Lecture 8 MOSFET(I) Outline Reading Assignment:

advertisement
Lecture 8
MOSFET(I)
MOSFET I-V CHARACTERISTICS
Outline
1.
2.
3.
MOSFET: cross-section, layout,
symbols
Qualitative operation
I-V characteristics
Reading Assignment:
Howe and Sodini, Chapter 4, Sections 4.1-4.3
6.012 Spring 2009
Lecture 8
1
1. MOSFET: layout, cross-section, symbols active area (thin
interconnect
Key elements:
Inversion layer under gate (depending on gate voltage)
Heavily doped regions reach underneath gate
- inversion layer to electrically connect source and drain
Cterminal device:
-
body voltage important
6.012Spring 2009
Lecture 8
Circuit symbols
Two complementary devices:
• n-channel device (n-MOSFET) on p-substrate
– uses electron inversion layer
• p-channel device (p-MOSFET) on n-substrate
– uses hole inversion layer
IDn
G
+
D
+
IDn
VDS > 0
B
D
_
G
B
+
VBS
VGS
_ _
S−
S
(a) n-channel MOSFET
Drain
Gate
Source
6.012 Spring 2009
n+
p
n+
S
+ S
+
VSB
VSG
_
G
B
VSD > 0
−IDp
B
D−
−IDp
D
(b) p-channel MOSFET
Source
Bulk or�
Body
G
Gate
Drain
Lecture 8
p+
n
Bulk or�
Body
p+
3
(2.
Qualitative Operation
Drain Current (Id:proportional to inversion charge
and the velocity that the charge travels fiom source
to drain
Velociv:proportional to electric field fiom drain to
source
Gate-Source Voltage (VG& controls amount of
inversion charge that carries the current
Drain-Source Voltage (V'J : controls the electric
field that drifts the inversion charge fiom the source
to drain
Want to understand the relationship between the drain
current in the MOSFET as a function of gate-to-source
voltage and drain-to-source voltage.
Initially consider source tied up to body (substrate or
6.012Spring 2009
Lecture 8
MOSFET:
- V,, < V,, with V,, 3 0
Inversion Charge = 0
V,, drops across drain depletion region
I,
=0
\
depletion region
6.012Spring 2009
*--
------- - *
no inversion layer
anywhere
Lecture 8
\
depletion region
6.012Spring 2009
inversion layer
everywhere
Lecture 8
/Three Regions of Operation: Saturation Region V,, > V,,
depletion region - V, inversion layer
"pinched-off" at drain side
IDis independent of VDs: ID=Id,, Electric field in channel cannot increase with VDs 6.012Spring 2009 Lecture 8
3. I-V Characteristics (Assume VSB=0)
Geometry of problem:
All voltages are referred to the Source
General expression of channel current
Current can only flow in the y-direction:
Total channel flux:
I y = W •QN (y)• vy (y)
Drain current is equal to minus channel current:
I D = −W •QN (y)• vy (y)
6.012 Spring 2009
Lecture 8
8
I-V Characteristics (Contd.)
I D = −W • QN (y) • vy (y)
Re-write equation in terms of voltage at location y, V(y):
• If electric field is not too high:
dV
v y (y) = −µ n • E y (y) = µn •
dy
• For QN(y), use charge-control relation at location y:
QN (y) = −Cox [VGS − V (y) − VT ]
for VGS – V(y) ≥ VT. .
Note that we assumed that VT is independent of y.
See discussion on body effect in Section 4.4 of text.
All together the drain current is given by:
dV(y)
I D = W • µ nCox [VGS − V( y) − VT ]•
dy
Simple linear first order differential equation with one
un-known, the channel voltage V(y).
6.012 Spring 2009
Lecture 8
9
I-V Characteristics (Contd..)
Solve by separating variables:
I D dy = W • µ nCox [VGS − V(y) − VT ]• dV
Integrate along the channel in the linear regime subject
the boundary conditions :
- Source: y=0, V(0)=0
- Drain: y=L, V(L)=VDS (linear regime)
Then:
L
VDS
0
0
I D ∫ dy = W • µ nCox
∫ [VGS − V(y) − VT ]• dV
Resulting in:
VDS




V
L
I D [y ]0 = I D L = W • µn Cox  VGS − − VT  V 
 0

2

VDS

W
ID =
• µ n Cox VGS −
− VT  • VDS


L
2
6.012 Spring 2009
Lecture 8
10
I-V Characteristics (Contd…)


W
VDS
I D = • µ nCox VGS −
− VT  • VDS


L
2
for VDS < VGS − VT
Key dependencies:
•
•
VDS↑ → ID↑ (higher lateral electric field)
VGS↑ → ID↑ (higher electron concentration)
This is the linear or triode region:
It is linear if VDS<<VGS-VT
6.012 Spring 2009
Lecture 8
11
I-V Characteristics (Contd….)
Two important observations
1. Equation only valid if VGS – V(y) ≥ VT at every y.
Worst point is y=L, where V(y) = VDS, hence,
equation is valid if
VDS ≤ VGS − VT
6.012 Spring 2009
Lecture 8
12
I-V Characteristics (Contd…..)
Two important observations
2. As VDS approaches VGS – VT, the rate of increase of
ID decreases.
Reason:
As y increases down the channel, V(y) ↑, |QN(y)| ↓, and
Ey(y) ↑ (fewer carriers moving faster)
⇒ inversion layer thins down from source to drain
⇒ ID grows more slowly.
6.012 Spring 2009
Lecture 8
13
I-V Characteristics (Contd……)
Drain Current Saturation
As VDS approaches
VDSsat = VGS − VT
increase in Ey compensated by decrease in |QN|
⇒ ID saturates when |QN| equals 0 at drain end.
Value of drain saturation current:
I Dsat = I Dlin (VDS = VDSsat = VGS − VT )
Then
W


VDS

IDsat =  • µnCoxVGS −
−VT  •VDS


L
2
V =V −V
DS GS T
1W
2
I Dsat =
µn Cox [VGS − VT ]
2 L
Will talk more about saturation region next time.
6.012 Spring 2009
Lecture 8
14
I-V Characteristics (Contd…….)
Output Characteristics
Transfer characteristics:
6.012 Spring 2009
Lecture 8
15
Output Characteristics
6.012 Spring 2009
Lecture 8
16
Summary of Key Concepts
• MOSFET Output Characteristics
I-V Characteristics in Cutoff Region
VGS < VT ID = 0
I-V Characteristics in Linear Region
VDS < VGS - VT

VDS

W
I D = • µ nCox VGS −
− VT  • VDS


L
2
I-V Characteristics in Saturation Region
VDS ≥ VGS - VT
W
2
I Dsat =
µn Cox (VGS − VT )
2L
6.012 Spring 2009
Lecture 8
17
MIT OpenCourseWare
http://ocw.mit.edu
6.012 Microelectronic Devices and Circuits
Spring 2009
For information about citing these materials or our Terms of Use, visit: http://ocw.mit.edu/terms.
Download