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IEEE standard for metal-oxide surge arresters for AC power circuits
IEEE standard for metal-oxide surge arresters for AC power circuits
IEEE Standard 519-2014
IEEE Standard 519-2014
IEEE Power Electronics Specialists Conference, PESC-97, 39
IEEE Power Electronics Specialists Conference, PESC-97, 39
IEEE Power
IEEE Power
IEEE Photonics Technology
IEEE Photonics Technology
IEEE PE-Condition Monitoring-Revised
IEEE PE-Condition Monitoring-Revised
IEEE Paper Word Template in A4 Page Size (V3)
IEEE Paper Word Template in A4 Page Size (V3)
IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)
IEEE P802.3ba/D0.9
IEEE P802.3ba/D0.9
IEEE P802.19 Wireless Coexistence January 2008 IEEE P802.19-07/0020r3
IEEE P802.19 Wireless Coexistence January 2008 IEEE P802.19-07/0020r3
IEEE P802 Media Independent Handover Services
IEEE P802 Media Independent Handover Services
IEEE P1904.1 SIEPON Scope and Structure
IEEE P1904.1 SIEPON Scope and Structure
IEEE Nanotechnology Awards Committee Report (2006
IEEE Nanotechnology Awards Committee Report (2006
IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 10
IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 10
ieee journal of selected topics in quantum electronics, vol. 10, no. 5
ieee journal of selected topics in quantum electronics, vol. 10, no. 5
IEEE Journal of Quantum Electronics, Vol. 47, No. 3, pp. 320
IEEE Journal of Quantum Electronics, Vol. 47, No. 3, pp. 320
IEEE Jackson PES Meeting
IEEE Jackson PES Meeting
IEEE International Conference on Power Engineering, Energy and
IEEE International Conference on Power Engineering, Energy and
IEEE Instrumentation and Measurement Conferences - Unitn
IEEE Instrumentation and Measurement Conferences - Unitn
IEEE EMD PPT
IEEE EMD PPT
IEEE EMC Experiments and Demonstrations Guide
IEEE EMC Experiments and Demonstrations Guide
IEEE ELECTRON DEVICE LETTERS, VOL. 33, NO. 9, SEPTEMBER
IEEE ELECTRON DEVICE LETTERS, VOL. 33, NO. 9, SEPTEMBER
IEEE ELECTRON DEVICE LETTERS, VOL. 27, NO. 7, JULY 2006
IEEE ELECTRON DEVICE LETTERS, VOL. 27, NO. 7, JULY 2006