HRXRS – High Resolution X-ray Spectrometer
Basic properties of our HRXRS spectrometer:
Cylindrically bent crystal in Johansson geometry, radius of Rowland circle = 500 mm
Angular range: 300 – 650
crystal
TlAP
Quartz
Si
2d[Å]
(001) 25.900
(110) 8.5096
(111) 6.271
energy range
0.55 – 0.95 keV (1.1 – 1.9 keV)
1.6 – 2.9 keV (3.2 - 5.8 keV)
2.2 – 4.0 keV
Thermoelectricaly cooled CCD camera (ANDOR DX-438-BV)
Marconi 555-20, 770x1152 pixel size 22,5 x 22,5 mm2
controler CCI-010, 1 MHz reading frequency, 16bit AD conversion
Spectrometer is enclosed into 1,6 x 1,3 x 0,3 m3 stainless stell
vacuum chamber (working pressure 10-6 mbar)
HRXRS spectrometer enables high energy resolution x-ray measurement of solid and gaseous targets
with energy resolution E/E of appr. 2x10-4.
Yield [arb. units]
Yield [arb. units]
E = 1.185 eV
 = 0.61 eV
2300
2305
2310
X-ray energy [eV]
2315
E = 12.71 eV
 = 3.42 eV
4080
4090
4100
4110
4120
4130
X-ray energy [eV]
Measured K line of S target (left) and L line of Xe exhibiting energy resolution of 0.4 eV and 0.7 eV,
respectively.
HRXRS spectrometer installed at the ID26 beamline of the ESRF (left) and the XAFS beamline of the
Elettra (right) synchrotron, respectively.
Some of the experiments with HRXRS:
Multiple ionization of low-Z atoms induced in collisions with MeV protons
M. Kavčič, Phys. Rev. A68, (2004), 022713.
M. Kavčič, K. Tokesi, Phys. Rev. A72, (2005), 062704.
Use of high-resolution X-ray spectrometer for the study of chemical effects in X-ray spectra and
chemical state analysis
M. Kavčič, A.G. Karydas, Ch. Zarkadas, Nucl. Instr. and Meth. B222, (2004), 611.
M. Kavčič, A.G. Karydas, Ch. Zarkadas, X-Ray Spectrom. 34, (2005), 310.
Resonant X-ray emission studies employing synchrotron radiation
M. Žitnik et al., Phys. Rev. A76, 032506 (2007).
RIXS (Resonant Inelastic X-ray Scattering) planes of Mo L1,2 (L3 – M4,5 transition) and L2,15 (L3 – N4,5
transition) lines from the Na2MoO4 sample measured with our HRXRS spectrometer at the ID26
beamline of the ESRF synchrotron.