EV10AS180x-EB Evaluation Board .............................................................................................. User Guide Table of Contents Section 1 Introduction ........................................................................................... 1-1 1.1 1.2 Scope ........................................................................................................1-1 Description ................................................................................................1-1 Section 2 Hardware Description ........................................................................... 2-1 2.1 2.2 2.3 2.4 2.5 2.6 2.7 Board Structure .........................................................................................2-1 Analogue Inputs/Clock Input .....................................................................2-2 Digital Output Data....................................................................................2-3 RSTN ........................................................................................................2-3 SA, RSx, TMx, SDA, SDAEN, GA, OA, DECN, Diode..............................2-4 Ground Layers ..........................................................................................2-4 Power Supplies .........................................................................................2-4 Section 3 Operating Characteristics ..................................................................... 3-1 3.1 3.2 3.3 Introduction ...............................................................................................3-1 Operating Procedure.................................................................................3-1 Electrical Characteristics...........................................................................3-2 Section 4 Application Information ......................................................................... 4-1 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 Analogue Input ..........................................................................................4-1 Clock Input ................................................................................................4-1 RESETN input...........................................................................................4-2 SA, GA, OA, SDA and SDAEN Commands..............................................4-2 RSx, TMx and DECN Commands.............................................................4-6 Output Data...............................................................................................4-8 Diode for Junction Temperature Monitoring............................................4-10 Test Bench Description ...........................................................................4-10 Section 5 Ordering Information ............................................................................. 5-1 Section 6 Appendix............................................................................................... 6-1 6.1 6.2 EV10AS180x-EB Evaluation Kit User Guide EV10AS180x-EB Electrical Schematics....................................................6-1 EV10AS180x-EB Board Layers ................................................................6-6 i 1072A–BDC–11/12 e2v semiconductors SAS 2012 Table of Contents ii 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Section 1 Introduction 1.1 Scope The EV10AS180x-EB Evaluation Kit is designed to facilitate the evaluation and characterization of the EV10AS180x 10-bit 1.5 GSps ADC in AC coupled mode. The EV10AS180x-EB Evaluation Kit includes: The 10-bit 1.5 GSps ADC Evaluation board with EV10AS180x ADC soldered on the PCB. A CD ROM with the datasheet and device User Guide. The User Guide describes the use the EV10AS180x-EB Evaluation Kit as an evaluation and demonstration platform and provides guidelines for its proper use. 1.2 Description The EV10AS180x-EB Evaluation board is very straightforward as it implements e2v EV10AS180x 10-bit 1.5 GSps ADC device, SMA connectors for the sampling clock, analogue inputs and reset input accesses and 2.54 mm pitch connectors compatible with high speed acquisition system probes. Thanks to its user-friendly interface, the EV10AS180x-EB Kit enables to test all the functions of the EV10AS180x 10-bit 1.5 GSps ADC. To achieve optimal performance, the EV10AS180x-EB Evaluation board was designed in a 6-metal-layer board using FR4 HTG epoxy dielectric material (200 µm, ISOLA IS410 featuring a resin content of 45%). The board implements the following devices: The 10-bit 1.5 Gsps ADC Evaluation board with the EV10AS180x ADC soldered. SMA connectors for CLK, CLKN, VIN, VINN, RESETN signals. 2.54 mm pitch connectors for the digital outputs, compatible with high speed acquisition system probes. Banana jacks (2 mm) for the power supply accesses, the Die junction Temperature monitoring functions. Jumpers for SDAEN, RS0, RS1, TM0, TM1, DECN, SDA, SA, OA, GA. Potentiometers for SA, OA, GA, SDA. The board dimensions are 260 mm × 220 mm. The board comes fully assembled and tested, with the EV10AS180x installed. EV10AS180x-EB Evaluation Kit User Guide 1-1 1072A–BDC–11/12 e2v semiconductors SAS 2012 Introduction Figure 1-1. EV10AS180x-EB Evaluation Board Simplified Schematic SA GA OA Diode Connector port A RSTN CLK Connector port B PIN 1 CLKN Connector DR DRN VIN VINN Connector port C AGND SDAEN AGND RS0 RS1 TM0 TM1 DECN Connector port D SDA VCC5 VCC3 3 V 3 D G N D V C C O D G N D As shown in Figure 1-1 on page 2, different power supplies are required: VCC5 = 5.2V analogue positive power supply (referenced to AGND). VCC3 = 3.3V analogue positive power supply (referenced to AGND). VCCO = 2.5V digital output power supply (referenced to DGND). 3.3V board supply for control functions (referenced to DGND). 1-2 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Section 2 Hardware Description 2.1 Board Structure In order to achieve optimum full speed operation of the EV10AS180x 10-bit 1.5 Gsps ADC, a multi-layer board structure was retained for the evaluation board. Six copper layers are used, dedicated to the signal traces, ground planes and power supply planes. The board is made in FR4 HTG epoxy dielectric material (ISOLA IS410). Board characteristics: RO4003 for the top and bottom layers, FR4 HTG for the internal layers Dielectric thickness: 200 µm Dielectric constant: 3.38 Lands diameter: 750 µm GND Via/Land Diameter: 200 µm The following table gives a detailed description of the board's structure. Table 2-1. Board Layer Thickness Profile Layer Characteristics Layer 1 Copper layer Copper thickness = 40 mm (with NiAu finish) AC signals traces = 50Ω microstrip lines DC signals traces FR4 HTG / dielectric layer Layer thickness = 200 µm Layer 2 Copper layer Copper thickness = 18 µm AGND, DGND (separate planes) FR4 HTG / dielectric layer Layer thickness = 349 µm Layer 3 Copper layer Copper thickness = 18 µm Power planes = VCC5, VCC3, VCCO FR4 HTG / dielectric layer Layer thickness = 350 µm Layer 4 Copper layer Copper thickness = 18 µm Power planes = 3V3 FR4 HTG / dielectric layer Layer thickness = 350 µm EV10AS180x-EB Evaluation Kit User Guide 2-1 1072A–BDC–11/12 e2v semiconductors SAS 2012 Hardware Description Table 2-1. Board Layer Thickness Profile (Continued) Layer Characteristics Layer 5 Copper layer Copper thickness = 18 µm AGND, DGND (separate planes) FR4 HTG / dielectric layer Layer thickness = 200 µm Layer 6 Copper layer Copper thickness = 40 µm (with NiAu finish) AC signals traces = 50Ω microstrip lines DC signals traces The board is 1.6 mm thick. The Clock, analogue inputs, reset and ADC functions occupy the top metal layer. The digital data output signals occupy the top and bottom layers. The Ground planes occupy layer 2 and 5. Layer 3 and 4 are dedicated to the power supplies. 2.2 Analogue Inputs/Clock Input The differential clock and analogue inputs are provided by SMA connectors (Reference: JOHNSON 142-0701-851-6). Both pairs are AC coupled using 10 nF capacitors. Special care was taken for the routing of the analog and clock input signals for optimum performance in the high frequency domain: 50Ω lines matched to ±0.1 mm (in length) between VIN and VINN or CLK and CLKN. 1270 µm between two differential pairs. 400 µm line width. 40 µm thickness. 870 µm diameter hole in the ground layer below the VIN and VINN or CLK and CLKN ball footprints. In addition, the lines for VIN, VINN and CLK, CLKN are matched to one another within ±1mm. A clearance in the ground plane below the CLK, CLKN and VIN, VINN package lands is necessary. Note: These values have been calculated with RO4003 dielectric material. Figure 2-1. Board Layout for the Differential Analog and Clock Inputs with RO4003 e = 40 µm 400 µm 870 µm RO4003 400 µm 200 µm AGND 1270 µm Note: 2-2 1072A–BDC–11/12 e2v semiconductors SAS 2012 The analogue inputs and clock inputs are AC coupled with 10 nF very close to the SMA connectors. EV10AS180x-EB Evaluation Kit User Guide Hardware Description Figure 2-2. Recommended Clearance Under CLK, CLKN, and VIN, VINN on the Ground Plane 1270 µm 1400 µm 2.3 Digital Output Data The high speed differential output signals (digital output, clock output), are routed in parallel with 50Ω impedance, 370 µm width and a pitch of 0.77 mm. Max difference between any two signals = ±1.5mm. Max difference between longest and shortest data per port = ±1mm Max difference between two signals of the same differential pair (Xi, XiN) = ±0.5mm (where X = A, B, C or D, i = 0…9). Note: These values have been calculated with RO4003 dielectric material. Figure 2-3. Recommended Routing on RO4003 for Digital Output Data Signals e = 40 µm 370 µm 400 µm 370 µm RO4003 200 µm DGND 770 µm 2.4 RSTN The RSTN signal is a single-ended signal with 50Ω impedance. Figure 2-4. Recommended Routing on RO4003 for RSTN Signal e = 40 µm 430 µm RO4003 200 µm DGND EV10AS180x-EB Evaluation Kit User Guide 2-3 1072A–BDC–11/12 e2v semiconductors SAS 2012 Hardware Description 2.5 SA, RSx, TMx, SDA, SDAEN, GA, OA, DECN, Diode These are "static" signals. They are routed in single-ended 50Ω impedance. Figure 2-5. Recommended Routing on RO4003 for Static Signal e = 40 µm 430 µm RO4003 200 µm DGND 2.6 Ground Layers There are 2 separated planes for the AGND and the DGND on the PCB. These planes must be reunited via 0Ω resistors. Only the input clock and analogue input are referenced to AGND, the other parts of the ADC are referenced to DGND. Important note: AGND and V CCO are not superimposed in order to avoid coupling effects. VCC3 and VCC5 are referenced to AGND while VCCO is referenced to DGND. 2.7 Power Supplies Layers 3 and 4 are dedicated to power supply planes: VCC5: ADC Analog part supply (VCC5 = 5.2V) VCC3: ADC Analogue Core and Digital parts supply (VCC3 = 3.3V) VCCO: ADC Output buffers supply (VCCO = 2.5V) 3.3V: external reference for GA, OA, SA and SDA commands. The supply traces are low impedance and are surrounded by two ground planes (layer 2 and 5). Each incoming power supply is bypassed at the banana jack by a 1 µF Tantalum capacitor in parallel with a 100 nF chip capacitor. Each power supply is decoupled as close as possible to the EV10AS180x device by 10 nF in parallel with 100 pF surface mount chip capacitors. Note: 2-4 1072A–BDC–11/12 e2v semiconductors SAS 2012 The decoupling capacitors are superimposed with the 100 pF capacitor mounted first. EV10AS180x-EB Evaluation Kit User Guide Section 3 Operating Characteristics 3.1 Introduction This section describes a typical configuration for operating the EV10AS180x 10-bit 1.5 Gsps ADC, evaluation board. The analogue input signals and the sampling clock signal should be accessed in a differential fashion. Band pass filters should also be used to optimize the performance of the ADC both on the analog input and on the clock. It is necessary to use a very low jitter source for the clock signal (recommended maximum jitter = 225 fs rms). Note: 3.2 Operating Procedure The analogue inputs and clock are AC coupled on the board. 1. Connect the power supplies and ground accesses through the dedicated banana jacks. VCC5 = 5.2V, VCC3 = 3.3V, VCCO = 2.5V and board supply = 3.3V 2. Connect the clock input signals. The clock input level is typically 4 dBm and should not exceed 10 dBm (into 100 differential). The clock frequency should be set to 1.5 GHz (for operation in 1:2 or 1:4 DEMUX Ratio). 3. Connect the analogue input signals (the board has been designed to allow only AC coupled analogue inputs). Use a low-phase noise High Frequency generator as well as a band pass filter to optimize the analogue input performance. The analogue input Full Scale is 500mV peak-to-peak around zero (analogue input providing the Input common mode). It is recommended to use the ADC with an input signal of –12 dBFS max (to avoid saturation of the ADC). 4. Connect the high speed acquisition system probes to the output connectors. The digital data are differentially terminated on-board (100Ω) however, they can be probed either in differential. 5. Switch on the ADC power supplies (recommended power up sequence: simultaneous or in the following order: VCC3 = 3.3V, VCC5 = 5.2V, VCCO = 2.5V and board supply 3.3V). 6. Turn on the RF clock generator. 7. Turn on the RF signal generator. EV10AS180x-EB Evaluation Kit User Guide 3-1 1072A–BDC–11/12 e2v semiconductors SAS 2012 Operating Characteristics The EV10AS180x-EB evaluation board is now ready for operation. Note: 3.3 Electrical Characteristics An external reset (RSTN) SMA connector or switch is available in case it is necessary to reset the ADC during operation (it is not mandatory to perform an external reset on the ADC for proper operation of the ADC as a power up reset already implemented). This reset is 2.5V CMOS compatible. It is active low (inactive by default on the board). Values in the table below are given for information only, for more accurate values refer to datasheet. Table 3-1. Recommended Conditions of Use Parameter Symbol Power supplies Comments Typ Unit VCC5 5.2 V VCC3 3.3 V VCC0 2.5 V Differential analog input voltage (Full Scale) VIN – VINN 100Ω differential 500 mVpp Clock input power level (Ground common mode) PCLK PCLKN 100Ω differential input 4 dBm Unless otherwise stated, requirements apply over the full operating temperature range (for performance) and at all power supply conditions. Table 3-2. Electrical Characteristics Parameter Symbol RESOLUTION Min Typ Max 10 ESD CLASSIFICATION > 1000V (HBM model) Unit Test level bit 1,6 V NA POWER REQUIREMENTS Power Supply voltage - Analog VCC5 5.0 5.2 5.5 V - Analog Core and Digital VCC3 3.15 3.3 3.45 V - Output buffers VCCO 2.4 2.5 2.6 V 1,6 Power Supply current in 1:1 DEMUX Ratio - Analog - Analog Core and Digital - Output buffers I_VCC5 I_VCC3 I_VCCO 71 85 mA 300 330 mA 100 110 mA I_VCC5 I_VCC3 I_VCCO 71 85 mA 312 335 mA 137 160 mA I_VCC5 I_VCC3 I_VCCO 71 85 mA 325 355 mA 216 240 mA 1,6 Power Supply current in 1:2 DEMUX Ratio - Analog - Analog Core and Digital - Output buffers 1,6 Power Supply current in 1:4 DEMUX Ratio - Analog - Analog Core and Digital - Output buffers 1,6 Power dissipation - 1:1 Ratio with standard LVDS output swing PD 1.6 1.9 W - 1:2 Ratio with standard LVDS output swing PD 1.75 2.0 W - 1:4 Ratio with standard LVDS output swing PD 1.9 2.3 W 3-2 1072A–BDC–11/12 e2v semiconductors SAS 2012 1,6 EV10AS180x-EB Evaluation Kit User Guide Operating Characteristics Table 3-2. Electrical Characteristics (Continued) Parameter Symbol Min Typ Max Unit Test level LVDS Data and Data Ready Outputs Logic compatibility LVDS differential Output Common Mode Differential output (1) VOCM 1.125 1.25 1.375 V 1,6 (1)(2) VODIFF 250 350 450 mVp 1,6 (3) VOH 1.25 – – V 1,6 VOL – – 1.25 V 1,6 Output level “High” Output level “Low” (3) Output data format Binary 1,6 ANALOG INPUT Input type AC coupled Analog Input Common Mode (for DC coupled input) Full scale input voltage range (differential mode) 3.1 V VIN –125 +125 mVp VINN –125 +125 mVp 1,6 Full scale analog input power level PIN –5 dBm 1,6 Analog input capacitance (die only) CIN 0.3 pF 5 Input leakage current (VIN = VINN = 0V) IIN 50 µA 5 Analog Input resistance (Differential) RIN Ω 1,6 V 1,6 96 100 104 CLOCK INPUT (CLK, CLKN) Input type Clock Input Common Mode (for DC coupled clock) DC or AC coupled VICM 2 Clock Input power level (low phase noise sinewave input) at 1.5 GHz PCLK 0 4 +7 dBm 4 ±447 ±708 ±1000 mVp 4 pF 4 Ω 4 V 1,6 V 1,6 100Ω differential Clock input swing (differential voltage) at 1.5 GHz VCLK VCLKN Clock input capacitance (die only) CCLK Clock Input resistance (Differential) RCLK 0.3 94 98 102 RSTN (active low) Logic compatibility 2.5V CMOS compatible Input level “High” VIH Input level “Low” VIL 2.0 0.4 DIGITAL INPUTS (RS0, RS1, DECN, SDAEN, TM1, TM0) Logic low - Resistor to ground RIL 0 10 Ω - Voltage level VIL – 0.5 V - Input current IIL – 450 µA - Resistor to ground RIH 10k infinite Ω - Voltage level VIH 2.0 – V - Input current IIH – 150 µA 1,6 Logic high 1,6 OFFSET, GAIN & SAMPLING DELAY ADJUST SETTINGS (OA, GA, SDA) Min voltage for minimum Gain, Offset or SDA EV10AS180x-EB Evaluation Kit User Guide Analog_min 2*Vcc3/3 – 0.5 V 1,6 3-3 1072A–BDC–11/12 e2v semiconductors SAS 2012 Operating Characteristics Table 3-2. Electrical Characteristics (Continued) Parameter Max Unit Test level Analog_max 2*Vcc3/3 + 0.5 V 1,6 Input current for min setting Imin 200 µA 1,6 Input current for nominal setting Inom 50 µA 1,6 Input current for max setting Imax 200 µA 1,6 Smax 2*Vcc3/3 Max voltage for maximum Gain, Offset or SDA Symbol Min Typ ANALOG SETTINGS (SA) SA voltage for default swing value 1,6 SA voltage for minimum swing value Smin Input current (low, for default swing value Imin 50 µA 1,6 Input current (high) for min swing value Imax 150 µA 1,6 Notes: 2*Vcc3/3 – 0.5 1,6 1. Assuming 100Ω termination ASIC load. 2. VODIFF can be lowered down to 100 mV with SA pin to reduce power consumption. 3. VOH min and VOL max can never be 1.25V at the same time when VODIFFmin. 3-4 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Section 4 Application Information 4.1 Analogue Input The analogue input (VIN, VINN) are entered in differential AC coupled mode as described in Figure 4-1. It is recommended to use a differential source to drive the analogue inputs of this ADC (external balun or differential amplifier). Please refer to Section Test Bench Description for more information. In order to optimize the performance of the ADC, it is also recommended to use a band pass filter on the analogue input path. Figure 4-1. Differential Analogue Inputs Implementation 10 nF VIN VIN EV10AS180x VNN VINN 10 nF 4.2 Clock Input It is recommended to use a differential source to drive the clock input. The clock is AC coupled via 10 nF capacitors as described in Figure 4-2. Please refer to Section Test Bench Description for more information. Figure 4-2. Clock Input Implementation 10 nF CLK CLK EV10AS180x CLKN CLKN 10 nF The jitter performance on the clock is crucial to obtain optimum performance from the ADC. We thus recommend to use a very low phase noise clock and to filter the clock signal if a fixed frequency is used. EV10AS180x-EB Evaluation Kit User Guide 4-1 1072A–BDC–11/12 e2v semiconductors SAS 2012 Application Information 4.3 RESETN input The RESETN signal can be applied by using a switch (SW5): By default, RESETN is floating, it is not active, the ADC is in normal mode; When the switch is activated, it connects RESETN to ground, which performs a reset on the ADC (reset of the clock circuitry, after reset, the first data will be seen on port A). It is also possible to apply a signal via the SMA connector, providing R4 is connected (0 ohm) and R3 is removed. The reset signal is implemented as illustrated in Figure 4-3. Figure 4-3. RESETN Input Implementation EV10AS180x RESETN R4 0Ω NC RESETN R3 0Ω R1 0Ω DGND 4.4 SA, GA, OA, SDA and SDAEN Commands 4.4.1 GA and OA Commands These signals are connected by default via their respective jumper to the command middle value (ie. 2 × VCC3/3 = 2.2V). When the jumper is removed, it is possible to tune the OA and GA commands between (2 × VCC3/3 – 0.5V) to (2 × VCC3/3 + 0.5V). 4-2 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Application Information Figure 4-4. GA and OA Commands Implementation 3.3V 3.3V 3.3V R12 R14 P1 3.3V R74 R76 R75 R77 P3 R15 R13 DGND DGND DGND DGND GA OA EV10AS180x EV10AS180x With: R12 = R74 = 240Ω R14 = R76 = 649Ω P1 = P3 = 1K R13 = R75 = 1.05 kΩ R15 = R77 = 1.33 kΩ Figure 4-5. GA and OA Commands Jumper Settings GA and OA set to default middle value 2 x VCC3/3 EV10AS180x-EB Evaluation Kit User Guide GA and OA tunable between (2 x VCC3/3 - 0.5V) and (2 x VCC3/3 + 0.5) 4-3 1072A–BDC–11/12 e2v semiconductors SAS 2012 Application Information 4.4.2 SA Command This signal is connected by default via its jumper to the command middle value (ie. 2 × VCC3/3 = 2.2V). When the jumper is removed, it is possible to tune the OA and GA commands between (2 × VCC3/3 – 0.5V) to (2 × VCC3/3 + 0.5V). Figure 4-6. SA Command Implementation 3.3V 3.3V R16 R18 R17 R19 P2 DGND DGND SA EV10AS180x With: R16 = 1 kΩ R18 = 649Ω P2 = 1K R17 = 1.62 kΩ R19 = 1.33 kΩ Figure 4-7. SA Command Jumper Settings SA set to default middle value 2 x VCC3/3 4-4 1072A–BDC–11/12 e2v semiconductors SAS 2012 SA tunable between (2 x VCC3/3) and 2 x VCC3/3 - 0.5V) EV10AS180x-EB Evaluation Kit User Guide Application Information 4.4.3 SDAEN and SDA Commands SDAEN signal allows to activate the SDA command when its jumper is OUT or connected as described in Figure 4-9 on page 5. When the SDA function is activated via SDAEN, then it is possible to tune the sampling delay of the ADC by tuning the SDA command between (2 × VCC3/3 – 0.5V) and (2 × VCC3/3 + 0.5V) by ±40 ps around the nominal Aperture delay of the ADC. Figure 4-8. SDAEN and SDA Commands Implementation 3.3V 3.3V R82 NC 3.3V R78 R80 P4 R81 DGND DGND DGND SDAEN SDA EV10AS180x EV10AS180x With: R82 = 10 kΩ (NC: can be connected to provide a true High level to SDAEN) R78 = 240Ω R80 = 649Ω P4 = 1K R79 = 1.05 kΩ R81 = 1.33 kΩ Figure 4-9. SDAEN Command Jumper Settings SDAEN activated: JUMPER ON EV10AS180x-EB Evaluation Kit User Guide SDAEN inactivated: JUMPER OUT 4-5 1072A–BDC–11/12 e2v semiconductors SAS 2012 Application Information Figure 4-10. SDA Command Jumper Settings SDA set to default middle value 2 x VCC3/3 4.5 RSx, TMx and DECN Commands SDA tunable between (2 x VCC3/3 - 0.5) and (2 x VCC3/3 + 0.5) The RSx, TMx and DECN functions are implemented on board with a jumper which can be ON or OUT (default setting is when the Jumpers are OUT, refer to Figure 4-12 on page 7). A 10 kΩ resistor can be connected in case a pull up is necessary to force a high level on these signals. This resistor is not connected. Figure 4-11. RSx, TMx and DECN Commands Implementation 3.3V RSx 10 kΩ NC TMx DECN DGND The default setting for RSx, TMx and DECN is when their respective jumper is OUT (refer to Figure 4-12). This gives a default setting of the ADC as described below (refer also to Table 4-1): RS1 = RS0 = Logic High = Jumper OUT -> 1:2 DMUX mode TM1 = TM0 = Logic High = Jumper OUT -> Test mode inactive DECN = Logic High = Jumper OUT -> Decimation Mode inactive 4-6 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Application Information When the jumper are on (refer to Figure 4-12), the different settings are described in Table 4-1. Table 4-1. RSx, TMx and DECN Commands Jumper Position Function Logic Level Jumper position Description 0 ON Decimation by 8 1 OUT Normal conversion (no decimation) 01 RS1 : ON RS0 : OUT 1:1 DEMUX Ratio (Port A) 11 RS1 : OUT RS0 : OUT 1:2 DEMUX Ratio (Ports A and B) 10 RS1 : OUT RS0 : ON 1:4 DEMUX Ratio (Ports A, B C and D) 00 RS1 : ON RS0 : ON Not used 01 TM1 : ON TM 0 : OUT Static Test (all “0”s at the output for VOL test) 11 TM 1 : OUT TM 0 : OUT Normal conversion mode (default mode) 10 TM 1 : OUT TM 0 : ON Static Test (all “1”s at the output for VOH test) 00 TM1 : ON TM0 : ON Dynamic test (checker board pattern = all bits toggling from “0” to “1” or “1” to “0” every cycle with 1010101010 or 0101010101 patterns) DECN RS<1:0> TM<1:0> Figure 4-12. RSx, TMx, DECN Command Jumper Settings Jumpers OUT EV10AS180x-EB Evaluation Kit User Guide Jumpers ON 4-7 1072A–BDC–11/12 e2v semiconductors SAS 2012 Application Information 4.6 Output Data The digital outputs are compatible with LVDS standard. They are on-board 100Ω differentially terminated as described in Figure 4-13. Figure 4-13. Differential Digital Outputs Implementation Connector ADC 100Ω Double row 2.54 mm pitch connectors are used for the digital output data. The upper row is connected to the signal while the lower row is connected to Ground, as illustrated in Figure 4-5 on page 3 and Figure 4-6 on page 4. The connectors are vertical connectors. Figure 4-14. Differential Digital Outputs 2.54 mm Pitch Connector (X = A, B) X0 X0N X1 X1N X8 X8N X9N X9N GND GND GND GND GND GND GND GND A6N A7 A7N A8 A8N A9 A9N B6N B7 B7N B8 B8N B9 B9N A6 A5N A5 A4N A4 A3N A3 A2N A2 A1N A1 A0N A0 Figure 4-15. Differential Digital Outputs 2.54 mm Pitch Connector (Port A) 4-8 1072A–BDC–11/12 e2v semiconductors SAS 2012 B6 B5N B5 B4N B4 B3N B3 B2N B2 B1N B1 B0N B0 Figure 4-16. Differential Digital Outputs 2.54 mm Pitch Connector (Port B) EV10AS180x-EB Evaluation Kit User Guide Application Information Figure 4-17. Differential Digital Outputs 2.54 mm Pitch Connector (X = C, D) X9N X9 GND GND X8N GND X8 X1N X1 X0N X0 GND GND GND GND GND C0 C0N C1 C1N C2 C2N 3C C3N C4 C4N C5 C5N C6 C6N C7 C7N C8 C8N C9 C9N Figure 4-18. Differential Digital Outputs 2.54 mm Pitch Connector (Port C) D0 D0N D1 D1N D2 D2N D3 D3N D4 D4N D5 D5N D6 D6N D7 D7N D8 D8N D9 D9N Figure 4-19. Differential Digital Outputs 2.54 mm Pitch Connector (Port D) Figure 4-20. Differential Digital Outputs 2.54 mm Pitch Connector (DR, DRN Signal) DR DRN The data are output in Binary format and in double data rate (the output clock frequency is half the data rate and thus half the input clock frequency in 1:1 DMUX mode, or ¼ the input clock frequency in 1:2 DMUX mode and 1/8 the input clock frequency in DMUX 1:4 mode). EV10AS180x-EB Evaluation Kit User Guide 4-9 1072A–BDC–11/12 e2v semiconductors SAS 2012 Application Information 4.7 Diode for Junction Temperature Monitoring Two 2 mm banana jacks are provided for the die junction temperature monitoring of the ADC. One banana jack is labeled DIODEA and should be applied a current of up to 1 mA (via a multimeter used in current source mode) and the second one is connected to DIODEC. Figure 4-21. Die Temperature Monitoring Test Setup Protection Diodes DIODEA Banana jacks 1 mA V To DIODEA To DIODEC DIODEC Note: 4.8 The protection diodes are NC. Test Bench Description Figure 4-22. Test Bench Description Band pass filter Thermal system Temperature range -80 to +163˚ Input Signal Generator VINN balun Evaluation Board VIN ADC 10 -bit Digital Acquisition System Band pass filter Clock Signal Generator balun Supply Computer Equipment (for example) – Input Signal Generator: Agilent E4426B – Clock Signal Generator: Agilent E4426B – Power Supply: Agilent 6629A – Logic Analyser: HP16500C – Balun: MACOM-H9 (2MHz => 2GHz) – Band pass filter: LORCH (500MHz => 1GHz) & LORCH (1GHz => 2GHz) 4-10 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Section 5 Ordering Information 5.1 Ordering Information Table 5-1. Ordering Information Part Number Package Temperature Range Screening Level Comments EV10AS180AGS-EB CI-CGA255 Ambient Prototype Evaluation board EV10AS180x-EB Evaluation Kit User Guide 5-1 1072A–HIREL–11/12 e2v semiconductors SAS 2012 Ordering Information 5-2 1072A–HIREL–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide Section 6 Appendix 6.1 EV10AS180x-EB Electrical Schematics Figure 6-1. Power Supplies Bypassing VCCA 5 . 2 . J3 1 2 C3 1uF 16V K . VCC5 . 2 2 VCC3 1 . C2 100nF 50V K 1 . . J8 2 1 2 C1 1uF 16V K . 1 1 2 . J1 1 VCC0 PT2 1 J6 C4 100nF 50V K C5 1uF 16V K . 1 2 AGND 1 . 2 . J5 PT1 1 Vcarte . . C6 100nF 50V K J7 1 2 C7 1uF 16V K . . 2 1 2 2 1 2 J4 . 2 1 2 1 PT4 1 3V3 . 1 . J2 PT3 1 . C8 100nF 50V K 1 VCCA 3 VCCO AGND Figure 6-2. Power Supplies Decoupling . C27 100pF J 50V 2 1 2 C26 . 10nF 25V K 1 2 2 . C25 100pF J 50V 1 C24 . 10nF 25V K 1 2 2 . C23 100pF J 50V 1 2 C22 . 10nF 25V K 1 . C21 100pF J 50V 1 C20 . 10nF 25V K 1 2 2 2 . C19 100pF J 50V 1 C18 . 10nF 25V K 1 2 2 . C17 100pF J 50V 1 2 C16 . 10nF 25V K 1 . C15 100pF J 50V 1 2 C14 . 10nF 25V K 1 2 1 . C13 100pF J 50V 1 2 VCCO C28 . 10nF 25V K . C83 100pF J 50V 2 1 C82 . 10nF 25V K 2 2 . C67 100pF J 50V 1 C66 . 10nF 25V K 2 2 2 . C81 100pF J 50V 1 C80 . 10nF 25V K 1 . C65 100pF J 50V 2 C64 . 10nF 25V K 2 2 2 . C79 100pF J 50V 1 C78 . 10nF 25V K 1 . C63 100pF J 50V 2 C62 . 10nF 25V K 2 2 1 . C61 100pF J 50V 1 2 VCCA 3 C68 . 10nF 25V K AGND 1 1 1 1 1 1 2 1 . C77 100pF J 50V 1 2 VCCA 5 C84 . 10nF 25V K AGND EV10AS180x-EB Evaluation Kit User Guide 6-1 1072A–BDC–11/12 e2v semiconductors SAS 2012 1 . PT15 2 1 R5 J 10K 0.10W NE 2 3 1 . J13-B SM A-bord-de-cart e RSTN J13-A SM A-bord-de-cart e SW 11 . 2 1 . J14 2 1 DIODE C DIODE A J15 R72 J 10K 0.10W NE NC NC 1 . PT16 1 70V NE CR2 BAV99 70V NE 3V3 R2 J 10K 0.10W NE 1 2 NE 70V CR4 BAV99 NE 70V NC NC 1 1 . PT14 . . PT17 SW 19 . 1 1 1 B . . . PT7 PT6 PT5 R3 J 0 0.10W R4 J 0 0.10W NE SW 12 SW 13 . 3 4 SW 5 R6 J 10K 0.10W NE 3V3 SW 18 R73 J 10K 0.10W NE 3V3 SW ITCH-STTS KHUB . CR3 BAV99 R1 . J 0 0.10W . PT11 . SW 16 SW 17 . CR1 BAV99 SW 10 3V3 SW 14 . 2 1 1 2 2 TM 1 TM 0 DE CN DiodeC DiodeA RS TN RS 1 RS 0 . P2 1K R16 F 1K 0.10W R17 F 1.62K 0.10W . . 3 . C10 100nF K 50V SW 7 1 . . . PT13 R19 F 1.33K 0.10W 1 2 3 J17 . . R18 F 649 0.10W 2 1 2 1 2 2 1 1 2 1 . R13 F 1.05K 0.10W . 2 3 . C9 100nF K 50V 3V3 P1 1K R12 F 240 0.10W . . 1 R15 F 1.33K 0.10W . R14 F 649 0.10W . PT12 1 2 3 J16 . SW 6 . 3V3 2 1 2 1 2 1 1 2 1 3V3 . R7 J 10K 0.10W NE SW15 . . 2 1 1 2 1 2 4 5 6 V1 V2 V3 V4 V5 V6 7 8 9 2 1 2 1 2 1 1 2 2 1 1 1 2 . 2 1 . R75 F 1.05K 0.10W . 3 . C11 100nF K 50V 3V3 P3 1K R74 F 240 0.10W . 2 2 1 1 2 1 3V3 . 2 3 21 3 1 1 3 12 3 2 2 1 2 1 . 1 . R77 F 1.33K 0.10W . R76 F 649 0.10W . PT18 1 2 3 J23 . SW 8 2 1 3V3 2 1 2 1 SW 20 R82 J 10K 0.10W NE 3V3 2 1 1 2 3V3 1 . . PT20 SW 21 . . . SD AEN R79 F 1.05K 0.10W SA GA OA 3V3 P4 1K R78 F 240 0.10W . 3 . C12 100nF K 50V . 1 . . SD A R81 F 1.33K 0.10W PT19 1 2 3 J24 . SW 9 . R80 F 649 0.10W N3 P3 T4 R13 T13 R14 T14 N14 P14 P4 N4 R12 T12 3V3 2 1 2 2 2 1 1 2 1 e2v semiconductors SAS 2012 2 1072A–BDC–11/12 1 6-2 1 3V3 1/3 CONTROL DIOD EC MN 1-A EV10AS180x DIOD EA RS TN RS 1 RS 0 TM 1 TM 0 DE CN SA GA OA SD AEN SD A Appendix Figure 6-3. Electrical Schematics EV10AS180x-EB Evaluation Kit User Guide Appendix Figure 6-4. Electrical Schematics (Analogue and Clock Input) 6 . 4 5 V1 V2 V3 V4 V5 V6 7 8 9 J11-B SM A-bord-de-carte AGND AGND J11-A SM A-bord-de-carte 2/3 C93 . 10nF 25V K DA TA A A0 A0N A1 A1N A2 A2N A3 A3N A4 A4N A5 A5N A6 A6N A7 A7N A8 A8N A9 A9N P1 P2 N1 N2 M1 M2 L3 M3 L1 L2 K1 K2 K3 J3 J1 J2 H1 H2 H3 G3 A0 A0N A1 A1N A2 A2N A3 A3N A4 A4N A5 A5N A6 A6N A7 A7N A8 A8N A9 A9N DA TA B B0 B0N B1 B1N B2 B2N B3 B3N B4 B4N B5 B5N B6 B6N B7 B7N B8 B8N B9 B9N F1 F2 E3 F3 E1 E2 D1 D2 A4 B4 A5 B5 C6 C5 A6 B6 A7 B7 C7 C8 B0 B0N B1 B1N B2 B2N B3 B3N B4 B4N B5 B5N B6 B6N B7 B7N B8 B8N B9 B9N EV10AS180x MN 1-B 1 2 1 2 . 3 VIN VIN AGND J12-A SM A-bord-de-carte VINN C94 . 10nF 25V K 1 2 3 2 . 1 AGND 6 . 4 5 V1 V2 V3 V4 V5 V6 7 8 9 J12-B SM A-bord-de-carte AGND VIN AGND T9 VINN T10 DATA READY DA TA C C0 C0N C1 C1N C2 C2N C3 C3N C4 C4N C5 C5N C6 C6N C7 C7N C8 C8N C9 C9N DA TA D D0 D0N D1 D1N D2 D2N D3 D3N D4 D4N D5 D5N D6 D6N D7 D7N D8 D8N D9 D9N P16 P15 N16 N15 M1 6 M1 5 L14 M1 4 L16 L15 K16 K15 K14 J14 J16 J15 H16 H15 H14 G1 4 D0 D0N D1 D1N D2 D2N D3 D3N D4 D4N D5 D5N D6 D6N D7 D7N D8 D8N D9 D9N CLKN 6 5 . 4 V1 V2 V3 V4 V5 V6 7 8 9 J9-B SM A-bord-de-carte C95 . 10nF 25V K 1 2 3 2 . 1 CLK CLKN CLK AGND J10-A SM A-bord-de-carte C96 . 10nF 25V K 1 2 3 2 . 1 . DRN F16 F15 E14 F14 E16 E15 D16 D15 A13 B13 A12 B12 C11 C12 A11 B11 A10 B10 C10 C9 R6 DR R83 100 1 A9 B9 C0 C0N C1 C1N C2 C2N C3 C3N C4 C4N C5 C5N C6 C6N C7 C7N C8 C8N C9 C9N CLK T6 AGND AGND J9-A SM A-bord-de-carte DR DRN . TSM-104-01-L-DV-A F 0.10W . 1 J22 J22 2 3 J22 J22 4 5 J22 J22 6 7 J22 J22 8 2 AGND 6 5 . 4 AGND V1 V2 V3 V4 V5 V6 7 8 9 J10-B SM A-bord-de-carte AGND EV10AS180x-EB Evaluation Kit User Guide 6-3 1072A–BDC–11/12 e2v semiconductors SAS 2012 Appendix Figure 6-5. Electrical Schematics (Output Connectors Ports A and B) J18 2 3 J18 J18 4 5 J18 J18 6 7 J18 J18 8 9 J18 J18 10 11 J18 J18 12 13 J18 J18 14 . . B0N 15 J18 J18 16 R41 F 249 0.10W R43 F 249 0.10W B1 17 J18 J18 18 R29 F 249 0.10W A1 1 1 1 R27 F 249 0.10W F A0N . A2 1 A3 1 A4 1 A5 1 A6 1 A7 1 A7N A8 1 R24 100 F A8N A9 1 0.10W . B3 25 J18 J18 26 B3N 27 J18 J18 28 B4 29 J18 J18 30 B4N 31 J18 J18 32 B5 33 J18 J18 34 B5N 35 J18 J18 36 B6 37 J18 J18 38 B6N 39 J18 J18 40 B7 41 J18 J18 42 B7N 43 J18 J18 44 B8 e2v semiconductors SAS 2012 4 5 J19 J19 6 7 J19 J19 8 9 J19 J19 10 11 J19 J19 12 13 J19 J19 14 15 J19 J19 16 17 J19 J19 19 J19 J19 20 21 J19 J19 22 23 J19 J19 24 25 J19 J19 26 27 J19 J19 28 29 J19 J19 30 31 J19 J19 32 33 J19 J19 34 35 J19 J19 36 37 J19 J19 38 39 J19 J19 40 41 J19 J19 42 43 J19 J19 44 45 J19 J19 B8N J18 J18 48 B9 46 47 J19 J19 49 J18 J18 50 B9N J18 J18 52 F 48 49 J19 J19 50 51 J19 J19 2 0.10W . R39 100 1 2 2 0.10W . R38 100 F 2 0.10W . R37 100 F 2 0.10W . R36 100 F 0.10W . 18 2 0.10W . R35 100 F 1 PORT A 1072A–BDC–11/12 F 1 J18 J19 J19 2 0.10W . R34 100 1 46 NC Alignem entPin F 1 J18 J18 54 2 3 2 0.10W . R33 100 1 47 45 J19 2 0.10W . R32 100 F 1 2 51 6-4 2 2 24 2 0.10W . R25 100 F J18 J18 2 0.10W . F 1 2 0.10W . R23 100 F B2N 2 0.10W . R22 100 F A6N 22 2 0.10W . R21 100 F A5N J18 J18 2 0.10W . R20 100 F A4N J18 J18 23 J19 . J19 2 0.10W . R31 100 1 B2 21 F B1N 20 19 R30 100 1 2 0.10W . R11 100 F A3N 100 B0 2 0.10W . R10 100 F A2N 100 0.10W . R9 F A1N A9N R8 53 1 100 Oh ms shall be put outside toget 1V and 1V4 1 . 2 2 1 100 Oh ms shall be put outside to get1V and 1V4 1 100 Oh ms shall be put outside toget1V and 1V4 A0 TSM-126-01-L-DV NC Alig neme ntPin . J18 J18 1 100 Oh ms shall be put outside toget1V and 1V4 . R42 F 464 0.10W 1 53 1 NC Aligne me ntPin . R40 F 464 0.10W 1 TSM-126-01-L-DV . R28 F 464 0.10W 1 2 2 . R26 F 464 0.10W 3V3 2 3V3 3V3 2 3V3 2 NC Alig neme ntPin 54 52 J19 PORT B EV10AS180x-EB Evaluation Kit User Guide Appendix Figure 6-6. Electrical Schematics (Output Connectors Ports C and D) TSM-126-01-L-DV NC Aligne me ntPin R58 100 1 F C9 C8N F C7N F C6N F C6 C5N 1 F C5 C4N 1 F C4 C3N F C2N F 6 7 J20 J20 8 9 J20 J20 10 11 J20 J20 12 13 J20 J20 14 15 J20 J20 16 D7N D6N 17 J20 J20 18 19 J20 J20 20 21 J20 J20 22 23 J20 J20 24 25 J20 J20 26 27 J20 J20 28 29 J20 J20 30 31 J20 J20 32 33 J20 J20 34 35 J20 J20 36 F 37 J20 J20 38 39 J20 J20 40 41 J20 J20 42 43 J20 J20 44 45 J20 J20 46 47 J20 J20 48 49 J20 J20 50 51 J20 J20 52 D5N D4N D3N D2N 100 Oh ms shall be put outside toget1V and 1V4 0.10W . D1N 100 Oh ms shall be put outside toget1V and 1V4 . R57 F 249 0.10W . D0N R68 F 464 0.10W R65 100 1 D0 F 100 O hm s shall be put outside to get1V and 1V4 100 O hm s shall be put outside to get1V and 1V4 J21 J21 12 13 J21 J21 14 15 J21 J21 16 17 J21 J21 19 J21 J21 20 21 J21 J21 22 23 J21 J21 24 25 J21 J21 26 27 J21 J21 28 29 J21 J21 30 31 J21 J21 32 33 J21 J21 34 35 J21 J21 36 37 J21 J21 38 39 J21 J21 0.10W . 40 41 J21 J21 42 43 J21 J21 44 45 J21 J21 46 47 J21 J21 48 49 J21 J21 50 51 J21 J21 52 18 2 NC Alig neme ntPin 2 EV10AS180x-EB Evaluation Kit User Guide 11 2 0.10W . . R66 F 464 0.10W J20 PORT C 1 1 . R55 F 249 0.10W F D1 2 2 NC Aligne me ntPin 54 10 2 0.10W . R64 100 1 2 J21 J21 3V3 1 F 8 9 54 J21 2 1 C0 1 1 R51 100 F J21 J21 2 0.10W . R63 100 1 D2 1 C0N F 6 7 2 0.10W . R62 100 1 D3 2 . R56 F 464 0.10W F J21 J21 2 0.10W . R61 100 1 D4 2 2 . R54 F 464 0.10W F 4 5 2 0.10W . R60 100 1 D5 2 0.10W . F D6 J21 J21 2 0.10W . R53 100 1 2 3 2 1 C1 F J21 . J21 J21 2 0.10W . R52 100 1 D7 3V3 R50 100 F 53 1 2 0.10W . R71 100 1 D8 3V3 C1N F D8N 2 0.10W . R70 100 1 D9 . . R67 F 249 0.10W R69 F 249 0.10W 1 3V3 J20 J20 2 0.10W . R49 100 1 C2 5 D9N 2 0.10W . R48 100 1 C3 4 2 0.10W . R47 100 J20 J20 2 0.10W . R46 100 3 2 0.10W . R45 100 1 2 2 0.10W . R44 100 1 C7 . J20 J20 2 0.10W . R59 100 1 C8 NC Aligne me ntPin J20 1 PORT D 1 C9N 53 TSM-126-01-L-DV 6-5 1072A–BDC–11/12 e2v semiconductors SAS 2012 Appendix 6.2 EV10AS180x-EB Board Layers Figure 6-7. Top Layer EV10AS18X-EVALUATION-BOARD 9001661B GA SA 1 B OA DIOD EA DIOD EC A0 A1 A2 GN D A3 B0 RS TN A4 B1 A5 B2 A6 A7 B3 B4 A8 B5 A9 B6 CLK B7 B8 B9 CLKN DR VIN C9 C8 VINN C7 D9 C6 C5 D8 D7 C4 D6 C3 AG ND C2 D5 VCC5 D4 C1 C0 SD A D3 AG ND D2 D1 DECN TM 1 TM 0 RS 1 RS 0 D0 SDAE N DG ND VCCO DG ND 3V3 VCC3 EV10AS18X-EVALUATION BOARD 6-6 1072A–BDC–11/12 e2v semiconductors SAS 2012 LAYER 1 COMPONENT SIDE EV10AS180x-EB Evaluation Kit User Guide Appendix Figure 6-8. Bottom Layer 6 B LAYER 6 SOLDER SIDE EV10AS180x-EB Evaluation Kit User Guide 6-7 1072A–BDC–11/12 e2v semiconductors SAS 2012 Appendix Figure 6-9. Equipped Board (Top) Dotted components are not wired FX2 FX7 R15 R14 C9 PT12 R77 R76 PT18 C11 PT6 P1 P2 R26 R27 J23 J17 PT13 C10 J16 R19 R18 FX4 R28 R29 PT7 P3 R8 R16 R17 R12 R13 R74 R75 R9 R41 R40 SW 5 R1 R10 R2 R43 SW 3 R42 R4 R11 J13 J18 R3 PT5 R30 R20 R31 R21 R32 SW 1 R22 R33 J19 R23 R34 R24 FX1 R35 R25 J9 R36 C95 R37 R38 J10 R39 C96 T R P N M L K J H G F E D C B A 1 2 3 4 5 6 7 MN 1 8 R83 9 J22 10 11 12 13 14 15 J11 16 C93 R58 R59 R44 C94 J12 R45 R70 R46 FX8 R71 R47 R52 J20 R48 C5 C6 R53 R49 PT2 R60 R50 R61 SW 4 J21 R62 R63 C3 C4 P4 PT3 PT1 R65 6-8 1072A–BDC–11/12 e2v semiconductors SAS 2012 R7 R72 R66 R67 PT17 R73 SW 18 R5 SW 14 R6 PT16 PT15 SW 16 R82 PT11 SW 10 FX3 PT14 SW 12 C1 SW 20 PT20 C2 C7 R54 R55 R68 R69 PT4 C8 R51 R56 R57 R64 C12 R81 R80 J24 R78 R79 PT19 SW 2 FX5 FX6 EV10AS180x-EB Evaluation Kit User Guide Appendix Figure 6-10. Equipped Board (Bottom) BLACK RED Dotted components are not wired J14 J15 CR4 CR3 R88 CR1 R98 CR2 R1 01 R9 1 R9 R99 R93 R92 R89 R 103 R94 C79 C80 C81 C82 C65 C66 C64 C63 C C2 21 2 C C2 23 4 C83 C84 C61 C62 C77 C78 C67 C68 0 02 C20 C19 C14 C13 R1 5 C2 2 6 7 C C2 28 C C16 C15 C17 C18 R104 R97 Put all 100 pF capacitor below 10 nF capacitor J5 J6 RED J3 BLACK RED J7 RED BLACK R 117 R 116 J2 J8 RED 15 J1 BLACK R1 EV10AS180x-EB Evaluation Kit User Guide R 111 R8 4 R9 6 R8 6 R1 06 BLACK J4 R1 05 R 107 R87 R 100 R9 5 R85 6-9 1072A–BDC–11/12 e2v semiconductors SAS 2012 Appendix 6-10 1072A–BDC–11/12 e2v semiconductors SAS 2012 EV10AS180x-EB Evaluation Kit User Guide How to reach us Home page: www.e2v.com Sales offices: Europe Regional sales office Americas e2v ltd e2v inc 106 Waterhouse Lane 520 White Plains Road Chelmsford Essex CM1 2QU Suite 450 Tarrytown, NY 10591 England USA Tel: +44 (0)1245 493493 Tel: +1 (914) 592 6050 or 1-800-342-5338, Fax: +44 (0)1245 492492 Fax: +1 (914) 592-5148 mailto: enquiries@e2v.com mailto: enquiries-na@e2v.com e2v sas Asia Pacific 16 Burospace e2v ltd F-91572 Bièvres Cedex 11/F., France Onfem Tower, Tel: +33 (0) 16019 5500 29 Wyndham Street, Fax: +33 (0) 16019 5529 Central, Hong Kong mailto: enquiries-fr@e2v.com Tel: +852 3679 364 8/9 Fax: +852 3583 1084 mailto: enquiries-ap@e2v.com Product Contact: e2v Avenue de Rochepleine BP 123 - 38521 Saint-Egrève Cedex France Tel: +33 (0)4 76 58 30 00 Hotline: mailto: hotline-bdc@e2v.com Whilst e2v has taken care to ensure the accuracy of the information contained herein it accepts no responsibility for the consequences of any use thereof and also reserves the right to change the specification of goods without notice. e2v accepts no liability beyond that set out in its standard conditions of sale in respect of infringement of third party patents arising from the use of tubes or other devices in accordance with information contained herein. e2v semiconductors SAS 2012 1072A–BDC–11/12