Ben- Gurion University of the Negev
Materials Engineering
Name of the module: Analytical Transmission Electron Microscopy for Nanoscale Characterization of Materials
Number of module: 365-2-6906
BGU Credits: 3
Course Description:
ECTS credits: 5
The course will review analytical methodologies used in advanced transmission
Academic year: 2012-2013
and scanning transmission electron microscopy (TEM and STEM). These
Semester: Fall semester
analytical methods characterize the composition, structure, chemical bonding,
Hours of instruction: 3 hours per
electronic structure, electric and magnetic fields at nanometer to atomic scale
week, Monday 3pm-6pm
spatial resolution.
Location of instruction:
will be
The first part of the course is related to the instrumentation (e.g. electron source,
defined
vacuum system, etc.) and the laboratory requirements for achieving analytical
Language of instruction: Hebrew, or
S/TEM characterization.
English if requested by students
The second part describes and compares the imaging modes and the contrast
Cycle: second / third
transfer functions in both phase-contrast (high resolution TEM) and high-angle
Position: an advanced course for
annular dark-field STEM. In particular, the influence of spherical aberration
graduate students of the Materials
correction of the objective lens is described and evaluated.
Engineering Department
The third part is spectroscopy, with an emphasis on electron energy-loss. The
Field
of
Education:
Materials
physical background is discussed followed by practical methods of data analysis
Engineering
for calculating the composition and evaluating the electronic structure of materials.
Responsible department: Materials
In the fourth part, mid-resolution phase microscopy is discussed for measuring
Engineering
electrical and magnetic fields: Lorentz TEM and off-axis electron holography.
Aims of the module:
General prerequisites: Introductory
Students will learn experimental methodologies of analytical transmission electron
course on electron microscopy, e.g.
microscopy (TEM) and scanning TEM for nanometer to atomic scale spatial
365-1-4611, in consultation with the
characterization of materials. The course will combine a theoretical background
lecturer
with practical approaches for measurements and data analysis enabling to
Grading scale: the grading scale
understand reported experiments and plan experiments using these methodologies.
determined on a scale of 0 – 100 (0
Objectives of the module:
would
To familiarize students with modern analytical S/TEM methodologies for the
indicate
failure
and
100
complete success), passing grade is
characterization of materials at nanometer to atomic-scale spatial resolution.
75.
Learning outcomes of the module: On successful completion of the course, the
student should be able to:
1.
Describe, at a basic level, the optical configuration and alignment of a
transmission electron microscope and scanning TEM.
2.
Explain the following contrast mechanisms and their contrast transfer
functions: phase-contrast, high-angle annular dark-field
3.
Describe the principles of operation of electron energy-loss and energy
dispersive spectrometers in the S/TEM.
4.
Describe inelastic electron scattering processes measured in EELS.
5.
Explain methods of EELS data analysis for compositional quantification
and chemical bonding characterization.
6.
Formulate an experiment for nano-scale characterization of materials
based on the discussed S/TEM imaging and spectroscopy methods.
…
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statements of what student is expected to know, understand and\ or be able to demonstrate after
Ben- Gurion University of the Negev
Materials Engineering
Lecturer: Dr Amit Kohn
Attendance regulation: attendance in class is mandatory (at least 80%).
Contact details:
Teaching arrangement and method of instruction: lectures, including a practical
room 207, building 51
demonstration of analytical S/TEM.
Office phone: 08-6428610
Assessment:
Email: akohn@bgu.ac.il
1.
Project, including short presentation 50%
Office hours:
2.
Oral exam
50%
Monday, from 10am to 12pm
100%
Module evaluation: at the end of the
semester the students will evaluate
Work and assignments: Students are expected to review lecture notes and read
the
relevant bibliography after each class;
module,
in order to draw
conclusions, and for the university's
Each student will be assigned a project, to be chosen from the following type:
-
internal needs.
Proposal for an experiment using an analytical TEM methodology
(preferably related to their graduate research topic). The project should
was
include a brief background on the scientific motivation, aim of the
confirmed by the faculty academic
experiment, the reasoning for choosing the specific analytical method,
advisory committee to be valid on
detailed design of experiment, methods required for data analysis,
2012-2013.
expected outcome, and references.
Confirmation:
the
syllabus
-
Image simulation: high-resolution (phase contrast), Fresnel-contrast, or
HAADF scanning TEM based on guidance by the lecturer.
Last update: 06.08.2012
-
Data analysis: EFTEM, or STEM EELS or STEM EDS or off-axis electron
holography
Time required for individual work: in addition to attendance in class, the students
are expected to do their assignment and individual work: at least 3 hours per week.
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Ben- Gurion University of the Negev
Materials Engineering
Module Content\ schedule and outlines:
Definition of Analytical TEM; explanation of the motivation for the course
• Electron microscopes and instrumentation:
Electron sources: Field emission, energy resolution and monochromators. (3 hours)
Imaging modes: TEM and Scanning TEM (STEM) (3 hours)
Correction of spherical aberration and implications to analytical microscopy. (3 hours)
Spectrometry instrumentation: measuring energy dispersive X-ray, and electron energy loss (post-column spectrometer and
in-column Omega filter) (3 hours)
• Composition, chemical bonding, electronic structure:
Energy dispersive X-ray spectrometry (3 hours)
Electron energy loss spectrometry (6 hours)
Spectrum imaging (EDS and EELS), Energy-filtered TEM. (3 hours)
High angle annular dark-field STEM (6 hours)
• Electric and magnetic field imaging (3 hours)
Electron holography
Lorentz TEM
• Practical lab on the JEOL 2100F S/TEM and data analysis. (3 hours)
• Presentation of projects (3-4 hours, depending on number of registered students)
• Time permitting:
Tomography: reconstructing 3D structures using analytical data.
Data analysis methods, etc. (3 hours)
Required reading:
• R.F. Egerton, Electron energy-loss spectroscopy in the TEM, Rep. Prog. Phys. 72 (2009) 016502 (25pp)
• V. J. Keast, A. J. Scott, R. Brydson, D. B. Williams, and J. Bruley, Electron energy-loss near edge structure – a tool for
investigation of electronic structure on the nanometer scale, J. of Microscopy 2001. 203:135-175
• N. D. Browning, I. Arslan, P. Moeck, and T. Topuria, Atomic Resolution Scanning Transmission Electron Microscopy,
Phys. Stat. Sol. (b) 227, No. 1, 229–245 (2001).
• Pennycook, S. J., Lupini, A.R., Varela, M., Borisevich, A. Y., Peng, Y., Oxley, M.P., van Bentham, K., and Chisholm, M.
F. (2007) Scanning transmission electron microscopy for nanostructure characterization. In “Scanning Microscopy for
Nanotechnology: Techniques and Applications” (Zhou, W. and Wang, Z. L., eds.) Springer, New York, Ch. 6, pp 152-191
• Martha R. McCartney and David J. Smith, Electron Holography: Phase Imaging with Nanometer Resolution, Annu. Rev.
Mater. Res. 2007. 37:729–67
Additional literature:
• Williams and Carter, ‘Transmission Electron Microscopy’, 2nd Edition, Springer
• Rik Brydson, Electron Energy Loss Spectroscopy, Taylor & Francis
• R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press
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