Form 2B City University of Hong Kong REVISED on 20 Jul 2012 wef Sem A 2012/13 Information on a Course offered by the Department of Physics and Materials Science with effect from Semester A in 2012 / 2013 This form is for completion by the Course Co-ordinator/Examiner. The information provided on this form will be deemed to be the official record of the details of the course. It has multipurpose use: for the University’s database, and for publishing in various University publications including the Blackboard, and documents for students and others as necessary. Please refer to the Explanatory Notes attached to this Form on the various items of information required. Part I Course Title: Materials Characterization Techniques Course Code: AP3171 Course Duration: One semester No of Credit Units: 3 Level: B3 Medium of Instruction: English Prerequisites: Nil Precursors: AP2102 Introduction to Materials Engineering AP3169/ AP3170 Materials Testing Techniques AP3172 Electronic Properties of Materials MA2176 Basic Calculus and Linear Algebra or MA1201 Calculus and Basic Linear Algebra II Equivalent Courses: Nil Exclusive Courses: Nil Part II 1. Course Aims: Materials characterization techniques are used in quality and assurance programs, i.e., processes of verification, quality management and contamination reduction. They are integral parts of the material production and processes for development of novel materials. Therefore characterization techniques and production/development processes are equally important. This course aims at the foundation of knowledge in modern methodologies of materials characterization and their applications to engineering and scientific AP3171 (3-3-4) 1 problems appearing at production and development of materials, nanomaterials, solid state devices and nanodevices. This knowledge guides the students to select suitable analysis techniques to identify the problems in above processes, to recognize the product quality and/or feedback the analysis data to the material processing. 2. Course Intended Learning Outcomes (CILOs) (state what the student is expected to be able to do at the end of the course according to a given standard of performance) Upon successful completion of this course, students should be able to: No 1 2 3 4 3. CILOs Level of Importance Recognize the characteristics of analytical 1 instruments for advanced materials, such as their sensitivities, spectral resolution, spatial resolution, depth of analysis, etc. Recognize the various types of materials 3 characterization techniques, and be able to relate them to the principles of fundamental physics and chemistry. Select advanced analytical techniques and apply 2 them to characterization of different materials and nanomaterials under various analysis conditions. Analyze, interpret and mutually correlate data to 2 arrive at meaningful conclusions. Teaching and Learning Activities (TLAs) (designed to facilitate students’ achievement of the CILOs) TLAs CILO 1 CILO 2 CILO 3 CILO 4 Total (hrs) Large Class Activities 4 10 6 6 26 Small Class Activities 2 4 2 2 10 Laboratory Work -6 3 3 12 Total no of hours 6 20 11 11 48 The “Large Class Activities” are lectures scheduled weekly in 2-hour teaching blocks. Lectures follow the teaching structure as indicated in the keyword syllabus. The “Small Class Activities” refer to tutorials based on interpretation of analytical data and determination of chemical and phase composition, designation of electron diffraction patterns and others materials qualities based on spectral analysis and calculations. Laboratory work is scheduled throughout the semester in small groups and is focussed on practical material analysis using selected and the most important analytical techniques. Scheduled activities: 2 hrs lecture + 1 hr tutorial + 1 hr laboratory AP3171 (3-3-4) 2 4. Assessment Tasks/Activities (designed to assess how well the students achieve the CILOs) Examination duration is 2 hrs Percentage of coursework, examination, etc.:30% by coursework; 70% by exam To pass the course, students need to obtain at least 30% in the examination. ATs Exam Quiz CILO 1 CILO 2 CILO 3 CILO 4 Total (%) 8 28 18 16 70 2 2 3 3 10 Mid-term Test 1 3 3 3 10 Lab Report -6 3 1 10 Weighting (%) 11 39 27 23 100 Individual tasks are assessed continuously over the whole semester. The assessment is by course work (30%) and exam (70%). The course assessment is composed of 5 Quiz tasks, 1 mid-term test, and 4 laboratory work with typed reports which provides 10 input parameters for the course work assessments. The information on assessment and learning is feed back within 7 days. The exam assessment follows the weighting individual tasks and comprises shorter and longer questions as well as calculation (~20%). The questions are focused on principles of materials analysis, interpretations fundamental processes and spectral data. 5. Grading of Student Achievement: Refer to Grading of Courses in the Academic Regulations (Attachment) and to the Explanatory Notes. The grading is based on students’ performance in assessment tasks/activities. Grade A The student completes all assessment tasks/activities and is able to demonstrate excellent understanding of the scientific principles and the working mechanisms of analytical instruments. He/she can thoroughly identify and explain how the analytical principles are applied to science and technology and solving physical and engineering problems. The student shows strong evidence of original thinking, supported by various properly documented information sources, other than taught materials. He/she is able to communicate ideas effectively and persuasively via written and/or oral presentation. Grade B The student completes all assessment tasks/activities and can describe and explain the scientific principles. He/she can evaluate analytical principles in details, applied them to materials science and technology, and solve relevant physical and engineering problems. He/she demonstrates ability to integrate taught concepts, analytical techniques and applications via clear oral and/or written communication. Grade C The student completes the given assessment tasks/activities and can describe and AP3171 (3-3-4) 3 explain some scientific principles. He/she provides simple but fairly accurate evaluations of the analytical principles applied to science and technology and solving physical and engineering problems. He/she can communicate analytical tasks of materials clearly in writing and/or oral presentations. Grade D The student completes the given assessment tasks/activities but can only briefly describe some scientific principles. He/she can properly demonstrate only some methods of analysis and applications of their principles to science, technology and solving physical and engineering problems. He/she can communicate simple ideas in writing and/or oral presentations. Grade F The student fails to complete assessment tasks/activities and/or cannot accurately describe and explain the analytical principles. He/she fails to identify and explain the principles applied to science and technology and solving physical and engineering problems objectively or systematically. He/she is weak in presentations of fundamental analytical ideas; and/or the student’s work shows evidence of plagiarism. Part III Keyword Syllabus: General classification analytical techniques and major limitations. Guidance for their choice. Scanning electron microscopy (SEM). Environmental SEM. Energy dispersive x-ray spectroscopy (EDS). Wave dispersive spectroscopy (WDS) Cathodoluminescence (CL). Crystallography and diffraction. Real and reciprocal space. Transmission electron spectroscopy (TEM). Bright and dark field imaging. High resolution TEM (HRTEM). Selected area diffraction (SAD). Analytical techniques associated with TEM Electron energy loss spectroscopy (EELS). Energy dispersive x-ray spectroscopy integrated (EDS) in TEM. Auger electron spectroscopy (AES). Scanning Auger spectroscopy (SAM). Xray photoelectron spectroscopy (XPS). Ultraviolet photoelectron spectroscopy (UPS). Mass spectrometry. Secondary ion mass spectrometry (SIMS). Rutherford backscattering spectroscopy (RBS). Elastic recoil detection analysis (ERDA). Proton induced x-ray emission (PIXE). Surface profiling. Scanning probe microscopy (SPM). Atomic force microscopy (AFM). Scanning tunnelling microscopy (STM). Reference Book(s): Mark Ladd, Crystal structures in stereoview, Horwood publishing, Chichester 1999. M Grasserbauer and H W Werner (Editors), Analysis of Microelectronic Materials and Devices, Willey Chichester 1991. Douglas A Skoog, James J Holler, Timothy A Nieman, Principle of Instrumental Analysis, Sanders College Publishing, Philadelphia 1998. L Reimer, Transmission electron microscopy: physics of image formation and AP3171 (3-3-4) 4 microanalysis, Springer, Berlin 1997. Hobart H Willard, lynne L Merritt, Jr, John A Dean, Frank A Settle, Jr, Instrumental Methods of Analysis 7th Edit., Wadsworth Pub Comp, Belmont, California, 1988. J F Watts, J Wolstenholme, An introduction to surface analysis by XPS and AES, J Willey, New York 2003. D Briggs, Surface analysis of polymers by XPS and static SIMS, Cambridge University Press, Cambridge 1998. P E J Flewit and R K Wild, Physical Methods for Materials Characterization, Institute of Phys Publising Bristol 1994. D Briggs and M P Seah (Eds), Practical Surface Analysis, Willey, Chichester 1990. D J O'Connor, B A Sexton, R St C Smart (Eds), Surface Analysis Methods in Materials Science, Springer -Verlag Berlin c2003. Lee E Fitzpatric (Ed), Characterization of organic thin films, Boston, ButterworthHeinemann, Boston 1995. David J Whitehouse, Hanbook of suface metrology, Institute of Phys. Publ. Bristol 1994. John B Wachtman, Z H Kalman, Characterization of Materials, Butterworth-Heinemann, Boston 1993. G Fizgerald, B E Storey, D Fabian, and P Osborne (Eds), Quantitative Microbeam Analysis, Proceeding Scottich University Summer School in Physics, Instit of Phys Pub Bristol 1993. R Howland, and L Benatar, A practical guide to scanning microscopy, Park Scientific Instrument 1993-1997. Internet Sources: Charles Evans Surface Science Western http://www.eaglabs.com/techniques/ http://www.uwo.ca/ssw/services.html Returned by: Name: Dr Y Y LI Department: AP Extension: 7810 Date: 20 Jul 2012 AP3171 (3-3-4) 5