X Ray Diagnostics
LCLS FAC Meeting
Oct. 27, 2005
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
FEE Layout
Slit
Solid
Attenuator
Diagnostics
Package
Be Mirrors 2 & 3
Collimator 1
Fast
close
valve
Ion
Chamber
Gas Attenuator
SiC Mirror 1
Ion
Chamber
Diagnostics
Package
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
SiC Mirror 2
Richard M. Bionta
bionta1@llnl.gov
Damage Considerations
Dose (eV/atom)
(maximum over 827-8267eV)
Dose along the beam line for different materials at Gaussian peak
(under normal illumination)
Shown is the maximum dose (over Ephoton=827 to 8267eV)
SiC melt
Si melt
B4C melt
Be melt
z (m from end of undulator)
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Dose obtained at TTF
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
TTF VUV Beamline
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Damage experiment chamber
TOF ion spectrometer
Sample holder
Visible
spectrometer
Microscope
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
SiC thin film, 1 shot, 8 x melt
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
SiC thin film, 10000 shots, ~ 1 x melt
SiC Sample Spectrum at interaction with DESY X-ray beam 24/10/2005
80
Output (arb. units)
60
40
20
0
-20
-40
200
300
400
500
Wavelength (nm)
600
700
J. Kuba et al.
Emission spectra shows plasma was formed
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
800
Richard M. Bionta
bionta1@llnl.gov
SiC thin film, 10000 shots, 10% melt
SiC Sample Spectrum at interaction with DESY X-ray beam 24/10/2005
Low energy
80
Output (arb. units)
60
40
20
0
-20
-40
200
300
400
500
Wavelength (nm)
600
700
J. Kuba et al.
No spectra can be distinguished above background
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
800
Richard M. Bionta
bionta1@llnl.gov
Si/C mirror reflects for one shot
Signal normalized to the intensity [a.u.]
Mirror reflectivity
6
First shot
5
Second shot
4
3
2
1
0
-1
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
Time [s]
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
x 10
Richard M. Bionta
bionta1@llnl.gov
-6
Desired FEL Measurements
u
l1
Dl/l1
x, y
x , y 
f(x,y)
s u,s l 1
s x ,s y ,s x ,s y 
t
July 19-21, 2005
XTOD Breakout
Total energy / pulse
Photon wavelength
Photon wavelength spread
Pulse centroid
Beam direction
Spatial distribution
Temporal variation in beam
parameters
Pulse duration
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Desired Spontaneous Measurements
f(x,y,l1)
Spatial distribution around l1
l1
1st harmonic Photon wavelength
Dl/l1
1st harmonic wavelength spread
x , y 
u
s u,s l 1
July 19-21, 2005
XTOD Breakout
Beam direction
Total energy / pulse
Temporal variation in beam
parameters
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
FEE Cartoon
Windowless
Ion
Chamber
Diagnostic Package
Spectrometer / Indirect
Imager mirror
Solid
Attenuator
e-
High-Energy
Slit
Gas
Attenuator
5 mm
diameter
collimators
Total
Energy
Calorimeter
WFOV Direct
Imager
Spectrometer camera
Muon
Shield
July 19-21, 2005
XTOD Breakout
Start of
Experimental
Hutches
Windowless
Ion
Chamber
UCRL-PRES-xxxxxx
FEL Offset
mirror
system
Richard M. Bionta
bionta1@llnl.gov
Redundant Commissioning Instrumentation
Instrument
Purpose
Direct Imager
SP f(x,y), look
ND filter,
for FEL,
Attenuators
measure FEL u,
f(x,y), x,y
Scintillator
linearity,
Attenuator
linearity and
background
Indirect Imager
Measure FEL u, Mirror Angle
f(x,y), spectral
imaging of SP
and FEL
harmonics,
attenuator
calibration
Mirror
reflectivity,
damage
Total Energy
FEL u
Attenuators
Energy to Heat,
damage
Ion Chamber
FEL u, x,y,x',y'
Pressure
Signal strength
Spectrometers
FEL, SP
spectra
Attenuators
Resolution,
damage
Richard
M. Bionta
July 19-21, 2005
XTOD Breakout
Adjustment
UCRL-PRES-xxxxxx
Calibration and
Physics risks
bionta1@llnl.gov
Wide Field of View Direct Imager
Photoelectrons
generated by 0.01%
FEL
Horizontal LineOut
Single shot measurement of
f(x,y), x, y ,u
PhotoElectrons/Pixel
400,000
300,000
200,000
100,000
0
-50 -40 -30 -20 -10 0 10 20 30 40 50 60
X, mm
Camera
Y, mm
Fluence
Scintillators
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
20
15
10
5
0
-5
-10
-15
-20
-60
-40
-20
0
X, mm
20
Richard M. Bionta
bionta1@llnl.gov
40
60
Indirect Imager
Single shot measurement of
f(x,y), x, y, u
Multi shot measurement of l
Angle selects energy and
attenuation
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
B4C/SiC Test Multilayers Fabricated
40 layer pairs
G = 0.7
P = 6 nm
Data at Cu Ka, 8 keV
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Total Energy Calorimeter
Thermal diffusion calculations
performed
Single shot measurement of
f(x,y), x, y, u
Cold Si
substrate
t = 300 ms
t = 100 ms
Nd0.8Sr0.2MnO
3
CMR Sensor
array 100
pixels
Xray Beam
t=0
T
Cooling
ring
July 19-21, 2005
XTOD Breakout
T, ms
0
Sample CMR at LLNL for etching and R(T)
measurements
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
5
Sensor Development: Nd0.8Sr0.2MnO3
25
25
0.2
3
(sample #23)
20
Resistance [k½]
0.8
20
15
15
10
10
5
5
0
100
0
150
200
Sensitivity 1/R ¶R/¶T [%/K]
Nd Sr MnO
-5
250
Temperature [K]
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Ion Chamber
Single shot, non destructive,
measurement of
x’, y’, x, y ,u
Segmented
cathodes for
position
measurement
10 cm
1 torr
July 19-21, 2005
XTOD Breakout
Imaging of optical
emission for
position
measurement
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Measuring K with photons
On axis:
l1
1  K 2  l

2
2  2
July 19-21, 2005
XTOD Breakout
u
Effect of changing K
Dl
DK
 1.7 
l1
K
UCRL-PRES-xxxxxx
But
Dl
l1
 2
DTe
Te
Richard M. Bionta
bionta1@llnl.gov
Near-Field calculations of detuned
single undulator segments
49
8.
49
8.
45
8.
45
8.
41
8.
41
8.
37
8.
37
8.
33
8.
33
8.
29
8.
29
8.
25
8.
25
8.
21
8.
21
8.
17
8.
17
8.
13
8.
13
8.
09
8.
09
8.
05
8.
05
8.
First
8.2658
First
Last 1mm
Last
8.2651
49
8.
45
8.
41
8.
37
8.
33
8.
29
8.
25
8.
21
8.
17
8.
13
8.
09
First
First
8.2658
Last Detuned 1e-4
Last 8.2645
8.
01
8.
First 2
x 2 mm
Last
1x
1mm
Last has K(1+10-4)
05
8.0E+06
6.0E+06
4.0E+06
2.0E+06
0.0E+00
First
8.2658
Last
First 8.2362
Last
8.
01
8.
8.0E+06
6.0E+06
4.0E+06
2.0E+06
0.0E+00
8.
First 2
x 2 mm
Last
1x
1mm
3.0E+07
2.0E+07
1.0E+07
0.0E+00
01
First
and
Last
2mm x
2mm
Mean, keV
Photons/pulse/20 eV
Photon Energy, keV
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Single Shot 8 keV Spectrometer
Single shot measurement of
20 m downstream
l
1.4991 Å
Sputter-sliced SiC / B4C multilayer
P = 20 nm
N = 1x104
D = 200 mm
1.4994 Å
33 mm thick
200 mm
Beam
DE 1
  1 10  4
E
N
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Problems:
Don't have 20 m.
Signal degradation due to
grating thickness (coupled
waveguides.)
Only possible at high
photon energies.
Richard M. Bionta
bionta1@llnl.gov
Other candidates for Single-Shot
Spectrometers
Mosaic Graphite crystal
Asymmetric cut multilayer
Only one
diffracted order
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov
Summary
X-ray characterization for LCLS is challenging
Dose limits materials choice
Large range of signal levels
Some measurements require precision near r = 10-4
Redundant diagnostics techniques will be used to
measure pulse energy
Total energy calorimeter
Direct Imager
Indirect Imager
Ion chamber
Much work needed on single-shot spectral
measurements
TTF damage experiment to be analyzed
July 19-21, 2005
XTOD Breakout
UCRL-PRES-xxxxxx
Richard M. Bionta
bionta1@llnl.gov