A COMPUTER ALGORITHM TO IMPLEMENT LINEAR STRUCTURED ILLUMINATION IMAGING Zhongchao Liao B.E., Wuhan University of Technology, 2007 PROJECT Submitted in partial satisfaction of the requirements for the degree of MASTER OF SCIENCE in ELECTRICAL AND ELECTRONIC ENGINEERING at CALIFORNIA STATE UNIVERSITY, SACRAMENTO FALL 2009 A COMPUTER ALGORITHM TO IMPLEMENT LINEAR STRUCTURED ILLUMINATION IMAGING A Project by Zhongchao Liao Approved by: __________________________________, Committee Chair Warren D. Smith __________________________________, Second Reader Stephen M. Lane ____________________________ Date ii Student: Zhongchao Liao I certify that this student has met the requirements for format contained in the University format manual, and that this project is suitable for shelving in the Library and credit is to be awarded for the Project. __________________________, Graduate Coordinator B. Preetham Kumar Department of Electrical and Electronic Engineering iii ________________ Date Abstract of A COMPUTER ALGORITHM TO IMPLEMENT LINEAR STRUCTURED ILLUMINATION IMAGING by Zhongchao Liao The conventional diffraction limit defines a finite range of spatial frequencies that can be transmitted through a microscope. To reveal more information about the objects that are observed by microscope, techniques that can go beyond this limit need to be developed. Structured illumination microscopy (SIM), one such method, uses patterns of excitation light to encode otherwise unobservable information into the observed image. Although the method has been well developed, the procedure of this technique is complicated. During the procedure, after encoding the unobservable information into the observed image, the superresolution information components need to be separated, shifted, and reassembled. These procedures have never been clearly explained. In this project, a computer algorithm of the linear structured illumination microscopy technique is developed. To implement this algorithm, multiple images of an object are taken with different phases and orientations of sinusoidally patterned illumination. Superresolution information components then can be extracted from these images. The procedures of separation, shifting, and reassembly of the superresolution information components are presented, explained, and verified. A block diagram of the whole procedure of the structured illumination method is presented. The results of the conventional microscope and the structured illumination algorithm are generated and compared. When applied to test objects, the performance of the algorithm is found to be in agreement with theoretical predictions, thus verifying the theory and the implementation algorithm. The block diagram of the whole procedure of the structured illumination and iv the explanation of the procedures of separation, shifting, and reassembly of the superresolution information components can be taken as the instructions of how to implement this method. This project report is intended to serve as a useful reference for researchers to understand this method. _______________________, Committee Chair Warren D. Smith _______________________ Date v ACKNOWLEDGMENTS I would like to thank my advisor, Dr. Warren D. Smith, for giving me the opportunity to work in a very interesting area, and for his support and guidance throughout my graduate studies at California State University, Sacramento. I also wish to thank Dr. Stephen M. Lane, the Chief Scientific Officer of the NSF Center for Biophotonics Science and Technology at the University of California, Davis, for his direction, assistance, and guidance. His recommendations and suggestions have been invaluable for the project. I thank Dr. Preetham Kumar, the Graduate Coordinator of the Department of Electrical and Electronic Engineering, for his support and encouragement throughout my graduate studies. Special thanks should be given to my parents who love and support me at all times. Finally, words alone cannot express the thanks I owe to Qing Gu, my wife, for her encouragement and assistance. vi TABLE OF CONTENTS Page Acknowledgments ....................................................................................................... vi List of Figures ............................................................................................................. ix Chapter 1. INTRODUCTION ................................................................................................ 1 1.1 Overview .................................................................................................... 1 1.2 Purpose of Study ........................................................................................ 2 1.3 Organization of Project Report ................................................................... 3 2. BACKGROUND .................................................................................................. 4 2.1 Structured Illumination Imaging Theory .................................................... 4 2.2 Information Components Shifting .............................................................. 6 3. METHODOLOGY ............................................................................................... 8 3.1 Object ......................................................................................................... 8 3.2 Optical Transfer Function and Point Spread Function .............................. 9 3.2.1 Optical Transfer Function ........................................................... 9 3.2.2 Point Spread Function ............................................................... 10 3.3 Conventional Image ................................................................................. 11 3.4 Illumination Patterns ................................................................................. 15 3.5 Shifted Components ................................................................................ 15 3.6 Information Components Separation ........................................................ 19 3.7 Information Components Analysis ........................................................... 23 3.8 Information Components Reconstruction ................................................ 25 3.9 Apodization .............................................................................................. 28 3.10 Methodology Summary ......................................................................... 30 4. RESULTS ........................................................................................................... 32 4.1 Real Space Comparison ........................................................................... 32 4.2 Reciprocal Space Comparison ................................................................. 36 vii 5. DISCUSSION .................................................................................................... 39 6. SUMMARY, CONCLUSIONS, AND RECOMMENDATIONS ...................... 40 6.1 Summary .................................................................................................. 40 6.2 Conclusions ............................................................................................. 40 6.3 Recommendations .................................................................................... 41 Appendix Matlab Simulation Code .......................................................................... 42 References .................................................................................................................. 52 viii LIST OF FIGURES Page 1. Figure 3.1. Object image, D (r ) ....................................................................... 8 2. Figure 3.2. OTF spectrum magnitude plot ..................................................... 10 3. Figure 3.3. OTF spectrum image .................................................................... 11 4. Figure 3.4. Fourier transform of object image, D (r ) , in reciprocal space, Dbar (r ) ....................................................... 12 5. Figure 3.5. OTF support region in reciprocal space, DHbar (k ) ................... 14 6. Figure 3.6. Conventional image, DP (r ) ........................................................ 14 7. Figure 3.7. Illumination pattern, I (r ) , with 240 o , orientation = 120o in real space ................................................................................. 16 8. Figure 3.8. Illuminated image in real space, DI (r ) ....................................... 16 9. Figure 3.9. Illuminated object in reciprocal space, DIbar (r ) . ....................... 17 10. Figure 3.10. Magnitude plot of illuminated object, DIbar (r ) ....................... 17 11. Figure 3.11. Magnitude plot of reconstructed object, rc (k ) . ......................... 18 12. Figure 3.12. Illumination pattern, I (r ) , in three phases and orientations.. ............................................................. 19 13. Figure 3.13. Components for three different phases and orientations ............ 22 14. Figure 3.14. The moved components, replc ci (k ) ........................................... 26 15. Figure 3.15. The Fourier transform of reconstructed structured illumination image, drr (k ) ...................................... 28 16. Figure 3.16. Magnitude plot of triangular function in reciprocal space, bhs (k ) ........................................................ 29 17. Figure 3.17. Reconstruction of SI image in real space, fimage(r ) ............... 30 18. Figure 3.18. Block diagram of the methodology ............................................ 31 19. Figure 4.1. Magnitude plot of column 65 of object image in real space ........ 33 20. Figure 4.2. Magnitude plot of column 65 of SI image in real space .............. 34 ix 21. Figure 4.3. Magnitude plot of column 65 of conventional image in real space ................................................................................. 35 22. Figure 4.4. Comparison of column 65 of conventional image and SI image in real space ........................................................... 35 23. Figure 4.5. Magnitude plot of column 65 of object image in reciprocal space ....................................................................... 36 24. Figure 4.6. Magnitude plot of column 65 of SI image in reciprocal space ....................................................................... 37 25. Figure 4.7. Magnitude plot of column 65 of conventional image in reciprocal space ....................................................................... 37 26. Figure 4.8. Comparison of column 65 of conventional image and SI image in reciprocal space ................................................. 38 x 1 Chapter 1 INTRODUCTION 1.1. Overview Optical or light microscopy involves passing visible light transmitted through or reflected from the sample through a single or multiple lens system to allow a magnified view of the sample [1]. The resulting image can be captured digitally, imaged on a photographic plate, or observed directly by the eyes. According to E. K. Abbe's theory [2], the conventional diffraction limit defines a finite range of spatial frequencies that can be transmitted through a microscope. This theory has been well understood for more than a century. Recently, a few techniques have been shown that can go beyond this limit. Structured illumination microscopy (SIM) , one such method, uses patterns of excitation light to encode otherwise unobservable information into the observed image. This method, developed by M. G. L. Gustafsson and R. Heinzmann, has been used for resolution enhancement in both the axial and the lateral directions. This method resolves an object’s spatial frequencies that are normally outside the passband of an imaging system. The basic idea is based on the well-known moiré effect [3]. The moiré effect is a visual perception that occurs when viewing a pattern that is superimposed on another pattern, where the patterns differ in relative size, angle, or spacing. In this project, one pattern is purposely structured excitation light with a 2 sinusoidal illumination pattern, and the other pattern is the unknown sample object [4]. The observed image is the product of the two patterns, where the amount of light emitted from a point is proportional to the product of the unknown object and the sinusoidally patterned illumination [5]. Such an observed image also will contain moiré fringes. This generated moiré pattern combines the high spatial frequencies of the object with the spatial frequency of the sinusoidal illumination. Since it is much coarser than either the sinusoidal pattern or the sample object, the moiré pattern easily can be observed in the microscope, even if the object is too fine to resolve. Multiple images of the object can be obtained by shifting the phase of the sinusoidal pattern and rotating the orientation of the sinusoidal pattern. These images then are processed to extract the high spatial frequencies in order to obtain a superresolved image. 1.2. Purpose of Study The theory of structured illumination imaging has been well developed. In this project, a computer algorithm is developed to implement linear structured illumination imaging theory. The primary purposes of developing this computer algorithm are to verify the robustness of the theory and to help people understand this method clearly. During the procedure, after encoding the unobservable information into the observed image, the superresolution information components need to be separated, shifted, and reassembled. Since these procedures have never been explained clearly, this project discusses these steps thoroughly. 3 1.3. Organization of Project Report The project is organized as follows: Chapter 2 provides background knowledge on linear structured illumination microscopy and illustrates the method of shifting the superresolution information components. Chapter 3 shows the computer algorithm to implement the linear structured illumination technique. It illustrates the methods of separating, shifting, and reassembling the superresolution information components. Chapter 4 shows the results after applying the linear structured illumination technique to the object image and compares the reconstructed image with the conventional microscope image. Chapter 5 is a discussion of the results of the project. Chapter 6 is the summary, conclusions, and recommendations of this project. 4 Chapter 2 BACKGROUND 2.1. Structured Illumination Imaging Theory The classical resolution limit specifies a maximum spatial frequency, k obs , that can be observed through the light microscope. The region within a circle of radius k obs in reciprocal space is called observable region [6]. It is also known as the OTF support region. It is defined as the spatial frequencies for which the optical transfer function (OTF) of the conventional microscope is non-zero [7]. In terms of the definition of the OTF support region, the information that lies inside this region can be observed through the conventional microscope, while information that resides outside the region is not observable. The structured illumination technique is developed to extend the resolution beyond this limit by shifting high spatial frequencies from outside the observable region into the observable region in the form of moiré fringes. Object image D (r ) and observed image E (r ) are related by E (r ) D(r ) I (r ) , where I (r ) is the structured illumination pattern, and r is the spatial vector. (1) 5 The Fourier transform of this relation is the convolution E (k ) D(k ) I (k ) , (2) where k is the spatial frequency vector in reciprocal space. This convolution mixes information from outside the observable region into the observable region in reciprocal space [8]. Thus, the observed patterned image contains previously unobservable information. If the structured illumination pattern is chosen properly, the unobservable information in moiré fringe form can be decoded and restored. A reconstruction can be created with the previously unavailable superresolution information to get the superresolved image. Because the resolution extension is based on the structured illumination pattern’s frequency, I (r ) should be as fine as possible to get maximal resolution [9]. The structured illumination used in this project is a sinusoidal pattern of parallel stripes: I (r ) 1 1 cos(2p r ), 2 where p is the frequency of the illumination pattern, and is the phase of the illumination pattern in real space. (3) 6 The Fourier transform of that pattern consists of three delta functions: 1 1 1 I (k ) [ (k ) (k p )e i (k p )e i ] , 2 2 2 (4) so that convolution integral (2) becomes a sum of three components [5]. The phase factor, e i , represents the phase of the illumination pattern in reciprocal space [10]. The observed image, E (k ) , at each point k in reciprocal space only depends on three information components: 1 1 1 E (k ) [ D(k ) D(k p )e i D(k p )e i ] . 2 2 2 (5) Three independent linear combinations of D(k ) , D (k p ) , and D(k p) then can be measured by repeating this procedure several times with the pattern shifted by different phases. This process can be repeated with the pattern at different orientations, resulting in an image of the object at double the normal resolution. 2.2. Information Components Shifting Equation (5) has three components, the unshifted object Fourier transform, D(k ) , and two shifted copies of the object Fourier transform, D(k p) and D (k p ) . The 7 shifted components contain part of the object's unobservable information in a conventional imaging system. The structured illumination process makes the previously unobservable information accessible by shifting these components into the OTF support region of the conventional microscope. To obtain the superresolved image, the three information terms need to be separated and moved back to proper positions. Unshifted component D(k ) does not need to be moved, but the spatial frequencies of those shifted components from (k p) and ( k p ) coordinates should be moved back to the (k ) coordinates [9]. Then, a reconstruction is generated to restore all components to get a superresolved image. 8 Chapter 3 METHODOLOGY 3.1. Object The numerical simulations are performed on a grid of 128 128 pixels. The object image, consisting of two-dimensional rods with random length and orientation, is shown in Figure 3.1. Figure 3.1. Object image, D (r ) . 9 3.2. Optical Transfer Function and Point Spread Function 3.2.1. Optical Transfer Function The optical transfer function (OTF) describes the magnitude of each spatial frequency observed by the microscope. The simulations and numerical calculations in this project used an analytical wide field OTF for a diffraction-limited optical microscope in the scalar, paraxial approximation [8]. This OTF is OTF (k ) {2b( k ) sin[ 2b( k )]} / , (6) where b(k ) cos 1 (k / k 0 ) . Figure 3.2 shows this OTF. Here, k0 is the radius of the normally observable region in reciprocal space. The normally observable region is shown in Figure 3.3. This simple expression is picked because the particulars of the OTF are unimportant for the general question. The highest spatial frequency for the OTF, f c , is set to 20 frequency index where the frequency index 65 represents 0 spatial frequency in reciprocal space. The interval from one frequency index to the next corresponds to a spatial frequency interval of (1 / 128) / pixel . 10 3.2.2. Point Spread Function The point spread function (PSF) describes the response of an imaging system to a point source or point object. A more general term for the PSF is a system's impulse response, with the PSF being the impulse response of a focused optical system. Figure 3.2. OTF spectrum magnitude plot. It is the plot of (6) in reciprocal space. The frequency index 65 represents 0 spatial frequency in reciprocal space. The interval from one frequency index to the next corresponds to a spatial frequency interval of (1 / 128) / pixel . When the object is divided into discrete point objects of varying intensity, the image is computed as a sum of the PSF of each point. As the PSF typically is determined entirely by the imaging system, the entire image can be described by specifying the 11 optical properties of the system. This process usually is formulated by a convolution equation [11]. Figure 3.3. OTF spectrum image. It is the image of (6) in reciprocal space. The frequency index 65 represents 0 spatial frequency in reciprocal space. The interval from one frequency index to the next corresponds to a spatial frequency interval of (1 / 128) / pixel . 3.3. Conventional Image The OTF is the Fourier transform of the PSF. According to the property of convolution, convolving the object with the PSF in real space is equivalent to multiplying the Fourier transform of the object with the OTF in reciprocal space. The product of the 12 multiplication of the Fourier transform of the object and the OTF then is transformed back to real space again to avoid the convolution process. The result in real space is the normally observable, or conventional, image. The Fourier transform of the object image, D (r ) , to reciprocal space is Dbar (k ) F [ D(r )] , (7) where F [ ] represents the Fourier transform. This Fourier transform is shown in Figure 3.4. Figure 3.4. Fourier transform of object image D (r ) in reciprocal space, Dbar (k ) . 13 Multiplying Dbar (k ) by the OTF results in DHbar (k ) OTF (k ) Dbar (k ) , (8) the OTF support region of the object image, D(k ) , in reciprocal space, shown in Figure 3.5. Then, transforming back to real space results in DP (r ) F 1[ DHbar (k )] , (9) where F 1 [ ] represents the inverse Fourier transform and DP (r ) is the inverse Fourier transform of DHbar (k ) in real space, shown in Figure 3.6. Comparing Figure 3.1 with Figure 3.6, it can be seen that, after applying the PSF, the object image, D (r ) , that consists of two-dimensional rods with random length and orientation, is changed into a blurred image, DP (r ) , which simulates a conventionally observed image. The goal of the project is to improve conventionally observed images by using the structured illumination technique. 14 Figure 3.5. OTF support region in reciprocal space, DHbar (k ) . Figure 3.6. Conventional image, DP (r ) . This is the normally observed image, which is the image that can be observed through a conventional microscope. 15 3.4. Illumination Patterns As mentioned before, a sinusoidal pattern of parallel stripes is used in this project to generate the illumination pattern, I (r ) . The illumination pattern is shown in Figure 3.7 for an orientation of 120o, where orientation is measured clockwise from the horizontal. In real space, the product of the illumination pattern, I (r ) , and the object image, D (r ) , is the illumination patterned object image, DI (r ) , shown in Figure 3.8. It is then transformed to reciprocal space, DIbar (k ) , shown in Figure 3.9. Then, it is multiplied by the OTF to get the conventionally observable patterned image, DIbars (k ) , DIbars (k ) H (k ) DIbar (k ) . (10) In (10), the patterned object image is limited by the OTF. However, there is some superresolved information in the shifted components. 3.5. Shifted Components As shown in (4), the Fourier transform of a sinusoidal pattern consists of three impulses. The Fourier transform of an object illuminated by this pattern contains three replicas of the object spectrum [12]. The three components can be visualized in Figure 3.10 [13]. Figure 3.10 is a slice through Figure 3.9 at orientation = 120o. All three 16 Figure 3.7. Illumination pattern, I (r ) , with 240 o , orientation = 120o in real space. Figure 3.8. Illuminated image in real space, DI (r ) . It is illuminated by the illumination pattern shown in Figure 3.7. 17 Figure 3.9. Illuminated object in reciprocal space, DIbar (r ) . It is illuminated by the illumination pattern shown in Figure 3.7. Figure 3.10. Magnitude plot of illuminated object, DIbar (k ) . This is the plot of (5). It is a slice through Figure 3.9 at orientation = 120o. 18 components are combined appropriately to obtain a superresolved image, rc (k ) , as shown in Figure 3.11. Figure 3.11. Magnitude plot of reconstructed object, rc (k ) . The detectable region is the normal OTF support region and the plot is the reconstruction of Figure 3.10, after moving the shifted components back to proper positions. In order to solve for the three unknown components, three or more images are needed. Traditional technique uses three images with phase shifts of 0o, 120o and 240o in the sinusoidal illumination [4]. Figure 3.12 shows sinusoidal patterns with three phases for three different orientations. For each orientation, there are three unknown components. 19 Orientation = 0o Orientation = 60o Orientation = 120o 0o 120 o 240 o Figure 3.12. Illumination pattern, I (r ) , in three phases and orientations. They are printed on 128×128 pixel grids with the same scales. 3.6. Information Components Separation Solution of these individual components by solving linear equations has been 20 discussed extensively in the literature [4], [5]. However, there are few papers that discuss the details of inverting the matrix and solving for the three unknown components. Therefore, one of the purposes of this project is to show such details. According to Shroff's paper [9], let H1 (k ) and H 2 (k ) be the optical transfer functions (OTFs) of the illumination and imaging paths, respectively. Recall that Dbar (k ) is the Fourier transform of the object intensity, and DIbars (k ) is the Fourier transform of the OTF support patterned object. The resulting matrix is DIbars 1 (k ) e DIbars (k ) e i0 2 DIbars 3 (k ) e i0 C i0 i 1 e e i 2 e i3 A 1 H 1 (0) H 2 (k ) Dbar (k ) 2 e 1 i 2 . e H ( p ) H ( k ) Dbar ( k p ) 1 2 i 3 4 e 1 H ( p ) H (k ) Dbar (k p) 2 4 1 B i1 (11) Since the Fourier transforms of the patterned object and the three phases, 1 0 , 2 120 o , 3 240 o , are already known, the Fourier transforms of the shifted object can be solved by inverting matrix A, which is the shifting factor matrix. For this project, the equation is solved numerically. 21 First, 1 2 H 1 (0) H 2 (k ) Dbar (k ) e i0 1 H 1 ( p ) H 2 (k ) Dbar (k p ) e i0 4 i0 1 H ( p ) H (k ) Dbar (k p ) e 2 4 1 B 1 e i1 e i1 DIbars 1 (k ) e i 2 e i 2 DIbars 2 (k ) . e i3 e i3 DIbars 3 (k ) C A (12) Substituting 1 0 , 2 120 o , and 3 240 o in (12) results in 1 1 2 H 1 (0) H 2 (k ) Dbar (k ) 1 1 1 DIbars 1 (k ) 1 H 1 ( p) H 2 (k ) Dbar (k p) 1 - 0.5 0.866i - 0.5 0.866i DIbars 2 (k ) . (13) 4 1 0.5 0.866i 0.5 0.866i DIbars ( k ) 3 1 H ( p) H (k ) Dbar (k p) 1 2 A C 4 B The three components, and 1 1 H 1 ( p ) H 2 (k ) Dbar (k p ) , H 1 ( p ) H 2 (k ) Dbar (k p ) , 4 4 1 H 1 (0) H 2 (k ) Dbar (k ) thus are obtained. Figure 3.13 shows the three components 2 for each orientation. 22 Orientation = 0o Orientation = 60o Orientation = 120o 0o 120 o 240 o Figure 3.13. Components for three different phases and orientations. They are the results of the information components separation after applying the respective illumination patterns shown in Figure 3.12. All the images are printed on 128×128 pixel grids with the same scales. 23 3.7. Information Components Analysis The separated terms in matrix B of (13), which are the Fourier transforms of shifted objects in reciprocal space, are now analyzed [9]. The term sp c1 (k ) 1 H 1 (0) H 2 (k ) Dbar (k ) 2 (14) is the unshifted component image for 0o orientation. It has an OTF given by otf1 (k ) The second separated term, 1 H 1 (0) H 2 (k ) . 2 (15) 1 H 1 ( p ) H 2 (k ) Dbar (k p ) , is the shifted component 4 image containing the superresolution information from the conventionally unobservable region. A shifting factor, Ir (k ) , is introduced to sub-pixel shift the components. By using the shifting factor, the second separated term can be shifted from the (k p) coordinates back to the (k ) coordinates to obtain sp c 2 (k ) 1 H 1 ( p ) H 2 (k p ) Dbar (k ) . 4 This procedure is repeated for the third separated term to obtain sp c 3 (k ) 1 H 1 ( p ) H 2 (k p ) Dbar (k ) . 4 24 The OTFs for sp c 2 (k ) and sp c 3 (k ) are otf 2 (k ) 1 H 1 ( p) H 2 (k p) , 4 (17) otf 3 (k ) 1 H 1 ( p) H 2 (k p) . 4 (18) The derivation shown above follows that of Shroff’s paper [9]. This process is repeated for 60o and 120o orientations of the sinusoidal illumination pattern. Thus, six more component images can be obtained. There are four component images having superresolution along their respective rotations in Fourier space, given as sp c 5 (k ) and sp c 6 (k ) for orientation of 60o and sp c8 (k ) and sp c 9 (k ) for orientation of 120o. They have their own OTFs, otf 5 (k ) , otf 6 (k ) , otf 8 (k ) , and otf 9 (k ) . There are other two components, given as sp c 4 (k ) and sp c 7 (k ) . They are the unshifted versions for 60o and 120o orientations, having OTFs similar to otf1 (k ) , given as otf 4 (k ) and otf 7 (k ) . These nine components need to be reconstructed with their OTFs to get an image having superresolution in all directions in reciprocal space. In this project, the shifting factor, Ir (k ) , given by Ir (k ) exp{i[cos( k i ) sin( k i )]} , (19) 25 where symbol i represents the different phases of π/3, 2π/3, 4π/3, is applied to move the separated components back to proper positions. The shifting factor, Ir (k ) , shifts the different image components along with the superresolution information back to the center of the observable region. The moved component images, replc ci (k ) , are shown in Figure 3.14. They can be reconstructed as a superresolved image by adding them together. Once all the components are combined, a deconvolution is needed to eliminate the OTF. 3.8. Information Components Reconstruction After obtaining the moved component images, replc ci (k ) , one estimate, dr (k ) , of the object information, Dbar (k ) , in reciprocal space for each phase and each pattern orientation is obtained as dr (k ) i 1 4replc ci (k ) , otf i (k ) (20) where otfi (k ) represents the proper OTFs for the moved component images, replc ci (k ) . Each such estimate is valid in the circular region k k 0 , where otf i (k ) 0 , and k 0 is the radius of the normally observable region of reciprocal space. Many of these regions overlap, so there is more than one estimate of replc ci (k ) at the same point k . 26 Orientation = 0o Orientation = 60o Orientation = 120o 0o 120 o 240 o Figure 3.14. The moved components, replc ci (k ) . They are the results of moving the respective images shown in Figure 3.13 by the shift factor, Ir (k ) , shown in (19). The noise-optimal way to combine such independent measurements of the same unknown is through a weighted average, in which each measurement is given a weight 27 inversely proportional to its noise variance [9]. The noise variance of Dbar (k ) is 2 inversely proportional to otf i (k ) , and the noise-optimal weighted average becomes dr (k ) optimal average 4replc ci (k ) 2 otf i (k ) otf i (k ) i 1 otf (k ) 2 4otf i 1 (k )replc ci (k ) otf (k ) i i 1 i i 1 2 , (21) i where the sums are taken over all pattern orientations. For the weighted average in (21), a direct linear inverse filter without regulation, is highly unstable in regions where the denominator approaches zero [8]. To regularize the estimate, (21) can be turned into a generalized Wiener filter by introducing a Wiener parameter 2 in the denominator: drr (k ) 4otf i 1 i (k )replc ci (k ) otfi (k ) 2 2 , i 1 where drr (k ) is the regularized estimate of the object image information, Dbar (k ) , shown in Figure 3.15. An estimate of the object in real space then can be obtained by an inverse Fourier transform of drr (k ) , after appropriate apodization. (22) 28 Figure 3.15. The Fourier transform of reconstructed structured illumination image, drr (k ) . It is an estimate of the object image information, Dbar (k ) . 3.9. Apodization Apodization is used in telescope optics in order to improve the dynamic range of the image [14]. Generally, apodization reduces the resolution of an optical image; however, because it reduces diffraction edge effects, it can actually enhance certain small details [15]. In this project, the reassembled information components are apodized with a triangular window function, bhs (k ) , shown in Figure 3.16. 29 Figure 3.16. Magnitude plot of triangular function in reciprocal space, bhs (k ) . And finally, the apodized reassembled information components are inverse Fourier transformed back to real space to obtain a high resolution reconstruction of the object, fimage(r ) , which is the reconstructed structured illumination (SI) image in real space, shown in Figure 3.17. The cutoff frequency of the apodization function is set to 90% of the theoretical resolution limit, to account for the non-circular shape of the support region of the effective OTF. 30 Figure 3.17. Reconstruction of SI image in real space, fimage(r ) . It is the improved image by structured illumination technique, obtained by inverse Fourier transform of drr (k ) shown in Figure 3.16. 3.10. Methodology Summary In order to help people to understand the linear structured illumination microscopy, the structure of this method is shown in Figure 3.18. It can be taken as an instruction of how to implement this method. 31 Figure 3.18. Block diagram of the methodology. It is an instruction of how to implement the linear structured illumination microscopy. 32 Chapter 4 RESULTS The structured illumination image in real space shown in Figure 3.17 is better resolved than its conventional counterpart shown in Figure 3.6. In this chapter, the results of the conventional image and the structured illumination image are compared both in real space and in reciprocal space. 4.1. Real Space Comparison Since the object image, the conventional image, and the structured illumination image are two-dimensional images, the plots of the images consist of many columns. For the convenience of observation, columns 65 of the three images are picked to be compared. Figure 4.1 is the magnitude plot of column 65 of object image D (r ) . Figure 4.2 and Figure 4.3 are the magnitude plots of column 65 of structured illumination image fimage(r ) and conventional image DP (r ) respectively. 33 Figure 4.1. Magnitude plot of column 65 of object image in real space. It is the plot of column 65 of the image shown in Figure 3.1. Structured illumination (SI) image, fimage(r ) , and conventional image, DP (r ) , are shown together in Figure 4.4. The plots are shown to the same scale in order to make comparison easy. 34 Figure 4.2. Magnitude plot of column 65 of SI image in real space. It is the plot of column 65 of the SI image shown in Figure 3.17. Figure 4.4 shows that the peaks of the plot of column 65 of the SI image near 45 pixels, 85 pixels, and 100 pixels are about two times narrower than the corresponding peaks of the plot of column 65 of the conventional image. Thus, the SI image has two times higher resolution than the conventional image. 35 Figure 4.3. Magnitude plot of column 65 of conventional image in real space. It is the plot of column 65 of the conventional image, DP (r ) , shown Figure 3.6. Plot of column 65 of conventional image Plot of column 65 of SI image Figure 4.4. Comparison of column 65 of conventional image and SI image in real space. 36 4.2. Reciprocal Space Comparison The plots of spectrum magnitude of column 65 of the Fourier transforms of the object image, structured illumination image, and conventional image are shown in Figure 4.5 ( Dbar (k ) ), Figure 4.6 ( drr (k ) ), and Figure 4.7 ( DHbar (k ) ), respectively. Once again, the structured illumination result and the conventional result are put together to the same scale to make the comparison easier. They are shown in Figure 4.8. Figure 4.5. Magnitude plot of column 65 of object image in reciprocal space. It is the plot of the object information image, Dbar (k ) , shown in Figure 3.4. 37 Figure 4.6. Magnitude plot of column 65 of SI image in reciprocal space. Figure 4.7. Magnitude plot of column 65 of conventional image in reciprocal space. 38 Plot of column 65 of conventional image in reciprocal space. Plot of column 65 of SI image in reciprocal space. Figure 4.8. Comparison of column 65 of conventional image and SI image in reciprocal space. The comparison in Figure 4.8 shows that the spectrum magnitude of column 65 of the structured illumination (SI) image is two times broader at the base than that of the conventional image. The structured illumination image contains superresolution information residing outside the conventional OTF support region. 39 Chapter 5 DISCUSSION The results shown in this project demonstrate the improvement of the resolution of the observed image using a linear structured illumination technique. The improvement is shown in both real space and reciprocal space. In this project, a computer algorithm of linear structured illumination microscopy technique is developed. This technique allows the conventional diffraction limit to be extended by an amount equal to the spatial frequency of the illumination pattern. The extended amount is the same as the conventionally observable frequencies; the spatial frequencies that can be introduced into the illumination pattern also are limited by diffraction. Therefore, the resolution of the structured illumination image can at most be improved by a factor of two [10]. This improvement of the conventional microscope can help reveal more information about the structure and function of the objects that are researched in areas of cellular biology, material science studies, and semiconductor metrology. The resolution improvements presented here are not related to constrained deconvolution methods. The enhancements are due to physically measuring normally inaccessible information about the object [14]. 40 Chapter 6 SUMMARY, CONCLUSIONS, AND RECOMMENDATIONS 6.1. Summary In this project, a computer algorithm of the linear structured illumination microscopy theory is developed in order to test this theory and help researchers understand it. To implement this algorithm, multiple images of an object are taken with different phases and orientations of sinusoidally patterned illumination. Superresolution information components then can be extracted from these images. The procedures of separation, shifting, and reassembly of the superresolution information components are presented and explained. A block diagram of the whole procedure of the structured illumination method is presented. The results of the conventional microscope and the structured illumination algorithm are generated and compared. The algorithm is verified on test objects, and its performance is in agreement with theoretical predictions. 6.2. Conclusions The algorithm developed in this project successfully implements the linear structured illumination theory. The theory is validated by showing the result of the algorithm. The algorithm is captured in the form of a block diagram that is intended to serve as a useful reference for researchers to understand this method. 41 6.3. Recommendations A much higher resolution result can be achieved by using nonlinear structured illumination microscopy [16]. The nonlinear structured illumination theory may need to be verified by developing a similar computer algorithm like the one developed in this project. The presentation and explanation of the complicated procedures of the nonlinear structured illumination theory is also needed. Definitive values of phase shifts are required to ensure the accuracy of the reconstruction of images in this project. A method has been developed that can estimate randomly chosen phase shifts in each image to permit the use of inexpensive actuation equipment with no calibration [17]. This method may need to be validated by developing a computer algorithm with illumination patterns having random phase shifts. There is no consideration of noise in this project. In the real world, there is noise. Therefore, the effect of noise on the algorithm needs to be investigated. The improvement factor of the structured illumination result may be changed by the effect of noise. A method may need to be developed in order to reduce the effect of noise to get better image resolution. 42 APPENDIX Matlab Simulation Code The m-files: wuline.m, OTF.m, and rotxy.m are derived from E. A. Ingerman and M. G. L. Gustafsson's simulation codes [8]. 1. linSI.m % % Clear previous variables and graphics windows % clear all; close all; % % Initialize random number generators % rand('state',0); randn('state',0); % % Set parameters % nphases = 3; % number of phases nangles = 3; % number of angles fc = 20; % maximum spatial frequency na = 1.4; % numerical aperture (1.4 for oil immersion lens) lamda = 500; % wavelength in nanometers n = 128; % number of x and y pixels % % Pixel size in nanometers (using fc=2 NA/lambda) % pixelsize = lamda/(2*na*fc); 43 ki = 2*pi*(fc)/n; % % Pattern (theta) and phase angles (phi) % theta=linspace(0,pi,nangles+1); theta=theta(1:nangles); phi=linspace(0,2*pi,nphases+1); phi=phi(1:nphases); % % Generate object consisting of 2D random length and oriented rods % xcrd = (-n/2:1:n/2-1); ycrd = (-n/2:1:n/2-1); xcrd = repmat( xcrd', 1, n ); ycrd = repmat( ycrd, n, 1 ); alpha = rand(n/2,1)*pi; x1 = 3+(n-3)*rand(n/2,1); y1 = 3+(n-3)*rand(n/2,1); l = n/20+n/10*rand(n/2,1); x2 = max(min(x1 + cos(alpha).*l,(n3)*ones(size(x1))),2*ones(size(x1))); y2 = max(min(y1 + sin(alpha).*l,(n3)*ones(size(y1))),2*ones(size(y1))); D = wuline( n, n, fix(x1), fix(y1), fix(x2), fix(y2) ); rad = sqrt( xcrd.^2 + ycrd.^2 ); rmax = max( max( rad ) ); ind = find( rad >= 50 ); D(ind) = 0; % % figure;colormap('gray');imagesc(D); axis('square'); title('Object'); % figure; colormap('gray'); imagesc(abs(fftshift(fft2(D)))); axis('square'); title('Fourier Transform of the Object'); % % Generatate OTF 44 % H = OTF(n,n,0,0,fc); figure; colormap('gray'); imagesc(H); axis('square'); title('OTF') figure; plot(H(n/2+1,:)); axis('square'); title('OTF') % % Transform object to reciprocal space, multiply by the OTF, and transform % result back to real space % Dbar = fftshift(fft2(ifftshift(D))); DHbar = H.*Dbar; DP=fftshift(ifft2(ifftshift(DHbar))); figure; colormap('gray'); imagesc(DP); axis('square'); title('Applied PSF to The Object') figure; colormap('gray'); imagesc(abs(DHbar)); axis('square'); title('OTF Support Reciprocal Region') % % Generate arrays X1 and Y1 with n rows and n columns. For array X1 (Y1), % rows (columns) are identical and columns (rows) have values ranging from 1 to n. % % Example for n=5: % % X1=[1 2 3 4 5; 1 2 3 4 5; 1 2 3 4 5; 1 2 3 4 5; 1 2 3 4 5] % Y1=[1 1 1 1 1; 2 2 2 2 2; 3 3 3 3 3; 4 4 4 4 4; 5 5 5 5 5] % [X1,Y1] = meshgrid(1:n,1:n); % % Information components separation % %Use this to store the values of DIbar, which is the B matrix ( AX = B ) DIbars = zeros(n,n,nphases); 45 %The A matrix of the equations( AX = B ), it depends on the shift phases %phi phase_matrix = [1 1 1;1 exp(1i*2*pi/3) exp(-1i*2*pi/3);1 exp(1i*4*pi/3) exp(-1i*4*pi/3);]; %Inversed A matrix inv_phase_matrix = inv(phase_matrix); %Sum of the (OTF)^2 hs = zeros(n,n); x=1:n; y=(1:n)'; %Reconstruction of the superresolved image rc = zeros(n,n,nphases^2); sp = zeros(n,n,nphases*nphases); I = zeros(n,n,nphases*nphases); rimage = zeros(n,n,3); hv = zeros(n,n); replc = zeros(n,n); dr = zeros(n,n); % % Phase angles % delta=linspace(0,2*pi,nphases+1); delta=delta(1:nphases); for itheta=1:nphases for iphi=1:nphases k = rotxy(theta(itheta))*[ki; 0]; kx = k(1); ky = k(2); disp(['angle= ',num2str(theta(itheta)*180/pi),... ' phase= ',num2str(phi(iphi)*180/pi),... 46 ' ' kx= ',num2str(kx),... ky= ',num2str(ky)]); % % Real space and reciprocal space images of illumination pattern % I(:,:,(itheta-1)*3+iphi) = (1cos(kx*X1+ky*Y1+phi(iphi)))/2; figure; colormap('gray'); imagesc(abs(I(:,:,(itheta-1)*3+iphi))); axis('square'); Ibar = fftshift(fft2(ifftshift(I))); % % DI - illumination intensity times object % DI = D.*I(:,:,(itheta-1)*3+iphi); figure; colormap('gray'); imagesc(DI); axis('square'); realstg=['Illumination Patterned Object in Real Space',... ' Angle= ',num2str(theta(itheta)*180/pi),... ' Phase= ',num2str(phi(iphi)*180/pi)]; title(realstg); % DIbar is the image in the reciprocal space. we shift the image so that the "lowest" Fourier modes % are in the center of the picture. DIbar = fftshift(fft2(ifftshift(DI))); %multiply the image in the reciprocal space by the OTF. DIbars(:,:,iphi) = H.*DIbar; fd(:,:) = H.*DIbar; figure; colormap('gray'); imagesc(abs(DIbar)); axis('square'); figure; colormap('gray'); imagesc(abs(DIbars(:,:,iphi))); axis('square'); recipstg=['Illumination Patterned Object in Reciprocal Space',... 47 ' Angle= ',num2str(theta(itheta)*180/pi),... ' Phase= ',num2str(phi(iphi)*180/pi)]; title(recipstg); %get back the image in the real space. ifd=fftshift(ifft2(ifftshift(fd))); rimage(:,:,iphi)=ifd; % % end % spimage(:,:,1:nphases)=ifft(rimage,[],3); nx = kx*n/(2*pi); ny = ky*n/(2*pi); ind = [(0:(nphases-1)/2) -(nphases-1)/2:1:-1]; xx=repmat(x,n,1); yy=repmat(y,1,n); % %This part is solving the equations to separate the components % for j = 1:nphases temp_separated = zeros(n,n,nphases); Ir(:,:)=exp(-1i*(kx*ind(j)*xx+ky*ind(j)*yy)); for k = 1:nphases temp_separated(:,:,k) = inv_phase_matrix(j,k).*DIbars(:,:,k); sp(:,:,(itheta-1)*3+j) = sp(:,:,(itheta1)*3+j)+temp_separated(:,:,k); end figure; colormap('gray'); imagesc(abs(sp(:,:,(itheta-1)*3+j))); axis('square'); hv(:,:) = OTF(n,n,-nx*ind(j),-ny*ind(j),fc); % %shift the OTF by taking inverse Fourier transform and exponential %factors % replc(:,:) = fft2(ifftshift(ifft2(sp(:,:,(itheta1)*3+j)).*Ir(:,:))); scalefactor = abs(cos((j-1)*pi/3)); 48 figure; colormap('gray'); imagesc(abs(replc(:,:))); axis('square'); rc(:,:,(itheta-1)*3+j) = replc(:,:).*(scalefactor*conj(hv(:,:))); hs = hs + abs(scalefactor*hv(:,:)).^2; end end % % Deconvolution and reconstruction with a Wiener % for t = 1:nphases*nphases dr = dr+rc(:,:,t)./ ( hs + .005*length(itheta)*(.0000001)^2); end figure; colormap('gray'); imagesc(abs(dr(:,:))); axis('square'); title('Reconstruction of The Object in Reciprocal Space') % %Triangular function % [k_x, k_y]=meshgrid(-n/2+1:n/2, -n/2+1:n/2); k_r = sqrt(k_x.^2+k_y.^2); k_max = .9*.9*fc*((nphases-1)/2+1); bhs = cos(pi*k_r/(2*k_max)); indi = find( k_r > k_max ); bhs(indi) = 0; figure; colormap('gray'); imagesc(abs(dr.*bhs)); axis('square'); title('Apodization of The Object in Reciprocal Space') drr = dr.*bhs; fimage = ifft2(ifftshift(drr)); figure; colormap('gray'); imagesc(abs(fimage)); axis('square'); title('Reconstruction of The Object in Real Space') 49 2. wuline.m function y = wuline(m,n,x1,y1,x2,y2) %y=zeros(m,n); xd = x2 - x1; yd = y2 - y1; indh = find( abs(xd) > abs(yd) ); indv = find( abs(xd) <= abs(yd) ); yh = zeros(m,n); yv=zeros(n,m); if ~isempty(indh) yh = drawline( m, n, x1( indh ), y1( indh ), x2(indh), y2(indh) ); end if ~isempty(indv) yv = drawline( n, m, y1( indv ), x1( indv ), y2(indv), x2(indv) ); end y = yh + yv'; function y = drawline( m, n, x1, y1, x2, y2 ) y = zeros( m, n ); ind = find( x1 > x2 ); if ~isempty( ind ) t = x2(ind); x2(ind) = x1(ind); x1(ind) = t; t = y2(ind); y2(ind) = y1(ind); y1(ind) = t; end xd = x2 - x1; yd = y2 - y1; grad = yd./xd; %end point 1 50 xend = fix( x1 + .5 ); yend = y1 + grad .* ( xend - x1 ); xgap = invfrac( x1 + .5 ); ix1 = round( xend ); iy1 = round( yend ); y( sub2ind(size(y), ix1 , iy1) ) = y( sub2ind(size(y), ix1 , iy1) ) + invfrac( yend ).*xgap; y( sub2ind(size(y), ix1 , iy1+1) ) = y( sub2ind(size(y), ix1 , iy1+1) ) + frac( yend ).*xgap; yf = yend + grad; %end point 2 xend = fix( x2 + .5 ); yend = y2 + grad .* ( xend - x2 ); xgap = invfrac( x2 - .5 ); ix2 = round( xend ); iy2 = round( yend ); y( sub2ind(size(y), ix2 , iy2) ) = y( sub2ind(size(y), ix2 , iy2) ) + invfrac( yend ).*xgap; y( sub2ind(size(y), ix2 , iy2+1) ) = y( sub2ind(size(y), ix2 , iy2+1) ) + frac( yend ).*xgap; for jj=1:length(ix1) for k = ix1(jj)+1:ix2(jj)-1 y(k,fix(yf(jj)))=y(k,fix(yf(jj)))+invfrac(yf(jj)); y(k,fix(yf(jj))+1)=y(k,fix(yf(jj))+1)+frac(yf(jj)); yf(jj) = yf(jj) + grad(jj); end end function y=frac(x) y = x - fix(x); function y=invfrac(x) y = ones(size(x)) - frac( x ); 51 3. 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