X Ray Diagnostics LCLS FAC Meeting Oct. 27, 2005 July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov FEE Layout Slit Solid Attenuator Diagnostics Package Be Mirrors 2 & 3 Collimator 1 Fast close valve Ion Chamber Gas Attenuator SiC Mirror 1 Ion Chamber Diagnostics Package July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx SiC Mirror 2 Richard M. Bionta bionta1@llnl.gov Damage Considerations Dose (eV/atom) (maximum over 827-8267eV) Dose along the beam line for different materials at Gaussian peak (under normal illumination) Shown is the maximum dose (over Ephoton=827 to 8267eV) SiC melt Si melt B4C melt Be melt z (m from end of undulator) July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Dose obtained at TTF July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov TTF VUV Beamline July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Damage experiment chamber TOF ion spectrometer Sample holder Visible spectrometer Microscope July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov SiC thin film, 1 shot, 8 x melt July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov SiC thin film, 10000 shots, ~ 1 x melt SiC Sample Spectrum at interaction with DESY X-ray beam 24/10/2005 80 Output (arb. units) 60 40 20 0 -20 -40 200 300 400 500 Wavelength (nm) 600 700 J. Kuba et al. Emission spectra shows plasma was formed July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx 800 Richard M. Bionta bionta1@llnl.gov SiC thin film, 10000 shots, 10% melt SiC Sample Spectrum at interaction with DESY X-ray beam 24/10/2005 Low energy 80 Output (arb. units) 60 40 20 0 -20 -40 200 300 400 500 Wavelength (nm) 600 700 J. Kuba et al. No spectra can be distinguished above background July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx 800 Richard M. Bionta bionta1@llnl.gov Si/C mirror reflects for one shot Signal normalized to the intensity [a.u.] Mirror reflectivity 6 First shot 5 Second shot 4 3 2 1 0 -1 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 Time [s] July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx x 10 Richard M. Bionta bionta1@llnl.gov -6 Desired FEL Measurements u l1 Dl/l1 x, y x , y f(x,y) s u,s l 1 s x ,s y ,s x ,s y t July 19-21, 2005 XTOD Breakout Total energy / pulse Photon wavelength Photon wavelength spread Pulse centroid Beam direction Spatial distribution Temporal variation in beam parameters Pulse duration UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Desired Spontaneous Measurements f(x,y,l1) Spatial distribution around l1 l1 1st harmonic Photon wavelength Dl/l1 1st harmonic wavelength spread x , y u s u,s l 1 July 19-21, 2005 XTOD Breakout Beam direction Total energy / pulse Temporal variation in beam parameters UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov FEE Cartoon Windowless Ion Chamber Diagnostic Package Spectrometer / Indirect Imager mirror Solid Attenuator e- High-Energy Slit Gas Attenuator 5 mm diameter collimators Total Energy Calorimeter WFOV Direct Imager Spectrometer camera Muon Shield July 19-21, 2005 XTOD Breakout Start of Experimental Hutches Windowless Ion Chamber UCRL-PRES-xxxxxx FEL Offset mirror system Richard M. Bionta bionta1@llnl.gov Redundant Commissioning Instrumentation Instrument Purpose Direct Imager SP f(x,y), look ND filter, for FEL, Attenuators measure FEL u, f(x,y), x,y Scintillator linearity, Attenuator linearity and background Indirect Imager Measure FEL u, Mirror Angle f(x,y), spectral imaging of SP and FEL harmonics, attenuator calibration Mirror reflectivity, damage Total Energy FEL u Attenuators Energy to Heat, damage Ion Chamber FEL u, x,y,x',y' Pressure Signal strength Spectrometers FEL, SP spectra Attenuators Resolution, damage Richard M. Bionta July 19-21, 2005 XTOD Breakout Adjustment UCRL-PRES-xxxxxx Calibration and Physics risks bionta1@llnl.gov Wide Field of View Direct Imager Photoelectrons generated by 0.01% FEL Horizontal LineOut Single shot measurement of f(x,y), x, y ,u PhotoElectrons/Pixel 400,000 300,000 200,000 100,000 0 -50 -40 -30 -20 -10 0 10 20 30 40 50 60 X, mm Camera Y, mm Fluence Scintillators July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx 20 15 10 5 0 -5 -10 -15 -20 -60 -40 -20 0 X, mm 20 Richard M. Bionta bionta1@llnl.gov 40 60 Indirect Imager Single shot measurement of f(x,y), x, y, u Multi shot measurement of l Angle selects energy and attenuation July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov B4C/SiC Test Multilayers Fabricated 40 layer pairs G = 0.7 P = 6 nm Data at Cu Ka, 8 keV July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Total Energy Calorimeter Thermal diffusion calculations performed Single shot measurement of f(x,y), x, y, u Cold Si substrate t = 300 ms t = 100 ms Nd0.8Sr0.2MnO 3 CMR Sensor array 100 pixels Xray Beam t=0 T Cooling ring July 19-21, 2005 XTOD Breakout T, ms 0 Sample CMR at LLNL for etching and R(T) measurements UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov 5 Sensor Development: Nd0.8Sr0.2MnO3 25 25 0.2 3 (sample #23) 20 Resistance [k½] 0.8 20 15 15 10 10 5 5 0 100 0 150 200 Sensitivity 1/R ¶R/¶T [%/K] Nd Sr MnO -5 250 Temperature [K] July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Ion Chamber Single shot, non destructive, measurement of x’, y’, x, y ,u Segmented cathodes for position measurement 10 cm 1 torr July 19-21, 2005 XTOD Breakout Imaging of optical emission for position measurement UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Measuring K with photons On axis: l1 1 K 2 l 2 2 2 July 19-21, 2005 XTOD Breakout u Effect of changing K Dl DK 1.7 l1 K UCRL-PRES-xxxxxx But Dl l1 2 DTe Te Richard M. Bionta bionta1@llnl.gov Near-Field calculations of detuned single undulator segments 49 8. 49 8. 45 8. 45 8. 41 8. 41 8. 37 8. 37 8. 33 8. 33 8. 29 8. 29 8. 25 8. 25 8. 21 8. 21 8. 17 8. 17 8. 13 8. 13 8. 09 8. 09 8. 05 8. 05 8. First 8.2658 First Last 1mm Last 8.2651 49 8. 45 8. 41 8. 37 8. 33 8. 29 8. 25 8. 21 8. 17 8. 13 8. 09 First First 8.2658 Last Detuned 1e-4 Last 8.2645 8. 01 8. First 2 x 2 mm Last 1x 1mm Last has K(1+10-4) 05 8.0E+06 6.0E+06 4.0E+06 2.0E+06 0.0E+00 First 8.2658 Last First 8.2362 Last 8. 01 8. 8.0E+06 6.0E+06 4.0E+06 2.0E+06 0.0E+00 8. First 2 x 2 mm Last 1x 1mm 3.0E+07 2.0E+07 1.0E+07 0.0E+00 01 First and Last 2mm x 2mm Mean, keV Photons/pulse/20 eV Photon Energy, keV July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Single Shot 8 keV Spectrometer Single shot measurement of 20 m downstream l 1.4991 Å Sputter-sliced SiC / B4C multilayer P = 20 nm N = 1x104 D = 200 mm 1.4994 Å 33 mm thick 200 mm Beam DE 1 1 10 4 E N July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Problems: Don't have 20 m. Signal degradation due to grating thickness (coupled waveguides.) Only possible at high photon energies. Richard M. Bionta bionta1@llnl.gov Other candidates for Single-Shot Spectrometers Mosaic Graphite crystal Asymmetric cut multilayer Only one diffracted order July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov Summary X-ray characterization for LCLS is challenging Dose limits materials choice Large range of signal levels Some measurements require precision near r = 10-4 Redundant diagnostics techniques will be used to measure pulse energy Total energy calorimeter Direct Imager Indirect Imager Ion chamber Much work needed on single-shot spectral measurements TTF damage experiment to be analyzed July 19-21, 2005 XTOD Breakout UCRL-PRES-xxxxxx Richard M. Bionta bionta1@llnl.gov