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Test Vision Symposium 2022 5G OTA Prod Testing on ATE

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5G Millimeter Wave Over the Air Production Testing
on ATE
Roger C. Nettles, Jr. – Presenter
Sui-Xia Yang, Frank Goh, Aritomo Kikuchi, Yasuyuki Kato, Natsuki Shiota,
Hiroyuki Mineo, Natsuki Ueda, Hiromitsu Takasu, and Jose Moreira
Topics
• Motivation
• Strategy
• Far-Field OTA
• Near-Field OTA
• Handler Integration
5G Millimeter Wave Over the Air Production Testing on ATE
Motivation
5G-NR OTA Testing Challenges - Packaging
• 5G-NR antenna-in-package (AIP) modules
come in different sizes and configurations.
• They are composed of multiple dualpolarized patch antennas for top firing and
in some configurations also dipole
antennas for side firing.
• A 5G-NR cellphone will contain multiple
modules and they might also not be all
equal in terms of antenna configuration.
Source: Curtis Zwenger, Vik Chaudhry [Amkor Technology], “Antenna in package (AiP) technology for 5G growth , Chip Scale Review March/April,2020
5G Millimeter Wave Over the Air Production Testing on ATE
5G-NR Over The Air (OTA) Testing Challenges
The 3GPP standard defines the following
OTA test methods for 5G-NR:
•
•
Direct Far-Field
•
Near-Field to Far-Field Transformation
Direct Far-Field
Indirect Far-Field
Indirect Far-Field (e.g. Compact
Antenna Test Range, CATR)
For high-volume production of AIP modules
with ATE, lower cost approaches are needed
5G Millimeter Wave Over the Air Production Testing on ATE
Near-Field to Far-Field
Transformation
OTA Testing in the Context of 5G mmWave Module Test
AiP Module
Assembly
Silicon Wafer
Testing
•
•
•
•
mmWave Parametric?
Only Loopback?
Only DC/scan?
Tri-Temp?
•
X-ray validation?
5G Millimeter Wave Over the Air Production Testing on ATE
AiP Module
Testing
•
•
•
•
OTA Parametric?
OTA Loopback?
Hot/Cold Testing?
Calibration?
AiP Module Assembled on Final
System (e.g. Cell Phone)
System Level
Testing
•
•
•
OTA Parametric
Calibration?
Beam Forming?
Strategy
OTA Test Strategies
5G Millimeter Wave Over the Air Production Testing on ATE
The Path for a Successful HVM Parametric OTA
Far-Field OTA Setup
•
•
Near-Field OTA Setup
Manual Engineering Socket
Full Handler Integration
The OTA Parametric Solution is designed to provide in HVM parametric OTA measurements that can be correlated with farfield/chamber.
For this it is critical to provide a complete set of tools especially for the first time to allow this correlation to be clearly
established.
5G Millimeter Wave Over the Air Production Testing on ATE
Far-Field OTA
ATE Far-Field Characterization Measurement Options
Motorized Beamforming Stage
5G Millimeter Wave Over the Air Production Testing on ATE
Fixed Mounting Chamber
Fixed Mounting Frame
Socket Challenges: Lid/Pusher Impact Measured Results
PEEK
HF 71
•
•
Socket lid geometry and material are critical for OTA
performance.
There is always a compromise between mmWave
performance and mechanical performance and reliability.
5G Millimeter Wave Over the Air Production Testing on ATE
Near-Field OTA
Radiating Near-Field OTA Challenges
Measurement
patch
… /2 periodic
distance
… /2 periodic
DUT patch
MEASUREMENT PROBE ANTENNA
DUT AIP
Symmetric: can be overly optimistic
5G Millimeter Wave Over the Air Production Testing on ATE
DUT AIP
Offset: different distances to antenna elements
Antennas
Antennas for production testing requirements:
• Customised to fit in handler/arm/socket.
• Required to cover all frequency bands in the test program.
• Able to withstand production environment.
Dual polarized PCB antenna
With blind mating interconnect
Dual polarized waveguide
antenna
5G Millimeter Wave Over the Air Production Testing on ATE
Dual polarized PCB antenna
with coaxial interconnect
Manual socket with coaxial
interconnect
Manual socket with blind
mating interconnect
Handler Integration
Radiating Near-Field Handler Integration Options
OTA Test Unit
video
5G Millimeter Wave Over the Air Production Testing on ATE
Integrated Pick and Antenna
video
Separate Pick and Antenna
video
OTA Test Cell Handler Integration Options
8-site Near-Field Solution
V93K+ M4841 Handler + OTA Test Unit
2-site Far-Field Solution
V93K+ M4841 Handler + OTA Test Unit
1-site Far-Field or Near-Field Solution
V93K+ M4171 Handler
•
5G Millimeter Wave Over the Air Production Testing on ATE
Very flexible platform, low cost
and fast lead time OTA setup.
8-site Near-Field Solution
V93K+ M4841 Handler
M4841 Handler with 8 site Near-Field OTA Test Unit
video
Summary
• Over the Air Production Testing presents new challenges to the ATE
community.
• Existing Handlers and ATE Infrastructure can be leveraged for OTA testing
while maintaining flexibility for traditional HVM RF testing.
• OTA testing is the new package/final test for AIP devices. Future challenges
will be larger antenna arrays at higher frequencies and new applications. (6G
mmWave Radar, LEO Satellite, etc.)
5G Millimeter Wave Over the Air Production Testing on ATE
Questions
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