Supporting Information Electron-hole overlap dictates the hole spin relaxation rate in nanocrystal heterostructures Jun He, Haizheng Zhong, and Gregory D. Scholes* Department of Chemistry, Institute for Optical Sciences, and Centre for Quantum Information and Quantum Control, University of Toronto, 80 St. George Street, Toronto, Ontario M5S 3H6, Canada *Corresponding author: gscholes@chem.utoronto.ca Supplementary materials contains: page: i. Synthesis of core-shell NC samples. (2) ii. TEM images of samples (4) iii. Optical characterizations of NCs (5) iv. Time-resolved photoluminescence measurement (6) v. Experimental methods: CPH-3TG technique (8) vi. Determine electron transfer rate of type-II core-shell NCs with VVVV measurement (13) vii. Modeling of strain and band structure (14) viii. CPH-3TG measurements on samples with different surface ligands (15) 1 i. Synthesis of core-shell nanocrystal samples. Colloidal CdTe NCs were synthesized with a modified method based on the previous reports [Ref. 27]. Typically, a mixture of 0.0256 g (0.2 mmol) of CdO, 0.116 g (0.4 mmol) of tetradecylphosphonic acid (TDPA), and 10 mL of octadecene (ODE) was heated in a three-neck flask to 300 °C to obtain a clear solution. A Te solution, prepared by dissolving 0.1 mmol of Te powder in 0.5 mL trioctylphosphine (TOP) and 4 mL ODE, was quickly injected into the hot mixture. The reaction was allowed to cool to 260 °C, allowing further growth to the desired size. The ODE solution of as-prepared NCs was combined with an equal-volume mixture of hexane and methanol (1/2, v/v) by vigorous shaking and subsequent centrifugation. The ODE phase was then extracted. This procedure was repeated twice, and the final solution was purged with argon flow and stored in the dark. The shell growth was accomplished via a successive ion layer adsorption reaction (SILAR) method by alternating injections of Cd and Se precursors. The solutions of Cd and Se precursors were prepared at a concentration of 0.04 M in ODE. Cadmium precursor was prepared by dissolving 0.050 g CdO in 0.90 g oleic acid and 7.08 g ODE under argon flow at 240 °C. The solution was then cooled to room temperature and stored under argon in a septum capped conical flask. The Se precursor was prepared by shaking a mixture of 0.038 g Se powder (100 meshes), 1.55 g tributylphosphine (TBP) and 7.95 g ODE in a septum capped conical flask. It was then purged with argon flow and stored for further use. A typical procedure of shell growth is as follows. A fixed amount of purified CdTe quantum dots were added into a three necked flask containing a mixture of ODE (3 mL) and oleylamine (3 mL). The reaction flask was attached to a Schlenk line, and flowed with argon at room temperature to remove the residential hexane. The solution was then refluxed under vacuum at ~100°C for an additional 40-60 min to ensure complete removal of any low boiling point impurities. The solution was then purged three times with argon, and the temperature of the solution was increased to 240 °C. At this temperature, the Se precursor was added first, followed by the Cd precursor 5 min later. The reaction solution was allowed to react for up to 15 min before another layer of CdSe was applied. Between 1 and 5 monolayers of CdSe were grown for 2 this study. For the preparation of CdTe/0.5 layer CdSe sample, only Se precursor was added and the reaction lasted for 10 min. These resulting NCs were precipitated by adding acetone and re-dissolved in toluene for spectroscopic measurements. The asprepared NCs were further purified twice by precipitation with methanol and re-dispersed in toluene for transmission electron microscopy characterization. Sample characterization. Both morphology and size distribution of the NCs were examined using a CTEM Hitachi H-7000 operated at 100kV. Powder X-ray diffraction (PXRD) measurements were carried out on a Siemens D-5000 diffractometer using a high-power Cu Kα source operating at 50 kV and 35 mA with a Kevex solid-state detector. The one-photon absorption spectrum was measured on a CARY 100 Bio UVvisible spectrophotometer. The steady-state photoluminescence (PL) and photoluminescence excitation (PLE) spectra were collected with a CARY Eclipse fluorescence spectrophotometer. 3 ii. TEM images of samples Figure S_1: Typical TEM images of 3.4 nm CdTe cores (top left) and CdTe/CdSe core-shell NCs with shell thickness of 1.2 (top right), 1.6 (bottom left) and 2.0 nm (bottom right). Scale bar: 50 nm. 4 iii. Optical characterizations of NCs 2.0-nm shell Abs/PL/PLE (a.u.) 1.0 1.6-nm shell 0.8 1.2-nm shell 0.6 0.8-nm shell 0.4 0.4-nm shell 0.2-nm shell 0.2 Core 0.0 500 600 700 800 900 Wavelength (nm) Figure S_2: Absorption (solid lines), PL (dotted lines) and PLE (dashed lines) spectra of 3.4-nm CdTe cores and CdTe/CdSe core-shell NCs with shell thickness of 0.2, 0.4, 0.8, 1.2, 1.6, and 2.0 nm. Consecutive spectra are shifted vertically for clarity. 5 iv. Time-resolved photoluminescence measurement PL dynamics were measured by time-correlated single photon counting (TCSPC), using an IBH Datastation Hub system with an IBH 5000M PL monochromator and a R3809U50-cooled MCP PMT detector. The light source was a model 3950 picosecond Ti:sapphire Tsunami laser (Spectra-Physics), pumped by a Millenium X (Spectra-Physics) diode laser and frequency doubled using a GWU-23PL multiharmonic generator (Spectra-Physics). The excitation wavelength was 450 nm and experimental data were analyzed by least-squares iterative reconvolution of multiexponential decay function with two experimentally determined instrument response functions. The shortest event that the TCSPC experiment can resolve is estimated to ~70 ps. More details on the setup and kinetic data analysis can be found elsewhere [Ref. 31]. Table S_1: Values extracted from two exponent fits to lifetime data of CdTe cores, coreshell NCs with CdSe shell thickness of 0.2−2.0 nm. Sample Emission peak (nm) A 1 (%) τ 1 (ps) A 2 (%) τ 2 (ps) τ avg (ns) a core 624 12.8 9262 87.2 23330 21.53 0.2-nm shell 641 11.1 8498 88.9 25283 23.42 (23.25) 0.4-nm shell 676 64.2 22911 35.7 40485 29.20 (28.68) 1.2-nm shell 754 54.2 38936 45.8 23013 31.64 (31.27) 1.6-nm shell 774 63.7 70399 36.3 30850 56.06 (54.42) 2.0-nm shell 815 22.1 38951 77.9 101210 87.43 (84.85) a P P B B B B B B B B B B P P The values in parentheses are the monoexponential fitting results. 6 PL intensity (a.u.) -1 radiative decay rate (s ) pure core radiative decay rate integrated PL intensity 80 60 40 20 0 600 620 640 660 680 Wavelength (nm) Figure S_2a: Radiative decay rate determined around the steady-state PL emission peak for pure CdTe core 7 v. Experimental methods: CPH-3TG technique The experimental setup of cross-polarized heterodyne third-order transient grating technique (CPH-3TG) is depicted in Figure S3. The details of the setup have been described elsewhere [Ref. 22]. Each sample, a dilute solution of CdTe/CdSe core-shell NCs in toluene, was photoexcited in resonance with the CdTe exciton absorption band by ultrashort laser pulses at a 1 kHz repetition rate. A relatively narrow size distribution of core-shell NCs were resonantly excited, as determined by the laser spectrum (~30 nm full width at half maximum) at each excitation wavelength. Depending on the center wavelength of laser spectrum, pulse durations of 25–30 fs were obtained from 3-TG autocorrelation measurements using carbon tetrachloride at the sample position, Figure S3. To prevent any sample degradation, biexciton formation, or thermal grating contributions to the signal, the pulse energy was kept at less than 5 nJ/pulse. The intensities of both pump and probe beams were attenuated until the early time signal shape did not change. The linear absorption spectra were obtained before and after the pulsed laser irradiation; no measurable difference was observed, showing the high photostability of the CdTe/CdSe heterostructures in toluene solution. All of the measurements reported in the present work were performed at room temperature (293 K). PM1 E1, E2 E3, E LO B WP P1 E2 E LO , E sig B B B B L1 DO M1 E1 B B E3 B B B B B B B P2 CS C G WP L2 M2 P3 PD1 S PM2 PD2 Figure S_3: Experimental setup for heterodyne-detected 3-TG measurements: P, polarizer; L, lens; DO, diffractive optic; PM, parabolic mirror, WP, /2 waveplate; M, mask; CS, cover slip; S, sample; PD, photodiode; G, glass plate; C, chopper. 8 Intensity (a.u.) 0.03 Experimental Gauss fit Pulse width ( tFWHM=28 fs) 0.02 0.01 0.00 -400 -300 -200 -100 0 100 200 300 Time delay, tp (fs) Figure S_4: Homodyne-detected 3-TG autocorrelation measurements using carbon tetrachloride at laser wavelength of 633 nm, the dashed line is the Gaussian fitting curve. The CPH-3TG techniques use a sequence of three ultrafast laser pulses to initiate and probe dynamics. The probe step involves interrogation using the third pulse in the sequence, but the information is obtained in a fourth direction via a third-order polarization radiated by the sample. We measure that signal using heterodyne detection, which retrieves the sign of the linearized signal (cf. the comparison of VHVH and VHHV signals) and also simplifies kinetic analysis of the transients compared to homodynedetected data, where V and H represent the vertical and horizontal polarizations. Generally speaking, transient grating measures population decay, whereas polarization grating measures depolarization. A key result is that optical selection rules for quantum dot excitons, governed by both circularly and linearly polarized light, can be exploited in nonlinear optical experiments to examine the exciton fine structure of NCs, even though 9 these levels are completely obscured by inhomogeneous line broadening. The CPH-3TG signal can be written as I HET t p 0 dt Re E LO t p , 30,t p ,t C nC1 nC1 C nF1 n1F , (1) where E * LO (t p , Δφ) is the electric field of the local oscillator with phase shift relative to P PB B B B the probe field Δφ, and t p is the pump-probe delay time during which the excitons B B equilibrate among the fine structure states, recombine to the ground state, or are dissociated into surface traps. P (3) (0, t p , t) is the induced third-order polarization, and P P B B n C +1 (n C -1 ) and n F +1 (n F -1 ) are the populations of conserved and flipped excitons. The B PB P B PB P B PB P B PB P coefficients, C and C´, are rotational averaging factors that both take the value of 2/15 in a population grating experiment, for example when all three pulses and the signal analyzer are vertically polarized in the laboratory frame (VVVV). Therefore the VVVV signal decays only with population relaxation like a normal pump-probe experiment. On the other hand, when the pulses are cross-linearly polarized (producing a polarization grating), C and C´have values of 2/15 (-2/15) and -2/15 (2/15) for the VHVH (VHHV) polarization sequence respectively [Refs. 22,26]. The VVVV CPH-3TG data were fit by a sum of three-exponentials, IVVVV t p 1 exp k1 t p 2 exp k2 t p 3 exp k3 t p . (2) All the experimental data were fitted from ~ 60 fs after the zero time delay in order to avoid the coherent spike (non-time ordered signals) [Ref. 23]. The initial decays of the cross-polarized signals with VHVH and VHHV polarization sequences have opposite signs, which is a prediction of the different rotational averaging captured by each crosspolarized signal [Ref. 22]. The cross-polarized signals were fit by an exponential function and an offset, multiplied by the VVVV decay function, as dictated by the theory behind the measurement [Refs. 22,24]: IVHVH t p A1 exp 2k s t p A2 IVVVV t p , (3) where k s is the rate of exciton spin relaxation and I VVVV (t p ) is the decay profile of the B B B B B B VVVVsignal as a function of the pump-probe time delay, t p , and A 2 is the amplitude of B B B B 10 the exciton recombination dynamics represented by the VVVV signal. The fitted negative amplitudes (A 1 ) for VHHV data indicate the opposite sign of the rotational averaging B B factors for VHHV measurement compared to that for VHVH experiments. Table S_2: VVVV fitting parameters for the CPH-3TG studies of CdTe/CdSe core-shell NCs. (VVVV) a P P A1 B B k 1 (ps −1 ) A2 B B P P B B k 2 (ps −1 ) A3 B B P P B B k 3 (ps −1 ) b B B P P P core 0.393 0.746 0.381 0.0715 0.324 0.00005 0.2-nm shell 0.133 1.25 0.112 0.113 0.0303 0.00005 0.4-nm shell 0.0289 1.19 0.0265 0.0944 0.00962 0.00005 0.8-nm shell 0.0745 0.526 0.0572 0.0589 0.0723 0.00005 1.2-nm shell 0.0410 0.326 0.0673 0.0369 0.0731 0.00005 1.6-nm shell 0.0608 0.165 0.180 0.0269 0.0595 0.00005 2.0-nm shell 0.0485 0.629 0.0668 0.0482 0.0360 0.00005 P a VVVV data were fitted using Equation (2) in the previous section. b k 3 was determined by time-resolved PL measurements (Section iv: Table S_1) and fixed during the current fitting procedure. P P P P B B 11 Table S_3: Spin flip fitting parameters for the CPH-3TG studies of CdTe/CdSe coreshell NCs. (VHVH) (VHHV) P P a a P a P P P Ks (ps −1 ) A2 Ks (ps −1 ) A2 0.499 2.60 −0.0162 −0.445 2.69 −0.0254 0.2-nm shell 0.648 2.34 0.0894 −0.556 2.08 0.0100 0.4-nm shell 0.492 2.16 −0.00884 −0.360 2.22 0.00897 0.8-nm shell 0.120 2.03 -0.0232 -0.137 1.89 0.00296 1.2-nm shell 0.179 0.573 0.00119 −0.129 0.363 −0.0101 1.6-nm shell 0.0582 0.221 0.00323 −0.0675 0.159 −0.0103 2.0-nm shell 0.285 0.202 −0.00657 −0.281 0.0903 −0.0388 2.4-nm shell 0.0426 0.0891 0.0148 −0.0343 0.0786 −0.00273 Sample A1 core B B P P B A1 B B B P P B B VHVH and VHHV data were fitted using Equation (3). 12 vi. Determination of the electron transfer rate of type-II core-shell NCs with the VVVV measurement. To determine the electron transfer rate from CdTe core to CdSe shell, we choose excitation and probing of the CdSe shell. The electronic energy transfer from CdSe to CdTe is too fast for us to resolve (Ref. 26). The electron subsequently transfers back from CdTe core to CdSe shell, which manifests itself by the fast rise process (~ 600 fs). We rule out hole transfer directly from photoexcited CdSe because this hole transfer would not lead to an increased bleach or transient absorption signal at the CdSe resonance compared to the CdSe exciton. In this case, the VVVV data can be fitted as follows. IVVVV t p 1 1 exp k1 t p 2 exp k 2 t p The decay component of ~ 3040 ps can be assigned to the electron trapping at the CdSe surface (Ref. 26). 0.7 CdTe/CdSe 2.4-nm shell VVVV fitting curve Intensity (a.u.) 0.6 0.5 0.4 0.3 0.2 0.1 0.0 0 10 20 30 40 Time delay, tp (ps) Figure S_5: VVVV measurement of type-II CdTe/CdSe core-shell NCs with photoexcitation at CdSe exciton absorption band. Table S_4: Fitting parameters for the VVVV measurement of type-II CdTe/CdSe coreshell NCs with resonant photoexcitation at CdSe exciton absorption band. CdTe/CdSe NC A1 B (2.4-nm shell) VVVV B 0.284 k 1 (1/ps) A2 1.71 0.258 B B B B k 2 (1/ps) B B 0.0271 13 vii. Modeling of strain and band structure. Simple modeling of the system to show the transition to a type-II core-shell structure as a function of shell thickness was performed using an effective mass model, where band offsets were calculated using a combination of the “model-solid theory” and a continuum elasticity model of concentric spheres [28]. The natural band alignment, the strain effects and the quantum confinement are all important for the core-shell NCs. (a) Ec1 Ue Ec2 Eg1 Ev1 Eg2 Uh Ev2 CdTe CdSe 1.2 1.0 (b) 0.8 Ue,h(eV) 0.6 0.4 0.2 0.0 Ue Uh -0.2 -0.4 -0.6 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 Shell thickness (nm) Figure S_6: (a) Illustration of band alignment (b) calculated relative energy shift for type-II CdTe-CdSe core-shell structures. 14 viii. CPH-3TG measurements on samples with different surface ligands In order to evaluate the effect of NC surface on spin flip dynamics, we perform the CPH3TG measurements on the same batch of sample with different surface ligand (N-BUTYL AMINE). No obvious difference was observed within the experimental error. 0 10 20 CdTe/CdSe 2.4-nm shell VHVH VHHV after ligand change Intensity (a.u.) Intensity (a.u.) CdTe/CdSe 2.4-nm shell VHVH VHHV before ligand change 30 40 0 10 Time delay, tp (ps) 20 30 40 Time delay, tp (ps) Figure S_7: CPH-3TG measurements on type-II CdTe-CdSe core-shell structures with different NC surface ligands. Table S_5: Spin flip fitting parameters for CdTe/CdSe core-shell NCs before and after surface ligand change. (VHVH) (VHHV) P P a a P CdTe/CdSe (2.4-nm shell) A1 before change after change a P P Ks (ps −1 ) A2 0.0426 0.0891 0.0148 0.0235 0.0821 0.0161 B B P P B B Ks (ps −1 ) A2 −0.0343 0.0786 −0.00273 −0.0289 0.0727 0.00113 A1 B B P P B B VHVH and VHHV data were fitted using Equation (3) in Section v. 15