Pipeline ADC - Hong Kong University of Science and Technology

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Lecture 4
Pipeline ADC
George Yuan
Hong Kong University of Science and Technology
Fall 2010
© George Yuan, HKUST
1
Outline
• Pipeline ADC
– MDAC
– Comparator
• Sample and Hold
• Calibration
– Linear
– Nonlinear
© George Yuan, HKUST
2
Applications
Signal Frequency
MHz Range
10-14 bits
Flash
Folding
Pipeline
Σ-Δ
Resolution
Communication, digital camera/video
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3
Quantization + Amplification
4-bit Flash
Vref
Vr14
Vr12
Vr10
Vin
1000
Vr8
Two-Step ADC
Vref
×4
Vr3
Vref
Vr3
Vi,i+1=4×(Vo,i-Vr)
10
Vr2
Vr2
Vr1
Vr1
Vr6
Vr4
Vr2
Vr1
0
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00
0
0
4
Pipeline ADC
High throughput
Long latency
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5
1-bit MDAC
Algorithmic ADC:
Ideal transfer function:
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6
MDAC Cascade
bi-1
Vi-2
2-bit
MDAC
Vi-2
Vi
bi-1, bi
00
0
01
Vref
2
0
-
Vref
2
-
Vref
4
Vref
4
-
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Vref
2
Vref
2
7
Non-ideal 1-bit MDAC
Ideal transfer function:
Sub-ADC threshold variation:
Can’t be recovered by
following stages
Vth
Vth
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1. No tolerance on threshold voltage;
2. Flash ADC power consumption is high
8
Over-ranging
bi-1
Vi-2
Vi-2
2-bit
MDAC
Vi
bi-1, bi
0
0
Vref
2
-
Vref
2
-
Vref
4
Vref
4
-
© George Yuan, HKUST
Vref
2
Vref
2
9
MDAC with Redundancy
Ideal transfer function:
Sub-ADC threshold variation:
Can still be recovered
by following stages
1. tolerance on threshold voltage;
2. Flash ADC power consumption reduced
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10
1.5-bit MDAC
ø2
Vres(i)
Cf
ø1
ø1
Cs
ø2 ø1a
Comp2
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Code Gen
Comp1
-0.5Vr
0
Vres(i+1)
ø1
+0.5Vr
11
1.5-bit MDAC @ phase 1
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12
1.5-bit MDAC @ phase 2
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13
Ideal 1.5-bit MDAC Transfer
Function
Vin < Vth1= -1/8 Vref,
-1/8Vref=Vth1<Vin<Vth2=+1/8Vref,
Vin>Vth2=+1/8Vref,
00
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01
Di=00, Vdac=-0.5Vref
Di=01, Vdac=0
Di=10, Vdac=+0.5Vref
10
14
ADC with Redundancy
Vn
V1
Vi
STn
ST2
ST1
D2
D1
Dn
Digital Error Correction
Dadc
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15
Digital Error Correction
Shift addition:
pipeline output (D11, D12) (D21, D22), (D31, D32),….,(Dn1, Dn2)
D11 D12
D21 D22
D31 D32
+
….
Digital code
For example:
If the input signal is -0.5Vref: final code 0
If the input signal is 0.5Vref: final code (1111111….10)
If the input signal is 0:
final code (100000…00)
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16
DEC Example
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17
Error Cascading Effect
1. Accuracies of the MDACs at the front of the pipeline are more significant
2. More power for the front MDACs
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18
Multi-bit MDAC
00 01 10 11
000 010
100 110
001 011 101
Vo
Vo
1
Vref
2
-
1
Vref
2
1
Vref
2
Vi
-
1
Vref
2
Vi
1
Vref
2
1
Vref
2
-
1
Vref
2
-
1
Vref
2
1
Vref
16
Resolved bits: M
Codes: C = 2M+1-1
Threshold levels: L = C-1 = 2M+1-2
Threshold tolerance: Vref/2M+2
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3
Vref
16
5
Vref
16
19
Multi-bit MDAC Circuits
ø2
Cf
ø1
ø1
Cs
Vres(i)
ø1
V2
V1
ø2
ø2
b2
+0.5Vrb1
-0.5Vr 0
-0.5Vr 0
Cs
b0
+0.5Vr
ø1a
ø1
ø1
ø2
Vres(i+1)
Cs
V0
Vo = 4Vi – V0 – V1 – V2
-0.5Vr 0 +0.5Vr
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20
Thresholds and Codes
Vo = 4Vi – V0 – V1 – V2
Code
b2
b1
b0
V2
V1
V0
Thresholds
6
1
1
1
0.5Vr
0.5Vr
0.5Vr
3/8Vr
5
1
1
0
0.5Vr
0.5Vr
0
2/8Vr
4
1
0
0
0.5Vr
0
0
1/8Vr
3
0
0
0
0
0
0
0
2
-1
0
0
-0.5Vr
0
0
-1/8Vr
1
-1
-1
0
-0.5Vr
-0.5Vr
0
-2/8Vr
0
-1
-1
-1
-0.5Vr
-0.5Vr
-0.5Vr
-3/8Vr
© George Yuan, HKUST
21
OTA Speed
Cf
Cs
Cl
t settling  10 
10
10
1

 Ts
2f c 3dB 2    GBWo 4
For example:

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1
4
  GBWo 
20

fs
GBWo  26 f s
22
Subtraction Accuracy
ø1
1. Settling error
2. Charge injection
3. Clock feedthrough
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Vi
ø1
ø1a
Q
23
Gain Accuracy
Cf
Cs
Vos
Vr
Ideal gain: A =
A
Cl
Cs
Cf
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Real gain?
24
Finite Amplifier
Capacitor Mismatch
Cs  C f
Cs  C f
Cs
V
V 
V 
Vo 
C s  C f os
Cs  C f r
Cs  C f i
Cf 
Cf 
Cf 
A
A
A
Vo
For 12-bit ADC
A?
c ?
Vi
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25
Noise
Rs1 vns1
vncf
Rs2 vns2 vncs
vns3
Rs3
Rs2 vns2 Cf
Rs1
Cs
vns1
vna
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2
vncf

kT
Cf
2
vncs

kT
Cs
1
1
1

Rs1  Rs 2 
sC f
sC s sC f
Vo s  
Vs1 
Va  Vs 2
1
1
Rs1 
Rs1 
sC s
sC s
Rs 2 
vno
2
vno
Cl
2
2
 C f  Cs

 Cf

 2  Cs  2
2
 vncs  vncf
 vna  

Cf 



 C f  Cs

 Cf

 kT
 2  Cs
 vna  
 1
Cf
Cf




2
26
Power Scaling
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Gain Error
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Recovery: Analog and Digital
Vin
Din
MDAC
Vres
Dres
Back-end
ADC
b
Digital recovery:
Di = Dres + B×A
Analog recovery:
Vi =
=
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Vres
+ Vth,b
A
1
( Vres+ AVth,b )
A
29
Code Gap
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30
Self-Calibration
Vi
×A
Σ
SHA
Sub-ADC
Sub-DAC
Vo
Vr
D Dcal = D + 1
Analog input Vi:
Digital code D
Vo1
Digital code D+1
Vo2
Code gap = Vo2 – Vo1
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31
Dynamic Comparator
Vref+
2
Vi+
2a
1
Vcm
Vi-
C1
2
C2
2
C2
1
Vcm
Vx+
Pre-amp
Latch
D
Vx-
C1
2
C1
Vref
Vr =
C2 + C1
2a
Vcm
Vref© George Yuan, HKUST
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ADC Timing
Vref+
ø2
Vi
ø1
ø1
Vcm
ø1
Vi-
-0.5Vr 0 +0.5Vr
MDAC1 Sampling
COMP1 Converting
C1
2a
Vcm
1
Vo
ø1a
Code Gen
Comp2
Vi+
Cs
ø2
Comp1
2
Cf
2
2
1
Vref-
C2
Vx+
Pre-amp
C2
C1
2
2a
Vcm
MDAC1 Sampling
COMP1 Converting
MDAC1 Amplifying
COMP1 Precharging
MDAC2 Sampling
COMP2 Converting
MDAC2 Amplifying
COMP2 Precharging
MDAC2 Sampling
COMP2 Converting
MDAC3 Sampling
COMP3 Converting
MDAC3 Amplifying
COMP3 Precharging
© George Yuan, HKUST
D
Vx-
MDAC1 Amplifying
COMP1 Precharging
1
Latch
2
33
Pipelined Output
half
cycle
MDAC1
MDAC2
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MDAC
n-1
MDACn
34
Outline
• Pipeline ADC
– MDAC
– Comparator
• Sample and Hold
• Calibration
– Linear
– Nonlinear
© George Yuan, HKUST
35
Sample-and-Hold
Vi
Rs
Vs
fs
Input bandwidth:
f 3dB
1

2Rs C


Vs  Vi 1  e 


t
Acquisition time:
Switch noise:
© George Yuan, HKUST
2
vns
C
kT

C




  Rs C
Settling
Error

10%
2.3
1%
4.6
.1%
6.9
.01%
9.2
.001%
11.5
.0001%
13.8
36
Aperture Time Accuracy
t =
Vsig
t1
Ts
For sinusoidal signal (a, fsig):
Vsig
trise
Vclk
t2
 a

d 2 dB   20 log
f sig t rise 
 Vclk

trise=100ps, Vclk=1.2V, a=200mV, fsig=100MHz
d2 = -45.6dB
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Differential Sampling
Vi+
Rs1
Vs+
fs
C1
 1 k a

d 2 dB   20 log
f sig t rise 
 1  k Vclk

k: matching parameter
Vi-
Rs2
fs
C2
  a

d 3 dB   40 log
f sig t rise 
 2 Vclk

Vstrise=100ps, Vclk=1.2V, a=200mV, fsig=100MHz
if k=1, d3 = -97.3dB
if k=0.9, d2 = -71.2dB
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38
Bootstrap
Vclk doubles, distortion reduces 6dB
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39
Signal Dependent Bootstrap
On-resistance, on-moment are constant
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40
Signal Dependent Bootstrap
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41
Low Signal Feedthrough Switch
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42
Double-buffered SHA
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43
Feedback SHA
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44
Fully-differential SHA
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45
SHA-less
• 1st MDAC sampling
aperture error
• MDAC and flash
sampling network
match
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46
Extra Clock Phase
• No matching is
required
• Good for higher
sampling accuracy
• 1 extra clock phase
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47
Outline
• Pipeline ADC
– MDAC
– Comparator
• Sample and Hold
• Calibration
– Linear
– Nonlinear
© George Yuan, HKUST
48
Digital Calibration Concept
Vn
V1
Vi
STn
ST2
ST1
D2
D1
Dn
Real-time Digital Recovery
Dadc
• DEC does not work because MDAC gain is not 2
• More accurate digital recovery, e.g. Di = Dres + A·Di+1
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49
MDAC Error Model
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50
Reference Error Removal
  Vx / VR 2  e2  (Vn / VR1  e1 ) N
 (e ADC  GD1VR1  GD1Vn N ) / VR 2  e2
 (Vn / VR1  e1 ) N
• Correlation-based
• N is a random
sequence
• On average,  = 0
VR1 = VR2/GD1
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51
Reference Dithering
Dout  2   1   1   Vin
 VREF  PN  Vcal 1   1   1   
• Obtain the reference
error
• Subtract from the
digital signal
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52
Digital Error Model Adaptation
• Guess error
parameters
• Recover a rough
output
• Compare with an
accurate channel
result
• Adapt the error
parameters
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53
Open-Loop MDAC
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54
Third-order Distortion Estimation
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55
Gain Distortion Model
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56
mth-order Gain Distortion
Compensation
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Gain Distortion Compensation
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References
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
14.
R. van de Plassche, Integrated Analog-to-Digital and Digital-to-Analog Converters, Kluwer, 2003
D. Johns, and K. Martin, Analog Integrated Circuit Design, Wiley, 1997
B. Song, S. Lee, and M. Tompsett, “A 10-bit 15MHz recycling two-step A/D converter”, IEEE J. Solid-State Circuits, Vol. 25, pp. 1328-1337,
Dec. 1990
A. Dingwall, and V. Zazzu, “An 8MHz CMOS subranging 8-bit A/D Converter”, IEEE J. Solid-State Circuits, Vol. SC-20, pp. 1138-1143,
Dec. 1985
B. Brandt, and J. Lutsky, “A 75mW, 10-b, 20MSPS CMOS subranging ADC with 9.5 effective bits at Nyquist”, IEEE J. Solid-State Circuits,
Vol. 34, pp. 1788-1795, Dec. 1999
D. Cline, and P. Gray, “A Power Optimized 13-b 5 Msamples/s pipelined analog-to-digital converter in 1.2um CMOS”, IEEE J. Solid-State
Circuits, Vol. 31, pp. 294-303, Mar. 1996
I. Mehr, and L. Singer, “A 55mW 10bit 40Msample/s Nyquist Rate CMOS ADC”, IEEE J. Solid-State Circuits, Vol. 35, pp. 318-325, Mar.
2000
B. Lee, B. Min, G. Manganaro, J. Valvano, “A 14-b 100MS/s Pipelined ADC with a Merged SHA and First MDAC”, IEEE J. Solid-State
Circuits, Vol. 43, pp. 2613-2619, Dec. 2008
U. Moon, B. Song, “Background digital calibration techniques for pipelined ADCs”, IEEE Trans. Circuits & Systems II, Vol. 44, pp. 102-109,
Feb. 1997
J. Ming and S. Lewis, “An 8-bit 80-Msample/s pipelined analog-to-digital converter with background calibration,” IEEE J. Solid-Sate
Circuits, vol. 36, pp. 1489–1497, Oct. 2001.
Yun-Shiang Shu, and Bang-Sup Song, “A 15-bit Linear 20-MS/s Pipelined ADC Digitally Calibrated With Signal-Dependent Dithering”
IEEE J. Solid-Sate Circuits, VOL. 43, NO. 2, FEBRUARY 2008, pp. 342–350
Xiaoyue Wang, Paul J. Hurst, and Stephen H. Lewis “A 12-Bit 20-Msample/s Pipelined Analog-to-Digital Converter With Nested Digital
Background Calibration ” IEEE J. Solid-Sate Circuits, VOL. 39, NO. 11, NOVEMBER 2004 pp.1799–1808
Boris Murmann, Bernhard E. Boser, “A 12bit 75MS/s pipelined ADC Using Open-loop Residue Amplification,” IEEE J. Solid-State Circuits,
vol. 38, no.12, pp.2040-2050, Dec 2003
A. Panigada, and I. Galton, “A 130mW 100MS/s Pipelined ADC with 69dB SNDR Enabled by Digital Harmonic Distortion Correction”,
IEEE J. Solid-State Circuits, vol. 44, no.12, pp.3314-3328, Dec. 2009
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