Infrastructure of Thin Films
Division in IMP
Hubert Głowiński and Janusz Dubowik,
IFM PAN
Outline
VNA-FMR
FMR
PIMM
Dynamic measurements
VSM
PPMS
MOKE
Static measurements
GIXRD
XRF
Structural characterization
Field sweep FMR
• During field sweep FMR experiment magnetization vector
changes its direction
FMR
Gaussmeter
Microwave
bridge
Lock-in
Field sweep
controller
• X-band spectrometer
9.18 GHz
• Field up to 11 kOe
VNA-FMR
Port 1
Port 2
On frequency sweep
FMR experiment
magnetization vector
does not change its
direction
Próbka
Microwave field
Coplanar
waveguide
External magnetic field
• Frequency up
to 40 GHz
CPW – coplanar waveguide
External magnetic field
Magnetic field lines
Electric field lines
Simulated current
Homogenous current
I. Neudecker et al. JMMM 307 (2006) 148–156
Channelized Coplanar Waveguide
The vias are acting
as a microwave wall
The other determining factor in the high frequency performance of
the vias is the spacing between the rows of the vias. The wider the
spacing, the lower the cutoff frequency and the closer the spacing
the higher the cutoff frequency.
http://mpd.southwestmicrowave.com/pdf/Launch_Report.pdf
VNA-FMR
Gaussmeter
VNA
Helmholtz’
s coils
Power
supply
VNA-FMR
Frequency sweep mode
Different fields
Field sweep mode
Different frequencies
0,2313
0,2312
0,2311
Free
0,2310
Polarizer
0,2309
A [a.u.]
0,2308
0,2307
0,2306
0,2305
0,2304
20 GHz
0,2303
Analyzer
0,2302
0,2301
0,2300
0
2000
4000
6000
Field [Oe]
8000
10000
12000
Au
Co
Au
Co
Au
Co
Au
Co
Au
Co
Au
Ti
Si
Pulsed inductive microwave
magnetometer (PIMM)
Pulse
generator
Trigger
Port
Port
Sampling
oscilloscope
Pulse magnetic field
Sample
External magnetic field
Bandwidth 20 GHz
Pulse risetime 55 ps
Pulse amplitude 10 V
PIMM
Pulse
generator
Oscilloscope
Helmholtz
coils
Power supply
Vibrating Sample Magnetometer –
VSM
• Frequency: 35 Hz
• Dual pickup coils
• Magnetic field: up to
16 kOe
• Temperature: -100oC
to 250oC
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011
Generator
Gaussmeter
Loudspeaker
Glass
pipe
Hallo
tron
PC
Power
supply
Pickup
coils
Lock-in
PHYSICAL PROPERTY
MEASUREMENT SYSTEM (PPMS)
• Options
– VSM
– Resistance
– Torque magnetometer
• PPMS system properties:
– Temperature range: 2 K 350 K.
– Magnetic field: up to 9
tesla.
– Magnetic field ramp rate:
determined by magnet and
power supply.
– Temperature and magnetic
field may be ramped
during the measurement.
MOKE
Z axis
Stepper motor
Modulator
Polarizer
Lens
Mirror
Elektromagnet
Laser
Wavelength
λ=640 nm
Modulator
Analyzer
Gauss
meter
Lens
Detector
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011
Power
supply
Lock-in
PC
MOKE – device setup
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011
Laser diode
Polarizer
Modulator
Lens
Electromagnet
Sample holder and table
Mirror
Analyser
Lens
Detector (fotodiode)
Magnetic field sensor
MOKE
M [a.u.]
Ti4/Au60/(Co0.8/Au1)3/Au2/Co1.5/Au2/Co3/Au5
40
20
0
-20
-40
-60
-80
-100
-120
-140
-160
-180
-200
-220
-240
-260
-280
-300
0
2
4
6
8
0
2
4
6
8
-8
-6
-4
-2
0
H [kOe]
2
4
6
8
Au
Co
Au
Co
Au
Co
Au
Co
Au
Co
Au
Ti
Si
XRF
Characteristic radiation
Multichannel analyzer 10 keV / 1024
channels
• We can measure:
– Thickness of thin films (up
to 200 nm)
– Chemical elements
composition
K. Załęski, Masters thesis, UAM Wydział Fizyki, Poznań 2007
1 – X-ray source, 2 - collimator,
3 – sample holder, 4 - detector
Wikipedia
GIXRD
Seifert, model XRD 3003,
X-ray source Cu-K
(wavelength λ=0.15419 nm)
Interference of the wave reflected
from surface of the film and the
surface of the substrate results in
Kiessiga fringes.
Allows to measure thickness
of thin films
P. Kuświk, PhD dissertation, IFM PAN, Poznań, 2010
2θ varies
0o
-
10o
aperture
X-ray
source
sample
detector
Summary
• We are able to characterize magnetically
samples (effective fields, anisotropy,
damping parameter)
• We are able to characterize structure of the
sample (film thickness, sublayer thickness,
chemical composition)
Thank you for your attention!