Introduction to Microelectronic Devices and Circuits

advertisement
ECE230L–Fall2015
IntroductiontoMicroelectronicDevicesandCircuits
Instructor:Dr.AaronFranklin,AssociateProfessorinECE&Chemistry
Email: aaron.franklin@duke.edu
OfficeHours:Tuesday&Thursday(10am–11am)andWednesday(2pm–3pm),F-CIEMAS3473
ClassTime&Location:Tuesday&Thursday(1:25pm–2:40pm),F-CIEMASA-1464
Lab Times & Location: Tuesday, 3:05–5:35pm, Wednesday, 3:05–5:35pm, Thursday, 3:05–5:35pm,
Friday,11:45am–2:15pm,HudsonHall,02G(studentsmustattendtheirscheduledlabsectiontime)
CourseWebsite:http://piazza.com/duke/fall2015/ece230L/home(forQ&A,discussions,files,etc.)
GTAs:ShrutiPreetam(shruti.preetam@duke.edu)(Lecture,officehours:Mon.(11am–12pm),CIEMAS3rdfloor)
BenLariviere(benjamin.lariviere@duke.edu)(Lab)
UGTAs:LaurenShum(ls240@duke.edu)(Lecture)
JohnLorenz(john.orenz@duke.edu)(Lab01LTu3:05–5:35PM)
JulianLockhart(julian.lockhart@duke.edu)(Lecture&Lab02LW3:05–5:35PM)
TCDong(tian.chan.dong@duke.edu)(Lab03LTh3:05–5:35PM)
ChrisWoodard(christopher.woodard@duke.edu)(Lab04LF11:45AM-2:15PM)
LabInstructor:KipCoonley,UndergraduateLaboratoryManager(kip.coonley@duke.edu),Hudson114
CourseDescription:
Hands-on, laboratory driven introduction to microelectronic devices, sensors, and integrated circuits.
Student teams of 3-4 students/team compete in a design, assembly, testing, characterization and
simulationofanelectronicsystem.Projectsincludemicroelectronicdevices,sensors,andbasicanalog
and digital circuits. Classroom portion designed to answer questions generated in laboratory about
understanding operation of devices and sensors, and the performance of electronic circuits. Student
evaluation based on project specification, prototyping, integration, testing, simulation and
documentation.
Objectives:
Throughthiscoursethestudentswill:
• Understand how the crystal structure of solids leads to the formation of solid-state quantum
theory,includingtheenergybandstructureofsemiconductors.
• Understand carrier transport in semiconductors and how such transport is controlled in
junction-baseddevices.
• Analyzethebehaviorofp-njunctiondevices,includingtheiroperationandperformance.
• AnalyzetheoperationofMOScapacitorsandMOSFETs,includingextractionofkeyparameters
andhowtheyaffectintegratedperformance.
• UnderstandanddescribetheoperationofMOSFETscoveringfromabanddiagramallthewayto
acircuitsymbolpicture.
• Understand and analyze how MOSFETs yield basic digital and analog circuits, including their
operationandperformance.BeabletodesignadigitallogicgateusingMOSFETs.
• Develop a conversational understanding of the field of micro/nanoelectronic devices and
circuits,fromsilicontothefuturedigital/analogdeviceoptions.
Textbook:
Requiredtextbook:
E-Book–IntroductiontoMicroelectronicDevicesandCircuits.ISBN–9781121962194.
o Students can purchase the e-book directly from McGraw-Hill using a credit card by
logging into https://create.mheducation.com/shop/ and searching by ISBN (note that
1
ECE230L–Fall2015
o
the instructor name listed may not be accurate, but if the School is “Duke University”
andthetitleiscorrect,thenitistherightbook).
Notethatthisisacombinationofthefollowingtwotextbooks:
! D. Neamen, Semiconductor Physics and Device Physics—4th Edition, McGrawHill,2012.(Chapters1-9)
! D.Neamen,Microelectronics:CircuitAnalysisandDesign—4thEdition,McGrawHill,2010.(Chapters10-22)
Hereareacoupleofotherusefultextbooksforreference:
• R.F.Pierret,SemiconductorDeviceFundamentals,AddisonWesleyLongman,1996.
• A.S.SedraandK.C.Smith,MicroelectronicCircuits,OxfordUniversityPress,1998.
Communication:
AllquestionsonhomeworkandlecturesshouldbepostedtoPiazzaforopendiscussion.Itisokforthe
post to be kept as “anonymous.” If students email the professor or TAs with questions on the
homeworkorlecture,theywilllikelybeaskedtopostthequestiontoPiazzatobeansweredtherefor
theentireclasstoaccess.
GradingCriteria:
Homework
20%
Quizzes
10%
Labs 20%
Exam1 15%
Exam2 15%
FinalExam
20%
Homework(20%):
A homework assignment will be given each week. The assignments are intended to help the student
solidify the important concepts of each principle/topic that is covered and will often require further
textbookreadingbeyondwhatisincludedinourlimitedlecturetime.Someoftheproblemswillcome
fromthecoursetextbookwhileotherswillbecreatedspecificallyforthiscourse.
HomeworkFormattingGuidelines
Eachassignmentshouldfollowtheseguidelines:
1) Usestandard8.5”x11”paper(blank,college-ruled,orgraphpaperallwork).
2) Staple the upper left corner with your name legibly in the top right corner of the first page,
alongwiththedateandassignmentnumber.
3) Keep the problems in the order they are given in the assignment (in other words, don’t put
problem#3onthefirstpagewithproblem#1onthesecondpage—placetheminorder!).
4) Ifyouusebothsidesofthepaper,besuretoindicatewhenaproblemcontinuesonthereverse
side.
5) Draw a box around (or clearly highlight) your final answer to each problem, with all needed
workforarrivingattheanswershownclearlyandlegibly.Pointswillbetakenawayforsloppywork!
AttendanceandLateHomeworkPolicy:
Attendancetothelecturesiscrucialtosucceedinginthiscourse.Homeworkwillbedueeachweek
andmustbeturnedinatthebeginningofclass–latehomeworkwillnotbeacceptedexceptwith
written approval from the professor (and even then, only once/student per semester for
extenuatingcircumstances).Notethatbetweentheweeklyhomeworkandquizzes,itwillbecrucial
forstudentstobepunctualandinattendanceforeverylecture!
2
ECE230L–Fall2015
CollaborationPolicy:
Students are allowed to work together on homework, keeping in mind that the Duke Community
Standard (http://www.integrity.duke.edu/new.html) applies to all assignments. Each student must
personally work each problem, legibly write up his or her solutions, and submit his/her own
solutions. This applies to all assignments, including computer simulations (e.g., MATLAB) and
laboratory projects. Generally, it is suggested that you work through all problems on your own
before discussing them with another student. Remember that you are just as responsible for the
academicdishonestyifyouallowsomeonetocopyyouroriginalworkasyouwouldbeifyoudidthe
copying yourself. The use of solution manuals or other sources of solutions is not allowed. Any
studentwhocopies(orallowscopyingof)anyassignmentorreportwillreceiveafailinggradefor
the assignment. If you have any questions regarding what is allowed and what is considered
cheating,pleaseask.
Quizzes(10%):
Therewillbequickquizzesgivenatthebeginningoflecturealmosteveryweekofthecourse.Quizzes
willtypicallycoverthematerialthatstudentsshouldhavereadinpreparationforthelecturethatwillbe
giventhatday(basedonthereadinglistinthecourseoutlineonthelastpageofthesyllabus).There
willbeabsolutelynomake-upquizzes,includingifyouaretardy!
MissedQuizzes/HomeworkandDroppingofLowestScores:
Astherewillbeabsolutelynomake-upquizzesorhomeworkextensions,thetwolowestofyourquiz
and the two lowest of your homework scores will be dropped. The scores that are dropped are
basedonpercentagesastheassignments/quizzesmaybeworthadifferentpointtotal.Thisallows
foryoutomissaclassorhomeworkforpersonalreasons.
Laboratory(20%):
The laboratory component of ECE 230L consists of a Shared Materials Instrumentation Facility (SMiF)
portionwherestudentswilldesignandfabricatetheirownSiliconwafer,8microelectronicslaboratory
experiments, and a final lab project. Each lab is designed to provide a hands-on experience with
electrical and computer engineering concepts presented in lecture. Attendance at each laboratory
during your assigned group time is required. If you must miss a lab due to an illness or injury that
prevents you from attending your assigned laboratory section, you must submit a Short-Term Illness
form prior to the absence to your course Instructor (https://tts-fm-admin01.trinity.duke.edu/stinf/).
Your instructor in conjunction with the laboratory manger (Kip Coonley, Hudson 114, (919) 660-5186
kip.coonley@duke.edu) will make arrangements with you to attend another lab section or otherwise
make-up the work. If you must miss a lab for any other reason, you must notify your Instructor
immediatelysothatarrangementscanbemadeforyoutocompletethework.Nostudentisallowedto
attendanotherlabsectionwithoutpriorapproval.
MidtermExams(15%each)andFinalExam(20%):
The midterm exams and final exam problems will be very much like the homework problems, so that
any student who has completed (and understood) all of the homework should be very familiar with
what to expect on the exams. The final exam will be comprehensive, covering all material from the
course. All exams will be closed book and closed notes. Further details to help you prepare for the
examswillbegiveninlecture.
GradingScale:
A+:98-100
B+:87-89
C+:77-79
D+:67-69
F:<60
A:93-97
B:83-87
C:73-76
D:63-66
A-:90-92
B-:80-82
C-:70-72
D-:60-62
3
Th,8/27
T,9/1
Th,9/3
T,9/8
Th,9/10
T,9/15
Th,9/17
T,9/22
Th,9/24
T,9/29
Th,10/1
SMIF
Intro
SMIFTour
PhotolithI
Photolith
II
pn
Junction
Diodes
P-Spice
Circuit
Simulatn
Devices
T,8/25
Semiconductor
Materials
ECE230L–Fall2015
AcademicIntegrity:
Academicintegrityisexpectedaspartofthecommunitytowhichyoubelongandeachstudentwillbe
held accountable for upholding the standard. University policy will be enforced in the case of any
dishonestconduct.
AnticipatedCourseOutline:
Date
Lab Lecture
ReadingHW/Quiz
T,10/6
Project
Th,10/8 Intro
T,10/13
NOLAB
Th,10/15
T,10/20
T,10/27
Th,10/29
T,11/3
Th,11/5
T,11/10
MOSFET
MOSFET
Model
Basic
Digital
Circuits
Multistage
Amplifiers
Th,11/12
T,11/17
Op-Amp
Th,11/19
T,11/24
NOLAB
Th,11/26
T,12/1
Project
Th,12/3 Demos
W,12/9
Circuits
Th,10/22
Courseoverview
TheBigPicture:WhyCareAboutThisCourse?
CrystalStructureofSolids
QuantumTheoryofSolids(bandstructure)
QuantumTheoryofSolids(electricaltransport)
ThermalEquilibrium
CarrierTransport(drift)
CarrierTransport(diffusion)
pn Junction Diodes (junction under zero-bias and
reverse-bias)
pnJunctionDiodes(junctionunderforwardbias,ideal
diode,deviationsfromideal,lightemittingdiode)
EXAM1–SemiconductorMaterials
pn Junction Diodes (small-signal equivalent circuit,
diodetransients)
pn Junction Diodes (large-signal analysis, half-wave
rectifier)
MOSFETs(MOScapacitors)
MOSFETs(capacitance-voltagecharacteristics)
FALLBREAK
MOSFETs(basicMOSFEToperation)
MOSFETs (small-signal equivalent circuit, CMOS
technology,circuitsymbols)
Digital(NMOSinverters)
pg.9-32
pg.34-48
pg.48-81
pg.82-131
pg.132-147
pg.148-155
pg.169-190
Quiz#1
HW#1due
Quiz#2
HW#2due
Quiz#3
HW#3due
pg. 204-232,
290-296
pg. 232-245,
425-430
pg. 416-425,
449-453
pg.313-336
pg.336-345
pg.345-364
pg. 364-373,
519-523
pg. 547-550,
836-850
Digital(CMOSinvertersandlogicgates)
pg.861-885
EXAM2–Devices
Analog(DCBiasingofMOSFETcircuits)
pg.528-543
Analog(common-sourceMOSFETamplifier)
pg. 550-551,
587-608
Analog (common-drain, common-gate MOSFET pg.609-620
amplifiers)
Analog(single-stageMOSFETIC,multistageamplifiers) pg.620-640
Analog(operationalamplifier)
pg.672-692
Analog(operationalamplifierapplications)
pg.692-708
The Big Picture: Why does this matter? Future directions
THANKSGIVINGBREAK
“CreateFinalExam”project
CourseReviewforFinalExam
FINALEXAM,7pm–10pm–Comprehensive
Quiz#4
HW#4due
Quiz#5
HW#5due
Quiz#6
HW#6due
Quiz#7
HW#7due
Quiz#8
HW#8due
Quiz#9
HW#9due
Quiz#10
HW#10due
Quiz#11
HW#11due
4
Download