Proceedings of Scanning Probe Microscopy-2003.
Nizhny Novgorod. March 2 - March 5. 2003.
CONTENTS
ORAL SESSIONS
AFM Contributions in Epitaxy.
A.V.Latyshev, D.V.Sheglov, E.E.Rodyakina, S.S.Kosolobov, D.A.Nasimov, A.L.Aseev. Institute of
Semiconductor Physics SB RAS, Novosibirsk, Russia
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Ambient AFM observation of strained SiGe nanoislands embedded in Ge/Si structures on the structure
cross-sections.
A.N.Titkov1, M.S.Dunaevskii1, A.V.Ankudinov1, Z.F.Krasilnik2, D.N.Lobanov2, A.V.Novikov2, R.Laiho3.
1Ioffe Physico-Technical Institute RAS, St.Petersburg, Russia. 2Institute for Physics of Microstructures
RAS, N.Novgorod, Russia. 3University of Turku, Turku, Finland
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Investigation of the electrical potential distribution on the test structures, imitating the integrated circuit
elements by Scanning Electrostatic Force Microscopy (Kelvin mode).
G.A.Maximov, D.O.Filatov, A.V.Kruglov, D.A.Antonov, А.N.Kiselev, D.E.Nikolitchev. Research and
Educational Center for Physics of the Solid State Nanostructures, Nizhny Novgorod State University ,
Russia
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Initial stages of overgrowth of GaInP on InP quantum dots.
M.-E.Pistol, M. K.-J.Johanson, U.Håkansson, M.Holm, T.Sass, J.Persson, J. Johansson, C. Pryor, C.
Thelander, L. Montelius, L.Samuelson. Solid State Physics/Nanometer Structure Consortium, Lund
University, Lund, Sweden. Osram Opto Semiconductors GmbH, Regensburg, Germany. Optical Science
and Technology Center, University of Iowa, Iowa, USA
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Many particle non-equilibrium effects in the scanning tunneling spectroscopy of impurity atoms and orbital
states.
P.I.Arseyev1, N.S.Maslova2, V.I.Panov2, S.V.Savinov2, C.Van Haesendonck3 . 1Lebedev Physical
Institute, Russian Academy of Sciences, Moscow, Russia. 2Department of Physics, Moscow State
University, Moscow, Russia. 3Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke Universiteit
Leuven, Belgium.
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Measuring local elastic properties of cell surfaces and soft materials in liquid by atomic force microscopy.
N.I.Nurgazizov, A.A.Bukharaev, A.A.Mozhanova, D.V.Ovchinnikov. Zavoisky Physical Technical Institute
RAS, Kazan, Russia
Nanostructure Characterization using Low Temperature Scanning Tunneling Microscopy and
Spectroscopy. (Invited)
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D.Fujita. Nanomaterials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki, Japan
STM study of magic clusters of group III metals on Si(111) and Si(100).
V.G.Kotlyar1, A.V.Zotov1, A.A.Saranin1,2, T.V.Kasyanova1,2, M.A.Cherevik1, I.V.Pisarenko1,2
V.G.Lifshits1,2 1Institute of Automation & Control Processes RAS,Vladivostok, Russia. 2Far Eastern
State University, Vladivostok, Russia.
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Microscopic study of thin films of Ni-filled carbon nanocapsules.
V.D.Frolov, E.V.Zavedeev, S.M.Pimenov, V.I.Konov, S.Tomita, M.Fujii, S.Hayashi. General Physics
Institute, Moscow, Russia. Department of Electrical and Electronics Engineering, Kobe University, Kobe,
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Japan
Real 2D frustrated Ising systems. (Practical realizations of a 2D frustrated Ising Model).
L.Ottaviano1, B.Ressel2,3, C.DiTeodoro1, G.Profeta1, S.Santucci1, V.Cháb3, K.C.Prince2. [1]Unità
INFM and Dipartimento di Fisica Università degli Studi dell'Aquila, L'Aquila, Italy. [2]Sincrotrone Trieste,
Basovizza-Trieste, Italy. [3]Institute of Physics of the Academy of Science of the Czech Republic, Prague,
Czech Republic.
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Scanning tunnelling spectroscopy of electron transfer processes at surfaces. (Invited)
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R.Berndt. Christian-Albrechts-Universität. Kiel, Germany
Nanotomography for surface layers by SPM.
S.A.Chizhik1,2, D.I.Shasholko3, V.V.Chikunov1,3 . 1A.V.Lykov Heat and Mass Transfer Institute NAS of
Belarus, Minsk, Belarus. 2Metal-Polymer Research Institute NAS of Belarus, Gomel, Belarus.
3Microtestmachines Co., Gomel, Belarus
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CuI growth on copper surface under molecular iodine action: influence of the surface anisotropy in iodine
monolayer.
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B.V.Andryushechkin, K.N.Eltsov, V.M.Shevlyuga. Center for Natural Science Research, A.M.Prokhorov
General Physics Institute RAS, Moscow, Russia
SPM Study of Patterned Magnetic Nanostructures for High-Density Data Storage.
N.I.Polushkin, B.A.Gribkov, V.L.Mironov, A.M.Alexeev, A.F.Popkov, J.Wittborn, K.V.Rao. Institute for
Physics of Microstructures of RAS, N.Novgorod, Russia. State Research Institute of Physical Problems,
NT-MDT, Moscow, Russia. Department of Materials Science, Royal Institute of TechnologyStockholm,
Sweden.
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Ferroelectric nanodomain structures in LiNbO3 and LiTaO3: investigation by scanning probe microscopy.
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V.Ya.Shur, E.V.Nikolaeva, E.I.Shishkin. Ural State University, Ekaterinburg, Russia
Open Experimental Internet Practical Studies in Nanoscopy.
A.V.Bolshakova, A.S.Filonov, M.O.Gallyamov, D.Yu.Gavrilko, E.V.Dubrovin, O.I.Kiselyova,
A.M.Lomonosov, E.B.Meshkov, I.V.Yaminsky. Moscow State University, Advanced Technologies Center,
Moscow, Russia
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Surface polaritons in the near-field optics.
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M.N.Libenson, G.A.Martsinovsky. S.I.Vavilov State Optical Institute
Near-field optical imaging of carrier dynamics in silicon with sub-wavelength resolution.
P.Tománek, M.Benešová, P.Dobis, D.Košťálová, L.Grmela, Satoshi Kawata. Brno University of
Technology, Faculty of Electrical Engineering and Communication, Brno, Czech Republic. Osaka
University and Riken, Japan
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Near-field scanning optical microscopy of single nano-objects. (Invited)
M.Brun, A.Drezet, S.Huant, J.C.Woehl. Université Joseph Fourier Grenoble et CNRS, Saint Martin
d’Hères, France
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Photochemically supported migration and transfer in the optical near field.
P.KARAGEORGIEV1, B.Stiller1, O.Henneberg1, A.Natansohn2, L.Brehmer1 . 1Institute of physics,
University of PotsdamPotsdam, Germany. 2Department of chemistry, Queen’s University Kingston,
Ontario, Canada
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Nanoproccessing in the Near-Field of Atomic Force Microscope Tip by Femtosecond Laser Pulses.
A.Kirsanov, A.Kiselev, A.Stepanov, N.Polushkin. Institute of Applied Physics RAS. Institute for Physics of
Microstructures RAS, Nizhny Novgorod, Russia
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Atomic and electronic properties of surface nanoscaled structures of HOPG.
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M.V.Grishin, F.I.Dalidchik, S.A.Kovalevskii. Institute of Chemical Physics RAS, Moscow, Russia
Trends of Scanning probe microscopy.
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V.Bykov. NT-MDT Co. Moscow, Russia.
Influence of nanostandard properties on calibration procedures of SPMs.
T.Dziomba, W.Häßler-Grohne, H.Bosse, H.Danzebrink, L.Koenders, G.Wilkening. PhysikalischTechnische Bundesanstalt, Braunschweig, Germany
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The physical-chemical model of the tip-induced oxidation process on thin metal films, factors influencing
and improvement of the lateral resolution.
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S.V.Lemeshko, S.A.Saunin, V.M.Roschin, A.Y.Yalovenko. NT-MDT, State research institute of physical
problem, Moscow, Zelenograd, RussiA
An Application of Atomic Force Microscopy to Measure the Spring Constant of Single Antigen-antibody
Complex.
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L.A.Chtcheglova, G.T.Shubeita, S.K.Sekatskii, G.Dietler. Institut de Physique de la Matière Condensée,
University of Lausanne, Switzerland
Atomic Force Microscopy in Applied Biological Research.
B.N.Zaitsev. State Research Center of Virology&Biotechnology "Vector", Koltsovo, Novosibirsk region,
Russia
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POSTER SESSION
1. SPM investigations of semiconductor structures
AFM investigation of the silicon micro structure steep walls created by reactive ion milling.
S.Saunin. S. Leesment. NT-MDT, State research institute of physical problem; Moscow Institute of
Electronic Engineering, Moscow, Zelenograd, RUSSIA
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STM study of Ag film initial stages growth on a GAN(0001) surface grown by MBE.
R.Z.Bakhtizin1), K.-H.Wu2), Q.-Z.Xue2), Q.-K.Xue3), T.Nagao2), T.Sakurai2) . 1)Department of Physics,
Bashkir State University, Ufa, Russia. 2)Institute for Materials Research, Tohoku University, Sendai,
Japan. 3)Institute of Physics, Chinese Academy of Sciences, Beijing, China
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Cross-sectional AFM of GaAs-based multilayer heterostructure with thin AlAs marks.
Yu.N.Drozdov, V.M.Danil’tsev, N.V.Vostokov, G.L.Pakhomov, V.I.Shashkin. Institute for Physics of
Microstructures RAS, N. Novgorod, Russia
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Charging of single InAs quantum dots on insulator surface.
M.S.Dunaevskii, A.N.Titkov, J.J.Grob, R.Laiho. Ioffe Physico-Technical Institute, St.Petersburg, Russia.
L.Pastoire University, Strasbourg, France. Wihuri Laboratory, Turku University, Finland
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AFM investigation of the buried InAs/GaAs quantum dots with in situ monitoring of etching process by
photoelectric and hotoluminescence spectroscopy.
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I.A.Karpovich, A.P.Gorshkov, A.V.Zdoroveishev, D.O.Filatov, R.N.Skvortsov. N.I.Lobachevsky State
University of Nizhny Novgorod, N. Novgorod, Russia
Surface micromorphology of silicon on sapphire layers after X-ray irradiation.
A.N.Kiselev, G.A.Maximov, V.A.Perevoshikov, V.D.Skupov, D.O.Filatov. N.I.Lobachevsky State
University of Nizhny Novgorod, N. Novgorod, Russia
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Morphology of a surface, electronic structure and properties ion - implanted and structural – non-uniform
of amorphous silicon
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A.V.Nezhdanov, L.A.Meduncev, A.I.Mashin, V.G.Shengurov, A.F.Khokhlov. N.I.Lobachevsky State
University of Nizhny Novgorod, N. Novgorod, Russia
SPM study of epitaxial layers of silicon on sapphire.
G.A.Maximov, D.A.Pavlov, S.P.Svetlov, A.F.Khokhlov, V.Yu.Chalkov, V.G.Shengurov, P.A.Shilyaev.
N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia
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Scanning Probe Microscopic Study of Silicon Nanostructure Inclusions in Amorphous Layer after Ne+
Implantation.
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M.Yu.Lebedev, A.A.Ezhevskiy, G.A.Maksimov, A.F.Khokhlov. N.I.Lobachevsky State University of Nizhny
Novgorod, N. Novgorod, Russia
2. SPM investigation and modification of solid-state surface
STM study of magnetic granular thin films CoFe-Ag, Co-Ag, Co-Cu, CoFe-HfO2 and CoFe-Al2O3.
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G.V.Bondarkova, A.F.Kravets, V.I.Silantiev. Institute of Magnetism NAS of Ukraine, Kyiv, Ukraine
Investigation of conductive properties of micro- and nanowires using scanning probe microscopy.
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A.A.Bukharaev, P.A.Borodin, D.A.Biziaev. Zavoisky Physical Technical Institute RAS, Kazan, Russia
SPM analysis of heterogeneity in tribolayers of hard materials.
V.V.Chikunov1,2, Zhuang Yan3, S.V.Korotkevich3, S.A.Chizhik2 . 1Microtestmachines Co., Gomel,
Belarus. 2A.V.Lykov Heat and Mass Transfer Institute NAS of Belarus, Minsk, Belarus. 3Metal-Polymer
Research Institute NAS of Belarus, Gomel, Belarus.
Scanning tunneling microscopy current features near the excitation thresholds of collective states of low –
dimensional structures.
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E.M.Balashov, F.I.Dalidchik. Semenov Institute of Chemical Physics RAS, Moscow, Russia
Investigation of the initial stage of adsorption of oxygen on Al (111) by STM method.
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M.V.Grishin, F.I.Dalidchik, S.A.Kovalevskii. Institute of Chemical Physics RAS, Moscow, Russia
Properties of metallic and semiconducting nanowires studied by TEM-SPM.
D.Erts1, B.Polyakov1. A.Lõhmus2, R.Lõhmus2, H.Olin3, J.D.Holmes4 . 1Institute of Chemical Physics,
University of Latvia, Riga, Latvia. 2Institute of Physics, University of Tartu, Tartu, Estonia. 3Physics and
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Experimental Physics, Chalmers University of Technology, Göteborg, Sweden. 4Department of
Chemistry, University College Cork, Ireland
Magnetic force microscope in an external controllable magnetic field.
L.A.Fomin, K.M.Kalach, G.M.Mikhailov, V.A.Bykov, S.A.Saunin. Institute of Microelectronics technology
RAS, Moscow district, Chernogolovka, Russia. NT-MDT Co, Moscov, Russia.
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The research of magnetic-contrast size-dependence in epitaxial iron nanostructures.
L.A.Fomin, I.V.Malikov, G.M.Mikhailov. Institute of Microelectronics technology RAS, Moscow district,
Chernogolovka, Russia.
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Investigation of ZrO2 Nanoceramics Microstructure.
O.V.Karban1, O.L.Khasanov2 . 1Physicotechnical Institute UrB of RAS, Izhevsk, Russia. 2Tomsk
Polytechnic University, Tomsk, Russia
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AFM investigation of Pt-doped spin-on glass thin silica films.
0A.E.Muravyev, 0S.S.Mikhailova, 1O.A.Shilova, 2O.M.Kanunnikova. 0Physical-Technical Institute UrBr
RAS, Izhevsk, Russia. 1Institute of Chemistry of Silicates RAS, St.-Petersburg, Russia. 2Udmurt state
University, Izhevsk, Russia.
Structures surface processing for photoconverters.
A.V.Karimov, M.Mh.Agzamova, D.M.Yodgorova, N.L.Dmitruk, R.V.Konakova. Physical-Technical institute
of the SCIE, Tashkent, Uzbekistan. Institute of Semiconductor Physics, National Academy of Sciences of
Ukraine, Kiev, Ukraine.
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Quantum-size charge systems resulting from the silicon surface modification in STM experiment.
V.M.Kornilov, A.N.Lachinov, A.Yu.Zherebov. Institute of Molecular and Crystal Physics of Ufa Research
Center of RAS, Ufa, Russia
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Application of AFM and XPS in measuring thickness of surface coatings for nanostructured materials.
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S.F.Lomayeva, I.L.Lomayev. Physicotechnical Institute, UrBr RAS, Izhevsk, Russia
Surface morphology and optical properties of thin-film antireflection coatings for high-power
semiconductor laser diodes.
A.V.Ershov, E.I.Malysheva, S.M.Nekorkin, B.N.Zvonkov, D.O.Filatov, V.V.Levichev. N.I.Lobachevsky
State University of Nizhny Novgorod, Nizhny Novgorod, Russia
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Investigation of strain-enhanced grain growth in nano- and microcrystalline aluminum alloys using
methods of atomic-force and optical microscopy.
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Yu.G.Lopatin, Makarov, A.V.Nokhrin. Science Research Physical-Technical Institute N.I.Lobachevsky
State University of Nizhny Novgorod, N. Novgorod, Russia
Investigation of structure thermal stability of nano- and microcrystalline aluminum alloys using methods of
atomic-force, optical and transmission electron microscopy.
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Yu.G.Lopatin, Makarov, A.V.Nokhrin. Science Research Physical-Technical Institute N.I.Lobachevsky
State University of Nizhny Novgorod, N. Novgorod, Russia
Correlation between surface morphology and switching characteristics of ferroelectric thin films.
V.Ya.Shur, I.S.Baturin, E.V.Nikolaeva, E.I.Shishkin, D.K.Kuznetsov. Ural State University, Ekaterinburg,
Russia
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Evolution of surface morphology in PZT and PLZT thin films during rapid thermal annealing.
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V.Ya.Shur, E.B.Blankova, S.A.Negashev, E.A.Borisova, A.V.Barannikov, E.V.Nikolaeva, E.I.Shishkin.
Ural State University, Ekaterinburg, Russia
The Investigation of Surface Machining Characterization for Single Crystal Materials by SPM.
Sun Tao, Li Jun, Yan Yongda, Xia Jiafei, Zhao Yi, Liang Yingchun, Cheng Kai, Dong Shen. Precision
Engineering Research Institute, Harbin Institute of Technology, Harbin, China
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Domains in micron-sized permalloy elements.
A.G.Temiryazev, V.I.Borisov, A.I.Krikunov, M.P.Tikhomirova. Institute of Radioengineering & Electronics
RAS, Fryazino, Russia.
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MFM study of soft magnetic samples.
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A.G.Temiryazev. Institute of Radioengineering & Electronics RAS, Fryazino, Russia.
STM study of vortex system in superconductor NbSe2 in high field region.
A.Troyanovski, M.van Hecke, J.Aarts, P.Kes. Kapitza Institute for Physical Problems RAS, Moscow,
Russia. Kamerlingh Onnes Laboratory, Universiteit Leiden, Leiden, The Netherlands
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AFM investigations of nanometer-scale metal clusters formation on silicon surface.
S.V.Gaponov, B.A.Gribkov, V.L.Mironov, S.A.Treskov, D.G.Volgunov. Institute for Physics of
Microstructures RAS, N. Novgorod, Russia
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AFM investigation of irradiated rock salt crystals in high vacuum and in air.
R.Gaynutdinov, D.I.Vainshtein, A.Tolstikhina, H.W.den Hartog. A.V.Shubnikov Institute of
Crystallography RAS, Moscow, Russia. State University of Groningen, The Netherlands
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In situ AFM investigation of domain walls movement in triglicine sulfate crystals under influence of
temperature and electric field.
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A.L.Tolstikhina, R.V.Gaynutdinov, N.V.Belugina. A.V.Shubnikov Institute of Crystallography RAS,
Moscow, Russia
AFM investigation of carbon nanotubes.
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A.Yalovenko. Moscow State Institute of Electronic Engineering Moscow, Russia.
Self-assembly of carbon nanotubes in a conductive SnO2 matrix.
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V.D.Frolov, S.I.Dolgaev, A.V.Simakin, G.A.Shafeev. General Physics Institute RAS, Moscow, Russia
Resonant surface polaritons of cylindrical three-layer waveguide in far IR-range.
M.N.Libenson, D.S.Smirnov . S.I.Vavilov State Optical Institute, Saint-Petersburg Institute of Fine
Mechanics and Optics, St.-Petersburg, Russia
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Fabrication of the nanodimensional elements by the near-field optical lithography method.
V.F.Dryakhlushin, A.Yu.Klimov, V.V.Rogov, N.V.Vostokov. Institute for Physics of Microstructures RAS,
N. Novgorod, Russia
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Study of Near-Field Emission of Semiconductor Laser.
K.P.Gaikovich, V.F.Dryakhlushin, V.V.Levichev, V.P.Mishkin . Institute for Physics of Microstructures
RAS, N. Novgorod, Russia, N.I.Lobachevsky State University of Nizhny Novgorod, N.Novgorod, Russia
Microwave Subsurface Imaging of Living Tissues.
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G.M.Altshuller, K.P.Gaikovich, V.L.Vaks. Institute for Physics of Microstructures RAS, N. Novgorod,
Russia
Possibility of subsurface thermometry of biological media by means of near-field microwave sounding.
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A.N.Reznik, N.V.Yurasova. Institute for Physics of Microstructures RAS, N. Novgorod, Russia
Fluctuating electromagnetic fields over a corrugated surface.
I.Dorofeyev, H.Fuchs, J.Jersch. )Institute for physics of microstructures RAS. )Physical institute of
Muenster university, Germany
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Fluctuating Near Field Microscopy.
J.Jersch, I.Dorofeyev, H.Fuchs, T.Maletzky. Physikalisches Institut, University Muenster, Muenster,
Germany. Institute for Physics of Microstructures RAS, Nizhny Novgorod, Russia
Theoretical model and numerical simulation of scanning near-field optical microscopy in the collection
and illumination configurations.
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A.B.Evlyukhin, I.Y.Fadeeva. Vladimir State University, Vladimir, Russia
Probe radiation in near-field optical microscopy of one-layer nanostructure.
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A.Evlyukhin, M.Gerke, E.Grigor'eva, I.Fadeeva. Vladimir State University, Vladimir, Russia
Investigation of correlation between the structure of the semiconductor laser diode with the spatial
structure of its radiation by Scanning Near-field Optical Microscopy (NSOM) and Atomic Force
Microscopy (AFM).
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D.O.Filatov, G.A.Maximov, V.P.Mishkin, V.V.Levichev. Research and Educational Center for Physics of
the Solid State Nanostructures N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod,
Russia
Intermode conversion in a SNOM probe.
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M.I.Bakunov, S.B.Bodrov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia
SNOM Lithography on positive photoresist.
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I.V.Dushkin, A.V.Mezin. State research Institute of Physical Problems, NT-MDT Co., Moscow, Russia
Estimation of the transmission coefficient of the metal coated SNOM fiber probe.
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I.Dushkin, A.Mesin. State research Institute of Physical Problems, NT-MDT Co., Moscow, Russia
The molecular clusters nanostructures.
Yu.V.Gulyaev1, S.P.Gubin3, G.B.Khomutov2, V.V.Kislov1, V.V.Kolesov1, E.S.Soldatov2, I.V.Taranov1 .
1Institute of Radioengineering & Electronics RAS; 2Faculty of Physics, Moscow State University;
3Institute of General and Inorganic Chemistry RAS, Moscow, Russia. 4Institute of Chemistry & Chemical
Technology, NAS, 720071 Bishkek, Kirgistan
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3. SPM technique and methods
Stochastic geometry approach to DNA SPM image recognition and automatic length calculation.
N.G.Fedotov, A.V.Roy, L.A.Shulga, A.D.Volkov. Penza State University, Penza, Russia. NT-MDT Co.,
Moscow, Russia
Integrated Approach to Software Environment for Nanotechnology.
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V.A.Bykov, S.A.Saunin, A.D.Volkov, A.E.Efimov, V.N.Komkov. State research Institute of Physical
Problems, NT-MDT Co., Moscow, Russia
The features of STM of high-resistance films.
A.E.Pochtenny, O.M.Stukalov, I.P.Ilyushonok. Belarussian State University of Technology, Minsk,
Belarus. Institute of Solid State and Semiconductor Physics NASB, Minsk, Belarus
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STM LDOS reconstruction of HOPG surface.
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K.P.Gaikovich, V.L.Mironov, A.V.Zhilin. Institute for Physics of Microstructures RAS, N. Novgorod, Russia
Development of methods for mechanical properties measurements using the scanning probe
microscope-nanohadrness tester "NanoScan".
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K.V.Gogolinsky, A.S.Useinov. Technological Institute for Superhard and Novel Carbon Materials, Troitsk,
Moscow Reg., Russia
Development of Microscopy Scanning at CANDLE.
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V.V.Harutunyan. Yerevan Physics Institute, Yerevan, Armenia
SPM-Tomograph.
I.Kink, R.Lõhmus, K.Saal, M.Lobjakas, B.Abramovich, A.Lõhmus. Institute of Physics, University of Tartu,
Tartu, Estonia
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A novel test for AFM Z – calibration.
D.O.Filatov, Yu.Yu.Guschina, A.N.Kiselev, G.A.Maximov. Research and Educational Center for Physics
of the Solid State Nanostructures, N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod,
Russia
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Fractal analysis of SPM images.
P.A.Shilyaev, D.A.Pavlov, A.F.Khokhlov. N.I.Lobachevsky State University of Nizhny Novgorod, N.
Novgorod, Russia
Calculation the contact lateral force imaging the atomic structure polyethilene crystallite based on the
model point-contact probe.
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A.B. Petrov. Bashkirian State University, Ufa, Russia
Influence of sample surrounding medium on chemical contrast of AFM images. Methods for increasing
reproducibility of chemical force microscopy measurements.
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S.G.Bystrov, A.V.Zhikharev, A.A.Shakov. Physicotechnical Institute UrB RAS, Izhevsk, Russia
Auxiliaries for scanning probe microscopes.
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A.V.Zhikharev, S.G.Bystrov. Physicotechnical Institute UrB RAS, Izhevsk, Russia
Application of ab initio calculations for modelling STM images.
A.M.Lipanov, A.V.Tyurikov, E.Yu.Shelkovnikov, P.V.Gulyaev. Institute of Applied Mechanics Ural branch
of Russian Academy of Sciences, Izhevsk, Russia
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The specialized piezoelectric micromanipulators in STM for studying nanosize objects in cluster
materials.
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A.M.Lipanov, P.V.Gulyaev, E.Yu.Shelkovnikov, A.V.Tyurikov. Institute of Applied Mechanics Ural branch
of Russian Academy of Sciences, Izhevsk, Russia
Non-Dissipative Model for Image Formation at MFM.
D.E. Balabanov1, S.A. Nikitov1,2 . 1Moscow Institute of Physics and Technology, Moscow Region,
Russia, 2Institue of Radioengineering and Electronics RAS, Moscow, Russia
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New aspects of fluctuation electromagnetic interactions between moving tips and sample surface.
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G.V.Dedkov, A.A. Kyasov. Kabardino-Balkarian State University, Nalchik, Russia
TEM imaging of tip sample contacts between microfabricated silicon tips and surface of copper.
G.V.Dedkov, R.I.Teghaev, A.Kh.Tutukov, O.A.Dyshekov. Kabardino-Balkarian State University, Nalchik,
Russia
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Study of frequency shifts and damping motion of copper probes in close vicinity to a silver film deposited
on quartz resonator.
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G.V.Dedkov, R.I.Teghaev, A. Kh.Tutukov, O.A. Dyshekov. Kabardino-Balkarian State University, Nalchik,
Russia
Energy dissipation mechanisms in normal modulation mode SPMs.
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G.V.Dedkov, E.G.DEDKOVA. Kabardino-Balkarian State University, Nalchik, Russia
4. SPM in the chemical and biological applications
The use of automated AFM for studying of polymers.
A.Alexeev1,2, S.Saunin2, V.Zhizhimontov2, M.Zhdanov2, J.Loos1, U.S.Schubert1. 1Eindhoven
University of Technology, Eindhoven, The Netherlands. 2NT-MDT Co, State Research Institute of
Physical Problems, Moscow, Russia,
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Identification of Living Bacterial Cells in Soil and Permafrost.
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A.V.Bolshakova, E.A.Vorobyova, I.V.Yaminsky. Moscow State University, Moscow, Russia
Probe microscopy of DNA on Graphite.
D.V.Klinov1, E.V.Dubrovin2, I.V.Yaminsky2 . 1Institute of Bioorganic Chemistry, Moscow, Russia. 2Dept.
of Chemistry, Dept. of Physics Moscow State University, Moscow, Russia
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AFM of Bacterial Cells Subjected to Different Factors.
A.M. Lomonosov3, S.N. Egorov2, I.V. Yaminsky1,3 . 1Faculty of Physics and Faculty of Chemistry,
Moscow State University, 2Biological Faculty, Moscow State University, 3Advanced Technologies
Center, Moscow, Russia
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Local elastic properties of biological materials studied by SFM.
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A.A.Mozhanova, N.I.Nurgazizov, A.A.Bukharaev. Zavoisky Physical Technical RAS, Kazan, Russia
Atomic-Force Microscopy of RNA-protein complexes.
S.V.Kalashnikova, D.V.Klinov, V.V.Prokhorov, V.V.Demin, N.O.Kalinina, D.A.Rakitina, N.E.Yelina,
A.A.Zamyatnin, T.A.Stroganova, B.K.Chernov, J.Schiemann, A.G.Solovyev, S.Yu.Morozov.
M.M.Shemyakin & Yu.A. Ovchinnikov Institute of Bioorganic Chemistry RAS, Moscow, Russia
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Homogeneous and smooth siloxane films for AFM visualization of immobilized biomolecules.
K.Saal1,2, T.Tätte1,2, I.Kink1, A.Kurg3, R.Lõhmus1, U.Mäeorg2, A.Rinken2 , A.Lõhmus1. 1Institute of
Physics, 2Institute of Organic and Bioorganic Chemistry, University of Tartu; 3Institute of Molecular and
Cell Biology, Estonian Biocentre, Tartu, Estonia
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SPM studies of DNA architectures on Au(111) and mica surfaces.
B.Polyakov1, D.Erts1, U.Malinovskis2, I.Muiznieks2, E.Tuite3 . 1Institute of Chemical Physics, University
of Latvia, Riga, Latvia. 2Department of Biology, University of Latvia, Riga, Latvia. 3Department of
Chemistry, University of Newcastle , Newcastle upon Tyne, UK
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Combined AFM and XPS investigation of plasma-polymerized films of saturated hydrocarbons deposited
onto organic substrate.
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0A.M.Lyakhovitch, 0A.M.Dorfman, 1M.A.Shirobokov. 0Physicotechnical Institute, UrBr RAS, Izhevsk,
Russia. 1Udmurt state University, Izhevsk, Russia
SPM investigations of phase distribution in lead phthalocyanine-perylene derivative composite films.
B.A.Gribkov1, О.М.Stukalov2, А.Е.Pochtenny3, V.L.Mironov1, S.V.Gaponov1, A.V.Misevich3. 1Institute
for Physics of Microstructure of RAS, N.Novgorod, Russia. 2Institute of Solid State and Semiconductor
Physics of NASB, Minsk, Belarus. 3Belarussian State University of Technology, Minsk, Belarus
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Morphology and electrical properties of nanostructured films of perylene pigments.
A.N.Lappo, A.V.Misevich, A.E.Pochtenny, O.M.Stukalov, G.K.Zhavnerko. Belarussian State University of
Technology, Minsk, Belarus. Institute of Solid State and Semiconductor Physics NASB, Minsk, Belarus.
Institute for Chemistry of New Materials NASB, Minsk, Belarus
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AFM analysis of non-structured selfassembled polymer films.
A.A.Suslov1, I.Prosychevas2, S.A.Chizhik1,3, A.I.Shelmanov1. 1Metal-Polymer Research Institute NAS
of Belarus, Gomel, Belarus. 2Physical Electronics Institute, Kaunas University of Technology, Kaunas,
Lithuania. 3A.V.Lykov Heat and Mass Transfer Institute of NAS of Belarus, Minsk, Belarus.
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AFM observation of single polyolefins lamellae.
V.V.Prokhorov 1 , K.Nitta 2 . 1 Institute of Bioorganic Chemistry RAS, Moscow, Russia. 2Japan
Advanced Institute of Science and Technology, Tatsunokuchi, Ishikawa, Japan
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AFM comparison of the conformations acquired on mica by single molecules of polystyrene and
polyethylene.
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V.V.Prokhorov 1 , K.Nitta 2 . 1 Institute of Bioorganic Chemistry RAS, Moscow, Russia. 2Japan
Advanced Institute of Science and Technology, Tatsunokuchi, Ishikawa, Japan
AFM and SEM investigation of polymer films irradated in cosmic space.
D.L.Zagorski, V.K.Milinchuk, I.P.Shelukhov. Shubnikov Institute of Crystallography RAS, Moscow,
Russia. Obninsk Institute of Nuclear Power Engineering, Obninsk, Russia
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AFM method for investigation of polymers irradiated with fission fragments.
D.L.Zagorskia , A.I.Vilenskya , S.A.Kosarevb, G.S.Zhdanovb, A.M.Miterevb, B.V.Mchedlishvilia. aInstitute
of Crystallography RAS, Moscow,Russia. bInstitute of physics and Power Engineering, Obninsk, Russia
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The study of morphology of weak-basic anion-exchanger granules surface by the method of scanning
probe microscopy.
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A.N.Zyablov, E.G. Boukhovets, T.V.Elisseeva, Y.A.Zhibrova. Voronezh State University, Voronezh,
Russia
Investigations of amino acids structure by scanning force microscopy.
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A.N. Zyablov, V.F.Sеlеmеnеv, S.G.Behovyh. Voronezh State University, Voronezh, Russia
AFM investigation of alteration in lipid-protein model membrane caused by heavy ions.
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R.V.Gaynutdinov, N.N.Novikova, A.L.Tolstikhina, N.D.Stepina. Institute of Crystallography RAS, Moscow,
Russia
The application of SNOM in investigation of mitochondria colored by fluorescent probes and marks.
V.G.Dedkov , V.V.Obukhova, N.N.Belushkina, G.I.Morozova, A.E.Efimov, I.Dujkin. Research Institute of
Molecular Medicine, Moscow; Russian University of People Friendship , NT-MDT Co., Zelenograd
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The electron microscopy and atomic-force microscopy study of the structure of cells VERO, RK-13 and
human fibroblasts infected by the viruses of Togaviridae family.
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A.A.Manykin, F.V.Lisitcin, E.A.Guschina, A.E.Efimov, Y.Y.Cilinscy, B.A.Yakovleva. D.I.Ivanovsky Institute
of Virology RAMS; NT-MDT Co, Moscov, Russia
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