Supporting Information Superconducting molybdenum-rhenium electrodes for single-molecule transport studies R. Gaudenzi1, J. Island1, J. de Bruijckere, E. Burzuri, T. Klapwijk, H. S. J. van der Zant Supporting Information Contents 1. Electromigration current-voltage characteristics Figure S1: I-Vb of electromigration process 2. Three terminal measurement (I-Vb-Vg) of an SN-I-NS junction Figure S2: I-Vb-Vg characteristics and 1D line cuts 3. Temperature and magnetic field dependence for a second characteristic device Figure S3: dI/dV-Vb as a function of temperature and magnetic field 4. Estimation of the charging energy U and electrode coupling constant 1. Electromigration current-voltage characteristics Feedback controlled software is used to monitor and adjust the voltage across the gold wire to steadily create a constriction at room temperature. Figure S1 shows the typical current voltage characteristics recorded during the creation of a constriction. The voltage is ramped up to > 1V at which point the resistance of the junction starts to change and the feedback software decreases the voltage to arrest an avalanche breaking of the wire. This continues to create a final constriction which is left to self-break at room temperature leaving a fewnanometer gap. Figure S1: Current-voltage characteristics for the electromigration of a typical device. 2. Three terminal measurement (I-Vb-Vg) of an SN-I-NS junction Figure S2 shows a three terminal measurement of an SN-I-NS junction taken at 100 mK after the electromigration and self-breaking process. A numerical derivative is taken to plot 1 The two authors contributed equally 1 dI/dV versus bias and gate voltage. The conductance does not change over the accessible gate voltage range (+-7V) indicating tunneling through a gate independent vacuum barrier. Figure S2: Three terminal measurement of an SN-I-NS junction at low temperature (100 mK). Current is measured as a function bias voltage and back-gate voltage. A numerical derivative is taken to plot dI/dV-Vb-Vg. 3. Temperature and magnetic field dependence for a second characteristic device Figure S3 shows the complete characteristics for a second device. This SN-I-NS junction shows the same characteristics as the main text device. The softening of the proximity induced gap with temperature is shown in Fig. S3(a). Again, a residual gap is present at 4.5K. Figures 3(b) and (c) for the magnetic field dependence in the z and y-axis. Greater modulation of the gap is found for fields in the z-axis direction. Figure S3: (a) Temperature dependence of the SN-I-NS junctions. A numerical derivative is plotted versus the applied bias voltage. (b) Magnetic field dependence of the junction with the external field in the z-axis direction. (c) Magnetic field dependence of the junctions with the external field in the y-axis direction. 2 4. Estimation of the charging energy U and electrode coupling constant An estimation of the charging energy U can be obtained from the V vs. Vgate differential conductance map according to U = Vgate, where is the gate coupling – obtained from the slopes of the Coulomb edges of the same conductance maps – and Vgate is the distance in gate voltage between two charge degeneracy points. From figure S4, meV/V and Vgate ≥ 7.5 V, so that U ≥ 13 x 7.5 meV. V (mV) 7.5 2.5 -2.5 -7.5 -4 -2 0 Vgate (V) 2 4 Figure S4: Coarse differential conductance map of an individual Fe4-SMM as a function of gate and bias voltages. The selected voltage range is the maximum allowed by the gate oxide. The molecule-electrode coupling constant is obtained from fitting the charge degeneracy peak (V = 0V, B = 8T) shown in figure S5 to a lorentzian function. The FWHM of the lorentzian extracted from the fit multiplied by the gate coupling yields 1meV. The high magnetic field ensures a negligible influence of superconductivity on transport. Figure S5: Normalized differential conductance zero-bias trace (charge degeneracy point) as a function of gate voltage obtained at a magnetic field of 8T. At this field superconductivity is completely lifted so that regular quasiparticle transport is restored. The molecule-electrode coupling constant is obtained by fitting the trace to a lorentzian. 3