The Advanced Instrumentation Laboratory (Geology & Geophysics, UAF) is a multiinstrument resource for the state of Alaska. It specializes in surface and elemental
analysis as well as electron microscopy. In addition to the instrumentation listed below it
houses support sample preparation facilities.
1. A Cameca SX-50 electron microprobe is equipped with four multi-crystal wavelengthdispersive spectrometers (WDS) and one energy-dispersive spectrometer (EDS). The
microprobe is fully automated by recently installed PC-based software package Probe
for Windows (Advanced Microbeam Co.), which allows rapid quantitative chemical
analysis of elements from Boron to Uranium. Electron-beam scanning capability
allows surface imaging in secondary and back-scattered electrons as well as X-ray
compositional mapping.
2. A ISI-SR-50 Scanning Electron Microscope equipped with a Kevex 7000 Energy
Dispersive X-ray spectrometer. The SEM is a superior tool for 2-D and 3-D imaging
using secondary electrons and back-scattered electrons techniques. It is also capable
of semi-quantitative chemical analysis and X-ray mapping using an EDS
spectrometer.
3. An ElectroScan E2020 Environmental Scanning Electron Microscope equipped with
an Oxford ISIS 200 Energy Dispersive X-ray spectrometer, a heating stage capable of
heating the sample to 1500 C, a cooling stage capable of cooling the sample to liquid
nitrogen temperatures, and a tensile stage capable of exerting 45 kg of compression or
tension on the sample. The ESEM can operate a pressures as high as 50 Torr,
eliminating the need for sample coating and in many ways can be regarded as an
environmental chamber with an SEM attached.
4. A PanAlytical Axios four kilowatt wavelength dispersive x-ray fluorescence
spectrometer. For quantitative analysis of bulk samples (approximately 10 grams) to
the ppm level.
5. A Kevex 0700 energy dispersive x-ray fluorescence spectrometer. For semiquantitative analysis of bulk samples (approximately 10 grams) to about 10ppm.
6. A JEOL 1200 Transmission Electron Microscope for detailed examination of thin
biological and materials science samples.
7. A Pacific Nanotechnology Nano-R atomic force microscope for analysis of surfaces at
the angstrom scale.
8. An Agilent 7500ce Inductively Coupled Mass Spectrometer for part per trillion
elemental analysis of liquids. Induction systems include liquid chromatography for
speciation studies and a New Wave UP213 laser for the analysis of solids.