CLSI Beamline 06ID-1, Hard X-ray MicroAnalysis (HXMA)
1
Chen ,
1
Kim ,
1
Wright ,
1
Igarashi ,
1
Warner ,
2
Jiang
N.
C.-Y.
G.
R.
J.
and D.T.
1. Canadian Light Source, 2. Department of Physics, University of Guelph
XAFS Endstation
HXMA BL: The Hard X-ray Micro-Analysis
(HXMA) beamline is a wiggler-sourced hard Xray (5 – 40 keV) spectroscopy beamline.
Kohzu CMJ-1 fixed exit DCM : selectable
Si(111) or Si(220) crystal pairs exchanged by
transverse motion of the vacuum housing,
indirect liquid nitrogen cooling for the
monochromator 1st crystal ( max 500 W
absorbing thermal power) and the 2nd crystal.
User Communities: XAFS, microprobe, and
diffraction.
Current Status:
XAFS: successfully performing general
users' experiments since Jan. 2007;
Microprobe: opening for letter of intent;
Diffraction: under commissioning
The resolvability of the 1s-4d transition
feature on the Cu K edge as a function of
primary slit vertical opening, measured from a
7.5 mm thick copper foil. The result was used
as a guideline to setup collimating mirror
bending radius.
Exemplary spectra of standard foil
samples acquired in transmission
modes. The inserts in the upper and
lower panel show the background
removed XAFS data in k-space. The
measurements were taken using Si(220)
mono crystal and Pt coating stripes on
the collimating and toroidal focus
mirrors.
63 pole 2T superconducting wiggler
12
Peak at 0.3 10 @ 10 KeV
Mono Xtal 220, Rh strip
v
h
2
Slit 2.5 4 mm graphite filter 900mm
Iring=~150 mA, June 24, 2006
Microprobe Endstation
Hi-pressure powder diffraction setup
at HXMA BL.
1
11
1.2
Normalized Int @9 keV
1
0.1
0.01
4
8
12
16
20
24
Photon Energy (KeV)
White beam slits: 2.5 mm (V) x 4.0 mm
(H) ~1/3 of the 1.5 mrad horizontal wiggler
radiation fan.
Our Operating
Funding Partners
Diffraction: Huber psi-8 diffractometer
The HXMA diffraction capability is under
commissioning. Initial powder diffraction
commissioning activity has yielded
encouraging results. Current diffraction
commissioning emphasis is in the detailed
understanding of the focused
monochromatic beam characteristics for
refining powder diffraction data and in the
development of the instrumentation
associated with the Huber psi-8
diffractometer for surface studies.
Normalized Intensity
Photon/s (10 )
Horizontal Knife-edge test
Normalized Int @11 keV
0.8
Normalized Int @14 keV
0.6
0.4
0.2
0
3.6
Phase transfer from ambient pressure
phase (Left: 0.1 GPa), through phrase
mixture (middle, 17.5 GPa), to new high
pressure phase (right, 22.9 GPa) (John, et
al., 2007)
3.65
3.7
3.75
Horizontal Position (mm)
Knife-edge test shows that horizontal beam position changes less than 0.1 mm while
the incident X-ray energy changes by 5.0 keV. Apparent change in edge shape is
largely due to normalization process.
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