LIN
Test Specimen
Questionnaire
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Test Specimen Questionnaire
Introduction:
The goal of this questionnaire is to determine the complexity of the tests for the test house and for the contractor as
well. In the first approach the test sample is classified into classes (A – D). Depending on the class of the specimen
additional questions are addressed.
1. Scope of service (Summary)
LIN Standard as per
1.3
2.0
2.1
Yes
As per
No
EMC Test
Test of Physical Layer
Test of Data Link Layer
Test of Node Configuration and Network Management
Name / Type / Version of the Device under Test
Additional tests required
If, yes Test Specification available
Note: Some OEM require additional tests, which are NOT covered by the standard LIN Test specification.
Class
A
A+
B0
B1
B2
B3
Device Class
(Explanations page 2)
Additional Implementation (e.g. cooling, 24V Power Supply, etc.):
C0
C1
C2
C3
D
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2. Classification of Test Type
2.1 Class A Devices: Transceivers
2.1.1 Class A:
• LIN Transceiver
2.1.2 Class A+:
• SBC (System Basis Chip)
2.2 Class B: μC based Devices
LIN Hardware integration level:

B0: Data Link Layer fully in Software (no Hardware UART/SCI)

B1: Standard UART /SCI with Data Link Layer driver Software

B2: Enhanced UART /SCI (some Hardware support for LIN+Data Link Layer Software

B3: Complete LIN in Hardware-Controller / State Machine
2.3 Class C: Integrated Devices: μC + Transceiver
LIN Hardware integration level:

C0: Data Link Layer fully in Software (no Hardware UART / SCI)

C1: Standard UART /SCI with Data Link Layer driver Software

C2: Enhanced UART /SCI (some Hardware support for LIN+Data Link Layer Software

C3: Complete LIN in Hardware-Controller / State Machine
2.4 Class D: Software

Software: Protocol Stack / LIN driver
Yes
Remark/Value
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Test Specimen Questionnaire
3.1 Questions related to all Classes
•
Datasheet / HW Documentation available
•
Adapter / connector to DUT available
Yes
No
see NCF
If Yes: Required at begin of testing.
3.2 Questions related to Class A & Class C (Physical Layer & EMC)
•
Highest supported Baud rate
•
Constant Slope time Transmitter
•
Constant Slew rate Transmitter
•
Selectable Timing for Baud rates (e.g.: 10400 / 19200 etc.)

•
If Yes: How is timing selection realized?
Miscellaneous
3.3 Questions related to Class B & Class C (Data Link Layer)
•
Master
•
Slave
•
Quartz / Ceramic precision
•
RC / integrated Oscillator precision [%] unsynchronized:
•
Baud rates to be tested (e.g. 4800 baud, 9600 baud, etc.)
•
Slave: Supports automatic Baud rate detection from/to
•
Slave: able to synchronize / range [%]
•
Miscellaneous
•
Support of Event Triggered Frame (ETF)
•
Support of Sporadic Frames
3.3.1 LIN 1.3 Data Link Layer Test (related to Class B & Class C):
Yes
•
Protocol Stack shall be tested with Application environment
Note: Test coverage will be limited to the contend of application support.
•
Protocol Stack shall be tested Application independent
In case of YES:
- Test Application can be installed
- Standardized LIN API available
- Customized LIN API available
- Memory for test Application available
a) Parallel Mode (Application AND Upper Tester)
Size in Byte / RAM / ROM
b) Replace Mode (Upper Tester replaces Application)
Size in Byte / RAM / ROM
No
Remark/Value
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Test Specimen Questionnaire
3.4 Questions related to Class C (Integrated Devices: μC + Transceiver, only)
Application
Rx
LIN
μC
Transceiver
Tx
•
Yes
No
Remarks / Value
Yes
No
Remarks / Value
Can Rx be observed directly
In case of no:
–
Rx access enable via Test mode
–
Additional Propagation Delay
•
Rx Driver capability: Voltage Levels:
•
Can Tx be accessed directly on Test pin
In case of no:
–
Tx access enable via Test mode
–
Additional propagation delay
through external access?
•
Is µC Tx detachable / overdrive to
stimulate Tx externally
3.5 Questions related to Class B, C & D
•
Application / Evaluation Board available
•
In-Circuit Emulator / Target Debugger available
•
Compiler / Linker available (Or name type)
•
Source Code available
•
Start-up Manual available
3.6 Questions related to Class D (Software)
Remarks / Value
•
Target Platforms (e.g. Controller Family / Type)
•
Which other SW components are mandatory (e.g.: drivers / OS)
•
Complete reference (SW) Application project available.
Test Specimen Questionnaire
Glossary
•
API = Application Programming Interface
•
ASIC = Application Specific Integrated Circuit
•
DUT = Device under Test
•
ECU = Electronic Control Unit
•
ETF = Event Triggered Frame
•
ID = Identifier
•
LIN = Local Interconnect Network
•
LDF = LIN Description File
•
NAD = Node Address
•
NCF = Node Capability File
•
OTP = On time Programmable
•
SBC = System Basis Chip
•
SCI = Serial Communication Interface
•
SOC = System on Chip
•
UART = Universal Asynchronous Receiver/Transmitter
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