FEDERAL STATE BUDGETARY INSTITUTION
FOR HIGHER VOCATIONAL INSTITUTION AND SCIENCE
ul. Khlopina, 8., building 3, Saint-Petersburg, 194021
Tel. (fax): (812) 448-69-80 ext. 5740 http://www.spbau.ru
OKPO 59503334, OGRN 1027802511879
INN/KPP 7804161723/780401001
MARCH 02, 2012 No. 11217.1/01/481
Re: _______________ dated _______________
In 2011 the first X-ray diffractometer DRON-8 was put into operation in the nanoelectronics laboratory of Saint-Petersburg Academic University – Research and Education Nanotechnology Center of the
Russian Academy of Sciences. The special design of the instrument with a four-axle XYZ φ large-sample holder and quadruple-reflection Bartels slit monochromator Ge 220 mounted on the original beam provide for high resolution when examining single-crystal semiconductor films. The selection of the Russian manufacture and a diffractometer model was not random.
First, “Bourevestinik” is the Russia’s largest research, development and manufacturing enterprise for high-tech X-ray instrumentation which has been supplied to the market for over than half a century and thus has been a well-known brand a nd a trademark of our country. Among consumers of the “Bourevestinik” products numerous education and research centers of Russia and CIS as well as major Russian and foreign industrial institutions can be mentioned.
First of all, high proficiency of specialists, corporate knowledge and experience acquired, use of innovative technology and extensive cooperation with leading research and production organizations make it possible for “Bourevestinik” to offer high-tech instruments and equipment meeting the up-to-date market requirements.
X-ray diffractometer DRON8 was developed by “Bourevestinik” OJSC and put into batch production in 2010. It is the first Russian multi-purpose diffractometer with a variable-radius vertical theta-theta goniometer. Its technical parameters, method opportunities and extended option components are not worse than those of the foreign analogues and provide for implementation of the most known X-ray diffraction measurement methods. Horizontal position of a sample allows the X-ray diffraction analysis of phase composition, structural condition and orientation of a wide range of items: polycrystalline materials, liquids, nanomaterials and nanocomposites, thin single-crystalline films. The diffractometer may handle large samples sized up to 300x250 mm and weighing up to 50 kg.
We are fully satisfied with our cooperation with “Bourevestinik” as far as both high-quality development and production and prompt and proper commissioning operations are concerned. We are sure that diffractometer DRON-8 we've purchased will be the right hand in X-ray diffraction researches of semiconducting materials, nano-heterostructures and other new nanopatterned materials, which are researched and developed by our Academic University.
Head of the Academic University
Member of the Russian Academy of Sciences
Deputy Head of the Nanotechnology Center
Deputy Head of the nanoelectronics laboratory
Associate of the Russian Academy of Sciences
Zh.I. Alferov
A.Ju. Egorov