NOT MEASUREMENT
SENSIUYE
h
MIL-STWI05E
10 MAY 1989
SUPERSEDING
MIL-STD-105D
29 APRIL 1963
MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION
BY ATTRIBUTES
AMSC N/A
AREA Qcil
●
~~~
& Approved for public reiesse; dktribution
is Unlimfi
!QL-”SI’D105E
DEPA~
W DEFENSE
Washbgmn, DC 20301
SAT*LDG
P~
T I!ND’ZABESFOR INSP=TI@JBYMTNBUES
and Jqencies
1. Ttis tilitarystandad is approvedfor use by all Depsmmms
of ~~~
of ~f-”
.
Cemmm&tiom.
additions,Wetions) and any
2. Beneficial~.ts
peeine.ntdatawhi~ may beef usein~this~
shouldbe
addressedto:
CnRInancier
Dwelopnent
Amy AmamE!!!Rem-a,
‘+-king
Ckmer
M-IN: SK?R-BAC-WBM!J . 6
Picatinnytisenal,NJ 07806-5000
Us.
by usi..g
the self-a=-essed&.andardizat
ion Dmmmt
(DD Fom 1426)~L-hq
at the md of this docmmt
ii
and
m~
or
PrepSal
letter.
MZL-S’IZ+1C5Z
mRE3m*”
ms
providessawling proce&res and referwm
tables for use in
on the pxobabiiis.icrecu.+mce 05 e%.ts when a sa~ies of-iots or bat~s
produ~ ti a stableenvironmrt.
are
of an
This publicationshouldbe-used to guide the user in the ~kpmnt
inspee.ionStratw that providesa co=. eff~ive qroach to attaining
ats. The
te-&%i~ reqJ
cm-:idm~ in pro&t ~liance wi”thca%racaual
user is warned of the assumedrisks relativeto the *sem sanple size and
w-.
~ifications shouldnot contakn requirement
s for use of specific
Q.z?s, !23Z shxld “.!y provideAQL’s or H?D’s as a -~rmem.
pkns fc= coxinuous, ra’hr than lot inspection,are contm
iii
M
~L-.STD-lO5E
GmTmTs
Page
Paragraph
1.
1.1
1.2
2.
2.1
3.
3.1
3.2
3.3
3.4
3.5
2.6
3.7
3.e
3.9
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
3.19
3.20
3.21
3.22
3.23
4.
4.1
4.2
4.3
4.4
4.4.1
4.4.2
4.4.3
SCOPE...............................................
1
...........................................
.......................................
1
-se
*liation
~IxmPEurs-
1
...............................
1
qplicable ....................................
1
=INITIONS .........................................
1
Acq.able
Qdality Ievel WE) ....................
Average Outgo
~Quality(lQ) ....................
Averaoe OutqoingQualityWt
(AOQIJ
.............
Classificationof Defects.........................
CriticalDefect...................................
CriticalDefective................................
Defect............................................
D@eccive................. ........................
DefectsPer Ru@edUn its... ......................
..................................
~i~......
~aim
by Attribxes ..........................
w&or Batdl......................................
Im or Batch Size.................................
Major Defect......................................
Major Defective...................................
Minor Defect .....................................
Minor Defeaive. ..................................
PercentDefective.................................
~s
Average...................................
Sanple............................................
Sanple Size COde~tt=v ...........................
Salq?ling
Plan.....................................
unit of Procalct
...................................
2
2
2
2
2
2
2
3
3
3
3
3
3
3
3
3
3
4
4
4
4
4
4
W.
●
~mxm=’nm
4
. . ... ....... ... ... . ... .. .. ......
4
4
5
5
5
5
5
................................
Written ~
NmcVnfozmne ....................................
Fonmticm and Itificatim
of ~
or =Cks. ..
...............................................
........................
ML use...0...........*...
Umkation ........ ...............................
choosingAQU .....................................
●
.
iv
mL-sm-lo5E
CcNTmrs
Conttiued.
-
Page
Paragraph
~B~
Sarrpling.
........................................
..........................
RepresentativeSan@.ing
4.5.1
The of Sanpling.................. ..............
4.5.2
Double or MQtiple Sampling
......................
4.5.3
.................... .......
4.6
~on
P~
.............................
4.7
WitdlirlgP~
....................
Normalto Tightened......0...
4.7.1
4.7.2
...................
Tightto Normal .....0....
..
..............*.....**...**..
4.7.3
Normalto ~
4.7.4
Rduced to Normal................................
4.8
Disconthtion of~on...
.................
4.9
SanplingPlans...................................
4.9.1
~ion
Wvel .................0...............
4.9.2
Co& utters .....................................
4.9.3
~aining San@ing Plan..........................
4.9.4
TYF= of sapling Pkns ..........................
4.10
Determinationof~ability.
..................
4.lC.1
P~Defective~ion.
....................
4.lC.1.A Single Sanql@ Plan.............................
4.1(?.1.2Double Sa@ing Plan.............................
4.10.1.3 FhltipleSanpling.
.......
Plan.......... *........
4.10.1.4 ~
for
Redu*IrqeCtion
.........
p~
4.10.2
............
DefectsPer ?lundmdt?nit s~ion
4.11
Idniting@ality Protection..
....................
4.12
~s
.................*.........................
4.12.1
~t@~merkic
~
..................
A~ge
Sanple Size Comes... ....................
4.12.2
●
5
5
5:
5
●
:
6
6
6
6
●
●
●
“7
7
7
7
7
8
8
8
8
8
8
8
9
9
9
9
9
5.
...............*..
...........
TABES .............*...*
11
I.
Sa@e Size Coda Mitters..............
o..........
Single San@ing Plans for Normal~im
Naster table)......................
Single Smpliq Plms for Tightewd
~i~
~=t~le)
o..o-oooo=
==oo.=.e....
Single Sapling Plans for ~
~ia
(Mas@rtable)......................
Double SamplingPlans for Normal
~i~
-a~le)..
oo......o.BOO.......
Dcxble Sapling Plans for Tight~m
~er=e)
......................
Double SamplimgP1.ansfor Reduced
~im
(Mastertable)......................
13
Table
II-A.
II-B.
II-C.
III-A.
III-B.
III-C.
v
14
15
16
17
18
19
MIL-STW105E
mt’n’mrs-
Conthued.
Page
Table
Mltiple Sa@ing Plans for Norml
Inspectim M3ster-le) ......................
M.dtipleSanplingPlans for Tightened
IV-B.
~im
(MastertaMe) ......................
Mdtiple SamplingPlans for ReduOed
TV-c.
Inspection(Mastertable)......................
IAmit F~s
for
V-A.
Average Outgoinguty
lwml~on
(Sin@e Zq)
.....-...o..
V-B.
~ge
Outgo* QualityLimit Fa=ors for
TightenedIMpeCtiOn (S=le ~1~).:...-..”
%3-A.
uting
Quality (h Perumt Def-iue) for
Wch a Pa = 10% (forNomal Inspemion,
S~le Saxrpling)
....................-..-...-*o”
LimitingQuality (inDefectsper ~
V3-3.
Unks) for which the Pa = 10% (forNozmal
Inspection,Single Sanplhg).-..--------------XI-A.
Unliziq Quality (inP~t
mfecti=) fo~
khid. “thePa = 5% (forNom@ ~ionl
SingleSawling)................................
LimitingQuality (fiDefectsper Hmdma
VII-B.
Units) for which the Pa = 5% (f= W*
....*..............
Siwle S=@@
~m,
~*~1Li,mitNmbersfor ~
Inspection...
..........
Auerage SampleSize Cumes for DDuble and
IX.
FmltipleS.mpliq .............-...--.-......-.c~ltig
pl= and cparatirq~amic
Cumes (andData) for:
San@e Size ~ktter
A........................
X-A.
X-3 .
Sanple Size ~Utter
B .........................
x-c.
Sanple Size Mkter
C ..........e00-00o.......
X-D.
San@e Size Co& LetterD ........................
X-E.
Sanple Size ~Utter
E ........................
San@e Size Mletter
F ........................
X-F.
Sanple Size MUtter
G ...............--..-..”x-G .
X-H.
~le
Size @ckletter H ........................
X-J.
qksM-~
J............*..”””””.”.”
X-K.
Sauple Size MIetter
K .......----------------X-L.
~le
S~M~
L ........................
x-M.
Sanple Size M~M
...........e............
X-N.
San@eSizeM E~N
. .......................
Sal@esizeM
wtterP
. . . . . . . . . . . . . . . ..”....”.
x-P.
~le
S~Mk=
Q.......*”+”*.==.*”+”*..=
x-Q.
X-R.
~le
S@ Mk=R
..................=””~””
IV-A.
vi
20
22
24
26
27
28
29
33
31
32 “
33
34
36
38
40
42
44
46
48
50
52
54
56
58
60
62
64
mL-sl’wlo5E
,
CCN’TS
- Continued.
Page
x-s.
~~e
size ~
~tt~v S ........................
66
Paragraph
6.
6.1
6.2
6.3
........*..............................
●
. . . .
use...................................
(keyuofi) tist~ ................”
Issw . . . . . . . . . . . . . . . . . . . .
~fr~P~im
v
Intf2nckci
67
Subject’I’em
67
mlmsAL. .............................
67
68
F2L-S’ID-105S
1. ~~~
This ~li=tim
establisheslot or bat~ sapling plans and
1.2 Pqse.
publi=tion shallnot & irfterproceduresfor ~ion
by attributes. ‘1’nis
words
s. m
p.reted
to superm3e or confli= with any amtraCtti ~
to
the
contractor’s
use
of
refer
only
“a~”,
“acceptable”*
e
tc,
“awqX”,
~anddonotinplyana~
W
the sanplingpkms Writin this
of aqability
by the
-theGove&mmnt to accept any prcdom. Deterfnination
me
Sarfpling
plans
Gwen ‘:=% shall k as desm~
in contractual~ts.
*sdhd
in
Ws
standad
m
awli-le
to U’s of .01pe~t
or ~~
and
are‘the.ref
ore not suitablefor ++lications where quality1-1s in the defemive
;az.s per million range m be realiz05.
are applicable,
items.
a. ElrIc
b.
Cmponents
c. Qerations
d. Materialsin process.
e.
Su@ies
in storage.
f. Maintenance~ations.
9. Data
or
records.
h. Mmbistrative ~Theseplans are intendedprimarilyto be used for a continuingseries of lots
The plans may also be used for the inspectionof isolatedlots or
0: batches.
Mches, W., in MS
latter=,
m
=
K =i~
to ~t
~
~m
characteristicmrves to find a plan whichwill yieldthe desiredprotectim
(see4.11).
2.
2.1 N&. -liable.
3. =INITICNS
1
FEL-S’IW105E
#
~able QualityLevel (ML) . When a mntinuous seriesof 10Es is
3.1 z
considered,the AQiiis tbe qualitylevelfib, for the roses
of sa@@
~.ion,
is the limitof a satisfactoryprocessaverage (Se 3.19).
NOTE: A sanpl~ plan and an AQL are chosenin accordanm with the risk assured.
Useofa@ueoflQL
fora a2rtain&!fector group of &fec5s indicam that the
pbded
the
ql~
PM
till acoeptthe -t
majorityof the lots or bata
prooess -X
level of ~
defectiwe (or&fects per huxlred units) in these
Thus,
the AQL is
lots or batchesbe no greaterthan the ~ignated value of A&
a ckignated value of ~
defective (or&facts per hundredunits) for fich
~re
bing used. The
btswill~a~+m~oftk
timbythesaqlingp
of a~
~liw
pl~ prfi~
here~ ~
~ ~
tit ~
p~i~ty
at the ~ignat~
A@ ~ue ~
~
the sanplesize,~
Z~N
~Xr
:0= 1~~ samples -n
for mall ones, for a givenAQL. The AQL alone does not
idelm=if
y the chanoes of aqing
or rejectingindividual10Ls or batches M
m...-y
frun a seriesof lots or batches,
dire~ relates to what might be ~ed
to
prm”i- *
steps indi=ted h -s publi~tion aze “taken. lt is ~sary
the
relative
~
of
t.te
plan
to
*texmine
=eYer to the operattigdarad.=”iscic
risks.
3.3 Average Qxqoing QualityLimit (ADQL). The M(2L is the maximum ACQ fora
ML tiues are givm M
9L~ a9L~~
-lW
pkn. Factors for ~@?
Tabie V-A for each of “~ singlesaqlimg plans for normal irqection and in
“on.
Table V-3 for each of the singlesmpling plans foz tightened~
of defectsis t!! enumerationof
3.4 ClassifimEion of Defects. A classification
of the unit of pxduct
classifiedamrdirq to their seri~.
pcsstiie defects
3.5 Czlti~ DefS&. A criticaldefect is a ~fect that j~
and ~ri=ce
~mte
would result in
hazardousor
unsafeconditionsfor
individualsUS*,
~
ora ~fecttbat~ti
--,
or ~upontheprodwt,
of ttE ~cal
fun-on of a
indicate
is likely to prevent perf~
experim
title.
major *
itm SU* as a Ship, aixuaft # tank, nbsile, or ~
3.6
Critidl Defective. A criticalckfectiveis a unit of prockt uhi~
contti one or mre criti~ defectsti may also contdn mejor and/or minor
defects.
3.7 Defect., A defect is any nonconformanm of the unit of product with
specimTEi%@l=mts
.
2
laks’m-lo5E
3.8 Def-.ive. A def=~ive is a unit of productwhich containsone or mre
defe.s.
Defe.s per HunckedUnits. The nwber of defe=s per hundred units of ~Y
gim quantityof units of productis one hundredtimes the mm&r of &fects
being
possible
in
any
unit of product)
con=zinedtherein (one or mme *fec&s
diviti by the total nunberof units of product,i.e.:
3.5
Defects
p“
=
hundredunits
Nunberof &fects x
Nmbar of units ~~
100
~gt
3.2C Impaction. Inspectionis the processof ~imt
cr o-.?m.isecmparing the unit of pmdu~. with the reqair-nts.
testmt
T
~io~
by Attribtes. Inspectim by attributesis inspectionwhe~
eizher ‘& unit of productis classifiedsimplyas defectiveor non+ef=eive, or
to a givm
~he number of defe~.sti the unit c= prcdue.is courted,with re~st
~~:i~m
or set or requirements.
7,1i
---
or -t&l. The term lot ox katch shall man “inspectionlot” or
3.12 tit
“i==se.ion batcb.”,i.e., a collee.ionof units of product from whi~ a sanple
is EC be dram and i~ed
md may dif5erfrm a mll-~ion of units designated
as a 10= or bat~ for 0“= purposes (e.g., production,shipnent,etc.).
3.13 bt or Batch Size. The lot or ~t~
A a lot‘0:bata.
size is the number of units of prtib
3.14 M3jor Defect. A major defecL is a -fact, other than criti-, that is
liKelyto resultin failure,or to reducemateriallythe usabilityof the unit
of productfor its int~~ajor * f~i~.
A major defectiveis a unit of product whid? containSone
0: mre major defects,* may alSO contain rrtiordefecLsbut containsno aitidefect.
3.15
isnot-yto~
3.16
Minor Defect. Anbm~i.Sa&fti~t
materiallythe usabilityof the unit of productfox its intpuzpose~m is e
~WviIgU*~@m
tkeffeCtiWUSec
fran ~
&par&m
operatim of the unit.
3-17
Minor
-— . . . Def-i-.
—
--ox more minor &facts
A minor defectiveis a unit of P-a
M*
no aititi or major *feet.
mtamtains
3
~
~
!!GL-SB105!2
3.16 Per-m
Defective. The percent &femive of any givm quantityof units
of produe~is one hur&4 tires the n~of defemive units of prda~. contairEd
thereindiviti by the total mmber of units of produa, i.e.:
?ercentDefective
=
Nmber of &fectives x
~“
of lmits ~ed
100
&fective or
3..19ProcessAverage. The Drocess average is the average~t
of product
averagenmber of &fects pez hw@red units (whichever is ~li~le)
szhitted by the sq@ier for originalinspection. Originalinspectionis ~
firstinspectionof a pa.z.zicula.r
quantityof produceas d.istinguis@dfran the
~ion
of productwhi~ has been resu&nittedafterprior rejection.
3.2C Sa~le. A sampleconsi=.sof one or mre u..irsof productdrawn fran a 10=
to their
or &z&, the units of the sem@e being sele~beda= randomwithoutrq~z:icy. ~
nmtx= C: units of product in the sample is the sarplesize.
3.22 SampleSize Coae Utter.
ElO.ngWitihthe WA fcr l-tins
The sanple size code letter is a deviceused
a sapling plan cm a table cf semplingplans.
3.22
A sanplingplan indc!caces
the nunt?erof units of product
Sa?’@hg Plan.
ad (sanplesize or seriesof
fromeat’.io= or bat&. which m
to be insoect
sa@e sizes)and the criteriafor cke.rmi.%ngthe acceptabilityof the lot or
batch (acceptan02anc rejectionnumbers).
?.23 ‘Unitof Prodxz . The unit of produ~. is the thing inspectedin o-r to
&.emme
lts classif~mtion as defectiveor non-def-hive or to count the ~“
of +.fecbs. It my be a single article,a p&ir, a set, a hmgth, an =8
~
operation,a volme, a cmpcmmt of an end product,or tlw end prociuaitself.
SWPIY,
The unit of p~GL
may or my not be the same as the unit of ~,
production,or sh.ipnent.
4. QN=AL
RmJIm=m
are o~ily
davelopedami made
4.1. Written P~
. Written p~
“Ve’s~,lqmnmquast.
-avaalablefor *
Govemmm
~
writtenp~
indime me of this stmdard, they shall amply with mq’111
raErltsof this stmdard arxlZefermce appropriate~
as ~.
ofpro&ct sbaube=rP=4.2 Nonconformance
. ‘he extent of nonconf~
titS.
eitherin terns Of peroentCkfectiveor in term of ckfectsper ~
MIPST’D-105E
4.3 Fo.mationand Identificationof Uts or Bat&es. Theproductshauke
as-led
into i-tifiable lots, -lots, batches,or in otkr manneras
may be paaibed . Ea* lot ox bat~ shall,as far as is practicable,mnsist
of units of prcduct of a singletype, grade, class,size, and composition,
.
manufacturedunder es-tially the sam renditions,and at ~ythesam
tine . The lots or batshall be itified
by the contractorand shallbe ke
intar.in adequateand suitablestoragespace.
4.4
AQL.
4.4.1 AQL use. The AQL, to@ther with the SaupleSize b&
plans p.mcw
herein.
. the sapling
.
~
ln&?Lnc
Letter,is used
for
4.4.2
Iimita:ion. The selectionor use of an AQL shallm. inplythat the
cwcractor has the right to sm@ y any defecEivewilt of product.
4.4.3 Chmshc ?@’&. Diff~t
~Ls IllSy
be Chosenfor ~
of &fects
cms.ide.red
colle.+.ivel
y, or for individual&fee&s. An ML for a groupof &fec
my be tiosen in a~cion to AQM for individualdefects,or mkqraps, within
chat group. AQL values of 10.0 or less my be expressedeither in ~t
&fective or *. ~fects ~- hunckd units;those over 10.0 ZhaU be qressed ix
defe.s per h!mdmd
“
units only.
4.5 Saxlplinq.
4.5.1 Repmsmt ative (Stratified)Satrplinq.When ~ropriate, the rnzr&r of
units in the sanple shall & sel~ed in proportionto the size of subletsor
-bat-,
or -s
of tM lot or bat~, idmtified by q
rationalcriterior
when represemathHaIcpMn
giswad,121e units
franeaal Sublet,sub-batch or
part of the lot or batdi shall be select”ed
at ranch.
4.5.2 Time of San’Plhq A samplemay be dram after all the units caprising
the lot or batch have bi+enassembled,or sarrple
unitsmay be drawn duringassak
of the lot or bat~, in uhi~ case the size of the lot or M*
till k *te*
kefore any ample units are dram. If tk sampleunits are drawn duringas~l~
oftklot
or batda, mdif tkrejectionnmb2ris
~m!foreth
lotis
Curpleted,that pomim of U
lot almldy cxmpletedshallbe @ected. m
a
oftkdefective ~shall
bedmermined and ammctive actiontaken,after
*.
&ichanewl otorbat*shgd.lk
4.5.3
Double or Mltiple Saup1~
WherI&&le or mkiple sauplingis to be
used, ea~ qle
shall be selecte&Ovar the entire lot or bat~.
5
IaL-s’Iwlc5E
~ion
Pr~.
Normal inspectionwink-at
the startof
shall continueundwqed for
inspection. Normal,tightenedor redu~ -bion
an sumsive
lots ox batd7esexq. where the
each class of def~s or &fectiws
*1
givm klw
require -.
m
swit~
P~?
p~
%it~
oz &2f_iveS ~
<Y”
be -lied to each class of ckfecSs
4.6
4.7
%?it-
P~es
.
normal inspectionis in effect,ti@tened
4.7.1 Normal to Tightened. ~
*mim
shallk institutedwhm 2 ouc of 2, 3, 4, or 5 comecutive lots or
“tted lots
batches have been rejetted on originalhspection (i.e.,ignoring~
0: btC!!S fOr thiS Fr~)
.
4.?.2 Tig?l:enee
to No.mal. When tightened~ion
is -b effect,no.mbal
inspecuon shailbe instituted*=I 5 consecutive10:s or baccbeshave -n
on.
co.nsidey-a-ptable on original~
4.7.3 No.mal to R@xed.
When normal inspectionis in effect,reducedir++ion
shal1 be -.ituted providedthat all of the followi~ conditionsare satisfied:
(ormre, as indicatedby EYW note tc
6. Tne pretig
20 lots ox batTa5~e VIII) have bee!!on no.mal ~ction
aiidall have ben acceptedon original
inspection;and
(orbf~)
fi ~
~~es
~
~
b. The.total nurber of ckf-i=
p.re
ceding 10 lots or batches (orSU* Ot&r mmber as was used for condition“a”
-)
is equal to or less than the a@i-le
nmber given in TableVIII. If
dable or mikiple smpling is in use, all samplesinspectedshouldbe ~ti-,
+les
only; imd
Pro@cLion is at a steadyrate; and
RE!cked~
“on is consi&rr
&sirable.
4.7.4 RedWed to Normal. _
~
~ion
follcwingomu
shallbe institutedif any of -
is in effect,normal inspection
on originalinq3acEcion:
a. A lot or bat~ is rejected;or
b. A le. Or batd) is comi4.10.1.4,or
acceptaMe under the procedueS of
c. Productionbecmes -=
d. Other conditims ~ant
or dela~;
or
that normal inspectionshallbe instituted.
6
MIL-SIW105E
4.8
Discontinuation
of 1~
ion. If the cumulative nmber of lots not
acce~.edin a sequenceof mnsecmive LuLs on originaltightmed inspection
r~achesfive,the acceptan~ prm3dures of this standardshall be discontfiued.
Inqlm
un~- the provisims of *thisstandardshallnot be ~
until
mrrective actionhas ~
takZ7. Tigthened~ion
shall then be used as if
4.7.1had been invoked. .
4.9 SanplinqPlans.
4.9.1 InspectionM.
The inspectionlevel &termines the rela+~onship~
the lo: or &t* size and the sanplesize. Thehspemion levelto be used for
any pa.mieti~-re@~c
will be as prescribedby the contractor’swritten
Three
in.spec.ion
levels:I, II, and 111, are g:van in Table I for
-“-es.
P-~
ge-.-erai
use (see4.1). Normally,hspee~ion Level II is us-. Hmmmr,
In~=.ion @vel I my be used whm less dis=”wtion
is needed,or Ievel 111
my be used for greaterdiscrtition.
Four additionalspeciallevels:
S-1, S-2, S-3, mti S-4, am gimn in the same tabie and my be used where
relaciveiysmall sanpiesizesace necessaryand large sa@ing risks can or W.
& mlerat~.
In the selectionof inspee.im ievelsS-1 tc S-4, ~
must be exercised
avoidAQii mm.asistent w“iti.
these ~eion
levels. Lm OLk”
words,
the
~
inspemion
levels is to keep sanplessmall when ~saxy.
For
of the
special
in.stanae,
the code iectersunder S-1 go no funk: than D, equivalentto a siql
sanpleof size 8, but it is cf nc use to choose S-1 if the AQL is 0.10 ~.
f
which the mhinm ample is 125.
N3TE:
Sanplesizes are designatedby wck letters..-Table I shal
4.9.2
Co& Letters.
be used to find t& applicableco& letterfor the ~icular
lot or batch size
and the p~iked
impectl“on level.
4.’3.3retainingSallp
lillgPlan. TTieAQLandthe m& letter shall be usedto
=ain tne sanpl.irq
plan fran Tables II, III, or IV. Whm no sapling plan is
availablefor a given cabination of AQL and code letter,the tables directthe
user tc a differentletter. Thesa@e
size to beusedisgLvm
bythenew co&
letter,not by t& originalletter. If this p~
leads to differentsample
sizes for diff~
classesof &fects, t& code letter m ~tothe .
~
sa@e size derivedmay be used for all Classesof defec+s. & an
alternativeto a sirqle sauplii plan with an ~
~ofo,
the plan
with an a~
ly Mqer sauple size for e
m.mberof lwithitscomeqmmbg
&signated AQL (wkre available), may be ~.
7
MIL-S’ID-105E
4.9.4 Types of Sanpling Plans. Three types of sapling plans: Single,Double,
and Wlziple, are givm h Tables II, III, and IV, respectively. Whe!!several
:ypes of plans are availablefor a given AQL and code letter,any one may be used.
A decisionu to t= of plan, either single,double,or titipler ~
~l~le
@
*
letter, will ~ly
&
~
~
*
~ison
bet=
for a given ~
diffitity and the ~ge
sanple sizes of the availableplans.
the administrative
7he averageszmplesize of multipleplans is less than for -Ie
(~
M ~
case co.~
to si@e aqance
n-1) and both of these m
always
less than a si~le qle
size (seeTable IX). US@lY m
~~a”~ve
difficultyfor singlesmpling and the cost per unit of the sanple are lessthan
for double or mltiple.
4.lG Daennina:ia of Amsmability.
4.2G.I Pe~nt Defeaive Inspection. To determinea~
ility of a lot or
bate!!mder percentdefectiveinspection,the appli-le. San@@
plan shallbe
used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@
4.3~.l.4.
4.IC.I.2 Shgie SanpLingPlan. The n-”
of sanpleunits inspecxedshallbe
qua2 tc the sanplesize givm by the plan. If tk n-v
of =f-.if~
the sample is equalto or less than the aqan~
rnmber,t& lot or bat~ shall
‘m consideredaqable.
If the nmber of &feccives is equal to or great-”than
the mjemion nwker, the 10= or bat~ shall be rejected.
4.10.1.2 Double SamplinqPlan. Anuberof
sa@eunkS6S?ud
to the first
sa@e size giw by the plan shallbe inspected. If the mmber of def=ives
found m the firstsanple is equal to or less than the first~
nmber,
the lot or bat- shallbe consia~le.
If tb ~
of W-W
found inthefirst sample is equal toorgmater
than the firSt z@eCtim~l
the lot or batd shallbe rejected. If tb nmber of &fectives fomd in &
firstsanple is betweenthe first~c
and rejectionxnzc&rs,a ~
sanpleof the sane size shallbe ~ed.
TM ~
of a-i=
fin
the fixst and secmd aanpks shallbe ammlated.
If the ~tiw
~
of
mmber, the lot or batd
*fectives isaqualto or less thanthesemnda~
shallh cmsickred a~le.
If the cmdative rnmber of &fectives G equal
toorgreaterthan~~
rejectim~,t&lOtOrk*
aballbe
= jetted.
im. 4.10.1.4
special
P~for~xnSJect
Xed13=d ~im
*
Sanplingpmoadura may t~
or rejectionaiteria
Withult aith=ac=pt==
m--”
~
*l~or=*~~be-acceptable,but normal
reinstatedstartingwith the next lot or
batch (see4.7.4.b)
.
8
.
mL-Slmlo5E
a-ability
of a
4.10.2 Defectsw
Hundredunits Inspection. To &temine ~
ion, t& promdure specified
k&feCts ~“ hundredunits ~
lot Or batti
for pemem 63feGive inapecxionabove shallbe “-, ex~
that the woti
“defects”shallbe substitutedfor “ckfectives”.
4.~1 ~i”
mg QualityProtection.The sanplingplans and associated~
given m this @liatim
were designedfor use _
the units of product are
prodmed in a continuingseriesof lots or batches mer a period of tire.~t
‘” the lot or batti is of an isolatedmm,
it is ~irable to limit the
ML mlw, Z
=lec&im of sarrpling
plans to those, associatedwith a ck2signated
prouidenot less than a ~fied
limitingqualitypmtectim
-W
pldns for
this purpose-. be selectedby dmosing a LimitingQuality (L@ and a ~’s
risk to be associatedwith it. TablesVI and VII give values of W for the
If a
the cmnonly used ‘bonsmer’srisks of 10 ~at
and 5 ~t
~bively.
s risk is recpired,the O.C. cumesandtheirtabutiffe.mc value of co~’
lazed valuesmy be used. The conceptof IQ may also be useful in specify+q the
on Levels for a seriesof lots or bat-s, thus fixim mimmm
L-L and ~~.i
s*ie size-vhere there is saw reason for avoiding (withmre than a-gima
corsmer’s risk)more than & Limking p~rtion
of def-kives (or defects)in any
single lot or bat~..
●
4.X2
Cum?es.
The qerathg ~ctaistic
mmes for
4.12.1 @crating Characteristic
~s.
shown in TableX, indi~=e the pe.roentage
of lots or kt~
normal -~ion,
whAti may be ~ed
to be acceptedunder the various sapling plans for a given
pmoess @ity.
The mmes shown are for single sapling; cumes for tile and
mlziple saqling are xmtchedas closelyas p-i-le.
The O.C. cumes shown
for AQIs greaterthan 10.0 are based on the Poisson&ibution
ti are ~li~le fo= defectspax hundredunits i.nsp&tion;those for ~
of 10.0 or less and
sanplesizesof 80 or less are M
on the binanialdistrikmim and azz
applicablefor perdefecLive~-ion;
those for AQE of 10.0 or less and
sarplesizes1-than 80 am based the Poissondistributionand m
~li-le
eim- for defeczsper hundredunits hsoection, or for percent de@ctive
.Onto the
inspection(thePoissm distribution
&&g an ~te
q~
timid
distrih.tim these conditions)
. TaMhted mluas,
selectedvalues or pmhabilitiesof aqanue
(Pa,in ~)
are gif= a&
ofth CUmes -,
an& in addition,for tightenedimpectx“on, and for Mperhundred units for ZoflO.
O orlessand sauplesizesof800r
less.
4.~2-2 Amage Sqle SizeOzrves. Averageample size mrves for ~le
@
show the averagesa@e sizes wMA may
mltiple sanplingam in TableIX. =
levelsof prooess
be qed
to omzr un&r the varioussa@ing plans for qcumailmnt of ~im
aml are ~roximte
quality. The
the m-t
tha-m
e=
upon the Poissondistribution,and that the s&e
sizes for double and multiplesamli.ngare assmed to & 0.631n and 0.25n
size.
respectively,
where n is the
MIL-SlW105E
/
SEXZIC)N
5
TAW3SANOG7E7VES
u
.
<ma
<4<
Vvu
C=W
=aa”
9
CODI
LETTEN
1.3
SINGLE
NORMAL
14
?
s
w
G
H
we
la
P
o
n
9
SW
m
..
ns
L
u
M
ao
II
J
—
#w
to
r
—
o
n
Ii
a
s
a
c
4
e
Ialu
do.
b.
0
12
r)
1?
01
ldJ
M@
—
—
)4
11-6 — Single
n
01
TABLE
0.40
satnpling
/or tighened
01
!
km
.
I.e
‘plans
itlspeclitm
(Muster
table)
(s0?
4.9.3
and
MO
—
4.9.4)
I
MIb~105E
SINGLE
REDUCED
16
-SK)-105E
17
DOUBJ
NORMI
I
—
?
?
*V*?
l,+
.
---l=
_LL
Idle,
I
.
m
c--
e
Ilu
Il..
II*
hew,+1.,
PI.,
e-a~w
.,.aI,
h,,,*,+ ’., ,1,.
- n,,.~,rw. ● 8d94
-
—
,Iti+,
..I,,
I
VI
●
.“
.w,I.-.
.h.m.11..l,
11s*w1..*I.
?!
6:
—
:
1. Il.
441. . ...1..,+
A
I,,,b,. . ..l
,..,..,,,”8
.h.
w . ..4.!1.1
tm ,.. ,., ,.,, -, ,,,.
$, 1....1.
1-1..
.,,...1. l.. e. tn. wh.,,.
I
4.
A,.,sl.l.l. 1,..,1.
n
n
●
(
.. .
I
n
*
—
I
—
1.
IIW pha h,
l-k,. urn*I,,,., me
l:. t. II
,I,lbl
, It 1,
— *
—
.
II
(
II
.
I
l
61
13 I
—
b
1-
.
h
●
b
I
—
—
.“ i
t:
II
.
.
;>
11
,,
I
(5ee4.9.3.ml 4.9.4)
DOUBI
mua
u
MULTIPLE
NORMAL
20
KUF~105E
.1
I
1
?
“.
.:
I
..
G
-”--*
1.- ”-----
;
I .8 -----}!-!
H’ sl~l””----1
9
~
-.--.w.ei
z
“*----”
-------
+ .. *+.-..
C.. --.
s ““-----
.* -----
*
-“------
-.o===~
Z=Z:
i
-
*- *-..:
‘------
.
9
.0
.---
m-.
***-
.. -”---
-----
-
-
9 .. -.--”
.0 ----“..”---?!
.
.
i
n-----
-
.--
. . .. ---t
✍✍✍✚✝✝✚
D-
“------
””1----””l
----””.- o-a..
4
-00 --------● ✍✍☛✍✎✍
✍✍✍
-m-:=
..-
““-----
f—
r
a---=:~
..-
-*j..-*
.* .0---
-
.----~~
--.--*3
..0---
=m
. ------
r. ..
-..
. ..0---1
1“
..
21
.--
. ..----1.*-”*-.
““*
I
I
I1.-”----
-----
.
“------
-------
*.-
I
II
!I
--1===---=1A
-o=:~==
“aa
-,-
i
1=
o.”.-gn
---
*--0--------.--------
0-...=:
.-
l=lsl”=”l
2
i
:.-
t
...=
E’”
m
jz
d
.
-------I..-----1------- ----.-~
------I -------
a
a
:
.--
”-.*
i-----=:
------~
.- ”---0
‘~
---=:==
--.====
0“--.--
=1=1
+1:::::::
:::::::
:::::::1:::::::
-------1-------, -----:=1--”-;2
!-,. 10” ~
;::::::
:
i:i
+
-:
I
I 2 l+”
II
-
.“-..”.,.-
●
00---.
‘-----51-------
●
0---.-
1‘------
--””
”-0
i-------
. . ..-
0 “.0.=:
I‘-”---q
.
d
=
e.i
Iiit
:010
[11
ecw.
:.
..
MULTIPLE
TIGHTENED
22
MULTN
TIGHTEN
23
.
1
•!
r
:
=
.
MULTIPLE
REDUCED
24
MULTI
mu
25
.
20
1?
r
3is
Soo
Wo
12s)
mo
N
P
Q
w
m
1%
K
L
M
32
30
20
9
13
22
s
3
2
SkO
TABLE
—
1.02!
—
).014
Ju
.01
1.1?
0.1!
—
—
—
—
.097 I.
16
.(M
041
—
—
1,73
1.%
—
1.2
O.ai 1.2
1.0( 1.4
—
—
0.9( 1,3
).22).33L41
L56
1.6
1.7
l.?
2.0
1.(
0.91 1.6
1.1
1.1
—
1.0
—
—
Q&
—
~.~:
—
L40
1.44 ).62
—
—
).39 ).63
).42 ).69
).6?
1.2
—
).60
—
Lhd
).s2
—
).24
)21
).27
—
L74
02s
—
Qwdity
).46
—
—
1.16 MS
—
1.17
).11
.
).11
).10
.061
—
074
).12
—
—
1.29
L10
—
—
1.04( I06s
—
—
Otdgoiug
‘.02!
—
V.A — Average
I.B
1.9
2.1
—
2.2
2.5
2.4
2.?
2.6
46
1.s
Factors
2.9
3m
33
3.6
4.4
3q
4.3
—
4i
74
2.s
—
4.7
—
C.7
5.2
5.6
—
6.3
6.1
6.9
—
6.S
12
—
4.0
—
/or
J
7.3
7,s
9.0
a.2
—
9.9
9,7
—.
11
II
10
—
6,5
—
Ntmnd
—
12
12
—
13
14
16
—
Is
17
Ii
—
—
to
—
—
10
—
19
21
22
—
24
24
—
27
23
—
1s
—
—
n
29
33
—
34
4Q
—
39
46
42
22
—
—
—
46
47
—
60
M
—
63
65
69
40
fwspecjion
—
73
—
72
w
—
9a
12(
—
m
—
Iw
22(
m
—
332
—
23(
—
—
ml
ml
47q
4ot
—
410
—
●
—
—
.
6(M
7a
73
6s
—
—
(see
—
Jam@iwK)
31a
m
—
—
—
la
M
270
Iia t7am
la
10I
—
Ila Iw
91
—
62
—
(Single
—
in
—
1m
1la
—
3.3)
lmPslwlo5E
I
I
I
3-
~
I
1“
:
Z38
I Ss: I
I
-. I 0.
==-
1
Id
I
A(
TWITEI
.
.
d
8
13
20
32
50
no
125
200
31s
500
8W
0
r%
F
G
II
J
u
L
w
N
1’
()
2UO0
1250
5
c
II
2
3
size
Ntw
A
Smple
:O&
0.18
0.29
0,53
0.46
0.20 0.27 0.33
0.70
0.31 0.43
I.2
IS(’I
0.065 0,10
!mpeclht!,
percent
0,67
0.73
0.040
Norma!
Qua[it y (in
0.49
0.46
0.015 0.025
(/or
VI-A — Limiting
0.010
TAULE
1.0
0.77
0.59
1.5
I.9
2.1
2.7
3.1
6.9
0,40
0.9,4 1,2
I,2
I.3
1.7
2,0
4.s
0.25
1.4
1.6
1.9
2.4
2.9
2.3
3,1
2.5
3.7
4.6
5,4
4,3
3.3
6.5
7.6
4.8
11
16
0.65 1.0
w~~ich P& =
sdmi)hg)
for
0,74
o.a4
1.1
I.2
2.0
0.Is
i%t~fp
de/atirv)
3.5
4.0
4.9
5.9
77
,
13
16
10
37
2.5
14
18
S.6
6.4
7.7
9.0
10
14
16
19
22
27
T
24
29
34
42
30
25
20
44
54
58
10
36
41
68
6.5
(Sr?r? 4.11)
27
54
4.(J
9.4 12
8.2 11
10
12
25
1.5
10 Percent
r&
Wo
1220
P
v
Jam
Soo
Y
u
L
125
m
31s
a
J
N
—
).10
—
).29
—
).20
).46
1.2
—
0.61
—
—
-
0.?1).33D.44 D.5Y D.71
—
1.0
12
—
—
14
1.6
—
1.9
2.4
—
2.9
I .9
33
27
43
49
—
21
—
3.1
1.2 I .s
1.3
17
—
20
0.14 0,94
—
—
D84
D.7m II
0.31).43D.W
—
—
—
)49
1.2
I .0
2.9
-
)6
—
2.J
—
2.s
3.1
37
—
46
54
6.7
—
78
w
so
w
—
90
—
10
12
Is
—
19
!1
—
14
}6
—
23
25
—
31
24
19
—
37
29
46
.
G
/7
—
33
—
20
!’
2
—
71
51
41
ul
13
2?
18
04
35
—
-
40
48
59
—
—
56
63
71
—
91
120
130
—
I 10
—
67
100
G
25
—
IJO
49
—
Is
—
a
f7
Z
10
22
—
65
78
—
—
—
to
—
l.cwl
—
Accrpldll?
(JUdily
s
7.2
—
).65 I .0
—
c
—
040
—
—
3
—
0.2!
—
42
0.73
—
—
10 1 Is
— —
—
Lti! )
—
2
).011 ).01! ‘.02! w
—
— —
—
A
tuer
—
—
M
100
—
120
150
190
—
220
z
40
—
220
MI
—
—
230
ml
3W
z
310
—
140
—
—
—
m
350
—
410
w
w
—
610
Slo
400
—
iii
Z’io
—
G
la) 150
—
24a
—
310
RI
65
—
61(
77(
—
94[
13M
m
—
—
—
lot
—
w
iii
MO
—
—
Iw
xi
I-MO
—
w
o
g
=
&
00
12s
200
315
500
800
1230
m
u
L
M
N
P
0
R
20
F
J
13
E
so
0
D
H
s
c
32
3
8
G
2
Qlze
semph
0.24
0.010
0.30
0,015
TABLE Vii-A—
A
leuet
Q ~
m
n’
g
z
Qwdity
0.24
O.tw
o.%
2.4
0.10
0.62
0,53
0.50
0.39
0.32
0.59 0.79
1.5
0,065
●
7.7
3.4
2.7
2.4
2.6
2.1
1.8
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