57Bi-42Sn-1Ag: A Lead Free, Low Temperature Solder for the Electronic Industry Ernesto Ferrer and Helen Holder Hewlett-Packard Company Aguadilla, PR and Palo Alto, CA Abstract The ternary alloy 57Bi-42Sn-1Ag is a general-purpose solder with mechanical properties that are comparable to 63Sn-37Pb. This alloy is appropriate for many electronics applications and is particularly useful when components cannot tolerate Sn-Pb or high temperature, lead free reflow processes. An SMT process was developed for volume manufacturing using this material, and this article describes design guidelines, materials, and processes for no-clean, air-reflow assembly. This process was developed for BGAs, CSPs, TSOPs, QFPs, passives, connectors, and two thicknesses of FR-4 (0.062” and 0.016”), but it can easily be extended to many other technologies because the majority of industry guidelines apply when using this material. Exceptions, additions, and modifications to existing documents and processes are described here. 57Bi-42Sn-1Ag is a lead free solder and should not be used when lead (Pb) is present in board or component finishes. Background HP began developing Bi-Sn alloys in the early 1990s in response to legislation proposed in the U.S. Congress to ban lead (Pb) from a variety of uses, including electronic soldering. From a technical perspective, lower melting point solders in reflow were considered as an alternative to wave soldering temperature sensitive components. 57Bi-42Sn-1Ag and eutectic 58Bi-42Sn have been studied extensively as an alternative to 63Sn-37Pb or Sn-Ag-Cu solders in SMT and wave solder within HP and at other companies and outside groups, including Fujitsu, Panasonic, NEC, Matsushita, and Motorola, AT&T, Honeywell, Motorola, IBM, and UC Berkeley.1-50 57Bi-42Sn-1Ag is a very promising system for low temperature or hierarchical soldering because it has: • A lower melting temperature than 63Sn-37Pb, • High enough melting temperature for most applications, • Similar mechanical properties to 63Sn-37Pb in many cases, and • Contains no lead. Despite the fact that 57Bi-42Sn-1Ag was researched as a mainstream replacement for 63Sn-37Pb, high temperature Sn-Ag-Cu alloys dominate lead free development in the electronics industry. 57Bi-42Sn1Ag is not prohibitively expensive nor does it provide significant cost savings on its own, however, when used to enable a technology or component choice, it can be the most economical solution. HP has encountered many temperature sensitive components requiring lower temperature processing, including the application for which this manufacturing process was developed. In this case, a product required components with a maximum temperature of 180°C. A project was started with these goals: • Develop a lead free process that the part could survive, with • Minimal capital investment for process implementation, where • Current manufacturing equipment could be used 57Bi-42Sn-1Ag had previously been studied and tested in small scale manufacturing, but had not been developed for volume SMT manufacturing. This paper describes the results of the process development project. Review of 57Bi-42Sn-1Ag Properties Although this paper focuses on the manufacturing process, a brief overview of 57Bi-42Sn-1Ag may be helpful for those considering implementation. The material properties and reliability of Bi-Sn solders have been investigated for many years and have been written about extensively elsewhere, as noted above. It is beyond the scope of this paper to thoroughly review all work on 57Bi-42Sn-1Ag. For more information, consult the reference section at the end. Results of shear strength, creep resistance, fatigue resistance, and other mechanical testing show 57Bi42Sn-1Ag has properties approaching or surpassing 63Sn-37Pb under most conditions, including reasonable strength up to 90C, despite its low melting point, and is considered acceptable for most applications where 63Sn-37Pb is adequate. Shear strength: Shear tests on bulk tensile specimens show 57Bi-42Sn-1Ag has higher shear strength than 63Sn-37Pb at 20C, is comparable at 65C, and shows more degradation than 63Sn-37Pb at 110C, but is still comparable.51 58Bi-42Sn with small additions of Au or Ag has a higher strength than 63Sn-37Pb and about the same shear ductility.22 The bulk strength of 57Bi-42Sn-1Ag is sufficient for most product environments where 63Sn-37Pb performs acceptably. Creep: Creep is a critical factor in joint failure because it is the main deformation mechanism in solders. 58Bi-42Sn creep resistance exceeds 63Sn37Pb in the range 20-65C.5-7,30,40,44 We do not have separate creep data for 57Bi-42Sn-1Ag. Thermal fatigue: 57Bi-42Sn-1Ag thermal fatigue is comparable or superior to 63Sn-37Pb, even in 0100C cycles.2,34 A standard 0-100C cycle will only produce valid results for 57Bi-42Sn-1Ag with no lead present. Lead contamination: 57Bi-42Sn-1Ag joints on leadcontaining surfaces will form the ternary eutectic 52Bi-30Pb-18Sn. Even small amounts of this phase will become molten at or above 96°C and promote highly accelerated grain growth, destroying the mechanical integrity of the solder joint.20,21 The low melting point failure mode is limited to cases where the temperature exceeds the melting point of the ternary eutectic (96°C). Thermal cycling to 75°C had little effect on microstructural coarsening both with and without lead.2 Isothermal fatigue: Glazer,46 Mei,51 and Hua2 report a shorter isothermal fatigue life for 58Bi-42Sn at large strains (10-20%), but comparable life at low strains. Guo52 observed a sharp break in CoffinManson for 58Bi-42Sn, where it became much more sensitive to strain rates over 4 x 10-2. We do not have separate isothermal fatigue data for 57Bi-42Sn-1Ag. Isothermal fatigue data is often used as the input to life predictions, however, since there is a large difference between isothermal results at high strains and measured thermal cycling results for 57Bi-42Sn1Ag, the implication is that highly accelerated tests may have limited predictive value. If 57Bi-42Sn1Ag assemblies are tested in highly accelerated conditions, the acceleration model for this material should be developed in order to make life predictions based on the failure data. Shock and vibration: Board level shock and vibration tests have been conducted on large and small assemblies, and product level testing has been done on small assemblies. 57Bi-42Sn-1Ag showed similar performance to 63Sn-37Pb in shock and vibration followed by dye and pry at up to 1500g, and also during scans from 100-2000Hz and 5 minutes at resonant frequency.53 No-clean, air-reflow SMT process development 57Bi-42Sn-1Ag manufacturing is very similar to 63Sn-37Pb. The same equipment is used, and in most cases, identical processes. This section describes the unique design, materials, and process requirements for volume, no-clean, air-reflow 57Bi42Sn-1Ag SMT manufacturing. Design Existing 63Sn-37Pb design rules can be used for 57Bi-42Sn-1Ag manufacturing with few exceptions. This section describes two design areas where there are differences: BGAs and backside components. BGAs: The recommended ball metallurgy for area arrays is 57Bi-42Sn-1Ag, but 58Bi-42Sn or Sn-AgCu balls may be used. The use of non-melting, highSn BGA balls reduces the performance of the joints by degrading the near-eutectic microstructure.34 The use of 58Bi-42Sn or 57Bi-42Sn-1Ag balls improves joint microstructure and mechanical properties and should be used whenever possible. • Collapsible balls: When 57Bi-42Sn-1Ag or 58Bi42Sn balls are used, they will collapse during reflow. Current 63Sn-37Pb pad/stencil designs should be used. • Non-collapsible balls: High temperature balls will not collapse during reflow. Bend tests on 57Bi-42Sn-1Ag assemblies revealed that correct solder paste volumes for BGAs with non-melting balls are critical to achieving performance comparable to 63Sn-37Pb. Stencil apertures should be adjusted to print additional solder paste in order to achieve acceptable joint geometries. Aperture designs must print 9000-9500 mil3 of solder paste for 1.27mm pitch BGAs in order for joints to be fully convex, but volumes of 40006000 mil3 can still result in BGAs performing comparably to 63Sn-37Pb.54,55 Design rules must be determined for other area arrays. Backside components: The allowable weight for backside components in double-sided reflow is a function of surface tension. Since the surface tension of 57Bi-42Sn-1Ag is less than 63Sn-37Pb, the allowable weight of backside components will be lower. TSOP-40, 0603, and 0805 components have been successfully soldered on the backside, but design rules for other components need to be determined. Materials This section describes changes to materials for 57Bi42Sn-1Ag manufacturing. Solder Paste: The key to making 57Bi-42Sn-1Ag feasible for production is having a flux vehicle that activates at lower temperatures and meets the requirements for standard surface mount processes. Most commercially available fluxes have been formulated for 63Sn-37Pb and can activate at temperatures as high as 150°C. This activation temperature is above the melting point of 57Bi-42Sn1Ag and therefore most existing 63Sn-37Pb flux vehicles cannot be used. HP has worked with solder vendors for many years to develop flux vehicles for 58Bi-42Sn and other low temperature alloys.56-59 Several pastes are now commercially available and perform similarly to existing 63Sn-37Pb pastes. 57Bi-42Sn-1Ag solder pastes should be held to the same printing and performance standards as any paste material. Although the qualification process for these materials is the same as any new paste, there are a few areas that deserve mention: • No-clean and water-clean: Most of the process development on this material was done for noclean surface mount, however, Bi-Sn powders have successfully been used in water-clean formulations. The use of water-clean flux vehicles may produce better wetting. If waterclean formulations are used, ensure that the temperature of the wash and dry processes remain below 85°C. • Misprint and stencil cleaning: Cleaning experiments showed good performance when cleaning stencils with the current machine configuration and chemistry, however, poor results were observed when cleaning misprinted boards as residues were visible after cleaning. Additional cleaning time, modification of machine parameters, or increased saponifier concentration may be necessary to improve cleaning results for misprinted boards with current chemistries. • Solder impurities: Small amounts of incidental exposure to lead or lead impurities in the paste should not cause concern. Contamination studies found that lead content of <0.3%wt does not significantly degrade the mechanical properties of 57Bi-42Sn-1Ag even when aged at 100°C. The maximum allowable lead impurity level should be 0.1%wt.60 • Metal load: 57Bi-42Sn-1Ag pastes may have a higher mass percent of flux vehicle than 63Sn37Pb pastes in order to minimize oxidation of bismuth (Bi). This modification may improve shelf life, printing, tack, solder balling, and wetting. The metal loading percent may be lower than existing 63Sn-37Pb pastes and can range from 89.0%wt to 90.5%wt, depending on the vendor, and should be optimized in production. • Viscosity: 57Bi-42Sn-1Ag powder may be more sensitive to variations in chemistry and exposure than 63Sn-37Pb powder, and may exhibit changes in viscosity over time. Viscosity should be carefully monitored and controlled. • Storage: 57Bi-42Sn-1Ag pastes have a shorter shelf life than 63Sn-37Pb pastes due to the oxidation of bismuth (Bi). Strictly follow the vendor recommendations. PCBs: Any laminate material can be used in this process because of the low temperatures, and OSP is the recommended finish. • Laminates: The product boards and test vehicles used for this work were 0.016” and 0.062” thick FR-4. It is also possible to use alternative laminates, such as FR-1, FR-2, CEM-1, or CEM-3.61 57Bi-42Sn-1Ag process temperatures are well within the range tolerated by these grades of materials.62 FR-1 and CEM-3 boards were exposed to an aggressive reflow profile of 90 seconds preheat at 130°C and 75 seconds over reflow to a peak temperature of 185°C. Although there was slight discoloration, the warpage of the boards was 0.5%, which meets IPC-A-610 standards.63 • Organic solderability protection (OSP): OSP consistently shows the best mechanical and process results, except in peel tests, and should be used whenever possible.36 Peel tests have shown that 57Bi-42Sn-1Ag on OSP over copper (Cu) has approximately 50% of the absolute strength of 63Sn-37Pb on a similar surface, however, no related failure mechanisms, such as delamination or interfacial failures in thermal cycling or shock and vibration, have been observed.64 • Other lead free surface finishes: Immersion Ag, electrolytic Ni-immersion Au, and immersion Sn all produce acceptable wetting when used as a PCB metallization. Thick coatings of Ag or Au should be avoided to minimize changes to solder joint metallurgy because excess Ag (>3%wt) or Au (>3µin) may reduce reliability.55,65 Components: The compatibility of low temperature materials and temperature sensitive components with this process is an obvious advantage. Component metallization recommendations and other notes are listed below: • 57Bi-42Sn-1Ag and 58Bi-42Sn are the preferred finishes. These finishes provide good wetting and are most compatible with the solder joint metallurgy. • As with PCB metallizations, immersion Ag, electrolytic Ni-immersion Au, and immersion Sn provide acceptable wetting. Thick coatings of Ag or Au should be avoided. • The process temperatures for 57Bi-42Sn-1Ag are lower than the ideal soldering temperature for NiPd and Ni-Pd-Au, but these finishes can still produce acceptable wetting.66,67 • The interfacial adhesion strength of 63Sn-37Pb and 57Bi-42Sn-1Ag are both lower for Alloy 42 surfaces than Cu, however the silver (Ag) makes 57Bi-42Sn-1Ag solder comparable to 63Sn37Pb.2,68 • If Sn-Ag-Cu or other high temperature balls are used on area arrays such as BGAs, coplanarity is critical. The JEDEC specification for PBGA coplanarity in MS-034B is 0.2 mm, but that may be too large for the non-collapsing case. It may be necessary to enforce a tighter coplanarity requirement. Process Many 63Sn-37Pb processes can be transferred directly to 57Bi-42Sn-1Ag manufacturing, but there are areas which deserve some attention: Printing: 57Bi-42Sn1-Ag solder pastes should be held to the same printing and performance standards as any paste material. The print process for 57Bi42Sn1-Ag is identical to 63Sn-37Pb. Paste rework and PCA bake out: If a partial assembly (components already soldered on one side of the PCB) requires paste rework, the board can be washed and dried in an oven. Current baking guidelines for electronic assemblies recommend 12 hours at 125°C. These baking conditions are too harsh for 57Bi-42Sn-1Ag joints. Baking conditions should not expose the solder joints to temperatures above 90°C. The bake out time needs to be validated for each product, but normally should be 12-15 hours. Component placement: Alignment of the pad, solder paste deposit, and component lead are important for 57Bi-42Sn-Ag. Less component self-alignment occurs during soldering because of the lower surface tension of the molten metal. It is recommended that the placement tolerance be maintained such that FP/XFP parts meet IPC-A-610, Class 3 requirements of < 25% off of the pad. Most modern equipment easily meets this requirement. Also, designers should adhere to alignment best practices, such as matching land pattern, component and stencil aperture centerlines, and placing fine-pitch components as close to the center of the board as possible. Reflow: It is critical to follow vendor guidelines to achieve proper flux activation. Additional reflow profile development may be necessary and here are some guidelines: • Preheat: Excess heating prior to reflow promotes oxidation, solvent drying, and activator breakdown, which can result in solder balls and wetting problems. 57Bi-42Sn-1Ag requires modest temperatures to achieve good wetting, and wicking can be a symptom of unnecessarily aggressive thermal profiles. Tests on currently available fluxes have shown good performance when the preheat time was set to 60 seconds and the preheat temperature was between 120°C and 130°C. Increasing the preheat time has not shown any improvements in wetting, and potentially increases wicking and voiding. • Peak temperature and time over reflow: Peak temperatures should be 20-30°C above the melting point of the solder. The liquidus temperature of 57Bi-42Sn-1Ag is 139°C. Tests with several flux vehicles have shown acceptable solder joints with peak temperatures between 160°C and 190°C. The recommendation is to use a peak temperature of 170°C and time over reflow of no more than 60 seconds, unless the vendor recommends different parameters. These parameters can result in dramatically higher throughput due to the increased conveyor speed. • Cooling: Faster cooling rates improve the microstructure and solder joint appearance. Do not exceed the thermal shock limit of 3°C/second. • Nitrogen: This process was developed for reflow in air. A nitrogen atmosphere produced slightly better wetting, but not enough to justify a nitrogen requirement.58 • Conveyor vibration and backside components: Vibration should be controlled to ensure that bottom side components do not fall off while solder joints are at or above liquidus. Properly maintained chain edge conveyors minimize vibration, and the use of reflow carriers may reduce the transmission of vibration to assemblies while molten. Inspection: IPC-A-610 acceptability requirements apply to 57Bi-42Sn-1Ag. Wetting angle should be the primary indication of acceptability of 57Bi-42Sn1Ag solder joints. Concave fillets should be used as evidence of acceptable wetting. Non-wetted joints, as shown by convex fillets or wetting angles greater than 90 degrees, are defective. The surfaces of 57Bi42Sn-1Ag joints often have a dull or even grainy appearance, but this appearance is merely cosmetic and has no bearing on reliability.63 Other lead free alloys require inspector retraining regarding joint acceptability as well, so correct inspection should be possible with 57Bi-42Sn-1Ag. The figures below show the difference in appearance between acceptable 63Sn-37Pb joints and 57Bi-42Sn-1Ag joints. temperature flux (cored wire is not currently available). Profiles should be the same as the original reflow profile. Component placement in rework is as critical as the initial placement. Test results show faster component removal and better temperature control on adjacent components with 57Sn-42Bi-1Ag than with 63Sn-37Pb and another low temperature alloy (43Sn-43Pb-14Bi). Also, lower power-rated tools could be used. Conclusion Volume no-clean manufacturing with 57Bi-42Sn1Ag is not only feasible, but produces good yields, increased throughput, and may be less expensive than high temperature lead free processes because existing equipment can be used. The majority of 63Sn-37Pb processes can be transferred directly to 57Bi-42Sn-1Ag manufacturing with only minor modifications. Current industry standards apply to 57Bi-42Sn-1Ag, including most design rules and acceptability criteria. Figure 1: Acceptable 57Bi-42Sn-1Ag joints (top) and 63Sn-37Pb joints (bottom) X-ray inspection: X-ray equipment, such as the Agilent 5DX, will show almost identical results with 57Bi-42Sn-1Ag as with 63Sn-37Pb because the two alloys have similar densities and other physical properties.69 Depanelization: Test board images were separated using a router. Keep-out distances of 0.040” and 0.065” were used on a 0.016” thick board. No fractures or joint failures due to the routing process were found. However, the effects of depanelization on 57Bi-42Sn-1Ag solder joints have not been studied in detail. 57Bi-42Sn-1Ag may be more susceptible to damage during depanelization than 63Sn-37Pb because of the strain rate sensitivity. Use conservative keep-outs, adequate fixturing and board support, and single images when possible. Special or critical components should be tested for depanelization effects prior to product release. 57Bi-42Sn-1Ag requires a completely lead free bill of materials, and is best suited for use with temperature sensitive components and PCB materials. It can be used in applications that do not require more reliability than 63Sn-37Pb. Several solder pastes are now commercially available and processes can be implemented immediately. Acknowledgements This work would not have been possible without the expertise, hard work, and support of many people inside HP, including: Geary Chew, Anaida Classen, Enid Davila, Judy Glazer, Jerry Gleason, Kristen Gratalo, Greg Henshall, Bill Leong, Al Saxberg, Valeska Schroeder, and Kris Troxel. We also greatly appreciate contributions from Agilent (Randy White), Kester Solder (Maureen Brown, Brian Deram, Dave Torp, Greg Hayes, Senju Metal Industry Co., Ltd. (Jeff Gaul, Richard Wulfert, Tetsuo Okuno), Indium Corporation of America (Patrick Ryan, Bill McCartny, N.-C. Lee), Amkor Technology (Craig Colpo), Texas Instruments (Don Abbott), Agere Systems (Kelly Mennell), Micron Technology (Jeff Reeder), JST (Dave Huggins), and Molex (Radames Negron). References [1] In-circuit test: Lower reflow temperature for 57Bi42Sn-1Ag eliminate the high temperature heat cycles that often cause harder, more brittle residues. Probe selection and fixture design must be validated to ensure residues do not create false readings. [2] Rework: Rework should be performed with 57Bi42Sn-1Ag paste or wire with an appropriate low [3] Liu, P. L. and Shang, J. K., Interfacial embrittlement by bismuth segregation in copper/tin-bismuth Pb-free solder interconnect Journal of Materials Research, vol. 16, 2001. Hua, F., Mei, Z., and Glazer, J., Eutectic Sn-Bi as an alternative to Pb-free solders Conference: Proceedings of the 1998 48th Electronic Components & Technology Conference , Seattle, WA, USA , 19980525-19980528 p 277-283 , 1998, vol. 1998. Hua, F. and Glazer, J., Lead-free solders for electronic assembly Design and Reliability of Solders and Solder [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] Interconnections. Proceedings of a Symposium held during the TMS Annual Meeting p.65-73, vol. 1997. Hu, J. N., Tanaka, H., and Narita, T., Aging behavior of a Sn-Bi eutectic solder at temperatures between 233 and 373 K Materials Transactions, vol. 42, 2001. Yebisuya, T. and Kawakubo, T., Creep and tensile properties of cast Bi-Sn, Bi-Pb and Bi-Sn-Pb solders Journal of the Japan Institute of Metals, vol.57, no.4, pp. 455-62, vol. 1993. Mitlin, D., Raeder, C. H., and Messler, R. W. Jr., Solid solution creep behavior of Sn-xBi alloys Metallurgical and Materials Transactions A (Physical Metallurgy and Materials Science), vol.30A, no.1, pp. 115-22, vol. 1999. Mitlin, D., Raeder, C. H., and Messler Jr, R. W., Modelling the creep rates of eutectic Bi-Sn solder using the data from its constitutive phases. Journal of Materials Science 33, (18), 4503-4508, vol. 1998. Lee, C. B., Jung, S. B., Shin, Y. E., and Shur, C. C., The effect of Bi concentration on wettability of Cu substrate by Sn-Bi solders Materials Transactions, vol. 42, 2001. Felton, L. E., Raeder, C. H., and Knorr, D. B., The Properties of Tin-Bismuth Alloy Solders Jom-Journal of the Minerals Metals & Materials Society, vol. 45, 1993. Freer Goldstein, J. L., Microstructural development and mechanical behavior of eutectic bismuth-tin and eutectic indium-tin in response to high-temperature deformation. Diss. Abstr. Int. 55, (7), Pp 108, vol. 1995. Freer Goldstein, J. L. and Morris, J. W. J., Microstructural development of eutectic Bi-Sn and eutectic In-Sn during high temperature deformation Journal of Electronic Materials vol.23, no.5 p.477-86, vol. 1994. Freer Goldstein, J. L., Mei, Z., and Morris Jr, J. W., Microstructure and Mechanical Properties of Tin--Indium and Tin--Bismuth Solders. JOM vol.45, no.7, 25-27, vol. 1993. Morris, J. W., Freer Goldstein, J. L., and Mei, Z., Microstructure and Mechanical-Properties of Sn-In and Sn-Bi Solders JOM, 1993, V45, N7 (JUL), P25-27, vol. 1993. Raeder, C. H., Messler, R. W., and Coffin, L. F., Partially-constrained thermomechanical fatigue of eutectic tin-bismuth/copper solder joints Journal of Electronic Materials, vol. 28, 1999. Raeder, C. H., Partially-constrained thermomechanical fatigue of eutectic tin-bismuth/copper solder joints Journal of Electronic Materials, vol.28, no.9, vol. 1999. Melton, C. M. and Skipor, A., Method for Forming Tin-Indium or Tin--Bismuth Solder Connection Having Increased Melting Temperature Patent: US5221038, USA 5 Oct. 1992, vol. 1993. Melton, C., Reflow soldering evaluation of lead free solder alloys ECTC 93 Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93), vol. 1993. Mei, Z., Hua, F., and Glazer, J., Sn-Bi-x Solders SMI 99 Surface Mount International Conference and Exposition, vol. 1999. Mei, Z., Hua, F., Glazer, J., and Key, C. C., Low temperature soldering Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology(IEMT) Symposium 1997. IEEE, Piscataway, NJ, USA,97CH36068. p 463-469 , 1997, vol. 1997. Mei, Z., Hua, F., and Glazer, J., Thermal reliability of 58Bi-42Sn solder joints on Pb-containing surfaces Proceedings of the 1997 TMS Annual Meeting , Orlando, FL, USA , 19970210-19970213 Design Reliability of Solders and Solder Interconnections TMS Annual Meeting 1997. p 229-239 , 1997, vol. 1997. Mei, Z. and Holder, H., A thermal fatigue failure mechanism of 58Bi-42Sn solder joints Journal of Electronic Packaging, vol. 118, 1996. Mei, Z., H., V. P., Gleason, J., Baker, J., and Holder, H., Low Temperature Solders, Internal Paper, 1995. [23] Guan, Z., Liu, G., and Liu, T., Kinetics of interface reaction in 40Sn-Bi/Cu and 40Sn-Bi-2Ag/Cu systems during aging in solid state IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2000, V23, N4 (NOV), P 737742, vol. 2000. [24] Gonya, S. G., Lake, J. K., Long, R. C., and Wild, R. N., Lead free, tin-bismuth solder alloys Patent: US5368814, USA 16 June 1993, vol. 1994. [25] Bartels, F., Linch, H., Xu, P., and Morris, J. W. Jr., Mechanical properties of Sn-Bi solder joints ISTFA '94. Proceedings of the 20th International Symposium for Testing and Failure Analysis p.479-83, vol. 1994. [26] Hosking, F. M., Vianco, P. T., and Frear, D. R., Wettability of low temperature solder alloys for step soldering Materials Developments in Microelectronic Packaging Conf. Proceedings, pp. 365-371, vol. 1991. [27] Phillips, J. and Stillahn, K., Eutectic tin-bismuth for twostep PCB soldering Electronic Packaging & Production, vol.32, no.2, pp78-80., vol. 1992. [28] Pattanaik, S. and Raman, V., Deformation and Fracture of Bismuth--Tin Eutectic Solder. Materials Developments in Microelectronic Packaging: Performance and Reliability, Montreal, Quebec, Canada, vol. 1991. [29] Mei, Z., Vander Plas, H., Gleason, J., and Baker, J., Low temperature solders ISTFA '94. Proceedings of the 20th International Symposium for Testing and Failure Analysis p.485-95, vol. 1994. [30] Mei, Z. and Morris, J. W. J., Characterization of eutectic Sn-Bi solder joints Journal of Electronic Materials vol.21, no.6 p.599-607, vol. 1992. [31] McCormack, M., Chen, H. S., Jin, S., and Kammlott, G. W., Significantly improved mechanical properties of BiSn solder alloys by Ag-doping Journal of Electronic Materials, 1997, V26, N8 (AUG), P954-958, vol. 1997. [32] Poon, N. M., Wu, C. M. L., Lai, J. K. L., and Chan, Y. C., Residual shear strength of Sn-Ag and Sn-Bi lead-free SMT joints after thermal shock Ieee Transactions on Advanced Packaging, vol. 23, 2000. [33] Powers, T. A., Singler, T. J., and Clum, J. A., Role of Tin Content in the Wetting of Cu and Au by Tin-Bismuth Solders Journal of Electronic Materials, vol. 23, 1994. [34] Schroeder, V., Hua, F., and Gleason, J., Strength and Fatigue Behavior of Joints Made with Bi-42Sn-1Ag Solder Paste: An Alternative to Sn-3.5Ag-0.7Cu for Low Cost Consumer Products SMTA International 2001. [35] Schroeder, V. and Hua, F., A reliability investigation of 57Bi-42Sn-1Ag solder paste: An alternative to Sn-3.5Ag0.7Cu for low cost consumer products, SMTA International 2001. [36] Schroeder, V. and Hua, F., Feasibility study of 57Bi42Sn-1Ag solder Proceedings of APEX (IPC), vol. 2001. [37] Schroeder, V. and Chew, G., The applicability of Bi-42Sn1Ag solder for consumer products: A study of Pb contamination effects IPC Works, vol. 2001. [38] Tomlinson, W. J. and Collier, I., Mechanical Properties and Microstructures of Copper and Brass Joints Soldered with Eutectic Tin-Bismuth Solder Journal of Materials Science v 22 n 5 May 1987 p 1835-1839 , 1987, vol. 1987. [39] Vianco, P. T., Kilgo, A. C., and Grant, R., Intermetallic Compound Layer Growth by Solid-State Reactions between 58bi-42sn Solder and Copper Journal of Electronic Materials, vol. 24, 1995. [40] Raeder, C. H., Modelling the creep rates of eutectic Bi-Sn solder using the data from its constitutive phases Journal of Materials Science v 33 n 18 Sep 15 1998. p 4503-4508 , 1998, vol. 1998. [41] Raeder, C. H., Thermomechanical stress-strain hysteresis of Sn-Bi eutectic solder alloy Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future' InclusivePages 263-8, vol. 1995. [42] Raeder, C. H., Evolution of eutectic SnAg, SnBi and SnPb joint and bulk microstructures Proceeding SAMPE 7th International Electronic Materials and Processes Conference InclusivePages 355-65, vol. 1994. [43] Raeder, C. H., The effect of aging on microstructure, room temperature deformation, and fracture of Sn-Bi/Cu solder joints Journal of Electronic Materials vol.23, no.7, pp. 611-17, vol. 1994. [44] Raeder, C. H., Isothermal creep of eutectic SnBi and SnAg solder and solder joints Proceedings of 16th IEEE/CPMT International Electronic Manufacturing Technology Symposium InclusivePages 1-6 vol.1, vol. 1994. [45] Raeder, C. H., Felton, L. E., Knorr, D. B., Schmeelk, G. B., and Lee, D., Microstructural evolution and mechanical properties of Sn-Bi based solders Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium InclusivePages 119-27, vol. 1993. [46] Glazer, J., Metallurgy of Low-Temperature Pb-Free Solders for Electronic Assembly International Materials Reviews, vol. 40, 1995. [47] Glazer, J., Microstructure and Mechanical-Properties of Pb-Free Solder Alloys for Low-Cost Electronic Assembly - a Review Journal of Electronic Materials, vol. 23, 1994. [48] Mccormack, M., Chen, H. S., Kammlott, G. W., and Jin, S., Significantly Improved Mechanical Properties of BiSn Solder Alloys by Ag-Doping Journal of Electronic Materials, vol. 26, Aug, 1997. [49] Morris, J. W., Goldstein, J. L. F., and Mei, Z., Microstructure and Mechanical-Properties of Sn-in and Sn-Bi Solders Jom-Journal of the Minerals Metals & Materials Society, vol. 45, Jul, 1993. [50] Artaki, I., Finley, D. W., Jackson, A. M., Ray, U., and Vianco, P. T., Wave soldering with lead-free solders SMI Surface Mount International. Advanced Electronics Manufacturing Technologies. Proceedings of the Technical Program, vol. 1995. [51] Mei, Z., Holder, H., and Vander Plas, H., Lowtemperature solders Hewlett-Packard Journal v 47 n 4 Aug 1996. p 91-98 , 1996, vol. 1996. [52] Guo, Z., Sprecher, A. F., Conrad, H., and Kim, M., Monotonic properties and low-cycle fatigue of several soft solder alloy systems Materials Developments in Microelectronic Packaging Conf. Proceedings, pp. 155162, vol. 1991. [53] Chew, G., Summary of Shock & Vibration Testing of Lead (Pb) Vs. Lead-free (Pb-free) Components Using Lead-free Solder Internal Paper, 2001. [54] Schroeder, V., Hua, F., and Gleason, J., Strength and Fatigue Behavior of Joints Made with Bi-42Sn-1Ag Solder Paste: An Alternative to Sn-3.5Ag-0.7Cu for Low Cost Consumer Products SMTA International 2001. [55] Schroeder, V. and Hua, F., Feasibility study of 57Bi42Sn-1Ag solder Proceedings of APEX (IPC), vol. 2001. [56] Hua, F., Mei, Z., and Glazer, J., Eutectic Sn-Bi as an alternative to Pb-free solders Conference: Proceedings of the 1998 48th Electronic Components & Technology Conference , Seattle, WA, USA , 19980525-19980528 p 277-283 , 1998, vol. 1998. [57] Holder, H. and Bell, D., Evaluation of Low Temperature Fluxes, Internal Paper, 1997. [58] Schroeder, V. and Hua, F., Feasibility study of 57Bi-42Sn1Ag solder Proceedings of APEX (IPC), vol. 2001. [59] Vander Plas, H., Cinque, R., Mei, Z., and Holder, H., Assessment of low-temperature fluxes Hewlett-Packard Journal v 47 n 4 Aug 1996. p 99-103 , 1996, vol. 1996. [60] Schroeder, V. and Chew, G., The applicability of Bi-42Sn1Ag solder for consumer products: A study of Pb contamination effects IPC Works, vol. 2001. [61] Chow, M., Comparison of Printed Circuit Board Materials Internal Paper, 1996. [62] M.W. Jawitz . Printed Circuit Board Materials Handbook, McGraw-Hill, 1997. [63] IPC-A-610 Acceptability of Electronic Assemblies 2000. [64] Gratalo, K., Peel Test Results for 63Sn-37Pb, 43Sn-43Pb14Bi, and 57Bi-42-Sn-1Ag Email, 2001. [65] Hua, F., Mei, Z., and Glazer, J., Eutectic Sn-Bi as an alternative to Pb-free solders Conference: Proceedings of [66] [67] [68] [69] the 1998 48th Electronic Components & Technology Conference , Seattle, WA, USA , 19980525-19980528 p 277-283 , 1998, vol. 1998. Oberndorff, P. J. T. L., van Vinken, M. G. A., Kodentsov, A. A., and van Loo, F. J. J., Solid state diffusion in the Bi-Pd system Diffusions in Materials: Dimat2000, Pts 1 & 2, vol. 194-1, 2001. Abbott, D. C., Nickel Palladium Finish for Leadframes Ieee Transactions on Components and Packaging Technologies, vol. 22, Mar, 1999. Hua, F., Mei, Z., Holder, H., and Glazer, J., Adhesion Strength of Solder Joints to Alloy 42 Component Leads, ECTC 1997. Fazzio, R. S., "Effects of Lead-Free Solders on Imaging Characteristics of HP 5DX Laminographic X-Ray Inspection System," HP 5DX User's Group Conference.