Waveguide-coupled detector in zero-change
complementary metal–oxide–semiconductor
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Citation
Alloatti, L., S. A. Srinivasan, J. S. Orcutt, and R. J. Ram.
“Waveguide-Coupled Detector in Zero-Change Complementary
Metal–oxide–semiconductor.” Applied Physics Letters 107, no. 4
(July 27, 2015): 041104. © 2015 AIP Publishing LLC
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http://dx.doi.org/10.1063/1.4927393
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Detailed Terms
Waveguide-coupled detector in zero-change complementary
metal–oxide–semiconductor
L. Alloatti, S. A. Srinivasan, J. S. Orcutt, and R. J. Ram
Citation: Applied Physics Letters 107, 041104 (2015); doi: 10.1063/1.4927393
View online: http://dx.doi.org/10.1063/1.4927393
View Table of Contents: http://scitation.aip.org/content/aip/journal/apl/107/4?ver=pdfcov
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APPLIED PHYSICS LETTERS 107, 041104 (2015)
Waveguide-coupled detector in zero-change complementary
metal–oxide–semiconductor
L. Alloatti,a) S. A. Srinivasan,b) J. S. Orcutt,c) and R. J. Ram
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
(Received 8 June 2015; accepted 14 July 2015; published online 27 July 2015)
We report a waveguide-coupled photodetector realized in a standard CMOS foundry without requiring changes to the process flow (zero-change CMOS). The photodetector exploits carrier generation
in the silicon-germanium normally utilized as stressor in pFETs. The measured responsivity and 3 dB
bandwidth are of 0.023 A/W at a wavelength of 1180 nm and 32 GHz at 1 V bias (18 GHz at 0 V
C 2015
bias). The dark current is less than 10 pA and the dynamic range is larger than 60 dB. V
AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4927393]
Monolithic integration of million-transistors circuits
with photonic components is an enabling technology for the
high-performance computers (HPC) foreseen in the next
decade.1 However, several materials, processes, or geometries generally utilized for building photonic components
are not available in advanced electronic foundries. For
example, even if optical detection can be achieved by midband gap absorption in doped or poly-crystalline silicon
waveguides or by internal photoemission absorption in
Schottky junctions,2,3 the most typical approach consists of
incorporating pure germanium on silicon.4–6 As a consequence, a complete toolbox has so far been demonstrated
only in modified CMOS flows4,5 and rely on the 90 nm or
older nodes, which are no longer utilized for building HPC
microprocessors.7 The modification of existing nodes,
moreover, requires costly process development and challenges fabrication yield.8
An alternative approach consists of designing photonic
components within existing CMOS foundries without violating the original design rules and without requiring any
change of the fabrication process—a term that we named
“zero-change CMOS photonics.”9 In this approach, the fabrication yield of the transistors remains unaltered and enables
the realization of electronic circuits of the complexity of
microprocessors. Discrete optical components, such as vertically coupled photodetectors, have been fabricated in zerochange CMOS in various foundries.10,11 Within the 45 nm,
12SOI silicon-on-insulator CMOS node of IBM, we have
recently demonstrated zero-change fabrication of grating
couplers (GCs), waveguide propagation losses of less than
5 dB/cm in the 1170 nm–1250 nm range, and 5 Gbps 70 fJ
optical transmitter comprising modulator and driver.9,12 This
node, moreover, is at the core of the 3rd, 4th, and 5th most
performing computers in the top 500 supercomputer list.7
In this work, we demonstrate a waveguide-coupled photodetector realized in 45 nm 12SOI, therefore, completing a
photonic toolbox within a zero-change CMOS paradigm.
a)
Electronic mail: alloatti@mit.edu
Present address: Photonics Research Group, Department of Information
Technology, Ghent University – Imec, St. Pietersnieuwstraat 41, 9000 Ghent,
Belgium.
c)
Present address: IBM T.J. Watson Research Center, 1101 Kitchawan Rd.,
Yorktown Heights, New York 10598, USA.
b)
0003-6951/2015/107(4)/041104/4/$30.00
Previous work on the integration of photodetectors within
zero-change CMOS has focused exclusively on surfaceilluminated devices.10,13 Nearly, all of the previous work has
relied on absorption of light by crystalline silicon and has
been restricted to k < 850 nm. An exception is the demonstration of a surface-illuminated detector also at k ¼ 850 nm
that used the silicon-germanium (SiGe) layer within an IBM
bipolar transistor (BiCMOS) process.11 Our waveguide
photodetector provides a crucial interface between photonic
integrated circuits and CMOS electronic integrated circuits.
The waveguide detector presented here is responsive at
longer wavelengths that can be guided with low loss through
silicon photonic integrated circuits.
The photodetector is based on carrier generation in the
SiGe heteroepitaxially grown in silicon pockets. This material is utilized in the 12SOI process for compressively
straining pFET channels, therefore, increasing the hole mobility.14,15 The optical mode and the cross section of the
photodetector are shown in Fig. 1(a). On top of the crystalline silicon, a 172 nm wide polysilicon strip (normally utilized as transistor gates) defines the waveguide core. A
300 nm wide SiGe pocket is formed next to the polysilicon.
Two well implants define a pn-diode whose junction is in
the center of the SiGe region. The germanium content is
estimated to be in the 25–35 at. % based on data of older
nodes.14 The SiGe has likely been p-type doped during epitaxy and is designed sufficiently narrow for avoiding the
formation of crystal dislocations.16 Source/drain implants,
silicidation, and metal bias form the electron/hole collectors and complete the electrical circuit. Ground-signal (GS)
high-frequency electrodes with minimal density of metal
fill shapes (required by the foundry to minimize dishing of
the wafer) are placed parallel to the waveguide (Fig. 1(b)).
The waveguides have been designed by a fully scripted
code which became part of a complete photonic-design
automation (PDA) tool based on Cadence with abstract
photonic layers, automatic DRC-cleaning, and photonic/
electronic auto-routing.17
Photodiodes of three different SiGe lengths (1.4 lm,
9.4 lm, and 99.4 lm) have been fabricated for characterizing
the optical loss (cut-back method). Each device has both an
input and an output grating coupler. The current-voltage
characteristic of the 99.4 lm long device with and without
107, 041104-1
C 2015 AIP Publishing LLC
V
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041104-2
Alloatti et al.
Appl. Phys. Lett. 107, 041104 (2015)
FIG. 1. Cross-section, optical mode, and geometry of the photodetector. (a)
Schematic cross-section of the photodiode and of the mask-set used to generate it. The optical mode is guided by the rib-waveguide structure consisting of a 4 lm wide, 80 nm thick crystalline silicon and a 172 nm wide, 65 nm
thick polysilicon core. On one side of the polysilicon, 300 nm wide SiGe is
grown by heteroepitaxy. Light is coupled in and out of the waveguide
through GCs. (b) Representation of the intensity of the TE00 optical mode.
(c) View of the photodetector with 99.4 lm-long SiGe active region. GS
electrodes are located parallel to the waveguide. The first seven metal layers
are present along the entire device length (inset). (d) Photograph the fabricated device monolithically integrated with an electric receiver.22
illumination is given in Fig. 2(a). The dark current is less
than 10 pA resulting to a reverse-bias dynamic range of
more than 60 dB. The responsivity of the device (defined as
optical power at the photodiode input/photocurrent) was
measured as a function of wavelength by recording at the
same time input and output optical power and photocurrent
(Fig. 2(b)). The measurement was repeated a second time
with exchanged input and output fiber connectors such as to
verify that the input and output grating couplers caused the
same optical loss. For comparison, Fig. 2(b) reports also the
responsivity based on the optical absorption measured in
unstressed SiGe at various germanium concentrations18 and
based on the Macfarlane equations
"
að Þ ¼ A
h Eg kh
1 eh=T
2
h Eg þ kh
þ
eh=T 1
2 #
;
FIG. 2. Device performance. (a) Current-voltage characteristics with and
without illumination. Under illumination, the zero-current voltage is 0.75 V,
and the photocurrent is 32 lA at 1 V bias with 1.4 mW in-waveguide optical power (wavelength of 1180 nm). The dynamic range is larger than 60 dB.
(b) Responsivity vs. wavelength and the responsivity for strained and
unstrained SiGe at different concentrations based on experimental data18
and on the Macfarlane equations (legend). The model curves (legend) use
the following parameters: energy gap Eg ¼ 0.991 eV and 0.965 eV and phonon energy # ¼ 480 K and 460.4 K for unstrained alloys with 25% and 32%
germanium content, respectively (legend). The model for strained silicongermanium is obtained by shrinking the bandgap by 0.03 eV. (c) Frequency
response. A 3 dB bandwidth of 18 GHz is obtained at 0 V bias and of
32 GHz at 1 V bias.
where is the photon frequency, Eg is the energy gap, k is
the Boltzmann constant, T ¼ 295 K is the room temperature,
# is the phonon energy (expressed in K), and the sum over
the six branches of the vibrational spectrum has already been
carried out and is contained in the coefficient A. For the
bandgap and phonon energy of unstrained SiGe, we set
Eg ¼ 1.088 eV, 0.991 eV, and 0.965 eV and # ¼ 550 K,
480 K, and 460.4 K for the concentrations of 0%, 25%, and
32%, respectively. The bandgap data and the phonon energy
for pure silicon are as reported by Braunstein.18 With these
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041104-3
Alloatti et al.
values, good agreement is obtained with the experimental
data18 of unstrained silicon germanium. The effects of
hydrostatic strain19 on 25% germanium are taken into
account by shrinking the bandgap by 0.03 eV (Fig. 2(b)),
obtaining an upper boundary of the measured responsivity.
To determine the device responsivity based on the
absorption coefficient of silicon-germanium, we calculated
the power overlap integral of the optical mode with the SiGe
region. The overlap integral is found to vary approximately
linearly between 0.128 at a wavelength of 1170 nm and
0.121 at a wavelength of 1250 nm. At the wavelength of
1180 nm, the responsivity is 0.023 6 0.002 A/W (1 V bias).
If no other loss mechanism was present, this responsivity
would correspond to an optical propagation loss of 10.7 dB/cm.
From the cut-back method, the optical loss was found to be
40 6 10 dB/cm and is dominated by free-carrier absorption
(FCA) in the pre-doped poly-silicon. This means that the
quantum efficiency of the present geometry can reach at least
20% in the long-device limit. Furthermore, results in a
0.18 lm bulk CMOS node20 show that the propagation loss of
optimized polysilicon waveguides can be as low as 10 dB/cm.
Because of the small optical overlap with the polysilicon
rib of the current geometry (Fig. 1), the use of low-loss polysilicon (in a modified process) could lead to parasitic losses
below 10 dB/cm (Ref. 21) and therefore to quantum efficiencies beyond 50% in the long device limit.
An alternative scheme for increasing the responsivity of
the photodiode consists of using resonant structures such as
rings. This approach would have multiple advantages: first,
the current scheme of detecting wavelength-division multiplexing (WDM) signals (based on a silicon ring acting like a
filter and a separate photodiode) would be simplified by the
elimination of the drop port.22 Second, the effective optical
path length would be dramatically increased without sacrificing space. Third, the use of whispering gallery modes would
no longer require the use of poly-silicon, therefore eliminating the parasitic loss dominated by the latter. Finally, by
using, for example, a ring with a radius of 5 lm,12 the total
junction length would be decreased leading to a smaller capacitance. The problem of locking the resonator to the correct wavelength with an on-chip feedback loop has,
moreover, been recently addressed.22
The bandwidth of the device was measured by contacting the GS electrodes with a 50 lm pitch GS probe of
Cascade Microtech (model Infinity I67-A-GS-50). The reference plane was set at the V-connector of the probe,
so that the probe is considered part of the photodiode. The
frequency response was measured with a 40 GHz VNA
(HP8722D) and the frequency-response of the setup (comprising modulator, semiconductor-amplifier (SOA), RF
cables, and bias-T) was calibrated with a reference photodiode (Discovery Semiconductors, model DSC30-3-2010)
of known frequency-response at a wavelength of 1550 nm.
It was confirmed that the frequency response of the combined system of modulator and reference photodiode is
identical (within measurement accuracy) at 1550 nm and
1180 nm. The photodiode has a 3 dB bandwidth of 18 GHz
at 0 V bias. The bandwidth increases to 32 GHz with a
reverse bias of 1 V. A different set of devices, in which
the diode junction was shifted by 150 nm towards the
Appl. Phys. Lett. 107, 041104 (2015)
waveguide center, showed smaller bandwidths (8 GHz at
1 V bias). The generated photocurrent is sufficient for
driving the on-chip electrical receiver23 which has a peakto-peak sensitivity of 6 lA at 5 Gb/s.22
In conclusion, we have fabricated and characterized a
waveguide-coupled photodetector compatible with unchanged
CMOS processes. The photodiode has a 3 dB bandwidth of
32 GHz at 1 V bias. The photodiode is realized in the 45 nm
CMOS node, which is widely used in high-performance
computing.
We acknowledge support by DARPA POEM under
Award No. HR0011-11-C-0100 and Contract No. HR001111-9-0009, led by Dr. Jagdeep Shah. The views expressed
are those of the authors and do not reflect the official policy
or position of the DoD or the U.S. Government.
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