TSV-Aware Analytical Placement for 3D IC Designs

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TSV-Aware Analytical
Placement for 3D IC Designs
Meng-Kai Hsu, Yao-Wen Chang, and Valerity
Balabanov
GIEE and EE department of NTU
DAC 2011
Outline
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Introduction
Previous works and Contributions
Problem formulation and analytical
placement
TSV-aware 3D analytical global placement
TSV insertion and TSV-aware legalization
Experimental results and Conclusions
Introduction
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3D IC technology can effectively
reduce global interconnect length and
increase circuit performance.
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In a generic 3D IC structure, each die
is stacked on top of another and
communicated by Through-Silicon Vias
(TSVs).
Introduction (cont.)
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TSV pitches are very large compared
to the sizes of regular metal wires
under current technology.
Moreover, TSVs are usually placed at
the white space.
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Routing resource, chip area, yield, etc.
are affected.
Schematic view of placement
Example of placement
If the TSVs are not well considered…
Previous works
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[9] folding/stacking with layer reassignment.
[11] use partitioning-based approach.
[7] is multi-level analytical placement
and cell could move along z-direction.
[15] partition cell first, then do
placement for each layer.
Contributions
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New 3D placement algorithm consists
of three stages that takes sizes and
positions of TSVs into account.
Weighted-average wirelength model
with smaller estimation errors than
Log-sum-exp (LSE) model.
Density cube to model the density.
Contributions (cont.)
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Not only handles the TSV count but also
handles the size of TSVs.
A TSV insertion algorithm based on the
overlapping whitespace area between
neighboring layers is proposed to determine
the location of each TSV.
Routing can be easily accomplished.
Moreover, the proposed algorithm achieves
best comparing with [7,15].
Problem formulation
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Given a placement region and the number of device
layers k, we intend to determine the optimal positions of
movable blocks so that the total wirelength and the
number of required TSVs are minimized while satisfying
the non-overlapping constraints among blocks and TSVs.
Inputs
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V  {v1 , v2 ,...,vn } as the set of n blocks.
E  {e1 , e2 ,...,em} as the set of m nets.
Placement region definitions with k device layers.
Density constraints, TSV size.
Outputs
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The location of each block and TSVs (layer and coordinates)
without constraint violation. The netlist should be updated.
Traditional placement flow
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Global placement: Find the best
position and layer for each block to
minimize the target cost.
Legalization: Remove overlaps.
Detail placement: Refines the
placement solution.
Analytical placement
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Optimize the target of placement by
mathematical way.
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Linear programming (LP), Quadratic
programming (QP), etc.
Key: How to model and how to solve.
Proposed TSV-aware 3D
analytical placement flow
3D analytical global placement
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The 3D analytical global placement
problem can be formulated as a
constrained optimization problem as
follows:
Wirelength and TSV model
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The wirelength W(x, y) is defined as
the total half-perimeter wirelength
(HPWL).
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The number of TSVs used for each net
could be approximated by the number
of layers it spans.
Wirelength and TSV model
(cont.)
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The above equations is not differentiable.
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Need differentiable one to approximate.
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Log-sum-exp (LSE) model
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The LSE wirelength is close to the HPWL
when γ approaches to zero.
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In fact, γ cannot be too small or else overflow
occurs => error is inevitable.
Proposed weighted-average
(WA) wirelength model
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Weighted-average
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In order to approximate maximum, the
following function is used.
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Hence, the WA model will be:
Estimation error comparisons
Density cube model
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The density of a cube b of layer k can
be defined as:
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Px, Py, and Pz are the overlap
computing functions along three
dimensions.
White space reservation for
TSVs
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Assume that the communication
between neighboring layers of a net is
through one TSV.
Distribute required spaces for TSVs
into density cubes inside the net-box
evenly.
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Net-box: the range spanned by a net.
Transform to unconstrained problem
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Solve a sequence of unconstrained
problem with increasing λ.
TSV insertion and TSV-aware
legalization
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Three-step scheme
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Layer-by-layer standard cell legalization
TSV insertion
TSV-aware legalization
Layer-by-layer standard cell legalization
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Minimum cell displacement without considering
TSVs.
Just like traditional legalization.
TSV insertion and TSV-aware
legalization (cont.)
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TSV insertion
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Decompose each net to 2-pin nets by MST.
Start from the 2-pin net with the smallest net-box
to the largest one.
Divide the region enclosed by net-box into bins,
and insert TSV into the overlapping white space
bin with minimized overlap between cells and
TSVs.
If there is not enough white space in the net-box,
the searched region is doubled, and the search
process continues.
Decompose each net to 2-pin
nets by MST
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Project cells to a single layer, then
compute edge cost by β*L(e)+δ*Z(e).
TSV insertion and TSV-aware
legalization (cont.)
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TSV-aware legalization
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Apply step1 and set TSVs as fixed blocks.
Experimental results
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Environment
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PC workstation
8x Xeon 2.5 GHz CPUs
26 GB memory
Implemented using C++
Integrated into NTUplace3
α ,β, and γ are set to 10, 0.4, and 0.6
respectively.
3D analytical placement comparisons
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4-layer 3D IC, area of each layer is
(original area)/4 and then enlarge to
get 10% white space.
TSV-aware placement comparisons
White space reservation comparisons
Example
Wirelength model comparisons
Conclusions
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Proposes a new TSV-aware placement
algorithm for 3D design.
Weighted-average wirelength model.
White space reservation for TSV
insertion.
Routing could easily be done by 2D
routers, and the algorithm achieves the
best result among [7,15].
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