Proceedings of Scanning Probe Microscopy-2004

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Proceedings of Scanning Probe Microscopy-2004.
Nizhny Novgorod. May 2 - May 6. 2004.
CONTENTS
ORAL SESSIONS
AFM of nanostructures: growth and fabrication.
A.V.Latyshev, D.V.Sheglov, E.E.Rodyakina, S.S.Kosolobov, D.A.Nasimov
Institute of Semiconductor Physics SB RAS, Novosibirsk
Quantitative Kelvin potential microscopy in force and force gradient.
A.N.Titkov, P.Girard1, M.Ramonda2, A.V.Ankudinov, Ph.Cadet1, B.G.Koshaev3
Ioffe Institute, St.Petersburg, Russia
1LAIN (UMR CNRS), 2LMCP, University of Montpellier, Montpellier, France
3Electrotechnical University, St.Petersburg, Russia
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Scanning Kelvin probe microscopy observation of the minority carriers escape from the active region of
injection semiconductor laser diodes.
A.V. Ankudinov1, V.P. Evtikhiev1, B.G. Koshaev2, D.K. Nelson1, A.S. Shkolnik1, and A.N. Titkov1.
1Ioffe Institute, St Petersburg, Russia
2Electrotechnical University, St Petersburg, Russia
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Semiconductor nanostructures and doping atoms analyzed at the atomic scale by cross-sectional
scanning tunneling microscopy. P.M.Koenraad, P.Offermans, A.Yakunin, J.H.Wolter.
eiTT-COBRA, Eindhoven University of Technology, The Netherlands.
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Ferroelectric Domain Kinetics Induced by Chemical Etching: New Effect Discovered in LiNbO3 and
Studied by SPM.
Vladimir Ya. Shur, Alexei I. Lobov, Alexander P. Chernykh, Alevtina G. Shur. Ural Center for Shared Use
“Scanning Probe Microscopy”, Ural State University, Ekaterinburg, Russia.
Sunao Kurimura, Kazuya Terabe, Xiaoyan Liu, Kenji Kitamura
Advanced Material Laboratory, National Institute for Materials Science, Tsukuba-shi, Japan
Yoshiyuki Nomura
Tokyo University of Science, Tokyo, Japan
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Atomic scale characterization of adsorption and growth of noble metal films on the GaN(0001) surface.
R. Z. Bakhtizin1, K.-H. Wu2, Q.-Z. Xue2, T. Nagao2 and T. Sakurai2
1Department of Physical Electronics, Bashkir State University, Ufa 450074, Russia
2Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan
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Investigation of isolated electron traps in thin dielectric films and nanoclusters of non-conducting material.
F.I.Dalidchik, M.V.Grishin, N.N.Kolchenko, S.A.Kovalevskii.
Semenov Institute of Chemical Physics PAS
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Investigation of the electronic properties of the Zr nanoclusters in the YSZ films by Combined STM/AFM.
D.A.Antonov, O.N. Gorshkov, A.P. Kasatkin, G.A.Maximov, D.A.Saveliev, D.O.Filatov.
Research and Educational Center for Scanning Probe Microscopy,
University of Nizhny Novgorod, Russia.
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Shape of Isolated Ferroelectric Micro- and Nano-domains in Lithium Niobate and Lithium Tantalate.
V.Ya. Shur, E.I. Shishkin, E.V. Nikolaeva, A.P. Chernykh, A.G. Shur
Ural Center for Shared Use “Scanning Probe Microscopy”, Ural State University, Ekaterinburg, Russia
S. Kurimura, K. Terabe, K. Kitamura
Advanced Material Laboratory, National Institute for Materials Science,
Tsukuba-shi, Japan
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Surface morphology SFM investigations of pancreatic b-cells with and without apoptosis promoter
treatment.
L.V.Kukharenko1, H. Fuchs2, G.K.Ilyich1, V.G.Leshchenko1, R.I.Gronskaya3
1 Belorussian State Medical University, Minsk, Belarus
2Westfalische Wilhelms-Universitat, Munster, Germany
3Institute of Physiology, Minsk, Belarus
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Surface morphology SFM investigations of pancreatic ?-cells with and without apoptosis promoter
treatment.
L.V.Kukharenko1, H. Fuchs2, G.K.Ilyich1, V.G.Leshchenko1, R.I.Gronskaya3
1 Belorussian State Medical University, Minsk, Belarus
2Westfalische Wilhelms-Universitat, Munster, Germany
3Institute of Physiology, Minsk, Belarus
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NanoFABs – as a nearest future for nanotechnology instruments for electronics.
Bykov V. A.
NT-MDT Co., Moscow, Zelenograd
pdf
Engineering the electronic structure of a pure 2D binary alloy.
L.Ottavianoa , C.Di Teodoroa, B.Resselb,c,e, K.C.Princeb,d, V.Chabe, S.Santuccia, S.Faccania,
G.Profetaa.
a) Unita INFM and Dipartimento di Fisica Universita degli Studi dell'Aquila, Coppito - L'Aquila, Italy.
b) Sincrotrone Trieste, Basovizza-Trieste, Italy
c) now at: TASC, INFM, Basovizza-Trieste, Italy
d) also at TASC, INFM, Basovizza-Trieste, Italy
e)Institute of Physics of the Academy of Science of the Czech Republic, Prague, Czech Republic.
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Characterization of individual carbon nanotube wetting by organic liquids.
Asa H. Barber, Sidney R. Cohen and H. Daniel Wagner.
Dept. of Materials and Interfaces & Chemical Research Support, Weizmann Institute of Science,
Rehovot, Israel
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STM study of vortex system in thin film superconductors.
A.Troyanovski1 , T. Nishizaki2, J. Aarts3, P.Kes3.
1Kapitza Institute for Physical Problems, Russian Academy of Sciences, Moscow, Russia,
2Institute for Materials Research, Tohoku University, Sendai, Japan
3Kamerlingh Onnes Laboratory, Universiteit Leiden, Leiden, The Netherlands
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Elastic properties of materials in the nm scale.
Y. Manassen1, R. Shneck2 and D. Barlam3.
Dept. of Physics1, Materials engineering2 and Mecanical engineering3, Ben Gurion University of the
Negev, Beer Sheva, Israel.
pdf
Scanning tunneling microscopy investigation of Si-based layer structures.
V.M.Kornilov, A.N.Lachinov.
Institute of Molecular and Crystal Physics of Ufa Research Center of RAS, Ufa, Russia
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Atomically resolved structure of InAs quantum dots grown on GaAs surfaces.
Y. Temko, T. Suzuki, M. C. Xu, K. Jacobi.
Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany.
pdf
New developments in NT-MDT microscope line.
Bykov V. A.
NT-MDT Co., Moscow, Zelenograd
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SPM-based methods for nanoscale studies of ferroelectrics.
Alexei Gruverman.
North Carolina State University, Raleigh, NC, USA
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STM detection of the precession of surface spin centers.
Y. Manassen1 and A. V. Balatsky2
Dept. of Physics1, Ben Gurion University of the Negev, Beer Sheva, Israel and Theoretical Division2, Los
Alamos National
Laboratory, Los Alamos, New Mexico, USA.
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Organized structures of magnetic nanoparticles investigated by scanning probe microscopy
V.V.Kislov1, Yu.V.Gulyaev1, I.V.Taranov1, V.V.Kashin1, V.M. Kozhevin2, D.A. Yavsin2, M.A. Zabelin2,
P.A. Tret’yakov2 and S.A. Gurevich2
1Institute of Radioengineering & Electronics, Russian Academy of Sciences, Moscow, Russia
2Ioffe Institute, Russian Academy of Sciences, St. Petersburg, Russia
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MFM studies of magnetic multilayers patterned using ion beams.
Sergej O. Demokritov, Vladislav E. Demidov, Dmitry I. Kholin, and Burkard Hillebrands
Fachbereich Physik and Forschungsschwerpunkt MINAS, Technische Universitat Kaiserslautern,
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Kaiserslautern, Germany
Spin polarized STM: Magnetic imaging and beyond.
W. Wulfhekel, U. Schlickum, H.F. Ding, J. Kirschner.
Max-Planck Institut fur Mikrostrukturphysik, Weinberg, Halle, Germany
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In situ magnetization reversal measurement of magnetic tips in a magnetic force microscope.
A. A. Bukharaev, D. A. Biziaev, P. A. Borodin, D. V. Ovchinnikov.
Zavoisky Physical Technical Institute of Russian Academy of Sciences, Kazan, Russia
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Observation of MFM tip induced remagnetization effects in elliptical ferromagnetic nanoparticles.
A.A.Fraerman, B.A.Gribkov , S.A.Gusev, V.L.Mironov, N.I.Polushkin, S.N.Vdovichev.
Institute for Physics of Microstructures RAS, Nizhny Novgorod, Russia
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Fluorescence Resonance Energy Transfer Scanning Near-field Optical Microscopy: from optical
superresolution to quantum computing.
S. K. Sekatskii, G. Dietler.
Laboratoire de Physique de la Matiere Vivante, IPMC, BSP, Ecole Polytechnique Federale de Lausanne,
Lausanne, Switzerland.
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SCANNING NEAR-FIELD THERMAL MICROSCOPY.
Heiderhoff R., Altes A., Phang J.C.H.*, and Balk L.J.
Bergische Universitat Wuppertal, Fachbereich Elektrotechnik, Informationstechnik, Medientechnik,
Wuppertal , Germany
*Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), National University of Singapore,
Singapore
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Scanning near-field optical microscopy and its applications in semiconductor investigation.
Pavel TOMANEK, Marketa BENESOVA, Dana OSTADALOVA, Pavel DOBIS.
Brno University of Technology, Faculty of Electrical Engineering and Communication Department of
Physics, Brno, Czech Republic
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Investigations of Optically Induced Mass Transport by Scanning Near-field Optical - and Atomic Force
Microscopy.
B. Stiller*, P. Karageorgieva, , Th. Geuea, M. Saphiannikova, N. Mechau, D. Neher.
Institute of Physics, University of Potsdam, Potsdam, Germany
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Apertureless near field optical microscopy and nanolithography.
Yu.E.Lozovik, A.V.Klyuchnik, S.P.Merkulova.
Institute of Spectroscopy, Moscow region, Troitsk, Russia
pdf
How Does Energy Dissipate? Discussion of Dynamic Force Measurements With Scanning Probe
Microscopes.
G.V.Dedkov.
Kabardino –Balkarian State University, Nalchik, Russia
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Tuning fork energy dissipation nanotribometry as option of AFM.
S.A. Chizhik1,2, H.-S. Ahn3, V.V. Chikunov1,2, A.A. Suslov2
1 Heat and Mass Transfer Institute of National Academy of Sciences of Belarus, Minsk, Belarus
2 Microtestmachines Co., Gomel, Belarus
3 Korea Institute of Science and Technology, Seoul, South Korea
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Study of the nanoscale contacts with the help of combine TEM-AFM technique and theoretical MD-TM
calculation.
D.Erts*, A.V.Pokropivny **, A.Lohmus ***, R. Lohmus***, H.Olin****, V.V.Pokropivny **
* Institute of Chemical Physics, University of Latvia, Riga, Latvia
**Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, Kiev, Ukraine
*** Institute of Physics, University of Tartu, Tartu, Estonia
**** Department of Engineering, Physics, and Mathematics, Mid Sweden University, Sundsvall, Sweden
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Novel SPM imaging modes: Torsional Resonance Mode Imaging and Scanning Electrochemical Potential
Microscopy.
S. Badger
Veeco Instruments
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Local anodic oxide properties characterization by using scanning probe microscopy techniques.
Lemeshko S.V.1 Mezin A.V.1 Saunin S.A.1
pdf
Roschin V.M.2 Shevyakov A.V.2 Gavrilov S.A.2
1. NT-MDT Co. 124460, Moscow,Zelenograd
2. Moscow institute of electronic engineering, Moscow, Zelenograd
SPM as key technology in nano-metrology at PTB.
T. Dziomba, L. Koenders, H.-U. Danzebrink, G. Dai, F. Pohlenz, G. Wilkening, H. Bosse.
Physikalisch-Technische Bundesanstalt, Bundesallee, Braunschweig, Germany
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POSTER SESSIONS
Influence of ordering and compositional modulation on the surface morphology and optical anisotropy of
InGaP/GaAs heterostructures.
N.V.BAIDUS, E.I.MALYSHEVA, YU.N.SAF’YANOV
Nizhniy Novgorod University
YU.N.DROZDOV
Institute for Physics of Microstructures, Nizhniy Novgorod, Russia
pdf
Correlations between the surface morphology and electronic properties of porous multilayer structures
with quantum InGaAs layers.
N.L.IVINA, L.K.ORLOV, V.B.SHEVTSOV.
Nizhny Novgorod State University, IPM RAS, Nizhny Novgorod, Russia
pdf
Electrical properties and surface morphology of amorphous silicon-germanium films ion-doped with
electrical-active impurities.
A.V.ERSHOV, A.I.MASHIN, Y.A.DUDIN, E.I.MALYSHEVA, S.E.NOVOZHILOV.
Physical Technical Research Institute, N.I. Lobachevsky State University of Nizhny Novgorod, Nizhny
Novgorod, Russia
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The new Au-induced reconstructed phases on the GaN(0001) surface.
A.I. ORESHKIN+, N.S. MASLOVA+, V.I. PANOV+, I.V. RADCHENKO+, KEHUI WU*, Q.Z. XUE*, T.
NAGAO* .
+Physical department, Moscow State University, Moscow, Russia. *Institute for materials Research,
Tohoku University, Sendai, Japan
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Peculiarities of local chemical structure of PS39 PEO61 block-copolymer surface studied by means of
AFM and XPS.
S.G.BYSTROV, A.A.SHAKOV.
Physicotechnical Institute UrB RAS, Izhevsk, Russia
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Determination of phase composition of titanium dioxide nanoceramics.
O.V.KARBAN, S.N.IVANOV*, E.N.KHAZANOV*, E.I.SALAMATOV**, O.M.KANUNNIKOVA.
Physical-Technical Institute of UrB RAS, Izhevsk, Russia; *Institute of Radioengineering and Electronics
of RAS, Moscow, Russia; **Advanced Materials” Research Center IzhGTU, Izhevsk, Russia
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Macroscopical and Nanoscale Photoelectric Properties of Organic Films Based on the Phthalocyanine
and Perylene Derivatives.
A.E.POCHTENNY, P.KARAGEORGIEV*, A.N.LAPPO, A.V.MISEVICH. Belarussian State University of
Technology, Minsk, Belarus. *University of Potsdam, Potsdam, Germany
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AFM and XPS investigations of silica films manufactured by sol-gel method and ion sputtering.
O.M.KANUNNIKOVA, S.F.LOMAYEVA, A.E.MURAVYEV.
Physical-Technical Institute UrB RAS, Izhevsk, Russia.
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AFM capabilities in investigating plasma polymerized films applied onto metal substrates.
A.M.LYAKHOVITCH, A.M.DORFMAN, M.A.SHIROBOKOV. Physicotechnical Institute, UrBr RAS,
Izhevsk, Russia
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Deposition of plasma-polymerized films. Mechanism study.
A.M. LYAKHOVICH, A.E. MURAVYOV, A.M. DORFMAN, M.A.SHIROBOKOV
Physical-technical institute UrB of RAS, Izhevsk, Russia
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AFM and XPS investigation of Pt-doped spin-on glass thin silica films deposited at 500C.
A.E. MURAVYEV, S.S. MIKHAILOVA, O.A. SHILOVA AND O.M. KANUNNIKOVA.
Physical-technical institute UrB of RAS, Izhevsk, Russia
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Temperature-induced Stacking of OPA Self-Assembled Bilayers
G.N.FONTES, R.L.MOREIRA, B.R.A.NEVES.
SPM Laboratory, Department of Physics, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil
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Morphological and adhesive properties of poly(5-amino–1-naphthol) ultrathin films.
C.P.L.RUBINGERa, R.L.MOREIRAa, L.A.CURYa, C.A.FERREIRAb, A.MENEGUZZIb, B.R.A.NEVESa .
aDepartamento de Fisica, ICEx, UFMG, Belo Horizonte,Brazil. bDepartamento de Materiais, UFRGS,
Porto Alegre, Brazil
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Study of mechanical properties of nanostructed polymer films by means of Scanning Force Spectoscopy.
GOLUTVIN I.A1., BOLCHAKOVA A.V2., KUROCHKIN I.N2., YAMINSKY I.V2.
1Institute for Theoretical and Experimental Physics, 2M.V. Lomonosov Moscow State University,
Moscow, Russia
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The software, hardware and technology peculiarities of STM for the nanosize particles dispersity control.
A.M.LIPANOV, S.R. KIZNERTCEV, P.V.GULYAEV, E.YU.SHELKOVNIKOV, A.V.TYURIKOV.
Institute of Applied Mechanics RAS, Izhevsk, Russia
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Method of obtaining the theoretical STM-spectra of ultradispersed particles.
A.M.LIPANOV, A.V.TYURIKOV, E.YU.SHELKOVNIKOV, P.V.GULYAEV, S.R.KIZNERTCEV.
Institute of Applied Mechanics RAS, Izhevsk, Russia
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Observation and Manipulation of As-grown Domain Structure in Pb5Ge3O11 Ferroelectric Single Crystal
by Scanning Probe Microscopy.
E.I.SHISHKIN, V.YA.SHUR.
Ural Center for Shared Use “Scanning Probe Microscopy”, Ural State University, Ekaterinburg, Russia.
F.SCHLAPHOF, L.M.ENG.
Institute of Applied Photophysics, University of Technology, Dresden, Germany
pdf
Surface Morphology and Ferroelectric Properties of PZT and PLZT Thin Films Crystallized by Rapid
Thermal Annealing and Laser Irradiation.
V.YA.SHUR, S.A.NEGASHEV, A.BARANNIKOV, A.CHERNYKH, I.BATURIN, D.KUZNETSOV.
Scanning Probe Microscopy Laboratory, Ural State University, Ekaterinburg, Russia.
V.P.VEIKO, K.KHIEU.
St.Petersburg State University of Information Technologies, Mechanics & Optics, Russia.
T.SCHNELLER, R.WASER.
IWE Rhein.-Westf. Technichen Hochschule Aachen, Aachen, Germany
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The investigation of the impurities influence during KDP crystals growth by Atomic Force Microscopy.
D.A.VORONTSOV, V.N.PORTNOV, D.O.FILATOV.
N.I.Lobachevsky State University of Nizhny Novgorod, N.Novgorod, Russia
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AFM based simulation of X-ray scattering.
V.L.MIRONOV, S.A.TRESKOV, O.G.UDALOV.
Institute for Physics of Microstructures, N.Novgorod, Russia
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Study of ion-exchanger granule surface by the method of scanning force microscopy.
A.N.ZYABLOV, E.G.BOUKHOVETS*, N.E.BEZRUKOV*, T.V.ELISSEEVA.
Voronezh State University, *”Voronezh-Aqua” Ltd, Voronezh, Russia
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Study of ultrafiltration polyimide membranes surface by the method of scanning probe microscopy.
A.N.ZYABLOV, *O.V.DYAKONOVA, *V.V.KOTOV, T.V.ELISSEEVA, V.F.SЕLЕMЕNЕV.
Voronezh State University, *Voronezh State Agricultural University, Voronezh, Russia
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AFM study of NaCl nanocrystals deposited from highly-disperse aerosol.
A.M.LOMONOSOV1,4, G.B.MESHKOV2, I.V.YAMINSKY1,3,4. 1A.N.Nesmeyanov Institute of
Organoelement Compounds RAS , 2Faculty of Physics, 3Faculty of Chemistry, Moscow State University,
4Advanced Technologies Center, Moscow, Russia
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A possibility for controlling the structure state of steels by means of atomic force microscopy.
A.N.MARATKANOVA, S.F.LOMAYEVA.
Physical-Technical Institute, UB RAS, Izhevsk, Russia
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Studies of plastic solar cells with SPM.
A.ALEXEEV1,2, M.M.KOETSE3, D.VELDMAN3, J.K.J. VAN DUREN, U.S.SCHUBERT1, J.LOOS1 .
1Laboratory of Macromolecular Chemistry and Nanoscience, Eindhoven University of Technology and
Dutch Polymer Institute, Eindhoven, The Netherlands, 2NT-MDT Co, Moscow, Russia, 3TNO Industrial
Technology, Eindhoven, The Netherlands.
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TEM-STM application for Si and Ge nanowires studies.
D.ERTS1, B.POLYAKOV1, E.SAKS, A.LOHMUS2, R.LOHMUS2, H.OLIN3, J.D.HOLMES4 .
1Institute of Chemical Physics, University of Latvia, Riga. 2Institute of Physics, University of Tartu, Tartu,
Estonia. 3Engineering, Physics and Mathematics, Mid Sweden University, Sundsvall, Sweden.
4Department of Chemistry, University College Cork, Ireland
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Magnetic Dissipation Microscopy of the low-coercivity magnetic films.
A.ALEXEEV1,2, D.BALABANOV3, S.NIKITOV3, A.POPKOV4 .
1NT-MDT Co, Moscow, Russia, 2Eindhoven University of Technology, Eindhoven, The Netherlands,
3Institute of Radio Engineering RAS, Moscow, Russia, 4FSUE Zelenograd Research Institute of Physical
Problems, Moscow, Russia
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On possibility of non-contact investigation into ferromagnetic nanoparticles using Josephson
magnetometer.
A.A.FRAERMAN, B.A.GRIBKOV, S.A.GUSEV, A.YU.KLIMOV, YU.N.NOZDRIN, G.L.PAKHOMOV,
V.V.ROGOV, S.N.VDOVICHEV. Institute for Physics of Microstructures, Nizhny Novgorod, Russia.
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Magnetic force microscopy to determine vorticity direction in elliptical Co nanoparticles.
A.A.FRAERMAN, B.A.GRIBKOV, S.A.GUSEV, A.YU.KLIMOV, V.L.MIRONOV, D.S.NIKITUSHKIN,
G.L.PAKHOMOV, V.B.SHEVTSOV, M.A.SILAEV, S.N.VDOVICHEV.
Institute for Physics of Microstructures, Nizhny Novgorod, Russia. L.BELOVA, K.V.RAO.
Royal Institute of Technology, Stockholm, Sweden
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Intermode Conversion in Al-Coated Near-Field Optical Fiber Probes.
M.I.BAKUNOV, S.B.BODROV.
University of Nizhny Novgorod, Nizhny Novgorod
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Image Analysis of Near-Field Emission of Two-Color Semiconductor Laser.
V.F.DRYAKHLUSHIN, K.P.GAIKOVICH, V.V.LEVICHEV*, V.P.MISHKIN* .
Institute for Physics of Microstructures RAS, *Nizhny Novgorod State University, Nizhny Novgorod,
Russia
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Deconvolution of Scanning Auger Microscopy and Scanning Electron Microscopy Images.
K.P.GAIKOVICH, V.F.DRYAKHLUSHIN, D.E.NIKOLICHEV*.
Institute for Physics of Microstructures RAS, *Nizhny Novgorod State University, Nizhny Novgorod,
Russia
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Investigation of the two-frequency laser diodes by Spectrum-Resolved Scanning Near-Field Optical
Microscopy.
D.O.FILATOV, G.A.MAXIMOV, V.P.MISHKIN, V.V.LEVICHEV, S.M.NEKORKIN*, S.V.MOROZOV**.
Research and Educational Center for Physics of the Solid State Nanostructures, University of Nizhny
Novgorod. *Physical Technical Research Institute, University of Nizhny Novgorod. **Institute for Physics
of Microstructure, Nizhny Novgorod, Russia.
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On the Noncontact Friction and Heat Transfer Between Nanostructures.
G.V.DEDKOV, A.A.KYASOV, E.G.DEDKOVA.
Kabardino –Balkarian State University, Nalchik, Russia
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Dissipated power inside of probing body nearby a noisy wall.
I.DOROFEYEV
Institute for Physics of Microstructures, N.Novgorod, Russia.
H.FUCHS
Westfalische Wilhelms-Universitat, Munster, Germany
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Theory of STM/STS of Thin Organic Films.
A.E.POCHTENNY, I.P.ILYUSHONOK, O.M.STUKALOV*.
Belarussian State University of Technology, Minsk, Belarus. *University of Guelph, Guelph, Ontario,
Canada
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In situ Transformations of Gold Contacts Studied by Molecular Dynamics Simulation.
A.V.POKROPIVNY*, A.LOHMUS**, R. LOHMUS**, D.ERTS***, V.V.POKROPIVNY*, H.OLIN****.
pdf
*Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, Kiev, Ukraine.
**Institute of Physics, University of Tartu, Estonia. ***Institute of Chemical Physics, University of Latvia,
Riga, Latvia. ****Department of Engineering, Physics, and Mathematics, Mid Sweden University,
Sundsvall, Sweden
Fractal based approaches to characterization of surface geometry
P.A.SHILYAEV, D.A.PAVLOV.
University of Nizhni Novgorod, Nizhni Novgorod, Russia
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Systematic characterization of SPM systems.
T.DZIOMBA, L.KOENDERS, H.-U.DANZEBRINK, G.WILKENING. Physikalisch-Technische
Bundesanstalt, Braunschweig, Germany
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The tip radius of probes for shear-force and near-field microscopes as determined by test samples and
deconvolution.
A.P.CHUKLANOV, A.A.BUKHARAEV.
Zavoisky Physical-Technical Institute RAS, Kazan, Russia
pdf
AFM-characterization of microlevers.
V.I.SHASHKIN, Е.А.VOPILKIN, N.V.VOSTOKOV, А.YU.KLIMOV, V.V.ROGOV, S.А.GUSEV.
Institute for Physics of Microstructures RAS, N.Novgorod, Russia
pdf
Electrical properties of DNA characterized by conducting-atomic force microscopy.
C.NOGUES1, S.COHEN2, S.DAUBE1, R.NAAMAN1. 1Dep. of Chemical Physics and 2Chemical
Research Support, Weizmann Institute, Rehovot, Israel.
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AFM studies of DNA networks on mica surface.
U.MALINOVSKIS1, A.PASTARE2, B.POLYAKOV2, I.MUIZNIEKS1, D.ERTS2 .
1Department of Biology, 2Institute of Chemical Physics, University of Latvia, Riga, Latvia
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AFM Investigation of Immunodiagnostic Assays for Hepatitis B Antigen Detection.
B.N ZAITSEV, I.V.YUDINA, A.N.KANEV.
State Research Center of Virology&Biotechnology "Vector", Koltsovo, Novosibirsk region, Russia
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Atomic force microscopy of blood cells of patients with hematological diseases
P.A.NAUMOV, B.N.ZAITSEV, I.B.KOVYNEV*, T.I.POSPELOVA*, M.I.LOSEVA*.
State Research Center of Virology&Biotechnology "Vector", Koltsovo, Novosibirsk region, *Medical
academy of Novosibirsk. Hematological Center, Novosibirsk, Russia
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Investigated of morphological change of Azotobacter chroococcum after heat shock by AFM.
Y.A.MATCKOVA1, L.N.OLUNINA1, Y.Y.GUSHINA2, T.A.GONCHAROVA1 .
1Department of biochemistry and physiology of plants, University of Nizhny Novgorod, 2Research and
Education Center for Physics of the Solid State Nanostructurs, University of Nizhny Novgorod, Russia
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The investigations of water regime influence on the collagen structure.
A.V.ZEVEKE1, J.R.A.PLOHOV1, Yu.GUSHINA2, A.N.ASHUTOV3 . 1Central research laboratory of
Nizhny Novgorod Medical Academy. 2Research and Educational Center for Scanning Probe Microscopy,
University of Nizhny Novgorod. 3Biophysical Department, University of Nizhny Novgorod, Russia
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Influence of methods of fixing on structural and morphological parameters of human cells of blood reveal
by scanning probe microscopy.
S.N.PLESKOVA1, YU.YU.GUSHINA2, M.B.ZVONKOVA3 . 1Microbiology and Immunology Department,
Nizhny Novgorod Medical Academy, 2Research and Educational Center for Scanning Probe Microscopy,
University of Nizhny Novgorod, 3Physiology and biochemistry of Human and Animal Department,
University of Nizhny Novgorod, Nizhny Novgorod, Russia
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Investigation of the influence of complement system on the various strains of Proteus by methods of
atomic force microscopy and luminol-dependent chemiluminescence.
S.N.PLESKOVA1, YU.YU.GUSHINA2, M.B.ZVONKOVA3 . 1Microbiology and Immunology Department,
Nizhny Novgorod Medical Academy,
2Research and Educational Center for Scanning Probe Microscopy, University of Nizhny Novgorod,
3Physiology and biochemistry of Human and Animal Department, University of Nizhny Novgorod, Nizhny
Novgorod, Russia
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Microwave Subsurface Temperature Control of Living Tissues.
G.M.ALTSHULLER, M.B.CHERNYAEVA, K.P.GAIKOVICH, V.L.VAKS.
Institute for Physics of Microstructures of RAS, Nizhny Novgorod, Russia
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