ЦИТАТИ НА ПУБЛИКАЦИИТЕ на доц. д-р ПЕТКО ВИТАНОВ (съгласно Science Citation Index, ISI) I. ЦИТАТИ НА НАУЧНИ ПУБЛИКАЦИИ В СПИИСАНИЯ И СБОРНИЦИ: 1. L.I.Popova, V.J.Shekerdjiisky, V.B.Lazarova, G.D.Beshkov, P.K.Vitanov, “Preparation and Properties of Silicon Nitride Films Deposited from the SiCl4NH3 System”, BULG. J. PHYSICS, v.2, p.609, 1975 (2бр.) 1. C.E.Morosano, Microel, and Reliab, v.20, p.358, 1980 2. V.Michailov and R.Dulgerova, Bulgarian J.Phys., v.23, p.58, 1996 2.L.I.Popova,P.K.Vitanov,V.B.Lazarova,G.D.Beshkov,V.J.Shekerdjiisky, “Properties of silicon nitride films deposited by the SiH4 -NH3 system, varying the ratio of NH3 to SiH4 ”, COMPTES RENDUS de L’ ACAD. BULG. SCI., v.29, p.183, 1976 (3бр.) 3. C.E.Morosano, Microel, and Reliab, v.20, p.358, 1980 4. A. Agasava, Solid State technology R-20 (1977) 36. 5. A. Agasava, Phys. Letts. A, 59 (1977) 481. 3. P.K.Vitanov, L.Popova, B.Z.Antov, “ MNOS memory structures with relatively thick oxide ”, ELECTRONICS LETTERS, v.12, p.681, 1976 (3бр.) 6. Экспрес Информация - Приборы и элементы вычислителной технике, №27, 1977 7. Камбалин и др., Микроэлектроника, т.8 №3, стр.248, 1979 8. S.A.Biryakov et.al., Physica Status Solidi /a/, v.60, p.39, 1980 4. L.I.Popova, P.K.Vitanov, B.Z.Antov, “ C-V and I-V characteristics of MIS structures with pyrolitical SiO2 as dielectric ”, THIN SOLID FILMS, v.23, p.15, 1974 (6бр.) 9. 10. 11. 12. 13. H.Splitgeber, J.Herbst, Siemens Forsch. Und Enwickel. Bericht, N6, p.371, 1977 A.H.Agajanian, Solid State Technologyq v.20, p.36, 1977 W.P.Brown, Thin Solid Films, v.59, p.15, 1979 A.L.Dawer, J.Applied Physics, v.53, p.5311, 1982 U. Rao, J.S.Kumar, K.N.Reddy, Progress in Crystal Growth and Characterization of Materials, v. 15, pp. 187-314, 1987 14. Shekar M.C., Cryst. Res., T19 (1984) 1649 1 5. L.I.Popova, B.Z.Antov, P.K.Vitanov, “ Investigation of surface traps at the silicon-silicon monooxide interface by the C-V method” , SOLID STATE ELECTRONICS, v.18, p.1141, 1975 (1бр.) 15. Horvath, Zl., Dozsa. L., Krafcsik, O., Mohacsy, T., Vida, G., Applied Surface Science, 234, pp. 67-71, 2004 6. L.I.Popova, B.Z.Antov, P.K.Vitanov, “ Effect of surface traps on the C-V characteristics of MIS structures with SiO2 as dielectric ”, BULG.J. PHYSICS,v.2, p.465, 1975 (1бр.) 16. Horvath, Zl., Dozsa. L., Krafcsik, O., Mohacsy, T., Vida, G., Applied Surface Science, 234, pp. 67-71, 2004 7. L.I.Popova, B.Z.Antov, P.K.Vitanov, “ The conduction process in pyrolitically deposited SiO2 films ”, THIN SOLID FILMS, v.38, p.247, 1976 (5бр.) 17. M.Meandre et.al., Thin Solid Films, v.61, p.83, 1979 18. M.Meandre et.al., J.Non-Cristaline Solids, v.46, p.71, 1981 19. B.Babyji et al, Physica Staatus Solidi (a), v.60, p.K39, 1980 20. B.Brazis et.al., Physica Status Solidi (a), v.83, K69, 1984 21. U. Rao, J.S.Kumar, K.N.Reddy, Progress in Crystal Growth and Characterization of Materials, v. 15, pp. 187-314, 1987. 8. L.I.Popova, B.Z.Antov, P.K.Vitanov, “High field conduction processes in silicon nitride films in the presence of charge trapping “, THIN SOLID FILMS, v.36, p.157, 1976 (6бр.) 22. C.E.Morosanu, Thin Solid Films, v.65, p.171, 1980 23. K.Watanabene et.al., J.Appl.Phys., v.53, p.568, 1982 24. S.A.Awan, R.D.Gould, Acta Physica Slovaca, 53, p. 347, 2003 25. R.D.Gould, S.A.Awan, Thin Solid Films, 398, p. 454, 2001 26. S.A.Awan, R.D.Gould, S.Gravano, Thin Solid Films, 356, p. 456, 1999 27. A.Buchanan, R.A.Abrem, M.J.Morant, Solid St. Electr., 30, p. 1295, 1987 9. L.I.Popova, P.K.Vitanov, .Z.Antov, “Interface states in MNOS structures”, THIN SOLID FILMS, v.51, p.305, 1978 (3бр.) 28. Singh, Simmons, Solid State Electronics, v.25, p.219, 1982 29. D.G.Duft et.al., Bell Systems Technical Journal, v.58, p.2025, 1979 30. A.M.Dealmeida, S.S.Li, Solid State Electronics, 29, p.619, 1986 10. L.I.Popova, P.K.Vitanov, B.Z.Antov, “ Discharge of MNOS strucrures”, Solid-State and El. Devices, v.3, p.17, 1979 (2бр.) 31. P.Balk, Invated Paper VIII Vac. Congress, Cannes, p.525, 1980 32. S. Miller, J. Appl. Phys., 67, p. 7115, 1990 2 11. L.I.Popova, B.Z.Antov, P.K.Vitanov, “ Electrical conduction of silicon nitride films”, INT.J.ELECTRONICS, v.46, p.487, 1979 (5бр.) 33. M.D.Aggarval, J.Electr.Materials, v.11, p.491, 1982 34. S.Yokogama, N.Kajihara, M.Hirose, J.Appl.Phys., v.51, p.5470, 1980 35. S.Yokogama, M.Hirose, Y.Osaka, Jap. J. Appl.Phys., v.20, p.L35, 1981 36. H. Matsuura, M. Yoshimoto, H. Matsunami, Jap. J. of Appl. Phys., v. 34, p. L371, 1995 37. M.D.Aggarwal, S.Ashok, S.J.Fonash, J. of Electr. Matererials, 11, p. 491, 1982 12. L.I.Popova, P.K.Vitanov, B.Z.Antov, “ Microstructure and properties of CVD Si3N4 layers ”, J.NON-CRYST.SOL., v.31, p.429, 1979 (1бр.) 38. BAE YW, DU H, GALLOIS B, et al. , Chemistry of Materials 4 (2): 478-483 MARAPR 1992 13. P.K.Vitanov, M.Kamenova, M.S.Sotirova, “The influence of the outer surface conditions of MIS capacitors on the shape of their C-V curves ”, THIN SOLID FILMS, v.70, p.L5, 1980 (1бр.) 39. Cohen, Thin Solid Films, v.109, p.329, 1983 14. P.Vitanov, U.Schwabe, I.Eisele, “Electrical characterization of feature sizes and parasitic capacitance using a simple test structure ”, IEEE TRANS. ELECTRON DEVICES, v.ED-31, 1, 1984 (21бр.) 40. 41. 42. 43. 44. 45. 46. 47. 48. 49. 50. 51. 52. H.Iwai, J.Oristian, J.Walner, R.Dutton, IEEE Journal of Solid -State Circuits, v.20, N1, p.264, 1985 J.Paulos, D.Antoniadis, IEEE Journal of Solid -State Circuits, v.20, N1, p.277, 1985 H.Iwai, J.Oristain, J.Walner, R.Dutton, IEEE Transaction on Electron Devices, ED32, p.344, 1985 J.Paulos, D.Antoniadis, IEEE Transaction on Electron Devices, ED-32, p.357, 1985 H.Rehme, H.Oppolzer, Siemens Forsch. Und Enwickel. Bericht, N4, p.193, 1985 H.Oppolzer, Proc. Microscopy of Semiconductor Materials Conf. Oxford 25-27 March 1985, p.461-471 R.S.Petrova, R.S.Kamburova, I.S.Nachev, Microelectronics Journal, v.16, N6, p.31, 1985 C.T.Yao, I.Mack, H.Liu, IEEE Electron Device Letters, v.7, N4, 1986 D.Dimitrov, A.Paskaleva, T.Dimitrova, Thin Solid Films, v.223, N2, p.293, 1993 VLSI Electronics, v.18, “Advanced MOS Devices Physics”, N.Aurora and L.Richardson, Chapt.6 “MOSFET Modeling for Circuits Simulation”, Academic Press, 1989, San Diego Z.Latif, A.Oritz-Conde, J.J.Liou and Garcia Sanches, IEEE Trans.Elect.Devices, v. 44(2), p.340, 1997 Latif, A.Oritz-Conde, J.J.Liou and Garcia Sanches, Proc.21sth Int.Conference of Microelectronics, MIEL’97, Nish, Yugoslavia, 14-17 Sept. 1997, p.281 M.Delabardonnie, A.Maound, P.Mialhe, O.Elmazria, A.Hoffman, B.Lepley, J.P.Carles, IEEE Trans. On Nuclear Science, v.42, N6, p.1622, 1995 3 53. 54. 55. 56. 57. 58. 59. 60. J.G.Kim, B.Ihn, B.Kim, K.G.Lee, W.Lee, S.W.Lee, Solid State Electronics, v.39, N4, p.541, 1996 D. Schroder, Semiconductor Material and Device Characterization, John Wiley & Sons, 1990, p. 178 M. Sadowski, D. Tomaszewski, Microelectronics Reliability, v. 60, p. 1045, 2000 Y.W. Chang, H.W. Chang, T.C. Lu, Y.C. King, W. Ting, Y.H.J. Ku, IEEE Electron Device Letters, vol.27, N=5, pp390-392 2006 - ieeexplore.ieee.org A. Ortiz-Conde, F.J.G. Sánchez, J.J. Liou pancho.labc.usb.ve/ourpappdf/DYS(2000).pdf Yannis Tsividis, Operation and Modeling of the MOS Transistor, Oxford University, USA, edition 2 , June 2003 Chang, Y.-W., Chang, H.-W., Lu, T.-C., King, Y.-C., Ting, W., Ku, Y.-H.J., Lu, C.-Y. Charge-based capacitance measurement for bias-dependent capacitance , IEEE Electron Device Letters 27 (5) (2006) 390-392 Inokawa, H., Fujiwara, A., Nishiguchi, K., Ono, Y., Satoh, H., Direct measurement of capacitance parameters in nanometer-scale MOSFETs, IEEJ Transactions on Electronics, Information and Systems 128 (6) (2008) pp. 905-911 15. P.Vitanov, I.Eisele, “A new transient capacitance technique for the determination of interface traps in metal-oxide semiconductor transistors”, J.APPL. PHYSICS, 54,9 , 1983 (1бр.) 61. E.Klausman, Invited Paper, Physical Problems in Microelectronics, Proc. Of the Fourth International School, Varna, 1985, World Scientific Publishing, Singapore, p.325 16. M.Nedjalkov, P.Vitanov, “Monte Carlo methods for determination of transport properties of semiconductors”, SOLID STATE ELECTRONICS, v.31, p.1065, 1988 (2бр.) 62. L. Rota, C. Jacoboni, P.Poli, Solid State Electronics, v.32, N12, 1989 63. H. Arsham, Inverse Problems, v.5, N6, p.927, 1989 17. M. Nedjalkov, P. Vitanov,” Iteration approach for solving the Boltzmann equation with the Monte Carlo methods, SOLID STATE ELECTRONICS v.32, p.893, 1989 (8бр.) 64. M. A. Alam, M. A. Stettler, M. S. Lungstrom, Solid State Electronics, v.36, N2, p.263, 1993 65. F. Rossi, P. Poli, C. Jacoboni, Semiconductor Science and Technology, v.7, N8, p.1017, 1992 66. C. S. Kim, B. Shizgal, Physical Review B, v.44, N7, p.2669, 1991 67. Ch. Jungemann, B. Meinerzhagen , Hierarchical Device Similation: The Monte Karlo Perspective, Springer, 2003 68. V.Palankovski, R. Quay, Analisis and Simulation of Heterostructure Devices, Springer Wien New York, 2003 69. Kosina, H., Selberherr, S., Device simulation demands of upcoming microelectronics devices, International Journal of High Speed Electronics and Systems 16 (1) (2006) 115-136. 4 70. Sverdlov, V., Ungersboeck, E., Kosina, H., Selberherr, S., Current transport models for nanoscale semiconductor devices, Materials Science and Engineering R: Reports 58 (6) (2008) 228-270. 71. Ivan T. Dimov ,Monte Carlo methods for applied scientists, book, 2008, ISBN 13 978981-02 2329-8; ISBN 10 981-2329-3 18. P.Vitanov, T.Dimitrova, I. Eisele, “Direct Capacitance Measurements of Small Geometry MOS Transistors”, MICROELECTRONICS JOURNAL, vol.22, December 1991, p.77 (2бр.) 72. R.Lorival, P.Nouet, Proc. IEEE 1995 Conference on Microelectronic Test Structure, v.8, March, 1995 73. P Nouet, A Toulouse , IEEE Transactions on Electron Devices, 1997 19. M. Nedjalkov, P. Vitanov, “Application of the iteration approach to the ensamble Monte Carlo techniques”, SOLID STATE ELECTRONICS, v. 33, p. 407, 1990 (1бр.) 74. Ch. Jungemann, B. Meinerzhagen , Hierarchical Device Similation: The Monte Karlo Perspective, Springer, 2003 20. P. Vitanov, determination T. Dimitrova, R. Kamburova,” Capacitance method for of LDD MOSFET geometrical parameters”, SOLID STATE ELECTRONICS, vol.35 N7, p.985, 1992. (4бр.) 75. Z.Latif, A.Oritz-Conde, J.J.Liou and Garcia Sanches, IEEE Trans.Elect.Devices, v. 44(2), p.340, 1997 76. Z.Latif, A. Oritz-Conde, J. J. Liou and Garcia Sanches, Proc.21sth Int.Conference of Microelectronics, MIEL’97, Nish, Yugoslavia, 14-17 Sept. 1997, p.281 77. A Ortiz-Conde, FJG Sánchez, JJ Liou - pancho.labc.usb.ve/ourpappdf/DYS(2000).pdf 78. C.W. Eng, W.S.Lau, D. Vigar, S.S. Tan, L.Chan, Appl. Phys. Lett., 87, Issue 15, pp.13, 2005 21. Siegert, P. Vitanov, I. Eisele ,”Observation of discrete energy levels of interface traps in submicron MOSFET's”, SOLID-STATE ELECTRONICS, vol. 37, 11, p.1799, 1994. (2бр.) 79. E.Simoen, C.Cloeys, J.A.Martino, Journal de Physique IV, v.6, NC3, p.29, 1996 80. G.I.Wirth, Ph.D. Thesis, 1999, Uni –Dortmund, dspase.hrz.uni-dortmund.de 22. P. Vitanov, M. Kamenova, St. Kanev, N. Tjutjungzhiev, D. Malinovska, “A comparison between the performance of silicon solar cells with porous silicon emitter and conventional cells”, PROC. WORLD RENEWABLE ENERGY CONGRESS, vol. 5, Part III, p. 1787, 1994 (1бр.) 5 81. Yerokhov, I. Melnyk, Renewable and Sustainable Energy Review, v. 3-4, p. 219, 1999 23. P. Vitanov, M. Kamenova, N. Tjutjundzhiev, M. Delibasheva, E. Goranova, M. Peneva, “Application of porous silicon on the monocrystalline silicon solar cell emitter”, Proc. International School on Physics of Materials for Solar Energy Conversion, Portici, Italy, May 1997 (1бр.) 82. V. Yerokhov, I. Melnyk, Renewable and Sustainable Energy Review, v. 3-4, p. 219, 1999 24. P.Vitanov, N. Tjutjundzhiev, M. Kamenova, M. Delibasheva, “Some electrical properties of metal/porous Si/crystalline Si structure”, International Symposium on Si Heterostructures, Crete, Greece, Sept. 11-14, 1995 (poster) (2бр.) 83. V. Yerokhov, I. Melnyk, Renewable and Sustainable Energy Review, v. 3-4, p. 219, 1999 84. R.R Bilyalov, J. Poortmans, Proc.17th European Photovoltaic Sol. Energy Conference, Munich, pp. 1666-1669, 2001 25. P. Vitanov, M. Kamenova, N. Tjutjundzhiev, M. Delibasheva, “High efficiency solar cells using porous silicon layer”, THIN SOLID FILMS, v. 297, p. 299-303, 1997 (42бр.) 85. J. M. Buriak, M. J. Allen, J. Luminescence, v. 80, p. 29, 1998 86. B. Unal, S. C. Bayliss, D. T. Clarke, J. of Appl. Phys., v. 87, 7, p. 3547, 2000 87. P. Panek, M. Lipinski, H. Czternastek, Opto-electtron Review, v. 8, p. 57, 2000 88. Z. N. Adamian, A. P. Hakhoyan, V. M. Aroutiounian, R. S. Barseghian, K. Toutyan, Solar Energy Materials and Solar Cells, v. 6, 4, p. 347, 2000 89. C.C Striemer, F. Shi, P.M Fauchet, S.P Duttagupta, IEEE - Photovoltaic Specialists Conference, 2000. 90. P.Fauchet, Porous Silicon Thin Films Solar Cell, Final report, NREL, USA, May, 2003 91. A. F. Beloto, M. Ueda, E. Abramof, J. R. Senna, M. D. da Silva, C. Kuranaga, H. Renther, Ferreira da Siva, I. Pepe, Surface and Coatings Technology, v. 156, p. 257, 2002 92. A. F. Beloto, M. D. Silva, J. R. Senna, C. Kuranaga, N. F. Leite, M. Ueda, Physica Status Solidi B, 232, pp.111-115, 2002 93. K. Drabczyk, P. Panek, M. Lipinski, Solar Energy Materials and Solar Cells, v. 76, p. 545, 2003. 94. Hander, F.A.B., Moreno, J.D., Marcos, M.L., Velasco, J.G. Journal of New Materials for Electrochemical Systems 6 (2), pp. 129-135, 2003 95. Beloto, A.F., Silva, M.D., Senna, J.R., Kuranaga, C., Leite, N.F., Ueda, M. Nuclear Instruments and Method in Physics Research, Section B: Beam Interactions with Materials and Atoms 206 (SUPP), pp. 677-681, 2003 96. Blynskiǐ, V.I., Malyshev, S.A. Journal of Optical Technology (A Translation of Opticheskii Zhurnal) 70 (6), pp. 440-442 ,2003 97. Kennedy, S.R., Brett, M.J. Applied Optics 42 (22), pp. 4573-4579 15 , 2003 6 98. Prevo, B.G., Hwang, Y., Velev, O.D. Chemistry of Materials 17 (14), pp. 36423651,2005 99. Fu, X.-Y., Wang, S.-M., Deng, D.-G., Yi, K., Shao, J.-D., Fan, Z.-X. Chinese Physics Letters 22 (12), pp. 3173-3175 , 2005 100. Ben Rabha, M., Boujmil, M.F., Meddeb, N., Saadoun, M.,Bessai, B. Thin Solid Films, 511-512 pp. 108-111, 2006 101. Arenas, M., Hu, H., Antonio del Rio, J., Sanchez, Aaron, Nicho, M.E., Solar Energy Materials and Solar Cells, 90 (15) pp. 2413-2420, 2006 102. Tuzun, O. , Oktik, S. , Altindal, S., Mammadov, T.S., Thin Solid Films , Volume 511512, 26 July 2006, Pages 258-264 , 2006 103. Tuzun, O., Altindal, S., Oktik, S. Materials Science and Engineering B: Solid-State Materials for Advanced Technology 134, (2-3 SPEC. ISS, .), pp. 291-295, 2006 104. Arenas, M., Hu, H., Antonio del Rio, Nicho, M.E, Material Research Society Symposium Proceeding, vol. 939. pp.25-30, 2006 105. Badawy, W.A., AIP Coference Proceedings, 888, pp 29-35, 2007 106. Guo, H., Yang, H., Zhang, Y., Betavoltaic microbatteries using porous silicon, Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS) , art. no. 4433006, pp. 867-870, 2007. 107. Badawy, W.A., Effect of porous silicon layer on the performance of Si/oxide photovoltaic and photoelectrochemical cells, Journal of Alloys and Compounds 464 (1-2) (2008) 347-351. 108. Liu, N., Chen, H.-Z., Wang, M, Heterojunctions based on perylene diimide embedded into porous silicon, Thin Solid Films 516 (12) (2008) 4272-4276 109. Guo, H., Li, H., Lai, A., Blanchard, J., Nuclear microbatteries for micro and nano devices, International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT , art. no. 4735068, pp. 2365-2370, 2008. 110. Rajabi, M., Dariani, R.S. , Current improvement of porous silicon photovoltaic devices by using double layer porous silicon structure: Applicable in porous silicon solar cells, Journal of Porous Materials 16 (5) (2009) 513-519. 111 Ben Rabha, M., Bessaïs, B., Enhancement of photovoltaic properties of multicrystalline silicon solar cells by combination of buried metallic contacts and thin porous silicon, Solar Energy 84 (3) (2010) 486-491. 112. Gao JP, Li X, Li BY,, Han YC, Fabrication of polymer antireflective coatings by selfassembly of supramolecular block copolymer, Рolymer 51 (12) (2010) 2683-2689. 113. Ciro Chiappini, Xuewu Liu, Jean Raymond Fakhoury, Mauro Ferrari , “Biodegradable Porous Silicon Barcode Nanowires with Defined Geometry”, Advanced Functional Materials 20 (14) (2010) 2231 – 2239. 114.”Biodegradable Porous Silicon Barcode Nanowires with Defined Geometry”, In memory of Prof. Ulrich Gösele. C Chiappini, X Liu, JR Fakhoury … - Advanced …, 2010 - WILEY-VCH Verlag Weinheim 115. „Fabrication of polymer antireflective coatings by self-assembly of supramolecular block copolymer” , Junpeng Gaoa, Xiao Lia, Binyao Lia and Yanchun Han, , Polymer, (2010) Elsevier 116. Thermal annealing dependence of some optical properties of plasma-modified porous silicon, Benyahia, Be., Gabouze, N., Guerbous, L., Mahmoudi, B., Menari, H., 2010, Applied Surface Science 257 (3) , pp. 1105-1111 117. Salman, K.A., Omar, K., Hassan, Z. “.The effect of etching time of porous silicon on solar cell performance” 2011 Superlattices and Microstructures 50 (6), pp. 647-658 (2011) 7 118. Salman, K.A., Omar, K., Hassan, Z. "Improved performance of a crystalline silicon solar cell based on ZnO/PS anti-reflection coating layers” 2011 Superlattices and Microstructures 50 (5), pp. 517-528 (2011) 119. „Storage of luminescent nanoparticles in porous silicon: Toward a solid state "golden fleece" Serdiuk, T., Skryshevsky, V.A., Ivanov, I.I., Lysenko, V. 2011 Materials Letters 65 (15-16), pp. 2514-2517 8 120.”Influence of PECVD SiOx and SiNx:H films on optical and passivation properties of antireflective porous silicon coatings for silicon solar cells”, Remache, L., Mahdjoub, A., Fourmond, E., Dupuis, J., Lemiti, M. 2011 Physica Status Solidi (C) Current Topics in Solid State Physics 8 (6), pp. 1893-1897 121. „Effects of illumination on I-V, C-V and G/w-V characteristics of Au/n-CdTe Schottky barrier diodes”, Kanbur, H., Altindal, Ş., Mammadov, T., Şafak, Y. 2011 Journal of Optoelectronics and Advanced Materials 13 (6), pp. 713-718 122. „ Broadband antireflection of block copolymer/homopolymer blend films with gradient refractive index structures”, Li, X., Xue, L., Han, Y. 2011 Journal of Materials Chemistry 21 (15), pp. 5817-5826 123.” Porous silicon layer for optical sensing of organic vapor”, Kim, H.-J., Kim, Y.-Y., Lee, K.-W., Cheng, H., Dong Han, H. 2011 Physica B: Condensed Matter 406 (8), pp. 1536-1541, (2011) 124.” Design of porous silicon/PECVD SiOx antireflection coatings for silicon solar cells Remache, L., Fourmond, E., Mahdjoub, A., Dupuis, J., Lemiti, M. 2011 Materials Science and Engineering B: Solid-State Materials for Advanced Technology 176 (1), pp. 45-48 125. „Effect of silicon porosity on solar cell efficiency”, Salman, K.A., Hassan, Z., Omar, K., 2012, International Journal of Electrochemical Science 7 (1) , pp. 376-386 126.” Effective conversion efficiency enhancement of solar cell using ZnO/PS antireflection coating layers”, Salman, K.A., Omar, K., Hassan, Z., 2012, Solar Energy 86 (1) , pp. 541-547 26.P.Vitanov, M.Delibasheva, E.Goranova, M.Peneva, ""The Influence of Porous Silicon Coating on Silicon Solar Cells with Different Emitter Thickness", SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.61, p.213, 2000 (16 бр.) 127. R.R Bilyalov, J. Poortmans, Proc. 17th European Photovoltaic Sol. Energy Conference, Munich, pp. 1666-1669, 2001 128. Aroutiounian, V.M., Martirosyan, Kh., Soukiassian, P. Journal of Physics D: Applied Physics 37 (19), pp. L25-L28 (2004) 129. Aroutiounian, V.M., Martirosyam, K.S., Hovhannisyan, A.S., Soukiassian, P.G. , Proceedings of SPIE - The International Society for Optical Engineering 6327, art. no.2007 63270T, 2006 130. Martirosyan, K.S., Aroutiounian, V.M., Soukiassian, P. , Journal De Physique. IV : JP, 132 pp. 325-328, 2006 131. Ben Rabha, M., Boujmil, M.F., Meddeb, N., Saadoun, M., Bessa, B., Thin Solid Films, 511-512 pp. 108-111, 2006 132. Badawy, W.A., Porous silicon modified photovoltaic junctions: An approach to highefficiency solar cells, AIP Conference Proceedings 888, pp. 29-35, 2007. 133. Badawy, W.A., „Effect of porous silicon layer on the performance of Si/oxide photovoltaic and photoelectrochemical cells”, Journal of Alloys and Compounds 464 (1-2) (2008) 347-351 8 134. Aroutiounian VM, Martirosyan KS, Hovhannisyan AS, Soukiassian PG, „Use of Porous Silicon for Double- and Triple-Layer Antireflection Coatings in Silicon Photovoltaic Converters”, Journal Of Contemporary Physics-Armenian Academy Of Sciences, 43 92) (2008) 72-76. 135. Zhang, N., Ma, Z., Zhou, C., He, B., „Lower reflectivity and higher minority carrier lifetime of hand-tailored porous silicon”, Journal of Semiconductors 30 (7) (2009) art. no. 072004. 136. Rajabi, M., Dariani, R.S. ,”Current improvement of porous silicon photovoltaic devices by using double layer porous silicon structure: Applicable in porous silicon solar cells”, Journal of Porous Materials 16 (5) (2009) 513-519. 137. Macherzynski, M., Milczarek, G., Mamykin, S., Romanyuk, V., Kasuya, A., „Electrochemical preparation of photosensitive porous n-type Si electrodes, modified with Pt and Ru nanoparticles”, Electrochimica Acta 55 (14) (2010) 4395-4401. 138. Ben Rabha, M., Bessaïs, B., „Enhancement of photovoltaic properties of multicrystalline silicon solar cells by combination of buried metallic contacts and thin porous silicon”, Solar Energy 84 (3) (2010) 486-491 139. „The effect of etching time of porous silicon on solar cell performance”, Salman, K.A., Omar, K., Hassan, Z. 2011 Superlattices and Microstructures 50 (6), pp. 647-658 140. „A review of solar photovoltaic technologies”, Parida, B., Iniyan, S., Goic, R. 2011 Renewable and Sustainable Energy Reviews 15 (3), pp. 1625-1636 141. „Design of porous silicon/PECVD SiOx antireflection coatings for silicon solar cells „Remache, L., Fourmond, E., Mahdjoub, A., Dupuis, J., Lemiti, M. 2011 Materials Science and Engineering B: Solid-State Materials for Advanced Technology 176 (1), pp. 45-48 142. „ Effect of silicon porosity on solar cell efficiency”, Salman, K.A., Hassan, Z., Omar, K. 2012, International Journal of Electrochemical Science 7 (1) , pp. 376-386 27. P.Vitanov, M.Delibasheva, E.Goranova, Ch. Angelov, V.Dimov, "Structure and Morphological Studies of Thin Porous Silicon Layers", VACUUM, vol.58, p.351, 2000 (4 бр.) 143. Mliki N, Kaabi H, Bessais B, et al., Journal Of Nanoscience And Nanotechnology, 3 (5), pp. 413-419, 2003 , 144. Swiatek Z, Beltowska E, Maziarz W, et al., Materials Science And Engineering BSolid State Materials For Advanced Technology, 101, (1-3), pp. 291-296, 2003 145. Y. Zhao, D. Li, W. Yang, M.Jiang, Solid- State Electronics, 51, pp 678-682, 2007 146.Lv, J., Cheng, X., Crystalline structures and characterizations of porous silicon, Progress in Chemistry 21 (9) (2009) 1820-1826. 28. P.Stefchev, V.Blaskov, M. Machkova, P.Vitanov, .Kozhuharov, “Synthesis and characterization of high dispersed TiO2”, INTERN. JOURNAL OF INORGANIC MATERIALS, vol.3, p.531, 2001 (13бр.) 147. Xu, C., Khan, S.U.M. Meeting Abstracts, pp. 610, 2005 148.Xu, C., Khan, S.U.M., Proceedings - Electrochemical Society PV 2005-04, pp. 461470, 2005 149. Malinowska B, Walendziewski J, Robert D, et al., International Journal Of Photoenergy 5 (3): 147-152, Sp. Iss. SI, 2003 9 150. Gole J.L., Stout J.D., Burda C., Lou Y., Chen X., Journal of Physical Chemistry B, 108 4, Pages 1230-1240, 2004 151. Burda C., Lou Y., Chen X., Samia A.C.S., Stout J., Gole J.L., Nano Letters, 3 8, Pages 1049-1051, 2003 152. Li Z.-J., Hou B., Xu Y., Wu D., Sun Y.-H., Acta Physico - Chimica Sinica, 21 3, Pages 229-233, 2005 153. - 万方数据资源系统. 材料导报 MATERIALS REVIEW 2006 Vol.20 No.z2 P.64-67. 数字化期刊. 154. 나노 결정 구조의 티타니아 분말 승화 합성 정일현 - Journal of the Korean Industrial and Engineering Chemistry, 2003 155. Lukowiak, A., Maciejewska, M., Szczurek, A., Maruszewski, K., Application of a titania thin film for the discrimination between diesel fuel and heating oil, Thin Solid Films 515 (17) (2007) 7005-7010. 156. Wang, D., Wu, Y., Lu, J., Xu, G., Zuo, K., Liu, J., Wang, J., Zheng, Z., Configuration and photocatalystic capacity of Fe3+/Zn2+ codoping nanostructured TiO2 materials, Kuei Suan Jen Hsueh Pao/ Journal of the Chinese Ceramic Society 36 (11), pp. 15261532+1541, 2008. 157. Jiang, D., Xu, Y., Hou, B., Wu, D., Sun, Y.-H. , Synthesis and photocatalytic property of SiO2/TiO2, Wuji Cailiao Xuebao/Journal of Inorganic Materials 23 (5), pp. 10801084, (2008). 158. Bhandari, S., Deepa, M., Srivastava, A.K., Lakshmikumar, S.T., RamaKant, Electrochromic response, structure optimization and ion transfer behavior in viologen adsorbed titanium oxide films, Solid State Ionics 180 (1) (2009) 41-49. 159. „Effect of the thermal treatment on the morphology and optical properties of nanosized TiO2 films”, Stambolova, I., Blaskov, V., Kuznetsova, I.N., Kostova, N., Vassilev, S.,2011, Journal of Optoelectronics and Advanced Materials 13 (4) , pp. 381-386 29. P.Vitanov, A.Harizanova, T. Ivanova, D.Velkov, Zd.Raycheva,“Deposition, Structure, Evaluation and Dielectric Properties of BaTiO3 and BaxSr1-xTiO3 Thin Films Prepared by the Sol–Gel Method”,VACUUM, v.69,p.371 – 377,2003(13бр.) 160. Rang H., Park S., Kim K., Sung M.Y., Choi H., Electrochemical and Solid-State Letters, 7 12, 2004 161. Radonjic L., Todorovic M., Miladinovic J., Physics and Chemistry of Glasses, 46 2, Pages 211-214, 2005 162. - Ba (1--x) LaxTiO3 纳米晶的正电子湮没研究 余大书, 王立群, 冯嘉祯 - 天津师范大学学报: 自然科学版, 2004 - 维普资讯 第24卷第4期天津师范大学学报 (自然科学版) 2004年12月Journal of Tianjin Normal University(Natural Science Edition) Vo1.24 No.4 Dec.2004 163. Y.J. Seo, W.S. Lee, Journal of the Korean Physical Society, vol.4, N=6, pp.16511658, 2006 164. - 万方数据资源系统. 材料导报 MATERIALS REVIEW 2005 Vol.19 No.5 P.97-101. 数字化期刊. 165. Kim, N.-H., Ko, P.-J., Seo, Y.-J., Lee, W.-S., “Chemical mechanical polishing of BTO thin film for vertical sidewall patterning of high-density memory capacitor”, Thin Solid Films 504 (1-2) (2006) 261-264. 10 166 Seo, Y.-J., Lee, W.-S. .“Chemical mechanical polishing characteristics of barium titanate thin films using mixed abrasive slurry”, Journal of the Korean Physical Society 48 (6) pp. 1651-1656, (2006). 167. Lee, Woo-Sun, Seo, Yong-Jin, Chemical Mechanical Polishing Characteristics of BTO Films using - and -Mixed Abrasive Slurry (MAS), The Transactions of the Korean Institute of Electrical Engineers C / v.55, no.6, 2006, pp.291-296; KOI : KISTI1.1003/JNL.JAKO200626813130970; ISSN : 1229-246X 168. Kim, G.-H., Kim, C.-I. , „Selective etching of (Ba,Sr)TiO3 thin films over silicon in an inductively coupled plasma“, Microelectronic Engineering 84 (1) (2007) 187-191. 169. Riaz, S., Shamaila, S., Khan, B., Naseem, S., Barium titanate films for electronic applications: Structural & dielectric properties, Surface Review & Letters 15 (3) (2008) 237-244. 170. Guo, Y., Akai, D., Sawada, K., Ishida, M., “Dielectric and ferroelectric properties of highly (100)-oriented (Na0.5Bi0.5)0.94Ba0.06TiO3 thin films grown on LaNiO3/γ-Al2O3/Si substrates by chemical solution deposition”, Solid State Sciences 10 (7) (2008) 928933. 171. Hua, Z.-H., Li, D., Fu, H., “Sol-gel template synthesis and characterization of magnetoelectric CoFe2O4/BaTiO3 nanotubes”, Acta Physico - Chimica Sinica 25 (1) (2009) 145-149. 172..Pookmanee, P., Phanichphant, S. “Characterization of Ba0.77Sr0.23TiO3 powder prepared from an oxalate co-precipitation and an impregnation method “, Journal of Ceramic Processing Research 11 (3), pp. 384-387, (2010) 30. P.Vitanov, A.Harizanova, Chr. Angelov, I.Petrov, Z.Alexieva, P.Stefanov, “ Structure and Optical Properties of (Al2O3)x(TiO2)1-x Thin Films, prepared by SolGel Processing” VEIT , Sept. 2003, Varna, VACUUM, v.76, p.215-218 ISSN: 0042-207X, (2004) (8бр.) 173. „Progress on the pseudo-binary (Al2O3) (TiO2)-system for surface passivation of P-type silicon „ Vermariën, E., Agostinelli, G., Beaucarne, G., Poortmans, J. Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 1, art. no. 4059572, pp. 103-106, (2007). 174. ‘Refractive index, optical bandgap and oscillator parameters of organic films deposited by vacuum evaporation technique’ You, Z.Z., Hua, G.J. Vacuum 83 (6), pp. 984-988, (2009). 175. “Synthesis of high-molecular weight poly(trimethylene terephthalate) catalyzed by MoO3 supported Al2O3-TiO 2 catalysts”, Liu, J., Bian, S.-G., Xiao, M., Wang, S.-J., Meng, Y.-Z., Journal of Applied Polymer Science 115 (6), pp. 3401-3408, (2010). 176. “Pulsed plasma-enhanced chemical vapor deposition of Al2O3-TiO2 nanolaminates”, Rowlette, P.C., Wolden, C.A.,(2010), Thin Solid Films, 518 (12), pp. 3337-3341. 177. ”Preparación de películas delgadas del sistema Ti-Al-O mediante rf-sputtering”, Montes de Oca, J.A., Ceballos-Alvarez, J., Galaviz-Pérez, J., Manaud, J.-P., Lahaye, M., Muñoz-Saldaña, J., (2010), Revista Mexicana de Fisica 56 (2), pp. 118-124. 178..” Structural, absorption and optical dispersion characteristics of rhodamine B thin films prepared by drop casting technique”, Farag, A.A.M., Yahia, I.S. , (2010), Optics Communications 283 (21), pp. 4310-4317. 179. “Spectral-optical-electrical-thermal properties of deposited thin films of nano-sized calcium(II)-8-hydroxy-5,7-dinitroquinolate complex “, Farag, A.A.M., Haggag, S.M.S., Mahmoud, M.E., ( 2011), Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy 82 (1), pp. 467-474 . 11 180. “Optical properties and the dispersion parameters of new zinc Phthalocyanine benzofuran derivative prepared by non-vacuum spin coating technique “, Farag, A.A.M., Yahia, I.S., Yakuphanoglu, F., Kandaz, M., Farooq, W.A. , Optics Communications 285 (13-14) , pp. 3122-3127 , (2012). 31. P.Vitanov, K.Ivanova, A.Harizanova, “ Investigation of Thin Films of Metal Oxides on Silicon with Impedance Spectroscopy” VACUUM, v.76 (2004), p.207210. (1бр.) 181. Poklonski, N.A., Gorbachuk, N.I., Shpakovski, S.V., Lastovskii, S.B., Wieck, A. “Influence of radiation defects on electrical losses in silicon diodes irradiated with electrons”, Semiconductors 44 (3), pp. 380-38, 2010. 32. Kirilov K., Donchev V., Ivanov Tsv., Germanova K., Vitanov P., Ivanov P. „A surface photovoltage spectroscopy system used for minority carrier diffusion length measurements on floating zone silicon”,(2005)JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 7 (1), pp. 533-536 (2бр.) 182. Putungan, D.B., Herrera, M.U. Journal of Physics: Conference Series 28 (1), pp. 7073, (2006). 183. „Surface photovoltage phase spectroscopy study of the photo-induced charge carrier properties of TiO 2 nanotube arrays”, Chen, L., Xie, T., Wang, D., Fan, Z., Jiang, T. (2012), Science China Chemistry 55 (2) , pp. 229-234 33. V. Dimov, P.Vitanov, Formation of Pouros Silicon: Electron Microscope Investigation, J. APPL. PHYS. , 98, pp.1-9, 2005 (4бр.) 184 . Ben Rabha, M., Boujmil, M.F., Meddeb, N., Saadoun, M.,Bessai, B. Thin Solid Films, 511-512 pp. 108-111, 2006 185. Tuzun, O. , Oktik, S. , Altindal, S., Mammadov, T.S., Thin Solid Films , Volume 511512, 26 July 2006, Pages 258-264 , 2006. 186. Megouda, N., Hadjersi, T., El Kachai, O., Boukherroub, R., Guerbous, L., “Properties of Pt-assisted electroless etched silicon in HF/Na2S2O8 solution”, Materials Science Forum 609 (2005) 231-237. 187. RE Serda, C Chiappini, D Fine, E Tasciotti, - Nanostructured oxide”, 2009 ed .Challa Kumar Willey VCH Gmbh Weinheim 2009, books.google.com 34. P.Vitanov, Tz.Babeva, A.Alexieva, A.Harizanova, Z.Nenova, “Optical Properties of (Al2O3)x(TiO2)1-x Films, Deposited by Sol-Gel Method”, VACUUM, v.76 (2004), p.219-222. ISSN: 0042-207X (4 бр.) 12 188. Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron Blažek, J., Musil, J., Stupka, P., Čerstvý, R., Houška, J. 2011 Applied Surface Science 258 (5), pp. 1762-1767 189. Effect of cobalt doping and annealing on properties of titania thin films prepared by solgel process Pärna, R., Joost, U., Nõmmiste, E., Käämbre, T., Kikas, A., Kuusik, I., Hirsimäki, M., (...), Kisand, V. 2011 Applied Surface Science 257 (15), pp. 6897-6907 190. “Engineering titanium and aluminum oxide composites using atomic layer deposition “, Bilu Abaffy, N., McCulloch, D.G., Partridge, J.G., Evans, P.J., Triani, G. , Journal of Applied Physics 110 (12) , art. no. 123514 , (2011). 191. “ Effect of different annealing temperatures and SiO 2/Si(100) substrate on the properties of nickel containing titania thin sol-gel films”, Pärna, R., Joost, U., Nãmmiste, E., Käämbre, T., Kikas, A., Kuusik, I., Kink, I., (...), Kisand, V. , Physica Status Solidi (A) Applications and Materials Science 209 (5) , pp. 953-965 , (2012). 35. G. Agostinelli, P. Vitanov, Z. Alexieva, A. Harizanova, H.F.W. Dekkers, S. De Wolf, G. Beaucarne, “Surface Passivation of Silicon by Means of Negative Charge Dielectrics”, PROC.OF THE 19TH EUROPEAN PHOTOVOLTAIC SOLAR ENERGY CONFERENCE AND EXHIBITION, 7 – 11 June, 2004, Paris, France, (132 – 134). (7бр.) 192. Jang, K. Lee, J. Kim, S. Hwang, J. Lee, S. Kumar, Materials Science in Semiconductor Processing, 2006 193. Hoex, B., Heil, S.B.S., Langereis, E., Van De Banden, M.C.M., Kessels, W.M.M. “Ultralow surface recombination of c-Si substrates passivated by plasma-assisted atomic layer deposited Al2O3” , Applied Physics Letters 89 (4) (2006) art. no. 042112 194. “Optical and electrical properties of negatively charged aluminium oxynitride films”, Jang, K., Jung, S., Lee, J., Lee, K., Kim, J., Son, H., Yi, J., Thin Solid Films 517 (1), (2008) 444-446. 195 Li, T.-T., Cuevas, A, “Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide”, Physica Status Solidi - Rapid Research Letters 3 (5) (2009), pp. 160-162. 196. Kleekajai S., Jiang f., Stavola M., Yelundur V., Nakayashiki K., Rohatgi A., Hahn G., “Concentration and penetration depth of H introduced into crystalline Si by hydrogenation methods used to fabricate solar cells”, Journal of Applied Physics 100 (9) (2006) art.N 093517. 197. Chen F.W.,Li T.-T.A., Cotter J.E “Passivation of boron emitters on n-type silicon by plasma-enhanced chemical vapour deposited silicon nitride”, Applied Physics Letters 88 (26) (2006) art.N 263514. 198. T. A. Li, S. Ruffell, M. Tucci, Y. Mansouliéd, C. Samundsett, S. De Iullis, L. Serenelli, A.s Cuevas, Influence of oxygen on the sputtering of aluminum oxide for the surface passivation of crystalline silicon, Solar Energy Materials and Solar Cells, doi:10.1016/j.solmat.2010.03.034 36. St. DeWolf, G. Agostinelli, G. Beaucarne, P. Vitanov, “On the Influence of the Stoichiometry of Direct Plasma Enhanced Chemical Vapor Deposited Nitride Films 13 and the Silicon Surface Roughness on Surface Passivation”, J. APPL. PHYS., 97, (1), 2005. ( 22бр) 199. S.W. Glunz, A.Grohe, M. Hermle, M. Hofmann, S. Janz, Proc. at the 20th European Photovoltaic Solar Energy …, 2005 - ise.fraunhofer.de 200. S. Kleekajai, F. Jiang, M. Stavola, V. Yelundur, Journal of Applied Physics, 2006 link.aip.org 201. F.W. Chen, T.T.A. Li, J.E. Cotter, Applied Physics Letters, 2006 - link.aip.org 202. Glunz, S.W., High-efficiency crystalline silicon solar cells, Advances in OptoElectronics 2007, art. no. 97370, 2007\ 203. Yoo, J., Dhungel, S.K., Yi, J., Properties of plasma enhanced chemical vapor deposited silicon nitride for the application in multicrystalline silicon solar cells, Thin Solid Films 515 (12) (2007) 5000-5003. 204. Wang JQ,, Sun TT, Wu M, Zhu H, An J,, Tian C, Tang DY, Lin SQ, Xu XQ, Cui RQ, Wang JX, Du JB, Huang JH, Li X, Wu CJ, Optimization of PECVD SiNx on p-type N+ emitter solar cells, Proceedings Of ISES Solar World Congress 2007: Solar Energy And Human Settlement, Vols I-V, pp 1135-1139, 2007, Eds: Goswami DY; Zhao YW. 205. Kang, M.H., Kim, D.S., Ebong, A., Rounsaville, B., Rohatgi, A., Okoniewska, G., Hong, J., The study of silane-free SiCx Ny Film for Crystalline Silicon Solar Cells, Journal of the Electrochemical Society 156 (6) (2009) H495-H499. 206. Kang, M.H., Ebong, A., Rounsaville, B., Rohatgi, A., Hong, J., Silane-free PECVD silicon carbon nitride (SiCxNy) passivation and anti-reflection coatings for high efficiency silicon solar cells, Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 5411436, pp. 001724-001726, 2009. 207. Lelièvre, J.-F., Fourmond, E., Kaminski, A., Palais, O., Ballutaud, D., Lemiti, M., Study of the composition of hydrogenated silicon nitride SiNx:H for efficient surface and bulk passivation of silicon, Solar Energy Materials and Solar Cells 93 (8) (2009) 1281-1289. 208. V. Prajapati, E. Cornagliotti, R. Russell, J. M. Fernandez, R. F. Clark, N. Stoddard, P. Choulat, J. John, High efficiency industrial silicon solar cells on silicon mono2 tm cast material using dielectric passivation and local BSF, 24th European Photovoltaic Solar Energy Conference, 21-25 September 2009, Hamburg, Germany, pp. 11711174. 209. Gong, C., Simoen, E., Posthuma, N., Van Kerschaver, E., Poortmans, J., Mertens, R., „A deep-level transient spectroscopy study of silicon interface states using different silicon nitride surface passivation schemes”, Applied Physics Letters 96 (10), art. no. 103507, 2010 210. „Investigation of fired and non-fired Si-SiN x interface properties by deep-level transient spectroscopy measurements „ Gong, C., Simoen, E., Yang, R., Posthuma, N., Van Kerschaver, E., Poortmans, J., Mertens, R., 2010, Materials Research Society Symposium Proceedings 1210 , pp. 113-118 211. Study of silicon-silicon nitride interface properties on flat and textured surfaces by deep level transient spectroscopy, Gong, C., Simoen, E., Zhao, L., Posthuma, N.E., Van Kerschaver, E., Poortmans, J., Mertens, R. 2010 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 5617172 , pp. 858-862 212. „Study of silicon-silicon nitride interface properties on planar (1 0 0), planar (1 1 1) and textured surfaces using deep-level transient spectroscopy”, Gong, C., Simoen, E., Posthuma, N.E., Van Kerschaver, E., Poortmans, J., Mertens, R. 2010 Journal of Physics D: Applied Physics 43 (48) , art. no. 485301 14 „Effect of deposition conditions and thermal annealing on the charge trapping properties of SiN x films „, Ren, Y., Weber, K.J., Nursam, N.M., Wang, D. 2010 Applied Physics Letters 97 (20) , art. no. 202907 214.”Study on hydrogenated silicon nitride for application of high efficiency crystalline silicon solar cells”, J. Yoo, J. So, G. Yu, J. Yi, Solar Energy Materials and Solar Cells, 2011, Solar Energy Materials and Solar Cells 95 (1) , pp. 7-10 215. „Effective passivation of Si surfaces by plasma deposited SiO x/a-SiNx:H stacks” Dingemans, G., Mandoc, M.M., Bordihn, S., Van De Sanden, M.C.M., Kessels, W.M.M. 2011 Applied Physics Letters 98 (22), art. no. 222102 216. „Modeling the charge decay mechanism in nitrogen-rich silicon nitride films”, Ren, Y., Weber, K.J., Nursam, N.M. 2011 Applied Physics Letters 98 (12), art. no. 122909 0 217. „Surface passivation of crystalline silicon by plasma-enhanced chemical vapor deposition double layers of silicon-rich silicon oxynitride and silicon nitride”, Seiffe, J., Gautero, L., Hofmann, M., Rentsch, J., Preu, R., Weber, S., Eichel, R.A. 2011 Journal of Applied Physics 109 (3), art. no. 034105 218. „Analysis of a-sinx:h passivated si surfaces based on injection level dependent Lifetime and capacitance/conductance-voltage measurement?,s, H. Haug1*, S. Helland1, ø. Nordseth1, e. V. Monakhov2, E. S. Marstein1,2,, 26th European photovoltaic solar energy conference and exhibition 2011, p.1524 219.”Surface passivation of crystalline silicon by plasma-enhanced chemical vapor deposition double layers of silicon-rich silicon oxynitride and silicon nitride”, Seiffe, J., Gautero, L., Hofmann, M., Rentsch, J., Preu, R., Weber, S., Eichel, R.A., 2011 Journal of Applied Physics 109 (3) , art. no. 034105 220.Ultrathin oxide passivation layer by rapid thermal oxidation for the silicon heterojunction solar cell applications”, Lee, Y., Oh, W., Dao, V.A., Hussain, S.Q., Yi, J., 2012 , International Journal of Photoenergy 2012 , art. no. 753456 213. 37. P. Vitanov, A. Harizanova, T. Ivanova, K. Ivanova, “Deposition and Dielectric Properties of (Al2O3)x(TiO2)1-x Thin Films”, J. MATERIALS SCIENCE: MATERIALS IN ELECTRONICS 14 (2003) 757-758. (2бр.) 221. Vermarien, E., Agostinelli, G., Beaucarne, G., Poortmans, J., Progress on the pseudobinary (Al2O3)3(TiO2)2-system for surface passivation of P-type silicon, Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 1, art. no. 4059572, pp. 103-106, (2007). 222. “Engineering titanium and aluminum oxide composites using atomic layer deposition “, Bilu Abaffy, N., McCulloch, D.G., Partridge, J.G., Evans, P.J., Triani, G. , Journal of Applied Physics 110 (12) , art. no. 123514 , (2011). 38. Agostinelli G., de Wolf S., Dekkers H.F.W., Beaucarne G., Le Q.N., Goldbach H.D., Schropp R.E.I., Pinter I, Walter G, Schade K., Vitanov P., Topic M. , Dry Processing for Crystalline Silicon Solar Cells (2003) 13TH NREL WORKSHOP ON CRYSTALLINE SILICON SOLAR CELLS MATERIAL AND PROCESSING,, pp. 147. (2003) ( 1бр.) 223. Sopian, K., Asim, N., Amin, N., Zaidi, S.H., Plasma implantation for emitter and localized back surface field (BSF) formation in silicon solar cells, European Journal of Scientific Research 24 (3) (2008) 365-372 15 39. P.Vitanov, A.Harizanova, Chr. Angelov, I.Petrov, Z.Alexieva, P.Stefanov, “Structure and Optical Properties of (Al2O3)x(TiO2)1-x Thin Films, prepared by SolGel Processing” VEIT , Sept. 2003, Varna, VACUUM, v.76 (2004), p.215-218 ( 8бр.) 224. Vermarien, E., Agostinelli, G., Beaucarne, G., Poortmans, J. „Progress on the pseudobinary (Al2O3) (TiO2)-system for surface passivation of P-type silicon „Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 1, art. no. 4059572, pp. 103-106, (2007). 225. You, Z.Z., Hua, G.J. “Refractive index, optical bandgap and oscillator parameters of organic films deposited by vacuum evaporation technique’ , Vacuum 83 (6), pp. 984988, (2009). 226. Liu, J., Bian, S.-G., Xiao, M., Wang, S.-J., Meng, Y.-Z. “Synthesis of high-molecular weight poly(trimethylene terephthalate) catalyzed by MoO3 supported Al2O3-TiO2 catalysts , Journal of Applied Polymer Science 115 (6), pp. 3401-3408, (2010). 227. de Oca JAM, Ceballos-Alvarez J, Galaviz-Perez J, Manaud JP,, Lahaye M, MunozSaldana J, “Preparation of thin films of the Ti-Al-O system by rf-sputtering”, Revista Mexicana De Fisica 56 (2) (2010) 118-124. 228. “Pulsed plasma-enhanced chemical vapor deposition of Al2O3-TiO2 nanolaminates”, Rowlette, P.C., Wolden, C.A.,(2010), Thin Solid Films, 518 (12), pp. 3337-3341. 229..” Structural, absorption and optical dispersion characteristics of rhodamine B thin films prepared by drop casting technique”, Farag, A.A.M., Yahia, I.S. , (2010), Optics Communications 283 (21), pp. 4310-4317. 230.. “Spectral-optical-electrical-thermal properties of deposited thin films of nano-sized calcium(II)-8-hydroxy-5,7-dinitroquinolate complex “, Farag, A.A.M., Haggag, S.M.S., Mahmoud, M.E., ( 2011), Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy 82 (1), pp. 467-474 . 231. “Optical properties and the dispersion parameters of new zinc Phthalocyanine benzofuran derivative prepared by non-vacuum spin coating technique “, Farag, A.A.M., Yahia, I.S., Yakuphanoglu, F., Kandaz, M., Farooq, W.A., Optics Communications 285 (13-14) , pp. 3122-3127 , (2012). 40. P.Vitanov, K.Ivanova, A.Harizanova, “Investigation of Thin Films of Metal Oxides on Silicon with Impedance Spectroscopy” VACUUM, v.76 (2004), p.207210. (1бр.) 232. Poklonski, N.A., Gorbachuk, N.I., Shpakovski, S.V., Lastovskii, S.B., Wieck, A. Influence of radiation defects on electrical losses in silicon diodes irradiated with electrons Semiconductors 44 (3), pp. 380-384, (2010). 41. Georgieva V., Stevchev P., Vitanov P., Spassov L., Quartz resonator with thin TiO2 for NH3 detection, (2004) VACUUM, 76 (2-3), pp. 203-206. (4бр.) 233. Çoban, C., Demirbaş, E.,” Detection of volatile organic compounds in aqueous solutions by phthalocyanine coated quartz crystal microbalance”, Sensor Letters 4 (4), (2006) 446-451. 16 234. Schnitzer, R., Reiter, C., Harms, K.-C., Benes, E., Gröschl, M., „A general-purpose online measurement system for resonant BAW sensors”, IEEE Sensors Journal 6 (5), art. no. 1703493, pp. 1314-1321, 2006. 235. Sugimoto, H., Tanaka, H., Kanno, Y.,”Volatile organic compound gas sensing using quartz crystal microbalance with inorganic films coated by pulsed laser deposition”, Japanese Journal of Applied Physics 47 (1 PART 2) (2008) 637-639. 236. “ Quartz crystal microbalance sensor using ionophore for ammonium ion detection”, Kosaki, Y., Takano, K., Citterio, D., Suzuki, K., Shiratori, S., Journal of Nanoscience and Nanotechnology 12 (1) , pp. 563-567, 92012). 42. Tuytuyngjiev N., Vitanov P. , Demo Project AcadPV, FP5-Bulgarian Centre on Solar Energy, (2004) SCIENTIFIC SUMMER SCHOOL (1бр.) 237. Gramatikov, P., Solar energy utilisation opportunities in Bulgaria, NATO Security through Science Series C: Environmental Security , pp. 139-151, 2007. 43. Bakardjieva V., Beshkov G., Vitanov P., Alexieva Z., Effect of rapid thermal annealing on the properties of μPCVD and PECVD silicon nitride thin films, (2005) JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 7 (1), pp. 377-380. (2бр.) 238. Chattopadhyay, S., Dutta, S., Jana, D., Chattopadhyay, S., Das, D., Chakrabarti, M., Sanyal, D., Sarkar, A., Defects dynamics in annealed Si3N4 by positron annihilation spectroscopy, Physica Status Solidi (C) Current Topics in Solid State Physics 6 (11) (2009) 2533-2536. 239.”Effects of dry plasma releasing process parameters and induced inplane stress on MEMS devices yield,” Nieva, P.M., Godin, J.R., Norris, R.C., Sohi, A.N., Leung, T. 2012, Proceedings of SPIE - The International Society for Optical Engineering 8250 , art. no. 825003 44. P. Vitanov, A. Harizanova, T. Ivanova, Z. Alexieva, K. Ivanova, G. Agostinelli, “Application of Pseudobinary Alloys (Al2O3)x(TiO2)1-x as High- k Dielectrics on Silicon”, PLASMA PROCESSES AND POLYMERS 3 (2006) 184-187. (1бр.) 240. Ye WB, Huang GZ, Zhu JM, Dai JF, “Atomic layer deposition of high-k dielectrics”, Conference Information: 8th Vacuum Metallurgy and Surface Engineering Conference, JUN 16-19, 2007 Shenyang, PEOPLES R CHINA, Vacuum Metallurgy and Surface Engineering, Proceedings, pp: 291-298, (2007), ed. Dechun B 45. Vitanov, A. Harizanova, T. Ivanova, Z. Alexieva, G. Agostinelli, “Deposition and Properties of the Pseudobinary Alloys (Al2O3)x(TiO2)1-x and Its Application for Silicon Surface Passivation”, JAPANESE JOURNAL OF APPLIED PHYSICS 45 (7) (2006) 5894-5901. ( 2бр.) 17 241. Jõgi, I., Kukli, K., Kemell, M., Ritala, M., Leskela, M., Electrical characterization of AlxTiyOz mixtures and Al2O3-TiO2-Al2O3 nanolaminates , Journal of Applied Physics 102 (11): Art. No. 114114, DEC 1 2007. 242. „Ahn, Y., Choudhury, S.H., Lee, D., Md. Sadaf, S., Siddik, M., Jo, M., Park, S., Hwang, H., .“Estimation of interfacial fixed charge at AL2O 3/SiO2 using slant-etched wafer for solar cell application”, Japanese Journal of Applied Physics ,50 (7 PART 1), (2011) art. no. 071503 46. P. Vitanov, G. Agostinelli, A. Harizanova, T. Ivanova, M. Vukadinovic, N. Le Quang and G. Beaucarne, “Low Cost Surface Passivation for p-Type mc-Si Based on pseudobinary Alloys (Al2O3)x(TiO2)1−x”, Solar Energy Materials And Solar Cells 90 (2006) 2489 – 2495. (9бр.) 243. Rowlette, P.C., Wolden, C.A., „Pulsed plasma-enhanced chemical vapor deposition of Al2O3-TiO2 nanolaminates2, Thin Solid Films 518 (12) (2010) 3337 – 3341. 244. de Oca JAM, Ceballos-Alvarez J, Galaviz-Perez J, Manaud JP,, Lahaye M, MunozSaldana J,“Preparation of thin films of the Ti-Al-O system by rf-sputtering”, Revista Mexicana De Fisica 56 (2) (2010) 118-124. 245. Energy barriers for trimethylaluminum reaction with varying surface hydroxyl density, Kim, D.-H., Baek, S.-B., Kim, Y.-C., Applied Surface Science, v. 258, issue 1, (2011), pp. 225 – 229. 246. Silicon surface passivation by Al2O3: Effect of ALD reactants Repo, P., Talvitie, H., Li, S., Skarp, J., Savin, H. 2011 Energy Procedia 8, pp. 681-687 247. Interactions between tri-methylaluminum molecules and their effect on the reaction of tri-methylaluminum with an OH-terminated Si (0 0 1) surface Kim, D.-H., Baek, S.-B., Seo, H.-I., Kim, Y.-C. 2011 Applied Surface Science 257 (15), pp. 6326-6331 248. Microsystems enabled photovoltaics: 14.9% efficient 14 μm thick crystalline silicon solar cell Cruz-Campa, J.L., Okandan, M., Resnick, P.J., Clews, P., Pluym, T., Grubbs, R.K., Gupta, V.P., (...), Nielson, G.N. 2011 Solar Energy Materials and Solar Cells 95 (2), pp. 551-558 249. “Optical and passivating properties of sol-gel derived silica and titania coatings on textured monocrystalline silicon “, Petersson, A.M., Lindberg, P., Boström, T. , Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186556 , pp. 002918-002923, (2011). 250. “Crystalline silicon surface passivation by the negative charge dielectric film “, Liang, Z., Chen, D., Feng, C., Cai, J., Shen, H. , Physics Procedia 18 , pp. 51-55 , (2011). 251. “ Engineering titanium and aluminum oxide composites using atomic layer deposition’, Bilu Abaffy, N., McCulloch, D.G., Partridge, J.G., Evans, P.J., Triani, G. , Journal of Applied Physics 110 (12) , art. no. 123514, (2011). 47. Agostinelli G., Delabie A., Vitanov P., Alexieva Z., Dekkers H.F.W., De Wolf S., Beaucarne G. Very low surface recombination velocities on p-type silicon wafers passivated with a dielectric with fixed negative charge, (2006) SOLAR ENERGY MATERIALS AND SOLAR CELLS, 90 (18-19), pp. 3438-3443. ( 86 бр.) 18 252. Srikanth, S., Karmalkar, S., Charge Sheet Superjunction (CSSJ) - A new superjunction concept, Proceedings of the 14th International Workshop on the Physics of Semiconductor Devices, IWPSD , art. no. 4472638, pp. 795-798, 2007. 253. Hoex, B., Schmidt, J., Bock, R., Altermatt, P.P., Van De Sanden, M.C.M., Kessels, W.M.M, Excellent passivation of highly doped p -type Si surfaces by the negativecharge-dielectric Al2O3, Applied Physics Letters 91 (11), art. no. 112107, 2007. 254. Heil, S.B.S., Van Hemmen, J.L., Hodson, C.J., Singh, N., Klootwijk, J.H., Roozeboom, F., Van De Sanden, M.C.M., Kessels, W.M.M., Deposition of TiN and HfO2 in a commercial 200 mm remote plasma atomic layer deposition reactor, Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films 25 (5) (2007) 1357-1366. 255. Hoex, B., Schmidt, J., Pohl, P., Van De Sanden, M.C.M., Kessels, W.M.M., Silicon surface passivation by atomic layer deposited Al2O3, Journal of Applied Physics 104 (4), art. no. 044903, 2008 256. Schmidt, J., Merkle, A., Brendel, R., Hoex, B., Van De Sanden, M.C.M., Kessels, W.M.M, Surface passivation of high-efficiency silicon solar cells by atomic-layerdeposited Al2O3, Progress in Photovoltaics: Research and Applications 16 (6), pp. 461-466, (2008). 257. Heil, S.B.S., Van Hemmen, J.L., Van De Sanden, M.C.M., Kessels, W.M.M., Reaction mechanisms during plasma-assisted atomic layer deposition of metal oxides: A case study for Al2O3, Journal of Applied Physics 103 (10), art. no. 103302, (2008). 258. Srikanth, S., Karmalkar, S., On the charge sheet superjunction (CSSJ) MOSFET, IEEE Transactions on Electron Devices 55 (12), pp. 3562-3568, (2008). 259. Hoex, B., Gielis, J.J.H., Van De Sanden, M.C.M., Kessels, W.M.M., On the c-Si surface passivation mechanism by the negative-charge-dielectric Al2O3, Journal of Applied Physics 104 (11) (2008) art. no. 113703. 260. Gielis, J.J.H., Hoex, B., Van De Sanden, M.C.M., Kessels, W.M.M., Negative charge and charging dynamics in Al2O3 films on Si characterized by second-harmonic generation, Journal of Applied Physics 104 (7) (2008) art. no. 073701. 261. Li, T.-T., Cuevas, A. , Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide, Physica Status Solidi - Rapid Research Letters 3 (5) (2009) 160-162. 262. Kessels, W.M.M., Gielis, J.J.H., Hoex, B., Terlinden, N.M., Dingemans, G., Verlaan, V., Van De Sanden, M.C.M., Electric field induced surface passivation of Si by atomic layer deposited AI2O3 studied by optical second-harmonic generation Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 5411651, pp. 000427-000431, 2009. 263. Wang, J., Farrokh-Baroughi, M., Shanmugam, M., Samadzadeh-Tarighat, R., Sivoththaman, S., Paul, S. , Passivation of silicon surfaces using atomic layer deposited metal oxides, Materials Research Society Symposium Proceedings 1153, pp. 147-152 , 2009. 264. Wang, J., Baroughi, M.F., Bills, B., Galipeau, D., Samadzadeh, R., Sivoththaman, S , Substrate dependence of surface passivation using atomic layer deposited dielectrics Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 5411511, pp. 001988-001991, 2009 265. Schmidt, J., Veith, B., Brendel, R., Effective surface passivation of crystalline silicon using ultrathin Al2O3 films and Al2O3/SiN x stacks, Physica Status Solidi - Rapid Research Letters 3 (9) (2009) 287-289. 266. Dingemans, G., Engelhart, P., Seguin, R., Hoex, B., Van De Sanden, M.C.M., Kessels, W.M.M., Firing stability of atomic layer deposited Al2O3 for c-Si surface passivation, 19 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 5411187, pp. 000705-000708, (2009). 267. Putkonen, M., ALD applications beyond outside IC technology- Existing and emerging possibilities , ECS Transactions 25 (4), pp. 143-155, (2009). 268. Conway, A.M., Wang, T.F., Deo, N., Cheung, C.L., Nikolić, R.J., Numerical simulations of pillar structured solid state thermal neutron detector: Efficiency and gamma discrimination , IEEE Transactions on Nuclear Science 56 (5), art. no. 5280550, pp. 2802-2807, (2009). 269. Xiao, H.-Q., Zhou, C.-L., Cao, X.-N., Wang, W.-J., Zhao, L., Li, H.-L., Diao, H.-W., Excellent passivation of p-type Si surface by sol-gel Al2O 3 films, Chinese Physics Letters 26 (8) (2009) art. no. 088102. 270. Sun, W.C., Chang, W.L., Chen, C.H., Du, C.H., Wang, T.Y., Wang, T., Lan, C.W., High efficiency silicon solar cells with bilayer passivation structure Electrochemical and Solid-State Letters 12 (10) (2009) H388-H391 271. Vázquez, C., Alonso, J., Vázquez, M.A., Caballero, L.J., Romero, R., Ramos-Barrado, J.R., Efficiency of commercial Cz-Si solar cell with a shallow emitter, Materials Science and Engineering B: Solid-State Materials for Advanced Technology 172 (1) (2010) 43-49. 272. Lim, B., Bothe, K., Schmidt, J., Impact of oxygen on the permanent deactivation of boron-oxygen-related recombination centers in crystalline silicon, Journal of Applied Physics 107 (12), art. no. 123707 , (2010). 273. Verlaan, V., Van Den Elzen, L.R.J.G., Dingemans, G., Van De Sanden, M.C.M., Kessels, W.M.M.3, Composition and bonding structure of plasma-assisted ALD Al 2O3 films, Physica Status Solidi (C) Current Topics in Solid State Physics 7 (3-4) (2010) 976-979. 274. Terlinden, N.M., Dingemans, G., Van De Sanden, M.C.M., Kessels, W.M.M., Role of field-effect on c-Si surface passivation by ultrathin (2-20 nm) atomic layer deposited Al2O3, Applied Physics Letters 96 (11), art. no. 112101, (2010). 275. Dingemans, G., Seguin, R., Engelhart, P., van de Sanden, M.C.M., Kessels, W.M.M , Silicon surface passivation by ultrathin Al2O3 films synthesized by thermal and plasma atomic layer deposition, Physica Status Solidi - Rapid Research Letters 4 (1-2) (2010) 10-12. 276. Dingemans, G., Van De Sanden, M.C.M., Kessels, W.M.M., Influence of the deposition temperature on the c-Si Surface passivation by Al2O3 films synthesized by ALD and PECVD , Electrochemical and Solid-State Letters 13 (3), (2010) H76-H79. 277. Miyajima, S., Irikawa, J., Yamada, A., Konagai, M., High quality aluminum oxide passivation layer for crystalline silicon solar cells deposited by parallel-plate plasmaenhanced chemical vapor deposition, Applied Physics Express 3 (1), art. no. 012301, (2010). 278. A.Das, V.Meemongkolkait, D.S.Kim, S. Ramanathan, A.Rohatgi “ 20% efficient screen-printed cells with spin-on dielectric-passivated boron back- surface field” IEEE Trans. Electr. Dev., 57, pp.2462-2469, (2010) art.no. 5549878 279.G. Dingemans, W.Beyer, M.C.M. Van de Sanden, W.M. M. Kessels, ” Hydrogen indused passivation of Si interface by Al2O3 films and SiO2/ Al2O3 stacks”, Appl.Pys. Lett, 97, 15, (2010) art no. 152106 280.F.Werner, B.Veith, V. Tiba, P. Poodt, F. Roozenboom, R.Brendel, J.Schmidt, “Very low surface recombination on P- and n- type c-Si by ultrafast atomic layerdeposition of aluminum oxide” Appl. Phys. Lett, 97, 16, (2010) , art no. 162103 281. X. Loozen, B.J. O’Sullivan, A. Rothschild, B. Vermang, J.John, I.Gordon ” On the choice of the test structure for the electrical characterization of dielectric for silicon solar cells” , Phys. St. Sol. –Rapid research Letters 4 , 12, pp.362-364 , (2010) 20 282. J.I. Skarp, “ High throughput ALD production system for cadmium free CIGS and enhanced efficiency c-solar cells”, ECS transactions , 33 (20), pp.447-452, (2010) 283. G. Dingemans, P. Engelhart, R. Seguin, M.M. Mandos, M.C.M. Van de Sanden, W.M. M. Kessels, ” Comparison between aluminum oxide surface passivation films deposited with thermal ALD, plazma ALD and PECVD” Conf. Record of the IEEE Potovoltaic Spec. Conf. pp.3118-3121, art no. 5614508 ( 2010) 284. M.M. Mandos, M.L.C. Adams G. Dingemans, N.M. Terlinden, M.C.M. Van de Sanden, W.M. M. Kessels, “ Corona charging and optical second harmonic generation studies of the field effect passivation of c-Si by Al2O3 films” , Conf. Record of the IEEE Potovoltaic Spec. Conf. pp.3200- 3204, art.no. 5616794 ( 2010) 285. J Schmidt, B. Veith, F. Werner, D. Zielke, R. Brendel „ Silicon surface passivation by ultrathin Al2O3filns and Al2O3/SiNx stacks“. Conf. Record of the IEEE Potovoltaic Spec. Conf. p.885-890, art.no. 5614132 (2010) 286. M.J. Rafi, M.Zabala, O.Beldarrain, F.Campabadal, “ Effect of processing conditions on the electrical characteristics of atomic layer deposition Al2O3 and HfO2 films”, ECS transactions , 28 (2), pp.213-221, (2010) 287. Controlling the fixed charge and passivation properties of Si(100)/Al 2O3 interfaces using ultrathin SiO2 interlayers synthesized by atomic layer deposition Dingemans, G., Terlinden, N.M., Verheijen, M.A., Van De Sanden, M.C.M., Kessels, W.M.M. 2011 Journal of Applied Physics 110 (9), art. no. 093715 288. Energy barriers for trimethylaluminum reaction with varying surface hydroxyl density Kim, D.-H., Baek, S.-B., Kim, Y.-C. 2011 Applied Surface Science 258 (1), pp. 225229 289. Spatially separated atomic layer deposition of Al2O3, a new option for high-throughput Si solar cell passivation Vermang, B., Rothschild, A., Racz, A., John, J., Poortmans, J., Mertens, R., Poodt, P., (...), Roozeboom, F. 2011 Progress in Photovoltaics: Research and Applications 19 (6), pp. 733-739 290. Nanoengineering and interfacial engineering of photovoltaics by atomic layer deposition Bakke, J.R., Pickrahn, K.L., Brennan, T.P., Bent, S.F. 2011 Nanoscale 3 (9), pp. 3482-3508 291. Accelerated deactivation of the boron-oxygen-related recombination centre in crystalline silicon Lim, B., Bothe, K., Schmidt, J. 2011 Semiconductor Science and Technology 26 (9), art. no. 095009 292. Comparison of the thermal stability of single Al2O3 layers and Al2O3/SiNx stacks for the surface passiviation of silicon Veith, B., Werner, F., Zielke, D., Brendel, R., Schmidt, J. 2011 Energy Procedia 8, pp. 307-312 293. High-rate atomic layer deposition of Al2O3 for the surface passivation of Si solar cells Werner, F., Stals, W., Görtzen, R., Veith, B., Brendel, R., Schmidt, J. 2011 Energy Procedia 8, pp. 301-306 294. High surface passivation quality and thermal stability of ALD Al 2O3 on wet chemical grown ultra-thin SiO2 on silicon Bordihn, S., Engelhart, P., Mertens, V., Kesser, G., Köhn, D., Dingemans, G., Mandoc, M.M., (...), Kessels, W.M.M. 2011 Energy Procedia 8, pp. 654-659 295. Contact passivation in silicon solar cells using atomic-layer-deposited aluminum oxide layers Zielke, D., Petermann, J.H., Werner, F., Veith, B., Brendel, R., Schmidt, J. 2011 Physica Status Solidi - Rapid Research Letters 5 (8), pp. 298-300 296. Modulation of atomic-layer-deposited Al2O3 film passivation of silicon surface by rapid thermal processing Lei, D., Yu, X., Song, L., Gu, X., Li, G., Yang, D. 2011 Applied Physics Letters 99 (5), art. no. 052103 21 297 Impact of forming gas annealing and firing on the Al2O 3/p-Si interface state spectrum Simoen, E., Rothschild, A., Vermang, B., Poortmans, J., Mertens, R. 2011 Electrochemical and Solid-State Letters 14 (9), pp. H362-H364 298. Estimation of interfacial fixed charge at al2o 3/sio2 using slant-Etched wafer for solar cell application Ahn, Y., Choudhury, S.H., Lee, D., Md. Sadaf, S., Siddik, M., Jo, M., Park, S., (...), Hwang, H. 2011 Japanese Journal of Applied Physics 50 (7 PART 1), art. no. 071503 299. Very fast light-induced degradation of a-Si:H/c-Si(100) interfaces De Wolf, S., Demaurex, B., Descoeudres, A., Ballif, C. 2011 Physical Review B - Condensed Matter and Materials Physics 83 (23), art. no. 233301 300. Electronic and chemical properties of the c-Si/Al2O3 interface Werner, F., Veith, B., Zielke, D., Kühnemund, L., Tegenkamp, C., Seibt, M., Brendel, R., Schmidt, J. 2011 Journal of Applied Physics 109 (11), art. no. 113701 301. Excellent silicon surface passivation with 5 Å thin ALD Al2O3 layers: Influence of different thermal post-deposition treatments Richter, A., Benick, J., Hermle, M., Glunz, S.W. 2011 Physica Status Solidi - Rapid Research Letters 5 (5-6), pp. 202204 302. Interactions between tri-methylaluminum molecules and their effect on the reaction of tri-methylaluminum with an OH-terminated Si (0 0 1) surface Kim, D.-H., Baek, S.-B., Seo, H.-I., Kim, Y.-C. 2011 Applied Surface Science 257 (15), pp. 6326-6331 303. Ultralow surface recombination in p-Si passivated by catalytic-chemical vapor deposited alumina films Ogita, Y.-I., Tachihara, M., Aizawa, Y., Saito, N. 2011 Thin Solid Films 519 (14), pp. 4469-4472 304. Deposition temperature and thermal annealing effects on the electrical characteristics of atomic layer deposited Al2O3 films on silicon Rafí, J.M., Zabala, M., Beldarrain, O., Campabadal, F. 2011 Journal of the Electrochemical Society 158 (5), pp. G108-G114 305. Charge carrier trapping at passivated silicon surfaces Seiffe, J., Hofmann, M., Rentsch, J., Preu, R. 2011 Journal of Applied Physics 109 (6), art. no. 064505 306. Photovoltaic effect of a-C: Fe/AlOx/Si based heterostructures Wu, L.-H., Zhang, X.-Z., Yu, Y., Wan, C.-H., Tan, X.-Y. 2011 Wuli Xuebao/Acta Physica Sinica 60 (3), art. no. 037807 307. Influence of the oxidant on the chemical and field-effect passivation of Si by ALD Al2 O3 Dingemans, G., Terlinden, N.M., Pierreux, D., Profijt, H.B., Van De Sanden, M.C.M., Kessels, W.M.M. 2011 Electrochemical and Solid-State Letters 14 (1), pp. H1-H4 357. 308. Effects of annealing and atomic hydrogen treatment on aluminum oxide passivation layers for crystalline silicon solar cells Irikawa, J., Miyajima, S., Kida, S., KidaWatahiki, T., Konagai, M. 2011 Japanese Journal of Applied Physics 50 (1), art. no. 012301 309. Excellent Si surface passivation by low temperature SiO2 using an ultrathin Al2O3 capping film Dingemans, G., Van De Sanden, M.C.M., Kessels, W.M.M. 2011 Physica Status Solidi - Rapid Research Letters 5 (1), pp. 22-24 310. Influence of oxygen on the sputtering of aluminum oxide for the surface passivation of crystalline silicon Li, T.-T.A., Ruffell, S., Tucci, M., Mansouli, Y., Samundsett, C., De Iullis, S., Serenelli, L., Cuevas, A. 2011 Solar Energy Materials and Solar Cells 95 (1), pp. 69-72 311..E. Simoen, A. Rothschild, B. Vermang, j. Poortmans, R. Mertens, „ A deeplevel transients spectroscopy comparison of the SiO2/Si and Al2O3/Si interface state’ , ECS Transactions , 41, (4), pp.37-44, (2011) 22 312. A. Delabie, S.Sioncke, J.Rip, S.Van Eishocht, G. Pourtois, M.Mueller, m. Beckhoff, K. Pierloot, “ Alumiium oxide atomic layer deposition on semiconductor substrates” ECS Transactions , 41, (3), pp.149-160, (2011) 313..Z. Liang, d. Chen, C.Feng, J.Cai, H. Shen ‘ Cristalline silicon surface passivation by the negative charge dielectric film” Phys. Procedia, 18 pp, 51-55 314.G. Dingemans, W.M.M. Kessels “ Aluminum oxide and other ALD materials for Si surface passivation”, ECS Transactions , 41, (2), pp.293-301, (2011) 315..E. Black, K. m. Provancha, K.R. McIntosh, “ Surface passivation of crystalline silicon by APCVD aluminium oxide’ , 26th European Photovoltaic Solar Energy Conference , pp 1120-1124, ( 2011) 316. D. Zielke, J.H. Petermann, F. Werner, B. Veith, R. Brendel, J. Schmidt, „ 21.7% efficient PERC solar cells with AlOx tunneling layer“,26th European Photovoltaic Solar Energy Conference , pp 1115-1119, ( 2011) 317. B. Vermang, H. Goverde, A. Urena, A. Lorenz, A.Uruena, J. Das, P. Choulat, E. Comaglioti, A. Rothschild, J. John, J. Poortmans, R. Mertens, „On The blistering of Al2O3 passivation layers for Si solar cells“,26th European Photovoltaic Solar Energy Conference , pp 1129-1131, ( 2011) 318.P.Jaffrennou, A. Uruena, J.Das, J.Penaud, M.Moor, A. Rothschild, B.Lobardet, J. Szlufcik, “Laser ablation of SiO2/SiNx and AlOx/ back side passivation stack for advanced cell architectures”, 26th European Photovoltaic Solar Energy Conference , pp 2180-2183, ( 2011) 319. Laser ablation of AlOx and AlOx/SiNx backside passivation layers for advanced cell architectures Jaffrennou, P., Moors, M., Uruena, A., Das, J., Duerinckx, F., Penaud, J., Rothschild, A., (...), Szlufcik, J. 2011 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186138 , pp. 001074-001078 320..Y. Schiele, G. Hahn, B. Terheiden ‚ “Investigation of radiation damage to the Al2O3/Si wafer interface during electron beam ewaporation by means of C-V lifetime measurements”, 26th European Photovoltaic Solar Energy Conference , pp 1o681o72, ( 2011) 321. Investigation of passivation properties of thermal Al 2O 3 and SiN x stack layers deposited on solar grade p-type CZ Si wafers, Seo, J.-W., Oh, H., Kyung, D.-H., Hwang, M.-I., Lee, K., Lee, W.-J., Cho, E.-C., 2011 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186246 , pp. 001512-001514 322. Enhanced passivation for silicon solar cells by anodic aluminum oxide, Lu, P.H.D., Lu, Z., Wang, K., Lennon, A., Wenham, S, 2011 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186241 , pp. 001490-001494 323. Al 2O3 surface passivation: Electrical characterization using the Quantox tool, Rothschild, A., Nishibe, S., Cui, J., Zhu, N., Debucquoy, M., Mamagkakis, S., Nagaswami, V., John, J. 2011 Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186245 , pp. 001508-001511 324. J.Schmidt, A.Merkle, R. Bock, P. Altermatt, A, Cuevas, ” Progress in the Surface passivation of silicin solar cells” 26th European Photovoltaic Solar Energy Conference , pp 974-981, ( 2011) 325..A.Delabie, S.Sionke. J. Rip, S.Van Eishocht, G.Pourtois, M.Mueller, B.Beckhoff, K.Pierlot, “Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates” J. Vacuum Sci. and Techn. A: Vacuum, Surface and Films, 30, 91) art. No. 01A127 (2012) 326..J. Edwadson, P.G.Coleman, T.Li,A.Cuecas, S.Ruffell, “ Positron annihilation studies of the AlOx SiO2 ?si interface in solar cell structures” J. Appl. Phys., 111, (5), art. no. 053515, 2012. 23 327.N. Satoh, I.Cesar, M. Lamers, I. Romijn, K. Bakker, S. Olson, f. Verbakel, M. Wiggers, ” Energy band diagram near the interface of aluminum oxide on p_Si fabricated by atomic layer deposition without/with rapid thermal cycle annealing determined by capacitance- voltage measurements” , J. Sci. and Nanotechnology, 10, pp.22-28, 2012. 328. B. Vermang, H. Goverde, A. Urena, A. Lorenz, E. Comaglioti, A. Rothschild, J. John, R. Mertens, “ Blisterin in ALD Al2O3 passivation layers as rear contacting for local Al BSF Si solar cells”, Solar Energy Materials and Solar Cells, 101, pp. 204-209, 2012 329. Effect of the temperature during deposition of AlO x films by spray pyrolysis on their passivating properties in a silicon solar cell Untila, G.G., Kost, T.N., Chebotareva, A.B., Zaks, M.B., Sitnikov, A.M., Solodukha, O.I. 2012 Semiconductors 46 (6) , pp. 832-837 330. Surface passivation of c-Si by atmospheric pressure chemical vapor deposition of Al 2O 3 Black, L.E., McIntosh, K.R. 2012 , Applied Physics Letters 100 (20) , art. no. 202107 331. „Advances in the surface passivation of silicon solar cells”, Schmidt, J., Werner, F., Veith, B., Zielke, D., Steingrube, S., Altermatt, P.P., Gatz, S., (...), Brendel, R. 2012 Energy Procedia 15 , pp. 30-39 332. Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements, McIntosh, K.R., Black, L.E., Baker-Finch, S.C., Kho, T.C., Wan, Y.Y. 2012, Energy Procedia 15 , pp. 162-170 333. „Low-temperature surface passivation of moderately doped crystalline silicon by atomic-layer-deposited hafnium oxide films „, Lin, F., Hoex, B., Koh, Y.H., Lin, J.J., Aberle, A.G. 2012 Energy Procedia 15 , pp. 84-90 334. „Approach for Al 2O 3 rear surface passivation of industrial p-type Si PERC above 19%”, Vermang, B., Goverde, H., Tous, L., Lorenz, A., Choulat, P., Horzel, J., John, J., (...), Mertens, R. 2012 Progress in Photovoltaics: Research and Applications 20 (3) , pp. 269-273 335. Surface passivation for Si solar cells: A combination of advanced surface cleaning and thermal atomic layer deposition of Al 2O 3, Vermang, B., Rothschild, A., Kenis, K., Wostyn, K., Bearda, T., Racz, A., Loozen, X., (...), Mertens, R. 2012 Diffusion and Defect Data Pt.B: Solid State Phenomena 187 , pp. 357-361 336. „Interface recombination parameters of atomic-layer-deposited Al2O3 on crystalline silicon „ Werner, F., Cosceev, A., Schmidt, J. , 2012 , Journal of Applied Physics 111 (7) , art. no. 073710 337. „Surface recombination of crystalline silicon substrates passivated by atomic-layerdeposited AlO x”, Arafune, K., Miki, S., Matsutani, R., Hamano, J., Yoshida, H., Tachibana, T., Ju Lee, H., (...), Satoh, S.-I. 2012 Japanese Journal of Applied Physics 51 (4 PART 2) , art. no. 04DP06 48. P Vitanov, Z Alexieva, A Harizanova, Z Horvath, L Dozsa , “Electrical properties of (Al2O3)x(TiO2)1-x films deposited on silicon substrate”,, Proc. of Fifteenth International Summer School on Vacuum, Electron, And Ion Technologies, 17–21 September 2007, Sozopol, Bulgaria, JOURNAL OF PHYSICS: CONFERENCE SERIES 113 2008)012037 (1бр.) 338..“Evidence of Pool-Frenkel conduction mechanism in Sr-doped lanthanum ferrite La 1xSr xFeO 3(0≤x≤1) system “, Zafar, A., Imran, Z., Rafiq, M.A., Hasan, M.M. , Saudi 24 International Electronics, Communications and Photonics Conference 2011, SIECPC 2011 , art. no. 5876924, (2011). 49. Vitanov P., Tsanev A., Stefanov P., Harizanova A., Ivanova T., “XPS characterization of thin ZrO2 and (ZrO2) x(Al2O3)1-x films deposited on silicon”,) JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 9 (2) , pp. 256-259 (2007). (1 бр.) 339. „Antireflection coatings for GaAs solar cell applications”Alexieva, Z.I., Nenova, Z.S., Bakardjieva, V.S., Milanova, M.M., Dikov, Hr.M.,Journal of Physics: Conference Series 223 (1) , art. no. 012045, (2010). 50. P Vitanov, P Stefanov, A Harizanova and T Ivanova, “XPS characterization of thin (Al2O3)x(TiO2)1-x films deposited on silicon”, 15TH INTERNATIONAL SCHOOL ON VACUUM, ELECTRON AND ION TECHNOLOGIES, J. PHYSICS: CONFERENCE SERIES 113 (2008) 012036. (5 бр.) 340. Qi, B., Agnarsson, B.,Göthelid, M., Ólafsson, S.,Gíslason, H.P., “High-resolution X-ray photoemission spectroscopy study of AlN nano-columns grown by nitridation of Al nano-squares on Si(111) substrates with ammonia”, Thin Solid Films 518 (14) (2010) 3632-3639. 341. Avi Shalav, Dinesh K.Venkatachalam, Fabian Reichardt, Frederic Fischer and Robert G. Elliman, “Titania Coated Silica Nanowires”, Mater. Res. Soc. Symp. Proc. Vol. 1206 © 2010 Materials Research Society, 1206-M16-05 342.“Evidence of Pool-Frenkel conduction mechanism in Sr-doped lanthanum ferrite La1xSrxFeO3(0≤x≤1) system”, Zafar, A., Imran, Z., Rafiq, M.A., Hasan, M.M., (2011), Saudi International Electronics, Communications and Photonics Conference (2011), , SIECPC, art. no. 5876924 343. “Modification of the electronic structures of graphene by viologen “, Jeong, H.K.,Kim, K.-J., Kim, S.M., Lee, Y.H. , Chemical Physics Letters 498 (1-3) , pp. 168-171, (2010). 344. “Depassivation of some metals by sliding friction “, Henry, P., Takadoum, J., Berçot, P. , Corrosion Science 53 (1) , pp. 320-328 , (2011). 51. Vitanov P., Loozen X., Harizanova A., Ivanova T, Beaucarne G., A study of sol-gel deposited Al2O3 films as passivating coatings for solar cells application, PROCEEDINGS OF THE 23RD EUROPEAN PHOTOVOLTAIC SOLAR ENERGY CONFERENCE, (2008), pp. 1596-1599. (1 бр.) 345. Ghannam, M.Y., Abouelsaood, A.A., Alomar, A.S., Poortmans, J.,”Analysis of thinfilm silicon solar cells with plasma textured front surface and multi-layer porous silicon back reflector” , Solar Energy Materials and Solar Cells 94 (5) (2010) 850856. 25 52. Vitanov P, Harizanova A, Ivanova T, Т. Dimitrova, Chemical deposition of Al2O3 thin films on Si substrates, THIN SOLID FILMS 517 (23) (2009) 63276330. (11 бр.) 346. Kaian Yao, Deqian Huang, Bolei Xu, Na Wang, Yingjie Wang and Shuping Bi,”A sensitive electrochemical approach for monitoring the effects of nano-Al2O3 on LDH activity by differential pulse voltammetry”, Analyst, 135 (1) (2010) 116-120 347. Limnonthakul P., Pokaipisit A., Limsuwan P., “Ultra-thin Al2O3 formation at room temperature”, Advanced Materials Research 93-94 (2010) 113-116. 348. Alexieva, Z.I., Nenova, Z.S., Bakardjieva, V.S., Milanova, M.M., Dikov, Hr.M..“Antireflection coatings for GaAs solar cell applications”, Alexieva, Z.I., Nenova, Z.S., Bakardjieva, V.S., Milanova, M.M., Dikov, Hr.M. Journal of Physics: Conference Series 223 (1), art. no. 012045, (2010) 349. “ Multi-walled carbon nanotubes decrease lactate dehydrogenase activity in enzymatic reaction “, Zhang, F., Wang, N., Kong, J., Dai, J., Chang, F., Feng, G., Bi, S., (2011), Bioelectrochemistry ,82 (1), pp. 74-78 350. “Effects of post-deposition annealing temperature and time on physical properties of metal-organic decomposed lanthanum cerium oxide thin film”, Lim, W.F., Cheong, K.Y., Lockman, Z., (2011), Thin Solid Films , 519 (15), pp. 5139-5145 . 351. “Role of hydrogen in the surface passivation of crystalline silicon by sputtered aluminum oxide”, Li, T.-T.A., Cuevas, A., (2011), Progress in Photovoltaics: Research and Applications, 19 (3), pp. 320-325. 352. “Optical and passivating properties of sol-gel derived silica and titania coatings on textured monocrystalline silicon”, Petersson, A.M., Lindberg, P., Boström, T., Conference Record of the IEEE Photovoltaic Specialists Conference , art. no. 6186556 , pp. 002918-002923, ( 2011). 353. “ Influence of post-deposition annealing on metal-organic decomposed lanthanum cerium oxide film “, Lim, W.F., Lockman, Z., Cheong, K.Y. , 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts , art. no. 6088283 , pp. 24-27 , (2011). 354. “Metal-oxide-semiconductor characteristics of lanthanum cerium oxide film on Si “,Lim, W.F., Lockman, Z., Cheong, K.Y. , Applied Physics A: Materials Science and Processing 107 (2) , pp. 459-467 , (2012). 355. “ Surface passivation of c-Si by atmospheric pressure chemical vapor deposition of Al 2O3 “, Black, L.E., McIntosh, K.R. , Applied Physics Letters 100 (20) , art. no. 202107,( 2012). 356. “Preparation and characterisation of Ag incorporated Al 2O 3 nanocomposite films obtained by sol-gel method “, Ivanova, T., Harizanova, A., Koutzarova, T., Vertruyen, B. Crystal Research and Technology 47 (5) , pp. 579-584, (2012). 53. Vitanov, P., Goranova, E., Stavrov, V., Ivanov, P., Singh, P.K., Fabrication of buried contact silicon solar cells using porous silicon, SOLAR ENERGY MATERIALS AND SOLAR CELLS 93 (3), pp. 297-300, 2009. ( 6 бр.) 357. Avi Shalav, Photovoltaics literature survey (No. 69), Progress in Photovoltaics: Research and Applications, Volume 17 Issue 3, Pages 211 – 215,(2009). 358. P.N. Vinod,”Specific contact resistance and metallurgical process of the silverbased paste for making ohmic contact structure on the porous silicon/p-Si surface of the silicon solar cell, J Mater Sci: Mater Electron (2010) 21:730–736. 26 359.”Green nanotechnology of trends in future energy”, Guo, K.W. 2011 Recent Patents on Nanotechnology 5 (2), pp. 76-88 ,2012. 360. “Fabrication and characterization of black polycrystalline silicon”, Liu, B.-W., Xia, Y., Liu, J., Li, C.-B. 2011 Beijing Keji Daxue Xuebao/Journal of University of Science and Technology Beijing 33 (5), pp. 619-622 . 361. „Modification of porous silicon formation by varying the end of range of ion irradiation Ow, Y.S., Liang, H.D., Azimi, S., Breese, M.B.H. (2011), Electrochemical and SolidState Letters 14 (5), pp. D45-D47. 362.” Specific contact resistance and metallurgical process of the silverbased paste for making ohmic contact structure on the porous silicon/p-Si surface of the silicon solar cell”, Vinod, P.N. (2010), Journal of Materials Science: Materials in Electronics 21 (7) , pp. 730-736 54. Z. Nenova, P.Vitanov, St. Kanev, “Temperature behavior of the spectral response: a new approach for silicon solar cell characterization” JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.11, (2009), p.1487 ( 1 бр.) 363. Wiley InterScience:Progress in Photovoltaics: Research and Applications v.18 Issue 2, p 151-154, Literature Surveys, Photovoltaics literature survey (No. 76), School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia Santosh Shrestha, Published Online: Feb 23 2010 9:19AM, DOI: 10.1002/pip.970 55. P. Vitanov, A. Harizanova, T. Ivanova, Ch. Trapalis, N. Todorova, ”Sol – Gel ZrO2 and ZrO2-Al2O3 Nanocrystalline Thin Films on Si as high –k Dielectrics , MATERIALS SCIENCE AND ENGINEERING B: SOLIDSTATE MATERIALS FOR ADVANCED TECHNOLOGY, (2009),165 (3), pp. 178-181. ISSN:0921-5107 ( 5 бр.) 364 . “ Effect of annealing temperatures on properties of sol-gel grown ZnO-ZrO 2 films”, Ivanova, T., Harizanova, A., Koutzarova, T., Vertruyen, B., Crystal Research and Technology 45 (11) , pp. 1154-1160, (2010). 365.” Deposition and post-deposition annealing of thin Y2O3 film on n-type Si in argon ambient”, Quah, H.J., Cheong, K.Y.,(2011), Materials Chemistry and Physics, 130 (3), pp. 1007-1015. 366. “Effects of post-deposition annealing temperature and time on physical properties of metal-organic decomposed lanthanum cerium oxide thin film”, Lim, W.F., Cheong, K.Y., Lockman, Z., Thin Solid Films 519 (15), pp. 5139-5145, (2011). 367. “Phase transition and microstructural changes of sol-gel derived ZrO 2/Si films by thermal annealing: Possible stability of tetragonal phase without transition to monoclinic phase ‘, Hwang, S.M., Choi, J.H., Lee, S.M., Lim, J.H., Joo, J. , Journal of Physical Chemistry C 116 (20) , pp. 11386-11392 , (2012). 368. “Metal-oxide-semiconductor characteristics of lanthanum cerium oxide film on Si”, Lim, W.F., Lockman, Z., Cheong, K.Y. , Applied Physics A: Materials Science and Processing 107 (2) , pp. 459-467 , (2012). 27 56. Milanova M., Kakanakov R., Koleva G., Arnaudov B., Evtimova S., Vitanov P., Goranova E., Alexieva Z. , “Incorporation of nitrogen in melt grown GaAs,“ Journal of Optoelectronics and Advanced Materials, 11 (10), pp. 14711474, ISSN:14544164 (2009) ( 1бр.) 369. „Properties of GaAsN layers grown from melt containing Li3N as flux for enhancing nitrogen dissolution Das, S.K., Das, T.D., Dhar, S. (2011), Semiconductor Science and Technology 26 (8), art. no. 085028 57. M. Milanova, G. Koleva, R. Kakanakov, P. Vitanov, Z. Alexieva, E. Goranova, B. Arnaudov, S. Evtimova, C. Barthou and B. Clerjaud J. PHYS.: CONF. SER. 223 012016 ,ISSN: 1742-6596, (2010) ( 1бр.) 370. S. K. Das, T. D. Das and S. Dhar, Properties of GaAsN layers grown from melt containing Li3N as flux for enhancing nitrogen dissolution, Semicond. Sci. Technol. 26 (2011) 085028 (5pp) 58. Vitanov P., Tyutyundzhiev N., Stefchev P., Karamfilov B. Low cost multilayer metallization system for silicon solar cells (1996) SOLAR ENERGY MATERIALS AND SOLAR CELLS, 44 (4) , pp. 471-484. (3бр.) “ The investigation of plating technologies for front fingers of c-Si solar cells”, Sun, S., Long, J., Zhang, B., ( 2012), Advanced Materials Research 512-515 , pp. 198-201 . 372. “A novel two step metallization of Ni/Cu for low concentrator c-Si solar cells”, Chaudhari, V.A., Solanki, C.S., 2010, Solar Energy Materials and Solar Cells 94 (12) , pp. 2094-2101. 373 .”Electroplated metallization method for crystalline silicon solar cells, Gao, J., Li, M., Mao, D., (2010),Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP, (2010),art. no. 5582336 , pp. 310-313 371. II. ЦИТАТИ В ПАТЕНТИ 59. Agostinelli G; Szlufcik J; Vitanov P, Harizanova A. “Surface passivation of semiconductor solar cell e.g. silicon solar cell involves spin-coating a binary oxide system of aluminum oxide and metal/metalloid oxide that enhances tetrahedral structure of aluminum oxide at the solar cell surface” PATENT NUMBER(S): EP1489667-A2; US2005022863-A1; US76594752,(2005)Assignee:INTERUNIV MICRO-ELECTRONICA CENT VZW. (4бр) 374. “Method for manufacturing silicon solar cell, involves preparing silicon substrate and depositing dielectric layer on external surface of silicon substrate by sequential gas phase deposition “Assignee: INST SOLARENERGIEFORSCHUNG GMBH , Inventor(s): SCHMIDT J , 2009-J17348, DE102007054384-A1; WO2009062882-A2. 28 375. “Photovoltaic material fabrication involves forming crystalline material having worm hole structures overlying semiconductor substrate, and subjecting crystalline material to hydrogen plasma species to occupy worm hole structures “, SILICON CHINA HK LTD, SILICON CHINA LTD , Inventor(s): CHAN Y C, CHEUNG N W, CHAN C 2008-E61405, WO2008033859-A1; US2008105301-A1. 376. “Photovoltaic device e.g. solar cell, has intrinsic back surface passivated layer disposed adjacent to lightly doped crystalline substrate, where passivated layer includes amorphous or microcrystalline semiconductor material “,GENERAL ELECTRIC CO, MANIVANNAN V, EBONG A U, et. al , Inventor(s): MANIVANNAN V, HUANG J J, JOHNSON J N, et. al, 2007-103640, EP1722419-A1; US2006255340-A1; JP2006319335-A; 377. Venkatesan Manivannan, Abasifreke Udo Ebong, Jiunn-Ru Jeffrey Huang, Thomas Paul Feist, James Neil Johnson,” Surface passivated photovoltaic devices”, Patent N US 7,375,378 B2, May 20, 2008. 60. G Agostinelli, J Szlufcik, P Vitanov, A. Harizanova - US Patent US 7,659,475 B2, Feb.9, 2010, “Method for backside surface passivation of solar cells and solar cells with such passivation”. (1 бр) 378. JJ Xu. “Methods of forming integrated circuits”, US Patent 7,939,353, (2011). III. ЦИТАТИ В ДИСЕРТАЦИИ: 61. Vitanov P., Delibasheva M., Goranova E., Angelov Ch., Dimov V., Structure and morphological studies of thin porous silicon layers, (2000) VACUUM, 58 (2), pp. 351-357 . (2 бр) 379. (2006) Polymerization in Confined Geometries PETRIE, RANDALL JAMES. Polymerization in Confined Geometries. (Under the direction of Professors Christopher B. Gorman and Jan Genzer) The work presented in this PhD thesis is centered on nanometer-sized pores. Two detailed objectives include: 1) ... [www.lib.ncsu.edu/.../etd-05022006-162454] 380. Polymerization in confined geometries Thesis (Ph.D.). (2005)North Carolina State University. Includes vita. Includes bibliographical references. [www.lib.ncsu.edu/.../etd.pdf] 29