G RUNDT ECHNICALS OLUTIONS
Atlas Transmission Line Pulse Generator
Atlas Pulser
TLP PULSES with Current and
Voltage Measurements
for repeatable, accurate, comprehensive
device testing
Atlas provides TLP pulses that
support the testing of IC devices by
applying 100 nanosecond rectangular
pulses of increasing amplitude to
devices per the Electrostatic
Discharge Association’s Standard
Test Method ANSI/ESD 5.5.1.
As a member the GTS Olympus family
of pulsers, both the current through
the DUT and the voltage across the
DUT are measured during each pulse.
All waveforms are recorded and a
pulsed I-V curve is produced.
A 50 Ω pulse output and controlled
impedance path provides repeatable
pulse delivery and minimizes pulse
reflections.
Atlas TLP is used to determine a test
structure’s or device’s response to
ESD stress. Optionally, pulse rise
time is software switchable from 1 to
10 ns.
Atlas makes device characterization
easy for packaged ICs and wafer
testing.
Atlas Advantages
 High accuracy 100 nanosecond TLP testing
Pulses without overshoot or ringing
 Pulsed Current and Voltage measurements
Current measurement with either inductive or resistive
probes
Voltage measurement with a probe voltage pickoff
 Member of the GTS Olympus family of products
Flexible multi-waveform testing supported
Easy to use Graphical Interface software
Maestro control and analysis software
Compact desktop system
 Flexible wafer probes
Connections to device under test with fixture boards
and/or wafer probes
 Atlas/Olympus system provides
Intelligent oscilloscope setting optimization with
algorithms for noise reduction
Control of voltage stepping and pulse timing
Microprocessor based high voltage supply
Waveform recording and display
The New Standard
In TLP Testing
G R U N D T E C H N I C AL S O L U T I O N S
+1-408-216-8364
sales@grundtech.com
© 2013 Grund Technical Solutions, LLC All rights reserved
Specifications & Prices subject to change
Network capable for data transfer
Optional automation with probe station and/or flying
probes
Measure DC leakage and/or DC Curve Tracing with a
high resolution Source-Meter Unit to detect device
damage
 Performance backed by the GTS Team with a
combined TLP design experience of over 25 years
Atlas/Olympus TLP Test System
A D D I T I O N A L T E C H N I C A L D E TA I L S
Transmission Line Pulse testing is commonly used for semiconductor characterization of Electrostatic
Discharge (ESD) protection structures. Transmission Line Pulse testing can provide details of device
operation at very short time frames and high current levels that can’t be done with DC curve tracing.
TLP is very useful in measuring and comparing the parameters different ESD protection schemes and
investigating HBM failures in products. Pulses are applied to pairs of DUT pins while DUT currents and
voltages are measured. Under test program control successively higher stress levels of currents are
generated and waveforms collected to provide current vs. voltage (I-V) curves that describe the response
of IC devices or ESD protection structures to simulated ESD stresses.
The GTS Atlas/Olympus TLP System has been carefully designed to generate rectangular stress pulses
which can be applied to ICs in a consistent and reproducible manner. Measurement of the DUT voltage
and current during the pulse is made and waveforms as a function of time is displayed. TLP options
support special testing needs, including multiple TLP impedances, multiple pulse widths, and multiple
pulse rise times, all under Maestro software control. Optional Kelvin voltage measurements provide
exceptional DUT voltage measurements.
As a member of the Olympus family of pulsers, the Atlas pulser can be combined with other pulse
generators. TLP pulses can be intermixed with other types of stress pulses, such as Human Body Model
(HBM), Machine Model (MM) or Human Metal Model (HMM). The Transmission Line Pulse test is unique
because of its high accuracy of the measurement of the DUT response over the range from milliamperes
to many amperes to trace the device characteristics showing the turn-on or snap-back, low current
holding, and high current breakdown characteristics of the ESD protection structure.
Atlas meets the requirement of the ESD Association ANSI/ESD STM5.5.1-2008 Electrostatic Discharge
Sensitivity Testing – Transmission Line Pulse (TLP) – Component Level.
SPECIFICATIONS
Pulse Rise Time
Pulse Width
Impedance
Maximum Current
Maximum Voltage
Pulse Voltage Range
Power and Control
Size
Typically 2 ns 10 to 90% rise standard, other rise times available
100 ns ± 1 ns, other widths optionally available
50 ohm delivery standard, other impedances optionally available
20 amperes into a short circuit, 10 amperes into a 50 Ω load
1000 volts into an open circuit
0.5 to 10 volts in 0.1 V steps into an open circuit;
to 100 V in 0.5 V steps; 1 V steps above 100 V
Provided from GTS Olympus (required)
10” W x 4½” H x 18” D
OPTIONS
Olympus Controller Required
Device Failure Detection
Wafer Test Kit
High Impedance
Kelvin
Pulse Rise Time
Pulse Width
PC with GTS Windows®-based Maestro Software and HV supply
Keithley 2400/2600 series SourceMeter® Leakage Measurement
Probes and Cables for Micropositioners
100 Ω and 500 Ω operation, for low reflections and low currents
Kelvin probes replacing the standard quasi-Kelvin probes
Both 2 and 10 ns, program selectable
Other widths available, manual or automated changes
Evaluate ESD Protection Structures
precise, flexible parameter testing solution
 High current device testing
 High impedance TLP for
high voltage ICs
 Wafer and Packaged parts testing
 Compatible with other stress
waveforms
 Exceeds requirements of ESDA TLP
Standard Test Method
+1-408-216-8364
sales@grundtech.com
© 2013 Grund Technical Solutions, LLC All rights reserved. Specifications & Prices subject to change