Atomic Force Microscope (AFM)
AFM as an important apparatus in the applied nano
projects and industries related to nano technology, is now
produced with the latest known AFM-Modes and most
developed hardware and software.
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Design Objectives:
Different Data Channels Including Amplitude, Phase,
Topography
High Sampling Rate and Digital Filtering
Implementation
High Bandwidth Sensors and High Quality Nano
Scanner
Disturbance and Noise Rejection through Closed Loop
Operation
Some of the adjustable parameters are as below:
Scanning speed & range
Angle of scanning
Reference force
Proportional & Integration coefficients of PID control
Amplitude & frequency of dithering in dynamic mode
Scanning selected zoomed area on previously obtained
images
Determining the slope coefficients for compensation
Advantages:
Operation under non-vacuum conditions
No need of sample preparation
Reasonable cost, low energy consumption
Not limited to specific kind of samples in compare to
TEM,STM and SEM
Proper laboratory size
Proper for imaging of bio samples
Address: NO.78, 16 Azar St, Keshavarz Blv, Tehran, IRAN
Phone: (+98 21)88 980 173 Fax: (+98 21)88 980 827
Application
• Industrial
Inspection of microelectronic
industry product
Qualification control of coated
surfaces
• Environment and Food
Sciences
Nano filter evaluation
• Polymers and Coating
Surface morphology of
polymeric films
Evaluation of polymerization
process
• Physics
Smoothness evaluation of
optical surfaces in optic industry
Magnetic and Electrical
properties of materials
• Material Science
Morphological evaluation of
different specimens
Measuring the size particle of
powders
Creep crack analysis
Surface roughness analysis
• Specific Application
Nano lithography
Nano machining of hard
ceramic surfaces
• Medical and Biological
Sciences
Medicine manufacturing
Imaging of DNA, RNA,
chromosome, cell membrane,
bacteria and …
Web: www.adeeco.ir
Email: info@adeeco.ir
SPECIFICATION
Surface Scanning Range
Lateral Resolution
Vertical Resolution
Large Scale Sample Movement
Laser Power
Photodiode Sensitivity
Micro Actuator Resolution
50 µm
1 nm
0.1 nm
7 mm
0.01 W
18 A/W
0.6 µm
Features:
• Different Data Channels Including Amplitude,
Phase, Topography
• High Sampling Rate and Digital Filtering
Implementation
• High Bandwidth Sensors and High Quality
Nano Scanner
• Disturbance and Noise Rejection through
Closed Loop Operation
Address: NO.78, 16 Azar St, Keshavarz Blv, Tehran, IRAN
Phone: (+98 21)88 980 173 Fax: (+98 21)88 980 827
Web: www.adeeco.ir
Email: info@adeeco.ir
Head:
Address: NO.78, 16 Azar St, Keshavarz Blv, Tehran, IRAN
Phone: (+98 21)88 980 173 Fax: (+98 21)88 980 827
Web: www.adeeco.ir
Email: info@adeeco.ir
Scanner:
Scanner features are shown in the following table.
Controller:
Controller model is detailed as follows:
Software:
Address: NO.78, 16 Azar St, Keshavarz Blv, Tehran, IRAN
Phone: (+98 21)88 980 173 Fax: (+98 21)88 980 827
Web: www.adeeco.ir
Email: info@adeeco.ir
AFM working modes:
Address: NO.78, 16 Azar St, Keshavarz Blv, Tehran, IRAN
Phone: (+98 21)88 980 173 Fax: (+98 21)88 980 827
Web: www.adeeco.ir
Email: info@adeeco.ir