Carrier Concentrations

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Carrier

Concentrations

Presented by Chanam Lee

August 22 nd

Carrier Concentration

Carrier Properties

State and Carrier Distributions

Equilibrium Carrier Concentration

Carrier Concentration for the Quantum Well

Devices

Carrier Properties

Carrier Movement in Free Space

Carrier Movement Within the Crystal

Intrinsic Carrier Concentration

Extrinsic n-Type Semiconductor

Extrinsic p-Type Semiconductor

Electronic Materials

Two-dimensional representation of an

Individual Si atom.

Elemental semiconductors

Valence III IV V

B

Al

Ga

C

Si

Ge

P

As

Represents each valence electron

Semiconductors

When Si (or Ge & GaAs) atoms contact other

Si atoms, they form a tetrahederal

2D representation of lattice structure:

Electronic Materials

Two dimensions Three dimensions

Carrier Movement in Free Space

Newton’s second law

F = − qE = m

0 dv dt

Carrier Movement Within the Crystal

Electrons moving inside a semiconductor crystal will collide with semiconductor atoms ==> behaves as a “wave” due to the quantum mechanical effects

The electron “wavelength” is perturbed by the crystals periodic potential

Carrier Movement Within the Crystal m * n m

F = − qE = m * n

Material

Si

Ge

GaAs dv dt m * n

/ m

0

1.18

0.55

0.066

F = − qE = m * p dv dt m * p

/ m

0.81

0.36

0.52

0

Density of States Effective Masses at 300 K

Intrinsic Carrier Concentration

Contains an insignificant concentration of impurity atoms

Under the equilibrium conditions, for every electron is created, a hole is created also n = p = n i

As temperature is increased, the number of broken bonds (carriers) increases

As the temperature is decreased, electrons do not receive enough energy to break a bond and remain in the valence band.

Extrinsic n-Type Semiconductor

Donors (Group V): The 5 th in a five valence electrons is readily freed to wander about the lattice at room temperature

There is no room in the valence band so the extra electron becomes a carrier in the conduction band

Does NOT increase the number of hole concentration

Extrinsic p-Type Semiconductor

Acceptors (Group III) : three valence electrons readily accept an electron from a nearby Si-Si bond

Completing its own bonding creates a hole that can wander about the lattice

Does NOT increase the number of electron concentration

State and Carrier Distribution

How the allowed energy states are distributed in energy

How many allowable states were to be found at any given energy in the conduction and valence bands?

Essential component in determining carrier distributions and concentration

Density of States

Fermi Function

Dopant States

Density of States:

Number of cm 3

States

/ eV g c

( E ) = m * n

2 m * n

π 2

( E

3

− E c

)

, E ≥ E c g c

( E ) dE represents the number of

/ cm the energy range between E and E + dE g v

( E ) = m * p

2 m * p

( E v

π 2 3

− E )

, E ≤ E v g v

( E ) dE represents the number of

/ cm energy range between E and E + dE g c

( E c

) = g v

( E v

) = 0

Fermi Function (I)

How many of the states at the energy E will be filled with an electron f ( E ) =

1 + e ( E

1

− E

F

) / kT f(E) , under equilibrium conditions, the probability that an available state at an energy E will be occupied by an electron

1 f(E) , under equilibrium conditions, the probability that an available state at an energy E will NOT be occupied by an electron

Fermi Function (II)

If

If

E = E

F

, f ( E

F

) = 1 / 2

E f

(

E

E )

F

+ 3 k

B exp[(

T

E

,

F

− E ) / k

B

T ]

If E ≤ f (

E

E

F

)

3

1 k

B

T , exp[( E − E

F

) / k

B

T ]

At T=0K (above), No occupation of states above EF and complete occupation of states below E

F

At T>0K (below), occupation probability is reduced with increasing energy f(E=E

F

) =

1/2 regardless of temperature.

At higher temperatures, higher energy states can be occupied, leaving more lower energy states unoccupied (1-f(E))

Fermi Function (III)

Dopant States

Density of

States n-type: more electrons than

Holes

Intrinsic:

Equal number of electrons and holes p-type: more holes than electrons

Occupancy factors

Carrier

Distribution

Equilibrium Carrier Concentration

Formulas for n and p

Degenerate vs. Non-degenerate Semiconductor

Alternative Expressions for n and p ni and the np Product

Charge Neutrality Relationship

Carrier Concentration Calculations

Determination of E

F

Formulas for n and p n =

E top

E c g c

( E ) f ( E ) dE p =

E v

E bottom g v

( E )[ 1 − f ( E )] dE n = m * n

π 2

2 m * n

3

E top

E c

1 +

( e

E

( E

− E c

− E

F

) /

) kT dE

N c

= 2

2 π m * n kT h 2

3 / 2

, N v

= 2

2 π m * p kT h 2

3 / 2

Letting when

η =

E − kT

E c

E = E c and

, η = 0

Let E

Top

→ ∞

η c

=

E

F

− kT

E c n = m * n

2 m * n

π 2

( kT ) 3 / 2

3

E

E

0

1 +

η 1 / e ( η

2

− η c

) d η

F

1 / 2

( η c

) n ≡ N c p ≡ N v

2

π

F

1 / 2

2

π

F

1 / 2

Degenerate vs. Non-degenerate

Semiconductor

If E

F

< E c

− 3 k

B

T , f ( E ) =

F

1 / 2

1 +

= e

1

( η

π

− η c

2 e

)

(

E

F e − ( η − η c

− E c

) / kT

) n = N c e ( E

F

− E c

) / k

B

T , p = N v e ( E v

− E

F

) / k

B

T

If E

F

> E v

+ 3 k

B

T , F

1 / 2

=

2

π e ( E v

− E

F

) / kT

Alternative Expressions for n and p n

0

= N c e ( E

F

− E c

) / k

B

T p

0

= N v e ( E v

− E

F

) / k

B

T

When n=n i

, E

F

= E i

, then n i

= N c e ( E i

− E c

) / k

B

T

N c

= n i e ( E c

− E i

) / k

B

T ,

= N v e ( E v

− E i

) / k

B

T

N v

= n i e ( E i

− E v

) / k

B

T n p

0

0

=

= n n i i e ( e (

E c

E i

− E i

− E v

+ E

F

+ E v

− E c

E

F

) / k

B

T

) / k

B

T

=

= n n i i e e (

( E i

E

F

− E i

E

F

)

) / k

B

T

/ k

B

T n

0 p

0

= n i

2

n i and the np Product n i

= N c e ( E i

− E c

) / k

B

T = N v e ( E v

− E i

) / k

B

T n i

2 = N c

N v e − ( E c

− E v

) / k

B

T = N c

N v e

− E g

/ k

B

T n i

=

N c

N v e

− E g

/ 2 k

B

T

Charge Neutrality Relationship

For uniformly doped semiconductor:

Charge must be balanced under equilibrium conditions otherwise charge would flow qp

qn

qN −

A

+

qN +

D

=

0

Thermally generated + assume ionization of dopant addition all dopant sites

Carrier Concentration Calculations

( p − N

A

) + ( N

D

− n n

( n i

2

2 n

− n (

N

N

A

D

) +

( N

D

N

A

) −

− n n i

2

)

) =

=

=

0

0

0 n =

N

D

2

N

A +

N

D

2

N

A

2

+ n i

2

1 / 2

, p =

N

A

2

N

D +

N

A

2

N

D

2

+ n i

2

1 / 2 np = n i

2

N

N −

A

=

1 + g

A

(

N

E

A

A

− E

F

) / kT

, N +

D

=

1 + g

D

(

N

E

D

F

− E

D

) / kT

N −

A

The degeneracy factors account for the possibility of electrons with different spin, occupying the same energy level (no electron with the same quantum numbers can occupy the same state)

Most semiconductor g

D

=2 to account for the spin degeneracy at the donor sites g

A is 4 due to the above reason combined with the fact that there are actually 2 valence bands in most semiconductors

Thus, 2 spins x 2 valance bands makes g

A

=4

Determination of E

F

(Intrinsic Material) n = N c e ( E i

− E c

) / k

B

T = N v e ( E v

− E i

) / k

B

T = p

N c e ( E i

− E c

) / k

B

T = N v e ( E v

− E i

) / k

B

T

E i

=

E c

+

2

E v + k

B

T

2 ln

N v

N c

N c

= 2

2 π m * n h 2 kT

3 / 2

, N v

= 2

2 π m * p kT h 2

3 / 2

N v

N c

= m * p m * n

1 / 2

E i

=

E c

+

2

E v +

3 k

4

B

T ln m * p m * n

Determination of E

F

(Extrinsic Material) n = n i e ( E

F

− E i

) / k

B

T

E

F

− E i

= kT ln n n i

, p = n i e ( E i

− E

F

) / k

B

T

= − kT ln p n i or for N

D

>> N

A and N

D

>> n i

E

F

− E i

= kT ln

N

D n i or for N

A

>> N

D and N

A

>> n i

E

F

− E i

= − kT ln

N n i

A

Determination of E

F

(Extrinsic Material)

Fermi level positioning in Si at room temperature as a function of the doping concentration. Solid E

F lines were established using Eq.

(previous page)

Carrier Concentration for the

Quantum Well Devices

Density of States 3D vs. 2D

Carrier Concentration – 2D

Charge Neutrality

Density of States 3D vs. 2D

3D

2D g ( E ) = m

π 2

2 mE

3 g =

π 2 m

3 L

Z

Energy Dependent

Energy Independent

Carrier Concentration – 2D n =

E top

E c g c

( E ) f ( E ) dE n =

π m * n

2 kT

3 L z i ln 1

[

+ e ( E

FC

− E i

) / kT

] p =

π m * p kT

2 3 L z i ln 1

[

+ e ( E

FV

− E i

) / kT

]

Charge Neutrality

P hh

+ P lh

= N

Γ

+ N

Χ

+ N

L

References

Robert F. Pierret, Semiconductor Fundamentals

(VOLUME I), Addison-Wesley Publishing Company,

1988, chapter 2

Robert F. Pierret, Advanced Semiconductor

Fundamentals (VOLUME VI ), Addison-Wesley

Publishing Company, 1987, chapter 4

Ben G. Streetman and Sanjay Banerjee, Solid State

Electronic Devices , Prentice Hall, Inc., 2000, chapter 3

Peter S. Zory, J

R

., Quantum Well Lasers , Academic

Press, 1993, chapter 1, 7

Effective Mass of Holes - 3D g v

( E ) = m * p

= m * hh

2 m * p

( E v

π 2 3

− E )

2 m * hh

π 2

( E v

3

− E )

+ m * lh

2 m * lh

π 2

( E v

3

− E )

( m * p

) 3 / 2 = ( m * hh

) 3 / 2 + ( m * lh

) 3 / 2 m * p

= (

[ m * hh

) 3 / 2 + ( m * lh

) 3 / 2

2

]

3 /

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