COURSE PLAN
Instrumental analysis: Scanning electron microscopy, 5 credits
Valid for the period
2014
Course plan developed
Elisaveta Potapova, 2012-09-20
Revised
2014-02-04
Education level
Third cycle
Grade
Subject
Passed/Failed Chemical
Technology
Division
Chemical
Engineering
Department
Civil, Environmental and
Natural
Resources
Engineering
Requirement
Course participants should be accepted for post-graduate studies.
Special requirement
Goal/Expected result
After the course the participants should be able to:
- understand the physics and the instrumentation behind the scanning electron
microscopy (SEM) methods, as well as the capabilities and limitations of the methods;
- understand the effect of different parameters on the measurement result;
- to chose the correct measurement set up depending on the type of measurement to
be carried out.
Course content
- SEM image formation and magnification, electron-specimen interactions, interaction
volume, backscattered electrons, secondary electrons, detectors;
- Contrast, electron gun, electron lenses, aberration, astigmatism, resolution;
- Imaging modes, STEM, sample preparation;
- Energy dispersive spectroscopy, wavelength dispersive spectroscopy.
Realization
The course consists of six lectures covering the theoretical part of the course and an
obligatory laboratory exercise.
Literature
Scanning electron microscopy and x-ray microanalysis, Volume 1, J. Goldstein, D.E.
Newbury, D.C. Joy, C.E. Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J.R. Michael, Kluwer
Academic / Plenum, New York, 2003/2007, ISBN 978-0-306-47292-3.
Examination
- an approved laboratory report;
- passed written examination.
Examiner
Bärbar/SBN/kursplan doktorandkurs ver 120413
Assoc. Prof. Johanne Mouzon, Division of Chemical Engineering
johanne.mouzon@ltu.se, tel. +46(0)920491960
For more information contact
Dr. Elisaveta Potapova, Division of Chemical Engineering
elisaveta.potapova@ltu.se, tel. +46(0)920491776
Bärbar/SBN/kursplan doktorandkurs ver 120413