Burn-In Test
Agilent Technologies and LXinstruments
Achieve lower cost and optimized throughput of burn-in test
with modular power supply multiplexing
To ensure the reliability of complex
systems used in applications such as
process automation, power generation
and public transport, extensive burn-in
testing is used to identify early defects.
For maximum reliability burn-in test
will be applied to all of the circuit
• Burn-in test systems based on
modular multiplex architecture
• Support active and passive
burn-in test
• Multiplex architecture allows
sharing of DUT power supplies
• Multiplexing uses breadboard
module of Agilent 34980 multi function switch/measure unit
• Integrated with environmental
chamber for accelerated life
testing
• Modular software with graphical
interface
• Results can be stored in database
for analysis and reporting
• Reduces cost of burn-in test while
optimizing throughput
boards and modules in a system.
When very large numbers of circuit
boards are exercised simultaneously
the efficiency of the burn in test
process is critical in order to control
the overall cost of test.
For accelerated life testing, in
order to fully stress the product,
the burn-in test procedures will
be executed in an environmental
chamber where the temperature of
the device-under-test (DUT) can be
cycled over many hours. The circuit
boards may be tested in their passive
state or actively exercised. For both
approaches the DUTs are individually
powered but for active testing they
are also exercised with a
test routine. The provision
of individual power
supplies can be very costly,
while sharing a common
power supply between all
or a group of DUTs risks
losing test time and data
if an early failure in one
DUT compromises the power supply
to the rest.
Burn-in test systems from
LXinstruments address this issue
by using a multiplexer architecture
that allows individual DUTs to be
switched between common power
supplies. The systems can provide
multiple power supplies with up to
three different supply voltages. All of
the power supplies can be switched
individually and all supply currents
Burn-In Test
can be measured. In order
to manage the in-rush currents experienced when the
devices are initially switched
on, the system firstly turns
all of the devices on and
off to identify any failing
DUTs, and then turns each
on in sequence to minimize
the instantaneous in-rush
currents.
To learn how this solution
can address your specific needs
please contact
Agilent’s solutions partner,
LXinstruments.
www.agilent.com/find/LXinstruments
the environmental chamber can be
implemented via a serial link or over
The multiplex architecture is implean Ethernet LAN. Chambers from
mented using a custom circuit board multiple vendors are supported.
based on the Agilent 34959A bread- The system software is modular in
board module for the Agilent 34980A structure and based on the Agilent
multifunction switch/measurement Test Exec SL test sequencer with a
unit. This provides eight channels
graphical user interface. Test results
of power supply multiplexing within can be stored in a relational database
one 34980A module slot, high switch for analysis and reporting.
count with mechanical armature
relays, direct control through the
By using a multiplex architecture
34980A and SCPI ASCII programin its burn-in test solutions
mability.
LXinstruments can optimize the
number of power supplies required to
The systems support active and
test multiple DUTs while eliminating
passive burn-in testing of multiple
the risks associated with sharing
DUTs within an environmental
supplies between multiple devices.
chamber. Communication with the
The result is lower cost and greater
DUTs, in order to synchronize the
efficiency allowing you to optimize
test and monitor the performance
your burn-in procedures and maxiof the devices, is over a serial fibre
mize the reliability of your products.
optic link. Communication with
System Components
Agilent Technologies
34980A
34959A
34411A
N6700B
N67xxA
LXinstruments
Multifunction switch/measure unit
Breadboard module
Digital multimeter
Modular power supply mainframe
Power supply modules
Modular burn-in test system
Agilent Solutions Partner Program
Agilent and its Solutions Partners work
together to help customers meet their unique
challenges, in design, manufacturing, installation or support. To learn more about the
program, our partners and solutions go to
www.agilent.com/find/solutionspartner
LXinstruments provides test solutions and
consulting services for functional test and
data acquisition.
www.lxinstruments.com
For information on Agilent Technologies’
products, applications and services, go to
www.agilent.com
LAN eXtensions for instrumentation
Product specifications and descriptions in this
document subject to change without notice.
© Agilent Technologies, Inc. 2012
Printed in USA, December 4, 2012
5991-1628EN