Agilent 93000 Pin Scale 800 Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip (SOC) and System-in-Package (SIP) devices. To test these devices, a test system must have the capability to address a range of performance challenges: structural test requirements, rising processing speeds for logic cores, different interfaces and more. And this must all be done at a lower costof-test than last year because of ongoing price erosion. An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce cost-of-test. Product Summary Per-pin scalability up to 800 Mbps High density digital card with per-pin scalability up to 800 Mbps offers the lowest cost SOC test in production. The Pin Scale 800 offers broad scalability starting at 200 Mbps for low cost, low performance needs and scaling to 800 Mbps for higher performance demands — all with a single digital card. With per-pin licenses to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Pin Scale 800 digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest cost of test. As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale 800 can be instantly reconfigured through software to maximize the lifetime of your investment. With 32 pins on the Pin Scale 800 digital card, an Agilent 93000 can be configured with up to 2048 pins, providing the pin count needed for multi-site test of even high pin count devices. With a Test ProcessorPer-Pin architecture, the Pin Scale 800 provides true parallel test for lowest cost-of-test. Performance for next-generation SOC devices With digital speeds up to 800 Mbps and memory up to 256 MB (X4 Mode) on each pin, the Pin Scale 800 delivers the performance demanded by next-generation devices. Per-pin speed scalability from 200 Mbps to 800 Mbps provides the performance needed to test a wide range of interfaces, including USB2.0 and IEEE1394. This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds. Edge placement accuracy of ±100 ps means the Pin Scale 800 provides the accuracy demanded for DDR interface test to speeds over 400 Mbps. The Pin Scale 800 protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future. 2 Cost savings with per-pin software configuration Low cost solution with quick upgrades The broad scalability of the Pin Scale 800 when coupled with Agilent InstaPin provides the industry’s only per-pin software configuration of an SOC platform. Each pin of the Pin Scale 800 can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin. The Pin Scale 800 digital card offers a low entry price at just $600 per pin for 200 Mbps performance, with the ability to quickly upgrade in the future as your needs change. This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds. Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need it. Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world. This unprecedented flexibility allows the Agilent 93000 to match the next device to be tested, instantly. Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement. Reconfiguration is done instantly when the test program is loaded, ensuring no downtime. True parallel test for lowest costof-test The Pin Scale 800 features 32 pins per card, enabling the Agilent 93000 to be configured with up to 2048 pins for multisite test of today’s high pin count SOC and SIP devices. The value of parallel test, however, depends on its efficiency. The Pin Scale 800 features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing maximum parallel efficiency. The Pin Scale 800’s pin count density and architecture enable true parallel test for the lowest cost-of-test. Features and Benefits Feature Benefits Up to 800 Mbps Speed for testing a range of applications and interfaces – USB2.0, IEEE1394, DDR and more – for maximum utilization. Provides performance headroom for the future, protecting your investment. Per-pin scalability from 200 to 800 Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost. $600 per pin for 200 Mbps performance Low entry price, with per-pin software licenses for speed and memory, offer the flexibility to add the performance you need, when you need it at a low cost. Up to 2048 pins Support of multi-site for high pin count devices reduces cost-of-test. Pin EPA of ±100 ps 400 MHz sequencer rate Better results and improved yield with accurate measurements. Provides performance for high speed interface test, such as DDR, operating over 400 Mbps. Flexible waveform generation for high-speed applications. Also beneficial to generate low jitter high-speed clock signals. Optional 256 waveforms Provides greater timing flexibility for ease of programming. Testing in higher x-modes means that more logical vector memory is available. Unified memory approach The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility. Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher throughput. Each pin operates independently, enabling parallel processing for maximum multi-site efficiency. Compatible with Agilent 93000 Ce-channels Protects your investment in equipment, people and training Additional Detail Up to 2048 pins The Pin Scale 800 offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards. This enables the Agilent 93000 to offer the following pin counts: • up to 2048 pins (or 1792 pins + analog) with a large testhead (72 slots) to support maximum capability • up to 1024 pins (or 768 pins + analog) with an affordable small testhead (36 slots) • up to 512 pins (or 256 pins + analog) with a low cost 18 slot small testhead Test Processor-Per-Pin architecture The Pin Scale digital cards feature a Test Processor Per-Pin architecture, which localizes all test processing instead of using centralized resources. This results in minimal measurement overhead and higher throughput. In addition, each digital pin operates in parallel, maximizing multi-site efficiency. Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors. The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. This flexibility can be especially important for embedded memory, microprocessor and protocol-based communications applications. 3 www.agilent.com Key Specifications Options Specification Value Max. I/O Data Rate 400 Mbit/s @ 3V swing 800 Mbit/s @ 1V swing Available per-pin licenses for data rate: • 200 Mbit/s @ 1V swing • 400 Mbit/s @ 1V swing • 800 Mbit/s @ 1V swing Max. CLK Rate 200 MHz @ 3V swing 400 MHz @ 1V swing EPA (within any card cage) ±100 ps @ 3V up to 400 Mbit/s ±110 ps @ 1V up to 800 Mbit/s EPA (entire system) ±175 ps OTA (within any card cage) ±200 ps @ 3V up to 400 Mbit/s ±220 ps @ 1V up to 800 Mbit/s OTA (entire system) ±350 ps Additional Information Edge Placement Resolution 1 ps For more information about the Agilent 93000 SOC Series, please visit: Available per-pin licenses for memory depth: • 8 Mbyte (X1 Mode) • 16 Mbyte (X1 Mode) • 32 Mbyte (X1 Mode) • 64 Mbyte (X1 Mode) www.agilent.com/see/soc Contact Information For more information about the Agilent 93000 Pin Scale 800, please contact your local Agilent sales representative. www.agilent.com/see/contactus This information is subject to change without notice. © Agilent Technologies, Inc. 2005 March 11, 2005 5989-2596EN