SPACE TELESCOPE SCIENCE INSTITUTE Operated for NASA by AURA Point-Source CCD Photometry with STIS: Correcting for CTE loss Paul Goudfrooij Space Telescope Science Institute • Methods to measure CTE of STIS CCD • (Visual) effects of CTE loss • CTE correction formula for point source photometry • Plans for the (near) future A Brief History of STIS CTE Measurements CTE: “Fraction of charge transferred per pixel transfer” (which is < 1 due to traps in the CCD silicon) Typically, one measures CTI ≡ 1 – CTE. • Significant parallel CTI discovered on STIS in 1998 (Gilliland, Goudfrooij & Kimble,1999, PASP, 111, 1009). – Apparent non-linearity, most significant for faint sources. Parametrized in terms of Stetson’s (1998, PASP, 110, 1448) phenomenological model. • Review of various effects of radiation damage on the STIS CCD including CTI: Kimble, Goudfrooij & Gilliland, 2000, Proc. SPIE, vol. 4013, p. 532. STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 2 STIS CCD Architecture; Measurement Method Amp C STIS CCD: Nominal Readout Direction Amp D • 4 Readout Amps (1 / corner) Nominal Clocking Direction • Bi-directional Clocking yields CTI ≡ 1 – CTE: 1 d(fluxD / fluxB) CTI = dY 2 Measured using “Sparse Field Tests” STScI Calibration Workshop 2002 Axis2 (Y) • Nominal Amp: D (lowest RN) Parallel (virtual) overscan Amp A Serial overscan Oct 17-18, 2002 Axis1 (X) Serial overscan Paul Goudfrooij Amp B 3 Sparse Field Tests • • Sparse fields to ensure that sources do not overlap, in which case (e.g.) PSF wings could fill traps for sources along the readout direction Two varieties: (i) “Internal” Sparse Field Test – – Lamp images along narrow, (cross-)dispersion slits, projected at 5 positions along columns (or rows) Representative of “worst case” point source spectroscopy (essentially no background to fill traps) STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 4 Sparse Field Tests • (ii) “External” sparse field test (annually) – A. Imaging: ÿ ÿ ÿ – Sparse outer field in NGC 6752 CVZ target (‘cheap’ orbits; yields range of backgrounds) 3 exposure times; 50CCD B. Spectroscopy: Young open cluster NGC 346, in nebulosity ÿ CVZ target ÿ Slitless; 3 exp. times; G430L ÿ [O II] l3727, Hb, [O III] l5007 lines in nebulosity provide three convenient, ~constant “sky” levels per spectrum (Spectroscopy discussed by Ralph Bohlin) ÿ STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 5 Visual effects of CTE loss: Dependence on Y position “External” Sparse Field Test: Outer Field in NGC 6752 (Oct 2001) Exp. time = 20 s STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 6 Visual effects of CTE loss: Effects of Intensity and Sky “External” Sparse Field Test: Outer Field in NGC 6752 (Oct 2001) Exp. time = 20 s STScI Calibration Workshop 2002 Exp. time = 100 s Oct 17-18, 2002 Paul Goudfrooij 7 Visual effects of CTE loss: Centroid shifts “Internal” Sparse Field Test • Charge trailing and centroid shift measurable; most significant at low signal. • Impacts ‘shape’ measurements (surface photometry), especially for faint objects. STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 8 External Sparse Field Test: CTI Analysis 3.0 e– d fluxD fluxB CTI = 2 dY Obvious dependence on flux STScI Calibration Workshop 2002 3.0 e– Oct 17-18, 2002 Paul Goudfrooij 9 External Sparse Field Test: CTI Analysis No significant dependence on aperture size fi Can use small-aperture photometry without CTIrelated headache STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 10 External Sparse Field Test: CTI Analysis Clear dependence on background level (“sky”) • Slope systematically flatter with increasing flux • “Sky” presumably fills traps in bottoms of potential wells, mostly affecting transfer of small charge packets. • Suggests CTI bckgr a µ exp – counts STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 11 Preparing for CTE Correction Formula (for imaging) • • Currently three epochs analyzed (Oct 1999, 2000, 2001) Define count, background (sky) and epoch parameters relative to their (rough) averages: yr = (MJD – 51831) / 365.25 lcts = ln(counts) – 8.5 bg = sqrt(sky_) lbg = ln(sqrt(sky_+1)) – 2 • Functional form producing best fit to the data: • Similar (but not identical) to Dolphin’s (2000, PASP, 112, 1397) functional form to correct WFPC2 CTE bg h CTI = (1 + a yr) * b exp(-c lcts) * [d exp (-e lbg) + f exp (-g )] counts STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 12 CTI Correction Formula bg h CTI = (1 + a yr) * b exp(-c lcts) * [d exp (-e lbg) + f exp (-g )] counts a = 0.108 ± 0.034 b = (9.32 ± 0.09) 10–5 c = 0.37 ± 0.01 d = 0.23 ± 0.02 e = 0.60 ± 0.05 f = 0.48 ± 0.01 g = 1.80 ± 0.10 h = 0.40 ± 0.04 STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 13 Quality of CTI fits CTI Correction good to £ 7% fi Photometry good to £ 1%. Cycle 8 Cycle 9 Cycle 10 50% 20 10 5 2 1% Black: sky = 2 Red: sky = 4 STScI Calibration Workshop 2002 Blue: sky = 15 Oct 17-18, 2002 Magenta: sky = 40 Paul Goudfrooij 14 Future Plans / Enhancements • • • • • • Analysis of Oct 2002 sparse field data to improve/solidify CTI correction formula (Dec 2002) Finalize correction formula for spectroscopic data Write IRAF (post-observation) tool to correct for CTI Analysis of extended source CTI measurements (Spectroscopy & imaging; Spring 2003) After 2003, internal measurements (internal sparse field, Cosmic Ray Tail intensity trending) should be sufficient to monitor CTI evolution See poster of Paul Bristow: Analytical modelling of STIS CTE as part of ST-ECF Calibration Enhancement project. When fully successful, it would enable CTE correction within the pipeline. STScI Calibration Workshop 2002 Oct 17-18, 2002 Paul Goudfrooij 15