New possibilities with aberration-corrected electron microscopy
Organized and edited by David Cockayne, Angus I Kirkland, Peter D Nellist
and Andrew Bleloch
Published September 2009
FREELY AVAILABLE ONLINE UNTIL 30 NOVEMBER 2010
Special offer price: £47.50 (usual price: £58)
This volume contains the thirteen invited papers (by Hawkes,
Haider, Krivanek, Zach, Pennycook, Urban, Kirkland, Lichte,
Dahmen, Rose, Nellist, Colliex and Howie) presented at the
Royal Society Discussion Meeting 'New possibilities with
aberration-corrected electron microscopy' held in London from
24-25 November 2008. It includes not only reports of recent
research in the field, but also papers on the history of the
subject, including the developments of aberration correctors,
and papers looking to future developments and directions.
New possibilities with aberration-corrected electron microscopy will be a key
resource for those in the field and for those interested in recent developments in
microscopy, and a historical record of the state of high resolution electron
microscopy at this time.
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Full contents are listed overleaf…
Contents
Preface – New possibilities with aberration-corrected electron microscopy, by
D Cockayne, AI Kirkland, PD Nellist and A Bleloch
Aberration correction past and present, by PW Hawkes
Current and future aberration correctors for the improvement of resolution in
electron microscopy, by M Haider, P Hartel, H Müller, S Uhlemann and J Zach
High-energy-resolution monochromator for aberration-corrected scanning
transmission electron microscopy/electron energy-loss spectroscopy, by
OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, MF Murfitt,
CS Own and ZS Szilagyi
Chromatic correction: a revolution in electron microscopy? by J Zach
Aberration-corrected scanning transmission electron microscopy: from atomic
imaging and analysis to solving energy problems, by SJ Pennycook,
MF Chisholm, AR Lupini, M Varela, AY Borisevich, MP Oxley, WD Luo, K van
Benthem, S-H Oh, DL Sales, SI Molina, J García-Barriocanal, C Leon, J Santamaría,
SN Rashkeev and S T Pantelides
Negative spherical aberration ultrahigh-resolution imaging in corrected
transmission electron microscopy, by KW Urban, C-L Jia, L Houben, M Lentzen,
S-B Mi and K Tillmann
Optimal tilt magnitude determination for aberration-corrected super resolution
exit wave function reconstruction, by SJ Haigh, H Sawada and AI Kirkland
Off-axis electron holography in an aberration-corrected transmission electron
microscope, by H Lichte, D Geiger and M Linck
Background, status and future of the Transmission Electron Aberrationcorrected Microscope project, by U Dahmen, R Erni, V Radmilovic, C Ksielowski,
M-D Rossell and P Denes
Future trends in aberration-corrected electron microscopy, by HH Rose
Three-dimensional imaging by optical sectioning in the aberration-corrected
scanning transmission electron microscope, by G Behan, EC Cosgriff,
AI Kirkland and PD Nellist
Multi-dimensional and multi-signal approaches in scanning transmission
electron microscopes, by C Colliex, N Brun, A Gloter, D Imhoff, M Kociak,
K March, C Mory, O Stéphan, M Tencé and M Walls
Aberration correction: zooming out to overview, by A Howie