Lecture Notes on Photonics and Optoelectronics Vol. 1, No. 1, June 2013 Benzocyclobutene (BCB 4022-35) Single Mode Rib Waveguides Fikret. G. Aras and E. Öz Orhan Gazi University, Institute of Science and Technology, Department of Advanced Technologies, Teknikokullar, Ankara, Turkey E-mail: goncaras@gmail.com, eliforhan@gazi.edu.tr O. Salihoglu Bilkent University, Department of Physics,Advanced Research Laboratory, Bilkent, Ankara, Turkey Abstract—Design, fabrication and characterization of a photodefinable benzocyclobutene (BCB 4022-35 is a product of DowTM) single mode rib optical waveguide is presented in this work. At first, the refractive index of polymer film is measured by the method of prism coupling. We design the single mode rib waveguide based on the geometrical adjustment of rib width, total waveguide height using conventional R-soft BPM and effective index methods. Based on the design results, BCB waveguides were fabricated by using photolithographic process with wet etching, which is quite complicated and time consuming. In this work, the insertion and propagation losses of waveguide are measured by using the conventional cut back method. The insertion losses of waveguide are 3.95 dB and 4.08 dB for TE and TM modes respectively. The propagation losses of waveguide are 1.09dB/cm and 1.20dB/cm for TE and TM modes respectively. Index Terms—Benzocyclobutene waveguide, single mode I. (BCB 4022-35), cyclobutene). Benzocylobutene (BCB), a product of DowTM [2] is a photodefinable polymer. Due to excellent planarization, low dielectric constant, low moisture uptake, low optical loss, high chemical resistance and high glass-transition temperature, BCB is then often used for optical waveguides in recent years [3]. It is well known that benzocyclobutene (BCB) has been widely used for flat panel display, interlayer dielectrics and microelectronics packing applications. Recently, it is also used for making waveguides [4]-[7] because BCB has a high glass-transition temperature of over 350 C and high optical transparency over the wide wavelength range from ultraviolet to infrared [8]. Moreover, BCB on silicon substrate is compatible with the standard processing techniques of integrated circuits [9]. Ibrahim et al. [10] discussed the characterization process of benzocylobutene (BCB 4022-40) and its realization into optical devices. In this paper, we will report on fabrication and characterization process of optical waveguides using organic photodefinablebenzocyclobutene (BCB 4022-35) polymer from DowTM [1]. rib INTRODUCTION Integrated optics are having an increasing impact on the development of lightwave communication systems with applications such as high speed broadband switching and high speed interconnects for local area network. Undoubtedly, the major performances of integrated optics rely on the waveguiding component. Extensive interest has been shown in the development and application of polymers for various optically active and passive waveguide devices because of potential of these materials for low cost and high performance commercial products [1]. Polymers are expected to play an important role in the realization of integrated optical devices for applications in the fields of optical communications, optical data processing, electro-optic and thermo optic switching devices, directional couplers, nonlinear optics etc. Classes of polymers used in integrated optics include acrylates, polyimides, polycarbonates, and olefin (e.g., II. We have designed the single mode rib waveguide based on the geometrical adjustment rib of width, total waveguide height to the single mode condition for rib waveguide with large cross section obtained by effective index method proposed by Soref et al. [11]. Based on the previous theory Petermann [12], Soref et al. [11] proposed condition for the single-mode propagation in rib waveguides with large cross section taking into account cutoff values from numerical solutions. This formula (1) has been frequently used later. (1) Here, Manuscript received November 29, 2012; revised January 6, 2013; accepted January 17, 2013. ©2013 Engineering and Technology Publishing doi: 10.12720/lnpo.1.1.14-17 DESIGN OF WAVEGUIDE 14 Lecture Notes on Photonics and Optoelectronics Vol. 1, No. 1, June 2013 = 1 for TE modes Figure 2. Mode profile of fundamental mode and computed mode spectrum. for TM modes nf, ns and nc are refractive indices of the guiding region, the substrate and air respectively. k=2π/ , is the wavelength. The constant c is given as 0.3 which was found from an approximation to a BPM numerical solution. However, it has been recently stated that c values of 0 or -0.05 give better single mode condition for rib waveguide design purposes. Plot of theoretical curve for single mode limit and schematic of a rib waveguide are given in Fig. 1. III. WAVEGUIDE FABRICATION We have designed fabricated and characterized BCB single mode rib waveguide in this work. A schematic diagram of waveguide structure is shown Fig. 3. For convenience, a silicon wafer (100) is used as the substrate. BCB was chosen specifically for the core. After a conventional semiconductor cleaning, a 4 m SiO2 was grown on substrate to form a lower cladding layer by using PECVD. This was followed by the photolitography step where a mask aligner having I-line UV exposure at 365 nm wavelenght was used to pattern.The photoresist mask was patterned by the buffered oxide etching. After the wet etching step, a BCB was coated at 5000 rpm and cured at 250 C for 1 h in nitrogen environmental.The refractive index of cured BCB film was then measured by prism coupling method. Figure 1. Single mode condition for rib waveguide ( for H = 3.5 µm ). As can be seen in Fig.1, the zone under the curve shows the experimentally verified single mode (SM) propagation region. In the other zone multimode (MM) waveguiding condition is satisfied. This is a stronger criterion for the single mode propagation since it allows waveguide designers to be certain that they would have single mode waveguides. According to single mode condition, waveguide simulation was carried out by usingR-soft BPM which based on Finite Difference method in this work. Fig. 2 shows computed mode spectrum and the mode profile of fundamental mode. ©2013 Engineering and Technology Publishing Figure 3. Schematic diagram of waveguide structure (left) and optical micrograph and imaging of SEM (right). Table 1 shows the refractive indices of BCB films for TE polarization. Finally waveguide was cleaved at the facets for optical coupling. 15 Lecture Notes on Photonics and Optoelectronics Vol. 1, No. 1, June 2013 TABLE I. REFRACTIVE INDICES OF BCB FILMS FOR TEPOLARIZATION The surface roughness of a waveguide device is important as it can become the determinant for optical applications, particularly because scattering loss is more sensitive to the surface roughness in case of evanescent modes [13-15]. To survey the surface morphology, the root mean square (RMS) surface roughness was measured by atomic force microscopy (AFM). The surface morphologies of coated polymer (spin coated and cured) are shown Fig. 6. BCB (4022-35) Wavelenght (nm) Cure temperature (C) Spin speed (rpm) Refractive index 632,8 250 5000 1,5845 1553,0 250 5000 1,5606 632,8 300 2500 1,5680 1553,0 300 2500 1,5471 IV. CHARACTERIZATION In order to characterize for a waveguide loss a conventional cutback method has been adopted in the loss measurement. A single mode fiber is used to couple 1550,0 nm laser source in to polished and facet of the polymer waveguide. The output is measured using the Germanium (Ge) photodetector and the near field profile is imaged onto an infrared camera integrated with beam analyzer software. Fig. 4 represents a schematic diagram regarding the optical injection set-up and the measurement of optical losses. Figure 6. A surface morphology of a coated of BCB polymer which was spun at 5000 rpm an cured 250C. The surface roughness of coated polymer was RMS = 0.322 nm. The result is given in Fig. 6 which gives a surface roughness in root mean square (RMS) of 0.322 nm, which indicate good coating quality. V. RESULT AND DISCUSSION Optical waveguides based on a photodefinable BCB (4022-35) polymer have been demonstrated utilizing silicon as a substrate and thin lower cladding of SiO2 with 4 m thickness. Polymer characterization using prism coupling technique provides useful ideas on its abilities in optoelectronic applications. The photolithography and wet etching technique were utilizing throughout the fabrication process. For single mode application, a core dimension of 3.5 m was fabricated, which is further characterized for loss using the cutback method. The propagation losses of the polymer single mode waveguide for TE and TM modes are 1.09 dB/cm and 1.20 dB/cm respectively. The insertion losses of waveguide for TE and TM modes are 3.95 dB and 4.08 dB respectively. Figure 4. Optical waveguide devices measurement setup. The results of loss measurement of BCB optical waveguides for TE and TM modes are shown in Fig. 5. The slope of the line indicates that the propagation loss in the waveguides is 1.09 dB/cm and 1.20 dB/cm respectively. The insertion losses for TE and TM modes are 3.95 dB and 4.08 dB. ACKNOWLEDGMENT This work was supported by Gazi University Research Fund under Project No 18/2010-02. The authors would like to thank Professor A. Aydınlı who is director of Advanced Research Laboratory in Bilkent University for help in waveguide fabrication and for numerous useful discussions. The authors are grateful to John H. Jackson from Metricon Corp. Pennington NJ, USA for prismcoupling measurements. REFERENCES [1] Figure 5. Measurement output power for several waveguide lengths and image of waveguideoutput for 1550,0 nm laser coupling and single mode profile. ©2013 Engineering and Technology Publishing 16 M. H. Ibrahim, S. Y. Lee, M. K Chin, N. M. Kassim, and A. B. Mohammad, Microwave and Optical Technology Letters, vol. 49(2), pp. 479,2004 . Lecture Notes on Photonics and Optoelectronics Vol. 1, No. 1, June 2013 [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] Product Literature: CycloteneTM Advanced Electronic Resins, The Dow Chemical Company, 1999. Y. H. So, P. Garrou, J. Hi, Im, and D. M. Scheck, Chemical Innovation, vol. 31(12), pp. 40, 2011. G. Fishbeck, R. Moosburger, M. Töpper, and K. 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Cvelbar, S. Pejovnik, M. Mozetei, A. Zalar, Appl. Surf. Sci., vol. 210, pp. 255, 2003. Y. Zhao, F. Wang, Z. C, Cui, J. I, Zheng, D. M, Zhang, S. Y, Liu, M. B, Yi, J. Microelectron, vol. 35, pp. 605, 2004. Dr. Elif Orhan is an Associate Professor of department of Advanced Technologies from Graduate School of Natural and Applied Sciences at Gazi University in Turkey. She has served as a Chairman of the department from 2008 to 2013. In 1993, she received her B.S. degree in Physics Education from the Atatürk University and then received her M.Sc. degree in department of Physics in 1996. In 2000, she received her Ph.D. degree in the field of X-Ray Fluorescence (XRF) Spectroscopy from the Atatürk University of Erzurum, Turkey. She was elected as a reviewer of the Turkish Scientific and Technical Research Council and in 2012 and she was a reviewer of journal of X-Ray Spectroscopy in 2001-2003 and journal of Radiation Physics and Chemistry in 2002. She was the recipient of International Scientific Publication Incentive Awards, from Turkish Scientific and Technical Research Council, Atatürk University and Gazi University. She was a member of Group of Specialist from 2008 to 2012 at Gazi University and she is a member of Committee of Specialist at Gazi University. She is a member of the Turkish Physics Academy. Dr. Orhan has focused her research efforts on Coster-Kronig yields and chemical effects in the field of X-Ray Fluorescence (XRF) Spectroscopy and on optical waveguides and micro disk/ring add- drop multiplexers in the field of Integrated Optics. She has 26 research papers and cited 155 according to Web of Science. Dr. Orhan is the technical editor in 2013 the 2nd International Conference on Electronics and Opto-electronics Science. She is now Associate Professor at Gazi University of Advanced Technologies, Ankara. Dr. Omer Salihoglu received his B.S. in Physics from middle east technical university (METU), Ankara, Turkey in 2001 and Ph.D. in Physics from Temple University, Philadelphia, PA in 2009. His areas of research interest include superlattice infrared photodetector technologies, ultrafast crystallization of semiconductors and graphene based plasmonics. He is currently postdoc at Bilkent University in Ankara Turkey. ©2013 Engineering and Technology Publishing 17