350351_IMAPS.qxp 2/14/2007 8:42 PM Page 1 MARCH/APRIL 2007 Vol. 34 No.2 Computing & Ceramics The RoHS Experience... A 3D Computer Model Study... Next Generation Multilayer Dielectrics... Embedding a Thin Polymer Voltage ESD... W W W. I M A P S . O R G D e G vic B e C P A Sp ac ut r k C om ing agi IC o 0 n M ti 7 g T ve - - M M A - A a ar pr p rc ch il ri h 23 l 9 18 19 -2 -1 -1 -22 6 2 9 Thin Array Polymer Packaging... 350351_IMAPS.qxp 2/14/2007 8:42 PM Page 2 350351_IMAPS.qxp 2/14/2007 8:42 PM Page 1 MARCH/APRIL 2007 Features The RoHS Experience at NCR Corporation Paul Rostek 10 L A 3-D Computer Module Study Don Hayashigawa 20 L Next Generation Multilayer Dielectrics for High Reliability Multilayer Hybrid Circuits Stefan Flick, Annette Kipka and David Malanga Embedding a Thin Polymer Voltage ESD Suppressing Core in a Chip Package Offers and Alternative to on Chip ESD Protection of Sensitive High Performance ICs Used in Today’s Cell Phones and Computers Karen Shrier and Greg Caswell Thin Array Polymer Packaging (TAPP®) Leo M. Higgins III, Ph.D. On the cover: 9 layer, Z interconnect, PTFE System in Package Courtesy of Endicott Interconnect Technologies, Inc. 24 L 28 L 34 L 350351_IMAPS.qxp 2/14/2007 8:42 PM Page 2 A DVA N C I N G MICROELECTRONICS CONTENTS D E PA R T M E N T S IMAPS 4-TIER PARTICIPATION 4 5 From the Publications Committee Chair: Spreading the Word 6 From the European Editor: SIP, MCM, Flip Chips, Wirebond, QFN, Surface Mount...? 7 Industry 49 Metro Chapter Meeting Draws Large Audience 54 Welcome New Members 54 First Time Renewals Sales and Marketing Corner: Don’t Shoot ‘til You See the Whites of Their Eyes! MEMBER TOOLS 48 Chapter Contacts 33 MASH 2007 Editorial (Military, Aerospace, Space, and Homeland Security Conference) 50 Exhibitor Products & Services 56 Advertiser Hotline 56 Who to Call at IMAPS HQ U P D AT E S from IMAPS 38 2 European News Foundation Focus Design IMAPS - International Microelectronics And Packaging Society 611 2nd Street, NE Washington, DC 20002 Tel: (202) 548-4001 Fax: (202) 548-6115 E-mail: IMAPS@imaps.org See us on IMAPS’s Home Page: www.imaps.org 42 23 Systems & Applications Materials & Process From the President Reflections on a Reflection CHAPTER and INDUSTRY NEWS Device Packaging Program-at-a-Glance Inside Back Cover Calendar of Events 39 IMAPS 2007 – From the Technical Program Co-Chairs 40 IMAPS Awards – Your Help Needed 41 CICMT Program-at-a-Glance 55 In Memoriam – Jack Rubin COMING NEXT ISSUE Military/Aerospace International Technology 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 3 UPCOMING EVENTS Executive Council *International Conference on Device Packaging March 19-22, 2007 Scottsdale, AZ (co-located with GBC Winter Meeting) GBC Spring 2007 Meeting March 18 & 19, 2007 Scottsdale, AZ (co-located with Device Packaging) Automotive ATW April 9-12, 2007 Dearborn, MI *International Conference on Ceramic Interconnect and Ceramic Microsystems Technologies April 23-26, 2007 Denver, CO Co-sponsored by IMAPS and ACerS *Military, Aerospace, Space & Homeland Security (MASH 2007) May 8-10, 2007 Baltimore, MD IMAPS 2007 *The 40th International Symposium on Microelectronics November 11-15, 2007 San Jose, CA Integrated/Embedded Passives November 15 – 17, 2007 San Jose, CA *Exhibit Space Available President Michael R. Ehlert, Barry Industries, Inc. President-Elect Stephen J. Adamson, Asymtek First Past President James R. Drehle, Robert Lloyd & Associates Vice President of Technology Andrew Strandjord, FlipChip International Vice President of Membership Michael P. O’Neill, Heraeus – Thick Film Division Secretary Susan Trulli, Raytheon Treasurer Steve Capp, Laserage Technology Corp. Northwest Regional Director John Zhang, Finisar Southwest Regional Director Hossein Ahmad, Applied Reliability IME Southeast Regional Director Kinzy Jones, Jr., Motorola North Central Regional Director Adam Schubring, Kyocera America, Inc. Northeast Regional Director Michael Salloum, R&D Assembly, Inc. Publications Committee Publications Committee Chair Jeffrey C. Demmin, Tessera Technologies, Inc. Editor-in-Chief, Advancing Microelectronics Jerry Sergent, Fairfield University Editor - The Americas, Advancing Microelectronics Greg Caswell, Virtex Assembly, Inc. Editor - Europe, Advancing Microelectronics Søren Nørlyng, Micronsult Editor - Asia, Advancing Microelectronics Dr. Hironori Asai, Toshiba Corporation Editor, Journal of Microelectronics and Electronic Packaging Dr. Fred Barlow, University of Idaho Directors Executive Director Michael O’Donoghue Director, Program Development & Technology Brian Schieman Managing Editor and Advertising Sales Ann Carter Bell, Manager Marketing & Communications Visit www.imaps.org for links to all upcoming events including: L full event descriptions L abstract submissions L exhibition information L event updates Advancing Microelectronics (formerly Inside ISHM), is published six times a year and is a benefit of IMAPS membership. The annual subscription price is $75; $15 for a single copy. Copyright 2007 by IMAPS— International Microelectronics And Packaging Society. All rights reserved. Except as defined in 17 USC, Sec. 107, permision to republish any materials in this publication must be obtained from IMAPS, 611 2nd Street, NE, Washington, DC 20002. Telephone (202) 548-4001. 3 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 4 A DVA N C I N G MICROELECTRONICS FROM THE PRESIDENT Reflections on a Reflection Mike Ehlert, Irvine, CA and Attleboro, MA USA IMAPS 2007 President Have a look in the mirror and see the reflection. People, specifically the technological packaging experts – IMAPS members – made it work. The realities of a production schedule mean that although you are reading this at the change of seasons, it is written in mid winter. I am spending my winter vacation in Fairbanks, Alaska visiting family. Fairbanks is located in central Alaska on the Chena River some 130 miles south of the Artic Circle. It is just after the winter solstice and although blessed with 4 hours and 7 minutes of sun-up time, the low sun angle, high mountains to the south and the near-constant clouds mean it only gets to twilight conditions and the sun is never seen. The airport sign greets you “Welcome to Fairbanks, -22F at 3:57 PM.” Today is unseasonably warm at +2F while our members of IMAPS-Brazil in São Paulo are blessed with 72F. This is nothing new for our members from IMAPS-Nordic and IMAPS-Russia, but the rest of us may learn a little. In these conditions the human body and mind must be protected from frostbite and cabin fever, respectively, but life goes on pretty normally otherwise. People get up, eat breakfast and go to work in the morning, come home in the evening to dinner. The kids go to school, learn their lessons and play in the streets. People drive around in cars, chat on cell phones, snap pictures with digital cameras and generally do the same things everyone else does. What makes this significant is that no one worries about the electronics. The cars are plugged in at night so the battery stays warm and the oil stays fluid enough to crank but that is about it. MP3 players are left laying on the dash, electronic ignitions and stereos work fine and everything is okay as long as the battery is kept warm enough for the chemistry to work. Fur traders using dog sleds settled interior Alaska in the 1800s. At that time the only things that worked in this weather were self-heating: dogs, people, coal-oil lanterns, wood stoves. Why is it that things have changed so much? As part of the Industrial Revolution someone worried about all the packaging problems – “everything between the chip and the system” – and made it all work. Have a look in the mirror and see the reflection. People, specifically the technological packaging experts – IMAPS members – made it work. Some of the first steps were halting. Portable transistor radios, if left in the sun, melted into single frequency devices. We had LCD watches that stopped working if you bumped them. Progress has been continuous and fast. Now everything everywhere is electronic and it all works pretty much. Modern life with oil heat, electricity and indoor plumbing is the result of decades of good work by people like you. So the next time you look in the mirror, consider the effect on the world that person has. What will you invent next? IMAPS has three conferences directly on this point coming up. International Conference and Exhibition on Device Packaging Doubletree Hotel - Scottsdale, Arizona USA March 19-22, 2007 Advanced Technology Workshop on Automotive Packaging Hyatt Regency - Dearborn, Michigan - USA April 9-12, 2007 IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT) April 23-26, 2007 Grand Hyatt Hotel - 1750 Welton Street Denver, Colorado USA If you are interested in some of the world’s best work in packaging I suggest you come to one or all of these. The world’s best people in packaging “everything between the chip and the system” will be there, and in your mirror. IMAPS 2007 San Jose Classic Trolley photo courtesy of the San Jose Convention & Visitors Bureau 4 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 5 MARCH/APRIL 2007 PUBLICATIONS COMMITTEE Spreading the Word I hope that you have noticed – and taken advantage of – the updates to the various IMAPS information sources. This is the second issue of the re-designed Advancing Microelectronics, with broader coverage and upgrades to details that should make the information more accessible. And, hey, it just looks a lot nicer, too. On the electronic front, the IMAPS website (www.imaps.org) has had a major overhaul, with the new version going live at the beginning of 2007. This was probably an even bigger upgrade than the magazine. The Internet has continued to evolve of course, so the IMAPS website had some catching up to do. The homepage has been reorganized to make everything clearer, for example, and features like the event calendar are easier to use. We are also planning further upgrades to make more IMAPS information available to members. One interesting outcome of these improvements is that we have looked more closely at the IMAPS membership to understand better who you are and what information you might want. All of those boxes that you check describing your job, company, interests, etc., have been put to use! For example, one out of six IMAPS members is a vice president or higher in their organization. It isn’t just wishful thinking that the industry leaders are part of IMAPS. Also, the membership really is heavy on technical people – at the “manager/director” level, people with technical roles outnumber sales and marketing professionals by almost two to one. It’s good to have some of each, but IMAPS intentionally emphasizes the technical part of the industry. Along with all of that technical management horsepower, more than a quarter of the members put themselves in the “engineer / research / scientist” category. The geographic scope of the membership is thoroughly international, too, with more than one-third of the members residing outside of North America. We are hoping for that fraction to grow, too, as the importance of international supply chains and partnerships continues to increase. Finally, the industry coverage of the membership reflects the four tiers of IMAPS (materials and process, design, systems and applications, and industry). There are many of the traditional material and equipment companies on the rolls, like K&S, DEK, Heraeus, Cookson, and Dow, and the large OEMs downstream are there, too, with companies like Agilent, Cisco, Nokia, and Sony participating in IMAPS. It has been useful for the IMAPS staff and volunteers to take a closer look at the membership, since that helps us to understand your needs better. I thought that I would highlight some of that data here, so that the members also have some more insight into our IMAPS colleagues. As always, please let us know if you have suggestions on what other information IMAPS could gather and transmit to the members, or about how we accomplish that. The website and Advancing Microelectronics have been upgraded, but there is always room for improvement. Thanks for reading, Jeff Demmin IMAPS Publications Committee Chair One interesting outcome of these improvements is that we have looked more closely at the IMAPS membership to understand better who you are and what information you might want. For exhibiting opportunities at IMAPS 2007, visit www.imaps40th.org: L Exhibitor Prospectus and booth application L Exhibitor Benefits L Previous Exhibitors L and more! 5 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 6 A DVA N C I N G MICROELECTRONICS EUROPEAN EDITOR SIP, MCM, Flip Chips, Wirebond, QFN, Surface Mount...? Søren Nørlyng noerlyng@micronsult.dk I imagine that quite often an OEM has the challenge to find the optimum solution for a new packaging concept with more components on a restricted area. Of course the headline should be: System cost. I imagine that quite often an OEM has the challenge to find the optimum solution for a new packaging concept with more components on a restricted area. What is the optimum solution? If you ask the strategic buyers, you should do what you always have done, no new exotic solutions, no new suppliers to be qualified and audited. If you ask the technical nerds, you will be told to use the latest technology that would be suitable. If you ask other engineers, you will most likely get as many different answers as available options. Why? Because it actually is a very difficult task to suggest the optimum, as it requires multiple skills, experience and insight. You have to know so many details. Volume and timing, motherboard complexity vs. price for on-board solution or module solution – and for wirebond and flip chip solutions, the requirements to pad termination materials and eventual fine-line needs. In the case of flip chips, then you need to know chip design, pitch, metallization, bump type, requested or preferred joining technology, underfills, pastes or films. Test strategy, repairability, reliability, needs for second sourcing. All possibilities have to be overviewed before a final choice is made – it also has to be known if we talk in-house or outsourced production to a preferred EMS or packaging house – and therefore about their capabilities and preferences regarding technologies and the necessary equipment. In order to succeed cooperation and involvement of all partners are required as early as possible before the requirements and specs are “frozen.” And don’t forget, the engineers have to know as much as possible about this broad span of technologies in order to have fruitful discussions with suppliers and subcontractors. IMAPS is a tremendous source. IMAPS NA last year introduced almost the answer to these multidisciplinary needs by their Device Packaging Conference in Scottsdale. Here we had parallel tracks like flip chip – wafer bumping, flip chips – future directions, flip chip – underfill & materials, flip chip – packaging, flip chip – copper/low-K, 3D – wafer bonding, 3D – stacked die, 3D – device applications, 3D – assembly and manufacturing – and many more. The number of delegates demonstrated the need for this kind of conference. I am sure this year’s event in March will be an equally big success! Also in Europe the IMAPS chapters organize very broad conferences covering the many areas of interest with focused sessions. You can definitely expect that this year’s European event will cover all needs from advanced PCBs and flex to interconnection, advanced packaging, 3D-SIP, manufacturing technologies to thermal management and design. EMPC2007, the 16th European Microelectronics and Packaging Conference and Exhibition, will be held in Oulu, Finland, June 17-20. Plan to come to the technical capital of Finland and also take the opportunity to visit the many companies there. Please read more on http://www.empc2007.org. See you in Oulu! Søren Nørlyng noerlyng@micronsult.dk IMAPS 2007 San Jose Cezar Chavez Park photo courtesy of the San Jose Convention & Visitors Bureau 6 350351_IMAPS.qxp 2/16/2007 8:12 PM Page 7 MARCH/APRIL 2007 SALES and MARKETING CORNER Don’t Shoot ‘til You See the Whites of Their Eyes! “Don’t shoot ‘til you see the whites of their eyes!” General George Prescott uttered these famous words to his Revolutionary War troops as the British marched upon them from Boston Harbor in 1775 in the colonial US. Why start out the inaugural Sales and Marketing Corner of Advancing Microelectronics with such a statement? Eye-to-eye contact is one of the most important means of human communication. And communication is probably the single most important factor in the success of any sales and marketing initiative. Fast forward to today. The incorporation of the Internet as an information-gathering tool has revolutionized the way we do business. Emails, e-shopping, newsletters, blogs, and other readable electronic media supply information and transaction opportunities at our fingertips, and in a fraction of the time that the IMAPS founding fathers searched for microelectronics information 40 years ago. But what advantage – yes, advantage – did General Prescott’s troops or the IMAPS founding fathers have without the multitude of communication choices at our disposal today? They had to rely primarily on face-to-face interactions to get things done. There were no misunderstood emails and no spam. When we purchased something, a handshake closed the deal, not “proceed to secure checkout.” Yes, all these tools allow transactions to happen faster and more efficiently. But e-commerce cannot replace the following scenarios: • The look on the face of a person when they are covering up (lying) about something. • The clear confidence beaming from someone who has and can deliver the “killer” product or service to someone who needs it. • Satisfying an individual’s or organization’s need for a trusting personal relationship before they make a purchase decision or a change to a new vendor. • Interacting with a person to discover the real need in an inquiry. • The positive energy in a room when a customer and supplier have arrived at a win-win agreement. • The negative energy in a room when a salesperson sells at someone, with little regard to what the client really needs. In Daniel Coleman’s Social Intelligence, he discusses the actual biochemical reactions in our brain that occur when we interact with other people – what he calls “Neural WiFi.” For example, when two people are sitting across from each other in deep conversation and the body language is mimicked by both persons – the nodding, smiling, shifting of the body, frowning. When sensors are actually connected to certain portions of their brains, it is proven that the individuals are biochemically “in synch.” Yet in another example, Coleman sent off several pairs of college students to an online chat room to get acquainted. The online interaction became quite aggressive and sexual. The researcher was astounded as there were no signs of such behavior in interviews before and after the online activity – behavior likely never to be played out face-to-face. A major theme in Coleman’s book is that we are social beings, and like it or not we gravitate to face to face social interaction for meaning, accomplishment, and harmony. If you have ever spent any time in Japan, you will certainly understand that this thinking is a way of life. In business, understanding how to create harmonious communications with our customers, co-workers, or industry colleagues is highly desirable. I want to have that interaction that creates the positive body language making it clear my counterpart is in synch with what I am saying and I am also in synch with his or her thoughts. This is only accomplished when I can see the whites of someone’s eyes. Hurling email back and forth or relying on Internet searches exclusively to make major purchase decisions only gets a fraction of the story. I know from my own experiences it is tough, because email and the Internet are easy. But the idea here is to become more effective in our professional (and home) interactions. Why is all of this relevant in a column in this magazine? The mission of IMAPS, right out of the 20062009 Strategic Plan and posted front and center on the IMAPS home page www.imaps.org is this: IMAPS leads the Microelectronics Packaging, Interconnect and Assembly Community, providing means of communicating, educating, and interacting at all levels. Collaborating face to face at symposiums, workshops and local meetings is arguably the best way for us to get a complete picture of the information we desire to obtain and develop. Electronic media certainly supplies us as much information as we desire to be fully prepared for those person-to-person interactions. This is why we strive to provide information content in this magazine, in the Journal of Microelectronics, and via the IMAPS website (new and improved I might add!). In summary, today’s electronic media provides an efficient means for information gathering, but it simply cannot replace the face-to-face interactions needed to fully process and get the complete picture. Stephen M. R. Covey relates in The Speed of Trust that the “Internet is a good example of both transparency and illusion. At the same time as it engenders extraordinary transparency, allowing people to get information and access truth wherever they live, it also creates a place where people can make up pseudonyms and interact with others inside an illusion – where nobody knows their true identity or intent.” It is no mistake that the latest trends in electronic communications are video related (video conferencing, web casts, YouTube, etc.), facilitating more face-to-face interaction. For technologists, presenting or listening to papers at symposiums allows you to get the full story – ideally we know if a paper is really a good paper after we listen to the pres- Michael P. O’Neill Vice President of Membership Heraeus Inc., Thick Film Division continued page 8 7 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 8 A DVA N C I N G MICROELECTRONICS continued from page 7 entation – don’t we? It’s never the same if we just read the Proceedings. For salespeople – it is simple: get out in front of your customers and communicate – understand what they need. Read the interactions and body language. Listen. The cold blank stares and uncomfortable jostling in the chair really mean something. Look into the whites of their eyes before shooting – get in synch! 8 Was this column interesting to you? Please send any comments or suggestions to the author at moneill@imaps.org. 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 9 MARCH/APRIL 2007 9 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 10 FEATURE ARTICLE T he RoHS Experience at NCR Corporation Paul Rostek, Teradata Division, of NCR Corporation, 17095 Via Del Campo, San Diego, CA 92027, Phone: 858-485-2860, Fax: 213-337-5432 Email: paul.rostek@ncr.com www.ncr.com Abstract This is a story of the RoHS journey at NCR Corporation starting in January 2003 with the passing of the European RoHS (Restriction of Hazardous Substances) Directive 2002/95/EC. NCR realized the need to comply with all relevant environmental legislation in order to avoid the risks, costs and the consequences of non-compliant products in the EU. This paper discusses all the issues NCR encountered preparing for the implementation of the EU directive for a unified company-wide approach to RoHS. This paper addresses: • Overview of the NCR Policy for RoHS and Environmental Intentions • The “DfE” Design for Environment Landscape – the regulations impacting the industry today • Organizing NCR for the RoHS effort and the impact on NCR Business • Coordinating the Corporation RoHS team and the individual Business Unit teams • Defining the EU legal interpretation of RoHS Terms and Conditions • Developing a strategy to manage the transition from non-compliance to compliance • Developing a logistics model for the transition for spare parts, old inventory, refurbished units, etc. • Evaluating and selecting tools to assist in the transition to compliance • Evaluating technical issues associated with RoHS – such as the “tin whisker” problem • Developing RoHS processes, audit preparations and assessing on-going compliance • Future considerations – Lessons learned and how to be proactive next time Key words: Restriction of Hazardous Substances (RoHS), RoHS Directive, toxic materials, DfE, compliance, NCR 1.0 Introduction This paper reveals the problems that NCR had to deal with and understand when transitioning its products for RoHS compliance, such as managing the supply chain, using up existing inventory, and managing outsourced manufacturing vendors. The paper looks at the investigation into a potential problem hidden in the parts that are soldered with tin only, known as the growth of “tin whiskers” which may cause a short circuit between devices. Some of the internal NCR issues discussed included the handling of spare parts, the repairing of equipment, refurbishing units, upgrading and resales of customer equipment “put on the market” before July 1, 2006. Just understanding terms like the meaning of “put on the market” took a lot of time and resources to research and clarify. NCR developed a strategy for gathering and managing supplier information on all electronic components for RoHS compliance, reviewing and evaluating company databases, and anticipating future environmental compliance initiatives. NCR had to look at all the options to identify their parts, modules and products for RoHS compliance. A material data management process is discussed including part number modifications and new vendor documentation such as material 10 declaration sheets, product identifications, and certificates of compliance. How NCR identified parts and products as part of a documented “due diligence” initiative is discussed as well as the research and understanding of the legal requirements, enforcement and exemptions of this new Directive. 2.0 Overview of NCR Policy and Intentions It is NCR’s intention to be fully compliant with the new European Union Directive on the Restriction of Hazardous Substances (RoHS) introduced on July 1, 2006. RoHS restricts the use of certain hazardous substances in electrical and electronic equipment that could be considered harmful to future environment. Many of the actions taken by NCR required significant investment, time and effort. Customers are assured that all products and services purchased from NCR are environmentally safe and comply with the European Union RoHS Directive. NCR is working with its suppliers to ensure only compliant parts are provided. NCR suppliers’ processes were modified to ensure all Teradata products “put on the market” after July 1 were totally compliant in the EU. NCR maintenance processes are being modified to 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 11 MARCH/APRIL 2007 ensure RoHS compliant units are serviced using only RoHS compliant spare parts. NCR has a documented and auditable process to ensure that its products are shipped and maintained as compliant. One of the important effects of this process was that all NCR Teradata Product ID numbers were changed to denote they are compliant to easily differentiate them from existing products. 3.0 The Design for the Environmental Landscape NCR products shipped to the EU after July 1, 2006 will not contain banned substances and will be serviced and maintained as RoHS compliant. The RoHS Directive 2002/95/EC was passed in 2003 and became effective July 1, 2006 for all Electrical and Electronic Equipment as defined in the Directive. Table 1 shows a glimpse of the upcoming regulations facing the industry for the next 2.5 years. Other future environmental requirements are forthcoming which will need to be incorporated into this DfE Landscape, such as (Energy using Products) EuP Directive 2005/32/EC as they become available. DfE (Design for Environment) is a set of engineering principles to incorporate environmental attributes into Table 1 Future Environmental Legislations continued page 12 11 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 12 A DVA N C I N G MICROELECTRONICS continued from page 11 product design, manufacture, use, service and return. There are two goals to the DfE program. The first goal is to comply with all environmental regulations that apply to energy using products. The second goal is to increase the number of environmentally preferable attributes in the products through innovative design and by promoting responsible environmental management by the suppliers. 4.0 Understanding the Impact on the Business NCR realized that it could not sell its non-compliant products in the EU after July 1 2006, but the full impact of RoHS on the business units was underestimated in terms of manpower, time and cost. A cost of $2.6M solely for Teradata was totaled for the past 18 months ending July 1. A Teradata retiree was brought back from retirement to help with the unexpected workload. This total of $2.6M was only for one business unit of the six divisions within NCR. In early January 2005, a major supplier presented a comprehensive RoHS picture and plan to scrub every component in our products, and stated the necessity of contacting every supplier to determine if they had any of the six toxic materials in each part. The supplier submitted a $500K bid to perform the RoHS work solely to scrub the Teradata PWBA (Printed Wired Board Assembly) boards. Due to the cost, Teradata Engineering decided to do the work itself and worked on more than 1000 parts for RoHS compliance. Also, supplier processes in manufacturing had to be modified to implement the new RoHS transition. The Teradata RoHS Team decided that RoHS compliant products will be identified by new class numbers with all new part and assembly numbers. In order to use up all the remaining inventory, non-RoHS numbers will continue to be orderable in the rest of the world. 5.0 How NCR Organized for the RoHS Effort and the Impact on the NCR Business In early 2003, an NCR task force from all six NCR divisions was formed to work on the WEEE Directive which was completed in August 2005. Soon afterward another task force team was formed to work on the RoHS Directive. A new team leader was appointed in early 2005 to guide the divisions toward achieving RoHS compliance. NCR employs less than 30,000 people and is organized into six business units. Five of the six units were directly impacted by RoHS. Representatives from each of the business units were chosen and team meetings were scheduled to work on this new environmental directive from Europe. Each of the business units in turn developed its own cross functional RoHS team comprised of members from all affected departments. The corporate team leader quickly set up teleconference meetings every two weeks to address RoHS concerns and issues. He wrote up the list of action items with the selected persons to work the issues. He prioritized and tracked the action items until they were closed. It was not obvious in late 2004 what resources, time and work effort was necessary for this RoHS project. In early 2005, the full impact of the RoHS Directive 12 was realized after a major supplier presented its view and perspective on the RoHS Directive. 6.0 Developing the NCR Processes for RoHS From the biweekly teleconferences emerged the corporate RoHS compliance process consisting of the following four main functional areas, which were incorporated into each business unit’s product development and release processes: 1 – Engineering Design and Documentation 2 – Supplier Management 3 – Product Order Ability 4 – QA and Compliance Development of Products is performed using the Teradata development process. This process now incorporates the RoHS Directive which begins with the Engineering and relevant design documentation, and the product specification describing the product design parameters. The Engineering documentation is then used by SLM (Supply Line Management) to select or approve a RoHS-compliant supplier that can deliver RoHS-compliant components and compliance certifications for their parts to NCR. All evidence of compliance, supplier compliance certificates, audit reports, web sites, etc. is stored in a central repository database for ease of access, logistics, recordkeeping and audit trails. As product compliance progresses, its product features are defined and entered into GSDB (Global Services Data Base) by Product Management. Features are flagged compliant when all its components are RoHS compliant. Otherwise it is flagged as non-compliant. Once all the product’s features are compliant, the product is marked as compliant in GSDB, and released to the EU countries. The released product, as part of its release documentation, will have a formal Product Declaration of Conformance certificate that certifies that the product also adheres to the RoHS Directive, as well as other EU directives for EMI and Product Safety. Teradata engineering added the RoHS procedures to the existing Engineering Compliance process for EMI and Product Safety as illustrated in Table 2. 7.0 Defining RoHS Terms and Conditions A representative from the NCR Law Department, a part of the corporate team, researched the terms and conditions of the RoHS Directive. A good example of the extensive research is illustrated in the questions below, where the legal definition for “put on the market” was researched for interpretation and clarity. Q What does the term “put on the market” mean? The RoHS term “put on the market” refers to each individual product, not a product type or class. This term refers to the initial action of making a product available for the first time on the Community market. Q When is a product made available for the first time? A product is made available when it is transferred from the stage of manufacture with the intention of distribution/use in the EC market. Q When is a product transferred from the stage of manufacture? A product is transferred when a physical handover or transfer of ownership has taken place from the manufacturer to an EU importer or distributor or from the manufacturer to the final EU consumer or end user. 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 13 MARCH/APRIL 2007 Transfer can be for payment, free of charge, sale, loan, hire, leasing, gift or the result of any other kind of legal instrument. Q When does physical transfer occur? Physical handover or transfer of ownership takes place in any of the following scenarios: a) when title and risk of loss has passed from NCR to the distributor or end user customer (typically upon delivery to customer); b) in bill and hold sales where title and risk of loss pass upon delivery to warehouse; c) upon delivery to a distributor or end user customer; d) where physical handover has occurred, but title and risk of loss have not yet passed; e) for NCR-branded products, the physical handover or transfer of ownership generally takes place from the applicable NCR country/sales subsidiary to the distributor or end user customer. Q When is a product not “put on the market”? A product is “not” put on the market for the following reasons: a) transferred to a manufacturer for further measures (assembling, packaging, processing, labeling); b) not yet granted release for free circulation by customs; c) has been placed under another customs procedure (transit, warehousing or temporary importation); d) is in a free zone; e) manufactured in a Member State with a view to exporting it to a non EC-country; f) displayed at trade fairs, exhibitions or demonstrations; g) is in the Table 2 Engineering Compliance Process stocks of the manufacturer; h) is with the authorized representative in the community. When title passes from one NCR entity to another NCR EU entity (distributor), the product may be con- continued page 14 13 350351_IMAPS.qxp 2/14/2007 8:43 PM Page 14 continued from page 13 sidered “put on the market” when it can be demonstrated that the receiving NCR EU entity is genuinely distributing the goods. Physical handover does not take place merely because a product is shipped. There must be a legal instrument for transfer of a product to be deemed “put on the market” upon shipment. Otherwise, the physical handover will occur upon delivery. In regard to third party products NCR is reselling, physical handover or transfer of ownership will take place in the following scenarios: a) when title and risk of loss has passed from the third party supplier to NCR; b) upon delivery to NCR, physical handover has occurred but title and risk of loss have not yet passed. In all cases, products must be granted release for free circulation in the EU by customs to be “put on the market.” Imported products cannot be “put on the market” prior to the time they clear customs. 8.0 Developing the Strategy to Manage the Transition from Non-compliance to Compliance NCR had to review all parts, components, assemblies, PWBAs, sheet metal and cabinet designs that were in production and also new designs in development to insure compliance to the RoHS Directive. It was decided by the Teradata RoHS Team to change part numbers to quickly identify RoHS-compliant parts, making it easier to find RoHS parts, by visually seeing them in the BoM (Bill of Material). The following table illustrates how the unique RoHS part numbers were assigned according to this special Teradata procedure to clearly identify all RoHS compliant parts. Table 3 NCR Progress Chart of Business Units 14 Parts (components, single items, etc.) Fully RoHS Compliant —-> 007-998xxxx Compliant / Exempt —-> 007-997xxxx Non-Compliant —-> 007-996xxxx or others Assemblies (modules, PWBAs, sub-assemblies) Fully RoHS Compliant —-> 315-060xxxx Compliant / Exempt —-> 315-059xxxx Non-Compliant —-> 315-058xxxx or lower All parts and assemblies were verified conforming to the RoHS Directive by engineers and special RoHS part numbers assigned after they were confirmed. Product Engineering reviewed designs in their development cycle. The manager of Product Engineering reviewed, approved, and released the engineering bill of materials verifying that engineering had selected all RoHS parts. The progress of each of the business units was measured monthly for the past year. Since a single component can hold back a product from being RoHS compliant, it was only in March 2005 that real progress could be seen as illustrated in Table 3. Teradata had a few major suppliers that were not RoHS compliant until the very last month of June. Teradata worked with several major suppliers on their RoHS products. Some suppliers came out with entirely new lines of RoHS products in June 2006 that replaced their old products. To meet the schedules, Teradata held biweekly meetings with suppliers, like the UPS vendor, to track their RoHS progress in converting their UPS components. All Teradata products follow the Corporate Process which requires issuing a NCR RoHS CoC for each NCR system product, and also requires obtaining a Certificate of Conformity or equivalent evidence from all NCR suppliers. Suppliers must provide RoHS-compliant parts and provide documentation of their RoHS compliance by a CoC or equivalent proof. In early 2005, NCR developed its own supplier RoHS survey form and questionnaire complete with CoC to be filled out by suppliers. NCR now uses the Industry’s forms: IPC 1751/2 standard forms for Material Declaration and ERA audit forms. On a periodic time basis, the list of suppliers must be reviewed and verification obtained to confirm RoHS compliance. Supplier audits are to be performed by NCR Business Operations to verify suppliers’ RoHS compliance. The intent is for SLM to ensure that suppliers are delivering compliant parts and assemblies on an ongoing, continuous basis. In addition, a central repository for all supplier documentation and CoC has been set up at the corporate level to contain all RoHS documentation and to eliminate needless duplication of suppliers from the Business units. In Teradata, the Engineering Compliance Process is the document that provides the high level guidance to ensure products designed and released by Teradata are RoHS compliant. This Compliance Process and the other process documents provide the “paper trail” for defining RoHS compliance as a requirement. At issue is whether there are enough controls in place to ensure that those requirements will be met. On a day-to-day basis, engineers do not refer to process documents when performing their jobs. They use specific tools, forms and templates to design, develop and release products. The question is whether those tools, forms 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 15 MARCH/APRIL 2007 and templates have enough safeguards built in to ensure products will be compliant. Table 4 is a summary of the Control Plan Overview for Teradata Process Control. 9.0 Developing a Logistics Model to Support the Transition for Spare Parts, Old Inventory, Refurbished Units, and Outsourced Products The RoHS Directive applies to Electrical and Electronic Equipment and covers the products engineered and/or marketed by the Teradata Business Unit. This Directive applies to the design of new products as well as equipment purchased from Original Equipment Manufacturers and Third Party Products for incorporation in new products or redesign of existing products for sale by NCR. To simplify the RoHS identification of Teradata products, the team decided to change the Class numbers and not the model numbers of all Teradata products. The class number is like a family of similar products, whereas the model number represents the actual configuration, the exact hardware BoM for the product. Teradata products are typically large Data Warehouse computer cabinets as shown in Figure 1. Table 4 Overview of the Process Control Plan continued page 16 15 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 16 A DVA N C I N G MICROELECTRONICS continued from page 15 non-compliant parts and assemblies. Non-compliant spare parts may be used to expand the capacity or upgrade products “put on the market” before July 1, only if the concerned equipment is not subsequently “put on the market” as a new product. Q How do third-party parts or kits installed after shipment but prior to or during installation affect the “put on the market” determination? If the physical handover or transfer of ownership of a finished product has taken place prior to July 1, 2006, then that unit should be considered “put on the market.” Servicing and/or upgrade of the product can be made with non-RoHS compliant parts or assemblies. If the unit cannot be considered a “finished product” without incorporation of the third-party part or kit, then the unit will not be “put on the market” until such time that the product is complete and a physical handover or transfer has occurred. 10.0 Evaluating and Selecting Tools to Assist in the Transition to Compliance Figure 1 NCR Teradata Data Warehouse System In order to be assigned a RoHS Class number, every part, component, subassembly, module, sheet metal must first have been verified as being RoHS compliant. All existing NCR equipment in the EU before July 1, 2006 is non-RoHS, but can still be repaired, serviced, and upgraded with non-RoHS parts. The Teradata global strategy is to use up all the inventory of non-RoHS parts and phase in all new RoHS parts as cost and logistics allow with the goal of shipping only RoHS-compliant products to the world market. New RoHS “finished products” will be shipped to EU countries. Whereas non-RoHS service parts will be shipped to non-EU countries and to only non-RoHS systems in the EU until all the non-RoHS inventory of service parts is used up. The following questions and answers are good illustrative examples of the topics that surfaced during the biweekly meetings: Q Can used and/or refurbished products be resold after July 1, 2006 if they are not RoHS compliant? The RoHS Directive does not apply to the reuse of products put on the EU market before July 1, 2006. A product first put on the market in the EU before July 1, 2006 can be resold “as is” or refurbished with non-compliant parts and resold after July 1, 2006, provided that the unit is being sold only as used or refurbished equipment. Used or refurbished products imported into the EU for the first time after July 1, 2006 must be RoHS compliant. Q Must spare parts used to service and/or repair units after July 1, 2006 be RoHS compliant? It depends when the unit being serviced or repaired was first put on the market. Products put on the market after July 1, may only be serviced, repaired, and/or upgraded with RoHS compliant parts and assemblies. Products “put on the market” before July 1, may be serviced, repaired, and/or upgraded with compliant or 16 The first rough cut of totaling the number of Teradata parts impacted by RoHS was approximately 46,000 parts. Many parts were duplications as they were used in other similar products. Microsoft Excel was used to total up all the parts and components, but Excel proved to be too slow. The in-house Teradata database programs: PCMS (Purchased Commodity Management System) and EPIC (Engineering Product Information Center) were the sources used to extract the data and Excel was used to massage the data for tracking part compliance. This showed that a new software database tool will be necessary to flag and store the required RoHS designators. To track progress, each of the business units was monitored by the corporate team using a tracking tool as shown in table 5 that was updated monthly. A master chart combined all these business unit tables for a PowerPoint presentation each month. 11.0 Evaluating Technical concerns Associated with RoHS – such as “Tin Whiskers” Early in the RoHS transition there was a real concern about the reliability of the solder joints without using lead. The military had investigated lead-free solder and found the growth of “tin whiskers” could cause a short between adjacent conductors on a PWBA board. The industry had evaluated many alternatives and has found a number of options to mitigate the problem of long term reliability concerns in the commercial world. The EU has granted an exemption for the next four years for “lead in solder” in certain applications, such as servers and storage. This was an important exemption for NCR and some of the suppliers in meeting the July 1milestone. 12.0 Developing RoHS Process Preparations for Audits and On-going Supplier Compliance In order to ensure on-going supplier compliance, suppliers must provide RoHS-compliant parts and documentation of their RoHS compliance by a CoC (Certificate of Compliance) or equivalent proof. RoHS compliance for a supplier requires the following: a) 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 17 MARCH/APRIL 2007 develop manufacturing and material handling processes and procedures that are compliant with the EU Directive RoHS 2002/95/EC; b) ensure that process materials and chemicals used in the controlled manufacturing processes are compliant with the RoHS Directive. To verify internal compliance to RoHS, as well as EMI, Product Safety regulations and/or agency accreditations, internal audits are held periodically by the Quality Analyst within Teradata. ISO audits are performed by an external service contracted by the Teradata Quality group. In some cases it may be necessary to test and/or verify the impact of manufacturing variations on product compliance and assure continued compliance over the product’s lifetime. RoHS-compliance audits for suppliers are performed by Business Operations as defined under the Supplier Management section in the NCR Corporate Process document on a periodic time basis. The process controls are periodically audited to assure the original process quality and integrity. Conformance is more than simply testing one product during development or early production, and declaring all subsequent production units compliant. Most regulatory agencies require retest or verification as part of an ongoing conformance program. This requirement can be met by testing new production samples as products are enhanced and upgraded. The engineering processes must be audited by the Quality Analyst to verify that the proper procedures are being followed to ensure the quality and integrity of the processes and conformance to the global regulations and requirements. In order to check and/or verify compliance, there are several Teradata on-line databases that list the part numbers including parameters and designations in the Teradata PCMS and EPIC databases, and the Product Identification “PID” in the corporate GSDB database. In preparation for a RoHS audit, the Teradata engineering process documents are being updated to provide a paper trail to support the massive one-time work effort, to scrub the parts lists and BoM to ensure new products being sold to the EU contain RoHS-compliant materials. However, this is different from what is collected on an ongoing basis to show that products have been designed, developed and released in compliance with the RoHS Directive. A major requirement of an ongoing audit trail is the collection of evidence to show “due diligence” that the supplier is continuously verifying compliance on a periodic basis as documented in the process. A DoC (Declaration of Compliance) certificate that is used for EMI and Product Safety certification has been modified to include the RoHS certification. Certificates relative to existing products have been updated and signed by an officer of the company. This shows that management has confirmed that processes are in place to ensure RoHS compliance. In the NCR Corporate GSDB (Global Services Data Base), the following are some of the symbols used to flag and indicate the various RoHS levels: CMP ==> (Compliant) NCE ==> (Non-Compliant with Exemption) TRN ==> (Transitioned) NA ==> (Not Applicable) Table 5 Tracking Tool for Teradata Compliance NCM ==> (Non-Compliant) UPG ==> (Kit or Cable) with Conditionally Orderable Reason Code of “RO” In addition, a Central Repository for all supplier documentation and Certificates of Conformity is set up at the corporate level to contain all the RoHS documentation and to eliminate duplicate suppliers from all the Business units. In July, an internal audit on the Teradata business unit revealed some “gaps” in the RoHS compliance process. These gaps were solely within the internal Teradata process and steps being taken to eliminate them. Figure 2 shows page 1 of the internal assessment cover. 13.0 RoHS Training Course Available In order to make new people aware of the RoHS requirements and to properly train and prepare personnel, appropriate RoHS training was necessary. This course provides an overview and describes the detailed implementation impacts of the Restriction on Hazardous Substances (RoHS) Directive put into effect in the European Union as of July 1, 2006. It is designed to provide NCR Field Service and all support personnel with the knowledge and information required in their job responsibilities to be aware of and adhere to these new legal requirements. 14.0 Future Considerations – Lessons Learned and How to be Proactive Next Time One of the lessons learned was that better database tools are needed to capture and massage the data and scope the magnitude of the problem. The first estimate of parts impacted was approximately 46,000 parts, but there were many obsolete parts, end-of-life parts, nonapplicable parts, and duplications used in similar products. Microsoft Excel was used to total all parts, but proved to be so slow that it was unusable on very large databases. The other in-house database programs EPIC and PCMS were not set up to capture the appropriate parts data and massage it, or attach and store all the supplier verification data. continued page 18 17 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 18 A DVA N C I N G MICROELECTRONICS continued from page 17 Therefore, a new software database tool will be necessary to capture large blocks of data and massage it. It may also be necessary to flag and store the necessary designators for countries and/or States in the United States, and to anticipate the impact of future environmental compliance laws and initiatives, such as shown in table 1. A database program called “Merlin” looks promising and could be implemented in the future to supplement or replace the existing EPIC and PCMS database programs. As a side observation, it was interesting to find that transitioning the Teradata products to RoHS did not impact the EMI test certifications, probably because the engineering designs were not impacted. References 1. Fleming, J., “RoHS Compliance Status – Teradata,” NCR Corporation, June 26, 2006. 2. Mahsoub, M., “NCR Corporate Product Compliance Process,” July 14, 2006. 3. Jonathan J., “Put on the Market,” NCR Corporation, February 2, 2006. 4. Celio, J., “NCR Assessment Report,” NCR Corporation, July 10, 2006. 5. Rostek, P., “Engineering Compliance Process,” NCR Corporation, June 30, 2006. Figure 2 Cover Sheet of Internal Audit Report IMAPS 2007 San Jose Historic Winchester House photo courtesy of the San Jose Convention & Visitors Bureau 18 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 19 MARCH/APRIL 2007 19 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 20 FEATURE ARTICLE A 3-D Computer Module Study Don Hayashigawa, NxGEN Electronics Inc., 9771 Clairemont Mesa Blvd., San Diego, CA 92124, donh@NxGENelectronics.com, 858-309-6610 ext 3014 Introduction The current trend in military space electronics is to utilize the latest COTS (Commercial-Off-The-Shelf) technology in such a way that they can still meet the demanding requirements of the target application, including low cost, small form factor, conduction cooling, high reliability and functional performance. A major building block in a missile application is the microcomputer, whose “main purpose is to accept the digitized spectral information from the sensors, process the information so that the ‘target’ can be discriminated from ‘non-targets’ and generate signals for the missile control and payload systems to turn towards the target…” 1. The subject of this paper is the development of the preliminary package design for a 3-D microcomputer module intended for this purpose. The preliminary requirements and specifications for the module were determined with the customer. A block diagram was initially generated and subsequently modified by the customer, as shown in figure 1 below. Abstract This paper outlines a study for the development of a small form-factor 3D-Microcomputer Module for a military application, based on COTS devices. The process, from establishing the module functional requirements to the development and analysis of a preliminary package design, will be examined. The main discussion will center on how the mechanical, electrical and thermal requirements can be met by adopting different packaging strategies, including CSP stacking, rigid-flex PCB, embedded passives, low profile components and a novel heat sink design. Finally, the results of the analyses done to validate this system-in-package design will be presented. • Dual Core 8641D CPU Up to 1.5 GHz w/Altivek • 466 MHz DDR2 SDRAM Up to 1 GB • Dual Core version has 2 DDR Interfaces 64MB to 512MB • 4X 2.5 GHz PCI Express (PCIe) Interfaces • 4X 3.125 GHz Serial Rapid IO (SRIO) Interfaces • 4X GBE Interfaces • Up to 512 MB (NAND) Flash Boot Memory • FPGA based Quad 3.125 GHz Rocket I/O Interfaces • Two Local Bus Interfaces to CPLD and FPGA • Dual DS 1772 Thermal Sensors Some of the environmental requirements include the following: • Operating Temperature Range: -40 to +85ºC • Non-operating Temperature Range: -55 to +105ºC • Vibration: VITA 47 Level V3 • Shock: 40g, 11 millisecond half-sine Package Design Figure 1. Block Diagram The key features required to meet the computing and communications requirements and specifications of the target application included the following: • Size: 2.4 “ x 2.4” x .35” • Weight: .2 LBS • ~1080 ball outs 20 The package design developed for the above requirements is depicted in the 3-dimensional view of figures 3. and the side view of figure 4. Standard packaging for the CPU and the FPGA was selected due to the high cost and unavailability of fully tested bare die. In order to maintain the footprint size, it was necessary that the CPU and the FPGA be in some way mounted one over the other. One method for doing so is through the use of a flex substrate on which the FPGA and CPU are mounted on separate rigid substrates. Because the CPU dissipates the most power, it was located on the upper substrate in direct contact with the coldplate, while the FPGA was mounted below. For reasons of minimizing real estate and minimizing trace lengths, the CPLD and memory were placed on the same rigid substrate as the CPU. The CPLD is again assumed to be a COTS packaged device and placed on top, while the flash and DRAM are located on the opposite side of the CPU. The package I/O are implemented as an array of solder balls on 1 mm pitch. 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 21 MARCH/APRIL 2007 Figure 2: Model of 3-D Microcomputer Module Figure 3: Side View of Model of 3-D Microcomputer Module (Heat sink removed for visibility) One unique feature of this package is the folded copper heatsink which wraps around the upper substrate and is used to conduct heat from the top surface of the FPGA to the coldplate. In many military space applications, there is no available airflow and the motherboard is usually running at a fairly-elevated temperature, so the coldplate was assumed to be the only source for cooling of the module. The side view of figure 4 shows the DRAM and flash memory implemented as Tessera µZ-ball Stacks TM.2 A more detailed view of such a stack with its basic construction is shown in figure 5. In this technology, wafers are obtained from various DRAM manufacturers and thinned down from 150 microns to as low as 75 microns. The die are then placed face down and attached to a flex substrate using a compliant adhesive. The compliant adhesive acts to mechanically decouple the low-CTE die from the higher-CTE PCB on which the stack is mounted and provides inherent reliability to the stack. The substrate has a slot running down the middle of it, which reveals the center row of bond pads of the attached DRAM die. The assembly is then flipped over and DRAM bond pads are wirebonded through the slot up to the substrate bond pads. The bond pads are then connected via traces to rows of solder ball pads on each side of the substrate. The wirebonds are encapsulated and solder balls are then reflowed onto the solder pads. The layers can then be stacked and reflowed to create the final assembly. Wafer probed memory die are becoming available through manufacturers such as Micron, Samsung and others. In addition, each stack layer can be further tested as an individual CSP prior to final assembly. This greatly enhances the overall yield of the stack. Thus, although not strictly COTS, memory stacks are inherently cost-effective, reliable and small-form factor components, which are ideally suited for applications such as this. With regard to the rigid-flex substrate, it is assumed that as many as 16 layers might be required. The side view in figure 4, shows flex connections on either side of the substrate. On the right side, two flex cables are shown connecting the upper and lower sections, but up to 4 is possible. The maximum allowable number of flex connections between rigid sections is critical to assuring not only sufficient signal interconnect, but also power ground plane integrity. On the left side of figure 4 is another flex connection, which would be achieved after the assembly is folded. This connection could be achieved through a spot soldering operation or an ACA (anisotropic conductive adhesive) attachment. There are clearly many passive components which would be required for a functional microcomputer including high-frequency and low-frequency bypass capacitors, bias and termination resistors and frequency control capacitors. Termination resistors can be embedded into the substrate using Ohmega-PlyTM resistors, while high-frequency bypass capacitance can be achieved through buried capacitive layers. Low frequency bypass capacitors tend to have a large footprint as well as being high-profile. However, some capacitors have recently become available which have fairly high capacitances (10ufd) and low profile (~.5 mm). Other key issues are shock and vibration requirements. The component as designed does appear to meet the weight specifications, however, to meet the vibration and shock requirements, it appears that some form of mechanical restraint would be required. The simplest approach would be to bolt the heatsink to the PCB through holes drilled in the heatsink. Thermal Analysis: From the 3-D model, a FEM thermal analysis was conducted using SolidWorks COSMOS. The following power assumptions were made for the various components. Table 1: Component Power Dissipations Figure 4: Detailed View of 2-Layer ìZ-ball Stack TM The cold plate was set arbitrarily at 25ºC and it was assumed that it was in direct contact with the FPGA die. If the maximum junction temperature is assumed to be 115 ºC, then the maximum allowable delta between junction and the cold plate would be 30 ºC, continued page 22 21 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 22 A DVA N C I N G MICROELECTRONICS continued from page 21 given the maximum cold plate temperature of 85 ºC. The results from the thermal analysis indicates a temperature rise of 6 ºC, which is probably a little overly optimistic as the die was assumed to be the same size as the FPGA package. Still, a temperature rise over 10 ºC would not be expected. The lower DRAM die on the stack packages runs the hottest with a cold-plate-tojunction temperature of 20 ºC. It should be noted that the stacks were modeled with a thermally conductive material bonding the stacks together. The assumptions for the DRAM die dissipation were given by the customer, however, it is likely that the DDR2 die will run significantly cooler. Conclusion: A preliminary package design for a 3D microcomputer module targeted for a demanding military space application was completed. This design incorporates a novel heatsink design, a rigid-flex substrate, buried/low profile passive components and µZ-ball Stacks TM components. A simplified thermal analysis indicates that the module should meet the thermal requirements. To the extent possible, it appears that all the other specifications and requirements for this device are being met. The other tasks required to complete the development include: rad- hard design, electrical analysis, preliminary layout, final analyses, final design and development of a functional prototype. References 1. R. Czajkowski, SBIR Final Report (Contract HQ0006-05-C7-190), “3D Computer Module, NxGen Electronics Inc.,” 2006. 2. Vern Solberg, Ignacio Osorio, and Jeffrey Demmin, Tessera, “Ball Stack Packaging for High Performance Memory,” Tessera Inc., SMTA International, September, 2003. Figure 5 22 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 23 MARCH/APRIL 2007 Foundation Focus Focus and Initiatives of The Microelectronics Foundation Talent and innovation are critical to the industry’s and Foundation’s success. New programs and innovative projects including research will drive the Foundation. Collaboration is always better than competition, whether within an industrial context or with several universities. The Foundation can offer not only human capital resources but funding resources for those projects. What is the Goal? The goal is to attract the best and brightest to the Microelectronics industry by making Microelectronics a visible and exciting field of endeavor. Programs to accomplish this goal are designed to create greater awareness, develop future industry leaders and create a funding source to support their education. Developing Future Leaders • • • Train teachers of gifted and talented students with an emphasis on increasing exposure to and appreciation of microelectronics, blended classroom learning strategies, plus web-based learning tools, and conventional teacher presentations. A high school outreach program is starting, focused on microelectronics careers/jobs, with direction given by IMAPS retirees, interested volunteers and retired executives. If you have the time, the interest and the passion to help, we need you. A high school curriculum or enhancement to the curriculum program — a comprehensive, integrated view of what comprises a microelectronics program — is now in formation with ASU and University of Kentucky. • Begin a university intern work program to achieve goals of greater awareness of microelectronics and collaboration with corporate donors. Does your company have an intern program? Contact us and we will help you set one up. Creating a Funding Source Named Awards The Microelectronics Foundation is setting up new grants, awards and scholarships to fund and develop the talent we find. The Foundation is eager to work with your company and its philanthropic department on exciting new programs that will enhance the Microelectronics industry. In nearly all cases, the company or group of contributors that fund the award will name the award, such as the Sidney J. Stein Award for Graduate Studies or the Motorola Innovation & Design Competition. Awards and Grants are conferred annually to encourage the study of theory and application of microelectronics and microelectronic packaging by university and college students and practitioners. Scholarships are conferred annually to encourage the study of Microelectronics and Microelectronics Packaging. Multiple-year scholarships for the innovators that industry needs will be designed to provide funding through college into graduate school. To get involved, contact Jim Drehle, jdrehle@microelectronicsfoundation.org James R. Drehle, Robert Lloyd & Associates 23 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 24 FEATURE ARTICLE N ext Generation Multilayer Dielectrics for High Reliability Multilayer Hybrid Circuits Stefan Flick, Annette Kipka, Heraeus TFD, Hanau, Germany, stefan.flick@heraeus.com, +49-6181-354935 David Malanga, Heraeus TFD, West Conshohocken, PA david.malanga@heraeus.com, +1-610-825-6050 Abstract As the core in a multilayer build-up the dielectric plays an important role in preventing resistors from cracking or chipping provoked by the heat of the laser beam. State-ofthe-art dielectrics must be able to handle the stringent requirements of wirebond and solder pads. Cost is also paramount in the electronics industry so a new dielectric must be cost effective. A dielectric that uses only a 2layer-build-up and low total thickness but still provides high insulation and high breakdown voltage is a cost effective solution. These requirements are extremely important in automotive, medical, and power electronic applications which require cost effective alternatives with ever increasing stringent demands. An environmentally-friendly dielectric has been developed which addresses actual and future expectations in terms of RoHS and ELV legislation. This paper will present a new lead, cadmium and phthalatefree dielectric which meets the strict requirements of today’s multilayer hybrid circuits. Performance data will be presented on electrical and mechanical performance, as well as compatibility with resistors and other RoHS-compliant conductors. Key words: Hybrid, Dielectric, Break Down Voltage, Adhesion, Chip-Off, 2 Layer, Battery Effect 1. Motivation Hybrid thick film circuits are comprised of conductive and dielectric layers on top of a substrate which is typically 96% alumina. The chemical inertness at higher working temperatures, high frequency properties and a remarkable insulation resistance of Al2O3 (~1012 to 1015 Ohm*cm), supplemented by good thermal conductivity offers a safe and flat platform for electronic circuits. High batch-to-batch consistency in smoothness and geometry ensures a high yield during build-up of circuitry, population and mounting which balances out higher material costs compared to PCB. Highly integrated double-sided circuits with buried power tracks and thermo-mechanical shock stability are typical requirements of harsh environments like under-the-hood applications for car components. To achieve a higher level of integration, multilayer hybrid circuits use dielectric layers to insulate stacked conductor tracks. Conductors, via fills, resistors and dielectric layers are applied by screen printing, drying and firing at 500 – 850°C of each consecutive layer. Thick film resistors can be realized between 0.1Ohm to 100Mohm, and high precision and reliability can be achieved by laser trimming [1],[2]. Through holes (conductor through the substrate to connect the front with the back side) and multilayer build-up offer a freedom in design and high integration density for population with passive and active components. Typical fields of application are motor and gearbox management, air flow meters, airbag igniters, as well as high frequency, wireless communication devices. Production of hybrid circuits is an inexpensive process due to the time of development and undedicated equipment enabling short term modifications. Hybrid technology offers the advantage of high reliabil- 24 ity over a long lifetime. However, ongoing pressure from competing technologies forces hybrid manufacturers to increase integration density by increasing functions on a smaller space at higher yields while minimizing tolerances. An increased demand on environmental sensitivity sets another task concerning material composition. To address these demands, W.C. Heraeus has developed a new 850°C fireable multilayer dielectric which is lead, cadmium, nickel and phthalate free. 2. Demands on the new multilayer dielectric A new dielectric was developed in close cooperation with customers to answer the increasing demands on materials for hybrid circuits. These are: • Hermetic density in a two-layer, sequentially fired build-up. Break down voltages of 500 V at 3540µm thickness as fired. • Increased printability for large area shielding on a 6x4” substrate. The likelihood of pinholes and misprints increases by the 2nd order and can negatively influence hermeticity. • Optimized rheological properties, namely via resolution of 250µm or better in continuous production operation, prior requirements were only 350µm. • High migration stability during refirings in a “mixed metal build-up.” Figure 1 shows a simple build-up to test for battery effect:1 The bottom electrode is silver and the top conductor is gold which are insulated by the dielectric to be tested. Each layer is printed, dried and fired sequentially at 850°C in a 30 minute profile. The fired thickness of each metal layer should be kept low, 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 25 MARCH/APRIL 2007 around 12µm, to avoid other effects causing blisters. The dielectric layer typically is built up in 2 or 3 layers, resulting in a fired thickness of 30 – 40µm. Up to 12 refirings should be tested. Figure 1: Mixed metal build-up to test for Battery Effect. ing resistor and the trim spot. The difference in thermal expansion of this very spot induces an enormous pressure on the resistor and the dielectric underneath. A new dielectric should be able to withstand this thermal stress without chip-offs. Figures 3a and 3b show chip-offs after laser trimming of a large area printed with R8931DCR. Resistors were trimmed with a NdYAG-Laser with 0.8 to 1.2 W at 15 mm/s. After trimming of resistors on the new dielectric there is no critical chip-off in the trim cut. Figure 4 shows a light microscopic blow-up of trim cuts in R8900 series. Resistors were printed on top of IP 9227 and as can be seen from the micrograph, no chip off is evident. 1 Due to the high electrochemical potential between gold and silver, silver ions always migrate into the gold. The first generation of dielectrics showed blisters under the gold layer from the first refiring. This happens due to silver migration through the dielectric as Ag+ and O2- ions. Oxygen is present due to the firing in air and the oxidizing character of the glazes in the layers. Recombination of the Ag+ and its electrons in the interface between gold and dielectric leave bubbles of oxygen during firing. Around the peak temperatures the softened dielectric acts as an electrolyte as in a battery. Figure 3a: Resistor R8931DCR with trim cuts, dielectric printed on alumina. Chip-offs were counted on a trim cut with a total length of 2 meters. Figure 2: Battery effect after 3 firings. Bottom electrode: Au, blue layer: dielectric, top electrode: Ag. Figure 2 shows the surface of a test substrate after 3 firings. This dielectric does not prevent battery effect. Independently whether gold is on top or printed as the bottom electrode the bubbles will be formed at the gold interface. After 3 refirings the dielectric and the top electrode are lifted by blisters showing the pattern of the bottom electrode. This is an unsuitable dielectric for mixed metal multilayers. • Trimming of resistors printed on top of dielectric can lead to “chip-off” in the form of shell-like chipping of bigger chunks of resistor and glaze. This leads to sudden changes of resistance and causes imprecise online control of the trim progress, which results in low accuracy. Furthermore, cracks often begin in the chip-offs and propagate throughout the resistor. This causes significant resistance drift over time. Due to the high energy input of the laser beam there is a high temperature gradient between the cold surround- Figure 3b: Detail from Pic.3a. Chip-off. A summary of the important requirements for a new multilayer dielectric is shown in Table 1. 3. Developmental stages of the new Multilayer Dielectric As a basis for the new dielectric, a lead free composition in the system SiO2-B2O3-Al2O3-CaO was chosen which matched the Thermal Coefficient of Expansion (TCE) of Alumina. This glaze was blended with pig- continued page 26 25 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 26 A DVA N C I N G MICROELECTRONICS continued from page 25 ment and ceramic fillers. The fillers are a blend of alumina powders with different fineness of grind. A new dye was developed with reinforced chemical stability. Some of the results of the experiments are shown in Table II. down voltage. A mixture of different kinds of Alumina powders showed to be very helpful. The optimum was found by the design of experiment method. On the organic side, a new vehicle was formulated to meet the required via resolution of 250µm. The vehicle is phthalate free to comply with current EU regulations. While paste in series 1 still showed chip-off, the second set of formulations showed battery effect significantly after 3 refirings. Further work was needed to meet the new requirements. 4. Properties of the new multilayer dielectric Figure 4: Laser trimmed resistor (R 8900 series) on top of the new multilayer dielectric. These experiments showed a strong dependency of the dielectric’s properties on the content and grain size of Al2O3. Chip-Off was greatly reduced by increasing the content of Al2O3. But this had the undesirable effect of also increasing the formation of pores and pinholes, which consequently negatively influenced break Table I: Specifications for new dielectric. Table II: Summary of initial paste trials. 26 Further development successfully led to a new product, IP9227. The properties of this dielectric are shown in Table III. This data is benchmarked against the actual standard multilayer dielectric IP9117SB. For adhesion tests the standard wire-peel-test was completed by a shear test on a critical component, a diode with plastic housing; type “DO 214” (Figure 5). Due to the significant mismatch of the TCE of the housing and the hybrid as the substrate this is a harsh test for adhesion. Standard tests in the automotive industry are “Temperature Shock Cycling” and “High Temperature Storage” which reflect the under-the-hood conditions over a car’s lifetime. Shock cycling simulates a situation where either a hot gear box hits a dump, filled with icy water or a very cold winter day where the cold electronic devices attached to the engine or gear box get hot in very short term. Formation of moisture is a co-aspect of cycle testing because it is a driver for silver migration. Silver dendrites can grow between tracks which ends up in a short cut. High temperature storage simulates operation temperatures in automatic gear boxes, where gear box management is placed within the gear box housing. Increased friction, as on a longer ride in a mountainous region, or at high speed, the temperature in a gear box easily reaches 150°C. While High Temp. Storage is simply done in a conventional box oven, shock cycling requires special equipment. Between two isolated chambers where one is cold (40°C) and the opposite is hot (+150°C), a cage with the test circuits cycles up and down. All phases of a full cycle are controllable like change time between chambers as well as peak time to address the differences in temperature leveling, e.g.; of a blank hybrid versus the much bigger mass of a populated circuit within a sealed box, filled with silicone gel. During the last years these reliability tests have been modified several times in duration and gradient. Typically requested is performance data after 1000 cycles between –40°C and 150°C and 3000h storage test at 150°C . Due to longer life time expectations of the next model year with increasing horse power and weight at less fuel consumption the operating temperatures of the power train have been risen constantly. This has started a discussion to change test conditions to an upper temperature of 170°C or 3000 cycles. DO 214 type of housing is critical on hybrids due to the inflexible termination and its bulk plastic housing (sizes in mm). The TCE mismatch and the sudden change in temperature between the two extremes in seconds, provoke high shear forces on the solder joint. 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 27 MARCH/APRIL 2007 Figure 5: Drawing of DO 214. Bulk plastic housing and leads visible. Sizes in mm. Additionally the direction of the stress input alternates between tension and compression. As shown in Table III the new multilayer dielectric shows significantly better stability in terms of battery effect or chip-off. Figure. 6 shows the results for the testing for the battery effect after 12 refirings at 850°C. There is no formation of bubbles visible. The electrodes are 12µm thick, the thickness of the dielectric was measured to be 45µm. Table III: Properties of new multilayer dielectric, IP9227. Figure. 6: Battery-Effect-Test after 12 refirings at 850 °C. No bubbles indicate sufficient electro-chemical stability. 5. Summary The new dielectric answers current and future demands of the automotive, medical, and power electronic applications for hybrid microcircuits. The absence of battery effect in mixed metal multilayer, improved laser trimmability of resistors along with a high break down voltage on large areas in a cost saving 2-layer build-up are the key features of this new dielectric. An environmentally-friendly lead, cadmium, nickel and phthalate free dielectric has been developed which addresses actual and future expectations in terms of RoHS and ELV legislation. Literature [1] Siegert Electronic – Hybridschaltungen: www.siegert.de [2] IPC “National Technology Roadmap for Electronic Interconnections” 2002/2003. Part D – section 3 – Ceramic Interconnecting Structures 27 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 28 FEATURE ARTICLE E mbedding a Thin Polymer Voltage ESD Suppressing Core in a Chip Package Offers and Alternative to on Chip ESD Protection of Sensitive High Performance ICs Used in Today’s Cell Phones and Computers Abstract Each year billions of dollars worth of electronics is damaged or made inoperable due to the effects of ElectroStatic-Discharge (ESD). As gate geometries of devices shrink, making them more susceptible to being damaged by even lower voltages, it is vital that a high speed low capacitance means of protection be developed and implemented. Typically, designers have utilized diodes, transsorbs, or surge protection devices to protect the electronics. These devices are expensive, take up valuable real estate in the electronic assembly, and only provide a modicum of protection. This paper presents a new, disruptive technology that offers the low capacitance levels needed for today’s high speed applications, a reduced footprint to facilitate the smaller product designs, and a faster switching speed that offers better ESD protection. Karen Shrier, CEO, Electronic Polymers Inc., kshrier@electronicpolymers.com Greg Caswell, VirTex Assembly Services, gregc@virtexassembly.com Introduction: Today’s computers, portable cell phones and commercial electronics have the potential to impact the quality of our daily lives by the reliability of their performance. One of nature’s hidden threats to electronics is electrostatic discharge (ESD). In extreme cases of reliability we hear of batteries in computers exploding, but now we are also becoming aware of the thousands of hours that are lost each day due reliability issues caused by ESD. ESD caused events trace back to reliability issues such as computers locking up and needing to be re-booted, or worse yet, dying and needing to be replaced as a result of ESD damage. Engineers are being forced to sacrifice reliability for performance in the competitive race to provide more features in less space. By comparison, today’s cell phones have become one of the most sophisticated electronic tools used by most of the population worldwide. As we all know, there are few cell phones that are simply a phone. Cell phones support cameras, GPS Systems, video, and Internet 28 connections and there is no end in sight for the new features envisioned. The drive for new features has been supported by advances to 65nm CMOS chips and GaAs chips which are far more sensitive to ESD than their predecessors. In 2005 the National ESD Association published a roadmap showing ESD sensitivity of CMOS chips has not only taken a huge nose dive over the last five years, but also the map is predicting ESD sensitivity is going to get even worse between now and 2010. [1] Due to the reduced geometries, ESD survivability in 1995 for Human Body Model (HBM) ESD was at 2000 V, today, in 2006 HMB survivability has dropped to 200V, and is heading to less than 200V. [Figure 1]. Further exacerbating the ESD problem is the trend toward pervasive use of laptop computers and portable electronics, which led to the introduction in early 2000 of a system level ESD standard that anticipates the amount of current a computer chip can be exposed to at the system level, which is going to increase from 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 29 MARCH/APRIL 2007 HBM, worst case, of ~ 6 Amps to System Level Current of ~ 30 Amps. The duration of the ESD event is extremely short, typically less than 100 ns, but the speed of System Level ESD is so fast that it can reach 8kV in 1 ns. In 2002, Scientific American published an article written by an IBM expert of on-chip ESD design, stating “Electrostatic discharges threaten to halt further shrinking and acceleration of electronic devices in the future,” indicating ESD protection on semiconductor components is a barrier to Moore’s Law. [2] The key problem is computer chip designers need low capacitance ESD protection structures on chips in order to run at high frequencies without interfering with the signal transmission. Since no cost effective solution has been readily available to the Design Engineer, the only alternative has been to trade reliability for performance. It is estimated that 27-33% of customer returns are due to ESD. [3] Putting a cost to field returns is difficult, but in the case of portable electronics or cell phones, assuming a cost of $12 for processing a cell phone field return, for a 30% customer return rate, the estimate for the 600 million phones sold in 2005 is over a billion dollars. Taking the issue of ESD sensitivity of computer chips beyond cell phones to commercial electronics such as laptops becomes a multibillion dollar field return problem. Figure 2 shows the market drivers to which an ESD solution needs to respond. Technical Approach: Polymer Voltage Suppressor Characteristics: At Electronic Polymers Inc. we have developed EPIFLO™ ESD polymer voltage suppressors specifically for ESD protection of computer chips. The initial product developed was a standard footprint 0402 Surface Mount component for protection of computer chips from HBM and System Level ESD. The Surface Mount component led to EPI-FLO™ Connector arrays capable of multiple line ESD protection. [Figure 3] The EPI-FLO™ polymer is manufactured as laminate panels, with the voltage sensing polymer sandwiched between copper sheets. Using standard printed circuit board fabrication processes the laminate is transformed into either EPI-FLO™ Surface Mount Components or Connector Arrays, for typical application use in protecting USB and Ethernet connectors. Another application for the materials involves the move to embedding EPI-FLO™ in the package of a GaAs power amplifier which extends the through hole via and etch processes developed for Surface Mount Devices and Connector Arrays to embedding the etched EPI-FLO™ laminate in a 4-layer Power Amplifier board. [Figures 4, 5] The EPI-FLO™ polymer uses nanotechnology and contains materials to create a nanosecond voltage switch that can withstand repeated ESD surges regardless of polarity. The product is placed in parallel to ground, shunting ESD voltages to ground in picoseconds. Due to the inherently low capacitance of the polymer, EPI-FLO™ products have low femto-farad capacitance characteristics. The packaging flexibility of the laminate allows embedding the EPI-FLO directly in a chip package at costs that are typically economically more attractive than on-chip or on the printed circuit board ESD protection as shown in Figure 6. By embedding directly in the chip package, ESD protection is Figure 1: CMOS ESD Sensitivity Forecast at < 200V in 2010 Figure 2: Market Drivers for Reduction of On-Chip ESD Protection continued page 30 29 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 30 A DVA N C I N G MICROELECTRONICS continued from page 29 based on square inches of material needed for protection providing both a cost effective and reliable solution for ESD protection of computers, consumer electronics and cell phones. For example, there are approximately 27 locations in a cell phone that require ESD protection, ranging from Surface Mount and Connector Arrays on the printed circuit board to embedded offchip protection. Laptop computers have even more exposure. Technical Advantages of EPI-FLO Figure 3: SMT Component and USB Connector with Embedded Array EPI-FLO is far superior to competing ESD solutions, with key technical features enabling: • Protection against high ESD events (up to 25 KV more) • Protection against low ESD events (80V trigger voltage) • Extremely fast response time (<100 pS) • Flexible form factor • Ultra-low profile (<5 mils) • Ultra-low capacitance (<250fF) • Ultra-low leakage current (100 nA at VDC = 12V) • Wide operating temperate range (-55ºC to +85ºC) • Embedded in the package allows pin-pin and pinto-ground protection • Ease of design in ESD protection off-chip Test Protocols and Approach for ESD Protection of Chips with and without EPI-FLO™ Figures 4 and 5 30 At Electronic Polymers test protocols and test equipment have been developed to enable thorough evaluation of ESD protection of sensitive chips. We have used our test methodologies to effectively examine the ability of various schemes to protect chips from Human Body Model, Machine Model, Charged Device Model, System Level ICE 61000-4-2, and the new Cable Discharge Event ESD. To provide an effective ESD solution we first determine the failure voltage of the chip using the ESD standard specified; then, using our Very Fast Transmission Line Pulser (TLP) shown in Figure 7, we establish the turn on voltage that damages the chip. By comparison we also measure by testing with the Human Body Approach illustrated in Figure 8. The EPI-FLO materials are then specified and formulated to turn on at a lower voltage. The protection is verified initially by building test fixtures and mounting EPI-FLO surface mount 0402 units in front of the pins to be protected. Protection is demonstrated by showing the chip can survive multiple ESD hits as required by the specification utilizing both positive and negative pulses. Typically devices are most sensitive to negative pulses. Failure of the chip is measured by a 10- 20% change in leakage current under power as illustrated in Figure 9. Once the specification is determined art work is created for the multi-layer package with ESD protection. The unique benefit of embedding the EPI-FLO directly in the package is multiple protection of signal pins as well as pin-to-pin combinations. As an example, in a 6 pin GaAs power amplifier, 6 pins and 21 pin combinations are ESD protected. 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 31 MARCH/APRIL 2007 Figure 6 Figure 7: Transmission Line Pulser Test Set-up Figure 8: Human Body Model Test Set-up Figure 9: Test Data Comparison continued page 32 31 350351_IMAPS.qxp 2/14/2007 8:44 PM Page 32 A DVA N C I N G MICROELECTRONICS continued from page 31 Following is data showing the EPI-FLO enhanced ESD survivability of a GaAs cell phone Power Amplifier to System Level ESD. Figure 10, below, is a typical Voltage – Time trace for a surface mount device that was used to protect a GaAs cell phone switch that failed under power at 400V IEC. With the EPI-FLO surface mount device in parallel to ground the switch took 50 ESD pulses before the leakage increased by 20%. Conclusion A new technology is available for enhanced protection of electronics in computers or any other type of electronic equipment that may see exposure to ESD. This technology, due to its flexibility, can be utilized in its basic form as a component, or in its embedded form in either connectors or device packages. It will provide a significant advantage to designers in that they will no longer have to impact reliability to meet their smaller form factor designs. References: [1] ESDA Association Technology Roadmap, http://www.esda.org/documents/ElectrostaticDischargeRoadmap-March42004—ESDA— Final.pdf [2] Steven H. Voldman IBM, Lightning Rods for Nanoelectronics, October 2002, Scientific American. [3] Karen Shrier, Tuyen Troung, and Jimmie Felps, “Transmission Line Pulse Test Methods, Test Techniques and Characterization of Low Capacitance Voltage Suppression Device for System Level Electrostatic Discharge Compliance,” Proceedings of the EOS/ESD Symposium, 2004. [4] Karen Shrier, Chi Jia, “Cell Phone GaAs Power Amplifiers: ESD, TLP, and PVS Devices,” Proceedings of the EOS/ESD Symposium, 2005. [5] Stephen Halperin, “Guidelines for Static Control Management,” Eurostat, 1990. [6] Stephen Halperin, “Guidelines for Static Control Management,” ESD Association, 2001. Figure 10 32 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 33 MARCH/APRIL 2007 MASH Editorial (Military, Aerospace, Space and Homeland Security Conference) Today I read in the morning paper that Sgt. John M. Sullivan, 22, of Hixon, Tennessee died in Iraq, a victim of an IED. I didn’t know John Sullivan and I’m sure he never heard of me. I wonder why he was willing to die for me and my wife, my three kids, my father, my six brothers and sisters and everyone else in this country? Where did he find the courage and conviction to volunteer for Service in the US military? He was no doubt a patriot and a lover of freedom. God bless his soul. Most of us don’t face imminent danger on a day to day basis, but if you’re planning to attend MASH this year there is a good chance your livelihood (not your life) is tied into the defense of our nation. Let’s not forget John Sullivan and the countless others when we meet May 8th in Baltimore to exchange ideas and discuss common technical problems germane to the military and homeland security fields. This year’s MASH conference will be a great opportunity to network with other industry professionals and build the personal relationships that are at the very foundation of a strong industrial base. There are some difficult technical challenges out there that will require serious dialog. Lead free solder and its impact on our weapon systems procurement is a hard fact of life, whether we like it or not. Counterfeit parts and part obsolescence is another important topic area that will be addressed again this year. We’ve also lined up some excellent talks on new materials, thermal management and next generation packaging concepts. Package hermeticity is still a critical reliability concern and there is a lot to report on in the area of “near hermetic” packaging of advanced material sets such as LCP and copper clad teflon. There are lots of other interesting talks so be sure to check out the full program at http://www.imaps.org/mash/. I can personally guarantee a full line up of quality presentations! This year we’re very fortunate to have Paul Schneider, a respected industry consultant, as our Keynote speaker and the dynamic John Douglas, CEO of AIA, as our dinner speaker. We expect to attract 200 plus attendees this year as we continue to build on a great conference started by Greg Caswell and his team a few years ago. The conference will be held May 810th at the Radisson Plaza Lord Baltimore Hotel, just a few blocks from the famous Baltimore Inner Harbor! ...See you in Baltimore! Tom Green MASH 2007 General Chair to register to attend or to reserve booth space at MASH 2007, please visit www.imaps.org/mash photo courtesy of JSF 33 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 34 FEATURE ARTICLE T hin Array Polymer Packaging (TAPP®) Leo M. Higgins III, Ph.D., ASAT Inc., Austin, Texas USA, Leo_Higgins@asat.com Abstract TAPP (Thin Array Polymer Packaging) is a high density, low mass packaging technology ideal for portable electronic products. The very low electrical parasitics of TAPP makes it ideal for RF and high frequency device applications. TAPP is registered with JEDEC as a leadless surface mount package, with an outline similar to the QFN. Unlike the QFN, TAPP provides up to three rows of perimeter IOs, while also providing the exposed die attach pad, allowing direct soldering to a system board to provide heat sinking into the PCB and low resistance back side biasing. Portable electronics are increasingly demanding higher density assembly in the form of stacked die packaging and package stacking. TAPP allows stack die packaging, and with the ability to provide TAPP contacts, power and ground rings, and other metal features, at closer spacing than possible with QFNs, TAPP can allow reduction in wire length for all die in a stack. The assembly of leadless high-density surface mount packages requires low warpage during the surface mount process, and suitable design of the PCB bond pads and the pad receiving the exposed die attach pad to avoid open circuits. The reliability of the surface mount connections must tolerate many power cycles common to the use of portable electronics, and as with the QFN package, the soldering of the exposed die attach pad of TAPP to the system board enhances the reliability of the connections. In this paper, aspects of the design of the TAPP and its use and performance in a surface mount assembly are discussed. Introduction TAPP represents the next step up from the QFN package for high performance packaging and is targeting communication-oriented portable and consumer electronics. While QFNs with two rows of perimeter contacts were introduced recently, assembly challenges remain, and widespread acceptance has been slow. TAPP avoids the assembly issues associated with dual row QFNs since TAPP is not leadframe-based. Since TAPP does not use tie bars, as with QFN, each TAPP component in a padframe array is electrically isolated immediately after the carrier strip is etched away, making TAPP ideal for strip-testing. TAPP products are offered with thicknesses from 1.0 mm to 0.4 mm, and body sizes below 2 mm sq. to 19 mm sq. TAPP has been manufactured in both multichip module and stacked die configurations. Due to increasing demand, the TAPP padframe size has been increased, and the thickness of the copper plating that makes up most of the TAPP metal feature thickness has been decreased to improve productivity and reduce cost. Due to the combination of design attributes, including very small dimensions, very low mass, leading edge component mass / IO, and excellent electrical and thermal performance, TAPP is gaining market interest, and is now available from ASAT and Amkor (on license from ASAT). TAPP Padframe Manufacturing TAPP padframes are made via a series of electroplating operations on a thin copper sheet. These additive plating processes are used to create contact pads, 34 power/ground rings, and the die attach pads from a multiple metal layer stack. The sheet is first coated with a photosensitive plating resist that is then photo-lithographically processed to define openings where plating is desired. The sequence of Au – Ni – Cu plating follows. A second photolithographic process series follows, and is used to define the locations for the final selective plating of Ni – Au on areas requiring wire bonding. These areas include the surfaces of the contact pads, power and ground rings, and perimeter regions on the die attach pad. The plating resist is then stripped, and solder mask is applied to the panel in desired locations. The panel of padframes is then completed, and the individual padframe strips are punched out of the panel. Figure 1 shows schematics of a TAPP padframe strip, and a cross-section detailing the electroplated metal stack-up. TAPP Assembly TAPP padframes are designed to be the same size as QFN and fine pitch BGA strips to allow utilization of the same fixtures, tooling, molds, and saw singulation used for both QFN and fine pitch BGA manufacture. The carrier sheet is much more mechanically stable than etched QFN leadframes, allowing defect reduction from handling and flexure typical with QFN manufacture. The solid copper carrier sheet provides a very stable platform for dispensing of die attach adhesive and die placement. The copper carrier also allows excellent heat transfer without complex heater block / clamp tooling needed for QFN assembly, especially with dual row QFNs, consequently the wire bond process is 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 35 MARCH/APRIL 2007 greatly simplified. Problems associated with good clamping of leads during wire bonding of dual row QFN are avoided. Molding requires neither the unique molds for punch-singulated QFNs, nor the use of molding tape required for saw singulated QFNs, allowing a wide variety of body sizes with only a change in padframe artwork, and reduced tooling and process costs. The only unique process requirement is the etching of the copper carrier, and this uses equipment and chemistries that are common for leadframe and PCB manufacture. At this point, all the TAPP units in the padframe array are electrically isolated, and could readily be strip-tested. Post-mold processing to electrically isolate units and pads (etching, partial saw cutting, stamping to cut connections) to allow strip testing, or to create two rows of contacts, are not necessary. The final step is saw singulation. Since the copper carrier has been removed, the saw process is very efficient due to the need to saw only through mold compound, showing a greater throughput than is possible with sawing QFNs or fpBGAs. Figure 2 shows schematics of a TAPP cross-section after various assembly operations, and the etch-away of the copper carrier. Figure 3 shows schematic views of the bottom sides of TAPP devices with two and three rows of IOs, including a two-row design with a power ring. Figure 4 exhibits actual TAPP components. Figure 5 shows a photo of a full TAPP test padframe being used for assembly process development with copper wire bonding. Figure 1. Schematics of a TAPP padframe and a cross-section through an assembly site showing the 5 metal layer stack comprising the metal TAPP elements. TAPP Design Considerations Since TAPP is not leadframe-based, the TAPP manufacturing and assembly processes do not require use of tie bars to support the inner rows of leads and the die attach pad. Not requiring tie bars allows metal features (contacts, die attach pads, power rings, etc.) to be positioned wherever necessary, and allows higher pin counts compared to QFNs of the same body size, since pads can be located in areas normally taken up by tie bars. While several rows of perimeter pads are possible with TAPP, due to constraints of wire bond length, surface mount challenges, and the redistribution of signal pads from the surface of a PCB, TAPP is normally provided with up to three rows of perimeter pads. A power or ground ring surrounding the die attach pad can be used in place of a row of pads, or segmented power and ground bars can be substituted for partial rows of contact pads, so design flexibility is not constrained by leadframe and tie-bar technology limitations. The electrical parasitics of a TAPP package can be even lower than the excellent parasitics typically exhibited by a QFN package. The TAPP package wire bond pad is the top surface of the SMT pad seen on the bottom of a TAPP package, so the TAPP pads are even electrically ‘shorter’ than the leads in a QFN. The pads can be placed closer to the edge of the die attach pad than is possible with leadframe etching or stamping, so critical contacts can be supplied with shorter wires than with a QFN. Of course, close placement of contacts to the die attach pad requires care during surface mount assembly to avoid shorting between the contacts and the die attach pad. Table 1 provides information on the standard thicknesses of TAPP packages, and other design information. TAPP is currently offered in 0.65, Figure 2. Cross-sections of a section of a TAPP padframe after a sequence of assembly operations. Figure 3. Typical bottom side views of TAPP components showing two rows of contacts, two rows of contacts and a power ring, and three rows of contacts. Figure 4. Bottom side views of TAPP components. continued page 36 35 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 36 A DVA N C I N G MICROELECTRONICS continued from page 35 Figure 5. Test padframe being used for copper wire bonded TAPP process development. Table 1. TAPP package configurations. cause open circuits between the perimeter pads and the PCB. It is generally recommended to print solder paste onto the PCB thermal pad in a grid pattern, such that approximately 50% of the thermal pad area is covered with solder paste. Other printed paste patterns, such as a radial star-burst pattern, that cover approximately 50% of the thermal pads can also provide suitable solder wetting and spreading, and the sweep-out of gases, allowing the interfacial area between the exposed die attach pad and the thermal pad to be less than 50% void area. This area has been shown to provide sufficient coverage without a significant drop in thermal or electrical performance. During surface mount reflow, generally the solder paste on the perimeter pads will melt before the solder printed on the thermal pad. Accurate device placement will allow the solder to properly wet the TAPP pads and the PCB pads, and then the solder paste between the exposed die attach pad and the thermal pad will melt. The solder will wet both surfaces and begin to spread laterally, pulling the TAPP package towards the PCB. If too much paste was printed on the thermal pad, and if too much gas gets trapped between the exposed die attach pad and the thermal pad, it is possible that the package could lift and tilt, causing opens between the contact pads and the PCB. Figure 6 shows an X-ray image through a 12 x 12 x 0.8 mm, 0.4 mm pitch, 204 ld TAPP component after surface mount assembly using lead-free SAC405 solder paste onto OSP-coated PCB pads. 1 The radial starburst stencil pattern was used for this device. Figure 7 shows a cross section of a solder joint of a 9 x 9 mm, 0.5 mm pitch TAPP component surface mounted on a 1.6 mm thick, doublesided FR4 test board, using eutectic Sn-Pb solder paste, after 2000 cycles –40 / +125°C, 2 cycles per hour. 2 Since TAPP bond pads typically occur in multiple rows, and do not extend to the edge of the package, the solder joints cannot be visually inspected. A PCB assembly operation that has demonstrated the capability for high assembly yields for equivalent pitch QFN packages on high-density assemblies should experience the same yields with board level TAPP assembly. Figure 6. X-ray image of a 12 x 12 x 0.8 mm, 0.4 mm pitch, 204 ld TAPP component after surface mount assembly using lead-free SAC405 solder paste, printed with a radial starburst stencil pattern. 0.5, and 0.4 mm IO pitch. Development work on finer pitch TAPP packages is ongoing. TAPP Surface Mount Assembly Surface mount assembly of components with a pad pitch of 0.5 mm, or finer, requires good process and design know-how. As with SMT of QFNs, the design of the solder mask stencil requires careful consideration. If excess air is trapped in the solder between the exposed die attach pad and the thermal pad on the PCB, some perimeter pads are not likely to solder to the PCB. If there is too much solder between the exposed die attach pad and the thermal pad, it is also possible to 36 Figure 7. Cross-section of a eutectic Sn-Pb solder joint between a 0.5 mm pitch TAPP component and a test board after more than 2000 temperature cycles. 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 37 MARCH/APRIL 2007 Summary TAPP packaging is an advancement of QFN style packaging, offering higher densities, higher pin counts, enhanced electrical design, and equivalent thermal performance. Due to the very low mass and small dimensions of TAPP, it is an ideal packaging technology for all forms of portable communications equipment, and consumer electronics. References: 1. ASAT SMT Reports of ASAT 04044 / 12204 Package, January 7, 2005. 2. ASAT Reliability Report TRMS-RTG00-0110, August 15, 2001. Sites along the San Jose historial tour San Jose photos courtesy of the San Jose Convention & Visitors Bureau 37 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 38 A DVA N C I N G MICROELECTRONICS Device Packaging Program-at-a-Glance 38 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 39 MARCH/APRIL 2007 IMAPS 2007 IMAPS 2007 From the Technical Program Co-Chairs, Sarosh Patel and Ray Alexander Welcome to 2007. IMAPS will be holding the 40th International Symposium on Microelectronics in November with technical sessions addressing everything in packaging “between the chip and the system.” New challenges and opportunities to enhance our products have been presented with globalization being realized. This helped in bringing about a paradigm shift in time-to-value for a myriad of our electronic products. The industries focused on will be biomedical, telecom, military applications, consumer electronics and renewable energy sources. We will continue to demonstrate the importance of System Packaging/ Applications/Design with software and firmware applications and imaging sensors being added to the mix. ESD protection, packaging for extreme environments, ceramic, polymer and conductive materials and microwave communications are planned as four new areas for Advanced Packaging and Materials. In keeping with the international nature of this conference and to reflect the reality of globalization, translated Japanese and Chinese sessions have been added. Smaller lithography, MEMS and nanotechnology have brought innovation and technology changes to microelectronics packaging. These changes have provided a rich source of publications that we intend to leverage at this conference. Microelectronics packaging is now more exciting than it has ever been. We are looking forward to hearing what you have to share about your contributions “between the chip and the system.” The deadline is March 30, 2007! Your expedient response in submitting or soliciting papers is much appreciated. Santana Row shopping San Jose aerial view San Jose photos courtesy of the San Jose Convention & Visitors Bureau 39 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 40 A DVA N C I N G MICROELECTRONICS IMAPS Society Awards — Your Help Needed Every year IMAPS members are asked to point out the Society’s members who have done such notable work that they deserve the distinction of one of our awards to publicly acknowledge their accomplishments. This year the IMAPS Executive Council has added two new awards – for outstanding service in education and for sustained and exceptional lifetime achievement. We have many deserving members who have given their time and energy, and expertise to ensure our industry has a robust future; you can make sure they are recognized by nominating them for one of our prestigious awards – but it must start with you! Whether they demonstrate this dedication by the excellent technical or business work that they do, by volunteering their time at the chapter level, or by becoming active in national and international activities, such efforts are vital to maintaining the high quality of our activities. We are all better personally and collectively because of the efforts of these individuals. Now we have the opportunity to let them know that we value their dedication and that their hard work has not gone unnoticed. The six individual awards presented annually are: Daniel C. Hughes, Jr. Memorial Award; William D. Ashman Memorial Award; John A. Wagnon Technical Achievement Award; Outstanding Educator Award; Sidney J. Stein International Award; and Fellow of the Society Award. The Lifetime Achievement Award is also an individual award, but will be awarded only occasionally when a deserving individual is identified and nominated. The 2007 Awards Nominating Committee is actively seeking nominations for these awards. Nominees for each award are evaluated by their respective Selection Committee, which is made up of past award recipients of annual awards, and Advisory Board members for the Lifetime Achievement Award. The Award Committees are chaired by the First Past President. Criteria for each award are as follows: The Daniel C. Hughes, Jr. Memorial Award is the highest, most prestigious annual honor, and is awarded to the individual who, in the opinion of the Daniel C. Hughes, Jr. Memorial Award Selection Committee, has the greatest combination of technical achievements related to microelectronics, combined with outstanding contributions supporting the microelectronics industry, academic achievement, or support and service to IMAPS. One must be an IMAPS member in good standing for a minimum of five years to qualify for this award. Recipients of this award automatically become Life Members and Fellow of the Society. The William D. Ashman Memorial Award recognizes an individual who, in the opinion of the William D. Ashman Memorial Award Selection Committee, has provided significant technical contributions to the electronics packaging industry, while participating and demonstrating support of activities to enhance the electronics packaging profession as a member. Recipients of this award automatically become Life Members and Fellow of the Society. 40 The John A. Wagnon Technical Achievement Award is given to a member of the Society who, in the opinion of the John A. Wagnon Technical Achievement Award Selection Committee, has made outstanding technical contributions related to microelectronics technology. The award may be given for a specific accomplishment, for a number of accomplishments over a period of years, or for general overall contributions to the microelectronics industry. The IMAPS Outstanding Educator Award recognizes an individual who, in the opinion of the IMAPS Outstanding Educator Award Selection Committee, has provided significant contributions to education for the electronics packaging industry and/or to the advancement of IMAPS Student Chapters. Note that this is not restricted exclusively to academic education. The Sidney J. Stein International Award is given to a member of the Society who, in the opinion of the Sidney J. Stein International Award Selection Committee, has provided significant international technical and/or leadership contributions to the microelectronics packaging industry, while participating and demonstrating support of IMAPS international activities to enhance the electronics packaging profession. The Fellow of the Society Award honors and recognizes those who, in the opinion of the Fellow of the Society Award Selection Committee, have made significant and continuing contributions to IMAPS over the years at any level – local or national. A nominee must have been an IMAPS member for ten (10) consecutive years. Examples of the nomination criteria usually considered for this award are: (1) service as an officer of a local chapter or in a national office; (2) service as a member of a local, regional, or national committee or task force; and/or (3) presentation of papers or conducting of short courses at local, regional, or national symposia. The Corporate Recognition Award honors and recognizes a corporation (or the appropriate division or department of a corporation) that, in the opinion of the Corporate Recognition Award Selection Committee, has made significant technical contributions to the microelectronics industry, while demonstrating support of IMAPS through participation in such activities as Organizational and Regular Memberships, promoting member participation in IMAPS-sponsored activities, sponsorships, Educational Foundation contributions, and by exhibiting at the Annual Symposium. The Lifetime Achievement Award is given to a member of the Society who, in the opinion of the Lifetime Achievement Award Selection Committee, has made an exceptional, visible, and sustained impact on the microelectronics packaging industry in technology, business or both. Because this award recognizes a longterm and exceptional impact on the greater microelectronics industry, candidates may be nominated only by Senior Members, Life Members, or previous recipients of either the Fellow or Technical Achievement Awards. Continued page 41 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 41 MARCH/APRIL 2007 IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT) April 23-26, 2007 Register online at www.cicmt.org Program-at-a-Glance Monday, April 23 Welcome Reception Tuesday, April 24 Keynote Presentations Materials and Processes for Microsystems Co-Firing Processes and Dimensional Control in LTCC High Frequency Characterization and Simulation Ceramic Actuators Advanced Packaging Technology Direct Write Technology Wednesday, April 25 International Session on Microsystems Microsystem Applications Processing and Design of Integrated Passives in LTCC Microsystem Materials and Processses Advanced Packaging Technology Interactive Forum (Poster Session) Thursday, April 26 International Session on Microsystems Design and Fabrication of Ceramic Microsystems and Devices Housing (Hotel Cut-off is March 23, 2007) Housing Accommodations must be made directly to: Grand Hyatt Denver Hotel 1750 Welton Street Denver, Colorado 80202 Phone: 303-295-1234 or 800-233-1234 When making reservation by phone, please reference Ceramic Interconnect Conference. continued from page 40 Nominations and supporting materials must be received by May 15, 2007. Nomination forms can be found on-line at www.imaps.org or by contacting Rayma Gollopp at IMAPS headquarters, rgollopp@imaps.org. Nominations may be also be submitted on-line at www.imaps.org, and the Practices and Procedures governing the awards can be found on-line at http://www.imaps.org/leadership/PP/ Sections/Section16.pdf. There are few things we each value more than recognition by our peers. This is your chance to recognize a deserving member with the prestige of an award – and only you, the membership, can do that. You have the keys to a vital part of our professional network – and your actions in recognizing other members’ accomplishments are key to making IMAPS much more valuable to us all! 41 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 42 A DVA N C I N G MICROELECTRONICS EUROPEAN NEWS Press release from IMAPS Europe: Long Desired Co-operation – Europe-wide IMAPS and IEEE CPMT in Europe (Region 8) Start to Co-operate After a period of productive and fruitful discussion, the “International Microelectronics And Packaging Society” (IMAPS) and the “Components, Packaging & Manufacturing Technology” Society (CPMT) of IEEE have agreed to co-operate in Europe to provide their members with a much stronger offering. Since October 2006 this collaboration is creating a single Europe-wide network which will bring together the interests of industry with the expertise and skills found in Europe’s science and research base. A variety of activities and events for the microelectronics and packaging community will be jointly organized and supported by both organizations where each has similar objectives. Europe Moves Forward Co-operation between these two leading organizations in Europe is outlined in a Memorandum of Understanding (MoU). Members of both organizations, and especially the whole microelectronics and packaging community, will benefit greatly from this collaboration. “This cooperation is really not only an end in itself,” explains Paul Collander, President of IMAPS Europe. “The industrial and research community will appreciate the compact event management that co-operation will provide.” Evidence of this is the technical co-operation, mutual concessions and consultation on the venues and scheduling between the organization of the pioneering conferences EMPC and ESTC. In the future ESTC will run in even years (i.e., 2008, 2010, etc.) and EMPC will run in odd years (i.e., 2007, 2009, etc) with the first jointly promoted conference being EMPC taking place in Oulu in June 2007 and the next event, ESTC, scheduled in Greenwich in London, England in September 2008. Co-operation and consultation on the content at conferences will also take place. “These must be world leading and of direct relevance to future industrial requirements,” explains Rolf Aschenbrenner, CPMT Vice President Conferences. Rolf also emphasizes the strategic gain that comes with co-operation: “Joint discussions and co-operation between CPMT and IMAPS can only strengthen the offer each organization provides its members. On the technical front such co-operation will ensure that future essential packaging technologies are developed faster and in a more efficient way providing major benefits for European industry and its researchers.” The co-operation also brings significant benefits to CPMT and IMAPS. For example, IMAPS Europe publications will be available through the CPMT database and its homepage search engine IEEEXplore. In addition to this, each organization views co-operation on events and other activities as helping strengthen and grow the packaging community in Europe. Background of the partners of the cooperation: For decades both societies have been pursuing the goal to offer a subject-specific forum for research, design and development of progress that points the way ahead in packaging as well as manufacturing. Further information on IMAPS and CPMT can be found at the following websites: www.cpmt.org www.imapseurope.org Contact CPMT: Rolf Aschenbrenner, aschenbr@ieee.org IMAPS: Paul Collander, president.elc@imapseurope.org France: Meetings Program: SIP/SOC chapter meeting, Caen, May 24 A one-day chapter meeting will be dedicated to SIP/SOC solutions for system integration. Sponsored by IMAPS France in association with NXP, the former component branch of the multinational corporation Phillips, it will be held in Caen on next May 24. IMAPS France thanks Jean-Marc Yannou, NXP, for his personal involvement in the organization. Interconex 2007, Toulouse, September 25-26 Interconex 2007, the annual Conference and Exhibition of IMAPS France, will be held in Toulouse, the capital of “Region Midi-Pyrénées” which is well known as “Ville Rose.” First aerospace pole in Europe, thanks to Airbus and CNES – the French space agency – Toulouse is the heart of a very important industrial network. Large multinational corporations and small/medium sized 42 enterprises are involved, out of aerospace, in telecommunications, automotive equipments or semiconductors. Toulouse, in addition, is a major pole in France for education and research, thanks to universities, schools and public or private laboratories. The exhibitors would find here experienced visitors closely involved in the high-tech products and services. The exhibitor handbook is available on www.imapsfrance.org. Entitled “Interconnection and Packaging for On Board Equipments,” the conference program will be dedicated to electronic equipment in the fields of avionics, space, automotive and trains. Critical components, assembly technologies, environment stress requirements, reliability, economical features…the technical program should express the convergent concerns and the differences between the sectors. The technical committee seeks original papers on these topics and is encouraging actual industrial cases and experience returns. 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 43 MARCH/APRIL 2007 More information? IMAPS France, Events, Membership? Florence Vireton, Bureau IMAPS-France 49 rue Lamartine - 78 035 VERSAILLES cedex Phone: 33 (0) 1 39 67 17 73 Fax: 33 (0) 1 39 02 71 93 E-mail : imaps.france@imapsfrance.org Inputs from France must be sent to: jean-paul.droguet@wanadoo.fr Germany: News from the Chapter: News from the Chapter: Second European ATW on Thermal Management After the real success of the first issue, last year, the 2nd European ATW on Micropackaging and Thermal Management was held, January 31 and February 1st, in La Rochelle on the French Atlantic coast. The aim of the workshop was to help exchanges of information between scientists and engineers involved in the field of thermal management, for high integration levels. Due to the rising speed and miniaturization, the mastering of thermal effects is and will keep being, a technological key for future packaging solutions. After a welcome session, including two keynote addresses, the technical program gathered 21 papers in five sessions: Materials; Applications; Thermal modelling and reliability; Advanced cooling solutions; Test and Measurement Methods. Half of the speakers were French; the others came from five different countries, including Belgium (4), Germany (2), United States (2), Spain (1) and Sweden (1). The language was English. For the first time, the ATW was open to table top exhibits, strictly limited to organizations involved in the field of thermal management. As we write this paper in the end of December, we will have more to report for the next issue. More information? On IMAPS Germany? Events? Latest CD ROM proceedings? Membership? Please contact: www.imaps.de Martin Oppermann, Point of Contact AM, martin.oppermann@imaps.de continued page 44 IMAPS France website For the incoming events, the site is progressively updated by our webmaster with the useful documents as soon as available: • Poster • Call for papers • Exhibitors files • Technical program • Registration files The “member only” section is open to our members, with their membership number as a password. Besides the directory of IMAPS France, papers presented at IMAPS events, are available on-line. In addition, on the web site of IMAPS France, you continue to find: • An updated information on IMAPS-France, • Short reports on recent events, • A membership registration or renewal on line, • Short news and an employment exchange area. Visit us @: www.imapsfrance.org Links are available for direct access to other chapters in Europe and United States. 43 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 44 A DVA N C I N G MICROELECTRONICS continued from page 43 Italy: Meetings Program: Wireless sensors and RFID technology: State of the art and applications – Workshop, Milan, February 27-28 The event will take place at the Politecnico di Milano. The program will be made available on the IMAPSItaly web site as soon as available. News from the Chapter: EMPC2009, Rimini The IMAPS Steering Committee has started the implementation of the EMPC2009 conference with exhibition. It will take place in the first half of June 2009 at Rimini, a beautiful tourist spot on the Adriatic Sea in the north-east side of the country. SAS (with its Blue1) and of course other Star Alliance partners and Finnair serve Helsinki and Oulu with many daily connections. Oulu is a high tech capital of Northern Scandinavia being the technology base for large international corporations like Nokia and a large number of small and medium sized hi-tech enterprises. For microelectronics and packaging, University of Oulu (16,000 students) and VTT in Oulu are globally well-known research and development partners. Technopolis, housing some 550 companies, is the first and the largest science park in the Nordic Countries and the only listed company of this kind in the world. Company visits will be possible. Enjoy the pictures from a late December afternoon – and look forward to the midnight sun in June! More information? For more information on IMAPS Italy and its events, please look at: www.imaps-italy.it Nordic: Meetings Program: EMPC2007, Oulu, Finland, June 17-20 We can assure you that this year’s IMAPS Europe event will be worthwhile attending. You will have the opportunity to hear exiting presentations, visit the concentrated and dedicated exhibition and enjoy the IMAPS Nordic social atmosphere offering you the best possible networking opportunities. A record high number of excellent abstracts were received. The program is outlined as follows: • After 3 plenary opening papers, follows 4 parallel tracks of sessions and events. • 2 tracks with 18 parallel sessions and a total of 72 oral papers. • 1 track with 11 high tech papers from latest EU programs (embedded passives and actives in PCBs and flex, large area electronics on stretchable substrates, MEMS/ASIC co-integration) and with the first European GBC (Global Business Council) session with 4 presentations. • Finally a 4th track with about 40 poster presentations over 2 days with 2 daily presentations. All Sunday and Wednesday afternoon there will be organized tutorials. The dedicated exhibition is selling very well and the new format seems very popular. A few lines about the social arrangements: Sunday evening a Welcome cocktail party at the Oulu Town Hall. Monday evening a buffet dinner in the exhibition area and Tuesday evening the banquet dinner at the Maikkula mansion. It is now time for you to plan your travel. It is easy to get there and very reasonable – if you book your flights in time. 44 Please study the program and all details at www.empc2007.org 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 45 MARCH/APRIL 2007 Business/Trade/Industry News: New Oulu high tech activities Fingu, www.fingu.com, a Chinese IT R&D company from Wuhan, 2000 employees, 150 in R&D, expands for the first time outside China. Fingu starts early this year in Oulu, and it will hire 6-10 designers. The British rep Gary Daly reports that Fingu collaborates with Nokia and wants that to increase. Analog Devices also starts R&D in Oulu and seeks designers. Przemysl. The comfortable Zamkowy Hotel (92 beds in single, double, 3-person rooms, and suites), a picturesque landscape, and the unique scenery of this 16thcentury Renaissance castle, surrounded by a majestic park filled with unique specimens of fauna and flora, serve to create great conditions for holding a conference. For more details, please contact Prof. Jerzy Potencki, Dept. of Electronics and Telecommunications Systems, Rzeszów University of Technology, e-mail: jurpot@prz.rzeszow.pl Poltronic news Paul Collander’s assignment with Technology Village Digipolis in Northern Finland has come to an end. Paul is now focusing on his own consulting firm, Poltronic, on new microelectronics technology. See www.digipolis.fi and www.poltronic.fi News from the Chapter: Poland: Meetings Program: UK: Meetings Program: 31st IMAPS Poland Intl. Conf., Krasiczyn, September 23-26 The 31th IMAPS-Poland International Conference will be held between 23rd and 26th September 2007 by the Rzeszów University of Technology, at the Castleand-Park Complex in Krasiczyn - located in south-eastern Poland, just 10 km from the historical town of MicroTech 2007, March 6-7, Hellidon Lakes, Northamptonshire The theme of ‘Advanced Interconnection’ will be the essential mood of the annual IMAPS UK technical conference. For further details, please check www.imapseurope.org/poland Malgorzata Kramkowska, malgorzata.kramkowska@pwr.wroc.pl continued page 46 45 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 46 A DVA N C I N G MICROELECTRONICS continued from page 45 MicroTech 2007 will be held at the Hellidon Lakes conference center in the Center of England, near Daventry. This venue has been selected in order to provide more space for exhibitors as well as keeping costs for a 2-day residential conference to an affordable level. Hot Topics at MicroTech 2007: IMAPS-UK moves this annual event to a new venue and puts emerging Microelectronic Technology into the spotlight. Intelligent Manufacturing is the theme focusing on all the upcoming trends of Advanced Interconnection. Topics include Nano Fibers, Reducing costs in RFID Technology, Isothermal Fatigue Testing, Electro-Optical Circuit Boards, Mass Imaging of Electronic Materials, Heal and Usage Monitoring Microsystems, Low Cost packaging, Interconnection on Ceramic, while DEK and Mydata go head-to-head with Screen versus Jet Printing. This year the ‘not-to-miss’ Market Watch asks the question “Supply Chain – is the pipeline broken?” with thoughtful consideration from Aubrey Dunford – AFDEC, Mike Trencherwood – COG, David Kynaston – UKEA/E-KTN and Chris Bailey – University of Greenwich, with questions and debate from the floor. The keynote presentation from Graham Pink, VP of R&D at CSR – “Changing the way the world connects” – confirms the importance of this event. All this supported by a table-top exhibition of suppliers to the trade and a conference dinner as well. So much to hear, so much to see, so many to meet at the Hellidon Lakes, Daventry on the 6th and 7th March. Full details of this event from the IMAPS-UK secretariat, 4 The Close, Bracebridge Heath, Lincoln LN4 2PB, Tel: 01522 575212 or email office@imaps.org.uk News from the Chapter: Working with SEMI Europe SEMI Advanced Packaging Conference at SEMICON Stuttgart – October 9-11. SEMI Europe, is a major part of the Global SEMI organization, supporting the Semiconductor and related manufacturing industry in Europe from offices based in Brussels. It has four areas of activity: SEMICON conferences, providing Market data, Industry related Technical programs and Standards. SEMICON Europa has moved from April time at Munich to 9-11 October in Stuttgart for 2007 and will remain there at this time of year for at least the next 3 years. SEMI has just released its program for future key activity, to be known as “Tracks” in the areas of SEMICONDUCTOR, MEMS, Advanced Packaging and Photovoltaics. The SEMI Europe ‘Advanced Packaging Conference’ Technical Committee met in Munich on Friday 17 November 2006, to review the committee structure, events related to SEMICON and formulation of a 1-day Seminar for October 2007. Jens Muller (IMAPS Germany) has stepped down as chair of this Committee (due to conference conflict with the IMAPS Germany annual event) and Andy Longford has been asked by SEMI to take over from Jens. The major issues evolving from the meeting are: SEMI will concentrate the technical programs on issues relating to 1st level interconnection, typically 46 wafer level packaging and embedded systems. This will prevent conflicts with IMAPS, considered more knowledgeable for level 2 and 3 interconnects and the ‘Science’ issues will be kept at IEEE CPMT level to prevent clash with ESTC conferences. The one-day Advanced Packaging Conference was proposed to be held on the Wednesday 10 October so as NOT to clash with the IMAPS Germany 8/9 October meeting. Future IMAPS and SEMI cooperation should be maintained as a number of the conference committee are IMAPS (and ELC) members (E Beyne, J Muller) and A Longford will take over Chair of IMAPS UK in March 2007. Andy Longford IMAPS-UK and the UKEA The UK committee decided that it was a benefit to members of the Society for IMAPS-UK to join the UK Electronics Alliance (UKEA) established late in 2005 by Intellect and the DTI. The aims of the Alliance are wide ranging based on the belief that there is so much potential that a higher profile of the potential is necessary. The first requirement is to publicize this potential wherever possible and to lobby all relevant establishments to support the industry both morally and financially with the target of a much stronger presence in the global market for UK Electronics by 2015. The current membership consists of eleven organizations and the hope is that with greater awareness others will join. At this stage the DTI has pledged support in 2007 of £37K, about half of what was anticipated. This leaves members’ subscriptions to pay for the rest of the anticipated running costs, activity costs being pledged by the organizations “in kind.” At a committee meeting held in December members who attended were generally up-beat and felt that IMAPS indeed had a contribution to make. Concern was expressed however that members of the Society who contributed towards reports and other material, also attending meetings, should not be ‘out of pocket’ and that such expenses should reasonably be expected to be met by the Alliance, particularly since all work would be on a voluntary basis. This view was taken to the next Alliance meeting by Peter Ongley, Chairman IMAPS-UK, but the proposition is unlikely to be accepted. Further reports will appear in later issues of AM. Business/Trade/Industry News: IMAPS Members in the News It is gratifying to see reports from a number of companies that have supported IMAPS over the years with institutional or individual memberships. MCENewmarket announced its agreement with Selmic OY to meet a growth in demand for system-in-package solutions which in turn will make use of Low Temperature Co-fired Ceramic Substrates, a specialty of the Finnish company. Technograph Microcircuits used the new publication, Global Aerospace Manufacturing to announce its selection to supply micro-electronic modules for the Airbus A380/A400 – 18 per aircraft. It also uses both thin and thick film technology on similar modules supplied for the Boeing 787. An article by Ken Henderson of C-Mac Microtechnology outlined the potential for microelec- 350351_IMAPS.qxp 2/14/2007 8:45 PM Page 47 MARCH/APRIL 2007 tronics in the automotive sector, when both thick film and LTCC techniques are used by the company which has its eyes on the estimated global market for nonentertainment electronics in cars reaching $52.10 by 2010. Welwyn Components announced the launch of its VRW series, a range of compact RoHS-compliant thick film resistors particularly suited to operating in harsh environments. Finally John Boston of CIL has appeared in two instances. Firstly accepting the Cranfield School of Management’s annual Best Factory award and then he was put in the hot seat for the EMC CEM spotlight which summarized his company’s success as resulting from equipping the facility with up-todate equipment and by a re-structured sales force now attracting four to six new customers a month and fifteen new projects for new and existing customers a month. BCW IMAPS 2007 – San Jose Grand Prix San Jose photos courtesy of the San Jose Convention & Visitors Bureau 47 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 48 A DVA N C I N G MICROELECTRONICS CHAPTER CONTACTS CHAPTER NAME REGION NAME MEMBER NAME COMPANY REP E-MAIL WORK PHONE Angel Southwest Maurice Lowery Northrop Grumman Space Technology mlowery@imaps.org 310-814-1890 Benelux Europe Eric O. L. Beyne IMEC eric.beyne@skynet.be +3216281261 Brazil South America Fernando Fujimoto Centro de Pesquisas Renato Archer fernando.fujimoto@cenpra.gov.br 0055 (19) 3746-6062 California Orange Southwest William Gaines Northrop Grumman - Space Sys Div. william.gaines@ngc.com 626-812-2199 Capital Southeast Louis A. Razzetti Razzetti & Assoc. lou@avidassociates.com 301-588-0637 Carolinas Southeast Jim W. Lawson Bourns, Inc. jwlathome@att.net 919-363-2235 Central Texas Southeast Frank J. Muscolino Austin Semiconductor fmuscolino@austinsemiconductor.com 512-531-7055 Chicago/Milwaukee North Central Andrew R. Lytis King Circuit Inc. alytis@imaps.org 630-629-7300 China Asia Dr. Jusheng Ma Tsinghua University Florida Southeast C. Mike Newton Harris Corp., GCSD mnewton@harris.com 321-729-3748 France Europe Brigitte Braux ASTRIUM SAS brigitte.braux@astrium.eads.net 01 34 88 33 47 Garden State Northeast Kathleen M. Kriskewic HED International, Inc. kkriskewic@imaps.org 609-466-1900 Germany Europe Jens Mueller TU Ilmenau jens.mueller@imaps.de +493677693381 Great Lakes North Central Brad W. Heiler Robert Bosch Corp. bheiler@imaps.org 248-848-2975 Hungary Europe Peter Gordon Budapest University of Technology and Econ. gordon@ett.brne.hu 361 4632740 Indiana North Central Larry Wallman Hi-Tek Sales lwallman@sbcglobal.net 317-887-2564 Israel Europe Uri Barneah Barkoh Technologies ubarneah@zahav.net.il 972-54-672508 Italy Europe Dr. Roberto May Microtel SPA may@microtelgroup.it 029543901 Japan Asia Itsuo Watanabe Hitachi Chemical Co., Ltd. its-watanabe@hitachi-chem.co.jp +81-296-20-2471 Keystone Northeast Lee R. Levine Process Solutions Consulting levilr@hughes.net 610-248-2002 Korea Asia Jung-Il Kim Amkor Technology Korea Inc. jikim@amkor.co.kr +8224605110 Metropolitan Northeast Steven P. Lehnert Modular Devices slehnert@imaps.org 631-345-3100 New England Northeast Mark Occhionero Ceramics Process Systems Corp. jazzukes@verizon.net 508-801-7955 Nordic Europe Soeren Noerlyng Micronsult noerlyng@micronsult.dk +4544651457 North Texas Southeast Don R. Schuyler InterFET Corp. drskyler@interfet.com 972-238-1287 Northern California Northwest Anwar A. Mohammed EoPlex Technologies, Inc. anwar@eoplex.com 650-298-6507 Northwest Northwest Steve Annas Natel Engineering, Inc. sannas@natelengr.com 503-260-2002 Phoenix Southwest Donald Ream ASM Pacific don.ream@asmpt.com 602-437-4688 Poland Europe Prof. Jerzy Potencki Romania Europe Dr. Paul Svasta Politechnica University of Bucharest paul.svasta@cetti.ro +40214116674 Russia Asia Sergej N. Valev Mozaik valev_mozaik@kaluga.ru 7 0842 579 823 San Diego Southwest Carl S. Edwards Space Micro Inc. cedwards@spacemicro.com 858-309-7004 Slovenia Europe Prof. Marija Kosec Josef Stefan Institute marija.kosec@ijs.si +38614773828 Taiwan Asia Dr. Shen-Li Fu I-Shou University slfu@isu.edu.tw +88676577001 Tri-Valley Southwest Lawrence Driscoll SCTS, Inc. lmdriscoll@sctsinc.com 818-704-9087 United Kingdom Europe Peter Ongley Electronic Technology Services peter.ongley@ukonline.co.uk + 012-754-63808 Viking North Central Jay Ellingboe HEI, Inc. jay.ellingboe@heii.com 952-443-7011 48 886-1-62782126 jurpot@prz.rzeszow.pl 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 49 MARCH/APRIL 2007 CHAPTER NEWS Metro Chapter Meeting Draws Large Audience On January 24, 2007, METRO IMAPS held a dinner meeting at the Holiday Inn, Ronkonkoma, N.Y. Over 60 people turned out to hear Dr. Dan Baldwin discuss “Flip Chip Technology, What, Why and How.” As always the METRO Chapter attendees followed Dr. Baldwin’s talk with a lively question and answer period. The meeting was preceded by a one hour networking event allowing many old friends to get re-acquainted. Food arrangements, by Deirdre Kenny of Data Device Corporation (DDC), were also excellent, with many positive comments. In addition, Protavic, a supplier of epoxies, had a tabletop display with good interest from attendees. Scott Baldassarre, of Miteq Corporation, organized and managed the registration process seamlessly despite the overflow crowd. Thanks to Bob Conte, of Sensitron Semiconductor, for once again arranging another stimulating technical discussion. The Metro Chapter of IMAPS plans another technical meeting in mid-March and expects similar attendance. Vendors wishing to display at our next meeting are urged to contact the chapter president. For further information on the Metro Chapter including upcoming events, contact Steve Lehnert at slehnert@mdipower.com 49 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 50 A DVA N C I N G MICROELECTRONICS EXHIBITOR PRODUCTS & SERVICES As an added exhibitor benefit, we will run the Products and Services that the 2006 Exhibitors submitted for the Final Program in issues of Advancing Microelectronics until we have completed the list. Your Products and Services will only appear if you submitted them by the deadline last summer. Electronic Packages & Packaging Advanced Cooling Technologies 1046 New Holland Avenue Lancaster, PA 17543 717-295-6088 scott.garner@1-act.com www.1-act.com Aerotech, Inc. 101 Zeta Drive Pittsburgh, PA 15238 412-963-7470 412-963-7459 canderson@aerotech.com www.aerotech.com ALLVIA 657 N. Pastoria Ave. Sunnyvale, CA 94085 408-212-3200 ndodd@trusi.com www.allvia.com ANCeram/IKTS 3578 Hartsel Drive Unit E 356 Colorado Springs, CO 80920 719-264-6111 719 264 6333 jblafon@euro-industries.net www.anceram.de Barry Industries, Inc. 60 Walton Street Attleboro, MA 02703 508-226-3350 sales@barryind.com www.barryind.com Chip Supply, Inc. 7725 North Orange Blossom Trl. Orlando, FL 32810 407-298-7100 thamby@chipsupply.com www.chipsupply.com Crane Aerospace & Electronics PO Box 97005 Redmond, WA 98073-9705 425-882-3100 faina.zaslavsky@craneae.com www.craneae.com/microelec DuPont Microcircuit Materials 14 T W Alexander Drive Research Triangle Park, NC 27709 800-284-3382 Michele.L.Simpkins@ usa.dupont.com MCM.DUPONT.COM Endicott Interconnect Technologies, Inc. 1701 North St. Endicott, NY 13760 866-820-4820 vernon.wells@eitny.com www.endicottinterconnect.com First Level, Inc. 3109 Espresso Way York, PA 17406 717-266-2450 717-266-7410 nhomsy@aol.com www.firstlevelinc.com 50 Gel-Pak/Quik-Pak 31398 Huntwood Ave. Hayward, CA 94544-7818 510-576-2220 darby@gelpak.com Gel-Pak: www.gelpak.com Quik-Pak: www.icproto Minco Technology Labs, Inc. 1805 Rutherford Lane Austin, TX 78754 512-834-2022 512-837-6285 dpotter@mincotech.com www.mincotech.com Graphite Concepts, Inc. 15 Muirhead Avenue PO Box 5464 Trenton, NJ 08638 609-393-8050 graphiteconcepts@aol.com www.graphite-concepts.de Mini-Systems, Inc. Thick & Thin Film Division 20 David Road N. Attleboro, MA 02760 508-695-0203 508-695-6076 dmoody@mini-systemsinc.com www.Mini-SystemsInc.com HCM Z. I. La Rochelle-Perigny PERIGNY, 17185 France +33 5 46 45 12 70 + 33 5 46 45 04 44 alain.lacorne@hcm-france.com www.hcm-france.com Hybond, Inc. 330 State Place Escondido, CA 92029-1364 760-746-7105 760-746-1408 mailus@hybond.com www.hybond.com IC Interconnect 1025 Elkton Drive Colorado Springs, CO 80907 719-533-1030 719-533-1021 hcarey@icinterconnect.com www.icinterconnect.com Interconnect Systems, Inc. 708 Via Alondra Camarillo, CA 93012 805-482-2870 info@isipkg.com www.isipkg.com Kyocera America, Inc. 8611 Balboa Ave. San Diego, CA 92123 800-468-2957 kaicorp@kyocera.com americas.kyocera.com/packaging Life Line Packaging, Inc. 1250 Pierre Way El Cajon, CA 92021 619-444-2737 619-444-8532 info@lifelinepackaging.com www.lifelinepackaging.com Maxtek Components Corporation 2905 SW Hocken Avenue Beaverton, OR 97005-0428 800-462-9835 eric.hodges@maxtek.com www.maxtek.com Micropac Industries, Inc. 905 East Walnut Street PO Box 469017 Garland, TX 75040 972-272-3571 markking@micropac.com www.micropac.com Mitsubishi Materials Corp. 17401 Eastman Street Irvine, CA 92614 949-862-5755 949-862-5184 kreed@mmus.com www.mmc.co.jp/adv/ele/english/ index.html NanoDynamics 901 Furhrmann Blvd. Buffalo, NY 14203 716-853-4900 dmhfritzinger@nanodynamics.com www.nanodynamics.com Natel Engineering Co., Inc. 9340 Owensmouth Ave. Chatsworth, CA 91311-6915 818-734-6500 jima@natelengr.com www.natelengr.com NorCom Systems, Inc. 1055 West Germantown Pike Norristown, PA 19403 610-592-0167 610-631-0934 Sales@norcomsystemsinc.com www.norcomsystemsinc.com NxGen Electronics 9771-C Clairemont Mesa Blvd. San Diego, CA 92124 858-309-6610 kkron@nxgenelect.com www.nxgenelectronics.com Oasis Materials Corporation 12131 Community Road Suite D Poway, CA 92064 858-486-8846 858-486-8844 fpolese@oasismaterials.com www.oasismaterials.com Pac Tech USA 328 Martin Avenue Santa Clara, CA 95050 408-667-8946 teutsch@pactech-usa.com www.pactech-usa.com Paricon Technologies Corp. 421 Currant Road Fall River, MA 02720 508-676-6888 508-676-8111 rweiss@paricon-tech.com www.paricon-tech.com Polese Company 10113 Carroll Canyon Road San Diego, CA 92131 858-271-1993 kamin@polese.com www.polese.com Polysciences, Inc. 400 Valley Road Warrington, PA 18976 215-343-6484 215-343-0214 info@polysciences.com www.polysciences.com Semi Dice, Inc. 10961 Bloomfield St. P.O. Box 3002 Los Alamitos, CA 90720 562-594-4631 dminter@semidice.com www.semidice.com Solid State Equipment Corp. 185 Gilbraltar Road Horsham, PA 19044 215-328-0700 info@ssecusa.com www.ssecusa.com Stellar Microelectronics Inc. 28575 Livingston Ave. Valencia, CA 91355 661-775-3517 alex@stellarmicro.com www.stellarmicro.com Stratedge Corporation 4393 Viewridge Avenue San Diego, CA 92123 866-424-4962 info@stratedge.com www.stratedge.com Teledyne Microelectronic Technologies 12964 Panama Street Los Angeles, CA 90066 310-574-2051 microelectronics@teledyne.com www.teledynemicro.com Thin Film Industries, Inc. 201 Washington Road Building 3, Suite 3-130 Princeton, NJ 08540-6449 609-734-3158 609-734-2634 thin.film.industries@verizon.net http://www.sarnoff.com/thinfilm Umicore AG & Co. Kg Business Line Microbond - EPM Rodenbacher Chaussee 4 Hanau -Wolfgang, 63457 Germany +496181595327 +4961815975327 stefan.merlau@eu.umicore.com www.umicore.de 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 51 MARCH/APRIL 2007 EXHIBITOR Cyber Technologies USA 4200 Powderhorn Circle Minnetonka, MN 55345 952-401-9700 michael.riddle@ cybertechnologies.com www.cybertechnologies.com Haiku Tech, Inc. 1669 NW 79 Ave. Miami, FL 33126 305-463-9304 305-463-8751 sales@haikutech.com www.haikutech.com HI-Rel Laboratories 6116 N. Freya Spokane, WA 99217 509-325-5800 roger@hrlabs.com www.hrlabs.com Innov-X Systems 100 Sylvan Road, Suite 100 Woburn, MA 01801 781-935-5005 ppipitone@innovxsys.com www.innovxsys.com NETZSCH Instruments, Inc. 37 North Ave. Burlington, MA 01803 781-272-5353 781-272-5225 b.fidler@nib.netzsch.us www.e-thermal.com NxGen Electronics 9771-C Clairemont Mesa Blvd. San Diego, CA 92124 858-309-6610 kkron@nxgenelect.com www.nxgenelectronics.com PRODUCTS SEFAR Printing Solutions, Inc. 120 Mount Holly By-Pass PO Box 679 Lumberton, NJ 08048 609-613-5000 609-267-1750 lori.lee@sefar.us www.sefar-screens.com Silicon Cert, Ltd. 4201 Pottsville Rd. Reading, PA 19605 610-939-9500 610-939-1010 lheck@siliconcert.com www.SiliconCert.com Emerson & Cuming 46 Manning Road Billerica, MA 01824 978-436-9700 cheryl.bianco@nstarch.com www.emersoncuming.com Heraeus Thick Film Division 24 Union Hill Road West Conshohocken, PA 19428 610-825-6050 Gail.Strong@Heraeus.com www.thickfilm.net NanoDynamics 901 Furhrmann Blvd. Buffalo, NY 14203 716-853-4900 dmhfritzinger@nanodynamics.com www.nanodynamics.com Epoxy Technology, Inc. 14 Fortune Dr. Billerica, MA 01821-3972 978-667-3805 978-663-9782 jmccabe@epotek.com www.epotek.com Kester 515 East Touhy Avenue Des Plaines, IL 60018-2675 847-297-1600 swood@kester.com www.kester.com Newport Corporation 101 Billerica Ave, Bldg 3 North Billerica, MA 01862-1256 978-667-9449 dan.crowley@newport.com www.newport.com NAMICS Technologies, Inc. 5201 Great America Pkwy. #272 Santa Clara, CA 95054 408-907-8430 408-907-8431 jensen@namics-usa.com www.namics.co.jp NuSil Technology 1050 Cindy Lane Carpinteria, CA 93013 805-566-4111 805-566-9905 vincentm@nusil.com www.nusil.com/tradeshows/imaps2 006.aspx?ref=WS Kyocera America, Inc. 8611 Balboa Ave. San Diego, CA 92123 800-468-2957 kaicorp@kyocera.com americas.kyocera.com/packaging Sonix, Inc. 8700 Morrissette Drive Springfield, VA 22152 703-440-0222 703-440-9512 info@sonix.com www.sonix.com Five Star Technologies, Inc. 21200 Aerospace Parkway Clevland, OH 44142 440-239-7005 szuber@fivestartech.com www.fivestartech.com ANCeram/IKTS 3578 Hartsel Drive Unit E 356 Colorado Springs, CO 80920 719-264-6111 719 264 6333 jblafon@euro-industries.net www.anceram.de HI-Rel Laboratories 6116 N. Freya Spokane, WA 99217 509-325-5800 roger@hrlabs.com www.hrlabs.com Innov-X Systems 100 Sylvan Road, Suite 100 Woburn, MA 01801 781-935-5005 ppipitone@innovxsys.com www.innovxsys.com NxGen Electronics 9771-C Clairemont Mesa Blvd. San Diego, CA 92124 858-309-6610 kkron@nxgenelect.com www.nxgenelectronics.com Silicon Cert, Ltd. 4201 Pottsville Rd. Reading, PA 19605 610-939-9500 610-939-1010 lheck@siliconcert.com www.SiliconCert.com & SERVICES Sonix, Inc. 8700 Morrissette Drive Springfield, VA 22152 703-440-0222 703-440-9512 info@sonix.com www.sonix.com Electronic Microscopy Services, analytical services Sonoscan, Inc. 2149 E. Pratt Boulevard Elk Grove Village, IL 60007-5914 847-437-6400 mbrown@sonoscan.com www.sonoscan.com Xradia, Inc. 5052 Commercial Circle Concord, CA 94520 925-288-1228 bturnquist@xradia.com www.xradia.com Polysciences, Inc. 400 Valley Road Warrington, PA 18976 215-343-6484 215-343-0214 info@polysciences.com www.polysciences.com Epoxies & Adhesives SEFAR Printing Solutions, Inc. 120 Mount Holly By-Pass PO Box 679 Lumberton, NJ 08048 609-613-5000 609-267-1750 lori.lee@sefar.us www.sefar-screens.com Zymet, Inc. 7 Great Meadow Lane E. Hanover, NJ 07936 973-428-5245 info@zymet.com www.zymet.com Xradia, Inc. 5052 Commercial Circle Concord, CA 94520 925-288-1228 bturnquist@xradia.com www.xradia.com Failure Analysis Sonoscan, Inc. 2149 E. Pratt Boulevard Elk Grove Village, IL 60007-5914 847-437-6400 mbrown@sonoscan.com www.sonoscan.com Sypris Test & Measurement, Inc. 6120 Hanging Moss Rd. Orlando, FL 32807 800-775-2550 gary.rohlke@sypris.com www.wetest.com continued page 52 51 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 52 A DVA N C I N G MICROELECTRONICS EXHIBITOR PRODUCTS & SERVICES continued from page 51 Furnace Equipmentmaterials handling AMI/Presco 3087 US Highway 22 P.O. Box 5049 North Branch, NJ 08876 908-722-7100 908-722-5082 sales@ami-presco.com www.ami-presco.com ATV Technology, Inc. 21 Concord Street N. Reading, MA 01864 978-664-1948 978/664-4819 atvtec@att.net www.atv-tech.com Hybrid/SMT Manufacturing circuit boards and flex circuit manufacturing Aerotech, Inc. 101 Zeta Drive Pittsburgh, PA 15238 412-963-7470 412-963-7459 canderson@aerotech.com www.aerotech.com ALLVIA 657 N. Pastoria Ave. Sunnyvale, CA 94085 408-212-3200 ndodd@trusi.com www.allvia.com Alphasem AG Andhausen 64 8572 Berg/TG Switzerland +41716376363 gusek.b@alphasem.com www.alphasem.com Anaren Ceramics, Inc. 27 Northwestern Drive Salem, NH 03079 603-898-2883 603-898-4273 rconnors@Anaren.com www.anaren.com Barry Industries, Inc. 60 Walton Street Attleboro, MA 02703 508-226-3350 sales@barryind.com www.barryind.com BE Semiconductor Industries NV (Datacon) 7 Neshaminy Interplex Suite 116 Trevose, PA 19053 215-245-3050 215-245-3060 alisa.brunett@datacon.at www.besi.com 52 Dakota Consulting 12538 Ridgeton Drive Lakeside, CA 92040 619-328-2924 dakotaconsulting@cox.net www.dakotaconsulting.org Harrop Industries, Inc. 3470 E. 5th Ave. Columbus, OH 43219-1797 614-231-3621 pjtimmel@harropusa.com www.ajcarstencompany.com Graphite Concepts, Inc. 15 Muirhead Avenue PO Box 5464 Trenton, NJ 08638 609-393-8050 graphiteconcepts@aol.com www.graphite-concepts.de SierraTherm Production Furnaces, Inc. 200 Westridge Dr. Watsonville, CA 95076 831-763-0113 jsimpson@sierratherm.com www.sierratherm.com Sikama International, Inc. 118 East Gutierrez Street Santa Barbara, CA 93101-2314 805-962-1000 805-962-6100 sales@sikama.com www.sikama.com SST International 9801 Everest Street Downey, CA 90242 562-803-3361 dmuhs@sstinternational.com www.sstinternational.com Haiku Tech, Inc. 1669 NW 79 Ave. Miami, FL 33126 305-463-9304 305-463-8751 sales@haikutech.com www.haikutech.com Commonwealth Microtechnologies 1004 DuPont Rod Martinsville, VA 24112 276-638-3500 jim.gammon@cwmicrotech.com www.cwmicrotech.com F&K Delvotec, Inc. 27182 Burbank St. Foothill Ranch, CA 92610 949-595-2200 rick.bailey@fkdelvotecusa.com www.fkdelvotecusa.com Crane Aerospace & Electronics PO Box 97005 Redmond, WA 98073-9705 425-882-3100 faina.zaslavsky@craneae.com www.craneae.com/microelec Heraeus Thick Film Division 24 Union Hill Road West Conshohocken, PA 19428 610-825-6050 Gail.Strong@Heraeus.com www.thickfilm.net Datacon (BE Semiconductor Industries NV) 7 Neshaminy Interplex Suite 116 Trevose, PA 19053 215-245-3050 215-245-3060 alisa.brunett@datacon.at www.besi.com Interconnect Systems, Inc. 708 Via Alondra Camarillo, CA 93012 805-482-2870 info@isipkg.com www.isipkg.com DuPont Microcircuit Materials 14 T W Alexander Drive Research Triangle Park, NC 27709 800-284-3382 Michele.L.Simpkins@ usa.dupont.com MCM.DUPONT.COM Dyconex AG. Grindelstrasse 40 CH-8303 Bassersdorf, Switzerland +41 43 266 1100 +41 43 266 1101 zimmermann@dyconex.com www.dyconex.com Endicott Interconnect Technologies, Inc. 1701 North St. Endicott, NY 13760 866-820-4820 vernon.wells@eitny.com www.endicottinterconnect.com Maxtek Components Corporation 2905 SW Hocken Avenue Beaverton, OR 97005-0428 800-462-9835 eric.hodges@maxtek.com www.maxtek.com Micro Hybrid Dimensions, Inc. 2161 E 5th St Tempe, AZ 85281-3035 480-731-3131 ted@micro-hybrid.com www.micro-hybrid.com MicroConnex Corporation 34935 S.E. Douglas St. Snoqualmie, WA 98065 425-396-5707 akuller@microconnex.com www.microconnex.com Natel Engineering Co., Inc. 9340 Owensmouth Ave. Chatsworth, CA 91311-6915 818-734-6500 jima@natelengr.com www.natelengr.com NorCom Systems, Inc. 1055 West Germantown Pike Norristown, PA 19403 610-592-0167 610-631-0934 Sales@norcomsystemsinc.com www.norcomsystemsinc.com NxGen Electronics 9771-C Clairemont Mesa Blvd. San Diego, CA 92124 858-309-6610 kkron@nxgenelect.com www.nxgenelectronics.com Reinhardt Microtech AG Aeulistrasse 10 CH-7323 Wangs, Switzerland +41-81-720-04-56 dkoegi@reinhardt-microtech.ch www.reinhardt-microtech.ch Stellar Microelectronics Inc. 28575 Livingston Ave. Valencia, CA 91355 661-775-3517 alex@stellarmicro.com www.stellarmicro.com Teledyne Microelectronic Technologies 12964 Panama Street Los Angeles, CA 90066 310-574-2051 microelectronics@teledyne.com www.teledynemicro.com Thin Film Industries, Inc. 201 Washington Road Building 3, Suite 3-130 Princeton, NJ 08540-6449 609-734-3158 609-734-2634 thin.film.industries@verizon.net http://www.sarnoff.com/thinfilm 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 53 MARCH/APRIL 2007 EXHIBITOR Aerotech, Inc. 101 Zeta Drive Pittsburgh, PA 15238 412-963-7470 412-963-7459 canderson@aerotech.com www.aerotech.com F&K Delvotec, Inc. 27182 Burbank St. Foothill Ranch, CA 92610 949-595-2200 rick.bailey@fkdelvotecusa.com www.fkdelvotecusa.com PRODUCTS KLA - Tencor Corp. 160 Rio Robles San Jose, CA 95134 408-875-3000 408-875-4144 darryl.molina@kla-tencor.com www.kla-tenor.com ALLVIA 657 N. Pastoria Ave. Sunnyvale, CA 94085 408-212-3200 ndodd@trusi.com www.allvia.com GSI Group Inc. 60 Fordham Road Wilmington, MA 01887 978-661-4300 978-988-8798 zambellal@gsig.com www.gsig.com Cyber Technologies USA 4200 Powderhorn Circle Minnetonka, MN 55345 952-401-9700 michael.riddle@ cybertechnologies.com www.cybertechnologies.com Haiku Tech, Inc. 1669 NW 79 Ave. Miami, FL 33126 305-463-9304 305-463-8751 sales@haikutech.com www.haikutech.com NxGen Electronics 9771-C Clairemont Mesa Blvd. San Diego, CA 92124 858-309-6610 kkron@nxgenelect.com www.nxgenelectronics.com EPP GmbH Lochhamer Schlag 17 Graefelfing, 82166 Germany +49-89-829989-0 +49-89-82998999 hstenger@epp-germany.com www.epp-germany.com I Source Technical Services, Inc. 5 Rancho Circle Lake Forest, CA 92630 949-453-1500 mark@i-source.com www.i-source.com REMEC Defense & Space 9404 Chesapeake Drive San Diego, CA 92123 858-505-3369 Gil.Groves@remecrds.com www.remecrds.com Innov-X Systems 100 Sylvan Road, Suite 100 Woburn, MA 01801 781-935-5005 ppipitone@innovxsys.com www.innovxsys.com Sonix, Inc. 8700 Morrissette Drive Springfield, VA 22152 703-440-0222 703-440-9512 info@sonix.com www.sonix.com GSI Group Inc. 60 Fordham Road Wilmington, MA 01887 978-661-4300 978-988-8798 zambellal@gsig.com www.gsig.com MicroConnex Corporation 34935 S.E. Douglas St. Snoqualmie, WA 98065 425-396-5707 akuller@microconnex.com www.microconnex.com Excelta Corp 60 Easy Street Buellton, CA 93427 805-686-4686 805-686-9005 gjohnson@excelta.com www.excelta.com Accu-Tech Laser Processing, Inc. 1175 Linda Vista Drive San Marcos, CA 92069 760-744-6692 herbduryea@accutechlaser.com www.accutechlaser.com Aerotech, Inc. 101 Zeta Drive Pittsburgh, PA 15238 412-963-7470 412-963-7459 canderson@aerotech.com www.aerotech.com Centerline Technologies 577 Main Street, Suite 270 Hudson, MA 01749 978-568-1330 hugh@centerlinetech-usa.com www.centerlinetech-usa.com Commonwealth Microtechnologies 1004 DuPont Rod Martinsville, VA 24112 276-638-3500 jim.gammon@cwmicrotech.com www.cwmicrotech.com Dakota Consulting 12538 Ridgeton Drive Lakeside, CA 92040 619-328-2924 dakotaconsulting@cox.net www.dakotaconsulting.org I Source Technical Services, Inc. 5 Rancho Circle Lake Forest, CA 92630 949-453-1500 mark@i-source.com www.i-source.com Laser Tech, Inc. 1134 East Pine Street St. Croix Falls, WI 54024-9002 715-483-1636 715-483-5598 sales@laser-tech-inc.com www.laser-tech-inc.com Laserage Technology Corp. 3021 Delany Rd. Waukegan, IL 60087-1826 847-249-5900 847-336-1103 danc@laserage.com www.laserage.com NorCom Systems, Inc. 1055 West Germantown Pike Norristown, PA 19403 610-592-0167 610-631-0934 Sales@norcomsystemsinc.com www.norcomsystemsinc.com Miyachi Unitek Corp. 1820 South Myrtle Avenue Monrovia, CA 91016 626-930-8569 ivonet.gomez@miyachiunitek.com www.miyachiunitek.com Mundt & Associates, Inc. 14682 N. 74th Street #150 Scottsdale, AZ 85260 480-922-9365 mundtinc@mundtinc.com www.mundtinc.com & SERVICES Sonoscan, Inc. 2149 E. Pratt Boulevard Elk Grove Village, IL 60007-5914 847-437-6400 mbrown@sonoscan.com www.sonoscan.com Inspection Equipment and Services Sypris Test & Measurement, Inc. 6120 Hanging Moss Rd. Orlando, FL 32807 800-775-2550 gary.rohlke@sypris.com www.wetest.com Trebor Instrument Corp. 39 Balsam Drive Huntington Station, NY 11746-7724 631-293-8127 631-423-3332 treborinst@hotmail.com treborinst.com Xradia, Inc. 5052 Commercial Circle Concord, CA 94520 925-288-1228 bturnquist@xradia.com www.xradia.com SEFAR Printing Solutions, Inc. 120 Mount Holly By-Pass PO Box 679 Lumberton, NJ 08048 609-613-5000 609-267-1750 lori.lee@sefar.us www.sefar-screens.com Tecnisco Ltd. 2-2-15 Minami-Shinagawa, Shinagawa-ku Tokyo, 140-0004 Japan +81-3-3472-6991 +81-3-3472-1316 j-ikeda@tecnisco.co.jp www.tecnisco.co.jp/ e_html/tec/f_tec.html Lasers-cutting, scribing, trimming, marking, machining, welding & supplies Newport Corporation 101 Billerica Ave, Bldg 3 North Billerica, MA 01862-1256 978-667-9449 dan.crowley@newport.com www.newport.com Reinhardt Microtech AG Aeulistrasse 10 CH-7323 Wangs, Switzerland +41-81-720-04-56 dkoegi@reinhardt-microtech.ch www.reinhardt-microtech.ch 53 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 54 A DVA N C I N G MICROELECTRONICS MEMBERSHIP Welcome New IMAPS Members! November/December 2006 ORGANIZATIONAL Arizona State University Protean Marketing Communications Albin Engineering Services, Inc. NextWavebroadband Precision Process Equipment Inc. World Gold Council ANGEL Krivit, Steven CALIFORNIA ORANGE Bosze, Wayne Vazquez, Sergio CAN-AM Suurmann, Rob CAPITAL Papadakis, Stergios Srinivasan, Rengaswamy CAROLINAS Carroll, Alan Johnson, Beverly Poser, Dale CHINA Luo, Le FLORIDA Tran, John GARDEN STATE Mann, Robert INDIA Jain, Mayank INTERNATIONAL Cozzi, Gerardo ISRAEL Burdman, Edith JAPAN Furusawa, Yoko Wang, Shuqiang KEYSTONE Arizzi, Simone Davis, Robert KOREA Kim, Hyeon Hwan NEW ENGLAND Crawford-Hentz, Maureen Goodrich, Alan Hadjimichael, Evangelos Koenitzer, John Riffelmacher, David NORTHERN CALIFORNIA Cerilli, John Crowell, Jeffrey Gao, Guilian Joshi, Rajeev Lambine, Andre Ochrym, Robert Pitkin, Kevin Rankin, Kevin Yang, Frank Yin, Philip NORTHWEST Fraas, Lewis PHOENIX Clemons, Greg SAN DIEGO McGough, Tricia TAIWAN Chang, Hsiang-hung Chen, Chi-Hon Chen, Kuo-Ming Cheng, Hsien-chie Chiang, Kuo-Ning Chiang, Shin-Ying Chiu, Chien-Chia Chou, Chan-Yen Chou, Tsung-Lin Deng, Hong-An Fang, Jiunn Han, Cheng-Nan Huang, Chao-Jen Huang, Chen-Yu Huang, Wan-Yu Hung, Tuan-Yu Lin, Chia-Te Lin, Jim Peng, Chih-Tang Shen, Chieh Shie, Kun-Yun Shih, Chien-Chung Tsai, Ming-Yi Tseng, Kun-Fu Wei, Hsiu-Ping Wu, Chung-Jung Wu, Yu-Chen Yew, Ming-Chih TRI-VALLEY Chiao, Yi-Hung Li, Stephen UNITED KINGDOM Chivall, James Siddique, Sharjil Varga, Aron UNIVERSITY OF MARYLAND Sinha, Koustav VIKING Weber, Peggy VIRGINIA POLYTECHNIC INSTITUTE Heath, William First Time Membership Renewals... Thank You for Your Support! November/December 2006 We appreciate and know the importance of our members’ continued support of IMAPS and the microelectronics and packaging industries. Our members’ participation has enabled IMAPS to bring leading technical programs, workshops, courses, and symposia into the forefront of the industry and throughout the world. It is this consistent support that has helped IMAPS achieve its position as the world’s largest electronic packaging society. IMAPS member support increases the value of the society to the microelectronics industry and increases the value of the society to you and your fellow IMAPS members. Therefore, we have devoted this section to recognizing those individuals who have renewed their support to IMAPS for the first time, as they join us in advancing and expanding the use of microelectronics through the dissemination of information and the promotion of the values of the technology. ORGANIZATIONAL Chemical Abstracts Service GERMANY Klinger, Roswitha METROPOLITAN Ruscigno, Tony BENELUX Van Hoof, Chris GREAT LAKES Flynn, Paul NEW ENGLAND Hyman, Mark CENTRAL TEXAS Karthik, Thambidurai INDIANA Barnes, John Haffke, Benjamen NORTHERN CALIFORNIA McMaster, Mark GARDEN STATE Papanu, Victor 54 KEYSTONE Giardina, Rich NORTHWEST McCal, Dennis Rastogi, Ravi PHOENIX Abbaraju, Ravikanth Tennant, Tracy TRI-VALLEY Khaldi, Mohamed 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 55 MARCH/APRIL 2007 In Memoriam – Jack Rubin The San Diego Chapter reports with sorrow the passing of long-time member Jack A. Rubin on January 16, 2007. Jack was a great friend and respected colleague to many of us in the technical ceramics industry. Educated as a geochemist, he had been a dedicated leader in ceramics technologies since 1956 when he began working in advanced ceramics production at Atomics International. In 1967, Jack co-founded Ceradyne, Inc. with current Chairman Joel Moskowitz. Since moving to San Diego in 1978 to work as Vice President/Technical Director at Kyocera America, International, Inc., Jack has continued working within the ceramics community at companies such as Interamics, Microelectronic Packaging, Inc. and Polese Company and as a consultant helping many other companies. Jack always welcomed the most difficult technical challenges and brought his mastery of basic science and extensive experience along with a sharp sense of humor to attack these problems in the pursuit of their solutions. We were always fortunate to have Jack on our side and are at a great loss with his passing. 55 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 56 A DVA N C I N G MICROELECTRONICS ADVERTISER HOTLINE IMAPS’ Ad Hotline is provided as a courtesy to our advertisers and readers. Although every attempt is made to ensure accuracy, the information contained herein cannot be guaranteed. ADVERTISER CONTACT TELEPHONE EMAIL WEBSITE PAGE AdTech Ceramics Brian Bukovitz 423-755-5510 bbukovitz@adtechceramics.com www.adtechceramics.com 45 Durst Consulting Thomas Kriso +49-7034-7472-0 sales@durst.com www.durst.com 47 Hesse & Knipps Joe Bubel 403-436-9300 bubel@hesse-knipps.com www.hesse-knipps.com back cover Indium Corp. of America Rick Short 315--381-7554 rshort@indium.com www.indium.com 11, 13, 15 Laser Processing Technology, Inc. Connie L. Callow 503-254-2761 c.callow@laserprocessingtech.com www.laserprocessingtech.com 23 Mini-Systems, Inc. Darryl Moody 508-695-0203 dmoody@mini-systemsinc.com www.mini-systemsinc.com 37 Sikama International, Inc. Al Bonzer 805-962-1000 sales@sikama.com www.sikama.com 49 Torrey Hills Ken Kuang 858-558-6666 kkuang@torreyhillstech.com www.torreyhillstech.com 43 IMAPS ...contact IMAPS Headquarters See staff listing for specific program areas. HEADQUARTERS WHO TO CALL Michael O’Donoghue, Executive Director, (202) 548-8707, modonoghue@imaps.org, Strategic Planning, Contracts and Negotiations, Legal Issues, Policy Development, Intersociety Liaisons, Customer Satisfaction Brian Schieman, Director, Program Development and Technology, (202) 548-8715, bschieman@imaps.org, Development of Society Programs, Website Development, Database Management, Communication Tools and other Technology Ann Bell, Manager, Marketing & Communications, (202) 548-8717, abell@imaps.org, Public Relations, Marketing, Fundraising, Advertising, Exhibits, Advancing Microelectronics Rayma Gollopp, Membership Manager, (202) 548-8711, rgollopp@imaps.org, Member Relations and Services Administration, Dues Processing, Membership Invoicing, Foundation Contributions, Data Entry, Mail Processing, Address Changes, Telephone Support Rick Mohn, Operations Manager, (202) 548-8703, rmohn@imaps.org, Financial Management, Accounts Payable, Accounts Receivable, Human Resources, Employee Benefits, Budget Issues, Business Services, Facilities Management, Publications Sales Jackki Morris-Joyner, Technical Program Manager, (305) 382-8433, jmorris@imaps.org, Technical Program Development and Coordination, ATWs, PDCs, Calls for Papers, Speaker Communications, Proceedings Publication, Event Program Activities Elizabeth Keller, Meetings Coordinator, (202) 548-8716, ekeller@imaps.org 56 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 57 CALENDAR 2007 start end MARCH 3-6-07 3-7-07 3-18-07 3-19-07 APRIL 4-9-07 4-18-07 MAY 3-19-07 3-22-07 4-12-07 4-20-07 OF EVENTS MicroTech 2007 Northamptonshire, UK IMAPS Chapter Conference/Workshop (Europe) see website for details www.imaps.org.uk Global Business Council’s Spring 2007 Conference Scottsdale, Arizona USA IMAPS Global Business Council www.imaps.org/programs/gbc07spring.htm abell@imaps.org 3rd International Conference and Exhibition on Device Packaging Scottsdale, Arizona USA IMAPS Conference imaps@imaps.org www.imaps.org/devicepackaging ATW on Automotive Microelectronics and Packaging Dearborn, MI IMAPS Workshop imaps@imaps.org www.imaps.org/automotive International Conference on Electronics Packaging (ICEP 2007) Tokyo, Japan IMAPS Chapter Conference/Workshop www.jiep.or.jp/icep imaps-j@jiep.or.jp 4-23-07 4-26-07 CICMT 2007 - Ceramic Interconnect and Ceramic Microsystems Technologies Denver, CO USA IMAPS Conference imaps@imaps.org www.cicmt.org 5-1-07 5-1-07 34th Annual New England Symposium & Exhibition Boxborough, MA USA IMAPS Chapter Conference/Workshop www.imapsne.org 5-8-07 5-10-07 Military, Aerospace, Space and Homeland Security (MASH): Packaging Issues and Applications Baltimore, MD IMAPS Workshop imaps@imaps.org www.imaps.org/mash 5-5-07 5-15-07 Garden State Chapter Spring Symposium & Exhibit Murray Hill, NJ IMAPS Chapter Conference/Workshop www.imaps-gs.org kkriskewic@hed.com SoCal07 Anaheim Hills, CA www.sdchapters.org IMAPS Chapter Conference/Workshop william.gaines@ngc.com EMPC 2007 Oulu, Finland www.empc2007.org IMAPS Chapter Conference/Workshop info@imapsnordic.org 31st IMAPS Poland International Conference Krasiczyn, Poland IMAPS Chapter Conference/Workshop www.imaps.org.pl jurpot@prz.rzeszow.pl INTERCONEX 2007 Toulouse, France www.imapsfrance.org imaps.france@imapsfrance.org 5-16-07 JUNE 6-17-07 SEPTEMBER 9-23-07 9-25-07 5-16-07 6-20-07 9-26-07 9-26-07 IMAPS Chapter Conference/Workshop OCTOBER 10-8-07 NOVEMBER 11-11-07 11-15-07 IMAPS 2007 - San Jose San Jose, CA IMAPS International Symposium www.imaps40th.org imaps@imaps.org 11-15-07 11-17-07 ATW on Integrated/Embedded Passives San Jose, CA IMAPS Workshop www.imaps.org/passives 2008 NOVEMBER 11-2-08 10-9-07 11-6-08 IMAPS Germany International Conference Munich, Germany IMAPS Chapter Conference/Workshop (Europe) www.imaps.de imaps@imaps.org IMAPS 2008 - Providence Providence, RI IMAPS International Symposium www.imaps.org martin.oppermann@imaps.de imaps@imaps.org 350351_IMAPS.qxp 2/14/2007 8:46 PM Page 58