ITRS workshop on Emerging Spin and Carbon Based Emerging Logic Devices George Bourianoff, Intel Jim Hutchby, SRC Barcelo Renacimiento Hotel Conference Room D2 Sept 17, 2010 (8:00 – 18:30) Seville, Spain Outline • • • • • ERD charter Background Meeting Objectives Next steps, timeline Agenda Charter of ERD Chapter On behalf of the 2011 ITRS, develop an Emerging Research Devices chapter to -Critically assess new approaches to Information Processing technology beyond ultimate CMOS Identify most promising approach(es) to Information Processing technology to be implemented by 2024 To offer substantive guidance to – Global research community Relevant government agencies Technology managers Suppliers 3 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Scope of ERD Chapter Integrated emerging research memory, logic and new architecture technologies enabled by supporting -Materials and process technologies Modeling and simulation Metrologies Selection of specific technical approaches shall be Guided by fundamental requirements Bounded by ERD’s topic selection criteria 4 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Scope of ERD Chapter Criteria for Including Technology Entries Devices and Architectures – Published by 2 or more groups in archival literature and peer reviewed conferences, or Published extensively by 1 group in archival literature and peer reviewed conferences Technology Entry (by itself or integrated with CMOS) must address a major electronics market. Materials and Fabrication Technologies – Materials and processes that address the specific material needs defined by emerging research device technology entries Supporting disciplines – specify for crosscut TWGs Metrologies Modeling & simulation 5 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Emerging Research Devices Working Group Meeting Objectives Review ERD/ERM 2010 Workshops (cont’d) Logic Devices Summary of VLSI Tech Workshop on III-V MOSFETs Assessment of III-V compound & Ge MOSFET technology Carbon-based nanoelectronic devices Spin Transfer Torque logic devices Review plans for ERD Device workshop in Seville, Spain on Sept. 17 Emerging Research Architectures (Logic device benchmarking) Current status Plans for 2010 – 2011 Summary of potential changes in 2011 ERD Chapter Summary of potential changes in 2011 ERM Chapter 6 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Background • ITRS rewritten on a 2 year cycle – Information gathering workshops and chapter writing done on alternate years – 2010 is devoted to workshops – Previous Emerging Logic Workshop was held in Tsukuba, Japan 2008 focusing on spin and graphene devices • This workshop will review significant accomplishments in those areas in the intervening 2 years Meeting objectives • Review significant new research initiatives in spin based logic • Review significant research programs and accomplishments in graphene based logic • Hold brief business meeting – Discuss 2011 ERD Logic Table structure and en tries – Discuss potential writing assignments Morning AGENDA Progress, status and research needs for spin based logic elements – Sept, 17, 2010 8:00 Welcome and Introductions G. Bourianoff 8:15 Overview of DARPA Spin Logic Program D. Shenoy 8:50 Nano-magnetic Logic S. Hu 9:25 All Spin Logic B. Bhin-Aein 10:00 Break 10:15 Magnetic FPGA Spin in Logic T. Hanyu 10:50 "TIMARIS" Linear dynamic deposition technology W. Maass for production of spintronic devices 11:25 Wrap-up and Discussion 12:00 Lunch 9 ERD/ERM WG 4/6-7/2010 Barza, ITALY Workshop & FxF Meeting G. Bourianoff Work in Progress --- Not for Publication Afternoon AGENDA Progress, status and research needs for graphene based logic elements – Sept. 17, 2010 13:15 Graphene Logic Devices P. Kim 13:50 Analog & RF Graphene – based FETs C.Y. Sung 14:20 GRAND Perspectives on Graphene Electronics H. Kurz 15:00 Break 15:15 Gate induced Bandgap for Graphene Devices 15:50 Graphene Research at CEA S. Roche 16:25 Wrap-up and Discussion J. Hutchby 17:00 Break 17:30 ITRS Business Meeting 18:30 Adjourn 10 ERD/ERM WG 4/6-7/2010 Barza, ITALY Workshop & FxF Meeting T. Tsukagoshi J. Hutchby Work in Progress --- Not for Publication Business meeting Emerging Research Logic Device business meeting • Review table structure and make recommendations – 2009 had 3 tables plus transition table – Table 1 MOSFETS: Extending the channel to the End of the Roadmap – Table 2 Charge based Beyond CMOS: NonConventional FETs and other Charge-based information carrier devices – Table 3 Alternative Information Processing Devices • Review table entries and make recommendations New Logic Technology Tables Table 1 – MOSFETs Extending the Channel of MOSFETs to the End of the roadmap _____________ CNT FETs Graphene nanoribbons III-V Channel MOSFETs Ge Channel MOSFETs Nanowire FETs Non conventional geometry devices 13 ERD Table 2- Unconventional FETS, Charge-based Extended CMOS Devices _______________ Table 3 - Non-FET, Non Charge-based ‘Beyond CMOS’ devices Tunnel FET I-MOS Spin FET SET NEMS switch Negative Cg MOSFET Collective Magnetic Devices Moving domain wall devices Atomic Switch Molecular Switch Pseudo-spintronic Devices Nanomagnetic (M:QCA) _______________ 2009 ITRS Winter Conference – Hsinchu, Taiwan – 16 December 2009 2009 Logic Transition table Technology Status Reason RTD out No viable logic functionality Bi-layer tunneling devices In Significant theoretical work in NRI Band to band In tunneling devices NEMS In RSFQ Possible future device Comment Has been tracked for multiple revisions Table ERD7b Charge based Beyond CMOS: Non-Conventional FETs and other Charge-based information carrier devices Device FET [A] Tunnel FET Typical example devices Si CMOS All Si tunnel FET Strained Ge or III-V Projected 100 nm 20 nm [A] Demonstrated 590 nm Demonstrated: 70 nm, 100nm [B,C] Negative Cg FET Spin Transistor I-MOS Ferroelectric FET [H], [I] 100 nm 100 nm [same as CMOS] Spin FET [K] Spin MOSFET 100 nm for spin MOSFET [L] bCell Size (spatial pitch) [B] Density (device/cm 2 ) Projected 1.00E+10 Not known: channel length scalable down to 20nm [D] Demonstrated 2.80E+08 ~1E10 Projected 12 THz Not known Demonstrated 1.5 THz Si/Ge/InAs tunneling source: 1GHz/1THz/3THz [A] Switch Speed Projected 61 GHz Not known Demonstrated 5.6 GHz will depend on the source material used Projected 3.00E-18 Not known 1.00E-16 Si/Ge/InAs tunneling source: 90/90/3000E-18 J/um at VDD=0.5V, L=20nm [A] Circuit Speed Demonstrated GBit/ns/cm 2 2000 nm 1.00E+10 1E10[same as CMOS] [I] 2.50E+07 Unknown Unknown Limited by the ferroelectric Identical to response time, CMOSFET- with Ge, depends on the SiGe [E],[F],[G] ferroelectric material not known MEMS 40 nm [O] 100 nm [X} ~200 nm [P,Q] 900 nm for spin MOSFET [L] 6.00E+10 1.00E+10 Not investigated ~2E9 1 /cm**2 W2 10 THz [R] 1 GHz [Y] 2 THz [S] 0.18 GHz [Z] for spin MOSFET [M] 2 GHz [O] 1 GHz Not investigated 1 MHz [T] .18 GHz 1E-17-1E-18 1×10–18 [O] for spin MOSFET [M]] [>1.5×10–17 ] [U] ~1mm (channel length) for Spin FET[M] ~1E10 ~10 THz or less for spin MOSFET [N]] 30GHz N/A for Spin FET[M] Identical to CMOSFET- with Ge, SiGe [E],[F],[G] Unknown Limited by the ferroelectric response time, depends on the ~10GHz or less Not known: Switching Energy, J Binary Throughput, Unknown Single Electron Transistor Projected 238 Not known not known Identical to CMOSFET- with Ge, SiGe [E],[F],[G] N/A unknown 5E -17 J [A1,A2] 8×10–17 [V] N/A Not investigated [>1.3×10–14] [W] Not known ~200 10 not known not known 10 Table ERD7c Alternative Information Processing Devices Collective spin devices Moving Domain wall State Variable Spin Response Function Sinusoidal, various Class—Example Spin Wave Mach Zender Architecture Morphic Application Signal Processing Comments Status Material Issues Demonstrated High propagation loss, slow propagation velocity Atomic switch Molecular Pseudospintronc Charge distribution metal cations / atoms symmetry in two layers Gate controlled Non linear Non-linear Nonlinear, NDR NDR Bilayer Pseudospin Ferromagnetic wire Combinatorial logic Programable logic Field Effent devices circuits Transistor Morphic Morphic, cross bar Morphic Morphic Low power, Combinatorial logic General purpose Non volitale logic reconfigurable logic circuits logic Low resistance, low Extremely low power power Simulated Demonstrated Simulated Simulated, theory Polarization, magnetization High permeability material required Molecular configuration Low defect bilayer graphene, contacts Nano magnetic Magneric polarization patterns Non linear MQCA majority gate Morphic General purpose logic Low power, high density Demonstrated Issues and Decisions for 2011 Chapter - Logic Logic (Baltimore): The following questions were addressed: 1. Is the new organization (e.g. 3 subsections) an effective taxonomy of logic devices? 2. Are the technology entries the best candidates pursed by the research community? 3. Any technology entries in the logic chapter to move to the transition table? Potential candidates for 2011? 4. Right level of details? Mission accomplished concerning current status and critical paths? Refer to Adrian Ionescu’s presentation for his thoughtful answers to these questions (attached to this file). • In the Logic Transition Table, the IN/OUT entries for Ge FET, Spin MOSFET, Collective Spin Devices, Pseudomorphic, and Nanomagnetic Devices should be move into the Comment column to the right. Entries in the IN/OUT column might better be technical in nature. (being considered & discussed) 17 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Issues and Decisions for 2011 Chapter - Logic • Areas for improvements (suggested by Adrian Ionescu): – Introduction of energy efficiency criteria? Important (being considered/discussed) – Role of other functionality than digital of beyond CMOS: image processing, analog, RF, etc. (being considered/discussed) – Convergence of beyond CMOS and More than Moore technology entries? MEMS/NEMS already in (being considered/discussed) – More interaction with emerging architectures needed. (Decided) • Transfer to PIDS in 2011 – Alternate channel materials , Ge and III-V Semiconductors (keep CNT and GNR FETs) (Decided) – Unconventional FET s, Tri-Gate, FinFET, GAA FETs, etc. (Decided) Logic (Hsinchu): • Transfer to PIDS in 2011 – Alternate channel materials , Ge and III-V Semiconductors (keep CNT and GNR FETs) (Decided) • Unconventional FET s, Tri-Gate, FinFET, GAA FETs, etc. (Decided) 18 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Memory Technology Entries Resistive Memories Nanoelectromechanical Spin Transfer Torque MRAM Macromolecular (Polymer) Molecular Memory Electronic Effects Memory − Charge trapping − Metal-Insulator Transition − FE barrier effects 19 ERD Nanothermal –Thermochemical FUSE/Anti-FUSE − Nanowire PCM Nanoionic Memory (Electrochemical) − Cation migration − Anion migration Capacitive Memory FeFET Memory 2009 ITRS Winter Conference – Hsinchu, Taiwan – 16 December 2009 Issues and Decisions for 2011 Chapter - Memory Memory (Baltimore): • In the Memory Section, we need to discuss fabrication and issues related to the select device, either a diode or a transistor, for the storage elements in a cross-bar array. • We will include emerging research solid state Storage Class Memory technologies, but not include SCM based on mechanical or magnetic disc storage. The driving issue is to minimize the cost per bit – this is very important. Memory (Hsinchu): No decisions 20 ERD WG 7/11/2010 San Francisco, CA. FxF Meeting Work in Progress --- Not for Publication Proposed changes to the ERD Memory section To take out the “electronic effect memories” entry from the ERD memory table The FTJ memory could be covered along with FeFET as a subcategory Mott Memory could form a stand-alone entry if the ERD group decides, there is a sufficient critical mass of works 21