ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 24-Bit Analog-to-Digital Converter For Bridge Sensors FEATURES DESCRIPTION 1 • • • • 2 • • • • • • • • • • • Complete Front-End for Bridge Sensors Up to 23.5 Effective Bits Onboard, Low-Noise PGA RMS Noise: 17nV at 10SPS (PGA = 128) 44nV at 80SPS (PGA = 128) 19.2-Bit Noise-Free Resolution at Gain = 64 Over 100dB Simultaneous 50Hz and 60Hz Rejection Flexible Clocking: Low-Drift Onboard Oscillator (±3%) Optional External Crystal Selectable Gains of 1, 2, 64, and 128 Easy Ratiometric Measurements– External Voltage Reference up to 5V Selectable 10SPS or 80SPS Data Rates Two-Channel Differential Input with Built-In Temperature Sensor (ADS1232) Four-Channel Differential Input (ADS1234) Simple Serial Digital Interface Supply Range: 2.7V to 5.3V –40°C to +105°C Temperature Range The ADS1232 and ADS1234 are precision 24-bit analog-to-digital converters (ADCs). With an onboard, low-noise programmable gain amplifier (PGA), precision delta-sigma ADC and internal oscillator, the ADS1232/4 provide a complete front-end solution for bridge sensor applications including weigh scales, strain gauges and pressure sensors. The input multiplexer accepts either two (ADS1232) or four (ADS1234) differential inputs. The ADS1232 also includes an onboard temperature sensor to monitor ambient temperature. The onboard, low-noise PGA has a selectable gain of 1, 2, 64, or 128 supporting a full-scale differential input of ±2.5V, ±1.25V, ±39mV, or ±19.5mV. The delta-sigma ADC has 23.5-bit effective resolution and is comprised of a 3rd-order modulator and 4th-order digital filter. Two data rates are supported: 10SPS (with both 50Hz and 60Hz rejection) and 80SPS. The ADS1232/4 can be clocked externally using an oscillator or a crystal. There is also an internal oscillator available that requires no external components. Offset calibration is performed on-demand and the ADS1232/4 can be put in a low-power standby mode or shut off completely in power-down mode. All of the features of the ADS1232/4 are operated through simple pin-driven control. There are no digital registers to program in order to simplify software development. Data are output over an easily-isolated serial interface that connects directly to the MSP430 and other microcontrollers. APPLICATIONS • • • • Weigh Scales Strain Gauges Pressure Sensors Industrial Process Control The ADS1232 is available in a TSSOP-24 package and the ADS1234 is in a TSSOP-28. Both are fully specified from -40°C to +105°C. CAP AVDD ADS1234 Only DVDD GAIN [1:0] Gain = 1, 2, 64, or 128 AINP1 AINN1 AINP2 AINN2 REFP REFN Input Mux PGA PDWN DRDY/DOUT DS ADC AINP3 AINN3 SCLK Internal Oscillator AINP4 AINN4 SPEED External Oscillator (1) A1/TEMP A0 AGND CAP CLKIN/XTAL1 XTAL2 DGND NOTE: (1) A1 for ADS1234, TEMP for ADS1232. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2005–2008, Texas Instruments Incorporated ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI website at www.ti.com. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) ADS1232, ADS1234 UNIT –0.3 to +6 V DVDD to DGND –0.3 to +6 V AGND to DGND –0.3 to +0.3 V 100, Momentary mA AVDD to AGND Input Current Input Current 10, Continuous mA Analog Input Voltage to AGND –0.3 to AVDD + 0.3 V Digital Input Voltage to DGND –0.3 to DVDD + 0.3 V +150 °C Operating Temperature Range –40 to +105 °C Storage Temperature Range –60 to +150 °C Maximum Junction Temperature (1) 2 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 ELECTRICAL CHARACTERISTICS All specifications at TA = –40°C to +105°C, AVDD = DVDD = VREFP = +5V, and VREFN = AGND, unless otherwise noted. ADS1232, ADS1234 PARAMETER CONDITIONS MIN TYP MAX UNIT Analog Inputs Full-Scale Input Voltage (AINP – AINN) Common-Mode Input Range ±0.5VREF/Gain AINxP or AINxN with respect to GND, Gain = 1, 2 Gain = 64, 128 AGND – 0.1 Differential Input Current AVDD + 0.1 AGND + 1.5V Gain = 1 Gain = 2 Gain = 64, 128 V AVDD – 1.5V V V ±3 nA ±6 nA ±3.5 nA System Performance Resolution Data Rate Digital Filter Settling Time Integral Nonlinearity (INL) Input Offset Error (2) Input Offset Drift Gain Error (3) Gain Drift Normal-Mode Rejection (4) Common-Mode Rejection No Missing Codes 24 Internal Oscillator, SPEED = High 78 Internal Oscillator, SPEED = Low 9.75 82.4 SPS 10 10.3 SPS External Oscillator, SPEED = High fCLK/61,440 External Oscillator, SPEED = Low fCLK/491,520 Full Settling SPS SPS 4 Differential Input, End-Point Fit Gain = 1, 2 ±0.0002 Differential Input, End-Point Fit Gain = 64, 128 ±0.0004 Gain = 1 Gain = 128 % of FSR (1) % of FSR ppm of FS ±0.02 ±1 ppm of FS Gain = 128 ±10 Gain = 128 ±0.001 ±5 ±0.3 Gain = 1 Conversions ±0.2 Gain = 1 µV/°C nV/°C ±0.001 ±0.02 ±0.01 ±0.1 % % Gain = 1 ±0.2 ppm/°C Gain = 128 ±2.5 ppm/°C Internal Oscillator, fDATA = 10SPS fIN = 50Hz or 60Hz, ±1Hz 100 110 dB External Oscillator, fDATA = 10SPS fIN = 50Hz or 60Hz, ±1Hz 120 130 dB at DC, Gain = 1, ΔV = 1V 95 110 dB at DC, Gain = 128, ΔV = 0.1V 95 110 dB Input-Referred Noise Power-Supply Rejection Bits 80 See Noise Performance Tables at DC, Gain = 1, ΔV = 1V 100 120 dB at DC, Gain = 128, ΔV = 0.1V 100 120 dB 1.5 AVDD Voltage Reference Input Voltage Reference Input (VREF) AVDD + 0.1V V Negative Reference Input (VREFN) VREF = VREFP – VREFN AGND – 0.1 VREFP – 1.5 V Positive Reference Input (VREFP) VREFN + 1.5 AVDD + 0.1 V Voltage Reference Input Current (1) (2) (3) (4) 10 nA FSR = full-scale range = VREF/Gain. Offset calibration can minimize these errors to the level of noise at any temperature. Gain errors are calibrated at the factory (AVDD = +5V, all gains, TA = +25°C). Specification is assured by the combination of design and final production test. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 3 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 ELECTRICAL CHARACTERISTICS (continued) All specifications at TA = –40°C to +105°C, AVDD = DVDD = VREFP = +5V, and VREFN = AGND, unless otherwise noted. ADS1232, ADS1234 PARAMETER CONDITIONS MIN TYP MAX UNIT Digital Logic Levels VIH 0.7 DVDD DVDD + 0.1 V VIL DGND 0.2 DVDD V VOH IOH = 1mA VOL IOL = 1mA Input Leakage DVDD – 0.4 V 0 < VIN < DVDD External Clock Input Frequency (fCLKIN) 0.2 4.9152 Serial Clock Input Frequency (fSCLK) 0.2 DVDD V ±10 µA 8 MHz 5 MHz Power Supply Power-Supply Voltage (AVDD, DVDD) Analog Supply Current Digital Supply Current Power Dissipation, Total 4 2.7 5.3 V Normal Mode, AVDD = 3V, Gain = 1, 2 600 1300 µA Normal Mode, AVDD = 3V, Gain = 64, 128 1350 2500 µA Normal Mode, AVDD = 5V, Gain = 1, 2 650 1300 µA Normal Mode, AVDD = 5V, Gain = 64, 128 1350 2500 µA Standby Mode 0.1 1 µA Power-Down 0.1 1 µA Normal Mode, DVDD = 3V, Gain = 1, 2 60 95 µA Normal Mode, DVDD = 3V, Gain = 64, 128 75 120 µA Normal Mode, DVDD = 5V, Gain = 1, 2 95 130 µA Normal mode, DVDD = 5V, Gain = 64, 128 75 120 µA Standby Mode, SCLK = High, DVDD = 3V 45 80 µA Standby Mode, SCLK = High, DVDD = 5V 65 80 µA Power-Down 0.2 1.3 µA Normal Mode, AVDD = DVDD = 3V, Gain = 1, 2 2 4.2 mW Normal Mode, AVDD = DVDD = 5V, Gain = 1, 2 3.7 7.2 mW Normal Mode, AVDD = DVDD = 3V, Gain = 64, 128 4.3 7.9 mW Normal Mode, AVDD = DVDD = 5V, Gain = 64, 128 7.1 13.1 mW Standby Mode, AVDD = DVDD = 5V 0.3 0.4 mW Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 NOISE PERFORMANCE The ADS1232/4 offer outstanding noise performance that can be optimized for a given full-scale range using the on-chip programmable gain amplifier. Table 1 through Table 4 summarize the typical noise performance with inputs shorted externally for different gains, data rates, and voltage reference values. The RMS and Peak-to-Peak noise are referred to the input. The Effective Number of Bits (ENOB) is defined as: • ENOB = ln (FSR/RMS noise)/ln(2) The Noise-Free Bits are defined as: • Noise-Free Bits = ln (FSR/Peak-to-Peak Noise)/ln(2) Where FSR (Full-Scale Range) = VREF/Gain Table 1. AVDD = 5V, VREF = 5V, Data Rate = 10SPS (1) GAIN RMS NOISE PEAK-TO-PEAK NOISE (1) ENOB (RMS) NOISE-FREE BITS 1 420nV 1.79µV 23.5 21.4 2 270nV 900nV 23.1 21.4 64 19nV 125nV 22.0 19.2 128 17nV 110nV 21.1 18.4 Peak-to-peak noise data are based on direct measurement. Table 2. AVDD = 5V, VREF = 5V, Data Rate = 80SPS (1) GAIN RMS NOISE PEAK-TO-PEAK NOISE (1) ENOB (RMS) NOISE-FREE BITS 1 1.36µV 8.3µV 21.8 19.2 2 850nV 5.5µV 21.5 18.8 64 48nV 307nV 20.6 18 128 44nV 247nV 19.7 17.2 Peak-to-peak noise data are based on direct measurement. Table 3. AVDD = 3V, VREF = 3V, Data Rate = 10SPS (1) GAIN RMS NOISE PEAK-TO-PEAK NOISE (1) ENOB (RMS) NOISE-FREE BITS 1 450nV 2.8µV 22.6 20 2 325nV 1.8µV 22.1 19.7 64 20nV 130nV 21.2 18.5 128 18nV 115nV 20.3 17.6 Peak-to-peak noise data are based on direct measurement. Table 4. AVDD = 3V, VREF = 3V, Data Rate = 80SPS (1) GAIN RMS NOISE PEAK-TO-PEAK NOISE (1) ENOB (RMS) NOISE-FREE BITS 1 2.2µV 12µV 20.4 17.9 2 1.2µV 6.8µV 20.2 17.8 64 54nV 340nV 19.7 17.1 128 48nV 254nV 18.9 16.5 Peak-to-peak noise data are based on direct measurement of 1024 samples. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 5 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 PIN CONFIGURATION DVDD 1 28 DRDY/DOUT DGND 2 27 SCLK CLKIN/XTAL1 3 26 PDWN DVDD 1 24 DRDY/DOUT DGND 2 23 SCLK CLKIN/XTAL1 3 22 PDWN XTAL2 4 25 SPEED XTAL2 4 21 SPEED DGND 5 24 GAIN1 DGND 5 20 GAIN1 DGND 6 23 GAIN0 DGND 6 19 GAIN0 A1 7 22 AVDD ADS1232 6 ADS1234 TEMP 7 18 AVDD A0 8 21 AGND A0 8 17 AGND CAP 9 20 REFP CAP 9 16 REFP CAP 10 19 REFN CAP 10 15 REFN AINP1 11 18 AINP2 AINP1 11 14 AINP2 AINN1 12 17 AINN2 AINN1 12 13 AINN2 AINP3 13 16 AINP4 AINN3 14 15 AINN4 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 PIN DESCRIPTIONS TERMINAL NAME ADS1232 ADS1234 ANALOG/DIGITAL INPUT/OUTPUT DVDD 1 1 Digital Digital Power Supply: 2.7V to 5.3V DGND 2 2 Digital Digital Ground CLKIN/ XTAL1 3 3 Digital/Digital Input XTAL2 4 4 Digital External crystal connection DGND 5 5 Digital Digital Ground DGND 6 6 Digital Digital Ground TEMP 7 – Digital Input DESCRIPTION External Clock Input: typically 4.9152MHz. Tie low to activate internal oscillator. Can also use external crystal across CLKIN/XTAL1 and XTAL2 pins. See text for more details. Onboard Temperature Diode Enable Input Mux Select Input pin (MSB) Input Mux Select Input pin (LSB): A1 A0 – 8 7 8 CAP 9 9 CAP 10 AINP1 11 AINN1 Digital Input A1 A0 Channel 0 0 AIN1 0 1 AIN2 1 0 AIN3 1 1 AIN4 Analog Gain Amp Bypass Capacitor Connection 10 Analog Gain Amp Bypass Capacitor Connection 11 Analog Input Positive Analog Input Channel 1 12 12 Analog Input Negative Analog Input Channel 1 AINP3 – 13 Analog Input Positive Analog Input Channel 3 AINN3 – 14 Analog Input Negative Analog Input Channel 3 AINN4 – 15 Analog Input Negative Analog Input Channel 4 AINP4 – 16 Analog Input Positive Analog Input Channel 4 AINN2 13 17 Analog Input Negative Analog Input Channel 2 AINP2 14 18 Analog Input Positive Analog Input Channel 2 REFN 15 19 Analog Input Negative Reference Input REFP 16 20 Analog Input Positive Reference Input AGND 17 21 Analog Analog Ground AVDD 18 22 Analog Analog Power Supply, 2.7V to 5.3V Gain Select GAIN0 GAIN1 19 20 23 24 Digital Input GAIN1 GAIN0 GAIN 0 0 1 0 1 2 1 0 64 1 1 128 Data Rate Select: SPEED 21 25 Digital Input SPEED DATA RATE 0 10SPS 1 80SPS PDWN 22 26 Digital Input Power-Down: Holding this pin low powers down the entire converter and resets the ADC. SCLK 23 27 Digital Input Serial Clock: Clock out data on the rising edge. Also used to initiate Offset Calibration and Sleep modes. See text for more details. DRDY/ DOUT 24 28 Digital Output Dual-Purpose Output: Data Ready: Indicates valid data by going low. Data Output: Outputs data, MSB first, on the first rising edge of SCLK. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 7 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 TYPICAL CHARACTERISTICS At TA = +25°C, AVDD = DVDD = VREFP = 5V, and VREFN = AGND, unless otherwise noted. NOISE PLOT NOISE PLOT 25 6 PGA = 1 Data Rate = 10SPS 5 20 15 3 Output Code (LSB) Output Code (LSB) 4 2 1 −1 −2 −3 10 5 0 −5 −10 −4 −15 −5 −20 PGA = 128 Data Rate = 10SPS −25 −6 0 200 400 600 800 0 1000 200 Figure 1. Figure 2. 1000 NOISE HISTOGRAM PGA = 128 Data Rate = 10SPS 90 80 70 200 Occurrence Occurrence 800 100 PGA = 1 Data Rate = 10SPS 250 600 Time (Reading Number) NOISE HISTOGRAM 300 400 Time (Reading Number) 150 100 60 50 40 30 20 50 10 0 0 −2 −4 0 −16 4 2 −8 8 Output Code (LSB) Figure 3. Figure 4. NOISE PLOT 16 NOISE PLOT 70 22.5 PGA = 1 Data Rate = 80SPS 17.5 0 Output Code (LSB) PGA = 128 Data Rate = 80SPS 50 Output Code (LSB) Output Code(LSB) 12.5 7.5 2.5 −2.5 −7.5 −12.5 10 −10 −30 −50 −17.5 −70 −22.5 0 8 30 200 400 600 800 1000 0 200 400 600 Time (Reading Number) Time (Reading Number) Figure 5. Figure 6. 800 1000 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 TYPICAL CHARACTERISTICS (continued) At TA = +25°C, AVDD = DVDD = VREFP = 5V, and VREFN = AGND, unless otherwise noted. NOISE HISTOGRAM NOISE HISTOGRAM 50 180 PGA = 1 Data Rate = 80SPS 45 40 140 35 120 Occurance 100 80 30 25 20 60 15 40 10 20 5 0 0 −12 −6 0 6 −40 12 Figure 8. OFFSET DRIFT (+25°C to +105°C) 30 20 Offset Drift (nV/°C) Offset Drift (nV/°C) Figure 9. Figure 10. GAIN DRIFT (–40°C to +25°C) 500 400 300 200 GAIN DRIFT (+25°C to +105°C) 20 PGA = 1 Data Rate = 10SPS 90 Samples from 3 Lots 18 16 PGA = 1 Data Rate = 10SPS 90 Samples from 3 Lots 14 Counts 12 Counts 100 -500 500 600 300 400 100 200 0 0 -100 0 -200 5 -300 5 -400 10 -500 10 0 15 -100 15 PGA = 1 Data Rate = 10SPS 90 Samples from 3 Lots -200 Counts 20 -600 Counts PGA = 1 Data Rate = 10SPS 90 Samples from 3 Lots 25 14 40 35 25 16 20 Figure 7. OFFSET DRIFT (–40°C to +25°C) 18 0 Output Code (LSB) 35 30 −20 Output Code (LSB) -300 Occurance PGA = 128 Data Rate = 80SPS -400 160 10 8 6 12 10 8 6 4 4 0 -1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 2 0 -1.2 -1.1 -1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 2 Gain Drift (ppm/°C) Gain Drift (ppm/°C) Figure 11. Figure 12. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 9 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 TYPICAL CHARACTERISTICS (continued) At TA = +25°C, AVDD = DVDD = VREFP = 5V, and VREFN = AGND, unless otherwise noted. OFFSET DRIFT (–40°C to +25°C) OFFSET DRIFT (+25°C to +105°C) 30 20 PGA = 128 Data Rate = 10SPS 90 Samples from 3 Lots 25 16 14 Counts 20 Counts PGA = 128 Data Rate = 10SPS 90 Samples from 3 Lots 18 15 10 12 10 8 6 4 5 2 0 Offset Drift (nV/°C) Offset Drift (nV/°C) Figure 13. Figure 14. GAIN DRIFT (–40°C to +25°C) 30 20 25 15 5 10 0 -5 -10 -15 -20 -25 -30 50 40 30 20 10 0 -10 -20 -30 -40 -50 0 GAIN DRIFT (+25°C to +105°C) 25 20 PGA = 128 Data Rate = 10SPS 90 Samples from 3 Lots 20 PGA = 128 Data Rate = 10SPS 90 Samples from 3 Lots 18 16 Counts Counts 14 15 10 12 10 8 6 5 4 2 0 Gain Drift (ppm/°C) Gain Drift (ppm/°C) Figure 15. Figure 16. OFFSET vs TEMPERATURE 6.0 5.5 4.5 5.0 3.5 4.0 2.5 3.0 1.5 2.0 1.0 0 0.5 5.0 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0 0 GAIN ERROR vs TEMPERATURE 0.04 1000 PGA = 128 Data Rate = 10SPS 0.03 PGA = 128 Data Rate = 10SPS Gain Error (%) Offset (nV) 500 0 0.02 0.01 0 −500 −0.01 −1000 10 −50 −30 −10 −0.02 10 30 50 70 90 110 −50 −30 −10 10 30 50 Temperature (_C) Temperature (_C) Figure 17. Figure 18. 70 90 110 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 TYPICAL CHARACTERISTICS (continued) At TA = +25°C, AVDD = DVDD = VREFP = 5V, and VREFN = AGND, unless otherwise noted. NOISE vs INPUT SIGNAL NOISE vs INPUT SIGNAL 1000 PGA = 1 Data Rate = 10SPS 800 40 700 35 500 400 300 30 25 20 15 200 10 100 5 0 0.5 1.0 1.5 2.0 0 −19 2.5 −14.25 −9.5 −4.75 0 4.75 9.5 VIN (V) VIN (mV) Figure 19. Figure 20. INTEGRAL NONLINEARITY vs INPUT SIGNAL INTEGRAL NONLINEARITY vs INPUT SIGNAL 14.25 19 8 3 15 6 234.375 2 10 4 156.25 1 5 2 78.125 0 0 0 0 PGA = 1 −1 −5 −2 −10 −3 INL (ppmof FSR) 10 20 4 INL (µV) 25 5 390.625 PGA = 128 312.5 INL (nV) 600 0 −2.5 −2.0 −1.5 −1.0 −0.5 INL (ppm of FSR) PGA = 128 Data Rate = 10SPS 45 RMS Noise (nV) RMS Noise (nV) 900 50 −2 −78.125 −4 −156.25 −15 −6 −234.375 −4 −20 −8 −312.5 −5 −2.5 −2.0 −1.5 −1.0 −0.5 −25 0 0.5 1.0 1.5 2.0 2.5 −10 −19 −14.25 −9.5 −4.75 VIN (V) 0 4.75 14.25 −390.625 19 VIN (mV) Figure 21. Figure 22. ANALOG CURRENT vs TEMPERATURE DIGITAL CURRENT vs TEMPERATURE 120 2000 Normal Mode, PGA = 64, 128 Normal Mode, PGA = 1, 2 100 1200 Normal Mode, PGA = 1, 2 800 400 Digital Current (µA) 1600 Analog Current (µA) 9.5 Normal Mode, PGA = 64, 128 80 Sleep Mode, All PGAs 60 40 20 0 0 −50 −30 −10 10 30 50 70 90 110 −50 −30 −10 10 30 50 70 90 110 Temperature (_C) Temperature (_C) Figure 23. Figure 24. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 11 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 TYPICAL CHARACTERISTICS (continued) At TA = +25°C, AVDD = DVDD = VREFP = 5V, and VREFN = AGND, unless otherwise noted. DATA RATE vs TEMPERATURE 10.06 SPEED = LOW CLKIN/XTAL1 = LOW (Internal Oscillator) Data Rate (SPS) 10.01 9.96 9.91 9.86 −50 −30 −10 10 30 50 70 90 110 Temperature (_C) Figure 25. 12 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 OVERVIEW TEMPERATURE SENSOR (ADS1232 only) The ADS1232 and ADS1234 are highly integrated, 24-bit ADCs that include an input multiplexer, low-noise PGA, third-order delta-sigma (ΔΣ) modulator, and fourth-order digital filter. With input-referred RMS noise down to 17nV, the ADS1232/4 are ideally suited for measuring the very low signals produced by bridge sensors in applications such as weigh scales, strain gauges, and pressure sensors. On-chip diodes provide temperature-sensing capability. By setting the TEMP pin high, the selected analog inputs are disconnected and the inputs to the ADC are connected to the anodes of two diodes scaled to 1x and 80x in current and size, as shown in Figure 26. By measuring the difference in voltage of these diodes, temperature changes can be inferred from a baseline temperature. Typically, the difference in diode voltage is 111.7mV at 25°C with a temperature coefficient of 379µV/°C. With PGA = 1 and 2, the difference voltage output from the PGA will be 111.7mV and 223.4mV, respectively. With PGA = 64 and 128, it is impossible to use the temperature sensor function. A similar structure is used in the MSC1210 for temperature measurement. For more information, see TI application report SBAA100, Using the MSC121x as a High-Precision Intelligent Temperature Sensor, available for download at www.ti.com. Clocking can be supplied by an external oscillator, an external crystal, or by a precision internal oscillator. Data can be output at 10SPS for excellent 50Hz and 60Hz rejection, or at 80SPS when higher speeds are needed. The ADS1232/4 are easy to configure, and all digital control is accomplished through dedicated pins; there are no registers to program. A simple two-wire serial interface retrieves the data. ANALOG INPUTS (AINPx, AINNx) The input signal to be measured is applied to the input pins AINPx and AINNx. The positive internal input is generalized as AINP, and the negative internal input generalized as AINN. The signal is selected through the input mux, which is controlled by pins A0 and A1 (ADS1234 only), as shown in Table 5. For the ADS1232, the A1 pin is replaced by the TEMP pin to activate the onboard diodes (see the Temperature Sensor section for more details). The ADS1232/4 accept differential input signals, but can also measure unipolar signals. When measuring unipolar (or single-ended signals) with respect to ground, connect the negative input (AINNx) to ground and connect the input signal to the positive input (AINPx). Note that when the ADS1232/4 are configured this way, only half of the converter full-scale range is used, since only positive digital output codes are produced. ADS1232 Only AVDD 10I 1I AINP AINN 1X 8X AINP1 AINN1 AINP2 Table 5. Input Channel Selection with A0 and A1 (ADS1234 only) AINN2 MUX PINS AINN3 A1 A0 SELECTED ANALOG INPUTS POSITIVE INPUT AINP3 NEGATIVE INPUT AINP4 AINN4 0 0 AINP1 AINN1 0 1 AINP2 AINN2 1 0 AINP3 AINN3 1 1 AINP4 AINN3 ADS1234 Only A1 A0 Figure 26. Measurement of the Temperature Sensor in the Input Multiplexer Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 13 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 LOW-NOISE PGA Bypass Capacitor The ADS1232/4 features a low-drift, low-noise PGA that provides a complete front-end solution for bridge sensors. A simplified diagram of the PGA is shown in Figure 27. It consists of two chopper-stabilized amplifiers (A1 and A2) and three accurately-matched resistors (R1, RF1, and RF2), which construct a differential front-end stage with a gain of 64, followed by gain stage A3. The PGA inputs are equipped with an EMI filter, as shown in Figure 27. The cut-off frequency of the EMI filter is 19.6MHz. If the PGA is set to 1 or 2, the gain-of-64 stage is bypassed and shut down to save power. With the combination of both gain stages, the PGA can be set to 64 or 128. The PGA of the ADS1232/4 can be set to 1, 2, 64, or 128 with pins GAIN1 (MSB) and GAIN0 (LSB). By using AVDD as the reference input, the bipolar input ranges from ±2.5V to ±19.5mV, while the unipolar ranges from 2.5V to 19.5mV. When the PGA is set to 1 or 2, the absolute inputs can go rail-to-rail without significant performance degradation. However, the inputs of the ADS1232/4 are protected with internal diodes connected to the power-supply rails. These diodes will clamp the applied signal to prevent it from damaging the input circuitry. On the other hand, when the PGA is set to 64 or 128, the operating input range is limited to (AGND + 1.5V) to (AVDD – 1.5V), in order to prevent saturating the differential front-end circuitry and degrading performance. By applying a 0.1µF external capacitor (CEXT) across two capacitor pins and the combination of the internal 2kΩ resistor RINT on-chip, a low-pass filter (with a corner frequency of 720Hz) is created to bandlimit the signal path prior to the modulator input. This low-pass filter serves two purposes. First, the input signal is bandlimited to prevent aliasing as well as to filter out the high-frequency noise. Second, it attenuates the chopping residue from the PGA (for gains of 64 and 128 only) to improve temperature drift performance. It is not required to use high quality capacitors (such as ceramic or tantalum capacitors) for a general application. However, high quality capacitors such as poly are recommended for high linearity applications. CAP 450W RINT AINP 18pF A1 A3 RF2 ADC Where: fMOD = modulator sampling frequency (76.8kHz) CBUF = input capacitance of the buffer For the ADS1232/4: RINT 450W The voltage reference used by the modulator is generated from the voltage difference between REFP and REFN: VREF = REFP – REFN. The reference inputs use a structure similar to that of the analog inputs. In order to increase the reference input impedance, a switching buffer circuitry is used to reduce the input equivalent capacitance. The reference drift and noise impact ADC performance. In order to achieve best results, pay close attention to the reference noise and drift specifications. A simplified diagram of the circuitry on the reference inputs is shown in Figure 28. The switches and capacitors can be modeled with an effective impedance of: 1 Z EFF + 2f MODC BUF Gain of 1 or 2 RF1 R1 VOLTAGE REFERENCE INPUTS (REFP, REFN) A2 AINN 18pF CAP Figure 27. Simplified Diagram of the PGA 14 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com Z EFF + SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 1 + 500MW (2)(76.8kHz)(13fF) CLKIN/XTAL1 Crystal Oscillator CLK_DETECT VREFP VREFN Internal Oscillator XTAL2 AVDD S0 EN S1 S MUX AVDD To ADC ESD Protection CBUF ZEFF = 500MΩ(1) (1) f MOD = 76.8kHz Figure 28. Simplified Reference Input Circuitry ESD diodes protect the reference inputs. To prevent these diodes from turning on, make sure the voltages on the reference pins do not go below GND by more than 100mV, and likewise, do not exceed AVDD by 100mV: GND – 100mV < (REFP or REFN) < AVDD + 100mV Figure 29. Equivalent Circuitry of the Clock Source When the clock source is a crystal, simply connect the 4.9152MHz crystal across the CLKIN/XTAL1 and XTAL2 pins. Table 6 shows the recommended part numbers. Due to the low-power design of the parallel resonant driver circuitry onboard, both the CLKIN/XTAL1 and XTAL2 pins are only for use with external crystals; they should not be used as clock output drivers for external circuitry. No external capacitors are used with the crystal; it is recommended to place the crystal close to the part in order to reduce board stray capacitance for both the CLKIN/XTAL1 and XTAL2 pins and to insure proper operation. Table 6. Recommended Crystals CLOCK SOURCES The ADS1232/4 can use an external clock source, external crystal, or internal oscillator to accommodate a wide variety of applications. Figure 29 shows the equivalent circuitry of the clock source. The CLK_DETECT block determines whether the crystal oscillator/external clock signal is applied to the CLKIN/XTAL1 pin so that the internal oscillator is bypassed or activated. When the CLKIN/XTAL1 pin frequency is above ~200kHz, the CLK_DETECT output goes low and shuts down the internal oscillator. When the XIN pin frequency is below ~200kHz, the CLK_DETECT output goes high and activates the internal oscillator. It is highly recommended to hard-wire the CLKIN/XTAL1 pin to ground when the internal oscillator is chosen. MANUFACTURER FREQUENCY PART NUMBER ECS 4.9152MHz ECS-49-20-1 ECS 4.9152MHz ECS-49-20-4 An external oscillator may be used by driving the CLKIN/XTAL1 pin directly. The Electrical Characteristics table shows the allowable frequency range. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 15 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 FREQUENCY RESPONSE 4 The ADS1232/4 use a sinc digital filter with the frequency response (fCLK = 4.9152MHz) shown in Figure 30. The frequency response repeats at multiples of the modulator sampling frequency of 76.8kHz. The overall response is that of a low-pass filter with a –3dB cutoff frequency of 3.32Hz with the SPEED pin tied low (10SPS data rate) and 11.64Hz with the SPEED pin tied high (80SPS data rate). Figure 31(b) shows the zoom in plot for both 50Hz and 60Hz notches with the SPEED pin tied low (10SPS data rate). With only a ±3% variation of the internal oscillator, over 100dB of normal-mode rejection is achieved. 0 Data Rate = 10SPS Gain (dB) −50 0 −20 fCLK = 4.9152MHz −100 −40 Gain (dB) −60 −80 −150 −100 0 10 20 30 40 50 60 −120 Frequency (Hz) −140 (a) −160 70 80 90 100 −50 Data Rate = 10SPS −180 −200 38.4 76.8 Frequency (kHz) Figure 30. Frequency Response To help see the response at lower frequencies, Figure 31(a) illustrates the response out to 100Hz, when the data rate = 10SPS. Notice that signals at multiples of 10Hz are rejected, and therefore simultaneous rejection of 50Hz and 60Hz is achieved. Gain (dB) 0 −100 −150 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 Frequency (Hz) (b) 4 The benefit of using a sinc filter is that every frequency notch has four zeros on the same location. This response, combined with the low drift internal oscillator, provides an excellent normal-mode rejection of line-cycle interference. 16 Figure 31. Frequency Response Out To 100Hz The ADS1232/4 data rate and frequency response scale directly with clock frequency. For example, if fCLK increases from 4.9152MHz to 6.144MHz when the SPEED pin is tied high, the data rate increases from 80SPS to 100SPS, while notches also increase from 80Hz to 100Hz. Note that this is only possible when the external clock source is applied. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 SETTLING TIME After changing the input multiplexer, the first data are fully settled. In both the ADS1232/4, the digital filter is allowed to settle after toggling either the A1 or A0 pin. Toggling any of these digital pins will hold the DRDY/DOUT line high until the digital filter is fully settled. For example, if A0 changes from low to high, selecting a different input channel, DRDY/DOUT immediately goes high, and DRDY/DOUT goes low when fully-settled data are ready for retrieval. There is no need to discard any data. Figure 32 shows the timing of the DRDY/DOUT line as the input multiplexer changes. switching input channels. Another example would be toggling the TEMP pin, which switches the internal AINP, AINN signals to connect to either the external AINPx, AINNx pins or to the TEMP diode (see Figure 26). Note that when settling data, five readings may be required. If the change in input occurs in the middle of the first conversion, four more full conversions of the fully-settled input are required to get fully-settled data. Discard the first four readings because they contain only partially-settled data.Figure 33 illustrates the settling time for the ADS1232/4 in Continuous Conversion mode. In certain instances, large and/or abrupt changes in input will require four data cycles to settle. One example of such a change would be an external multiplexer in front of the ADS1232/4, which can cause large changes in input voltage simply by A1 or A0 t1 DRDY/DOUT tS Figure 32. Example of Settling Time After Changing the Input Multiplexer SYMBOL (1) DESCRIPTION (1) MIN MAX UNITS tS Setup time for changing the A1 or A0 pins 40 50 µs t1 Settling time (DRDY/DOUT held high) SPEED = 1 51 51 ms SPEED = 0 401 401 ms Values given for fCLK = 4.9152MHz. For different fCLK frequencies, scale proportional to CLK period. Expect a ±3% variation when an internal oscillator is used. Toggled TEMP Pin or Abrupt Change in External VIN VIN Start of conversion. DRDY/DOUT 1st conversion; includes unsettled VIN. 2nd conversion; VIN settled, but digital filter unsettled. 3rd conversion; VIN settled, but digital filter unsettled. 4th conversion; VIN settled, but digital filter unsettled. 5th conversion; VIN and digital filter both settled. Conversion Time Figure 33. Settling Time in Continuous Conversion Mode Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 17 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 DATA RATE DATA READY/DATA OUTPUT (DRDY/DOUT) The ADS1232/4 data rate is set by the SPEED pin, as shown in Table 7. When SPEED is low, the data rate is nominally 10SPS. This data rate provides the lowest noise, and also has excellent rejection of both 50Hz and 60Hz line-cycle interference. For applications requiring fast data rates, setting SPEED high selects a data rate of nominally 80SPS. This digital output pin serves two purposes. First, it indicates when new data are ready by going low. Afterwards, on the first rising edge of SCLK, the DRDY/DOUT pin changes function and begins outputting the conversion data, most significant bit (MSB) first. Data are shifted out on each subsequent SCLK rising edge. After all 24 bits have been retrieved, the pin can be forced high with an additional SCLK. It will then stay high until new data are ready. This configuration is useful when polling on the status of DRDY/DOUT to determine when to begin data retrieval. Table 7. Data Rate Settings DATA RATE SPEED PIN Internal Oscillator or 4.9152MHz Crystal External Oscillator 0 10SPS fCLKIN / 491,520 1 80SPS fCLKIN / 61,440 DATA FORMAT The ADS1232/4 output 24 bits of data in binary two’s complement format. The least significant bit (LSB) has a weight of 0.5VREF/(223 – 1). The positive full-scale input produces an output code of 7FFFFFh and the negative full-scale input produces an output code of 800000h. The output clips at these codes for signals exceeding full-scale. Table 8 summarizes the ideal output codes for different input signals. SERIAL CLOCK INPUT (SCLK) This digital input shifts serial data out with each rising edge. This input has built-in hysteresis, but care should still be taken to ensure a clean signal. Glitches or slow-rising signals can cause unwanted additional shifting. For this reason, it is best to make sure the rise-and-fall times of SCLK are less than 50ns. Table 8. Ideal Output Code vs Input Signal (1) (1) 18 INPUT SIGNAL VIN (AINP – AINN) IDEAL OUTPUT CODE ≥ +0.5VREF/Gain 7FFFFFh (+0.5VREF/Gain)/(223 – 1) 000001h 0 000000h (–0.5VREF/Gain)/(223 – 1) FFFFFFh ≤ –0.5VREF/Gain 800000h Excludes effects of noise, INL, offset, and gain errors. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 DATA RETRIEVAL indicating that new data are being updated. To avoid having DRDY/DOUT remain in the state of the last bit, the user can shift SCLK to force DRDY/DOUT high, as shown in Figure 35. This technique is useful when a host controlling the device is polling DRDY/DOUT to determine when data are ready. The ADS1232/4 continuously convert the analog input signal. To retrieve data, wait until DRDY/DOUT goes low, as shown in Figure 34. After this occurs, begin shifting out the data by applying SCLKs. Data are shifted out MSB first. It is not required to shift out all 24 bits of data, but the data must be retrieved before new data are updated (within t7) or else it will be overwritten. Avoid data retrieval during the update period (t6). DRDY/DOUT remains at the state of the last bit shifted out until it is taken high (see t6), Data Data Ready New Data Ready MSB DRDY/DOUT 23 LSB 22 21 0 t4 t5 t2 t3 t6 1 SCLK 24 t3 t7 Figure 34. Data Retrieval Timing SYMBOL (1) DESCRIPTION MIN t2 DRDY/DOUT low to first SCLK rising edge t3 SCLK positive or negative pulse width t4 SCLK rising edge to new data bit valid: propagation delay t5 TYP MAX UNITS 0 ns 100 ns 50 ns SCLK rising edge to old data bit valid: hold time 0 ns t6 (1) Data updating: no readback allowed 39 µs t7 (1) Conversion time (1/data rate) SPEED = 1 12.5 ms SPEED = 0 100 ms Values given for fCLK = 4.9152MHz. For different fCLK frequencies, scale proportional to CLK period. Data Data Ready New Data Ready DRDY/DOUT 23 1 SCLK 22 21 0 24 25 25th SCLK to Force DRDY/DOUT High Figure 35. Data Retrieval with DRDY/DOUT Forced High Afterwards Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 19 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 OFFSET CALIBRATION When the calibration is completed, DRDY/DOUT goes low, indicating that new data are ready. The analog input pins are disconnected within the ADC and the appropriate signal is applied internally to perform the calibration. The first conversion after a calibration is fully settled and valid for use. The offset calibration takes exactly the same time as specified in (t8) right after the falling edge of the 26th SCLK. Offset calibration can be initiated at any time to remove the ADS1232/4 inherited offset error. To initiate offset calibration, apply at least two additional SCLKs after retrieving 24 bits of data. Figure 36 shows the timing pattern. The 25th SCLK will send DRDY/DOUT high. The falling edge of the 26th SCLK will begin the calibration cycle. Additional SCLK pulses may be sent after the 26th SCLK; however, activity on SCLK should be minimized during offset calibration for best results. Data Ready After Calibration DRDY/DOUT 23 22 21 0 23 Calibration Begins SCLK 1 24 25 26 t8 Figure 36. Offset-Calibration Timing SYMBOL t8 (1) (1) 20 DESCRIPTION First data ready after calibration MIN MAX UNITS SPEED = 1 101.28 101.29 ms SPEED = 0 801.02 801.03 ms Values given for fCLK = 4.9152MHz. For different fCLK frequencies, scale proportional to CLK period. Expect a ±3% variation when an internal oscillator is used. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 STANDBY MODE Standby mode dramatically reduces power consumption by shutting down most of the circuitry. In Standby mode, the entire analog circuitry is powered down and only the clock source circuitry is awake to reduce the wake-up time from the Standby mode. To enter Standby mode, simply hold SCLK high after DRDY/DOUT goes low; see Figure 37. Standby mode can be initiated at any time during readback; it is not necessary to retrieve all 24 bits of data beforehand. When t10 has passed with SCLK held high, Standby mode will activate. DRDY/DOUT stays high when Standby mode begins. SCLK must remain high to stay in Standby mode. To exit Standby mode (wakeup), set SCLK low. The first data after exiting Standby mode is valid. Data Ready Standby Mode DRDY/DOUT 23 22 21 0 23 Start Conversion SCLK 1 24 t9 t10 t11 Figure 37. Standby Mode Timing (can be used for single conversions) SYMBOL t9 (1) t10 (1) t11 (1) (1) DESCRIPTION SCLK high after DRDY/DOUT goes low SPEED = 1 to activate Standby mode SPEED = 0 Standby mode activation time Data ready after exiting Standby mode MIN MAX UNITS 0 12.44 ms 0 99.94 ms SPEED = 1 12.46 SPEED = 0 99.96 ms SPEED = 1 52.51 52.51 ms SPEED = 0 401.8 401.8 ms ms Values given for fCLK = 4.9152MHz. For different fCLK frequencies, scale proportional to CLK period. Expect a ±3% variation when an internal oscillator is used. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 21 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 STANDBY MODE WITH OFFSET-CALIBRATION Offset-calibration can be set to run immediately after exiting Standby mode. This is useful when the ADS1232/4 is put in Standby mode for long periods of time, and offset-calibration is desired afterwards to compensate for temperature or supply voltage changes. To force an offset-calibration with Standby mode, shift 25 SCLKs and take the SCLK pin high to enter Standby mode. Offset-calibration then begins after wake-up; see Figure 38 for the appropriate timing. Note the extra time needed after wake-up for calibration before data are ready. The first data after Standby mode with offset-calibration is fully settled and can be used right away. Data Ready After Calibration Standby Mode DRDY/DOUT SCLK 23 22 21 0 1 24 Begin Calibration 23 25 t12 t10 Figure 38. Standby Mode with Offset-Calibration Timing (can be used for single conversions) SYMBOL t12 (1) (1) 22 DESCRIPTION Data ready after exiting Standby mode and calibration MIN MAX UNITS SPEED = 1 103 103 ms SPEED = 0 803 803 ms Values given for fCLK = 4.9152MHz. For different fCLK frequencies, scale proportional to CLK period. Expect a ±3% variation when an internal oscillator is used. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 POWER-UP SEQUENCE AVDD DVDD When powering up the ADS1232/34, AVDD and DVDD must be powered up before the PDWN pin goes high, as shown in Figure 39. If PDWN is not controlled by a microprocessor, a simple RC delay circuit must be implemented, as shown in Figure 40. PDWN ³10ms Figure 39. Power-Up Timing Sequence POWER-DOWN MODE Power-Down mode shuts down the entire ADC circuitry and reduces the total power consumption close to zero. To enter Power-Down mode, simply hold the PDWN pin low. Power-Down mode also resets the entire circuitry to free the ADC circuitry from locking up to an unknown state. Power-Down mode can be initiated at any time during readback; it is not necessary to retrieve all 24 bits of data beforehand. Figure 41 shows the wake-up timing from Power-Down mode. DVDD(1) 1kW 2.2nF Connect to ADS1232/34 PDWN pin NOTE: (1) AVDD must be powered up at least 10ms before PDWN goes high. Figure 40. RC Delay Circuit Start Conversion Data Ready Power-Down Mode t14 PDWN CLK Soure Wakeup DRDY/DOUT t13 t11 SCLK Figure 41. Wake-Up Timing from Power-Down Mode SYMBOL t13 t14 (2) (1) (2) DESCRIPTION Wake-up time after Power-Down mode TYP UNITS Internal clock 7.95 µs External clock 0.16 µs Crystal oscillator (1) 5.6 ms 26 (min) µs PDWN pulse width No capacitors on CLKIN/XTAL1 or XTAL2 outputs. Value given for fCLK = 4.9152MHz. For different fCLK frequencies, the scale is proportional to the CLK period except for a ±3% variation when an internal oscillator is used. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 23 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 APPLICATION EXAMPLES Therefore: Weigh-Scale System Noise−Free Counts + ǒ2 (18.4)1)Ǔ 10mV + 177, 385 39mV ǒ Figure 42 shows a typical ADS1232 hook-up as part of a weigh-scale system. In this setup, the ADS1232 is configured to channel one input with a gain of 128 at a 10SPS data rate. Note that the internal oscillator is used by grounding the CLKIN/XTAL1 pin. The user can also apply either a 4.9152MHz crystal across the CLKIN/XTAL1 and XTAL2 pins, or simply apply a clock to the CLKIN/XTAL1 pin. For a typical 2mV/V load cell, the maximum output signal is approximately 10mV for a single +5V excitation voltage. The ADS1232/4 can achieve 18.4 noise-free bits at 10SPS when the PGA = 128 (refer to Table 1). With the extra software filtering/averaging (typically done by a microprocessor), an extra bit can be expected. FS ǒFS Ǔ Noise−Free Counts + ǒ2 BITEffǓ LC Ǔ With +5V supply voltage, 177,385 noise-free counts can be expected from the ADS1232/4 with the onboard PGA set to 128. Thermocouple See Figure 43 for the ADS1232 in a thermocouple application. In this example, a type k thermocouple is used; the temperature range is from –260°C to +900°C when the gain is set to 64 to maximize the full input range of the ADS1232. R1 and a REF1004-2.5V are used to set the common-mode voltage to 2.5V for ungrounded junction thermocouples. With a gain of 128, the ADS1232 input has a typical noise of 17nVRMS for extremely high-resolution applications. AD Where: BITEFF = effective noise-free bits (18.4 + 1 bit from software filtering/averaging) FSLC = full-scale output of the load cell (10mV) FSAD = full-scale input of the ADS1232/4 (39mV when PGA = 128) 24 If either a wider temperature range application is required (up to +1350°C, for example), or a grounded junction thermocouple is used, pin 1 of the thermocouple can be grounded (see Figure 44). When the gain is set to 2, the ADS1232 input has a typical 500nV offset error and a noise level of 270nVRMS, which is good for all kinds of low-voltage output sensors. Note that to calculate the actual thermocouple temperature, the ADS1232 internal temperature sensor can be accessed in order to measure the cold junction temperature along with the thermocouple reading. Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 5V 3V 0.1mF 18 1 AVDD VDD DVDD 20 ADS1232 16 REFP 19 GAIN0 Gain = 128 9 CAP 24 DRDY/DOUT 0.1mF 10 CAP 23 SCLK + - GAIN1 22 PDWN 11 AINP1 12 MSP430x4xx or Other Microprocessor 4 XTAL2 AINN1 14 13 AINP2 CLKIN/XTAL1 AINN2 SPEED 3 21 8 A0 7 15 REFN TEMP AGND 17 GND DGND 2, 5, 6 Figure 42. Weigh Scale Application 5V 3V 0.1mF R1 50kW 18 1 AVDD ADS1232 16 REF1004- 2.5V 9 0.1mF 10 2 REFP VDD DVDD 20 GAIN1 GAIN0 1 12 14 Thermocouple Type k 13 Gain = 128 CAP DRDY/DOUT CAP SCLK PDWN 11 19 AINP1 XTAL2 24 23 22 4 MSP430x4xx or Other Microprocessor AINN1 AINP2 CLKIN/XTAL1 AINN2 SPEED A0 15 REFN AGND 17 TEMP 3 21 8 7 DGND 2, 5, 6 GND Figure 43. Ungrounded Junction Thermocouple Application Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 25 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 5V 3V R1 50kW 0.1mF 18 1 AVDD 19 ADS1232 16 9 REF1004- 2.5V REFP GAIN0 GAIN1 DRDY/DOUT 10 CAP SCLK PDWN 11 1 12 Thermocouple Type k 14 13 20 Gain = 2 CAP 0.1mF 2 VDD DVDD AINP1 XTAL2 24 23 22 4 MSP430x4xx or Other Microprocessor AINN1 AINP2 CLKIN/XTAL1 AINN2 SPEED A0 3 21 8 7 15 REFN AGND 17 TEMP DGND 2, 5, 6 GND Figure 44. Grounded Junction Thermocouple Application 26 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 RTDs and Thermistors Figure 45 shows a typical schematic for a style 2 (three-wire) RTD application. R1 and R2 are used to excite the RTD as well as establish the common-mode voltage of the ADS1232 PGA. By using both differential channels of the ADS1232, the temperature change in lead resistance, RL, can be eliminated. This condition is accomplished by using the following formula: (AINP1 – AINN1) – 2(AINP2 – AINN2). 5V 3V 0.1mF 18 1 AVDD VDD DVDD 20 ADS1232 16 9 0.1mF 10 R1 33kW REFP GAIN1 GAIN0 Gain = 128 CAP DRDY/DOUT CAP SCLK PDWN RL 14 11 RL RTD 13 RL 12 AINP2 XTAL2 24 23 22 4 MSP430x4xx or Other Microprocessor AINP1 AINN2 CLKIN/XTAL1 AINN1 SPEED R2 33kW A0 3 21 8 7 15 REFN AGND 17 NOTE: RL is lead resistance. 19 TEMP DGND 2, 5, 6 GND Figure 45. Style 2 (Three-Wire) RTD Schematic Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 27 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 SUMMARY OF SERIAL INTERFACE WAVEFORMS DRDY/DOUT 23 22 21 0 MSB SCLK LSB 1 24 (a) Data Retrieval DRDY/DOUT 23 SCLK 22 21 0 1 24 25 (b) Data Retrieval with DRDY/DOUT Forced High Afterwards Data Ready After Calibration DRDY/DOUT 23 SCLK 22 21 0 1 24 Calibration Begins 25 26 (c) Offset−Calibration Timing Data Ready Standby Mode 23 DRDY/DOUT 22 21 0 Start Conversion SCLK 1 24 (d) Standby Mode/Single Conversions Data Ready After Calibration Standby Mode DRDY/DOUT 23 22 21 0 Calibration Begins SCLK 1 24 25 (e) Standby Mode/Single Conversions with Offset Calibration Figure 46. Summary of Serial Interface Waveforms 28 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 ADS1232 ADS1234 www.ti.com SBAS350F – JUNE 2005 – REVISED FEBRUARY 2008 Revision History Changes from Revision E (October 2007) to Revision F ............................................................................................... Page • • Changed AVDD to deltaV in Common-Mode Rejection section in Electrical Characteristics table....................................... 3 Changed AVDD to deltaV in Power-Supply Rejection section in Electrical Characteristics table ......................................... 3 Changes from Revision D (September 2007) to Revision E .......................................................................................... Page • Corrected unit values in Electrical Characteristics table........................................................................................................ 3 Changes from Revision C (June 2006) to Revision D .................................................................................................... Page • • • • • • • • • • • • • • • • • Deleted Logic Level VIH row for CLKIN/XTAL test condition in Electrical Characteristics..................................................... 3 Added offset drift and gain drift histogram plots to Typical Characteristics (Figure 9 to Figure 16)...................................... 9 Changed difference voltage output for PGA = 2 from 323.4mV to 223.4mV in Temperature Sensor section.................... 13 Added text to Voltage Reference Inputs section regarding reference and drift noise ......................................................... 14 Changed ZEFF equation........................................................................................................................................................ 15 Changed Figure 28 ............................................................................................................................................................. 15 Changed Figure 29 ............................................................................................................................................................. 15 Deleted last sentence of Clock Sources section ................................................................................................................. 15 Changed text in Settling Time section ................................................................................................................................. 17 Changed Figure 32 ............................................................................................................................................................. 17 Changed Figure 33 ............................................................................................................................................................. 17 Deleted 2nd sentence of Serial Clock Input section ............................................................................................................ 18 Added Power-Up Sequence section, with new text and two new figures (Figure 39 and Figure 40). ................................ 23 Changed Figure 42 ............................................................................................................................................................. 25 Changed Figure 43 ............................................................................................................................................................. 25 Changed Figure 44 ............................................................................................................................................................. 26 Changed Figure 45 ............................................................................................................................................................. 27 Changes from Revision B (September 2005) to Revision C .......................................................................................... Page • • • • • • • • • • • • Deleted last row from Absolute Maximum Ratings table. ...................................................................................................... 2 Changed Analog Inputs section of Electrical Characteristics table ....................................................................................... 3 Changed the typical value in last row of Voltage Reference Input section of Electrical Characteristics table ...................... 3 Added footnote 1 to Table 1, Table 2, Table 3, and Table 4................................................................................................. 5 Changed fourth sentence in Temperature Sensor section of Overview. ............................................................................. 13 Added fifth and sixth sentences to Temperature Sensor section of Overview. ................................................................... 13 Added fourth and fifth sentences to Low-Noise PGA section of Overview.......................................................................... 14 Changed Figure 27. ............................................................................................................................................................. 14 Changed t11 to t10 in third paragraph of Standby Mode section of Overview. ..................................................................... 21 Changed min and max variables of t10 row in table below Figure 37. ................................................................................. 21 Changed Figure 41. ............................................................................................................................................................. 23 Added last row and second footnote to table below Figure 41............................................................................................ 23 Copyright © 2005–2008, Texas Instruments Incorporated Product Folder Link(s): ADS1232 ADS1234 29 PACKAGE OPTION ADDENDUM www.ti.com 11-Apr-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) (4) ADS1232IPW ACTIVE TSSOP PW 24 60 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1232 ADS1232IPWG4 ACTIVE TSSOP PW 24 60 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1232 ADS1232IPWR ACTIVE TSSOP PW 24 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1232 ADS1232IPWRG4 ACTIVE TSSOP PW 24 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1232 ADS1234IPW ACTIVE TSSOP PW 28 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1234 ADS1234IPWG4 ACTIVE TSSOP PW 28 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1234 ADS1234IPWR ACTIVE TSSOP PW 28 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1234 ADS1234IPWRG4 ACTIVE TSSOP PW 28 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 105 ADS1234 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 11-Apr-2013 (4) Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Top-Side Marking for that device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant ADS1232IPWR TSSOP PW 24 2000 330.0 16.4 6.95 8.3 1.6 8.0 16.0 Q1 ADS1234IPWR TSSOP PW 28 2000 330.0 16.4 6.9 10.2 1.8 12.0 16.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) ADS1232IPWR TSSOP PW 24 2000 367.0 367.0 38.0 ADS1234IPWR TSSOP PW 28 2000 367.0 367.0 38.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily performed. TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional restrictions. Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use of any TI components in safety-critical applications. In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and requirements. Nonetheless, such components are subject to these terms. No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties have executed a special agreement specifically governing such use. Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and regulatory requirements in connection with such use. TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of non-designated products, TI will not be responsible for any failure to meet ISO/TS16949. Products Applications Audio www.ti.com/audio Automotive and Transportation www.ti.com/automotive Amplifiers amplifier.ti.com Communications and Telecom www.ti.com/communications Data Converters dataconverter.ti.com Computers and Peripherals www.ti.com/computers DLP® Products www.dlp.com Consumer Electronics www.ti.com/consumer-apps DSP dsp.ti.com Energy and Lighting www.ti.com/energy Clocks and Timers www.ti.com/clocks Industrial www.ti.com/industrial Interface interface.ti.com Medical www.ti.com/medical Logic logic.ti.com Security www.ti.com/security Power Mgmt power.ti.com Space, Avionics and Defense www.ti.com/space-avionics-defense Microcontrollers microcontroller.ti.com Video and Imaging www.ti.com/video RFID www.ti-rfid.com OMAP Applications Processors www.ti.com/omap TI E2E Community e2e.ti.com Wireless Connectivity www.ti.com/wirelessconnectivity Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2015, Texas Instruments Incorporated