Rochester Institute of Technology
Rochester, New York
COLLEGE of SCIENCE
Chester F. Carlson Center for Imaging Science
Introduction to Microscopy Using Light, Electrons, and Scanning Probes, 1051-7xx
1.0 Title: Introduction to Microscopy Using Light, Electron, and Scanning Probes
Date: Sept 21, 2006
Credit Hours: 4
Prerequisite(s): Graduate standing in a science or engineering program or
permission of instructor.
Corequisite(s): None
Course proposed by: Rich Hailstone
2.0 Course information:
Classroom
Lab
Studio
Other (specify _______)
Quarter(s) offered (check)
Fall
Contact hours
4
X
Winter
Maximum students/section
30
Spring
Summer
Students required to take this course: (by program and year, as appropriate)
Graduate students in Imaging Science, nanoimaging track.
Students who might elect to take this course:
Graduate students in Imaging Science, and in the College of Science or
College of Engineering. Undergraduates with appropriate background seeking
an elective.
3.0 Goals of the course (including rationale for the course, when appropriate)
Provide students with a basic knowledge foundation that enables him/her to
describe the principles and techniques of imaging systems used in microscopy.
4.0
Course description (as it will appear in the RIT Catalog, including pre- and corequisites, quarters offered)
1051-7xx
Introduction to Microscopy Using Light, Electrons, and
Scanning Probes
This is the first course in a three-quarter microscopy sequence. The purpose of
this course is to give the student an overview of the various modes of microscopy
for the study of materials. The first part of the course will focus on various modes
of light microscopy. The bulk of the course will be devoted to electron
microscopy, with the final part of the course devoted to scanning tunneling and
atomic force microscopy. Demonstrations will be held in the NanoImaging Lab to
reinforce the lecture material. (Graduate student standing in science or
engineering, or permission of instructor.) Class 4, Credit 4 (W)
5.0 Possible resources (texts, references, computer packages, etc.)
5.1 P. J. Goodhew, J. Humphreys, and R. Beanland, Electron Microscopy and
Analysis, Taylor & Francis, London.
6.0 Topics
6.1 Microscopy using light
6.1.1 Optics principles
6.1.2 Light microscopy
6.2 Microscopy using electrons
6.2.1 Basic Principles of Electron microscopy
6.2.1.1 Electron beam-specimen interactions
6.2.1.1.1
Scattering and diffraction
6.2.1.1.2
Elastic scattering
6.2.1.1.3
Inelastic scattering
6.2.1.2 Electron sources
6.2.1.3 Lenses, apertures, and resolution
6.2.2 Transmission electron microscopy (TEM)
6.2.2.1 Detectors
6.2.2.2. The instrument
6.2.3 Scanning electron microscopy
6.2.3.1 Modes of operation
6.2.3.2 Beam-specimen interactions
6.2.3.3 Image formation and interpretation
6.2.4 X-ray microanalysis
6.2.4.1 Generation of X rays
6.2.4.2 Qualitative X-ray analysis
6.3 Microscopy using scanning probes
6.3.1 Basic principles
6.3.2 Scanning tunneling microscopy
6.3.3 Atomic force microscopy
7.0 Intended learning outcomes and associated assessment methods of those
outcomes
Learning Outcome
7.1 Demonstrate the application of
the optics principles used in the
light microscope
7.2 Explain electron beam-specimen
interactions
7.3 Identify the major components of
a transmission electron
microscope and their use in
optimizing image formation
7.4 Identify the major components of
a scanning electron microscope
and their use in optimizing image
formation
7.5 Explain the principles of X-ray
microanalysis and its limitations
7.6 Describe the operation of the
scanning probe microscope and its
applications
In class attendance
and evaluation
X
Homework
Assignments
X
X
X
X
X
X
X
X
X
X
X
8.0 Program or general education goals supported by this course
8.1 Prepares graduate students for research in imaging of nanoscale structures.
9.0 Other relevant information (such as special classroom, studio or lab needs,
special scheduling, media requirements, etc.)
9.1 Smart classroom
9.2 Laboratory with facilities for the following demonstrations:
Optical microscope
Transmission electron microscope
Scanning electron microscope
X-ray Microanalysis
Scanning probe microscope
10.0 Supplemental information : None