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Fabrication Process Introduction

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Fabrication Process Technology
Gong Xiao
Email: elegong@nus.edu.sg
Office: E4-05-31
Main Content:
 Thin Film Deposition and Growth
 Dopant Introduction – Diffusion & Ion Implantation
 Pattern Transfer – Lithography
 Pattern Transfer – Plasma Etching
 Back-End Technology
 CMOS Process Flow Integration
A Look Inside Apple’s iPhone:
A Modern Electronic System with Multiple
IC Chips
Si-based chips
Source:
www.ifixit.com
Transistor
 Faster Device Operation
 Lower Power Consumption
 Higher Device Density
III-V-based Devices
History of Transistor Scaling
Number of transistors in CPU
~$2800
4
First transistor
in 1950’
10
2016: Intel 14 nm Xeon E5 -2600
16-24 CPU cores (456 mm2)
7.2 Billion Transistors!
Cost/transistor = 2-5μ cents
~$1000
2
10
1971: Intel 4004 (12 mm2)
2300 Transistors
Cost/transistor = 50 cents
50 billion
Transistors?
0
10
60'
65'
70'
75'
80'
2016
2022
Moore’s Law: the number of transistors on a microchip doubles about
every two years, though the cost of computers is halved.
Recent Transistor Scaling
Year 2005
Tech node 65 nm
2009
2011
32 nm
22 nm 14 nm 10 nm Sub-5 nm, beyond Si CMOS
2013
2017
2019 and Beyond
Nanosheet
Nanowire
III-V
Ge
TFET
Strained Si
High-k
Metal Gate
FinFET
MoS2
Strained Silicon
High-k/Metal Gate
FinFET
GeSn
BP
Overview of Integrated Circuits
• Currently more than hundreds of device structures
exist, Si CMOS is the dominant technology!
• For example: Microprocessor (many levels of
Interconnects and high density of very small
transistors)
Intel’s 22 nm Tri-gate
Fabrication Process
There are two major stages in the
production process of semiconductor.
One is called front-end of the line
process where the transistors are
formed on the silicon substrate
(wafer), and the other is called backend of the line process where devices
are connected by layers of metal lines.
EE4436 Course Outline
1. Thin Film Deposition and Growth
2. Dopant Introduction
3. Lithography
4. Plasma Etching
5. Interconnects
6. CMOS Integration
What to Learn

Thin Film Deposition
and Growth
 Dopant Introduction
–Diffusion & Ion Implantation
 Pattern Transfer
–Lithography
 Pattern Transfer
–Plasma Etching
Transistor
Back-End
Technology
CMOS Process
Flow
Integration
Assessment:
40% CA + 60% (Final Exam)
 Simulation Project (20%)
 Literature Review Report (20%)

Assignment 1

Assignment 2
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