BY: Gabby Jones, Bridget
Crawford, and Emily Baker
• History
• Use
• Light Microscope
• Compound
Microscope
• Scanning Tunneling
Microscope
• X-Ray Microscope
• Binocular
Microscope
• Scanning Electron
Microscope
• Atomic Force
Microscope
• Electron Microscope
The first record of the use of lenses to manipulate
images was in Greek and Roman writings of around
1000 A.D. As for the origins of someone using lenses
to magnify a minute object, it is unclear. Most
scientific instruments have a clear place in the
historical records when they were formed and who
created them, not the microscope though. The
definition of the microscope makes it difficult to
determine when it was first created. Since there were
lenses dating back to ancient societies, how do we
say when those lenses were used to look at minute
objects? It is practically impossible to say when a
single lens was used in that fashion. Credit for the
first compound microscope (multiple lenses) is
generally given to Zacharias Jansen and John
Lipperhey of the Netherlands, in 1590.
• A microscope is an instrument that produces an
enlarged image of an object.
• A microscope ( Greek: Micran= small and
scopos = aim) is an instrument for veiwing
objects that are to small to be seen by the naked
or unaided eye. The science of investing small
objects using such an instrument is callled
microscopy, and the term microscopic means
minute or very small, not easily visible with the
unaided eye. In other words, requiring a
microscope to examine.
A microscope which consists of two microscopes
in series, the first serving as the ocular lens (close
to the eye) and the second serving as the objective
lens (close to the object to be viewed). Credit for
creating the compound microscope goes usually
to the Dutch spectacle makers Hans and Zacharias
Janssen who in 1590 invented an instrument that
could be used as either a microscope or
telescope. The compound microscope has evolved
into the dominant type of optical microscope
today.
•
The scanning tunneling microscope (not to be confused with scanning electron
microscopes electron microscopes), or STM, was invented in 1981 by Gerd Binning
and Heinrich Rohrer of IBM's Zurich Lab in Zurich, Switzerland. Although initially
greeted with considerable scepticism by materials scientists in the early 1980s, the
invention garnered the two a Nobel Prize in Physics in 1986. The STM allows
scientists to visualize regions of high electron density and hence infer the position of
individual atoms, where previously arduous study of diffraction patterns from prior
methods lead to much debate as to the real, spatial lattice structure of the item in
question. The STM has higher resolution than its slightly later invented but
nevertheless related cousin, the atomic force microscope (AFM). Both the STM and
the AFM fall under the class of scanning probe microscopy instruments.
•
It is used to obtain images of conductive surfaces at an atomic scale 2 × 10−10 m or
0.2 nanometre. It can also be used to alter the observed material by manipulating
individual atoms, triggering chemical reactions, and creating ions by removing
individual electrons from atoms and then reverting them to atoms by replacing the
electrons.
An X-ray microscope uses electromagnetic radiation in the soft X-ray band to
produce images of very small objects. Unlike visible light microscopes, Xrays do not reflect or refract easily, and they are invisible to the human eye.
Therefore the basic process of an X-ray microscope is to expose film or use
a charge-coupled device (CCD) detector to detect X-rays that pass through
the specimen, rather than light which bounces off the specimen.
Early X-ray microscopes by Kirkpatrick and Baez used grazing-incidence
reflective optics to focus the X-rays, which grazed X-rays off parabolic
curved mirrors at a very high angle of incidence. An alternative method of
focusing X-rays is to use a tiny fresnel zone plate of concentric gold or
nickel rings on a silicon dioxide substrate. Sir Lawrence Bragg produced
some of the first usable X-ray images with his apparatus in the late 1940's.
In the 1950's Newberry produced a shadow X-ray microscope which placed the
specimen between the source and a target plate, this became the basis for
the first commercial X-ray microscopes from the General Electric Company.
• A compound microscope with two
eyepieces viewing down a single optical
channel and objective lens. This is
different than a stereo microscope, which
has a separate optical channel for each
eye.
The scanning electron microscope (SEM) is a type of electron microscope capable
of producing high resolution images of a sample surface. Due to the manner in
which the image is created, SEM images have a characteristic three -dimensional
appearance and are useful for judging the surface structure of the sample.
• The Atomic Force Microscope (AFM) is a
very powerful microscope invented by
Binnig, Quate, and Gerber in 1986.
Besides imaging it is also one of the
foremost tools for the manipulation of
matter at the nanoscale.
• The electron microscope is a microscope
that can magnify very small details with
high resolving power due to the use of
electrons rather than light to scatter off
material, magnifying at levels up to
500,000 times