Introduction to X-Ray Optics, Coherence and Standing Waves David Attwood University of California, Berkeley Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 1 The short wavelength region of the electromagnetic spectrum n = 1 – δ + iβ Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 δ, β << 1 ICTP_Trieste_Lec2_Nov2014.pptx 2 Characteristic absorption edges for almost all elements in this spectral region Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 3 Energy levels, quantum numbers, and allowed transitions for the copper atom Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 4 Electron binding energies, in electron volts (eV), for the elements in their natural forms www.cxro.LBL.gov Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 5 Available x-ray optical techniques Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 6 Wave propagation and refractive index at x-ray wavelengths Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 7 Glancing Incidence Optics Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 8 Total external reflection of soft x-ray and EUV radiation Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 9 Total external reflection with finite Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 10 Buried, trace amounts of iron in a defective silicon solar cell Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 11 X-ray microprobe at SPring-8 Optical microscope PIN photodiode Now focused to 7 nm SDD Mirror manipulator DCM Undulator TC1Slit Ion chamber Incident Slit Beam monitor Sample & Scanner Experimental hutch S. Matsuyama et al., Rev. Sci. Instrum. 77, 103102 (2006) Front end Courtesy of K. Yamauchi and H. Mimura, Osaka University. Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 12 Multilayer mirrors can provide high reflectivity at the Bragg condition Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 13 A High Quality Mo/Si Multilayer Mirror Small reflections at many interfaces add in phase at the Bragg angle N = 40 d = 6.7 Courtesy of Sasa ˇ Bajt (DESY) Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 14 Multilayer mirrors have achieved 70% reflectivity Courtesy of Sasa Bajt, LLNL Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 15 A Fresnel zone plate lens Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 16 A Fresnel zone plate lens used as a diffractive lens for point to point imaging Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 17 Depth of focus and spectral bandwidth Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 18 New x-ray lenses: Improving contrast and resolution for x-ray microscopy C. Chang, A. Sakdinawat, P.J. Fischer, E.H. Anderson, D.T. Attwood, Opt. Lett. 2006; Sakdinawat and Liu, Opt. Lett. 2007; Sakdinawat and Liu, Opt. Express 2008 Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 19 New ultra high aspect ratio, high efficiency, hard x-ray zone plates for high spatial resolution at 30-50 keV Δr = 100 nm Δh = 6.6 µm 3.4 µ Courtesy of Anne Sakdinawat and Chieh Chang (SLAC) 20 Coherence Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 21 Born and Wolf, Chapter 10 Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 22 Spatial and temporal coherence Temporal Coherence Ability of a light beam to form fringes with a delayed version of itself Spatial Coherence Ability of spatially separated points in a wavefront to form fringes. Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 23 Marching band and coherence lengths Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 24 Spatial and spectral Courtesy of A. Schawlow, Stanford Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 25 Coherence, partial coherence, and incoherence Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 26 Spatial and temporal coherence Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 27 Spectral bandwidth and longitudinal coherence length Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 28 A practical interpretation of spatial coherence Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 29 Partially coherent radiation approaches uncertainty principle limits Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 30 Young’s double slit experiment: spatial coherence and the persistence of fringes Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 31 Young’s double slit experiment: spatial coherence and the persistence of fringes Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 32 Young’s double slit experiment: spatial coherence and the persistence of fringes Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 33 Undulator beamline for high spatial coherence measurements Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 34 Measuring the spatial coherence of undulator radiation: double pinhole experimental results Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 35 Spatially coherent undulator radiation Courtesy of Kris Rosfjord, UCB Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 36 Coherent soft x-ray science beamline K. Rosfjord, Y. Liu, D. Attwood, “Tunable Coherent Soft X-Rays”, IEEE J. Sel. Top. Quant. Electr.10, 1405 (Nov/Dec 2004) Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 37 Spatial coherence measurements of undulator radiation using the classic 2-pinhole technique Courtesy of Chang Chang, UC Berkeley and LBNL. l = 13.4 nm, 450 nm diameter pinholes, 1024 x 1024 EUV/CCD at 26 cm ALS, 1.9 GeV, lu = 8 cm, N = 55 Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 38 Spatial coherence measurements of undulator radiation using the classic 2-pinhole technique Courtesy of Chang Chang, UC Berkeley and LBNL. l = 13.4 nm, 450 nm diameter pinholes, 1024 x 1024 EUV/CCD at 26 cm ALS, 1.9 GeV, lu = 8 cm, N = 55 Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 39 Lensless imaging of magnetic nanostructures by x-ray spectro-holography Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 40 Coherent power at BESSY II Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 41 Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 42 High spectral resolution (meV) beamline Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 43 Beamline 7.0 at Berkeley’s Advanced Light Source Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 44 X-ray Standing Wave (XSW): Interference between the incident and reflected waves above a surface d = λ/2sinθ Professor David Attwood / UC Berkeley / ICTP-IAEA School, Trieste, November 2014 ICTP_Trieste_Lec2_Nov2014.pptx 45 I Reference-free GIXRF nanolayer characterisation PIB X-ray and IR spectrometry • reference-free GIXRF analysis uses the XSW to characterize nanolayered samples (layer composition and thickness, surface calibrated instrumentation and interface mass and composition) without any calibration samples nor reference materials wellknown • XSW calculation using IMD or own software depth-dependent modification of the excitation conditions revealing information about the sequence of the layers Anal. Chem. 83, 8623 (2011) 1. 2. 3. 4. oxygen carbon boron silicon (substate) carbon contamination at surface visible J. Anal. At. Spectrom. 23, 845 (2007) R. Unterumsberger, B. Pollakowski, B. Beckhoff I Synchrotron radiation based GIXRF depth profiling PIB X-ray and IR spectrometry • GIXRF can be used to depth profile gradient (e.g. ion implants) or nanolayered samples • Calculation of the XSW using IMD software or iteratively based on X-ray reflectivity data 3 keV As implant into Si , dose: 1015 cm-2 1 keV Al implant into Si, dose: 1016 cm-2 TRIM SIMS MEIS STEM GIXRF Anal. Bioanal. Chem. 396, 2825 (2010) P. Hönicke, B. Beckhoff TRIM GIXRF GIXRF+XRR J. Anal. At. Spectrom. 27, 1432 (2012) I Non-destructive interface speciation by GIXRF-NEXAFS PIB X-ray and IR spectrometry • Development of a methodology for non-destructive interface analysis, which is traceable and reliable • A priori X-ray standing wave analysis in order to keep the mean penetration depth constant when changing the photon energy during NEXAFS scans • Methodology has been proven by a model system consisting of boron carbide and Nickel Anal. Chem. 85, 193-200 (2013) • Application-oriented samples system: thin film Si photovoltaic -> interface between Si and TCO material J. Appl. Phys. 113, 044519 (2013) B. Pollakowski, B. Beckhoff