Course Number and Title
EEL 4930/5934 - Noise in Semiconductor Devices and Circuits
Please note that due to my retirement on March 31, 2016 the noise class is offered at a slightly
accelerated pace of 4 lectures per week with a final class date of March 24 2016. Shortly after
this date your course grade will be available with no further work required, leaving you time to
focus fully on your other classes and research during the month of April.
1. Catalog Description (3 hrs) – Physical principles and characterization of noise in solid-state
devices, sensors, and circuits.
2. Pre-requisites: EEL 3396 (Solid State Electron Devices) and EEE3308C (Electronic
Circuits I) or equivalent course material or consent of instructor
3. Course Objectives: To present an in-depth coverage of the noise performance and
characteristics of semiconductor devices, sensors and electronic circuits in terms of
underlying materials properties and device physics.
4. Contribution of course to meeting the professional component NA
5. Relationship of course to program outcomes: Skills student will develop in this course NA
6. Instructor: Gijs Bosman
a.
Office location NEB 565
b. Telephone 352 392-0910
c.
E-mail address bosman@ece.ufl.edu
d. Web site access via login to Sakai
e.
Office hours: TBA
7. Teaching Assistant: NA
a.
Office location
b. Telephone
c.
E-mail address:
d. Office hours:
8. Meeting Times: Tuesday period 6 and 7 and Thursday periods 7 and 8. Last day of class
will be March 24, 2016 instead of April 20, 2016 as for other UF classes.
9. Class/laboratory schedule, four classes per week, 50 minutes each. Last day of class will be
March 24, 2016 instead of April 20, 2016 as for other UF classes.
10. Meeting Location: CSE building room E122
11. Material and Supply Fees: None
12. Textbooks and Software Required
a.
Textbook: None, my handwritten lecture notes will be made available on a regular
basis.
b.
Author: -
c.
Publication date and edition: -
d. ISBN number: 13. Recommended Reading: TBA.
Course Outline:
Topics:
1. Introduction to physical device noise sources
1.1 Number fluctuation noise
1.2 Velocity fluctuation noise
1.3 Noise current and voltage spectral density
1.4 Noise stemming from electron and hole traps and defects
1.5 1/f noise
2. Noise characterization and measurements
2.1 Low frequency noise measurements on two terminal devices
2.2 Low frequency noise measurements on three terminal devices
2.3 High frequency noise measurements on two terminal devices
2.4 High frequency noise measurements on three terminal devices
2.5 Optimum noise source resistance, noise figure, noise equivalent current
2.6 Friiss formula for an amplifier chain
2.7 Low noise circuit design
3.
Noise of p-n junction based devices and detectors
3.1 Shot noise of a p-n diode
3.2 Noise equivalent optical power and detectivity of photodiodes
3.3 1/f noise in p-n diodes
3.4 Hooge parameter
4.
Noise of MOS transistors and HEMTs
4.1 Thermal noise
4.2 Hot carrier noise
4.3 Induced gate noise
4.4 Low frequency trapping noise
4.5 Unified low frequency noise model
5.
Device parameter extraction from noise data
5.1 Hot carrier diffusion constant
5.2 Trap energy levels, cross sections and densities
5.3 Electromigration
5.4 Impact ionization onset
5.5 Device aging
14. Attendance and Expectations: Attendance is expected. Questions and discussions during
class and office hours are strongly encouraged. Underlying principles and gaining insight are
more important than memorization.
15. Grading – Tests I and II count for 30% each, the homework for 20%, and the final for 20%.
Test dates: Test I Thursday January 28 period 7, Test II Thursday February 25 period 7, and
Final Exam Tuesday March 22 period 7 and 8.
Homework will be assigned regularly and will count for 20% towards your final grade. One
assignment may be missed.
Undergraduate and graduate students will attend the same lectures, but the level and scope of the
homework assigned to each group will differ.
16. Grading Scale – The UF standard grading brackets as defined in Sakai will be used
This statement must be included in every grade scale for undergraduate level 1000-4000
syllabi:
“A C- will not be a qualifying grade for critical tracking courses. In order to graduate, students
must have an overall GPA and an upper-division GPA of 2.0 or better (C or better). Note: a Caverage is equivalent to a GPA of 1.67, and therefore, it does not satisfy this graduation
requirement. For more information on grades and grading policies, please visit:
https://catalog.ufl.edu/ugrad/current/regulations/info/grades.aspx
17. Make-up Exam Policy: Make up exams require documented requests in writing and are
only approved for extenuating circumstances beyond a student’s control.
18. Honesty Policy – All students admitted to the University of Florida have signed a statement
of academic honesty committing themselves to be honest in all academic work and
understanding that failure to comply with this commitment will result in disciplinary action.
This statement is a reminder to uphold your obligation as a UF student and to be honest in all
work submitted and exams taken in this course and all others.
19. Accommodation for Students with Disabilities – Students Requesting classroom
accommodation must first register with the Dean of Students Office. That office will provide
the student with documentation that he/she must provide to the course instructor when
requesting accommodation.
20. UF Counseling Services –Resources are available on-campus for students having personal
problems or lacking clear career and academic goals. The resources include:


UF Counseling & Wellness Center, 3190 Radio Rd, 392-1575, psychological and
psychiatric services.
Career Resource Center, Reitz Union, 392-1601, career and job search services.
21. Software Use – All faculty, staff and student of the University are required and expected to
obey the laws and legal agreements governing software use. Failure to do so can lead to
monetary damages and/or criminal penalties for the individual violator. Because such
violations are also against University policies and rules, disciplinary action will be taken as
appropriate. We, the members of the University of Florida community, pledge to uphold
ourselves and our peers to the highest standards of honesty and integrity.