NDD60N550U1 - N-Channel Power MOSFET

advertisement
NDD60N550U1
N-Channel Power MOSFET
600 V, 550 mW
Features
• 100% Avalanche Tested
• These Devices are Pb-Free, Halogen Free/BFR Free and are RoHS
http://onsemi.com
Compliant
ABSOLUTE MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter
Symbol
NDD
Unit
Drain−to−Source Voltage
VDSS
600
V
Gate−to−Source Voltage
VGS
±25
V
ID
8.2
A
Continuous Drain
Current RqJC
Steady
State
TC =
25°C
TC =
100°C
Power Dissipation –
RqJC
Steady
State
94
W
IDM
34
A
TJ,
TSTG
−55 to
+150
°C
IS
8.2
A
Single Pulse Drain−to−Source Avalanche
Energy (ID = 4 A)
EAS
54
mJ
Peak Diode Recovery (Note 1)
dv/dt
15
V/ns
TL
260
°C
tp = 10 ms
Operating Junction and Storage
Temperature
Source Current (Body Diode)
Lead Temperature for Soldering Leads
550 mW @ 10 V
N−Channel MOSFET
D (2)
G (1)
S (3)
1
4
1 2
2
3
IPAK
CASE 369D
STYLE 2
3
DPAK
CASE 369C
STYLE 2
4
12
THERMAL RESISTANCE
Parameter
Symbol
Value
Unit
NDD60N550U1
RqJC
1.3
°C/W
Junction−to−Ambient Steady State
(Note 3)
NDD60N550U1
(Note 2)
NDD60N550U1−1
(Note 2)
NDD60N550U1−35
RqJA
© Semiconductor Components Industries, LLC, 2013
3
IPAK
CASE 369AD
STYLE 2
°C/W
47
98
95
MARKING AND ORDERING INFORMATION
See detailed ordering and shipping information on page 3 of
this data sheet.
2. Insertion mounted
3. Surface mounted on FR4 board using 1″ sq. pad size
(Cu area = 1.127 in sq [2 oz] including traces)
December, 2013 − Rev. 0
600 V
4
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. ISD < 8.2 A, di/dt ≤ 400 A/ms, VDS peak ≤ V(BR)DSS, VDD = 80% V(BR)DSS
Junction−to−Case (Drain)
RDS(ON) MAX
5.2
PD
Pulsed Drain Current
TC =
25°C
V(BR)DSS
1
Publication Order Number:
NDD60N550U1/D
NDD60N550U1
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Symbol
Test Conditions
Min
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 1 mA
600
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/TJ
Characteristic
Typ
Max
Unit
OFF CHARACTERISTICS
Drain−to−Source Leakage Current
Gate−to−Source Leakage Current
IDSS
V
540
VDS = 600 V, VGS = 0 V
IGSS
mV/°C
TJ = 25°C
1
TJ = 125°C
100
VGS = ±25 V
±100
mA
nA
ON CHARACTERISTICS (Note 4)
VGS(TH)
VDS = VGS, ID = 250 mA
Negative Threshold Temperature Coefficient
VGS(TH)/TJ
Reference to 25°C, ID = 250 mA
7.6
Static Drain-to-Source On Resistance
RDS(on)
VGS = 10 V, ID = 4 A
510
gFS
VDS = 15 V, ID = 4 A
7.0
S
540
pF
Gate Threshold Voltage
Forward Transconductance
2
3.2
4
V
mV/°C
550
mW
DYNAMIC CHARACTERISTICS
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Effective output capacitance, energy
related (Note 6)
Co(er)
Effective output capacitance, time
related (Note 7)
Co(tr)
VDS = 50 V, VGS = 0 V, f = 1 MHz
33
1.6
VGS = 0 V, VDS = 0 to 480 V
ID = constant, VGS = 0 V,
VDS = 0 to 480 V
24
84
nC
Total Gate Charge
Qg
18
Gate-to-Source Charge
Qgs
3.4
Gate-to-Drain Charge
Qgd
Plateau Voltage
VGP
5.4
V
Gate Resistance
Rg
5.5
W
8
ns
VDS = 300 V, ID = 9.5 A, VGS = 10 V
8.7
RESISTIVE SWITCHING CHARACTERISTICS (Note 5)
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
td(on)
tr
td(off)
VDD = 300 V, ID = 9.5 A,
VGS = 10 V, RG = 0 W
tf
14
20
17
SOURCE−DRAIN DIODE CHARACTERISTICS
Diode Forward Voltage
VSD
Reverse Recovery Time
trr
Charge Time
ta
Discharge Time
tb
Reverse Recovery Charge
Qrr
IS = 8.2 A, VGS = 0 V
TJ = 25°C
0.9
TJ = 100°C
0.82
290
VGS = 0 V, VDD = 30 V
IS = 9.5 A, di/dt = 100 A/ms
1.3
V
ns
160
130
2.6
mC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%.
5. Switching characteristics are independent of operating junction temperatures.
6. Co(er) is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 80% V(BR)DSS
7. Co(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% V(BR)DSS
http://onsemi.com
2
NDD60N550U1
MARKING DIAGRAMS
4
Drain
4
Drain
YWW
60N
550U1G
YWW
60N
550U1G
YWW
60N
550U1G
4
Drain
2
1 Drain 3
Gate Source
1 2 3
Gate Drain Source
IPAK
DPAK
Y
WW
G
1
Gate
3
2 Source
Drain
IPAK
= Year
= Work Week
= Pb−Free Package
ORDERING INFORMATION
Package
Shipping†
NDD60N550U1−1G
IPAK
(Pb-Free, Halogen-Free)
75 Units / Rail
NDD60N550U1−35G
IPAK
(Pb-Free, Halogen-Free)
75 Units / Rail
NDD60N550U1T4G
DPAK
(Pb-Free, Halogen-Free)
2500 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
http://onsemi.com
3
NDD60N550U1
TYPICAL CHARACTERISTICS
16
14
12
VGS = 5.5 V
10
8
VGS = 5.0 V
6
4
VGS = 4.5 V
2
VGS = 4.0 V
0
5
10
15
20
25
30
0.7
0.6
0.5
5
6
7
8
9
10
2.6
ID = 4 A
VGS = 10 V
2.0
1.8
1.6
1.4
1.2
1.0
0.8
−25
0
25
50
75
100
125
TJ, JUNCTION TEMPERATURE (°C)
150
BVDSS, NORMALIZED BREAKDOWN VOLTAGE
VGS, GATE VOLTAGE (V)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
RDS(on), NORMALIZED DRAIN−TO−
SOURCE RESISTANCE
4
TJ = 150°C
TJ = −55°C
2
3
5
4
6
7
9
10
14
16
8
Figure 2. Transfer Characteristics
0.8
0.6
0.4
−50
6
Figure 1. On−Region Characteristics
0.9
2.2
8
VGS, GATE−TO−SOURCE VOLTAGE (V)
TJ = 25°C
ID = 4 A
2.4
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
1.0
4
TJ = 25°C
12
0
1.1
0.4
VDS = 15 V
2
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
0
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
14
VGS = 6.0 V
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
16
VGS = 10 V to 6.5 V
1.1
TJ = 25°C
VGS = 10 V
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0
2
6
4
8
10
12
ID, DRAIN CURRENT (A)
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
1.125
1.100
ID = 250 mA
1.075
1.050
1.025
1.000
0.975
0.950
0.925
−50
Figure 5. On−Resistance Variation with
Temperature
−25
0
25
50
75
100
125
TJ, JUNCTION TEMPERATURE (°C)
Figure 6. Breakdown Voltage Variation with
Temperature
http://onsemi.com
4
150
NDD60N550U1
10,000
1.15
ID = 250 mA
1.10
TJ = 150°C
1.00
0.95
0.90
0.85
0.80
TJ = 125°C
100
TJ = 100°C
0.75
0.70
0.65
−50
10,000
C, CAPACITANCE (pF)
1000
−25
0
25
50
75
100
VGS = 0 V
TJ = 25°C
f = 1 MHz
10
1
10
100
12
400
500
600
300
10
9
8
7
1000
350
QT
11
VDS
200
QGD
150
4
3
2
1
0
250
VGS
QGS
6
5
100
VDS = 300 V
TJ = 25°C
ID = 9.5 A
0
2
4
6
8
10
12
14
16
50
18
20
0
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
QG, TOTAL GATE CHARGE (nC)
Figure 9. Capacitance Variation
Figure 10. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
100
1000
VGS = 10 V
VDD = 300 V
ID = 9.5 A
TJ = 100°C
IS, SOURCE CURRENT (A)
t, TIME (ns)
300
Figure 8. Drain−to−Source Leakage Current
vs. Voltage
100
td(off)
100
tf
tr
td(on)
10
1
200
Figure 7. Threshold Voltage Variation with
Temperature
CISS
0.1
100
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
CRSS
1
0
TJ, JUNCTION TEMPERATURE (°C)
COSS
1000
10
150
125
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
IDSS, LEAKAGE (nA)
1.05
VGS, GATE−TO−SOURCE VOLTAGE (V)
VGS(th), NORMALIZED THRESHOLD VOLTAGE
TYPICAL CHARACTERISTICS
1
10
TJ = 125°C
10
TJ = 150°C
1
0.1
100
TJ = 25°C
0.4
0.5
0.6
0.7
0.8
TJ = −55°C
0.9
1.0
1.1
RG, GATE RESISTANCE (W)
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 11. Resistive Switching Time Variation
vs. Gate Resistance
Figure 12. Diode Forward Voltage vs. Current
http://onsemi.com
5
NDD60N550U1
TYPICAL CHARACTERISTICS
ID, DRAIN CURRENT (A)
100
VGS ≤ 25 V
Single Pulse
TC = 25°C
10
10 ms
100 ms
1
0.1
0.01
1 ms
10 ms
dc
RDS(on) Limit
Thermal Limit
Package Limit
0.1
1
10
100
1000
R(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (°C/W)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 13. Maximum Rated Forward Biased
Safe Operating Area
10
RqJC steady state = 1.3°C/W
1
Duty Cycle = 0.5
0.20
0.10
0.1
0.05
0.02
0.01
0.01
Single Pulse
1E−06
1E−05
1E−04
1E−03
1E−02
1E−01
1E+00
t, TIME (s)
Figure 14. Thermal Impedance (Junction−to−Case)
http://onsemi.com
6
1E+01
1E+02
1E+03
NDD60N550U1
PACKAGE DIMENSIONS
IPAK
CASE 369D
ISSUE C
C
B
V
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
E
R
4
A
S
1
2
DIM
A
B
C
D
E
F
G
H
J
K
R
S
V
Z
Z
3
−T−
SEATING
PLANE
K
J
F
D
G
H
3 PL
0.13 (0.005)
M
INCHES
MIN
MAX
0.235 0.245
0.250 0.265
0.086 0.094
0.027 0.035
0.018 0.023
0.037 0.045
0.090 BSC
0.034 0.040
0.018 0.023
0.350 0.380
0.180 0.215
0.025 0.040
0.035 0.050
0.155
−−−
MILLIMETERS
MIN
MAX
5.97
6.35
6.35
6.73
2.19
2.38
0.69
0.88
0.46
0.58
0.94
1.14
2.29 BSC
0.87
1.01
0.46
0.58
8.89
9.65
4.45
5.45
0.63
1.01
0.89
1.27
3.93
−−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
T
3.5 MM IPAK, STRAIGHT LEAD
CASE 369AD
ISSUE B
E
E3
L2
E2
A1
D2
D
L1
L
T
SEATING
PLANE
A
A1
b1
2X
e
A2
3X
E2
b
0.13
M
T
D2
OPTIONAL
CONSTRUCTION
http://onsemi.com
7
NOTES:
1.. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2.. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.15 AND
0.30mm FROM TERMINAL TIP.
4. DIMENSIONS D AND E DO NOT INCLUDE
MOLD GATE OR MOLD FLASH.
DIM
A
A1
A2
b
b1
D
D2
E
E2
E3
e
L
L1
L2
MILLIMETERS
MIN
MAX
2.19
2.38
0.46
0.60
0.87
1.10
0.69
0.89
0.77
1.10
5.97
6.22
4.80
−−−
6.35
6.73
4.57
5.45
4.45
5.46
2.28 BSC
3.40
3.60
−−−
2.10
0.89
1.27
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
NDD60N550U1
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE)
CASE 369C
ISSUE D
A
E
b3
c2
B
Z
D
1
L4
A
4
L3
b2
e
2
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DIMENSIONS b3, L3 and Z.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH, PROTRUSIONS, OR BURRS. MOLD
FLASH, PROTRUSIONS, OR GATE BURRS SHALL
NOT EXCEED 0.006 INCHES PER SIDE.
5. DIMENSIONS D AND E ARE DETERMINED AT THE
OUTERMOST EXTREMES OF THE PLASTIC BODY.
6. DATUMS A AND B ARE DETERMINED AT DATUM
PLANE H.
C
H
DETAIL A
3
c
b
0.005 (0.13)
M
H
C
L2
GAUGE
PLANE
C
L
SEATING
PLANE
A1
L1
DETAIL A
ROTATED 905 CW
SOLDERING FOOTPRINT*
6.20
0.244
2.58
0.102
5.80
0.228
3.00
0.118
1.60
0.063
INCHES
DIM MIN
MAX
A 0.086 0.094
A1 0.000 0.005
b 0.025 0.035
b2 0.030 0.045
b3 0.180 0.215
c
0.018 0.024
c2 0.018 0.024
D 0.235 0.245
E 0.250 0.265
e
0.090 BSC
H 0.370 0.410
L 0.055 0.070
L1
0.108 REF
L2
0.020 BSC
L3 0.035 0.050
L4
−−− 0.040
Z 0.155
−−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERS
MIN
MAX
2.18
2.38
0.00
0.13
0.63
0.89
0.76
1.14
4.57
5.46
0.46
0.61
0.46
0.61
5.97
6.22
6.35
6.73
2.29 BSC
9.40 10.41
1.40
1.78
2.74 REF
0.51 BSC
0.89
1.27
−−−
1.01
3.93
−−−
6.17
0.243
SCALE 3:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks,
copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC
reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any
particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without
limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications
and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC
does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for
surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where
personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and
its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly,
any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture
of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: orderlit@onsemi.com
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5817−1050
http://onsemi.com
8
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NDF60N550U1/D
Download