Journal of Non-Crystalline Solids 338–340 (2004) 552–556 www.elsevier.com/locate/jnoncrysol Local structure resulting from photo and thermal diffusion of Ag in Ge–Se thin films M. Mitkova *, M.N. Kozicki, H.C. Kim, T.L. Alford Center for Solid State Electronics Research, Arizona State University, Tempe, AZ 85287-6206, USA Available online 12 April 2004 Abstract Thermally and photoinduced diffusion of Ag in thin amorphous Ge20 Se80 films are investigated with particular attention being given to the reaction kinetics and the local structure that results. The differences in the nature of the two diffusion processes with regard to the amount of the diffused silver in the films and the changes in the backbone structure of the hosting film are presented and discussed. Ag diffusion in this particular chalcogenide glass composition results in the formation of a phase separated structure formed by the Ge–Se backbone and Ag2 Se or Ag nanocrystals. Ó 2004 Elsevier B.V. All rights reserved. PACS: 42.70.C; 70.66.J; 61.43.F; 46.30.P 1. Introduction Thermal solid-state diffusion, the generation of a matter flux due to the application of heat energy, is an important transport phenomenon that is widely used in semiconductor technologies. When silver is the diffusing ion, the diffusion rate is naturally expected to be high due to the small ionic radius of the mobile particle. Silver diffusion in chalcogenide glasses may be also attained using light of the appropriate wavelength, a process unique to this system known as photodiffusion. The different stages of silver photodiffusion can produce diverse effects such as silver surface deposition [1] or the formation of structures with different optical constants [2]. The process has even been suggested as a means for producing low dimensional structures in VLSI circuit production [3]. No matter what the driving force for the Ag diffusion process is, the structure of the hosting material changes significantly [4], particularly at the nanoscale. The difficulty with the understanding of the formation and nature of the new structure is due to the fact that it is not possible to make general conclusions about the whole range of chalcogenide systems as in each case different reaction products form and dif* Corresponding author. Tel.: +1-480 965 9481/727 6243; fax: +1480 965 8118/2747. E-mail address: mmitkova@asu.edu (M. Mitkova). 0022-3093/$ - see front matter Ó 2004 Elsevier B.V. All rights reserved. doi:10.1016/j.jnoncrysol.2004.03.040 ferent diffusion kinetics dominate. In addition, if illumination with light is the driving force for the diffusion process, a photoinduced change in the local structure of the hosting chalcogenide glass occurs and this additionally influences the diffusion process and resulting structure. We have focused our current investigations on the thermal and photodiffusion processes and products arising from the diffusion of Ag in Ge20 Se80 thin films. This chalcogenide composition has a mean coordination number of 2.4 and this will result in the formation of a very stable glass as predicted by the Constraint Counting Theory [5] combining the properties of floppy (undercoordinated) and intermediate glasses in this system as shown by Boolchand et al. [6]. Besides, it is expected that this composition will take up a particularly high concentration of diffused Ag as it has been revealed that diffusion kinetics and the amount of diffused Ag can be correlated to the chalcogen content of the glass [7]. 2. Experimental Thin Ge–Se films 35 nm thick were prepared by thermal evaporation of previously synthesized glasses on silicon substrates covered with a film of Si4 N3 to electrically isolate the films from the substrate using a specially designed membrane evaporator with construction similar to a Knudsen cell. The actual composition of the M. Mitkova et al. / Journal of Non-Crystalline Solids 338–340 (2004) 552–556 mally induced diffusion at a treatment shorter than a minute, no observable silver diffusion into the films occurs. This ‘induction period’ effect is common for thermal diffusion and has been reported in other similar systems [9]. More interestingly, in the case of photodiffusion no induction period has been found and the results also show that the diffusion rate and the quantity of silver at saturation of the films are higher. Fig. 1 shows the overall change in the amount of the diffused silver with time. The kinetics curves illustrate that saturation after thermal diffusion occurs when the concentration of Ag introduced into the chalcogenide matrix reaches 43%, while for photodiffusion the amount of the diffused silver is 47.3 at.% (for comparison, in bulk material one can introduce an maximum of 33 at.% silver [10]). The Raman analysis gives a clear indication of the different nature when the diffusion process is driven by heat or by light. For thermal treatment the presence of Ge–Se corner sharing tetrahedra at 194 cm1 are seen to dominate (Fig. 2), as expected for Ge20 Se80 backbone [11]. The films were placed in a heating camera, so that we lost part of the signal due to difficulties in focusing of the laser beam, which results in a poor signal to noise ratio. The noisy spectra were therefore numerically smoothed to enable extraction of meaningful information. Although the selenium concentration is high and the initial network is expected to exhibit high flexibility having a ‘non-stressed rigid’ structure [6], the peaks seem to be smeared, suggesting a high degree of disorder [12] due to strain that occurs because of the differences of thermal expansion coefficients between the film and the substrate. With development of the diffusion process no changes in the position of the Raman modes occur i.e. no modification in the original configuration of the backbone structure of the chalcogenide glass takes place. However fitting the spectra shows systematic 50 Amount of diffused Ag(at.%) deposited films as determined by Rutherford backscattering spectrometry (RBS) was within ±2.5 at.% of the initial source composition. Following deposition of the chalcogenide, a 20-nm silver film was evaporated on top and this sandwich structure was either subsequently thermally treated or illuminated with light. The thermal treatments were performed at 120 and 200 °C in repeated blocks of 10 min up to a maximum of 5 h in nitrogen atmosphere. The optically treated samples were illuminated with 436 nm light, which is above the optical gap of the chalcogenide, at room temperature for various times using the light source of a Karl Suss MJB-3 contact aligner with an optical power density of 6.5 mW/ cm2 . The typical illumination time was 10 min. The residual silver on the surface of the sandwich structure was dissolved in 1 mol solution of Fe(NO3 )3 . The composition of the resulting films before and after the diffusion process was studied using RBS analysis, performed with 2 MeV 4 Heþ with the beam at normal incidence to the sample and a backscattering angle of 65°. As the samples were quite beam sensitive, a reduced charge of around 0.25 lC/mm2 was used. Experimental RBS curves were fitted with those obtained by numerical calculation using the ‘RUMP’ software package [8]. The chemical composition of the layer and the corresponding number of atoms of silver were used as fitting parameters. The shape and position of the RBS yield energy profiles have Gaussian form which is the result of the convolution of the normalized Ag concentration distribution and another Gaussian function which models the broadening in the RBS spectra due to the energy resolution of the detector and associated electronics. Because the signals from Ge and Se are very close to each other, a shoulder forms in the spectra but each of the individual signals is Gaussian in character. The phases formed in the films were characterized by means of an X-ray diffraction (XRD) method performed by CuKa radiation in the 2-theta range from 23° to 100° at a step size of 0.05°. Raman spectra were obtained to provide information on the short and medium range order occurring in the films after the diffusion processes. These investigations were performed in the micro-Raman mode with the following conditions: 15 s at 15 accumulations by illumination with 1.5 mW of light power on sample with 647.1 nm wavelength of a Krþ ion laser. In situ measurements at elevated temperatures placing the films in a special thermal camera purged with nitrogen were also performed. The experimental curves were fitted with Labcalc software package. The amount of diffused silver was established using RBS analysis and the results show that in case of ther- Photo diffusion 40 Thermal diffusion 30 20 10 0 3. Results 553 0 5 10 15 20 25 Time (min) Fig. 1. Amount of diffused silver in Ge20 Se80 films: (a) due to photodiffusion; (b) due to thermal diffusion. 554 M. Mitkova et al. / Journal of Non-Crystalline Solids 338–340 (2004) 552–556 10 (a) virgin film 65.0 Normalized intensity(a.u.) Counts (arb. units) 65.5 (b) 64.5 o HT@120 C, 10 min 64.0 63.5 (c) o HT@200 C, 10 min 63.0 50 100 150 200 250 300 8 6 + 4 ++ Initial film * * * * HT@200°C ^ *++* * * 2 20 30 40 50 60 70 80 90 100 -1 Raman shift (cm ) 2 Theta (deg.) Fig. 2. Raman spectra of Ge20 Se80 film: (a) virgin film, (b) film after thermal treatment at 120 °C for 10 min, and (c) film after thermal treatment at 200 °C for 10 min. Fig. 4. XRD pattern of thermally diffused Ge20 Se80 films: (a) virgin film, (b) film after thermal diffusion at 200 °C for 10 min: * denotes peaks of Ag, + denotes peaks of orthorhombic Ag2 Se, and ^ are peaks of cubic Ag2 Se. reduction in the scattering strength of the Se chain mode at 260 cm1 (CM) with the annealing time. In the case of photodiffusion, drastic changes in the structure of the hosting material take place when saturation is reached as shown in Fig. 3. Prior to diffusion, the hosting material exhibits modes of Ge–Se cornersharing tetrahedra at 194 cm1 , low scattering from edge sharing tetrahedra at 221 cm1 , and Se chains at 260 cm1 (stretching mode) and 150 cm1 (bending mode). However, after the diffusion process is complete, we see at 180 cm1 the mode of the ethane-like molecule Ge2 Se6 and at 203 cm1 the mode of the GeSe4 tetrahedron. The XRD investigation shows that prior to any treatment, the films consist of micro-crystalline Ag with 2-theta peaks at 38.12°, 44.30°, 81.54° and 97.89° (JCPDS card #87-2871) and an underlying amorphous matrix of Ge–Se glass, as shown in Fig. 4. Following thermal diffusion at 200 °C to completion, features of orthorhombic Ag2 Se with peaks at two theta 26.97°, 33.54°, 40.41° – JCPDS card # 06-0501; 28.83 – JCPDS card # 25-0766; and 43.43° JCPDS card # 20-1063 emerge together with peak of cubic Ag2 Se at 35.89° – JCPDS card # 27-0619 and silver. From the XRD data, one can also see that the Ge–Se backbone remains amorphous after the thermal anneal. Counts (arb. units) 1.6 1.2 0.8 Ge 20 Se80 b) (Ge 20 Se80 ) 53 Ag 47 c) Ag 2Se 0.0 100 200 We now discuss the most important results of our work regarding how and in what form silver incorporates into the Ge20 Se80 films and show in what manner the resulting structure depends upon the way in which the diffusion process is performed. If we assume that the mean coordination of Ag with Se is 3 we can use the equation proposed in Ref. [10] to estimate the composition of the glasses after Ag is introduced: ðGex Se1x Þ1y Agy ¼ ð3y=2ÞðAg2=3 Se2=3 Þ a) 0.4 4. Discussion 300 400 -1 Raman Shift (cm ) Fig. 3. Raman spectra of Ge20 Se80 films: (a) virgin film, (b) film after saturation with silver at photodiffusion, and (c) Raman spectrum of Ag2 Se. þ ð1 3y=2ÞðGet Se1t Þ; ð1Þ where t ¼ xð1 yÞ=ð1 3y=2Þ is the amount of Ge in the Ge–Se backbone. At x ¼ 0:20 and y ¼ 0:43, we get t ¼ 0:33 for the case of thermally induced diffusion and t ¼ 0:36 for the case of photodiffused silver when y ¼ 0:47. Feng et al. [11] demonstrated that Ge–Se glass containing 33 at.% Ge will consist only of CS and ES Ge–Se tetrahedra. As shown on Fig. 2 there are not big changes of the initial backbone structure due to the thermal treatment and indeed the ES structures are not developing with the diffusion as seen also for Ge30 Se70 M. Mitkova et al. / Journal of Non-Crystalline Solids 338–340 (2004) 552–556 glasses by Takeuchi et al. [13]. We are tempted to suggest that this is due to the fact that Ag only partially reacts at the diffusion temperatures with Se from the Se chains and partially finds place between the structural units of the glass and remains in elemental form as neither the annealing temperature nor time contribute for it to fully chemically react with Se from the Se chains. The presence of Ag2 Se and Ag is manifested also on the XRD spectra of the diffused films. In the case of photodiffusion, there is excellent agreement between our Raman data and the post-diffusion calculated backbone composition of 36 at.% Ge. As discussed by Boolchand [14], in this composition the underlying molecular phase consists of face-sharing quasi one-dimensional ethane-like Ge2 (Se12 )6 chain fragments whose presence is manifested on the Raman spectra by the appearance of the mode at 180 cm1 depicted in Fig. 3(b) following silver diffusion. This structure supposes the appearance of Ge–Ge bonds. So far, investigations of the photoinduced changes in Ge– Se glasses have not revealed the formation of Ge–Ge bonds. The act of illumination of the film results in the creation of electron–hole pairs and is accompanied by the formation of charged metastable states at the chalcogen [15] that can react spontaneously with the surrounding Ag ions. This reaction will be preferred as the energy that it requires is about three times less than the energy for the Ge–Se bonding (48.4 vs 113 kcal/mol) and we suggest that this is the reason that in this way more Se is consumed for formation of Ag2 Se than the initially available free Se chains. This fast occurring reaction could be also the reason for the lack of an induction period in photodiffusion and presence of only Ag2 Se phases on the XRD data as photodiffusion product [16]. The fact that the Ag2 Se modes do not interfere with those of the Ge–Se backbone after Ag diffusion is one more piece of evidence that no mixed ternary phase arises as a result of this reaction [17]. We assume that the process reaches saturation because of the strict number of free and under-coordinated Se atoms that are available for reaction with Ag and its concentration is higher than in bulk glasses in which the large variation in the melting temperatures of Ag2 Se and the Ge–Se backbone allows Ag precipitation during the quenching process and this limits the amount of Ag in the Ge–Se backbone to 33 at.% [10]. Considering the spectra from the XRD analysis, the unexpected presence of the high-temperature form of Ag2 Se, could be due to space restrictions as Ag2 Se forms after Ag thermal diffusion in an existing solid-state framework. During annealing, cubic Ag2 Se develops and this transforms to orthorhombic Ag2 Se after cooling to room temperature (at which the XRD investigations are made). The orthorhombic material has a more loosely packed structure than the cubic form and we suggest that the surrounding hosting glass restricts its 555 expansion. Although a number of floppy units are available in the initial structure of the host, with the first acts of silver inclusion and formation of Ag2 Se, its structure becomes stiffer and so the internal space limitation acts in the same way as elevated pressure, stabilizing some clusters from the high temperature form which has the closest packing. 5. Conclusions We have investigated photo and thermally induced silver diffusion in Ge20 Se80 thin films. The results show that photoinduced diffusion occurs at a higher rate and reaches saturation at higher silver concentration due to the photoinduced changes in the hosting glass whose mesoscopic structure modifies and phase separates to form the diffusion product – Ag2 Se. The local structure of the hosting film that forms following thermal diffusion is considerably distorted due to thermal stresses but remains almost unchanged. It is phase separated from the diffusion product that includes Ag2 Se as well as Ag. 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