International Journal of Micro and Nano Electronics, Circuits and Systems, 3(1), 2011, pp. 55-59 LOW POWER CLASS AB OPERATIONAL TRANSCONDUCTANCE AMPLIFIER FOR CAPACITIVE SENSORS Akhil Babu1 & J.Grace Jency2 Department of ECE, Karunya University, Coimbatore, India (akhilbabu.e@gmail.com1, gracegency@karunya.edu2) Abstract: A low power OTA for a generic interface circuit of capacitive sensor is presented in this paper. This circuit possesses flexibility and reduces the design cost of the interface circuit. The architecture consist sensor readout circuitry followed by capacitance to voltage converter and a signal processor. This switched capacitor interface works on lower clock frequency of 8 KHz destined for the low power consumption. The capacitance to voltage conversion is accomplished using a class AB operational amplifier and correlated double sampling. This technique provides an interface for broad range of capacitive sensors. Keywords: Class AB; operational transconductance amplifier (OTA); low power. 1. INTRODUCTION Interface architectures that developed so far considered interface circuit and sensor as two different entities. These approaches will increases the parasitic elements, interconnection resistance and signal loss. The hybrid chip architecture which integrates a MEMS capacitive sensors and an interfacing circuit is presented in this paper. The paper is targeted for the low power applications relying on battery for its power source. This design will reduce the number of interconnections and make the design more compact, more over capacitive sensor will not draw current from the supply unlike piezo resistive sensors. Interface circuit is following a generic design [1] so it is capable of sensing various quantities that could make any deflections in the diaphragm. This type of sensor finds its application in military, medicine, and in automotive fields. Emerging market urges for low cost, low power and more compact products. Power dissipation is the major area of research for last two decades. The sensor and interfacing being considered as two separate modules in the existing architecture increases the power consumption and parasitic capacitance. Hybrid chip which is described in this paper will address the power dissipation problem. The power consumption will be in the range of micro watts. The hybrid chip reported in this paper is a significant development of a single chip solution for the capacitive sensor with interfacing circuit. Resulting outputs can be directly fed to the micro controllers or micro processor for further processing. Rest of the paper is organized as follows. Firstly we begin with a general discussion of capacitive sensor and its electrical model. This will be followed by architecture and basic operation of class AB OTA. The result has been analyzed in section IV followed by conclusion. 2. CAPACITIVE SENSOR Capacitive sensors have acquired a wide acceptance in the market compared to other sensing techniques. This is because of the certain added advantages that the capacitive sensors posses. The advantages include high sensitivity, good DC response, low temperature sensitivity and low power consumption [2]. The main disadvantages include parasitic elements and sensitivity to Electro Magnetic Interference (EMI). The major problem to be addressed here is the reduction of the parasitic elements with low power consumption. The interface circuit is intended for a differential capacitive sensor which will have the linear relation with change in capacitance to the change in voltage. In this paper for the verification purpose capacitive sensor is replaced by an electrical model [3]. Electrical model is given in the Figure 1. This simple electrical model includes two parasitic capacitances Cpar1 and Cpar2, sensing element Csen and Gpa the shunt conductance in the electrical model [2]. 56 International Journal of Micro and Nano Electronics, Circuits and Systems frequency noises. The new architecture restricts the shunt leakage [6] to minimum while maintaining low power and low frequency. 3.1. Capacitance to Voltage Converter Figure 1: Electrical Model of Capacitive Sensor 3. ARCHITECTURE Interface circuits are the inevitable part of capacitive sensors. The parasitic elements present in the capacitive sensor will be very high compared to the sensed capacitance [4]. Capacitive sensors will also be affected by the low frequency noises present at the terminals. These reasons make the tight design of the front end analog interface part necessary. In this paper we present an architecture developed on the basis of an idea proposed by W. Bracke et al.[5]. The architecture is given in the Figure 2. The capacitive sensor is connected to the front end analog block to reduce the effect of parasitic and remove the low frequency noises. The architecture given in Figure 2 shows sensor as the initial block and then followed by a capacitance to voltage (C-V) converter. This interface is used for the suppression of the effect of parasitic and noises. It is suited for broad range of differential capacitive sensor whose differential capacitance is proportional to differential voltage. To maintain a low power profile switched capacitance interfaces is selected which fires at 8 KHz. This frequency is set as a tradeoff between power consumption and effective removal of parasitic. As frequency is increased the power consumption is increased. While lowering the frequency, effects of parasitic capacitance and low frequency noises will increase. The shunt conductance element replaces the leakage charges in the electrical model of the sensor. All the above dealt issues are compromised by the low power C-V convertor which utilizes a class AB transconductance amplifier along with correlated double sampling technique (CSD). This circuit reduces the effect of the parasitic and low The architecture of C-V is given in the Figure 3. This circuit offers lower power and efficiently reduces the parasitic effects represented by Cpar1 and Cpar2. Switched capacitor cancels the effect of parasitic elements [7]. The clock phases are divided into two, sampling phase Φ1 and signal phase Φ2. Here Vp will become a virtual ground and the charge stored in the sensor capacitance C sen is transferred into feedback capacitance Cf. In ideal charge transfer case the output is given by the Vref(Csen/Cf). Practically charge transfer will be imperfect owing to the charge leakage through parasitic shunt conductance. Reasons for leakage are response time of the operational transconductance amplifier (OTA), DC offset and finally the finite gain of the OTA. The architecture given in the Figure 3 need single reference voltage and measurement cycle to determine the value of Csen. It uses the correlated double sampling to purge the offset voltage of the sensor interface. During sample phase the capacitor Csam samples the offset voltage and in the successive phase the stored value is subtracted from the contemporary value. The C-V converter uses class AB OTA shown in Figure 4. The class AB operation will make the circuit more efficient to reduce the leakages. As the phase transition occurs, tail current of the OTA will be boosted and fastens the charge transfer from the sense capacitor C sen . Quiescent low level tail current will be restored as the Vp reaches the virtual ground. To get an insight about the OTA it is necessary to know that the circuit is based on the principle of self-biased transistors combined in a common source configuration. The circuit resembles to symmetrical OTA except at the input stage and tail current. Main modification of the present design is that it uses a negative feedback mechanism. This makes sure that the common source voltage of T1 and T2 is always forced to track the smaller of the two voltages Va and Vb. When Vin+ is larger than Vinvoltage Vb is larger than Va which is coupled to the internal feedback op-amp. The common source voltage in this case is determined only by Vin-, the device size of Ta and the constant bias current Ib. Low Power Class AB Operational Transconductance Amplifier for Capactivie Sensors… 57 tracking. The stability of the feedback is retained by the compensation capacitor formed by the gatesource miller capacitance. As dimension of the input device increases, capacitance formed at gate source increases proportionally. Device size also increases current consumption and fast tracking response. So an optimal class AB OTA is desired for our particular low power interface. In low power interface the power consumption can be reduced by reducing the clock frequency. Reduction in the frequency is limited by the accuracy. Low frequencies makes CSD less effective in reducing 1/f noise, degrades the system noise performance added by the OTA and increases the effect of electrostatic forces on the accelerometers [8-9]. So as an optimal value clock frequency is selected as 8 kHz. Figure 2: Architecture of Capacitive Sensor Interface [5] Figure 3: Correlated Double Sampling Scheme for C-V Converter The current boosting for input transistors operated in weak inversion for small input voltage range “Vin=Vin+-Vin- is given by IM1 ∆V = exp ( in ) IM2 nUT (1) Where n is the weak inversion slope factor and UT= (kT/q) is the thermal voltage. As the input voltage increases to high values the input transistors leaves the weak inversion mode. Input transistors with larger (W/L) ratio improve the current boosting. When differential input voltage increases the transistors will leave weak inversion and follows the square law. The current through T1 is given by IT 1 = 1 2 W * Kn (Vin + – Vin − + ∆V ) 2 L T 1 Figure 4: Class AB OTA 4. SIMULATION RESULTS Class AB op-amp shown in Figure 4 was modeled using 0.18µm N-well CMOS technology. Op-amp biased with a voltage of 1.8V.The measured offset is found to be -3mV for a DC input voltage of 0V. The OTA is designed to have a gain around 40 dB, and obtained figure is given in Figure 6. (2) Where DV = 2 I b / K n ( W / L )a (3) Internal feedback op-amps, op1 and op2, is given in the Figure 5. Simple five transistor OTAs are used as the op-amps to maintain low power and fast Figure 5: Schematic of Negative Feedback op-amp Used in OTA 58 International Journal of Micro and Nano Electronics, Circuits and Systems The offset of OTA is related to the gain and given as Vin/A0, where A0 is called the DC gain of the OTA and in this case it is 42dB with non cascoded output stage. As the OTA is made to work in the weak inversion mode the current boosting will increase and power dissipation of the circuit will reduce. The Figure 6 shows the closed loop gain and bandwidth of the circuit. The gain as given before it is measured as 42dB and the gain bandwidth is found to be 423Khz. The phase margin is found to be 71º for a load of 10pf. Here the dominant pole is given by the load capacitance. As we go on increasing the load capacitance the plot will start to dropdown at still lower frequency. The output stage got a significant effect in gain and phase plot. Similarly if we lowers the load then the band width can be improved. In the case of the OTA the secondary poles are determined by the aspect ratio of the transistors T3 and T4. The effect of miller capacitance formed between the gate and the source of the input transistors, will assist the OTA to linger in stable operating condition. This capacitance will act as compensation capacitance. If the output stage is cascoded the gain will be many times higher. The performance of the class AB OTA is shown in the Table 1. Figure 7 shows the relationship between Va, Vb and Vs. To maintain the negative feedback intact the Vs will follow Va or Vb whichever is smaller. Vs is connected to the non inverting terminal and Va and Vb to inverting terminal causing the output of the feedback op-amp to pull its output voltage nearer to negative supply rails when either of Va or Vb is higher than V s. This operation explained above guarantee the negative feedback in the circuit. The Figure 8 shows the output swing of the circuit. Similarly the current boosting of the circuit is found to be 85 times the quiescent current. Output can have a maximum swing of 2Vdd-2Vov if the supply Table 1 Performance of Class Ab Ota Technology Supply voltage DC gain Unity gain frequency Phase margin Random offset Current boosting (∆Vin=.4V) Power dissipation 1.8V 42 dB 423 Khz 71º -3mV 85 281µW ranges from 1.8V to -1.8V.The output obtained from the switched capacitor configuration is given in Figure 9. The capacitor Csam samples the offset at the output leads and cancels that from the present Figure 7: Tracking of Vs over Va and Vb. Figure 8: Output Voltage Swing of OTA Figure 6: Closed Loop Response of Class AB OTA 0.18µm Figure 9: Output of Switched Capacitor Interface Low Power Class AB Operational Transconductance Amplifier for Capactivie Sensors… value. This switched capacitance architecture is used to flush out the low frequency noises and the effects of parasitic capacitance. Effects of the parasitic capacitance will be negligible in switched capacitor architectures. Output will be ideally given by Vref(Csen/Cf). 5. CONCLUSION A low power class AB OTA used for the interface of the capacitive sensors is presented in the paper. The architecture given in the paper cancels the noise and parasitic effects well above the requirement for moderate level of accuracy (10bit). The class AB OTA presented here is designed with 0.18µm technology and current boosting up to 100 fold is possible. The circuit uses a negative feedback to maintain current boosting and low power profile. The sensor interface works on 8 KHz frequency and correlated double sampling operation removes the effects of parasitic conductance. ACKNOWLEDGEMENT The authors would like to express their sincere gratitude to Dr. A. Ravi Shankar for his dynamic guidance and support in the preparation of manuscript. The authors would like to extend their gratitude to Mr. Manikandan for his suggestions in development of the paper. REFERENCES [1] Mason, N. Yazdi, A.V. Chavan, K. Najafi, K.D. Wise, “A Generic Multielement Microsystem for 59 Portable Wireless Applications,” Proceedings of the IEEE 86, Vol. 8, pp. 1733–1746, 1998 . [2] R. Puers, “Capacitive Sensors: When and How to Use Them,” Sens. Actuators A, Vol. 37, pp. 93–105, 1993. [3] X. Li, G.C. Meijer, “An Accurate Interface for Capacitive Sensors,” IEEE Trans. Instrum. Meas., 51 Vol. 5, pp. 935–939, 2002. [4] R. Puers, E. Peeters, A. Van Den Bossche, W. 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