GROWTH – DEDICATED CALL – 10/00 TOPIC IV.8 Thermal specifications and properties of electronic components and materials 1. CONFORMITY WITH THE WORK PROGRAMME This topic falls under the Competitive and Sustainable Growth Programme, generic activity Measurement and Testing. Specifically, it is related to Objective GROW-20006.2.1 Methodologies to Support Standardisation and Community Policies for which expressions of interest have been called. 2. KEYWORDS Thermal specification, thermal design, electronic component, modelling, thermal interface, properties of materials, design rule, test method, standardisation. 3. SUMMARY OF OBJECTIVES AND JUSTIFICATION Controlled thermal design of electronic equipment is currently a very important area of electronic design. This is because the dissipated power densities of modern electronic chips have now reached such a high level that advanced heat transfer systems are needed. However there currently exists very little standardised information about the thermal properties of various electronic components and materials, or the test methods for verifying these thermal properties. With the new standardised specifications, models and test methods the users and designers of electronic equipment could get better, compatible and more realistic description of the thermal behavior of electronic equipment. Design time reduction and better accuracy can be achieved by using more effective and harmonized thermal models and specifications of electronic components and of heat conducting materials. 4. BACKGROUND Controlled thermal design of electronic equipment is currently a very important area of electronic design. This is because the dissipated power densities of modern electronic chips have now reached such a high level that advanced heat transfer systems are needed. However, there currently exists very little standardised information about the thermal properties of various electronic components and materials, or the test methods for verifying these thermal properties. In CENELEC there are no standards for the thermal design of electronic equipment and components. With regard to standardisation, the technical development of thermal models for components, and thermal simulation methods are advanced enough, to be used for better DC 10/00/Topic IV.8/ Pg 2 thermal specifications for electronic components. Recent studies performed in Europe by DELPHI and SEED projects (DELPHI = Development of Libraries of Physical models for an Integrated design environment, SEED = Supplier Evaluation and Exploitation of DELPHI, SEED is European ESPRIT project) and the published documents by JEDEC and SEMI will help when starting specification work at CENELEC. In the International Electrotechnical Commission (IEC) there are not any activities on this area yet. The information sources of thermal data for the manufacturer of electronic equipment are material suppliers and component suppliers. Using both of these channels the equipment designer should get reasonable thermal data. To improve this data flow from supplier to equipment manufacturer, some standardised specification system is needed. CENELEC is the most suitable organisation to co-ordinate this task. Information routes for thermal data Materials supplier Flow of thermal data Components Manufacturer Equipment manufacturer (thermal designer) CENELEC will develop guidelines for specifications used in thermal design processes On the following page there is a key figure illustrating ideas on how to manage the basic thermal specification parameters which should be addressed when specifying an electronic component. In these specifications it is very important, to cover all the applicable heat transfer mechanisms: thermal conduction, convection and radiation. It is also important to describe every component type by the actual feasible method (which is also measurable) to be used in verification of given parameter values in various models. DC 10/00/Topic IV.8/ Pg 3 How to manage thermal properties of electronic components? Thermal specification objects of electronic component - component itself (inside structure e.g. DELPHI, mostly thermal conduction and capacitance) - contact properties (bottom side and conduction to PWB, mostly thermal conduction) - surface properties (sides and top, thermal conduction if heatsink, convection and radiation) Heat sink area (possible) Surface properties of the component, outer properties Inner properties of component Printed wiring board Contact areas Modelling inner properties of component serve mostly the management of component itself Modelling outer/surface properties of component serve mostly the management of interface between component and neighbouring environment The modelling technics currently used have at least two different methods for creating real models for thermal design. One method uses direct geometrical/material analyses to make thermal model for components and the other method uses thermal resistor/capacitor networks for example the DELPHI-project. Both of these methods should be possible in component level specifications. DC 10/00/Topic IV.8/ Pg 4 The European co-operative project DELPHI /Rosten et al/ is an example of an activity where the responsibility of the thermal design has been attempted to be shared between the supplier of component and the end user. The specification system for thermal specifications of electronic components and subsystems and the applicable tests/measurement methods should cover following areas: - Component specifications - Interface specimens and materials (heat conducting specimens, thermally conductive insulators) and their specifications and models - Subsystems (Printed circuit boards, units, rails) - Heat sinks and fans. - Material specifications (materials of components and other parts of electronics) Some guidelines are needed for the thermal specification of PCB and subsystem level. It should be kept in mind that all relevant heat transfer mechanisms are treated, conduction, convection and radiation, when components are positioned on PCB. Monitoring the work of existing groups generating thermal models - DELPHI, SEED, JEDEC; SEMI, and standardising these different methods will be an important task for this research project and CENELEC. REFERENCE 1. Rosten, H.I. et al. Final report to SEMITHERM XIII on the European-funded project DELPHI - the Development of libraries and physical models for an integrated design environment. Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, Austin, TX, USA, 1997. Pp. 73 - 91. 2. Vinke, H. & Lasance, C.J.M. Recent achievements in the thermal characterization of electronic devices by means of boundary condition independent compact models. Thirteenth Annual IEEE Semiconductor-Thermal Measurement and Management Symposium, Austin, TX, USA, 1997. s. 32 - 39 5. ECONOMIC AND SOCIAL BENEFITS A good thermal design of electronics is crucial on the reliable and safe operation of equipment. The current situation makes it difficult to design electronics effectively because of the lack of standardised thermal specifications of electronic components and heat conducting materials. The ever increasing power density of electronics causes large difficulties for the designers who need more accurate and reliable information of thermal properties. The existence of standards could make it much more economical to make good thermal design. DC 10/00/Topic IV.8/ Pg 5 6. SCIENTIFIC AND TECHNOLOGICAL OBJECTIVES The RTD work-programme should contain the following tasks: 1. Definition of specifications of the thermal properties of electronic components 1.1 Parameters Definition of the specific thermal parameters concerning thermal design of components, assembled printed wiring boards, materials and test methods. 1.2 Units Units (and symbols) of the thermal parameters concerning thermal behavior and also design of components, assembled printed wiring boards and various materials shall be defined. 2. Thermal specifications of electronic components and interface parts 2.1 Evaluation of various package types of electronic components Evaluation of package types used in electronic components shall cover such packages which probably have use also in the future. Evaluation concentrates on finding possibilities to use some simplified geometric thermal model for these package types. Therefore the project has to find and develop some principles how such simpilification should be done. 2.2. PBGA-package evaluation of simplification of detailed geometric models The objective is to develop methodology for deciding what level of geometric simplification is practical in modelling thermal properties of Plastic ball grid array packages (PBGA). The project includes comparing the simplified models to accurate geometric model of this package type by using simulations and testing. 2.3 Resistor package geometric model The effect of mounting method of resistors on temperature of the component itself. Developing description of some standardised mounting methods. 2.4 Description of heat sink thermal properties Develop a method for describing thermal behaviour of heat sinks by using effective heat transfer surface area for the component instead of using the thermal model of heat sink. This kind of scaling factor reduces the size of accurate thermal model considerably. DC 10/00/Topic IV.8/ Pg 6 3. Thermal specifications of materials used in electronic components 3.1 Material types Selection of basic material types, how to manage specification for - construction materials - interface materials, glues, adhesives, plates Metals, plastics, ceramics, adhesives, glues, printed wiring board materials, other conductive materials, powder metals, composites 3.2 Basic properties of various materials - Standard definition of various properties (use of other standards) - Description of specification for various basic material types - Effect of surface contact resistance on thermal properties Thermal conductivity, thermal resistance, contact resistance at surface, thermal capacitance, specific heat, emissivity, density, coefficient of thermal expansion, surface properties (roughness), etc. 3.3. Test methods of thermal properties of materials - Comparison and further development of test methods - Selection of test methods to measure various material types 7. TIME SCALE Although no rigid time scale requirements apply to this project, based on the described objectives, the whole project should be completed within three years maximum. 8. IMPORTANT ADDITIONAL INFORMATION To get a reasonable amount of progress in this area, a minimum of three intrested parties is necessary. Close connections with CENELEC should be demonstrated in the proposal, and ensured during the proposed workplan, in order to properly match the requirements of industry and the evolution of technology.