Renishaw scanning technology

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Renishaw
scanning
technology
Renishaw’s innovative approach
to scanning system design
compared with conventional
solutions
Issue 2
Slide 1
technology
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Questions to ask your metrology system supplier
• Do my measurement applications require a scanning
solution?
– how many need to be scanned?
– how many need discrete point measurement?
• If I need to scan, what is the performance of the
system?
– scanning accuracy at high speeds
– total measurement cycle time, including stylus changes
Slide 2
• If I also need to measure discrete points, how fast can
I do this?
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Questions to ask your metrology system supplier
• Will I benefit from the flexibility of an articulating head
– access to the component
– sensor and stylus changing
• What are the lifetime costs?
– purchase price
– what are the likely failure modes and what protection is
provided?
– repair / replacement costs and speed of service
Slide 3
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Probing applications - factors
Manufacturers need a range of
measurement solutions.
Why?

machining processes have different
levels of stability:
 stable form :
 therefore control size and position
 discrete point measurement
 form variation significant :
 therefore form must be measured and
controlled
 scanning
Slide 4
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Probing applications - factors
Manufacturers need a range of
measurement solutions.
Why?

Features have different functions:
 for clearance or location
form is not important
 Discrete point measurement
 for functional fits
form is critical and must be controlled
 Scanning
Measured values
Best fit circle
Slide 5
Maximum inscribed
(functional fit) circle
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Scanning
Typical scanning routines to measure form
Slide 6
Scanning provides much more
information about the form of a
feature than discrete point
measurement
Spiral scanning of a cylinder
bore gathers data about feature
size, position, orientation and
form
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Renishaw scanning - our objectives
• speed and accuracy
– design sensors with high dynamic response to
provide high accuracy data at high speed
– accurate through use of sophisticated probe
calibration
– match styli materials to applications for best results
• flexibility
– probe changing
– stylus changing
– articulation
• cost effectiveness
Slide 7
– innovative hardware and scanning techniques
reduce complexity
– robust designs and responsive service for lower
lifetime costs
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Renishaw scanning systems
Active and passive
scanning probe design
Renishaw scanning sensor
design
Performance styli for
scanning
Articulating heads
Slide 8
Probe and stylus changing
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Active or passive sensors?
Passive sensors
Simplicity
• no motor
drives
• no locking
mechanism
• no tare system
• no
electromagnets
Active sensors
Complexity
• 3 force generators
• 3 dampers
• LVDTs mounted on
stacked axes
• no electronic
damping
• Design
Slide 9
– active sensors are large, heavy and complex
– passive sensors are small and relatively simple
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Passive sensors
Simple, compact mechanism
– no motor drives
– no locking mechanism
– no tare system
– no electromagnets
– no electronic damping
• springs generate contact force
– force varies with deflection
Force
Typical scanning
deflection
Slide 10
Deflection
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Active sensors
Complex, larger mechanism
• force generators in each
axis
• force is modulated in probe
– not constant at stylus tip*
Displacement
sensor
• deflection varies as
necessary
Axis drive
force
generator
– longer axis travels
Force
Controlled
force range
Slide 11
* see next slide
Deflection
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Active sensors
Errors in force modulation at stylus tip
Force Fp
controlled here
• force is modulated at each stacked axis
• mechanism & stylus mass, plus stylus
stiffness connect force generator to stylus tip
• errors that lead to uncontrolled stylus force:
– inertial acceleration of stylus mass
– error in estimating probe acceleration (d2xp/dt2)
– error in estimating probe velocity (dxp/dt)
– error in estimating quill acceleration (d2xq/dt2)
– force feedback error (eFp)
What
matters is
force Fs here
cp Fp
Slide 12
Quill
x
q
kp
Probe
mechanism
mass
xp
ks
Stylus
mass
xs
Fs
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Method of control
Passive sensors
• simple device
senses deflection
• no powered
motion
• measurements
taken using
machine to control
stylus deflection
• 3 axes under
servo control
Slide 13
– new devices take
advantage of
modern CMM
motion control
Active sensors
Compact
passive
sensor
Complex
active
sensor
• effectively a
miniature CMM
• ‘force generators’
control the
deflection to
modulate the force
on the stylus
• 6 axes under
servo control
– conceived in
1970s to
accommodate
poor machine
motion control
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Sensor design and calibration
Passive sensors
Active sensors
• smaller axis
travels required
– at 300 mm/sec,
deflections can
be held within
a 100 µm
range*
Compact
passive
sensor
• stylus bending
compensated
by sophisticated
calibration
routine
Slide 14
* using adaptive scanning
Complex
active
sensor
• large probe
travel needed to
keep the contact
force steady
during scanning
• directiondependent
stylus bending
variations
minimised by
controlling the
contact force
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Dynamic response
Passive sensors
Active sensors
• light weight
• motorised stylus carrier
– high natural frequency
suspension system
Slide 15
Probe suspension
responds whilst
scan vector is
adjusted
– driven on internal servo
loop
Motors adjust
stylus position to
modulate contact
force
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Scanning probe calibration
Constant force does not equal
constant stylus deflection
• although active sensors provide
modulated probe force, stylus
bending varies, depending on
the contact vector
F

F
• stylus stiffness is very different
in Z direction (compression) to
in the XY plane (bending)
• if you are scanning in 3
dimensions (not just in the
plane of the stylus), this is
important
Slide 16
High deflection
when bending
Deflection
Low deflection
in compression
– e.g. valve seats
– e.g. gears
0
90
180

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Scanning probe calibration
 modulated force does not result in better accuracy
– passive & active sensors must both cope with non-linear stylus
bending
– how the probe is calibrated is important
Slide 17
Passive sensors
Active sensors
• passive probes have contact
forces that are predictable at
each {x,y,z} position
• contact force is controlled,
and therefore not related to
{x,y,z} position
• scanning probe axis
deflections are driven by the
contact vector
• calibration must linearise
output of readheads,
mechanism motion and
stylus bending
• sensor mechanism and
stylus bending calibrated
together
• longer styli increase
bending variation
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Effective calibration for superior 3D scanning
SP80 testing at Renishaw
• sub micron 2D and 3D scanning
performance
– 2D:
– 3D:
0.3 m
1.0 m
• ISO 10360-4
• unknown path
• raw data - no data filtering
Slide 18
Test details:
CMM spec
Test time
Controller
Filter
Stylus length
0.5 + L/1000
97 secs
UCC1
None
50 mm
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Measurement performance
Passive sensors
Active sensors
• low inertia probe holds
surface at high speeds
• motorised probe
mechanism enables high
speed scanning
• fast discrete point
measurement cycles with
'extrapolate to zero'
routines
• no heat sources for
improved stability
– 500 mW power
consumption
Slide 19
– < 1ºC temperature change
inside probe
• slow discrete point
measurement cycles due to
the need to servo and static
average probe data
• heat sources: motors and
control circuits generate
heat that must be measured
and compensated
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Minimum inspection cycle times
High speed measurement
High speed scanning on a
large component
Slide 20
Scanning a complex surface at
high speed
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Minimum inspection cycle times
High speed measurement
Video commentary
• scanning probe
taking discrete
points at high speed
• ‘extrapolate to zero’
routines
• high speed scanning
Slide 21
Rapid discrete point measurement and
scanning combined
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Robustness
Passive sensors
Active sensors
• simplicity
• more things to go wrong
– position feedback system is
only electro-mechanical
element
– force generators
– no moving wires
– electromagnets
• kinematic stylus changing
and patented Z over-travel
bump stop provide robust
crash protection
– probe will survive most
accidents
Slide 22
• simpler motion control
– locking mechanism
– tare system
– electronic damping
– control hardware for the
above
• limited crash protection if
the stylus is deflected
beyond its limits
• more complex motion control
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Robustness
Crash protection
Video commentary
• overtravel in XY plane
• causes stylus module to
unseat
• stop signal generated
• stylus reseats as
machine backs off
surface
• probe still operational
Slide 23
Detachable styli allow stylus overtravel
without damage to the probe or
component
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Lifetime costs
Passive sensors
Active sensors
• lower purchase costs
• higher purchase costs
– simple and cost-effective to
purchase
• lower running costs
– crash protection for greater
reliability
– 50,000+ hours operating life
– advance replacement
service at discounted price
Slide 24
– customer-replacement on
site due to simple fittings
– less downtime
– cost-effective repair
– complex and high cost
sensor
• higher running costs
– complex sensor
– limited crash protection
– vendor technician needed to
remove damaged sensor
– more downtime
– high repair charges
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Renishaw scanning systems
Active and passive
scanning probe design
Renishaw scanning sensor
design
Performance styli for
scanning
Articulating heads
Slide 25
Probe and stylus changing
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Renishaw scanning sensor design
Renishaw design objectives:
• optimised for high speed
measurement
• accurate position sensing without
stacked axis errors
• compact and light, with excellent
dynamic response
• models for quill mounting and use
with articulating heads
• passive design to avoid unnecessary
system complexity
Slide 26
SP600M mounted
on a PH10M indexing head
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Renishaw scanning probes - quill mounted
Slide 27
SP80
• quill-mounted
• digital readheads for ultra-high
accuracy
• very long styli
SP600Q
• in-quill version of SP600
• reduced impact on
working volume
• suitable for any quill size
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Renishaw scanning probes - for articulating heads
Slide 28
SP600M
• styli up to 300 mm
• flexible part access
• robust
• changeable with other
sensors
SP25M
• ultra-compact design (25 mm
diameter)
• styli up to 200 mm
• interchangeable with touchtrigger probing
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Renishaw scanning probes - key characteristics
Passive sensor - no force
generators
• minimal heat source for greater
stability
• no electro-mechanical wear
• reduced vibration during discrete
point measurement
Slide 29
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Renishaw scanning probes - key characteristics
Box spring mechanism - SP600 and SP80
• unique design
• compact mechanism - fits inside Ø50 mm
(2 in) probe
• low inertia
• rapid dynamic response
• low spring rates
• single 3D ferrofluid damper
Parallel acting
springs
Slide 30
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Renishaw scanning probes - key characteristics
Pivoting probe
mechanism - SP25M
• patented, pivoting
mechanism featuring
‘isle of Man’ spring
• ultra-compact
mechanism - fits inside
a Ø25 mm (1 in) probe
• very low inertia
• very low spring rates
(< 60 g/mm)
Slide 31
• high natural frequency
(rigid member) when
in contact with the
component
‘Isle of Man’
spring creates
XY pivot point
Second spring
allows translation
in all direction
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Renishaw scanning probes - key characteristics
Isolated optical metrology - SP600
• readheads attached to probe
housing
• measures deflection of whole
mechanism, not just one axis
Z pos
Readheads
attached to
probe body
– eliminates inter-axis errors
– picks up thermal and dynamic
effects
• probes with stacked axes cannot
measure inter-axis errors directly
Slide 32
Illustration shows
SP600 mechanism
with PSDs
Inter-axis error
Y pos
X pos
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Renishaw scanning probes - key characteristics
Isolated optical metrology - SP80
• SP80 features digital readheads with
0.02 m resolution reading precision
gratings
• accuracy defined by straightness of
lines on each grating and calibrated
squareness of gratings, not by probe
mechanical design
ISO 10360-4 test data:
ISO Diff:
0.6 m
ISO Tij:
1.0 m
Slide 33
CMM spec
Test time
Controller
Filter
Stylus
0.5 + L / 1000
61 secs
UCC1
None
50 mm, 9 mm, ceramic
Note - results quoted are for
unknown path scans.
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Renishaw scanning probes - key characteristics
Isolated optical metrology SP25M
• IREDs in probe body reflect
light off mirrors in stylus module
back onto PSDs
SP25M
probe body
2 PSDs
detect stylus
deflection
IRED
• non-linear outputs
compensated by sophisticated
3rd order polynomial algorithms
Slide 34
ISO 10360-4 test data:
ISO Diff:
1.3 m
ISO Tij:
2.6 m
Mirror
CMM spec
Test time
Controller
Filter
Stylus
Kinematic joint
between probe
body and stylus
module (not
shown)
0.5 + L / 1000
57 secs
UCC1
None
50 mm, 5 mm, ceramic
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Renishaw scanning probes - key characteristics
Kinematic stylus changing

optimise stylus and hence
repeatability for each feature:
– minimum length
• Longer styli degrade repeatability
– maximum stiffness
– minimum joints
– maximum ball size
• Maximum effective working length
• repeatable re-location
– no need for re-qualification
• passive
Slide 35
– no signal cables
– easy installation
Kinematic stylus changing in
around 10 seconds means that
you can pick the best stylus for
each feature
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Renishaw scanning probes - key characteristics
Feature access - SP80
• SP80 can support very long and
complex styli
• 500 mm (19.7 in)
• 500 g (17.6 oz)
• suitable for measurement of
deep features on large
components
• no need for counter-balancing
• full measurement range is
maintained irrespective of stylus
mass and orientation
Slide 36
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Renishaw scanning probes - key characteristics
Feature access - SP80
Video commentary
• 500 mm (20 in) stylus cranked
stylus
• no counter-balancing needed
• scanning deep features in F1
engine block
SP80 scanning with a 500 mm
(20 in) stylus for access to
deep features
Slide 37
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Renishaw scanning probes - key characteristics
Feature access - SP80
• deep bore measurement cranked / star styli
VDI / VDE test data:
V2 m
CMM spec:
Test speed:
Controller:
Filter:
Values:
1.75
1.5
1.25
1.0
0.75
0.5
0.25
Slide 38
0
50
100 150 200 250
Stylus length (mm)
0.5 + L / 1000
5 mm/sec
UCC1
50 Hz
Unknown path
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Renishaw scanning probes - key characteristics
Feature access - SP600 family
Video commentary
• 200 mm (8 in) stylus
• scanning deep
features in a cylinder
block
• compact probe
dimensions further
extend the reach of the
probe
• styli up to 280 mm
(11.0 in) can be used
with SP600 probes
Slide 39
SP600 scanning with a 200 mm (8 in)
stylus for access to deep features
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Renishaw scanning probes - key characteristics
Feature access - SP25M
• three scanning modules, each
optimised for a range of stylus lengths
• same measuring range and accuracy in
all orientations
• stiff carbon fibre stylus extensions
provide excellent effective working
length with M3 styli
• styli up to 200 mm (7.9 in)
Slide 40
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Renishaw scanning probes - key characteristics
Feature access - SP25M
• ISO 10360-4 test data
• accurate form measurement, even with long styli
ISO Tij
m
ISO 10360-4 test data:
3.5
CMM spec:
Test speed:
Controller:
Filter:
Values:
3.0
2.5
2.0
Filtered (60 Hz harmonic)
1.5
No filter (raw data)
1.0
0.5
Slide 41
0.5 + L / 1000
5 mm/sec
UCC1
None / 60 Hz
Unknown path
0
22
50
100
200
Stylus length (mm)
22: 3 mm, SS stem
50: 5 mm, ceramic stem
100: 6 mm, GF stem
200: 6 mm, GF stem
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Renishaw scanning probes - key characteristics
Feature access - SP25M
• probe is small enough to be
inserted into many features
• total reach can be extended,
with a probe extension, to
nearly 400 mm (15.7 in)
• including length of probe body
Slide 42
SP25M inspecting a deep
counter-bore
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Renishaw scanning probes - key characteristics
Feature access - SP25M
• probe can be mounted on an
articulating head means that
many features can be accessed
with fewer styli
• lower stylus costs
• shorter cycle times
Slide 43
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Renishaw scanning probes - key characteristics
Crash protection
• stylus change joint has low
release force
– over-travel in XY causes stylus to
detach
• Z crash protection
– outer housing provides a ‘bump
stop’ to prevent probe
mechanism and readhead
damage
Slide 44
Stylus deforms in a severe Z
crash, whilst probe
mechanism is protected
Note - same principles apply to
pivoting probes like SP25M.
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Renishaw scanning probes - key characteristics
Crash protection
Slide 45
Renishaw scanning probes are robust - even
after bending or breaking the stylus, they still
work!
Video commentary
• steel stylus crushed
against SP600
• more severe than any
Z crash since E Stop
would prevent
continued force
• bump-stop protection
system saves probe
mechanism
• probe was still
functional after test
completed
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Renishaw scanning probes - key characteristics
Circle C
Compression test data
Circle B
Stylus ball
shatters
Circle A
Circle D
Force (N)
ISO 10360-4
1800
CMM spec
Test time
Controller
Filter
Stylus length
1600
1400
1200
1000
800
(All data in m)
600
400
200
Slide 46
3 + L / 250
70 secs
UCC1
None
50 mm
0
0
0.5
1
1.5
2
Deflection (mm)
2.5
3
3.5
Circle
A
B
C
D
Before
4.0
3.7
1.7
3.3
After
3.8
3.2
1.7
2.9
Result
4.0
3.8
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Renishaw scanning systems
Active and passive
scanning probe design
Renishaw scanning sensor
design
Performance styli for
scanning
Articulating heads
Slide 47
Probe and stylus changing
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Stylus selection for scanning
Styli choice affects performance
• the stylus is a critical element in any
scanning system
• affects:
– feature access (stylus length and
configuration, effective working length)
– speed (weight affects dynamic response)
– repeatability (stiffness, joints)
– accuracy over time (wear, pick-up on
stylus)
Slide 48
• choice of stylus configuration and
materials must be driven by the
application
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Stylus selection for scanning
Configuration
• keep styli as short and as stiff as
possible
– avoid joints
– articulating heads reduce the need
for long styli
• where longer styli are essential,
choose single-piece styli made from
performance materials (e.g. M5
range for SP80):
– graphite fibre stems (light and stiff)
– titanium fittings
Slide 49
Long graphite fibre
stylus
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Effects of continuous scanning on stylus balls
Three phenomena that can affect scanning accuracy
• in touch trigger probing, the stylus ball comes into temporary
contact with the measured surface
• scanning results in a different and more aggressive type of
surface interaction between the stylus and the workpiece
• testing at Renishaw has revealed three interactive
phenomena:
1. Debris
2. Adhesive wear
3. Abrasive wear
Slide 50
Sliding interaction
between ball and
surface
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Effects of continuous scanning on stylus balls
Phenomenon 1 - debris
• any contamination present on the scanning path will collect
on the stylus ball as it passes over the surface
– metal oxide particles on the surface
– air-born debris such as coolant mist or paper dust
• debris can be removed by wiping
the ball with a dry, lint-free cloth
– a periodic cleaning regime for the
stylus ball is the only solution to
avoid a build up of debris
Slide 51
– debris is practically unavoidable
with any contact scanning
application and is independent of
the stylus ball or scanned
surface material
Typical debris collected on a
stylus ball after scanning
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Effects of continuous scanning on stylus balls
Phenomenon 2 - adhesive wear
• adhesive wear (sometimes referred to as pick-up) involves the
transfer of material from one surface to another
– local welding (adhesion) at microscopic contact points
– break off during sliding
– minute particles from one surface are transferred to the other surface
• material adhesion is permanent and cannot be removed
through normal cleaning techniques
Slide 52
– as the surface material from the workpiece starts to adhere to the
ball, it is the attached material which is now in contact with the
surface
– as like materials attract, rapid build up can occur
– will eventually degrade the form of the stylus ball
– compromised measuring results
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Effects of continuous scanning on stylus balls
Phenomenon 2 - adhesive wear
• factors affecting adhesive wear:
– contact force
– distance scanned
– hardness of surfaces (if stylus is much harder than surface being
measured)
– affinity between ball and surface materials … is it a similar material?
– single point contact
• such conditions apply when scanning an aluminium surface with a
relatively hard ruby (aluminium oxide) stylus ball
Slide 53
– significant wear only occurs after long periods scanning the same part
– in most real applications, the amount of material transfer is negligible
on the form of the stylus ball (< 0.1 m) and cannot be quantified, even
with the highest precision measuring equipment
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Effects of continuous scanning on stylus balls
Phenomenon 2 - adhesive wear
• significant errors only occur in unrepresentative situations:
Slide 54
Test conditions:
Test conditions:
• ruby stylus on aluminium
• 15 g contact force, single point contact
• 350 m scan path over new material
• ruby stylus on aluminium
• 15 g contact force, single point contact
• 350 m scan path over repeated path
Results:
Results:
• small patch where adhesion occurs
• negligible impact on ball form
• 200 m x 500 m adhesion patch
• 2 m impact on ball form
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Effects of continuous scanning on stylus balls
Phenomenon 3 - abrasive wear
• abrasive wear involves removal of material from both surfaces
– small particles from both surfaces break and adhere to each surface
– harder stylus particles attached to the component surface begin to act
as an abrasive
– where there is little atomic attraction between the two materials, wear
rather than material build up occurs
Test conditions:
• ruby on stainless steel
• 15 g contact force, single point contact
• 5,600 m scan path over new material
• very extreme - unrepresentative of most applications
Results:
Slide 55
• flat on ball surface approx. 150 m diameter
• form error of 1.5 m
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Stylus selection for scanning
Ball material - conclusions from
testing at Renishaw
• ruby can suffer adhesive wear
(pick-up) on aluminium under
extreme conditions, but
performs well in most
applications
• ruby is the best material on
stainless steel
Ruby stylus used in touchtrigger mode
Slide 56
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Stylus selection for scanning
Ball material - conclusions from
testing at Renishaw
• silicon nitride is a good
substitute for ruby in extreme
aluminium applications, but
suffers from abrasive wear on
stainless steel and cast iron
Silicon nitride stylus tip
scanning an aluminium
component
Slide 57
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Stylus selection for scanning
Ball material - conclusions from
testing at Renishaw
• zirconia is the optimum choice for
scanning cast iron components
• tungsten carbide also performs
well on cast iron
Zirconia is often used where
a large diameter tip is
required
Slide 58
Zirconia stylus tip and
graphite fibre stem
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Renishaw scanning systems
Active and passive
scanning probe design
Renishaw scanning sensor
design
Performance styli for
scanning
Articulating heads
Slide 59
Probe and stylus changing
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Articulation or fixed sensors?
Articulating heads are a standard
feature of most computercontrolled CMMs
– heads are the most cost-effective
way to measure complex parts
Fixed probes are best suited to
small machines on which simple
parts are to be measured
– ideal for flat parts where a single
stylus can access all features
Slide 60
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Renishaw articulating heads
Increased flexibility…

easy access to all features on the part

repeatable re-orientation of the probe

reduced need for stylus changing

optimise stylus stiffness for better
metrology
Reduced costs…
Slide 61

indexing is faster than stylus changing

less expensive than active scanning
systems

reduced stylus costs

simpler programming
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Renishaw articulating heads for scanning
Slide 62
PH10M
• indexing head
• the industry
standard
PH10MQ
• in-quill version of
PH10M
• reduced impact on
working volume
• needs 80 mm quill
PHS1
• servo positioning head
• infinite range of
orientations
• longer extension bars
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Articulating head applications
Flexible probe orientation
• PH10M offers 7.5°
increments in 2 axes - is
this enough?
• prismatic parts
– generally few features at
irregular angles
– use a custom stylus to suit
the angle required
Slide 63
– fixed scanning probes also
need customer styli for
such features
Knuckle joint
needed to
access
features at
irregular
angles
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Articulating head applications
Flexible probe orientation
• PH10M offers 7.5° increments in 2
axes - is this enough?
• sheet metal / contoured parts
– many features at different irregular
angles
– stylus must be perfectly aligned with
surface in each case
– no indexing head is suitable
Slide 64
– fixed probes also unsuitable due to need
for many stylus orientations
– need continuously variable head (PHS1)
Cylindrical
stylus must be
perfectly
aligned with
hole
Sheet
metal
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PH10M indexing head - design characteristics
Head repeatability test results:
• Method:
– 50 measurements of calibration sphere at {A45,B45}, then 50 with
an index of the PH10M head to {A0,B0} between each reading
• TP200 trigger probe with 10mm stylus
• Results:
Result
X
Y
Z
Span fixed
0.00063
0.00039
0.00045
Span index
0.00119
0.00161
0.00081
 [Span]
0.00056
0.00122
0.00036
 [Repeatability]
± 0.00034
± 0.00036
± 0.00014
• Comment:
Slide 65
– indexing head repeatability has a similar effect on measurement
accuracy to stylus changing repeatability
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PH10M indexing head - design characteristics
Indexing repeatability affects the
measured position of features
– Size and form are unaffected
Most features relationships are
measured ‘in a plane’
– Feature positions are defined relative
to datum features in the same plane
(i.e. the same index position)
• Datum feature used to establish a part
co-ordinate system
Slide 66
– Therefore indexing typically has no
negative impact on measurement
results, but many benefits
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PH10M indexing head - design characteristics
Light weight
• 650 g (1.4 lbs)
• lightest indexing head available
• total weight of < 1 kg including scanning
probe
Fast indexing
• typical indexing time is 2 to 3 seconds
• indexes can occur during positioning
moves
– no impact on measurement cycle time
Slide 67
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PH10M indexing head - design characteristics
Flexible part access
Slide 68
Rapid indexing during CMM positioning moves
give flexible access with no impact on cycle times
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PH10M indexing head - design characteristics
Autojoint
• programmable sensor changing with no
manual intervention required
• use scanning and touch-trigger probes in
the same measurement cycle
Slide 69
Autojoint features
kinematic connection
for high repeatability
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PHS1 servo head - design characteristics
Servo positioning for total flexibility
• full 360° rotation in two axes for total
flexibility of part access
– resolution of 0.2 arc sec
– equivalent to 0.1µm at 100mm radius
• servo control of both axes for infinitely
variable positioning and full velocity
control
– speeds of up to 150° per second
– 5-axis control required
Slide 70
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PHS1 servo head - design characteristics
High torque for long reach
• extension bars of up to 750 mm
(30 in)
– ideal for auto body inspection
– touch-trigger probes only
• Autojoint for use with SP600M
• powerful motors generate 2 Nm
torque
– 4 times more than a PH10
Slide 71
– carry probes and extension bars of
up to 1 kg (2.2 lbs)
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PHS1 servo head - design characteristics
Infinitely variable positioning
Slide 72
PHS1’s motion can be combined with the CMM
motion to generate blended 5 axis moves
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Renishaw scanning systems
Active and passive
scanning probe design
Renishaw scanning sensor
design
Performance styli for
scanning
Articulating heads
Slide 73
Probe and stylus changing
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ACR3 probe changer for use with PH10M
• 4 or 8 changer ports
– store a range of sensors,
extensions and stylus
configurations
• Passive mechanism
Slide 74
– CMM motion used to lock and
unlock the Autojoint for secure and
fully automatic sensor changes
Compact rack with
minimal footprint
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New ACR3 probe changer for use with PH10M
Probe changing
Video commentary
• new ACR3 sensor
changer
• no motors or
separate control
• change is controlled
by motion of the
CMM
Slide 75
Quick and repeatable sensor changing for
maximum flexibility
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ACR2 probe changer for use with PHS1
Probe module changing
• flexible storage of probes and extension bars
Slide 76
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FCR25 module and stylus changing for SP25M
Passive rack enables both
module and stylus changing
• modular rack system
• switch between scanning
modules to suit application
• switch between scanning
and touch-trigger modules
Two sensors in one switching between scanning
and touch-trigger probing
modules
Slide 77
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FCR25 module and stylus changing for SP25M
Passive rack enables both module
and stylus changing
• change styli to suit measurement
task
– scanning styli up to 200 mm
– full range of TP20 modules
• combine with ACR3 for sensor
changing
Typical changing routine:
• stow TTP stylus
• stow TTP module
• pick up scan module
• pick up scan stylus
Slide 78
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SP600 stylus changing
Passive rack
• simple design
• rapid stylus changes
• storage for up to 4 stylus modules
– any number of racks can be used in
a system
• kinematic stylus changing
mechanism
– highly repeatable connection
between stylus and probe,
– styli can be stored and re-used
without the need for qualification
Slide 79
• crash protection from an overtravel
mechanism in the base of the rack
Rapid stylus changing with the
passive SCR600 stylus change
rack
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Renishaw scanning - our offering
• the fastest and most accurate scanning
– passive scanning probes with dynamically
superior mechanisms
– sophisticated probe calibration
– performance styli to match your application
• the most flexible and productive solution
– probe changing
– stylus changing
– articulation
• the lowest ownership costs
Slide 80
– innovative hardware and scanning techniques
reduce complexity
– robust designs and responsive service for
lower lifetime costs
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Responsive service and expert support
Application and product support wherever you are
• Renishaw has offices in over 20 countries
• responsive service to keep you running
• optional advance RBE (repair by exchange) service on many products
• we ship a replacement on the day you call
• trouble-shooting and FAQs on www.renishaw.com/support
Service facility
at Renishaw
Inc, USA
Slide 81
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Questions?
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Slide 82
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