IRF510 Data Sheet January 2002 5.6A, 100V, 0.540 Ohm, N-Channel Power MOSFET This N-Channel enhancement mode silicon gate power field effect transistor is an advanced power MOSFET designed, tested, and guaranteed to withstand a specified level of energy in the breakdown avalanche mode of operation. All of these power MOSFETs are designed for applications such as switching regulators, switching convertors, motor drivers, relay drivers, and drivers for high power bipolar switching transistors requiring high speed and low gate drive power. These types can be operated directly from integrated circuits. Formerly developmental type TA17441. Ordering Information PART NUMBER IRF510 PACKAGE TO-220AB Features • 5.6A, 100V • rDS(ON) = 0.540Ω • Single Pulse Avalanche Energy Rated • SOA is Power Dissipation Limited • Nanosecond Switching Speeds • Linear Transfer Characteristics • High Input Impedance • Related Literature - TB334 “Guidelines for Soldering Surface Mount Components to PC Boards” Symbol BRAND D IRF510 NOTE: When ordering, include the entire part number. G S Packaging JEDEC TO-220AB SOURCE DRAIN GATE DRAIN (FLANGE) ©2002 Fairchild Semiconductor Corporation IRF510 Rev. B IRF510 Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VDS Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID TC = 100oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGS Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .PD Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .EAS Operating and Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .TJ , TSTG Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg IRF510 100 100 5.6 4 20 ±20 43 0.29 19 -55 to 175 UNITS V V A A A V W W/oC mJ oC 300 260 oC oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. TJ = 25oC to 150oC. Electrical Specifications TC = 25oC, Unless Otherwise Specified PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS V Drain to Source Breakdown Voltage BVDSS VGS = 0V, ID = 250µA, (Figure 10) 100 - - Gate to Threshold Voltage VGS(TH) VGS = VDS, ID = 250µA 2.0 - 4.0 V - - 25 µA Zero-Gate Voltage Drain Current On-State Drain Current (Note 2) Gate to Source Leakage Current Drain to Source On Resistance (Note 2) Forward Transconductance (Note 2) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge (Gate to Source + Gate to Drain) IDSS ID(ON) IGSS rDS(ON) gfs td(ON) tr td(OFF) VDS = 95V, VGS = 0V VDS = 0.8 x Rated BVDSS, VGS = 0V, TJ = 150oC - - 250 µA VDS > ID(ON) x rDS(ON)MAX , VGS = 10V (Figure 7) 5.6 - - A VGS = ±20V - - ±100 nA VGS = 10V, ID = 3.4A (Figures 8, 9) - 0.4 0.54 Ω 1.3 2.0 - S - 8 12 ns - 25 63 ns - 15 7 ns - 12 59 ns - 5.0 30 nC - 2.0 - nC - 3.0 - nC VGS = 50V, ID = 3.4A (Figure 12) ID ≈ 5.6A, RGS = 24Ω , VDD = 50V, RL = 9Ω , VDD = 50V, VGS = 10V MOSFET switching times are essentially independent of operating temperature tf Qg(TOT) Gate to Source Charge Qgs Gate to Drain “Miller” Charge Qgd VGS = 10V, ID = 5.6A, VDS = 0.8 x Rated BVDSS, IG(REF) = 1.5mA (Figure 14) Gate charge is essentially independent of operating temperature. Input Capacitance CISS - 135 - pF Output Capacitance COSS - 80 - pF Reverse-Transfer Capacitance CRSS - 20 - pF - 3.5 - nH - 4.5 - nH - 7.5 - nH - - 3.5 oC/W - - 80 oC/W Internal Drain Inductance LD VGS = 0V, VDS = 25V, f = 1.0MHz (Figure 11) Measured From the Contact Screw On Tab To Center of Die Measured From the Drain Lead, 6mm (0.25in) From Package to Center of Die Internal Source Inductance LS Junction to Case RθJC Junction to Ambient RθJA ©2002 Fairchild Semiconductor Corporation Measured From The Source Lead, 6mm (0.25in) From Header to Source Bonding Pad Free air operation Modified MOSFET Symbol Showing the Internal Devices Inductances D LD G LS S IRF510 Rev. B IRF510 Source to Drain Diode Specifications PARAMETER SYMBOL Continuous Source to Drain Current Pulse Source to Drain Current (Note 3) ISD ISDM Test Conditions Modified MOSFET Symbol Showing the Integral Reverse P-N Junction Diode D MIN TYP MAX UNITS - - 5.6 A - - 20 A - - 2.5 V G S Source to Drain Diode Voltage (Note 2) Reverse Recovery Time Reverse Recovered Charge VSD TJ = 25oC, ISD = 5.6A, VGS = 0V (Figure 13) trr TJ = 25oC, ISD = 5.6A, dISD/dt = 100A/µs 4.6 96 200 ns QRR TJ = 25oC, ISD = 5.6A, dISD/dt = 100A/µs 0.17 0.4 0.83 µC NOTES: 2. Pulse test: pulse width ≤ 300µs, duty cycle ≤ 2%. 3. Repetitive rating: pulse width limited by max junction temperature. See Transient Thermal Impedance curve (Figure 3). 4. VDD = 25V, start TJ = 25oC, L = 910µH, RG = 25Ω, peak IAS = 5.6A. Typical Performance Curves Unless Otherwise Specified 10 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 8 6 4 2 0.2 0 0 25 0 125 50 75 100 TC , CASE TEMPERATURE (oC) 150 175 25 50 75 125 100 150 175 TC , CASE TEMPERATURE (oC) FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE TEMPERATURE FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs CASE TEMPERATURE ZθJC, TRANSIENT THERMAL IMPEDANCE (oC/W) 10 0.5 1 0.2 0.1 0.05 0.1 PDM 0.02 0.01 t1 t2 SINGLE PULSE NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC + TC 0.01 10-5 10-4 0.1 10-2 10-3 t1, RECTANGULAR PULSE DURATION (S) 1 10 FIGURE 3. MAXIMUM TRANSIENT THERMAL IMPEDANCE ©2002 Fairchild Semiconductor Corporation IRF510 Rev. B IRF510 Typical Performance Curves Unless Otherwise Specified 100 10 OPERATION IN THIS REGION IS LIMITED BY rDS(ON) VGS = 10V 10 ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 10µs 100µs 1ms 1 TC = 25oC TJ = 175oC SINGLE PULSE 0.1 (Continued) 1 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 8 VGS = 8V 6 VGS = 7V 4 VGS = 6V 2 VGS = 5V VGS = 4V 0 10 102 0 103 10 FIGURE 4. FORWARD BIAS SAFE OPERATING AREA 10 ID(ON), ON-STATE DRAIN CURRENT (A) ID, DRAIN CURRENT (A) VGS = 10V 8 VGS = 8V 6 VGS = 7V 4 VGS = 6V 2 VGS = 5V VGS = 4V 0 2 4 6 8 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.1 3.0 NORMALIZED ON RESISTANCE ON RESISTANCE (Ω) rDS(ON), DRAIN TO SOURCE 4 3 2 VGS = 10V VGS = 20V 1 0 12 16 ID, DRAIN CURRENT (A) FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE VOLTAGE AND DRAIN CURRENT ©2002 Fairchild Semiconductor Corporation TJ = 25oC TJ = 175oC 2 4 6 8 VGS , GATE TO SOURCE VOLTAGE (V) 10 FIGURE 7. TRANSFER CHARACTERISTICS PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 8 VDS ≥ 50V PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 10-2 0 10 5 4 50 1 FIGURE 6. SATURATION CHARACTERISTICS 0 40 FIGURE 5. OUTPUT CHARACTERISTICS 10 0 30 VDS , DRAIN TO SOURCE VOLTAGE (V) VDS , DRAIN TO SOURCE VOLTAGE (V) PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 20 20 2.4 ID = 3.4A, VGS = 10V PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 1.8 1.2 0.6 0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 TJ, JUNCTION TEMPERATURE (oC) FIGURE 9. NORMALIZED DRAIN TO SOURCE ON RESISTANCE vs JUNCTION TEMPERATURE IRF510 Rev. B IRF510 Typical Performance Curves Unless Otherwise Specified (Continued) 1.25 500 1.15 C, CAPACITANCE (pF) NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE ID = 250µA 1.05 0.95 VGS = 0V, f = 1MHz CISS = CGS + CGD 400 CRSS = CGD COSS ≈ CDS + CGD 300 200 CISS COSS 0.85 100 0.75 -60 -40 -20 0 CRSS 0 20 40 80 60 100 120 140 160 180 1 2 TJ, JUNCTION TEMPERATURE (oC) FIGURE 10. NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE vs JUNCTION TEMPERATURE TJ = 25oC 1.5 TJ = 175oC 1.0 0.5 0 0 2 2 5 102 100 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VDS ≥ 50V 2.0 10 FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE ISD, SOURCE TO DRAIN CURRENT (A) gfs, TRANSCONDUCTANCE (S) 2.5 5 VDS, DRAIN TO SOURCE VOLTAGE (V) 4 6 ID, DRAIN CURRENT (A) 8 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 10 1 TJ = 175oC TJ = 25oC 0.1 0 10 FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENT 0.4 0.8 1.2 1.6 VSD, SOURCE TO DRAIN VOLTAGE (V) 2.0 FIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE VGS, GATE TO SOURCE VOLTAGE (V) 20 ID = 3.4A VDS = 80V VDS = 50V VDS = 20V 16 12 8 4 0 0 2 4 6 Qg, GATE CHARGE (nC) 8 10 FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE ©2002 Fairchild Semiconductor Corporation IRF510 Rev. B IRF510 Test Circuits and Waveforms VDS BVDSS L tP VARY tP TO OBTAIN IAS + RG REQUIRED PEAK IAS VDS VDD VDD - VGS DUT tP 0V IAS 0 0.01Ω tAV FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 16. UNCLAMPED ENERGY WAVEFORMS tON tOFF td(ON) td(OFF) tr RL VDS tf 90% 90% + RG - VDD 10% 0 10% DUT 90% VGS VGS 0 FIGURE 17. SWITCHING TIME TEST CIRCUIT 0.2µF 50% PULSE WIDTH 10% FIGURE 18. RESISTIVE SWITCHING WAVEFORMS VDS (ISOLATED SUPPLY) CURRENT REGULATOR 12V BATTERY 50% VDD Qg(TOT) SAME TYPE AS DUT 50kΩ Qgd 0.3µF VGS Qgs D VDS DUT G 0 IG(REF) S 0 IG CURRENT SAMPLING RESISTOR VDS ID CURRENT SAMPLING RESISTOR FIGURE 19. GATE CHARGE TEST CIRCUIT ©2002 Fairchild Semiconductor Corporation IG(REF) 0 FIGURE 20. GATE CHARGE WAVEFORM IRF510 Rev. B TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ Bottomless™ CoolFET™ CROSSVOLT™ DenseTrench™ DOME™ EcoSPARK™ E2CMOSTM EnSignaTM FACT™ FACT Quiet Series™ FAST FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™ OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™ UltraFET VCX™ STAR*POWER is used under license DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. 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PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. 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