EECS 105 Spring 2004, Lecture 22 Lecture 21: BJTs (Bipolar Junction Transistors) Prof J. S. Smith Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Context In Friday’s lecture, we discussed BJTs (Bipolar Junction Transistors) Today we will find large signal models for the bipolar junction transistor, and start exploring how to use transistors to make amplifiers and other analog devices Department of EECS University of California, Berkeley 1 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Reading Today’s lecture will finish chapter 7, Bipolar Junction Transistors (BJT’s) Then, we will start looking at amplifiers, chapter 8 in the text. Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Lecture Outline z z z z BJT Physics (7.2) BJT Ebers-Moll Equations (7.3) BJT Large-Signal Models BJT Small-Signal Models Next: Circuits Department of EECS University of California, Berkeley 2 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Currents in the BJT z z A BJT is ordinarily designed so that the minority carrier injection into the base is far larger than the minority carrier injection into the emitter. It is also ordinarily designed such that almost all the minority carriers injected into the base make it all the way across to the collector Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Current controlled z So the current is determined by the minority current across the emitter-base junction IC ≈ I S e z qVBE kT But since the majority of the minority current goes right through the base to the collector: IC ≈ − I E z And so the amount of current that must be supplied by the base is small compared to the current controlled: I C >> I B Department of EECS University of California, Berkeley 3 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT operating modes z Forward active – – z Saturation – z Emitter-Base forward biased Base-Collector reverse biased Both junctions are forward biased Reverse active – – – Emitter-Base reverse biased Base-Collector forward biased Transistor operation is poor in this direction, becauseβ is low: lighter doping of the layer designed to be the collector means that there is a lot of minority carrier injection out of the Base. Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Collector Characteristics (IB) Saturation Region (Low Output Resistance) Breakdown Linear Increase Reverse Active (poor Transistor) Forward Active Region (Very High Output Resistance) Department of EECS University of California, Berkeley 4 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith The origin of current gain in BJT’s z z z The majority of the minority carriers injected from the emitter go across the base to the collector and are swept out by the electric field in the depletion region of the collectorbase junction. The base contact doesn’t have to supply that current to maintain the voltage of the base—the voltage which is causing the current in the first place. The current which does have to be supplied by the base contact comes from two main sources: – – z Recombination in the base (can often neglect in Silicon) Injection of minority carriers into the emitter If we find the ratio of the current to the current that must be supplied by the base, that will give us the current gain β. Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Diffusion Currents Minority holes in emitter-they recombine at the contact Minority electrons in the base Base-collector depletion extracts the minority carriers from the base The minority carriers injected into the base have a concentration gradient, and thus a current. Since emitter doping is higher, this current is much larger than the current due to the minority carriers injected from the base to the emitter. This is the source of BJT current gain. Department of EECS University of California, Berkeley 5 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Diffusion Revisited z z z Why is minority current profile a linear function? The diffusion current is proportional to the gradient×diffusion constant. Since current is constant→gradient is constant Note that diffusion current density is controlled by width of region (base width for BJT): Density here fixed by potential (injection of carriers) It is proportional to the number of majority carriers on The other side of the barrier, and is exponential with the (lowered) barrier height. Density at the contact is equal to the equilibrium value (strong G/R) Wp z Decreasing width increases current! Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Currents Collector current is nearly identical to the (magnitude) of the emitter current … define α F = .999 I C = −α F I E Kirchhoff: − I E = IC + I B DC Current Gain: I C = −α F I E = α F ( I B + I C ) IC = Department of EECS αF IB = βF IB 1−αF βF = αF .999 = = 999 1 − α F .001 University of California, Berkeley 6 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Origin of αF Base-emitter junction: some reverse injection of holes into the emitter Æ base current isn’t zero Some electrons lost due to recombination E B C β F ≈ 100 Typical: α F ≈ .99 Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Collector Current Diffusion of electrons across base results in J diff n ⎛ qDn n pB 0 ⎞ qVkTBE = qDn =⎜ ⎟e dx ⎝ WB ⎠ dn p ⎛ qDn n pB 0 AE ⎞ IS = ⎜ ⎟ WB ⎝ ⎠ IC = I S e Department of EECS qVBE kT University of California, Berkeley 7 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Base Current In silicon, recombination of carriers in the base can usually be neglected, so the base current is mostly due to minority injection into the emitter. Diffusion of holes across emitter results in J diff p ⎞ dpnE ⎛ qD p pnE 0 ⎞ ⎛ qVkTBE = − qD p =⎜ − 1 e ⎜ ⎟ ⎟ dx ⎝ WE ⎠ ⎝ ⎠ ⎞ ⎛ qD p pnE 0 AE ⎞ ⎛ qVkTBE − 1⎟ IB = ⎜ ⎟⎜e WE ⎝ ⎠⎝ ⎠ Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Current Gain ⎛ qDn n pBo AE ⎞ ⎜ ⎟ ⎛ WB IC ⎝ ⎠ = Dn ⎞ ⎛ n pB 0 ⎞ ⎛ WE ⎞ βF = = ⎜ ⎟⎜ ⎟⎜ ⎟ I B ⎛ qD p pnEo AE ⎞ ⎝⎜ D p ⎠⎟ ⎝ pnE 0 ⎠ ⎝ WB ⎠ ⎜ ⎟ WE ⎝ ⎠ Minimize base width ni2 N A, B N D,E ⎛ n pB 0 ⎞ ⎜ ⎟= 2 = ni N A, B ⎝ pnE 0 ⎠ N D,E Maximize doping in emitter Department of EECS University of California, Berkeley 8 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Simple NPN BJT model z A simple model for a NPN BJT: C I B (t ) → B βiB (t ) + VBE (t ) IB − E Real diode, not an ideal diode C + + VCE VBE − −IE − Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Ebers-Moll Equations Exp. 6: measure E-M parameters Derivation: Write emitter and collector currents in terms of internal currents at two junctions ( ) ( ) I E = − I ES eVBE / Vth − 1 + α R I CS eVBC / Vth − 1 ( ) ( ) I C = α F I ES eVBE / Vth − 1 − I CS eVBC / Vth − 1 α F I ES = α R I CS Department of EECS University of California, Berkeley 9 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Ebers-Moll Equivalent Circuit Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Parasitic capacitances z z z To model devices adequately at high frequencies, we need to account for the charge that we must move in or out of the devices. In the FET, this is clearly a capacitance, but in a BJT the majority of the stored charge is in the form of minority carriers which are diffusing across the device in forward operation, but aren’t there when the transistor is not conducting, so obviously they must be extracted, or allowed to diffuse away. This stored charge can be modeled as a capacitance in small signal models. Department of EECS University of California, Berkeley 10 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Diffusion Capacitance z The total minority carrier charge for a one-sided junction is (area of triangle) qV D 1 1 Qn = qA ⋅ bh2 = qA ⋅ (W − xdep , p )(n p 0 e kT − n p 0 ) 2 2 z For a one-sided junction, the current is dominated by these minority carriers: ID = qVD qADn ( n p 0 e kT − n p 0 ) W p − xdep , p Dn ID = 2 Qn (W − x p dep , p ) Constant! Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Diffusion Capacitance (cont) z The proportionality constant has units of time τT = Qn = ID τT = Temperature z q kT (Wp − xdep, p ) (W Dn p − xdep , p ) µn 2 2 Distance across P-type base Diffusion Coefficient Mobility The physical interpretation is that this is the transit time for the minority carriers to cross the p-type region. Since the capacitance is related to charge: Qn = τ T I D Department of EECS Cd = ∂Qn ∂I = τT = g dτ T ∂V ∂V University of California, Berkeley 11 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Transconductance gm z The transconductance is analogous to diode conductance Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Transconductance (cont) z Forward-active large-signal current: iC = I S evBE / Vth (1 + vCE VA ) Q here means quiescent point not charge • Differentiating and evaluating at Q = (VBE, VCE ) ∂iC ∂vBE = Q q I S e qVBE / kT (1 + VCE VA ) kT gm = Department of EECS ∂iC ∂vBE = Q qI C kT University of California, Berkeley 12 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Notation Review Large signal iC = f (vBE , vCE ) I C + ∆iC = f (VBE + ∆vBE , VCE + ∆vCE ) Quiescent Point (bias) small signal DC (bias) I C + ic = f (VBE + vbe , VCE + vce ) Q = (VBE , VCE ) ∂f ic ≈ ∂vBE ∂f vbe + ∂vCE Q small signal (less messy!) vce Q transconductance Output conductance Remember, the point of a small signal model is to produce a set of equations which relate the small variations in currents and voltages to each other linearly → and to create a linear equivalent circuit Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Base Currents Unlike a MOSFET, there is a DC current into the base terminal of a bipolar transistor: I B = I C β F = ( I S β F ) e qVBE / kT (1 + VCE VA ) To find the change in base current due to change in base-emitter voltage: ib = ∂iB ∂vBE ∂iB vbe ∂vBE Q ib = Department of EECS gm βF = Q ∂iB ∂iC ∂iC Q ∂vBE = Q 1 βF gm vbe University of California, Berkeley 13 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Small Signal Current Gain β0 = ∆iC = βF ∆iB ∆iC = β 0 ∆iB ic = β 0ib z Since currents are linearly related, the derivative is a constant (small signal = large signal) Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Input Resistance rπ ( rπ ) −1 = ∂iB ∂vBE = Q rπ = z z 1 ∂iC β F ∂vBE = Q gm βF βF gm In practice, the DC current gain βF and the small-signal current gain βo are both highly variable (+/- 25%) Typical bias point: DC collector current = 100 µA rπ = 100 25 mV = 25 kΩ .1mA Ri = ∞ Ω Department of EECS MOSFET University of California, Berkeley 14 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Output Resistance ro Why does current increase slightly with increasing vCE? Collector (n) WB Base (p) Emitter (n+) Answer: Base width modulation (similar to CLM for MOS) Model: Math is a mess, so introduce the Early voltage iC = I S e vBE / Vth (1 + vCE V A ) Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Graphical Interpretation of ro slope~1/ro slope Department of EECS University of California, Berkeley 15 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Small-Signal Model ib = rπ vbe ic = g m vbe + 1 vce ro Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Parasitic Capacitors z Emitter-base is a forward biased junction Æ depletion capacitance: C j , BE ≈ 1.4C j , BE 0 z z Collector-base is a reverse biased junction Æ depletion capacitance Due to minority charge injection into base, we have to account for the diffusion capacitance as well Cb = τ F g m Department of EECS University of California, Berkeley 16 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith BJT Cross Section Core Transistor z z z External Parasitic Core transistor is the vertical region under the emitter contact Everything else is “parasitic” or unwanted Lateral BJT structure is also possible Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Core BJT Model Reverse biased junction Base Collector g m vπ Reverse biased junction & Diffusion Capacitance z z z Fictional Resistance (no noise) Emitter Given an ideal BJT structure, we can model most of the action with the above circuit For low frequencies, we can forget the capacitors Capacitors are non-linear! MOS gate & overlap caps are linear Department of EECS University of California, Berkeley 17 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Complete Small-Signal Model Real Resistance (has noise) “core” BJT Reverse biased junctions External Parasitics Department of EECS University of California, Berkeley EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith Circuits! z When the inventors of the bipolar transistor first got a working device, the first thing they did was to build an audio amplifier to prove that the transistor was actually working! Department of EECS University of California, Berkeley 18 EECS 105 Spring 2004, Lecture 22 Prof. J. S. Smith A Simple Circuit: An MOS Amplifier Input signal Supply “Rail” RD VDD vo vs vGS = VGS + vs Department of EECS VGS I DS Output signal University of California, Berkeley 19