Theory of Quantum Dot Lasers M. Grundmann Institut für Experimentelle Physik II Fakultät für Physik und Geowissenschaften Universität Leipzig grundmann@physik.uni-leipzig.de www.uni-leipzig.de/~hlp/ Semiconductor Physics Group Content Introduction Electronic levels, Gain Carrier distribution function Laser properties static dynamic Conclusion Semiconductor Physics Group Scheme QD Laser (Edge Emitter) + Au-Zn-AuTi-Pt-Au p-GaAs p-AlGaAs p-GaAs n-GaAs n-AlGaAs [001] n-GaAs [110] Ni-Ge-Au Semiconductor Physics Group − TGr: Semiconductor Physics Group 700 °C 600/ 650 °C 505 °C (⇒ 640 °C) 640 °C 300 - 600 nm GaAs:Zn contact layer 0.8 - 1.0 µm AlGaAs : Zn cladding layer AlGaAs/GaAs SPS 70 nm GaAs barrier QDs 70 nm GaAs barrier AlGaAs/GaAs SPS 0.8 -1.0 µm AlGaAs:Si cladding layer GaAs:Si buffer with AlGaAs/GaAs SPS Layer Sequence quantum dot sheets Simple Picture of Density of States bulk QD QW E |1> Ec |000> |010> |011> |111> |0> D(E) D(E) Ec Semiconductor Physics Group E D(E) Ec E Ec E Simplest Theory Threshold current density: jthr ~ (1 ... 2)e × nQD/ττQD Characteristic temperature: infinite (perfect confinement) i.e. jthr is T-independent Semiconductor Physics Group Scheme electronic states carrier dynamics strain confinement (bi-)excitons oscillator strength capture inter-sublevel relaxation recombination thermal escape dephasing/scattering Threshold condition Laser operation QD ensemble effects inhomogeneous broadening carrier distribution function lateral arrangement Semiconductor Physics Group Single Particles States EcGaAs 1452.7 1518 1371.4 1.194 eV 1.098 eV 1359.3 1273.5 175.2 145.1 165.1 Ev 0 C1 V1 C2 V2 C3 V3 GaAs b=13.6 nm 5 nm 3D strain calculation 8-band kp-theory conduction band valence band M. Grundmann et al., PRB 52, 11969 (1995) O. Stier, MG, D. Bimberg, PRB 59, 5688 (1999) Semiconductor Physics Group Conventional Rate Equation Model (CRE) G τr 2 using ensemble averaged state populations f τ0 1 Semiconductor Physics Group Generation rate: G Radiative recombination:ττr Intersublevel relaxation: τ0 τr incorrect results τ0 → 0 G < 1 / τr f 1 = Gτ r f2 = 0 Master Equations of Microstates (MEM) Mean field Theory 2 QD's: Microstates ne=1/4 nh=1/4 N(0,0)=0 N(1,0)=1 N(0,1)=1 N(1,1)=0 ne=1/4 nh=1/4 N(0,0)=1 N(1,0)=0 N(0,1)=0 N(1,1)=1 Different situations are described by identical parameters Semiconductor Physics Group Impact on cw-spectra transients (decay) gain threshold Precise description of the situation MEM - Dynamics within a Single Dot Model: Excitons in ground and excited states n=1,2 Radiative recombination: τr Intersublevel relaxation: τ0 τr/2 n=2 n=1 τr n=2 n=1 Semiconductor Physics Group τ0 τr/2 τr τr τ0/2 τr τr Current - MEM vs. CRE Semiconductor Physics Group State Filling Strain induced quantum dots M. Sopanen, H. Lipsanen, J. Ahopelto Appl. Phys. Lett. 65, 1662 (1995) Semiconductor Physics Group Luminescence Intensity (arb. units) State-Filling: MEM vs. CRE 6 5 4 12 3 6 2 2 1 0 0.9 Semiconductor Physics Group RP, τ0=0 RE, τ0=τr/100 1.0 1.1 Energy (eV) 1.2 1.3 State-Filling of Self-Assembled QD's 1.4 1.3 PL-Intensity (arb. units) 10 Wavelength (µm) 1.1 1.0 1.2 0.8 300 K Wetting layer GaAs Quantum Dots 4 0.9 I (W/cm2 10 3 500 50 10 2 5 10 1 0.5 0.9 Semiconductor Physics Group 1.0 1.1 1.2 1.3 Energy (eV) 1.4 1.5 PL - Intensity (arb. units) State-Filling of Self-Assembled QD's 10 InAs/GaAs tav=1.0nm 4 T=8K 103 2 5 50 125 500 W/cm 0.5 102 101 0.9 Semiconductor Physics Group 1.0 1.1 1.2 1.3 Energy (eV) 1.4 1.5 State-Filling 1 10 I0 I1 I3 MEM,τ0 =35 ps 0 PL Intensity 10 -1 10 -2 10 -3 10 -4 10 -5 10 -3 10 -2 10 -1 10 0 10 Excitation (X/ (QD / τ)) Photoluminescence of mesa (d=30 µm) homogeneous excitation density Semiconductor Physics Group 1 10 MEM vs. CRE PL Intensity (arb. units) 1 Exp. |001> MEM, τ0=30ps CRE, τ0 =30ps 0.1 0.01 0.0 0.2 0.4 0.6 Time (ns) 0.8 Time-resolved photoluminescence Semiconductor Physics Group Ground State Gain - MEM vs. CRE CRE only correct in the limit of small excitation CRE overestimates gain CRE overestimates inter-sublevel relaxation time Semiconductor Physics Group MEM Summary Master equations for the transitions between micro-states are the conceptually correct model to describe the dynamics in quantum dots Modeling of the finite inter-level scattering time with conventional rate equations for the average level population can lead to wrong results, especially for t0<<tr. Experiments on quantum dots with fast and slow inter-level relaxation have been fitted. Semiconductor Physics Group Gain Electronic structure level positions inhomogeneous broadening homogeneous broadening oscillator strength barrier levels Recombination excitonic Carrier distribution function population of micro-states master equations thermal excitation non-equilibrium distribution Semiconductor Physics Group Gain pre-factor πe2 m 02 ε 0 c n r ω ∫ ∑i g (hω ) = M 2 2 δ (ε − E V0 DOS inhomogeneous oscillator broadening strength Semiconductor Physics Group g − E 0 ,i )[ f c ( ε ) − f v ( ε ) ] Γ in / π dε ( h ω − ε ) 2 + Γ i 2n carrier homogeneous distribution broadening function Saturated Gain L.V. Asryan, M. Grundmann et al., J. Appl. Phys. 90, 1666 (2001) Semiconductor Physics Group several excited transitions Gain Gain ( gmax ) 1 e+h (eh) 0 1 0 -1 -1 0 1 N/N D 2 2 Injection current ( e ND / τr ) Effect of correlated capture Semiconductor Physics Group 1 0 3 Only ground state is considered Gain - p-doped O.B. Shchekin, D.G. Deppe Appl. Phys. Lett. 80, 2758 (2002) Effect of static hole population Semiconductor Physics Group Only ground state is considered Threshold Current vs. Coverage Threshold current 2 (A/cm ) 3 10 e+h (eh) 2 10 α=10cm-1 1 10 0.01 ζmin Effect of correlated capture Semiconductor Physics Group 0.1 Coverage ζ 1 Only ground state is considered MEM - Dynamics in an Ensemble E1 τc E2 τeE 1 E3 τc τEe 2 barrier Size dependent capture time (?) escape time (!) τc τEe 3 QD's Semiconductor Physics Group Size distribution function Gaussian Carrier Distribution Function 1.0 0.4 nA/QD 0.32 Probability 0.8 0.6 0.4 300 K Fermi 77 K Low temperatures: Strong deviation from Fermi-function 0.24 0.16 Room temperature: Small deviation from Fermi-function Shift of EF with increasing injection 0.2 0.08 0.0 -150 -100 -50 Energy (meV) ground state Semiconductor Physics Group excited state 0 PL - Intensity (arb. units) State-Filling of Self-Assembled QD's 10 InAs/GaAs tav=1.0nm 4 T=8K 103 2 5 50 125 500 W/cm 0.5 102 101 0.9 1.0 1.1 1.2 1.3 Energy (eV) 1.4 Non-thermal carrier distribution! Semiconductor Physics Group 1.5 Gain Spectrum 1.0 0.4 nA/QD 300 K 77 K Low temperature: No Fermi distribution Small shift of gain maximum Larger gain maximum 0.32 Gain 0.24 0.5 0.16 Room temperature: Shift of wavelength and gain maximum 0.08 nA/QD 0.0 -150 -100 Energy (meV) Semiconductor Physics Group -50 Gain - Extremes: NTC vs. TC fn+fp-1=0.86 fn+fp-1=0.69 fn+fp-1=0.39 Gain 1.0 NTC: NTC gmax 0.5 all QD's have the same population regardless of the ground state energy 0.0 1.0 Gain non-thermal distribution µ=E0+3σE µ=E0+2σE µ=E0+σE µ=E0 2.0 TC: N/ND 1.5 1.0 0 1 2 3 4 µ-E0/σE 0.5 0.0 kBT=σE -0.5 -4 -3 -2 -1 0 1 (E-E0) / σE Semiconductor Physics Group TC 2 3 4 thermal distribution QD population is given by Fermi function Experimental Gain at Low Temperature 40 35 30 20 -1 Gain (cm ) 25 T=77K -2 100 Acm -2 90 Acm 80 Acm -2 70 Acm -2 60 Acm -2 PL (arb. units) NON-thermal carrier distribution function 15 10 Gain ~ Gaussian × j 5 0 -5 -10 -15 1215 1220 1225 1230 1235 1240 1245 1250 1255 1260 1265 1270 1275 Energy (meV) Semiconductor Physics Group Gain at High Temperature QD laser emission 20 T=300K 10 Thermal carrier distribution function Gain (cm-1) 0 -10 -2 -20 -30 -40 350 Acm -2 300 Acm -2 250 Acm -2 200 Acm -2 150 Acm -2 100 Acm -2 60 Acm Gain= Gaussian × Fermi EF -50 1110 1120 1130 1140 1150 1160 1170 1180 1190 1200 1210 1220 Energy (meV) Semiconductor Physics Group Gain of 2nd Excited State L.V. Asryan, M. Grundmann et al., J. Appl. Phys. 90, 1666 (2001) Semiconductor Physics Group 2 jth (A/cm) ξ=15% ξ=10% ξ=5% 100 Gain on Excited States (a) NTC 10 kB T=σE kB T=2σE kB T=σE kB T=σE /2 100 2 jth (A/cm) 1 For increasing losses or decreasing gain (b) NTC Shift of laser emission to excited states higher energies RT 10 ξ=10% 1 (Emax-E0 ) / E0 3 kB T=2σE kB T=σE kB T=σE /2 2 continously discontinuously (c) 1 0 -1 -2 NTC ξ=10% 0.01 0.1 Area coverageζ Semiconductor Physics Group 1 Gain Saturation 2 jth (kA/cm) 1.6 T=77K 1.2 1 Layer 6 Layers 0.8 QD 0.4 0.0 Semiconductor Physics Group WL 2 1 0.5 Cavity Length (mm) 0.25 History of Diode Laser Threshold Threshold current density (A/cm2) 10 4 Quantum Dots DH 10 3 SCH-QW 102 strained QW 10 Theory 1 293 K 1960 Semiconductor Physics Group 1970 1980 1990 Year 2000 2010 Temperature Dependence of Gain Gain (scaled units) 1.0 0.9 -80K: negative T0 80-150K: very high T0 >150K: positive T0 0.8 0.7 0.6 0.5 0 Current e/QD/τ 2 4 50 100 150 200 250 Temperature (K) Semiconductor Physics Group 300 350 400 Temperature Dependence of Threshold Threshold current (e/QD/τ) 3.0 Master equations for micro-states incl. thermal emission No T-dependent carrier loss in the barrier! τbarr=ττQD 2.5 T0 =-500K T0 =500K 2.0 T0~∞ Q )D /h (e lrsu o td n cT g= 0.7 gmax 1.5 0 50 100 150 200 250 Temperature (K) Semiconductor Physics Group 300 350 400 Small T0 values at RT Leakage current! RT: 100 τbarr=τQD ηbarr=37% ηbarr=5% T0 = 54 K 2 Threshold current density (A/cm ) Temperature Dependence of Threshold 14 1 T 0= Reduction of T0 due to T-dependent quantum efficiency ηbarr in the barrier K 0K 0 5 T0 ~ 10 0 50 100 150 200 250 300 350 Temperature (K) Semiconductor Physics Group τQD=1 ns High Power Laser Performance 8 x jthr Semiconductor Physics Group High Power Lasing Spectra QD laser 3×InAs/GaAs Spectral power density (W/nm) 10-1 Increasing width of mode spectrum with power due to inhomogeneous broadening -2 10 18.2 10.5 4.7 -3 10 1.3 1.0 Saturation value: 12.5 nW per QD refill time < 14ps 10-4 0.8 0.5 -5 10 1070 1080 1090 1100 1110 Wavelength (nm) Semiconductor Physics Group 1120 Laser intensity (arb. units) High Power Simulation 10 0 10 -1 10 -2 10 -3 10 -4 10 -5 10 -6 10 -7 10 -8 10 -9 10 -10 -240 σ=20 meV Γ=0 Inhomogeneous broadening dominates 1.2×Ithr 0.8×Ithr 0.4×Ithr -230 -220 -210 -200 -190 -180 -170 -160 Energy (meV) "Hat"-like spectral shape Saturation at high injection current > finally all QDs participate for which > dependent on relaxation bottleneck the gain is larger than the losses Semiconductor Physics Group Laser intensity (arb. units) High Power Simulation 10 0 10 -1 10 -2 σ=20 meV Γ=20 meV Inhomogeneous broadening Homogeneous broadening of similar size 10 -3 10 -4 1.04×Ithr 10 -5 0.96×Ithr 10 -6 10 -7 10 -8 10 -9 -10 10 -240 -220 -200 -180 -160 Energy (eV) Sharp spectral shape in the center of the gain spectrum > off-resonant QDs participate in lasing > collective action of the QD ensemble Semiconductor Physics Group Principle of bipolar MIR QD Laser Lasing on inter-sublevel transition in the MIR Pumping of upper level from barrier Depletion of lower level by interband lasing Semiconductor Physics Group Polarization: NIR and FIR Band edge (1.12 eV, 1100nm) FIR Inter-sublevel transitions (90 meV, 13.8 µm) [001] ×5 C1-V1 Semiconductor Physics Group C1-C2 C1-C3 Simulation of MIR-Laser - Population -1-1 αα =14cm, =14 cm 12 -1-1 αα =8cm, =44 cm 12 Population 1.0 0.8 0.6 f1 f2 0.4 0.2 0.5 max Gain (g ) 0.0 1.0 0.0 E1 E2 MIR -0.5 -1.0 0 5 10 15 20 25 Injection current (e/τr) Semiconductor Physics Group 0 5 10 15 20 25 Injection current (e/τr) Simulation of MIR-Laser - Emission Spontaneous MIR 0.5 6 NIR 10 0.0 0 5 5 Current -1 -1 0.5 MIR 0.0 0 10 5 Current 10 NIR NIR 0 20 15 10 5 0 0 5 10 15 20 25 Injection current (e/ τr ) Semiconductor Physics Group α1=8cm , α2=44 cm 6 15 -1 MIR ×10 Laser output (Nph /e) -1 MIR ×10 α1=14cm , α2=14 cm 0 5 10 15 20 25 Injection current (e/ τ r ) Relaxation Oscillations 25 6 20 5 P (mW) 2.90 2.41 1.98 1.49 1.01 15 10 5 0 Coupling of carrier density photon density 0 1000 2000 Timet (ps) MOCVD 3×InAs/GaAs Semiconductor Physics Group 4 3 2 1 T=293 K L=265µm 0 1 2 3 √ Power (√mW) 3dB cutoff: 8.2 GHz L=265 µm laser Itr=40 A/cm2 ηi = 91% Relaxation Oscillations σ=20 meV, τ0=100ps Homogeneous broadening leads to collective behavior Semiconductor Physics Group M. Grundmann, APL 77, 1428 (2000) Relaxation Oscillations Γ=0.5 meV Γ=5 meV Γ=30 meV 2.0 Time (ns) 0.9 1.5 0.8 0.7 1.0 0.6 0.5 -30 0 30 -30 0 30 -30 0 30 Energy (meV) Energy (meV) Energy (meV) Homogeneous broadening leads to collective behavior Semiconductor Physics Group Ground state filling 1.0 0.5 σ=20 meV, τ0=100ps Relaxation Oscillations RO Frequency (GHz) 7 0.5 meV 30 meV 6 5 4 σ=20 meV 3 I=1nA/QD 2 30 40 50 60 70 80 -1 Gain (cm ) M. Grundmann, Electr. Lett. 36, 1851 (2000) Impact of time constants Semiconductor Physics Group Impact of gain Chirp - Simple Picture 0.2 10 0.0 dnr (%) gain (cm-1) 20 α≡ ∂nr / ∂N 2π ∆λ / ∆I ≈− ⋅ ∂ni / ∂N δλ ⋅ L ∆g net / ∆I -0.2 0 2 asymmetric QD Ensemble α 1 0 symmetric QD Ensemble α=0 -1 1.20 1.25 1.30 Energy (eV) Semiconductor Physics Group α is also called linewidth enhancement factor Absorption - QD vs. QW QD QW J. Oksanen, J. Tulkki, J. Appl. Phys. 94, 1963 (2003) Semiconductor Physics Group Linewidth Enhancement Factor Smaller for QD than for QW can be zero for QD laser temperature effects! Semiconductor Physics Group Linewidth Enhancement Factor Impact of Fermi level J. Oksanen, J. Tulkki, J. Appl. Phys. 94, 1963 (2003) Semiconductor Physics Group Spatio-Temporal Dynamics Mesoscopic theory QD fluctuations spatially inhomogeneous light propagation dynamic scattering Maxwell + QD-Bloch equations E. Gehrig, O. Hess, Phys. Rev. A 65, 033804 (2002) Semiconductor Physics Group Spatio-Temporal Dynamics 60mW Th. Near field characteristics show less filamentation for QD laser due to small amplitude-phase coupling Exp. E. Gehrig, O. Hess et al. Appl. Phys. Lett. 84, 1650 (2003) Semiconductor Physics Group Beam Quality M2 Smaller M2 for QD laser for same stripe geometry and for same injection conditions E. Gehrig, O. Hess et al. Appl. Phys. Lett. 84, 1650 (2003) Semiconductor Physics Group Summary Single QD properties and dynamics QD fluctuations, ensemble average at room-T: Fermi is a good approximation otherwise: non-thermal carriers Spatially dependent light field Realistic description of QD laser properties and agreement with experimental results Semiconductor Physics Group Thanks to... the many colleagues I enjoy(ed) working with on quantum dot lasers over the last 10 years, in particular: (in alphabetical order) Zh.I. Alferov L.V. Asryan D. Bimberg F. Heinrichsdorff R. Heitz N. Kirstaedter N.N. Ledentsov Semiconductor Physics Group M.-H. Mao Ch. Ribbat A. Schliwa O. Stier V. Ustinov A. Weber