Agilent 93000 Pin Scale 800
Product Overview
Industry Challenges
Consumer demand for more
capability and connectivity in
a single product is driving the
need for more functionality,
faster processing and higher
speed interfaces in next-generation System-on-a-Chip (SOC) and
System-in-Package (SIP) devices.
To test these devices, a test system must have the capability to
address a range of performance
challenges: structural test
requirements, rising processing
speeds for logic cores, different
interfaces and more. And this
must all be done at a lower costof-test than last year because of
ongoing price erosion.
An uncertain future demands
the ability to upgrade quickly
to meet the next performance
challenge while continuing to
reduce cost-of-test.
Product Summary
Per-pin scalability up to 800 Mbps
High density digital card with per-pin scalability up to
800 Mbps offers the lowest cost SOC test in production.
The Pin Scale 800 offers broad
scalability starting at 200 Mbps
for low cost, low performance
needs and scaling to 800 Mbps
for higher performance demands
— all with a single digital card.
With per-pin licenses to enable
the different speed and memory
performance levels — part of the
industry-first Agilent InstaPin
performance library — the Pin
Scale 800 digital card can be
configured to match the device
requirements, pin-by-pin, resulting in the lowest cost of test. As
test needs change to accommodate a new class of device or
next-generation performance,
the Pin Scale 800 can be instantly reconfigured through software
to maximize the lifetime of your
investment.
With 32 pins on the Pin Scale
800 digital card, an Agilent
93000 can be configured with
up to 2048 pins, providing the
pin count needed for multi-site
test of even high pin count
devices. With a Test ProcessorPer-Pin architecture, the Pin
Scale 800 provides true parallel
test for lowest cost-of-test.
Performance for next-generation
SOC devices
With digital speeds up to 800
Mbps and memory up to 256
MB (X4 Mode) on each pin,
the Pin Scale 800 delivers the
performance demanded by
next-generation devices. Per-pin
speed scalability from 200 Mbps
to 800 Mbps provides the
performance needed to test a
wide range of interfaces, including USB2.0 and IEEE1394. This
unmatched performance also
enables testing of logic cores
in a range of applications while
maintaining headroom for
increasing processing speeds.
Edge placement accuracy of
±100 ps means the Pin Scale
800 provides the accuracy
demanded for DDR interface
test to speeds over 400 Mbps.
The Pin Scale 800 protects your
investment through expanded
scalability, which provides the
performance needed to test a
wide variety of devices now and
into the future.
2
Cost savings with per-pin software
configuration
Low cost solution with quick
upgrades
The broad scalability of the Pin
Scale 800 when coupled with
Agilent InstaPin provides the
industry’s only per-pin software
configuration of an SOC platform. Each pin of the Pin Scale
800 can be scaled over its wide
memory depth and speed range
through per-pin software licenses, which provides the lowest
cost of test by allowing the test
system to be configured to
match device requirements,
pin-by-pin.
The Pin Scale 800 digital card
offers a low entry price at just
$600 per pin for 200 Mbps performance, with the ability to
quickly upgrade in the future
as your needs change. This
lowers immediate capital investment and provides for future
growth as devices evolve from
generation to generation,
integrating more high-speed
interfaces or achieving higher
processing speeds. Per-pin
software licenses for speed and
memory depth mean you add
just the performance you need,
when you need it.
Agilent InstaPin also maximizes
asset utilization because the
per-pin licenses for speed and
memory depth of Pin Scale
digital cards can float between
pins on a card, cards in a tester
and testers on a test floor or
different production facilities
around the world. This unprecedented flexibility allows the
Agilent 93000 to match the next
device to be tested, instantly.
Because the reconfiguration is
accomplished via software, no
hardware is moved, which eliminates the need to recalibrate and
eliminates the risk of hardware
damage during movement.
Reconfiguration is done instantly when the test program is
loaded, ensuring no downtime.
True parallel test for lowest costof-test
The Pin Scale 800 features 32
pins per card, enabling the
Agilent 93000 to be configured
with up to 2048 pins for multisite test of today’s high pin
count SOC and SIP devices. The
value of parallel test, however,
depends on its efficiency.
The Pin Scale 800 features a
Test Processor-Per-Pin architecture, which allows all processing
to occur locally in the card, and
in parallel across pins, providing
maximum parallel efficiency.
The Pin Scale 800’s pin count
density and architecture enable
true parallel test for the lowest
cost-of-test.
Features and Benefits
Feature
Benefits
Up to 800 Mbps
Speed for testing a range of applications and interfaces –
USB2.0, IEEE1394, DDR and more – for maximum utilization.
Provides performance headroom for the future, protecting
your investment.
Per-pin scalability from
200 to 800 Mbps
The test system can be configured to match device requirements, pin-by-pin, for lowest cost.
$600 per pin for 200
Mbps performance
Low entry price, with per-pin software licenses for speed
and memory, offer the flexibility to add the performance you
need, when you need it at a low cost.
Up to 2048 pins
Support of multi-site for high pin count devices reduces
cost-of-test.
Pin EPA of ±100 ps
400 MHz sequencer rate
Better results and improved yield with accurate measurements. Provides performance for high speed interface test,
such as DDR, operating over 400 Mbps.
Flexible waveform generation for high-speed applications.
Also beneficial to generate low jitter high-speed clock
signals.
Optional 256 waveforms
Provides greater timing flexibility for ease of programming.
Testing in higher x-modes means that more logical vector
memory is available.
Unified memory
approach
The entire amount of purchased memory is available for
both test vectors and sequencer instructions for maximum
flexibility.
Test Processor-Per-Pin
architecture
Localizing all test processing instead of using centralized
resources results in minimal measurement overhead and
higher throughput. Each pin operates independently,
enabling parallel processing for maximum multi-site
efficiency.
Compatible with Agilent
93000 Ce-channels
Protects your investment in equipment, people and training
Additional Detail
Up to 2048 pins
The Pin Scale 800 offers 32 pins
per card, which is twice the
density of the Ce- and P-model
digital cards. This enables the
Agilent 93000 to offer the
following pin counts:
• up to 2048 pins (or 1792 pins
+ analog) with a large testhead
(72 slots) to support maximum
capability
• up to 1024 pins (or 768 pins
+ analog) with an affordable
small testhead (36 slots)
• up to 512 pins (or 256 pins
+ analog) with a low cost 18
slot small testhead
Test Processor-Per-Pin architecture
The Pin Scale digital cards
feature a Test Processor Per-Pin
architecture, which localizes all
test processing instead of using
centralized resources. This
results in minimal measurement
overhead and higher throughput.
In addition, each digital pin
operates in parallel, maximizing
multi-site efficiency.
Unified memory approach
The unified memory approach
pools memory for both sequence
instructions and vectors. The
entire amount of purchased
memory is available for both
test vectors and sequencer
instructions, which provides
more flexibility than architectures based upon two unshared
memory areas. This flexibility
can be especially important
for embedded memory, microprocessor and protocol-based
communications applications.
3
www.agilent.com
Key Specifications
Options
Specification
Value
Max. I/O Data Rate
400 Mbit/s @ 3V swing
800 Mbit/s @ 1V swing
Available per-pin licenses
for data rate:
• 200 Mbit/s @ 1V swing
• 400 Mbit/s @ 1V swing
• 800 Mbit/s @ 1V swing
Max. CLK Rate
200 MHz @ 3V swing
400 MHz @ 1V swing
EPA (within any card cage)
±100 ps @ 3V up to 400 Mbit/s
±110 ps @ 1V up to 800 Mbit/s
EPA (entire system)
±175 ps
OTA (within any card cage)
±200 ps @ 3V up to 400 Mbit/s
±220 ps @ 1V up to 800 Mbit/s
OTA (entire system)
±350 ps
Additional Information
Edge Placement
Resolution
1 ps
For more information about
the Agilent 93000 SOC Series,
please visit:
Available per-pin licenses
for memory depth:
• 8 Mbyte (X1 Mode)
• 16 Mbyte (X1 Mode)
• 32 Mbyte (X1 Mode)
• 64 Mbyte (X1 Mode)
www.agilent.com/see/soc
Contact Information
For more information about
the Agilent 93000 Pin Scale 800,
please contact your local Agilent
sales representative.
www.agilent.com/see/contactus
This information is subject to change without notice.
© Agilent Technologies, Inc. 2005
March 11, 2005
5989-2596EN